JP2023126924A - 非接触電圧測定を用いた調整可能な長さのロゴスキーコイル測定装置 - Google Patents
非接触電圧測定を用いた調整可能な長さのロゴスキーコイル測定装置 Download PDFInfo
- Publication number
- JP2023126924A JP2023126924A JP2023111090A JP2023111090A JP2023126924A JP 2023126924 A JP2023126924 A JP 2023126924A JP 2023111090 A JP2023111090 A JP 2023111090A JP 2023111090 A JP2023111090 A JP 2023111090A JP 2023126924 A JP2023126924 A JP 2023126924A
- Authority
- JP
- Japan
- Prior art keywords
- rogowski coil
- sensor
- conductor
- loop
- contact
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
- G01R19/2503—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques for measuring voltage only, e.g. digital volt meters (DVM's)
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
- G01R15/18—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using inductive devices, e.g. transformers
- G01R15/181—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using inductive devices, e.g. transformers using coils without a magnetic core, e.g. Rogowski coils
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0425—Test clips, e.g. for IC's
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
- G01R15/142—Arrangements for simultaneous measurements of several parameters employing techniques covered by groups G01R15/14 - G01R15/26
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
- G01R15/20—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices
- G01R15/202—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices using Hall-effect devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
- G01R15/20—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices
- G01R15/205—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices using magneto-resistance devices, e.g. field plates
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
-
- G—PHYSICS
- G08—SIGNALLING
- G08C—TRANSMISSION SYSTEMS FOR MEASURED VALUES, CONTROL OR SIMILAR SIGNALS
- G08C17/00—Arrangements for transmitting signals characterised by the use of a wireless electrical link
- G08C17/02—Arrangements for transmitting signals characterised by the use of a wireless electrical link using a radio link
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F27/00—Details of transformers or inductances, in general
- H01F27/28—Coils; Windings; Conductive connections
- H01F27/2804—Printed windings
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/12—Circuits for multi-testers, i.e. multimeters, e.g. for measuring voltage, current, or impedance at will
- G01R15/125—Circuits for multi-testers, i.e. multimeters, e.g. for measuring voltage, current, or impedance at will for digital multimeters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
- G01R15/18—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using inductive devices, e.g. transformers
- G01R15/186—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using inductive devices, e.g. transformers using current transformers with a core consisting of two or more parts, e.g. clamp-on type
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R21/00—Arrangements for measuring electric power or power factor
- G01R21/06—Arrangements for measuring electric power or power factor by measuring current and voltage
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Computer Networks & Wireless Communication (AREA)
- Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Abstract
Description
Claims (1)
- 絶縁導体とのガルバニック接触を必要とすることなく、前記絶縁導体内の電気的パラメータを検出するように動作する電気的パラメータセンサプローブであって、
ロゴスキーコイルと、
第1のチャネル及び第2のチャネルを含む本体であって、前記第1及び第2のチャネルが、それぞれの第1及び第2の開放端部を有し、前記第1及び第2のチャネルの前記それぞれの第1の端部が、互いに離間しており、前記第1及び第2のチャネルの前記それぞれの第2の端部が、互いに隣接しており、前記第1及び第2のチャネルの各々が、前記ロゴスキーコイルのループが前記第1及び第2のチャネルの前記それぞれの第1の開放端部の間に形成されるように、前記ロゴスキーコイルのそれぞれの長さをその中に摺動可能に収容するようにサイズ決め及び寸法決めされており、前記ループの前記サイズが、前記第1及び第2のチャネルのうちの少なくとも1つ内で前記ロゴスキーコイルの運動によって選択的に調整可能である、本体と、
前記本体に結合され、かつ前記第1及び第2のチャネルの前記それぞれの第1の端部の間に位置付けられている非接触センサであって、前記非接触センサが、前記絶縁導体が前記ロゴスキーコイルによって形成された前記ループ内にあるときに、前記絶縁導体内の少なくとも1つの電気的パラメータを感知するように動作する、非接触センサと、を備える、電気的パラメータセンサプローブ。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US15/975,187 US10746767B2 (en) | 2018-05-09 | 2018-05-09 | Adjustable length Rogowski coil measurement device with non-contact voltage measurement |
US15/975,187 | 2018-05-09 | ||
JP2019089281A JP7311307B2 (ja) | 2018-05-09 | 2019-05-09 | 非接触電圧測定を用いた調整可能な長さのロゴスキーコイル測定装置 |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2019089281A Division JP7311307B2 (ja) | 2018-05-09 | 2019-05-09 | 非接触電圧測定を用いた調整可能な長さのロゴスキーコイル測定装置 |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2023126924A true JP2023126924A (ja) | 2023-09-12 |
JP2023126924A5 JP2023126924A5 (ja) | 2024-02-19 |
JP7657858B2 JP7657858B2 (ja) | 2025-04-07 |
Family
ID=
Also Published As
Publication number | Publication date |
---|---|
TWI860108B (zh) | 2024-10-21 |
EP3567385B1 (en) | 2023-07-05 |
US20190346492A1 (en) | 2019-11-14 |
TWI820127B (zh) | 2023-11-01 |
US10746767B2 (en) | 2020-08-18 |
TW201947232A (zh) | 2019-12-16 |
TW202417859A (zh) | 2024-05-01 |
CN110470867B (zh) | 2024-10-29 |
JP7311307B2 (ja) | 2023-07-19 |
CN110470867A (zh) | 2019-11-19 |
JP2019215330A (ja) | 2019-12-19 |
EP3567385A1 (en) | 2019-11-13 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP7311307B2 (ja) | 非接触電圧測定を用いた調整可能な長さのロゴスキーコイル測定装置 | |
EP3567382B1 (en) | Clamp probe for non-contact electrical parameter measurement | |
EP3567381B1 (en) | Flexible jaw probe for non-contact electrical parameter measurement | |
US12061213B2 (en) | Non-contact voltage measurement with adjustable size rogowski coil | |
JP2019215330A5 (ja) | ||
EP4145141B1 (en) | Sensor probe with combined non-contact sensor and a rogowski coil | |
US11513140B2 (en) | Sensor probe with clamp having adjustable interior region for non-contact electrical measurement | |
JP7657858B2 (ja) | 電気的パラメータセンサプローブ及び絶縁導体内の電気的パラメータを検出する方法 | |
JP4755791B2 (ja) | 電流または電力センサ |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20230804 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20240208 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20240806 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20241023 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20250107 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20250212 |
|
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20250225 |