JP2021182136A - Anti-glare film and image display device - Google Patents

Abstract

To provide an anti-glare film which has excellent anti-glare property and can suppress reflected scattered light.SOLUTION: An anti-glare film with an anti-glare layer is provided, the anti-glare film has an uneven surface, wherein, for smoothed reflected light intensity measured under given measurement conditions, a maximum difference in the smoothed reflected light intensity between adjacent angles is less than or equal to a predetermined value, and the smoothed reflected light intensity near the specular direction is less than or equal to a predetermined value.SELECTED DRAWING: Figure 1

Description

The present invention relates to an antiglare film and an image display device.

An antiglare film for suppressing reflection of the background such as lighting and a person may be installed on the surface of an image display device such as a monitor of a television, a notebook PC, or a desktop PC.

The antiglare film has a basic structure having an antiglare layer having an uneven surface on a transparent base material. As such an antiglare film, for example, Patent Documents 1 to 4 and the like have been proposed.

Japanese Unexamined Patent Publication No. 2005-234554 Japanese Unexamined Patent Publication No. 2009-86410 Japanese Unexamined Patent Publication No. 2009-265500 International publication number WO2013 / 015039

Conventional anti-glare films such as Patent Documents 1 to 4 impart anti-glare properties to the extent that the reflected image is blurred, and it is difficult to sufficiently suppress the reflection of the background such as lighting and people. Met.
On the other hand, by increasing the degree of roughness of the surface unevenness of the antiglare layer, it is possible to sufficiently suppress the reflection and enhance the antiglare property. However, if the degree of roughness of the surface unevenness is simply increased, the reflected scattered light becomes stronger, and there is a problem that the contrast of the image display device is impaired.

An object of the present invention is to provide an antiglare film having excellent antiglare properties and capable of suppressing reflected scattered light.

The present invention provides the following antiglare films and display devices [1] to [2].
[1] An antiglare film having an antiglare layer, wherein the antiglare film has an uneven surface, and the smoothing reflected light intensity measured under the following measurement conditions satisfies the following conditions 1 and 2. Dazzling film.
<Measurement conditions>
(1) In the transmission measurement mode of the variable-angle photometer, visible light is emitted as parallel light from the light source of the variable-angle photometer, and the intensity of the emitted light is measured at an opening angle of 1 degree without going through the sample, and the maximum is reached. Standardize so that the strength is 100,000.
(2) A black plate is attached to the surface of the antiglare film on the side opposite to the uneven surface of the antiglare film via a transparent adhesive layer, and the antiglare film, the transparent adhesive layer and the black plate are laminated. A sample α having the uneven surface is prepared.
(3) The sample α is placed on the variable-angle photometer, and the uneven surface of the sample α is irradiated with visible light as parallel light from the light source of the variable-angle photometer, and the reflected light intensity is set to an opening angle of 1 degree. Measure with. The irradiation angle of the parallel light beam shall be a direction inclined by +45 degrees from the normal direction of the sample α. The reflected light intensity is measured at 1 degree intervals from 0 degrees to −85 degrees, which is the normal direction of the sample α. Further, in order to maintain the effect of the standard adjustment of (1), the reflected light intensity is measured in the transmission measurement mode.
(4) The smoothing process represented by the following formula (i) is performed at each angle from 0 degrees to −85 degrees, and the reflected light intensity after the smoothing process is defined as the smoothed reflected light intensity at each angle.
N degree smoothing reflected light intensity = ([n-2 degree reflected light intensity] + [n-1 degree reflected light intensity] + [n degree reflected light intensity] + [n + 1 degree reflected light intensity] + [Reflected light intensity of n + 2 degrees]) / 5 (i)
<Condition 1>
When the smoothed reflected light intensity of n degrees is defined as Rn and the smoothed reflected light intensity of n-1 degrees is defined as Rn-1, the maximum value of the absolute value of the difference between Rn and Rn-1 is 2.00 or less. ..
<Condition 2>
Smoothed reflected light intensity of -35 degrees is 4.0 or less.
[2] The surface of the antiglare film according to the above [1] on the uneven surface side is arranged on the display element so as to face the side opposite to the display element, and the antiglare film is placed on the outermost surface. An image display device arranged in.

The antiglare film and the image display device of the present invention are excellent in antiglare property and can suppress reflected scattered light.

It is a schematic sectional drawing which shows one Embodiment of the antiglare film of this invention. It is a schematic diagram for demonstrating the measuring method of the reflected light intensity. It is a schematic diagram for demonstrating the behavior of the light incident on the antiglare layer. It is sectional drawing which shows one Embodiment of the image display device of this invention. It is a figure which shows the smoothing reflected light intensity for every angle of the antiglare film of Example 1. FIG. It is a figure which shows the smoothing reflected light intensity for every angle of the antiglare film of Example 2. It is a figure which shows the smoothing reflected light intensity for every angle of the antiglare film of Example 3. FIG. It is a figure which shows the smoothing reflected light intensity for every angle of the antiglare film of Example 4. It is a figure which shows the smoothing reflected light intensity for every angle of the antiglare film of Example 5. It is a figure which shows the smoothing reflected light intensity for each angle of the antiglare film of the comparative example 1. FIG. It is a figure which shows the smoothing reflected light intensity for each angle of the antiglare film of the comparative example 2. It is a figure which shows the smoothing reflected light intensity for every angle of the antiglare film of the comparative example 3. FIG. It is a figure which shows the smoothing reflected light intensity for every angle of the antiglare film of the comparative example 4. It is a figure for demonstrating the calculation method of the amplitude spectrum of the elevation of an uneven surface. It is a figure for demonstrating the calculation method of the amplitude spectrum of the elevation of an uneven surface. It is a figure which shows the relationship between the spatial frequency and the amplitude of the antiglare film of Example 1. FIG. It is a figure which shows the relationship between the spatial frequency and the amplitude of the antiglare film of the comparative example 1. FIG.

Hereinafter, embodiments of the present invention will be described.
In addition, in this specification, the notation of AA to BB means that it is AA or more and BB or less.

[Anti-glare film]
The antiglare film of the present invention is provided with an antiglare layer and has an uneven surface, and the smoothing reflected light intensity measured under the following measurement conditions satisfies the following conditions 1 and 2.

<Measurement conditions>
(1) In the transmission measurement mode of the variable-angle photometer, visible light is emitted as parallel light from the light source of the variable-angle photometer, and the intensity of the emitted light is measured at an opening angle of 1 degree without going through the sample, and the maximum is reached. Standardize so that the strength is 100,000.
(2) A black plate is attached to the surface of the antiglare film on the side opposite to the uneven surface of the antiglare film via a transparent adhesive layer, and the antiglare film, the transparent adhesive layer and the black plate are laminated. A sample α having the uneven surface is prepared.
(3) The sample α is placed on the variable-angle photometer, and the uneven surface of the sample α is irradiated with visible light as parallel light from the light source of the variable-angle photometer, and the reflected light intensity is set to an opening angle of 1 degree. Measure with. The irradiation angle of the parallel light beam shall be a direction inclined by +45 degrees from the normal direction of the sample α. The reflected light intensity is measured at 1 degree intervals from 0 degrees to −85 degrees, which is the normal direction of the sample α. Further, in order to maintain the effect of the standard adjustment of (1), the reflected light intensity is measured in the transmission measurement mode.
(4) The smoothing process represented by the following formula (i) is performed at each angle from 0 degrees to −85 degrees, and the reflected light intensity after the smoothing process is defined as the smoothed reflected light intensity at each angle.
N degree smoothing reflected light intensity = ([n-2 degree reflected light intensity] + [n-1 degree reflected light intensity] + [n degree reflected light intensity] + [n + 1 degree reflected light intensity] + [Reflected light intensity of n + 2 degrees]) / 5 (i)

<Condition 1>
When the smoothed reflected light intensity of n degrees is defined as Rn and the smoothed reflected light intensity of n-1 degrees is defined as Rn-1, the maximum value of the absolute value of the difference between Rn and Rn-1 is 2.00 or less. ..
<Condition 2>
Smoothed reflected light intensity of -35 degrees is 4.0 or less.

FIG. 1 is a schematic cross-sectional view of the cross-sectional shape of the antiglare film 100 of the present invention.
The antiglare film 100 of FIG. 1 includes an antiglare layer 20 and has an uneven surface. In FIG. 1, the surface of the antiglare layer 20 is an uneven surface of the antiglare film. Further, the antiglare film 100 of FIG. 1 has an antiglare layer 20 on the transparent base material 10. Further, the antiglare layer 20 in FIG. 1 has a binder resin 21 and organic particles 22.
Note that FIG. 1 is a schematic cross-sectional view. That is, the scale of each layer constituting the antiglare film 100, the scale of each material, and the scale of the surface unevenness are schematicized for easy illustration, and are different from the actual scale. The same applies to FIGS. 2 to 4.

The antiglare film of the present invention is not limited to the laminated structure shown in FIG. 1 (laminated structure having an antiglare layer on a transparent substrate) as long as conditions 1 and 2 are satisfied. For example, the antiglare film may have a single-layer structure of an antiglare layer, or may have a layer other than the transparent base material and the antiglare layer (for example, an antireflection layer, an antifouling layer, etc.). good. When another layer is provided on the antiglare layer, the surface of the other layer may be an uneven surface of the antiglare film.
A preferred embodiment of the antiglare film is one in which an antiglare layer is provided on a transparent base material, and the surface of the antiglare layer opposite to the transparent base material is an uneven surface of the antiglare film.

<Transparent substrate>
The antiglare film preferably has a transparent base material from the viewpoint of ease of manufacturing the antiglare film and handleability of the antiglare film.

The transparent substrate preferably has light transmittance, smoothness, heat resistance, and is excellent in mechanical strength. Examples of such a transparent base material include polyester, triacetyl cellulose (TAC), cellulose diacetate, cellulose acetate butyrate, polyamide, polyimide, polyether sulphon, polysulphon, polypropylene, polymethylpentene, polyvinyl chloride, and polyvinyl acetal. , Polyether ketone, polymethyl methacrylate, polycarbonate, polyurethane and plastic films such as amorphous olefin (Cyclo-Olefin-Polymer: COP). The transparent base material may be made by laminating two or more plastic films.
Among the above, from the viewpoint of mechanical strength and dimensional stability, stretched polyesters, particularly biaxially stretched polyesters (polyethylene terephthalate, polyethylene naphthalate, etc.) are preferable. TAC and acrylic are suitable from the viewpoint of light transmission and optical isotropic properties. Further, COP and polyester are suitable because they have excellent weather resistance.

The thickness of the transparent substrate is preferably 5 to 300 μm, more preferably 20 to 200 μm, and even more preferably 30 to 120 μm.
When it is desired to make the antiglare film thin, the preferable upper limit of the thickness of the transparent substrate is 60 μm, and the more preferable upper limit is 50 μm. When the transparent substrate is a low moisture permeable substrate such as polyester, COP, or acrylic, the preferable upper limit of the thickness of the transparent substrate for thinning is 40 μm, and the more preferable upper limit is 20 μm. Even in the case of a large screen, if the upper limit of the thickness of the transparent base material is within the above-mentioned range, it is also preferable in that distortion can be less likely to occur.
The thickness of the transparent substrate can be measured with a Digimatic standard outer micrometer (Mitutoyo Co., Ltd., product number "MDC-25SX") or the like. The thickness of the transparent base material may be such that the average value measured at any 10 points is the above-mentioned numerical value.

In order to improve the adhesiveness, the surface of the transparent base material may be subjected to physical treatment such as corona discharge treatment or chemical treatment, or an easy-adhesion layer may be formed.

<Uneven surface>
The antiglare film of the present invention has an uneven surface. When there is no other layer on the antiglare layer, the surface of the antiglare layer becomes the uneven surface of the antiglare film. When another layer is provided on the antiglare layer, the surface of the other layer becomes the uneven surface of the antiglare film.

<Condition 1, Condition 2>
The antiglare film of the present invention has an uneven surface, and the smoothing reflected light intensity measured under the following measurement conditions satisfies conditions 1 and 2.

"Measurement condition"
(1) In the transmission measurement mode of the variable-angle photometer, visible light is emitted as parallel light from the light source of the variable-angle photometer, and the intensity of the emitted light is measured at an opening angle of 1 degree without going through the sample, and the maximum is reached. Standardize so that the strength is 100,000.
(2) A black plate is attached to the surface of the antiglare film on the side opposite to the uneven surface of the antiglare film via a transparent adhesive layer, and the antiglare film, the transparent adhesive layer and the black plate are laminated. A sample α having the uneven surface is prepared.
(3) The sample α is placed on the variable-angle photometer, and the uneven surface of the sample α is irradiated with visible light as parallel light from the light source of the variable-angle photometer, and the reflected light intensity is set to an opening angle of 1 degree. Measure with. The irradiation angle of the parallel light beam shall be a direction inclined by +45 degrees from the normal direction of the sample α. The reflected light intensity is measured at 1 degree intervals from 0 degrees to −85 degrees, which is the normal direction of the sample α. Further, in order to maintain the effect of the standard adjustment of (1), the reflected light intensity is measured in the transmission measurement mode.
(4) The smoothing process represented by the following formula (i) is performed at each angle from 0 degrees to −85 degrees, and the reflected light intensity after the smoothing process is defined as the smoothed reflected light intensity at each angle.
N degree smoothing reflected light intensity = ([n-2 degree reflected light intensity] + [n-1 degree reflected light intensity] + [n degree reflected light intensity] + [n + 1 degree reflected light intensity] + [Reflected light intensity of n + 2 degrees]) / 5 (i)

The step (1) of the measurement conditions is a standard matching step. By carrying out the step (1), even if the brightness of the light source of the variable-angle photometer is different, the absolute value of the reflected light intensity of the step (3) described later and the smoothing of the step (4). The reflection characteristics of the antiglare film can be evaluated based on the absolute value of the reflected light intensity. When measuring the reflected light intensity of the step (3) described later for a plurality of samples, the standard adjustment of the step (1) shall be performed for each sample.
In the step (1), the direction of the parallel light beam and the normal direction of the light receiver are made to match, and standard alignment is performed.

Examples of the variable angle photometer include the trade name "GC5000L" manufactured by Nippon Denshoku Industries Co., Ltd. In the examples described later, as a variable-angle photometer, a product name GC5000L manufactured by Nippon Denshoku Kogyo Co., Ltd. (luminous flux diameter: about 3 mm, inclining angle in light flux: within 0.8 degrees, aperture angle of receiver: 1 degree) is used. I'm using it.

The step (2) of the measurement conditions is a step of preparing a sample α which is a sample for measurement. In the measurement of the reflected light intensity in the step (3) described later, the sample α is a surface opposite to the uneven surface of the antiglare film and an uneven surface of the antiglare film in order to eliminate reflection at the interface with air. Has a black plate attached to the opposite surface.
The difference in refractive index between the member of the antiglare film in contact with the transparent pressure-sensitive adhesive layer (for example, a transparent base material) and the transparent pressure-sensitive adhesive layer is preferably 0.15 or less, and more preferably 0.10 or less. It is more preferably 0.05 or less, still more preferably 0.02 or less, and even more preferably 0.01 or less. The black plate preferably has a total light transmittance of JIS K7361-1: 1997 of 1% or less, and more preferably 0%. Further, the difference between the refractive index of the resin constituting the black plate and the refractive index of the transparent pressure-sensitive adhesive layer is preferably 0.15 or less, more preferably 0.10 or less, and more preferably 0.05 or less. It is even more preferably, more preferably 0.02 or less, and even more preferably 0.01 or less.

The step (3) of the measurement conditions is a step of irradiating the uneven surface of the sample α with visible light as parallel light and measuring the reflected light intensity. The measurement of the reflected light intensity in the step (3) shall be carried out in the transmission measurement mode in order to maintain the effect of the standard adjustment in the step (1).
In the step (3), the incident angle of the visible light is set to a direction inclined by +45 degrees from the normal direction of the sample α. In FIG. 2, the broken line indicates the normal direction (0 degree) of the sample α, and the solid arrow indicates the parallel light beam emitted from the light source.
Further, in the step (3), the reflected light intensity is measured at 1 degree intervals from 0 degrees to −85 degrees, which is the normal direction of the sample α. In FIG. 2, the direction of the broken line indicates 0 degrees, and the direction of the alternate long and short dash line indicates −85 degrees.

When measuring the reflected light intensity in the step (3), the aperture angle of the light receiver detected by the aperture of the light receiver is set to 1 degree. For example, in the case of 0 degree measurement, the range of -0.5 degree to +0.5 degree is measured, and in the case of -35 degree measurement, the range of -34.5 degree to -35.5 degree is measured, and the range of -85 degree is measured. In the measurement, the range of -85.5 to -84.5 degrees will be measured.

The step (4) of the measurement conditions is a step of performing a smoothing process represented by the following formula (i) and setting the reflected light intensity after the smoothing process to be the smoothed reflected light intensity at each angle.
N degree smoothing reflected light intensity = ([n-2 degree reflected light intensity] + [n-1 degree reflected light intensity] + [n degree reflected light intensity] + [n + 1 degree reflected light intensity] + [Reflected light intensity of n + 2 degrees]) / 5 (i)

Equation (i) takes into consideration that the "central visual field", which is a region that can be seen well in the human visual field, is "about 5 degrees", where the measured value of the reflected light intensity may repeatedly increase and decrease in a short cycle. It is smoothed with 5 points of data.

Since the measurement range is from 0 degrees to -85 degrees, in the formula (i), the average is 3 points at 0 degrees and -85 degrees, the average is 4 points at -1 degree and -84 degrees, and the average is 5 points. Must not be. However, 0 degrees, -1 degree, -84 degrees and -85 degrees are far from the specular reflection direction of -45 degrees of the incident light, and the absolute value of the reflected light intensity is small, which affects the condition 1. It can be said that it does not give.

<< Condition 1, Condition 2 >>
The antiglare film of the present invention requires that the smoothing reflected light intensity measured under the above measurement conditions satisfies conditions 1 and 2.

-Condition 1-
When the smoothed reflected light intensity of n degrees is defined as Rn and the smoothed reflected light intensity of n-1 degrees is defined as Rn-1, the maximum value of the absolute value of the difference between Rn and Rn-1 is 2.00 or less. ..

Satisfying condition 1 means that the change in the smoothed reflected light intensity for each angle is small. That is, the light incident on the uneven surface of the antiglare film satisfying the condition 1 and reflected is diffusely reflected at various angles without being biased in the vicinity of the specular reflection direction. Therefore, by satisfying the condition 1, the antiglare property can be improved.
On the other hand, if the condition 1 is not satisfied, the reflection of the light source or the like is visually recognized, and the antiglare property cannot be improved.

Under condition 1, the maximum value of the absolute value of the difference is preferably 1.00 or less, more preferably 0.50 or less, more preferably 0.20 or less, and 0.10 or less. It is more preferably present, and more preferably 0.05 or less.
If the absolute value of the difference in condition 1 becomes too small, the resolution of the video tends to decrease. Therefore, the maximum value of the absolute value of the difference is preferably 0.01 or more, and more preferably 0.02 or more.

When a plurality of numerical upper limit options and lower limit options are indicated in the configuration requirements shown in the present specification, one selected from the upper limit options and one selected from the lower limit options are combined. , It can be an embodiment of a numerical range. For example, in the case of the maximum value of the absolute value of the difference under condition 1, 2.00 or less, 0.01 or more and 2.00 or less, 0.01 or more and 1.00 or less, 0.01 or more and 0.50 or less, 0.01. 0.20 or less, 0.01 or more and 0.10 or less, 0.01 or more and 0.05 or less, 0.02 or more and 2.00 or less, 0.02 or more and 1.00 or less, 0.02 or more and 0.50 or less , 0.02 or more and 0.20 or less, 0.02 or more and 0.10 or less, and 0.02 or more and 0.05 or less.

In the present specification, the values of the smoothing reflected light intensity according to the conditions 1 to 3, the values of the surface shape such as Sa and Smp, the numerical values relating to the amplitude spectra of the altitudes such as AM1 and AM2, and the optical characteristics ( The value of haze, total light transmittance, etc.) means the average value of the measured values at 16 points.
In the present specification, the 16 measurement points are intersections when a region 1 cm from the outer edge of the measurement sample is set as a margin and a line is drawn that divides the vertical direction and the horizontal direction into five equal parts with respect to the region inside the margin. It is preferable to set 16 points of the above as the center of measurement. For example, when the measurement sample is a quadrangle, the measurement is performed centering on 16 points of intersections of dotted lines obtained by dividing the area inside the quadrangle into five equal parts in the vertical and horizontal directions, with the area 1 cm from the outer edge of the quadrangle as the margin. , It is preferable to calculate the parameter with the average value. When the measurement sample has a shape other than a quadrangle such as a circle, an ellipse, a triangle, or a pentagon, it is preferable to draw a quadrangle inscribed in these shapes and measure 16 points of the quadrangle by the above method.

Further, in the present specification, the smooth reflected light intensity according to the conditions 1 to 3, the surface shapes such as Sa and Smp, the amplitude spectrum of the altitudes such as AM1 and AM2, and the optical properties (haze, total light beam). Various parameters such as transmittance) shall be measured at a temperature of 23 ± 5 ° C. and a humidity of 40 to 65% unless otherwise specified. Further, before the start of each measurement, the target sample is exposed to the atmosphere for 30 minutes or more before the measurement is performed.

-Condition 2-
Smoothed reflected light intensity of -35 degrees is 4.0 or less.

Satisfying condition 2 means that the smoothed reflected light intensity of −35 degrees, which is a direction 10 degrees away from the specular reflection direction of −45 degrees, is small. Normally, when a person looks at an object, he or she looks at it from an angle where there is no specular light. Therefore, the intensity (≈whiteness) of the reflected scattered light can be matched with the appearance of a person by evaluating it at an angle excluding −45 degrees, which is the specular reflection direction.
Therefore, by satisfying the condition 2, the reflected scattered light can be suppressed and the contrast of the image display device can be improved.
The smoothed reflected light intensity of −35 degrees and the smoothed reflected light intensity of −55 degrees are usually about the same. Therefore, it is preferable that the smoothed reflected light intensity of −55 degrees is 4.0 or less.

Further, satisfying condition 2 and satisfying condition 1 means that even if a small amount of reflected scattered light is generated, the angular distribution of the reflected scattered light is not biased and is uniform. Therefore, by satisfying the conditions 1 and 2, the observer can hardly feel the reflected scattered light, the antiglare film can be given a jet-black feeling, and the image display device can be given a high-class feeling. Can be granted.

Under condition 2, the smoothing reflected light intensity of −35 degrees is preferably 2.0 or less, more preferably 1.5 or less, more preferably 1.0 or less, and 0.5 or less. Is more preferable, and 0.3 or less is more preferable. The smoothed reflected light intensity of −55 degrees is also preferably the above value.
If the smoothed reflected light intensity of −35 degrees under the condition 2 becomes too small, the resolution of the image tends to decrease. Therefore, the smoothing reflected light intensity of −35 degrees is preferably 0.1 or more. The smoothed reflected light intensity of −55 degrees is also preferably the above value.

<< Condition 3 >>
In the antiglare film of the present invention, it is preferable that the smoothing reflected light intensity measured under the above measurement conditions satisfies the following condition 3.

-Condition 3-
Smoothed reflected light intensity of -45 degrees is 8.0 or less.

Satisfying condition 3 means that the smoothed reflected light intensity of −45 degrees, which is the specular reflection direction, is small. Therefore, by satisfying the condition 3, the reflected scattered light can be suppressed in all directions, and the antiglare property of the antiglare film, the contrast of the image display device, and the jet-black feeling of the antiglare film can be further improved.

Under condition 3, the smoothed reflected light intensity of −45 degrees is more preferably 4.0 or less, further preferably 2.0 or less, and even more preferably 1.5 or less.
If the smoothed reflected light intensity of −45 degrees under the condition 3 becomes too small, the resolution of the image tends to decrease. Therefore, it is preferable that the smoothed reflected light intensity of −45 degrees is 0.1 or more.

In order to easily satisfy the conditions 1 to 3, it is preferable to have a structure in which high-altitude mountains are present at narrow intervals on the uneven surface of the antiglare film. In the case of this configuration, it is considered that conditions 1 to 3 are likely to be satisfied mainly for the following reasons (y1) to (y5).

(Y1) Since the distance between adjacent mountains is short, most of the reflected light reflected from the surface of any mountain is incident on the adjacent mountains. Then, total internal reflection is repeated inside the adjacent mountain, and finally it progresses to the opposite side of the observer 200 (image of the solid line in FIG. 3).
(Y2) The reflected light of the light incident on the steep slope of an arbitrary mountain travels on the opposite side of the observer 200 regardless of the adjacent mountain (image of the broken line in FIG. 3).
(Y3) Since the distance between adjacent mountains is short, there are few substantially flat regions that generate specularly reflected light.
(Y4) The reflected light reflected in a substantially flat region existing in a small proportion easily collides with an adjacent mountain. Therefore, the angle distribution of the reflected light reflected in the substantially flat region is not biased to a predetermined angle and becomes a substantially uniform angle distribution.
(Y5) The reflected light of the light incident on the gentle slope of an arbitrary mountain travels toward the observer 200 (image of the alternate long and short dash line in FIG. 3). Since the angle distribution of the gentle slope of the mountain is uniform, the angle distribution of the reflected light is also uniform without being biased to a specific angle.

First, from the above (y1) to (y3), it is considered that the reflected scattered light can be suppressed and, by extension, the antiglare property can be improved at a predetermined level.
Further, from the above (y4) and (y5), even if a small amount of reflected scattered light is generated, the angular distribution of the reflected scattered light can be made uniform, and conditions 1 to 3 can be easily satisfied. Even if the amount of reflected scattered light is very small, if the angle distribution of the reflected scattered light is biased to a specific angle, it will be recognized as reflected light. Therefore, the antiglare property can be made extremely good from the above (y4) and (y5).
Further, from the above (y1) to (y5), since the reflected scattered light can be hardly felt by the observer, the antiglare film can be given a jet-black feeling, and the image display device can be given a high-class feeling. can do.

<< Sa, Smp >>
The uneven surface of the antiglare film preferably has a three-dimensional arithmetic mean roughness Sa of 0.30 μm or more. Further, it is preferable that the uneven surface of the antiglare film has a three-dimensional average mountain spacing Smp of 10.00 μm or less. By setting Sa and Smp in the above range, it becomes easy to obtain an uneven surface in which high-altitude mountains exist at narrow intervals, and conditions 1 to 3 can be easily satisfied.

Sa is preferably 0.40 μm or more, more preferably 0.50 μm or more, and further preferably 0.55 μm or more.
Further, Sa is preferably 1.00 μm or less, more preferably 0.80 μm or less, and further preferably 0.70 μm or less.

The Smp is preferably 8.00 μm or less, more preferably 6.00 μm or less, further preferably 4.50 μm or less, and even more preferably 3.50 μm or less.
Further, the Smp is preferably 1.00 μm or more, more preferably 1.50 μm or more, and further preferably 2.00 μm or more.

The uneven surface of the antiglare film preferably has Sa / Smp of 0.05 or more, more preferably 0.10 or more, and even more preferably 0.13 or more. By setting Sa / Smp to 0.05 or more, it is possible to further increase the tendency for high-altitude mountains to exist at narrow intervals on the uneven surface of the antiglare layer, and it is possible to easily satisfy conditions 1 to 3. ..
Further, Sa / Smp is preferably 0.50 or less, more preferably 0.40 or less, and further preferably 0.25 or less.

<< Sz / Sa >>
In the antiglare film of the present invention, the ratio (Sz / Sa) of the three-dimensional ten-point average roughness Sz of the uneven surface to Sa is preferably 5.0 or more, and more preferably 5.5 or more. It is preferably 6.0 or more, and more preferably 6.0 or more. By setting Sz / Sa to 5.0 or more, a certain degree of randomness is imparted to the uneven surface, and when defects such as scratches occur on the uneven surface, it can be made inconspicuous.
If Sz / Sa is too large, glare (a phenomenon in which minute variations in brightness can be seen in the image light) may occur due to the presence of specific spots on the uneven surface, or the jet-black feeling may be locally reduced. there's a possibility that. Therefore, Sz / Sa is preferably 10.0 or less, more preferably 8.0 or less, and even more preferably 7.5 or less.

<< Ssk >>
In the antiglare film of the present invention, the three-dimensional skewness Sk of the uneven surface is preferably 0.60 or less, more preferably 0.20 or less, and further preferably 0 or less. A small Sk means that the proportion of low altitude points on the uneven surface is small. Therefore, by setting Sk to 0.60 or less, the above-mentioned actions (y3) and (y4) are likely to occur, and the above-mentioned effects (anti-glare property, suppression of reflected scattered light, jet-black feeling) are more exhibited. Can be made easier.
If Sk is too small, the reflected scattered light tends to increase due to the action of (y5). Further, if Sk is too small, the lower parts of adjacent mountains may overlap, the slope having a large angle disappears, and the action of (y2) may be reduced. Therefore, Sk is preferably −1.00 or higher, more preferably −0.80 or higher, and even more preferably −0.70 or higher.

Sk is an index showing the degree of deviation of the elevation distribution in the plus direction and the minus direction with respect to the average value of the elevations of the entire measurement surface. If the elevation distribution is normal, Sk shows 0. When the elevation distribution is biased in the negative direction, Sk shows a positive value, and the greater the degree of bias in the negative direction, the larger the Ssk value in the positive direction. On the other hand, when the distribution of elevation is biased in the positive direction, Sk shows a negative value, and the greater the degree of bias in the positive direction, the larger the value of Ssk in the negative direction.

《Inclination angle》
The uneven surface of the antiglare film preferably has a predetermined inclination angle distribution.
Specifically, regarding the inclination angle of the uneven surface of the antiglare film, the inclination angle of more than 0 degrees and less than 1 degree is θ1, the inclination angle of 1 degree or more and less than 3 degrees is θ2, and the inclination angle of 3 degrees or more and less than 10 degrees is set. The tilt angle of θ3, 10 degrees or more and less than 90 degrees is defined as θ4. When the total of θ1, θ2, θ3 and θ4 is 100%, the ratio of θ1, θ2, θ3 and θ4 is preferably in the following range. When θ1, θ2, θ3 and θ4 are in the following ranges, conditions 1 to 3 can be easily satisfied.
θ1 ≤ 3.0%
0.5% ≤ θ2 ≤ 15.0%
7.0% ≤ θ3 ≤ 40.0%
50.0% ≤ θ4 ≤ 90.0%

The ratio of θ1 is more preferably 2.0% or less, further preferably 1.5% or less, and even more preferably 1.2% or less. The lower limit of the ratio of θ1 is not particularly limited, but is usually 0.1% or more.
The ratio of θ2 is more preferably 12.0% or less, further preferably 10.0% or less, and even more preferably 8.0% or less. The lower limit of the ratio of θ2 is more preferably 1.0% or more, further preferably 1.5% or more, and even more preferably 2.0% or more.
The ratio of θ3 is more preferably 8.5% or more, further preferably 10.0% or more, and even more preferably 12.0% or more. Further, the ratio of θ3 is more preferably 35.0% or less, further preferably 32.0% or less, and further preferably 30.0% or less.
The ratio of θ4 is more preferably 55.0% or more, further preferably 57.5% or more, still more preferably 60.0% or more. Further, the ratio of θ4 is more preferably 88.0% or less, further preferably 86.5% or less, and further preferably 85.0% or less.

In the present specification, the three-dimensional arithmetic mean roughness Sa is a three-dimensional extension of Ra, which is a two-dimensional roughness parameter described in JIS B0601: 1994, and has orthogonal coordinate axes X and Y on the reference surface. Assuming that the roughness curved surface is Z (x, y) and the size of the reference surface is Lx, Ly, it is calculated by the following formula (i). In formula (i), A = Lx × Ly.

In the present specification, the three-dimensional average mountain spacing Smp is calculated as follows. Let Ps be the number of peaks where the part surrounded by one area above the reference surface from the three-dimensional roughness curved surface is one mountain, and let A be the area of the entire measurement area (reference surface). Is calculated by the following equation (ii).

In the present specification, the three-dimensional ten-point average roughness Sz is a three-dimensional extension of the ten-point average roughness Rz, which is a two-dimensional roughness parameter described in JIS B0601: 1994.
A large number of straight lines passing through the center of the reference plane are placed on the reference plane in a radial pattern of 360 degrees so as to cover the entire area, and a cross-sectional curve cut based on each straight line is obtained from a three-dimensional roughness curved surface. The point average roughness (the sum of the average of the mountain heights from the highest peak to the fifth in the highest order and the average of the valley depths from the deepest valley bottom to the fifth) is calculated. Sz is calculated by averaging the top 50% of the large number of ten-point average roughness thus obtained.

In the present specification, the three-dimensional skewness Sk is a three-dimensional extension of the skewness Rsk of the roughness curve of the two-dimensional roughness parameter described in JIS B0601: 1994, and the coordinate axes X and Y are orthogonal to the reference plane. Assuming that the axis is placed, the measured surface shape curve is z = f (x, y), and the size of the reference plane is Lx, Ly, it is calculated by the following equation (iii). In equation (iii), "Sq" is the root mean square deviation of the surface height distribution defined by equation (iv) below.

In the present specification, the inclination angle distribution of the uneven surface can be calculated from the three-dimensional roughness curved surface. The data of the three-dimensional roughness curved surface is represented by points arranged in a grid pattern at intervals d on a reference plane (the horizontal direction is the x-axis and the vertical direction is the y-axis) and the height at the positions of the points. Assuming that the height at the position of the i-th point in the x-axis direction and the j-th point in the y-axis direction (hereinafter referred to as (i, j)) is Z _{i, j} , x at an arbitrary position (i, j). The inclination Sx in the x-axis direction with respect to the axis and the inclination Sy in the y-axis direction with respect to the y-axis are calculated as follows.
Sx = (Z _{i + 1, j} −Z _{i-1, j} ) / 2d
Sy = (Z _{i, j + 1} −Z _{i, j-1} ) / 2d
Further, the slope St with respect to the reference plane in (i, j) is calculated by the following equation (v).

Then, the inclination angle in (i, j) is calculated as ^{tan -1 (St).} By performing the above calculation for each point, the inclination angle distribution of the three-dimensional roughness curved surface can be calculated.

The Sa, Smp and tilt angle distributions are preferably measured using an interference microscope. Examples of such an interference microscope include Zygo's "New View" series. Further, by using the measurement / analysis application software "MetroPro" attached to the above-mentioned interference microscope "New View" series, Sa, Smp and the tilt angle distribution can be easily calculated.

《Elevation amplitude spectrum》
In the antiglare film of the present invention, it is preferable that the amplitude spectrum of the elevation of the uneven surface satisfies a predetermined condition.
Respect amplitude spectrum of the altitude of the uneven surface, each spatial frequency 0.005 .mu.m ^-1, 0.010 ^-1, AM1 the sum of amplitude corresponding to 0.015 .mu.m ^-1, the amplitude at spatial frequency 0.300μm ^-1 AM2 Is defined as.
In the above premise, AM1 is preferably 0.070 to 0.400 μm. Further, AM2 is preferably 0.0050 μm or more. Further, it is preferable that AM2 <AM1.
Further, in the above premise, it is more preferable that AM1 is 0.070 to 0.400 μm, AM2 is 0.0050 μm or more, and AM2 <AM1.

As described above, AM1 is the sum of the amplitudes of the three spatial frequencies and is expressed by the following equation.
AM1 = amplitude at spatial frequency 0.005 .mu.m ^-1 in the amplitude + spatial frequency 0.015 .mu.m ^-1 in the amplitude + spatial frequency 0.010 ^-1 Note that the spatial frequency to be a discrete value dependent on the length of one side sometimes ^{0.005μm -1, 0.010μm -1, 0.015μm -1} , where and 0.300Myuemu ^-1 spatial frequency that matches the not obtained. If there is no spatial frequency that matches the value, the amplitude of the spatial frequency that is closest to the value may be extracted.

In the present specification, the "elevation of the uneven surface" means an arbitrary point P on the uneven surface and a virtual plane M (elevation is 0 μm as a reference) having the height at the average height of the uneven surface. , Means a straight line distance in the direction of the normal line V of the antiglare film (the normal direction in the above-mentioned virtual plane M) (see FIG. 14). If the elevation of any point P is higher than the average height, the elevation is positive, and if the elevation of any point P is lower than the average height, the elevation is negative.
Further, in the present specification, the wording including "elevation" means an altitude based on the above average height unless otherwise specified.

The spatial frequency and amplitude can be obtained by Fourier transforming the three-dimensional coordinate data of the uneven surface. The details of the method for calculating the spatial frequency and the amplitude from the three-dimensional coordinate data of the uneven surface will be described later.

<< AM1, AM2 >>
Regarding the amplitude spectrum of the elevation of the uneven surface, it can be said that the spatial frequency is roughly correlated with "the reciprocal of the distance between the convex portions" and the amplitude is roughly correlated with "the amount of change in the elevation of the convex portion having a predetermined spacing". The spatial frequency 0.005 μm ^-1 indicates that the interval is about 200 μm, the spatial frequency 0.010 ^{μm -1} indicates that the interval is about 100 μm, and the spatial frequency 0.015 μm ^{-1 indicates that the interval is about 100 μm.} Indicates that is about 67 μm, and the spatial frequency of 0.300 ^{μm -1} indicates that the interval is about 3 μm. Further, it can be said that "the amount of change in the elevation of the convex portions having a predetermined interval" is generally proportional to the absolute value of the individual heights of the convex portions having a predetermined interval.
Therefore, it is indirectly that the uneven surface having AM1 of 0.070 to 0.400 μm, AM2 of 0.0050 μm or more, and AM2 <AM1 has the following convex portions of i and ii. It can be said that it is regulated.
<Convex part group of i>
A plurality of convex portions i are arranged at intervals of about 67 to 200 μm, and the absolute value of the height of the convex portions i is within a predetermined range.
<Convex group of ii>
A plurality of convex portions ii are arranged at intervals of about 3 μm, and the absolute value of the height of the convex portions ii is equal to or more than a predetermined value and less than the absolute value of the height of the convex portions of i.

It is considered that the uneven surface provided with the above-mentioned i and the convex portion group of ii first exerts the above-mentioned actions (y1) to (y5) by the above-mentioned i and the above-mentioned convex portion group of i. Further, the uneven surface provided with the above-mentioned i and ii convex portions can form a convex portion due to the above-mentioned ii convex portions in a substantially flat region between adjacent mountains, and thus the convex portion can be formed in a substantially flat region. The ratio of specularly reflected light to the reflected reflected light can be reduced. Therefore, it is considered that the uneven surface provided with the above-mentioned i and ii convex portions tends to have good antiglare property, suppression of reflected scattered light, and a jet-black feeling.

AM1 is preferably 0.090 to 0.390 μm, more preferably 0.130 to 0.380 μm, and more preferably 0.150 to 0.370 μm in order to facilitate the above-mentioned effects. Is even more preferable.
If the AM is too small, the anti-glare property tends to be insufficient.
On the other hand, if AM1 becomes too large, the resolution of the image tends to decrease. Further, when AM1 becomes too large, the proportion of light totally reflected by the uneven surface in the light incident from the side opposite to the uneven surface (mainly image light) tends to increase, and the transmittance tends to decrease. Further, when AM1 becomes too large, the convex portion having a large absolute value of the height increases, the ratio of the light reflected on the observer side increases, and the reflected scattered light may become conspicuous. Therefore, it is preferable not to make AM1 too large from the viewpoint of suppressing the decrease in resolution and transmittance and further suppressing the reflected scattered light.

AM2 is preferably 0.0055 to 0.0550 μm, more preferably 0.0060 to 0.0500 μm, and more preferably 0.0070 to 0.0450 μm in order to facilitate the above-mentioned effects. Is even more preferable, and 0.0080 to 0.0400 μm is even more preferable.
If AM2 becomes too large, the resolution of the image tends to decrease. Therefore, it is preferable not to make AM2 too large from the viewpoint of suppressing a decrease in resolution.

In this embodiment, AM1 is the sum of the amplitudes of the three spatial frequencies. That is, in AM1, three intervals are considered as the intervals of the convex portions. In the present embodiment, since a plurality of intervals are taken into consideration in AM1, it is possible to easily suppress an increase in reflected light due to the alignment of the intervals of the convex portions.

In the present embodiment, each of the spatial frequency 0.005 .mu.m ^-1, 0.010 ^-1, the average of the amplitude corresponding to 0.015 .mu.m ^-1 when defined as AM1ave, AM1ave is in 0.023~0.133μm It is preferably 0.030 to 0.130 μm, more preferably 0.043 to 0.127 μm, and even more preferably 0.050 to 0.123 μm. AM1ave can be expressed by the following equation.
AM1ave = (amplitude in the amplitude + spatial frequency 0.015 .mu.m ^-1 in the amplitude + spatial frequency 0.010 ^-1 in the spatial frequency 0.005μm ^-1) / 3

In the present embodiment, Am1 - 1 an amplitude corresponding to the spatial frequency 0.005μm ^-1, AM1-2 an amplitude corresponding to the spatial frequency 0.010 ^-1, the amplitude corresponding to the spatial frequency 0.015 .mu.m ^-1 AM1 When defined as -3, AM1-1, AM1-2, and AM1-3 are preferably in the following ranges. By setting AM1-1, AM1-2, and AM1-3 in the following ranges, it is easy to suppress the alignment of the intervals between the convex portions, so that it is possible to easily suppress the increase in the reflected light.
AM1-1 is preferably 0.020 to 0.150 μm, more preferably 0.030 to 0.140 μm, further preferably 0.040 to 0.130 μm, and 0.050 to 0.130 μm. It is even more preferably 0.120 μm.
AM1-2 is preferably 0.020 to 0.145 μm, more preferably 0.030 to 0.135 μm, further preferably 0.040 to 0.125 μm, and 0.050 to 0.125 μm. It is even more preferably 0.120 μm.
AM1-3 is preferably 0.020 to 0.145 μm, more preferably 0.030 to 0.135 μm, further preferably 0.040 to 0.125 μm, and 0.050 to 0.05 to 0.125 μm. It is even more preferably 0.120 μm.

The antiglare film of the present invention has AM1 / AM2 of 1.0 to 60.0 from the viewpoint of improving the balance of the convex portions having different periods and facilitating the above-mentioned actions (y1) to (y5). It is preferably 2.0 to 50.0, more preferably 3.0 to 40.0, and even more preferably 4.0 to 30.0.

-Calculation method of AM1 and AM2-
In this specification, AM1, with respect to the amplitude spectrum of the altitude of the irregular surface, which means the sum of the amplitude spatial frequency respectively 0.005 .mu.m ^-1, 0.010 ^-1, corresponding to 0.015 .mu.m ^-1, AM2 is , Means the amplitude at a spatial frequency of 0.300 μm ^{-1 with respect to the amplitude spectrum.} Hereinafter, the calculation method of AM1 and AM2 will be described.

First, as described above, in the present specification, the "elevation of the uneven surface" means an arbitrary point P on the uneven surface and a virtual plane M (elevation) having the height at the average height of the uneven surface. Means the linear distance in the direction of the normal V of the antiglare film (the normal direction in the above-mentioned virtual plane M) with respect to 0 μm as a reference (see FIG. 14).

When the orthogonal coordinates in the uneven surface of the antiglare film are displayed by (x, y), the elevation of the uneven surface of the antiglare film can be expressed as a two-dimensional function h (x, y) of the coordinates (x, y). can.

The elevation of the uneven surface is preferably measured using an interference microscope. Examples of the interference microscope include Zygo's "New View" series.
The horizontal resolution required for the measuring machine is at least 5 μm or less, preferably 1 μm or less, and the vertical resolution is at least 0.01 μm or less, preferably 0.001 μm or less.
The measured area of altitude is preferably at least 200 μm × 200 μm or more in consideration of the spatial frequency resolution of 0.0050 μm ^-1.

Next, a method of obtaining the elevation amplitude spectrum from the two-dimensional function h (x, y) will be described. First, from the two-dimensional function h (x, y), the amplitude spectrum Hx (fx) in the x direction and the amplitude spectrum Hy (fy) in the y direction are obtained by the Fourier transform defined by the following equations (1a) and (1b). Ask.

Here, fx and fy are frequencies in the x-direction and the y-direction, respectively, and have dimensions of the reciprocal of the length. Further, π in the equations (1a) and (1b) is a pi, and i is an imaginary unit. The amplitude spectrum H (f) can be obtained by averaging the obtained amplitude spectrum Hx (fx) in the x direction and the amplitude spectrum Hy (fy) in the y direction. This amplitude spectrum H (f) represents the spatial frequency distribution of the uneven surface of the antiglare film.

Hereinafter, a method for obtaining the amplitude spectrum H (f) of the elevation of the uneven surface of the antiglare film will be described more specifically. The three-dimensional information of the surface shape actually measured by the above-mentioned interference microscope is generally obtained as a discrete value, that is, an elevation corresponding to a large number of measurement points.
FIG. 15 is a schematic diagram showing a state in which the function h (x, y) representing the altitude is obtained discretely. As shown in FIG. 15, the in-plane Cartesian coordinates of the antiglare layer are displayed as (x, y), and a line divided by Δx in the x-axis direction and a line divided by Δy in the y-axis direction on the projection surface Sp. When the drawn line is shown by a broken line, in actual measurement, the elevation of the uneven surface is obtained as a discrete elevation value at each intersection of the broken lines on the projection surface Sp.

The number of elevation values obtained is determined by the measurement range and Δx and Δy. As shown in FIG. 15, when the measurement range in the x-axis direction is X = (M-1) Δx and the measurement range in the y-axis direction is Y = (N-1) Δy, the number of altitude values obtained is M. × N pieces.

As shown in FIG. 15, the coordinates of the point of interest A on the projection surface Sp are (jΔx, kΔy) (where j is 0 or more and M-1 or less, and k is 0 or more and N-1 or less). Then, the elevation of the point P on the uneven surface corresponding to the point A of interest can be expressed as h (jΔx, kΔy).

Here, the measurement intervals Δx and Δy depend on the horizontal resolution of the measuring instrument, and in order to evaluate the fine uneven surface with high accuracy, both Δx and Δy are preferably 5 μm or less and 2 μm or less as described above. Is more preferable. Further, as described above, the measurement ranges X and Y are both preferably 200 μm or more.

As described above, in the actual measurement, the function representing the elevation of the uneven surface is obtained as a discrete function h (x, y) having M × N values. N discrete functions Hx (fx) by performing the discrete Fourier transform defined by the following equations (2a) and (2b) in the x and y directions of the discrete function h (x, y) obtained by the measurement. , M discrete functions Hy (fy) are obtained, and the amplitude spectrum H (f) is obtained by averaging all of them after obtaining their absolute values (= amplitudes) by the following equation (2c). In this specification, M = N and Δx = Δy. In the following equations (2a) to (2c), "l" is an integer of −M / 2 or more and M / 2 or less, and “m” is an integer of −N / 2 or more and N / 2 or less. Further, Δfx and Δfy are frequency intervals in the x-direction and the y-direction, respectively, and are defined by the following equations (3) and (4).

The discrete function H (f) of the amplitude spectrum calculated as described above represents the spatial frequency distribution of the uneven surface of the antiglare film. 16 and 17 show the discrete function H (f) of the amplitude spectrum of the elevation of the uneven surface of Example 1 and Comparative Example 1. In the figure, the horizontal axis indicates the spatial frequency (unit is “μm ^-1 ”), and the vertical axis indicates the amplitude ((unit is “μm”).

<Anti-glare layer>
The antiglare layer is a layer that plays a central role in suppressing reflected scattered light and antiglare.

<< Method of forming anti-glare layer >>
The antiglare layer can be formed, for example, by (A) a method using an embossed roll, (B) an etching treatment, (C) molding, (D) formation of a coating film by coating, and the like. Among these methods, molding by the mold of (C) is preferable from the viewpoint of easily obtaining a stable surface shape, and formation of a coating film by coating of (D) is preferable from the viewpoint of productivity and compatibility with a wide variety of products. Suitable.
When a coating film (antiglare layer) is formed by coating, for example, a means (d1) for applying a coating liquid containing a binder resin and particles to form irregularities by the particles, any resin, and compatibility with the resin. Examples thereof include a means (d2) in which a coating liquid containing a bad resin is applied and the resin is phase-separated to form irregularities. (D1) is preferable to (d2) in that it is easier to suppress variations in surface shapes such as Sa and Smp. Further, (d1) is preferable to (d2) in that the balance between AM1 and AM2 can be easily improved.

《Thickness》
The thickness T of the antiglare layer is preferably 2 to 10 μm, more preferably 4 to 8 μm, from the viewpoint of curl suppression, mechanical strength, hardness and toughness balance.
The thickness of the antiglare layer can be calculated from, for example, 20 points selected from arbitrary points in the cross-sectional photograph of the antiglare film by a scanning transmission electron microscope (STEM) and the average value thereof. The acceleration voltage of STEM is preferably 10 kv to 30 kV, and the magnification of STEM is preferably 1000 to 7000 times.

"component"
The antiglare layer mainly contains a resin component, and if necessary, particles such as organic particles and inorganic fine particles, a refractive index adjuster, an antioxidant, an antifouling agent, an ultraviolet absorber, a light stabilizer, an antioxidant, and the like. Contains additives such as viscosity modifiers and thermal polymerization initiators.
The antiglare layer preferably contains a binder resin and particles. Examples of the particles include organic particles and inorganic particles, and organic particles are preferable. That is, it is more preferable that the antiglare layer contains a binder resin and organic particles.

-particle-
Examples of the organic particles include particles made of polymethylmethacrylate, polyacrylic-styrene copolymer, melamine resin, polycarbonate, polystyrene, polyvinyl chloride, benzoguanamine-melamine-formaldehyde condensate, silicone, fluororesin, polyester resin and the like. Can be mentioned. Examples of the inorganic particles include silica, alumina, zirconia and titania, and silica is preferable.
Since the organic particles have a light specific gravity, they are preferable in that when they are used in combination with the inorganic fine particles described later, the organic particles easily emerge near the surface of the antiglare layer and the conditions 1 to 3 can be easily satisfied. Further, by using the organic particles and the inorganic fine particles in combination, the organic particles easily form irregularities having a long cycle, and the inorganic fine particles easily form irregularities having a short cycle, so that AM1 and AM2 can be easily set in the above-mentioned range. Further, since the organic particles are likely to emerge near the surface of the antiglare layer, the surface shapes such as Sa and Smp can be easily set in the above-mentioned range.
When only organic particles are used as the particles, it is preferable to increase the content ratio of the organic particles in the antiglare layer in order to easily satisfy the conditions 1 to 3. By increasing the content ratio of the organic particles in the antiglare layer, a shape in which the organic particles are spread all over is formed, and further, the shape in which the organic particles are stacked in the shape is partially formed. It becomes easy to be formed. By having such a shape, it is possible to easily obtain the above-mentioned actions of (y1) to (y5). Further, by increasing the content ratio of the organic particles, the shape is such that the organic particles are spread all over, and unevenness (AM2) having a short cycle due to the organic particles is formed, and further, the organic particles are spread all over. By partially forming a shape in which organic particles are stacked in such a shape, unevenness (AM1) having a long period can be formed. In addition, the shape of the organic particles spread over one surface makes it easy to reduce the Smp. Further, the shape in which the organic particles are stacked is partially formed in the shape in which the organic particles are spread all over, so that the Sa can be easily increased.

The average particle size D of particles such as organic particles and inorganic particles is preferably 1.0 to 5.0 μm, more preferably 1.5 to 3.5 μm, and 1.7 to 2.5 μm. It is more preferable to have.
By setting the average particle size D in the above range, the height of the peaks on the uneven surface and the spacing between the peaks can be easily set in an appropriate range, and the conditions 1 to 3 can be easily satisfied.
Further, by setting the average particle size D to 1.0 μm or more, it is possible to easily suppress that AM1 becomes too small, and it is possible to easily set Sa to 0.30 μm or more. Further, by setting the average particle size D to 5.0 μm or less, it is possible to easily suppress the AM1 from becoming too large, and it is possible to easily reduce the Smp to 10.00 μm or less.

The average particle size of particles such as organic particles and inorganic particles can be calculated by the following operations (A1) to (A3).
(A1) A transmission observation image is taken with an optical microscope of the antiglare film. The magnification is preferably 500 to 2000 times.
(A2) Arbitrary 10 particles are extracted from the observation image, and the particle size of each particle is calculated. The particle size is measured as the distance between straight lines in a combination of two straight lines such that the distance between the two straight lines is maximized when the cross section of the particle is sandwiched between two arbitrary parallel straight lines.
(A3) The same operation is performed 5 times in the observation image on another screen of the same sample, and the value obtained from the number average of the particle sizes of a total of 50 particles is taken as the average particle size of the particles.

The ratio (D / T) of the thickness T of the antiglare layer to the average particle diameter D of the particles is preferably 0.20 to 0.96, more preferably 0.25 to 0.90. , 0.30 to 0.80, more preferably 0.35 to 0.70. By setting the D / T in the above range, the height of the peaks on the uneven surface and the spacing between the peaks can be easily set in an appropriate range, and the conditions 1 to 3 can be easily satisfied. Further, by setting the D / T in the above range, AM1 and AM2 can be easily set in the above range. Further, by setting the D / T in the above range, the height of the peaks on the uneven surface and the spacing between the peaks can be easily set in an appropriate range, and the surface shapes such as Sa and Smp can be easily set in the above range.

The content of particles such as organic particles and inorganic particles is preferably 40 to 200 parts by mass, more preferably 55 to 170 parts by mass, and 60 to 150 parts by mass with respect to 100 parts by mass of the binder resin. Is more preferable.
By setting the content of the particles to 40 parts by mass or more, the height of the peaks on the uneven surface and the spacing between the peaks can be easily set in an appropriate range, and the conditions 1 to 3 can be easily satisfied. Further, by setting the content of the particles to 40 parts by mass or more, it is possible to easily suppress that AM1 becomes too small. Further, by setting the content of the particles to 40 parts by mass or more, it is possible to easily reduce the Sa to 0.30 μm or more and the Smp to 10.00 μm or less.
By setting the content of the particles to 200 parts by mass or less, it is possible to easily suppress the falling of the particles from the antiglare layer.
When the inorganic fine particles described later are not used, the content of the particles is preferably relatively large in the above range in order to facilitate the development of the above-mentioned "laying" and "stacking".

-Inorganic fine particles-
The antiglare layer preferably contains inorganic fine particles in addition to the binder resin and particles. In particular, the antiglare layer preferably contains inorganic fine particles in addition to the binder resin and organic particles.
When the antiglare layer contains inorganic fine particles, organic particles having a relatively light specific gravity are likely to emerge near the surface of the antiglare layer, and the surface shapes such as Sa and Smp are likely to be within the above-mentioned range. 3 can be easily satisfied. Further, since the antiglare layer contains inorganic fine particles, fine irregularities are formed between the peaks on the uneven surface and the specular reflected light is reduced, so that conditions 1 to 3 can be easily satisfied. Further, since the antiglare layer contains inorganic fine particles, fine irregularities are formed between the peaks on the uneven surface, and AM1 and AM2 can be easily set in the above-mentioned range.
Further, since the antiglare layer contains the inorganic fine particles, the difference between the refractive index of the organic particles and the refractive index difference of the composition other than the organic particles of the antiglare layer becomes small, and the internal haze can be easily reduced.

Examples of the inorganic fine particles include fine particles made of silica, alumina, zirconia, titania and the like. Among these, silica, which easily suppresses the occurrence of internal haze, is preferable.

The average particle size of the inorganic fine particles is preferably 1 to 200 nm, more preferably 2 to 100 nm, and even more preferably 5 to 50 nm.

The average particle size of the inorganic fine particles can be calculated by the following operations (B1) to (B3).
(B1) The cross section of the antiglare film is imaged by TEM or STEM. The acceleration voltage of TEM or STEM is preferably 10 kv to 30 kV, and the magnification is preferably 50,000 to 300,000 times.
(B2) Arbitrary 10 inorganic fine particles are extracted from the observation image, and the particle size of each inorganic fine particle is calculated. The particle size is measured as the distance between straight lines in a combination of two straight lines such that the distance between the two straight lines is maximized when the cross section of the inorganic fine particles is sandwiched between two arbitrary parallel straight lines.
(B3) The same operation is performed 5 times in the observation image on another screen of the same sample, and the value obtained from the average number of particle sizes for a total of 50 particles is taken as the average particle size of the inorganic fine particles.

The content of the inorganic fine particles is preferably 40 to 200 parts by mass, more preferably 50 to 150 parts by mass, and further preferably 60 to 100 parts by mass with respect to 100 parts by mass of the binder resin. ..
By setting the content of the inorganic fine particles to 40 parts by mass or more, it is possible to easily obtain the effect based on the above-mentioned inorganic fine particles. Further, by setting the content of the inorganic fine particles to 200 parts by mass or less, it is possible to easily suppress a decrease in the coating film strength of the antiglare layer.

-Binder resin-
From the viewpoint of improving the mechanical strength, the binder resin preferably contains a cured product of a curable resin such as a cured product of a thermosetting resin composition or a cured product of an ionized radiation curable resin composition, and ionized radiation. It is more preferable to include a cured product of the curable resin composition.

The thermosetting resin composition is a composition containing at least a thermosetting resin, and is a resin composition that is cured by heating.
Examples of the thermosetting resin include acrylic resin, urethane resin, phenol resin, urea melamine resin, epoxy resin, unsaturated polyester resin, silicone resin and the like. To the thermosetting resin composition, a curing agent is added to these curable resins as needed.

The ionizing radiation curable resin composition is a composition containing a compound having an ionizing radiation curable functional group (hereinafter, also referred to as “ionizing radiation curable compound”). Examples of the ionizing radiation curable functional group include an ethylenically unsaturated bond group such as a (meth) acryloyl group, a vinyl group and an allyl group, an epoxy group and an oxetanyl group. As the ionizing radiation curable compound, a compound having an ethylenically unsaturated bond group is preferable, a compound having two or more ethylenically unsaturated bond groups is more preferable, and a compound having two or more ethylenically unsaturated bond groups is particularly preferable. Polyfunctional (meth) acrylate compounds are more preferred. As the polyfunctional (meth) acrylate compound, either a monomer or an oligomer can be used.
The ionizing radiation means an electromagnetic wave or a charged particle beam having an energy quantum capable of polymerizing or cross-linking a molecule, and usually, an ultraviolet ray (UV) or an electron beam (EB) is used. Electromagnetic waves such as X-rays and γ-rays, and charged particle beams such as α-rays and ion-beams can also be used.

Among the polyfunctional (meth) acrylate compounds, the bifunctional (meth) acrylate monomers include ethylene glycol di (meth) acrylate, bisphenol A tetraethoxydiacrylate, bisphenol A tetrapropoxydiacrylate, and 1,6-hexane. Examples thereof include diol diacrylate.
Examples of the trifunctional or higher functional (meth) acrylate-based monomer include trimethylolpropane tri (meth) acrylate, pentaerythritol tri (meth) acrylate, pentaerythritol tetra (meth) acrylate, dipentaerythritol hexa (meth) acrylate, and di. Examples thereof include pentaerythritol tetra (meth) acrylate and isocyanuric acid-modified tri (meth) acrylate.
Further, the (meth) acrylate-based monomer may be one in which a part of the molecular skeleton is modified, and is modified with ethylene oxide, propylene oxide, caprolactone, isocyanuric acid, alkyl, cyclic alkyl, aromatic, bisphenol and the like. Can also be used.

Examples of the polyfunctional (meth) acrylate-based oligomer include acrylate-based polymers such as urethane (meth) acrylate, epoxy (meth) acrylate, polyester (meth) acrylate, and polyether (meth) acrylate.
Urethane (meth) acrylates are obtained, for example, by reacting polyhydric alcohols and organic diisocyanates with hydroxy (meth) acrylates.
Further, the preferable epoxy (meth) acrylate is a (meth) acrylate obtained by reacting a (meth) acrylic acid with a trifunctional or higher functional aromatic epoxy resin, an alicyclic epoxy resin, an aliphatic epoxy resin and the like, and a bifunctional one. (Meta) acrylate obtained by reacting the above aromatic epoxy resin, alicyclic epoxy resin, aliphatic epoxy resin, etc. with polybasic acid and (meth) acrylic acid, and bifunctional or higher functional aromatic epoxy resin, It is a (meth) acrylate obtained by reacting an alicyclic epoxy resin, an aliphatic epoxy resin or the like with phenols and (meth) acrylic acid.

Further, a monofunctional (meth) acrylate may be used in combination as the ionizing radiation curable compound for the purpose of adjusting the viscosity of the antiglare layer coating liquid. Examples of the monofunctional (meth) acrylate include methyl (meth) acrylate, ethyl (meth) acrylate, propyl (meth) acrylate, butyl (meth) acrylate, pentyl (meth) acrylate, hexyl (meth) acrylate, and cyclohexyl (meth) acrylate. , 2-Ethylhexyl (meth) acrylate, lauryl (meth) acrylate, stearyl (meth) acrylate, isobornyl (meth) acrylate and the like.
The ionizing radiation curable compound may be used alone or in combination of two or more.

When the ionizing radiation curable compound is an ultraviolet curable compound, the ionizing radiation curable composition preferably contains an additive such as a photopolymerization initiator or a photopolymerization accelerator.
Examples of the photopolymerization initiator include one or more selected from acetophenone, benzophenone, α-hydroxyalkylphenone, Michler ketone, benzoin, benzyldimethylketal, benzoylbenzoate, α-acyloxime ester, thioxanthones and the like.
The photopolymerization accelerator can reduce the polymerization inhibition due to air at the time of curing and accelerate the curing rate, and is selected from, for example, p-dimethylaminobenzoic acid isoamyl ester, p-dimethylaminobenzoic acid ethyl ester and the like. One or more types can be mentioned.

When the binder resin contains a cured product of an ionizing radiation curable resin composition, the configuration of (C1) or (C2) below is preferable.

(C1) The binder resin contains a thermoplastic resin in addition to the cured product of the ionizing radiation curable resin composition.
(C2) As the binder resin, substantially only the cured product of the ionizing radiation curable resin composition is contained, and as the ionizing radiation curable compound contained in the ionizing radiation curable resin composition, substantially only the monomer component is contained. include.

In the case of the above-mentioned embodiment of C1, since the viscosity of the antiglare layer coating liquid is increased by the thermoplastic resin, the organic particles are less likely to sink, and further, the binder resin is less likely to flow down between the peaks. Therefore, in the case of the embodiment of C1, the height of the peaks on the uneven surface and the spacing between the peaks can be easily set in an appropriate range, and the conditions 1 to 3 can be easily satisfied. Further, in the case of the embodiment of C1, it is possible to easily suppress that AM1 and AM2 become too small, and it is possible to easily make the surface shapes such as Sa and Smp within the above range.

Examples of the thermoplastic resin include polystyrene-based resin, polyolefin-based resin, ABS resin (including heat-resistant ABS resin), AS resin, AN resin, polyphenylene oxide-based resin, polycarbonate-based resin, polyacetal-based resin, acrylic-based resin, and polyethylene terephthalate-based resin. Examples thereof include resins, polybutylene teflate-based resins, polysulfone-based resins, and polyphenylene sulfide-based resins, and acrylic resins are preferable from the viewpoint of transparency.

The weight average molecular weight of the thermoplastic resin is preferably 20,000 to 200,000, more preferably 30,000 to 150,000, and even more preferably 50,000 to 100,000.
As used herein, the weight average molecular weight is the average molecular weight measured by GPC analysis and converted to standard polystyrene.

In the embodiment of C1, the mass ratio of the cured product of the ionizing radiation curable resin composition to the thermoplastic resin is preferably 60:40 to 90:10, preferably 70:30 to 80:20. Is more preferable.
By setting the amount of the thermoplastic resin to 10 or more with respect to the cured product 90 of the ionizing radiation curable resin composition, it is possible to easily exert the effect of increasing the viscosity of the above-mentioned antiglare layer coating liquid. Further, by setting the thermoplastic resin to 40 or less with respect to the cured product 60 of the ionizing radiation curable resin composition, it is possible to easily suppress the decrease in the mechanical strength of the antiglare layer.

In the case of the above-mentioned embodiment of C2, organic particles are spread on the bottom of the antiglare layer, and organic particles are stacked in a part of the region, and these organic particles are covered with a thin-skinned binder resin. It tends to have a shape like this. With such a shape, the above-mentioned actions (y1) to (y5) can be easily obtained, and conditions 1 to 3 can be easily satisfied. Further, in the embodiment of C2, the stacked organic particles form long-period irregularities (AM1), and the non-stacked organic particles form short-period irregularities (AM2) between the long-period irregularities. It will be. Therefore, in the case of the embodiment of C2, AM1 and AM2 can be easily set in the above range. Further, in the case of the embodiment of C2, the stacked organic particles can easily bring Sa into the above range, and the spread organic particles can easily bring Smp into the above range.
In the case of the embodiment of C2, it is preferable that the amount of the binder resin with respect to the organic particles is smaller than that of the embodiment of C1 in order to make the binder resin thin.

In C2, the ratio of the cured product of the ionizing radiation curable resin composition to the total amount of the binder resin is preferably 90% by mass or more, more preferably 95% by mass or more, and more preferably 100% by mass. More preferred.
Further, in C2, the ratio of the monomer component to the total amount of the ionizing radiation curable compound is preferably 90% by mass or more, more preferably 95% by mass or more, still more preferably 100% by mass. .. The monomer component is preferably a polyfunctional (meth) acrylate compound.

The antiglare layer coating liquid usually uses a solvent for adjusting the viscosity and making each component soluble or dispersible. Since the surface shape of the antiglare layer after coating and drying differs depending on the type of solvent, it is preferable to select the solvent in consideration of the saturated vapor pressure of the solvent, the permeability of the solvent into the transparent substrate, and the like.
Specifically, the solvent is, for example, ketones (acetone, methylethylketone, methylisobutylketone (MIBK), cyclohexanone, etc.), ethers (dioxane, tetrahydrofuran, etc.), aliphatic hydrocarbons (hexane, etc.), alicyclic type. Hydrocarbons (cyclohexane, etc.), aromatic hydrocarbons (toluene, xylene, etc.), carbon halides (dichloromethane, dichloroethane, etc.), esters (methyl acetate, ethyl acetate, butyl acetate, etc.), alcohols (isopropanol, isopropanol, etc. Butanol, cyclohexanol, etc.), cellosolves (methyl cellosolve, ethyl cellosolve, etc.), glycol ethers (propylene glycol monomethyl ether acetate, etc.), cellosolve acetates, sulfoxides (dimethyl sulfoxide, etc.), amides (dimethylformamide, dimethyl, etc.) (Acetamide, etc.) and the like can be exemplified, and a mixture thereof may be used.

The solvent in the antiglare layer coating liquid preferably contains a solvent having a high evaporation rate as a main component. By increasing the evaporation rate of the solvent, it is possible to prevent the organic particles from settling in the lower part of the antiglare layer, and further, it becomes difficult for the binder resin to flow down between the peaks. Therefore, by increasing the evaporation rate of the solvent, the height of the peaks on the uneven surface and the spacing between the peaks can be easily set in an appropriate range, and the conditions 1 to 3 can be easily satisfied. Further, by increasing the evaporation rate of the solvent, AM1 and AM2 can be easily set in the above range, and surface shapes such as Sa and Smp can be easily set in the above range.
The main component means that it is 50% by mass or more of the total amount of the solvent, preferably 70% by mass or more, and more preferably 80% by mass or more.

In the present specification, a solvent having a high evaporation rate means a solvent having an evaporation rate of 100 or more when the evaporation rate of butyl acetate is 100. The evaporation rate of the solvent having a high evaporation rate is more preferably 120 to 300, and further preferably 150 to 220.
Examples of the solvent having a high evaporation rate include methyl isobutyl ketone (evaporation rate 160), toluene (evaporation rate 200), and methyl ethyl ketone (evaporation rate 370).

The solvent in the antiglare layer coating liquid preferably contains a small amount of a solvent having a slow evaporation rate in addition to the solvent having a high evaporation rate. By containing a solvent having a slow evaporation rate, the organic particles can be aggregated, the height of the peaks on the uneven surface and the spacing between the peaks can be easily set in an appropriate range, and the conditions 1 to 3 can be easily satisfied. Further, by appropriately aggregating the organic particles containing a solvent having a slow evaporation rate, AM1 and AM2 can be easily set in the above range, and surface shapes such as Sa and Smp can be easily set in the above range.
The mass ratio of the solvent having a high evaporation rate to the solvent having a slow evaporation rate is preferably 99: 1 to 80:20, more preferably 98: 2 to 85:15.

In the present specification, a solvent having a slow evaporation rate means a solvent having an evaporation rate of less than 100 when the evaporation rate of butyl acetate is 100. The evaporation rate of the solvent having a high evaporation rate is more preferably 20 to 60, and further preferably 25 to 40.
Examples of the solvent having a slow evaporation rate include cyclohexanone (evaporation rate 32) and propylene glycol monomethyl ether acetate (evaporation rate 44).

Further, when forming the antiglare layer from the antiglare layer coating liquid, it is preferable to control the drying conditions.
The drying conditions can be controlled by the drying temperature and the wind speed in the dryer. The specific drying temperature is preferably 30 to 120 ° C., and the drying air speed is preferably 0.2 to 50 m / s. Further, in order to control the surface shape of the antiglare layer by drying, it is preferable to irradiate the ionizing radiation after the coating liquid is dried.

<Optical characteristics>
The antiglare film preferably has a total light transmittance of JIS K7361-1: 1997 of 70% or more, more preferably 80% or more, and further preferably 85% or more.
The light incident surface when measuring the total light transmittance and the haze described later is on the opposite side to the uneven surface.

The antiglare film preferably has a haze of JIS K7136: 2000 of 60 to 98%, more preferably 66 to 86%, and even more preferably 70 to 80%.
By setting the haze to 60% or more, it is possible to easily improve the antiglare property. Further, by setting the haze to 98% or less, it is possible to easily suppress a decrease in the resolution of the image.

The antiglare film preferably has an internal haze of 20% or less, more preferably 15% or less, and even more preferably 10% or less, in order to facilitate improving the resolution and contrast of the image.
The internal haze can be measured by a general-purpose method, for example, by crushing the unevenness of the uneven surface by attaching a transparent sheet on the uneven surface via a transparent adhesive layer.

<Other layers>
The antiglare film may have a layer other than the above-mentioned antiglare layer and the transparent base material. Examples of other layers include an antireflection layer, an antifouling layer, an antistatic layer and the like.
A preferred embodiment having another layer includes an embodiment having an antireflection layer on the antiglare layer and the surface of the antireflection layer being the uneven surface. It is more preferable that the antireflection layer has antifouling property. That is, the embodiment in which the antifouling antireflection layer is provided on the antiglare layer and the surface of the antifouling antireflection layer is the uneven surface is more preferable.

《Anti-reflective layer》
Examples of the antireflection layer include a single-layer structure of a low-refractive index layer; a two-layer structure of a high-refractive index layer and a low-refractive index layer; and a multi-layer structure of three or more layers. The low refractive index layer and the high refractive index layer can be formed by a general-purpose wet method, a dry method, or the like. In the case of the wet method, the single-layer structure or the two-layer structure is preferable, and in the case of the dry method, the multi-layer structure is preferable.

-In the case of single-layer structure or two-layer structure-
The single-layer structure or the two-layer structure is preferably formed by the wet method.
The low refractive index layer is preferably arranged on the outermost surface of the antiglare film. When imparting antifouling property to the antireflection layer, it is preferable to include an antifouling agent such as a silicone compound and a fluorine compound in the low refractive index layer.

The lower limit of the refractive index of the low refractive index layer is preferably 1.10 or more, more preferably 1.20 or more, more preferably 1.26 or more, more preferably 1.28 or more, and even more preferably 1.30 or more. The upper limit is preferably 1.48 or less, more preferably 1.45 or less, more preferably 1.40 or less, more preferably 1.38 or less, and even more preferably 1.32 or less.

The lower limit of the thickness of the low refractive index layer is preferably 80 nm or more, more preferably 85 nm or more, more preferably 90 nm or more, and the upper limit is preferably 150 nm or less, more preferably 110 nm or less, and even more preferably 105 nm or less.

It is preferable that the high refractive index layer is arranged on the antiglare layer side rather than the low refractive index layer.
The lower limit of the refractive index of the high refractive index layer is preferably 1.53 or more, more preferably 1.54 or more, more preferably 1.55 or more, more preferably 1.56 or more, and the upper limit is 1.85 or less. Is preferable, 1.80 or less is more preferable, 1.75 or less is more preferable, and 1.70 or less is more preferable.

The upper limit of the thickness of the high refractive index layer is preferably 200 nm or less, more preferably 180 nm or less, further preferably 150 nm or less, and the lower limit is preferably 50 nm or more, more preferably 70 nm or more.

-In the case of a multi-layer structure with three or more layers-
The multilayer structure preferably formed by the dry method is a structure in which a total of three or more layers are alternately laminated with high refractive index layers and low refractive index layers. Even in the multilayer structure, the low refractive index layer is preferably arranged on the outermost surface of the antiglare film.

The high refractive index layer preferably has a thickness of 10 to 200 nm, and preferably has a refractive index of 2.1 to 2.4. The thickness of the high refractive index layer is more preferably 20 to 70 nm.
The low refractive index layer preferably has a thickness of 5 to 200 nm, and preferably has a refractive index of 1.33 to 1.53. The thickness of the low refractive index layer is more preferably 20 to 120 nm.

<Size, shape, etc.>
The antiglare film may be in the form of a single leaf cut to a predetermined size, or may be in the form of a roll obtained by winding a long sheet into a roll. The size of the single leaf is not particularly limited, but the maximum diameter is about 2 to 500 inches. The "maximum diameter" means the maximum length when any two points of the antiglare film are connected. For example, when the antiglare film is rectangular, the diagonal of the region is the maximum diameter. When the antiglare film is circular, the diameter is the maximum.
The width and length of the roll shape are not particularly limited, but generally, the width is 500 to 3000 mm and the length is about 500 to 5000 m. The roll-shaped antiglare film can be cut into a single sheet and used according to the size of an image display device or the like. When cutting, it is preferable to exclude the end of the roll whose physical characteristics are not stable.
Further, the shape of the single leaf is not particularly limited, and may be, for example, a polygon (triangle, quadrangle, pentagon, etc.), a circle, or a random irregular shape. More specifically, when the antiglare film has a rectangular shape, the aspect ratio is not particularly limited as long as there is no problem in the display screen. For example, horizontal: vertical = 1: 1, 4: 3, 16:10, 16: 9, 2: 1 and the like can be mentioned, but the aspect ratio is limited to such an aspect ratio in in-vehicle applications and digital signage with rich design. Not done.

The surface shape of the antiglare film on the side opposite to the uneven surface is not particularly limited, but it is preferably substantially smooth. Approximately smooth means that Sa is less than 0.03 μm, preferably 0.02 μm or less.

[Image display device]
The image display device of the present invention is arranged on the display element so that the surface of the antiglare film of the present invention described above on the uneven surface side faces the side opposite to the display element, and the antiglare film is placed. It is arranged on the outermost surface (see FIG. 4).

Examples of the display element include a liquid crystal display element, an EL display element (organic EL display element, an inorganic EL display element), a plasma display element, and the like, and further, an LED display element such as a micro LED display element can be mentioned. These display elements may have a touch panel function inside the display element.
Examples of the liquid crystal display method of the liquid crystal display element include an IPS method, a VA method, a multi-domain method, an OCB method, an STN method, and a TSTN method. If the display element is a liquid crystal display element, a backlight is required. The backlight is arranged on the side opposite to the side on which the antiglare film of the liquid crystal display element is arranged.

Further, the image display device of the present embodiment may be an image display device with a touch panel having a touch panel between the display element and the antiglare film. In this case, the antiglare film may be arranged on the outermost surface of the image display device with a touch panel, and the surface of the antiglare film on the uneven surface side may be arranged so as to face the side opposite to the display element.

The size of the image display device is not particularly limited, but the maximum diameter of the effective display area is about 2 to 500 inches.
The effective display area of the image display device is an area in which an image can be displayed. For example, when the image display device has a housing that surrounds the display element, the area inside the housing is the effective image area.
The maximum diameter of the effective image area means the maximum length when any two points in the effective image area are connected. For example, when the effective image area is rectangular, the diagonal line of the area is the maximum diameter. When the effective image region is circular, the diameter of the region is the maximum diameter.

Next, the present invention will be described in more detail by way of examples, but the present invention is not limited to these examples. In addition, "part" and "%" are based on mass unless otherwise specified.

1. 1. Measurement and evaluation The antiglare films of Examples and Comparative Examples were measured and evaluated as follows. The atmosphere at the time of each measurement and evaluation was a temperature of 23 ± 5 ° C. and a humidity of 40 to 65%. Further, before the start of each measurement and evaluation, the target sample was exposed to the atmosphere for 30 minutes or more, and then the measurement and evaluation were performed. The results are shown in Tables 1-3.

1-1. Measurement of reflected light intensity The reflected light intensity of the antiglare films of Examples and Comparative Examples was measured by the following steps, and the smoothed reflected light intensity was calculated. Table 1 shows the maximum absolute value of the difference of condition 1 and the values of conditions 2 and 3. Further, FIGS. 5 to 13 show the smoothing reflected light intensity for each angle of the antiglare films of Examples and Comparative Examples. The horizontal axis is the light receiving angle (degrees), and the vertical axis is the smoothed reflected light intensity (logarithmic scale).

(0) In a variable-angle photometer (trade name "GC5000L" manufactured by Nippon Denshoku Industries Co., Ltd., luminous flux diameter: about 3 mm, inclining angle in luminous flux: within 0.8 degrees, aperture angle of receiver: 1 degree). After turning on the power switch of the device in advance so that the light source became stable and waiting for 20 minutes or more, zero adjustment was performed. Zero alignment was performed by setting the zero cap on the sample table of the variable-angle photometer and pressing the "zero alignment" button on the attached software with light irradiation of 45 degrees.
(1) In the transmission measurement mode (light receiving sensitivity 1000 times) of the variable-angle photometer, visible light is emitted as parallel light from the light source of the variable-angle photometer, and the intensity of the emitted light is not passed through the sample. It was measured once and standardized so that the maximum strength was 100,000.
(2) Next, a black plate is interposed on the surface of the antiglare film of Examples and Comparative Examples on the side opposite to the uneven surface, via a transparent adhesive layer (Panac Co., Ltd., trade name: Panaclean PD-S1) having a thickness of 25 μm. (Kuraray Co., Ltd., trade name: Comoglass DFA2CG 502K (black) system, thickness 2 mm) was bonded to prepare a sample α of 10 cm × 10 cm. The sample α had an antiglare film, a transparent adhesive layer, and a black plate in this order, and had an uneven surface (= uneven surface of the antiglare film).
(3) The sample α is placed on the variable-angle photometer, and the uneven surface of the sample α is irradiated with visible light as parallel light from the light source of the variable-angle photometer, and the reflected light intensity is set to an opening angle of 1. Measured in magnitude. The irradiation angle of the parallel light rays was set to a direction inclined by +45 degrees from the normal direction of the sample α. The reflected light intensity was measured at 1 degree intervals from 0 degrees to −85 degrees, which is the normal direction of the sample α. Further, in order to maintain the effect of the standard adjustment of (1), the reflected light intensity was measured in the transmission measurement mode.
(4) The smoothing process represented by the following formula (i) was performed at each angle from 0 degrees to −85 degrees, and the reflected light intensity after the smoothing process was calculated as the smoothed reflected light intensity at each angle.
N degree smoothing reflected light intensity = ([n-2 degree reflected light intensity] + [n-1 degree reflected light intensity] + [n degree reflected light intensity] + [n + 1 degree reflected light intensity] + [Reflected light intensity of n + 2 degrees]) / 5 (i)

1-2. Measurement of surface shape The antiglare films of Examples and Comparative Examples were cut into 10 cm × 10 cm. The cutting points were selected from random parts after visually confirming that there were no abnormal points such as dust and scratches. A glass plate (thickness 2.) measuring 10 cm in length and 10 cm in width is passed through the transparent base material side of the cut antiglare film via an optical transparent adhesive sheet (trade name: Panaclean PD-S1, thickness 25 μm) manufactured by Panac. Sample 2 bonded to 0 mm) was prepared.
After setting the sample 2 on the measurement stage so that it is fixed and in close contact with the measurement stage using a white interference microscope (New View7300, Zygo), the surface of the antiglare film is subjected to the following measurement condition 1 and analysis condition 1. The shape was measured and analyzed. In addition, Microscope Application of MetroPro ver9.0.10 (64-bit) was used as the measurement / analysis software.

(Measurement condition 1)
Objective lens: 50x ImageZoom: 1x Measurement area: 218μm x 218μm
Resolution (interval per point): 0.22 μm
-Instrument: NewView7000 Id 0 SN 073395
-Acquisition Mode: Scan
-Scan Type: Bipolar
-Camera Mode: 992x992 48 Hz
-Subtract Sys Err: Off
-SysErrFile: SysErr. dat
・ AGC: Off
・ Phase Res: High
・ Connection Orderer: Location
・ Discon Action: Filter
-Min Mod (%): 0.01
・ Min Area Size: 7
・ Remove Freshes: Off
-Number of Averages: 0
・ FDA Noise Threat: 10
-ScanLength: 15um bipolar (6 sec)
-Extended Scan Length: 1000 μm
・ FDA Res: High 2G

(Analysis condition 1)
・ Removed: None
・ Data Fill: On
-Data Fill Max: 10000
・ Filter: HighPass
・ FilterType: GassSpline
・ Filter Window Size: 3
・ Filter Trim: Off
・ Filter Low wavelength: 800 μm
-Min Area Size: 0
・ Remember spikes: On
-Spike Height (xRMS): 2.5
The Low wavelength corresponds to the cutoff value λc in the roughness parameter.

"Ra", "SRz", and "Rsk" were displayed on the Surface Map screen, and the respective numerical values were set to Sa, Sz, and Sk in each measurement area.
Next, the "Save Data" button was displayed in the Surface Map screen, and the analyzed three-dimensional curved surface roughness data was saved. Then, in Advanced Texture Application, the stored data was read and the following analysis condition 2 was applied.
(Analysis condition 2)
・ High FFT Filter: off
・ Low FFT Filter: off
-Calc High Frequency: On
-Calc Low Frequency: On
・ Filter Trim: On
・ Remove spikes: Off
-Spike Height (xRMS): 5.00
-Noise Filter Size: 0
-Noise Filter Type: 2 Sigma
・ Fill Data: Off
-Data Fill Max: 25
・ Trim: 0
・ Trim Mode: All
・ Move: Plane
・ Reference Band: 0 μm
-Mim Peaks / Valleys Area: 0 μm ²
-Max Peaks / Valleys Area: 0 μm ²

Next, the "Peaks / Valleys" screen is displayed, "Reference Band: 0 μm", "Mim Peaks / Valleys Area: 0 μm ² ", "Max Peaks / Valleys Area: 0 μm ² ", and analysis is performed with "Max Peaks / Valleys Area: 0 μm 2". The displayed numerical value was used as the Smp of each measurement area.

Next, display the Slope Mag Map screen with the above analysis software (Microscoppe Application of MetroPro ver9.0.10 (64-bit)), and in the screen, the horizontal axis is Value (μm / mm) and the vertical axis is Counts. The histogram was displayed as, and the horizontal axis was converted into an angle by arctangent to obtain histogram data of the three-dimensional surface inclination angle distribution. In each measurement sample, the numerical value of nBins was adjusted so as to obtain an angle distribution histogram in which the tilt angle after conversion was 1 degree or less. Based on the obtained histogram data, the tilt angle of more than 0 degrees and less than 1 degree (θ1), the tilt angle of 1 degree or more and less than 3 degrees (θ2), the tilt angle of 3 degrees or more and less than 10 degrees (θ3), 10 degrees or more. An inclination angle (θ4) of less than 90 degrees was calculated.

1-3. Total light transmittance (Tt) and haze (Hz)
The antiglare films of Examples and Comparative Examples were cut into 10 cm squares. The cutting points were selected from random parts after visually confirming that there were no abnormal points such as dust and scratches. Using a haze meter (HM-150, manufactured by Murakami Color Technology Laboratory), the total light transmittance of JIS K7631-1: 1997 and the haze of JIS K7136: 2000 were measured for each sample.
After turning on the power switch of the device in advance so that the light source becomes stable, wait for 15 minutes or more, calibrate without setting anything in the inlet opening (where the measurement sample is installed), and then measure in the inlet opening. The sample was set and measured. The light incident surface was on the transparent substrate side.

1-4. Anti-glare 1 (anti-glare in specular direction)
The sample α prepared in 1-1 was placed on a horizontal table with a height of 70 cm so that the uneven surface was facing up, and in a bright room environment, from the angle of the specular reflection direction of the illumination light, according to the following evaluation criteria. The reflection of the illumination light on the uneven surface was evaluated. At the time of evaluation, the position of the sample α with respect to the illumination was adjusted so that the incident angle of the light emitted from the center of the illumination with respect to the sample α was 10 degrees. The lighting used was an Hf32 type straight tube three-wavelength neutral white fluorescent lamp, and the position of the lighting was set to a height of 2 m above the horizontal table in the vertical direction. Further, the evaluation was made in the range where the illuminance on the uneven surface of the sample was 500 to 1000 lux. The line of sight of the observer was about 160 cm from the floor. The observer was a healthy person in his 30s with a visual acuity of 0.7 or higher.
<Evaluation criteria>
◎: There is no outline of the lighting and the position is unknown. 〇: There is no outline of the lighting, but the position is vaguely known. △: The outline and position of the lighting are vaguely understood. I understand

1-5. Anti-glare 2 (anti-glare at various angles)
While holding the sample α prepared in 1-1 with both hands and changing the height and angle of the sample α (however, the angle of incidence of the light emitted from the center of the illumination on the sample α is changed in the range of 10 to 70 degrees). The reflection of the illumination light on the uneven surface was evaluated in the same manner as in 1-4 except that the points to be evaluated were changed.

1-6. Reflected scattered light (≒ jet black feeling)
The sample α prepared in 1-1 was placed on a horizontal table with a height of 70 cm so that the uneven surface faced up. The position of the sample α with respect to the illumination was adjusted so that the light having the strongest emission angle among the light emitted from the illumination did not enter the sample α at the last minute. Due to this adjustment, the position of the sample with respect to the observer is located farther from the observer than the position of the sample 1-4.
The sample α was placed at the above position, and the degree of reflected scattered light (≈ jet-black feeling) was evaluated according to the following evaluation criteria. The observer's line of sight was around 160 cm from the floor. The observer was a healthy person in his 30s with a visual acuity of 0.7 or higher.
<Evaluation criteria>
◎: The whiteness of the scattered light is not felt and it is sufficiently black. 〇: The whiteness of the scattered light is slightly felt, but it is not noticeable.

1-7. Measurement of AM1 and AM2 Using a white interference microscope (New View7300, Zygo), set the sample 2 prepared in 1-2 on the measurement stage so that it is fixed and in close contact, and then under the following conditions. The elevation of the uneven surface of the antiglare film was measured, and AM1 and AM2 were calculated. The measurement conditions and analysis conditions for measuring the altitude were the same as those for measurement condition 1 and analysis condition 1 in 1-2 above. As the measurement / analysis software, Microscope Application of MetroPro ver9.0.10 was used.

(Calculation procedure of AM1 and AM2)
The "Save Data" button was displayed on the Surface Map screen, and the analyzed 3D curved surface roughness data was saved in the "XYZ File (* .xyz)" format. Next, writing was performed in Excel (registered trademark) of Microsoft Corporation to obtain a two-dimensional function h (x, y) of altitude. The number of raw data obtained is 992 rows vertically x 992 columns horizontally = 984064 points, and the length of one side (MΔx or NΔy) is 218 μm. Data with a horizontal 910 row = 828100 points and a side length of 200 μm were obtained. Next, using the statistical analysis software R (ver 3.6.3), the one-dimensional amplitude spectrum Hx'(fx) of the elevation of each row and each column in the two-dimensional function of elevation (vertical 910 rows x horizontal 910 columns), Hy'(fy) was calculated respectively, and the amplitude values corresponding to the respective spatial frequency values were averaged to obtain a one-dimensional amplitude spectrum H "(f) at altitude. 16 surfaces of each sample were obtained. On the other hand, the one-dimensional function H "(f) of the altitude was measured, and the result of averaging the amplitude values corresponding to the values of the respective spatial frequencies was taken as the one-dimensional amplitude spectrum H (f) of the altitude.
Then, from the obtained data, AM2 extracts the (amplitude at spatial frequency 0.300μm ^-1), AM1 (each spatial frequency 0.005 .mu.m ^-1, 0.010 ^-1, corresponding to 0.015 .mu.m ^-1 Total amplitude) was calculated. Further, Am1 - 1 is the amplitude corresponding to the spatial frequency 0.005 .mu.m ^-1, the amplitude corresponding to the spatial frequency 0.010μm ^-1 AM1-2, an amplitude corresponding to the spatial frequency 0.015 .mu.m ^-1 AM1 The values of -3 are shown in Table 3.
16 to 17 show the discrete function H (f) of the amplitude spectrum of the elevation of the uneven surface of the antiglare film of Example 1 and Comparative Example 1. In the figure, the horizontal axis indicates the spatial frequency (unit is “μm ^-1 ”), and the vertical axis indicates the amplitude (unit is “μm”).

2. 2. Preparation of Antiglare Film [Example 1]
After applying the antiglare layer coating liquid 1 of the following formulation on a transparent substrate (thickness 80 μm triacetyl cellulose resin film (TAC), Fujifilm, TD80UL) and drying at 70 ° C. and a wind speed of 5 m / s for 30 seconds. The antiglare film of Example 1 was obtained by irradiating ultraviolet rays in a nitrogen atmosphere (oxygen concentration of 200 ppm or less) ^{so that the integrated light amount was 100 mJ / cm 2.} The thickness of the antiglare layer was 5.0 μm. The Sa on the side opposite to the antiglare layer of the antiglare film was 0.012 μm.

<Anti-glare layer coating liquid 1>
・ Pentaerythritol triacrylate 58.2 parts (Nippon Kayaku Co., Ltd., trade name: KAYARAD-PET-30)
18.2 parts of urethane acrylate oligomer (DIC Corporation, trade name: V-4000BA)
-Thermoplastic resin 23.6 parts (acrylic polymer, Mitsubishi Rayon, molecular weight 75,000)
・ 63.6 parts of organic particles (Sekisui Plastics Co., Ltd., spherical polyacrylic-styrene copolymer)
(Average particle size 2.0 μm, refractive index 1.515)
(The ratio of particles with a particle size of 1.8 to 2.2 μm is 90% or more)
-230 parts of inorganic fine particle dispersion (Nissan Chemical Industries, Ltd., silica with reactive functional groups introduced on the surface, solvent: MIBK, solid content: 35.5%)
(Average particle size 12 nm)
(Active ingredient of inorganic fine particles: 81.9 parts)
-Photopolymerization initiator 5.5 parts (IGM Resins B.V., trade name: Omnirad 184)
-Photopolymerization initiator 1.8 parts (IGM Resins B.V., trade name: Omnirad 907)
-Silicone leveling agent 0.2 parts (Momentive Performance Materials, trade name: TSF4460)
・ Solvent (toluene) 346.8 parts ・ Solvent 3 17.9 parts (cyclohexanone)

[Examples 2 to 5], [Comparative Examples 1 to 4]
The antiglare of Examples 2 to 5 and Comparative Examples 1 to 4 are the same as in Example 1 except that the antiglare layer coating liquid 1 is changed to the antiglare layer coating liquid of the numbers shown in Table 1. I got a film. The compositions of the antiglare layer coating liquids 2 to 9 are shown below.

<Anti-glare layer coating liquid 2>
The organic particles of the antiglare layer coating liquid 1 were described as "particles having an average particle diameter of 4.0 μm and a refractive index of 1.515 (Sekisui Kasei Co., Ltd., spherical polyacrylic-styrene copolymer, particle diameter of 3.8 to 4.2 μm). A coating liquid having the same composition as that of the antiglare layer coating liquid 1 except that the particles are changed to organic particles having a ratio of 90% or more.

<Anti-glare layer coating liquid 3>
・ Pentaerythritol triacrylate 100 parts (Nippon Kayaku Co., Ltd., trade name: KAYARAD-PET-30)
129.8 parts of organic particles (Sekisui Plastics Co., Ltd., spherical polyacrylic-styrene copolymer)
(Average particle size 2.0 μm, refractive index 1.515)
(The ratio of particles with a particle size of 1.8 to 2.2 μm is 90% or more)
-Photopolymerization initiator 6.4 parts (IGM Resins B.V., trade name: Omnirad 184)
1.0 part of photopolymerization initiator (IGM Resins B.V., trade name: Omnirad 907)
-Silicone leveling agent 0.1 part (Momentive Performance Materials, trade name: TSF4460)
・ Solvent (toluene) 498.4 parts ・ Solvent (cyclohexanone) 55.4 parts

<Anti-glare layer coating liquid 4>
・ Pentaerythritol triacrylate 100 parts (Nippon Kayaku Co., Ltd., trade name: KAYARAD-PET-30)
99.6 parts of organic particles (Sekisui Plastics Co., Ltd., spherical polyacrylic-styrene copolymer)
(Average particle size 2.0 μm, refractive index 1.515)
(The ratio of particles with a particle size of 1.8 to 2.2 μm is 90% or more)
・ 10 parts of silica particles (average particle size: 4.1 μm)
(Fuji Silysia Chemical Ltd., gel method amorphous silica)
-Photopolymerization initiator 6.1 parts (IGM Resins B.V., trade name: Omnirad 184)
1. Photopolymerization Initiator 1.1 parts (IGM Resins B.V., trade name: Omnirad 907)
・ Solvent (toluene) 452.9 parts ・ Solvent (cyclohexanone) 50.3 parts ・ Solvent (ethyl acetate) 2.6 parts

<Anti-glare layer coating liquid 5>
In the antiglare layer coating liquid 1, the amount of the organic particles added was changed from 63.6 parts to 50.0 parts, and the amount of the inorganic fine particle dispersion liquid added was changed from 230 parts to 187 parts. A coating liquid having the same composition as that of liquid 1.

<Anti-glare layer coating liquid 6>
・ Pentaerythritol triacrylate 100 parts (Nippon Kayaku Co., Ltd., trade name: KAYARAD-PET-30)
14 parts of silica particles (average particle size: 4.1 μm)
(Fuji Silysia Chemical Ltd., gel method amorphous silica)
-Photopolymerization initiator 5 parts (IGM Resins B.V., trade name: Omnirad 184)
-Silicone leveling agent 0.2 parts (Momentive Performance Materials, trade name: TSF4460)
・ Solvent (toluene) 150 parts ・ Solvent (MIBK) 35 parts ・ Solvent (ethyl acetate) 5.2 parts

<Anti-glare layer coating liquid 7>
91.5 parts of pentaerythritol triacrylate (Nippon Kayaku Co., Ltd., trade name: KAYARAD-PET-30)
-Urethane acrylate oligomer 8.5 parts (DIC Corporation, trade name: V-4000BA)
-Two parts of organic particles (Sekisui Plastics Co., Ltd., spherical polyacrylic-styrene copolymer)
(Average particle size 5.0 μm, refractive index 1.550)
・ 15 parts of silica particles (average particle size: 4.1 μm)
(Fuji Silysia Chemical Ltd., gel method amorphous silica)
-Photopolymerization initiator 1.9 parts (IGM Resins B.V., trade name: Omnirad 184)
-Photopolymerization initiator 7 parts (IGM Resins B.V., trade name: Omnirad 907)
-Silicone leveling agent 0.1 part (Momentive Performance Materials, trade name: TSF4460)
・ Solvent (toluene) 161.1 parts ・ Solvent (cyclohexanone) 69 parts ・ Solvent (ethyl acetate) 3.9 parts

<Anti-glare layer coating liquid 8>
・ Pentaerythritol triacrylate 50.6 parts (Nippon Kayaku Co., Ltd., trade name: KAYARAD-PET-30)
-Urethane acrylate oligomer 49.4 parts (DIC Corporation, trade name: V-4000BA)
・ 3 parts of organic particles (Sekisui Plastics Co., Ltd., spherical polyacrylic-styrene copolymer)
(Average particle size 2.0 μm, refractive index 1.545 μm)
-Silica particles 1 part (average particle size: 12 nm)
(Fumed silica manufactured by Aerosil Japan)
-Photopolymerization initiator 1 part (IGM Resins B.V., trade name: Omnirad 184)
0.2 parts of photopolymerization initiator (IGM Resins B.V., trade name: Omnirad 907)
-Photopolymerization initiator 1.5 parts (Lamberti, ESACUREONE)
-Silicone leveling agent 0.1 part (Momentive Performance Materials, trade name: TSF4460)
・ Solvent (toluene) 98.6 parts ・ Solvent (cyclohexanone) 38.7 parts ・ Solvent (isopropyl alcohol) 44.1 parts ・ Solvent (MIBK) 2.4 parts

<Anti-glare layer coating liquid 9>
・ Pentaerythritol triacrylate 65 parts (Nippon Kayaku Co., Ltd., trade name: KAYARAD-PET-30)
-35 parts of urethane acrylate oligomer (DIC, trade name: V-4000BA)
・ 14 parts of organic particles (Sekisui Plastics Co., Ltd., spherical polyacrylic-styrene copolymer)
(Average particle size 3.5 μm, refractive index 1.550)
・ 6 parts of silica particles (average particle size: 12 nm)
(Fumed silica manufactured by Aerosil Japan)
-Photopolymerization initiator 5 parts (IGM Resins B.V., trade name: Omnirad 184)
-Silicone leveling agent 0.025 parts (Momentive Performance Materials, trade name: TSF4460)
・ Solvent (toluene) 100 parts ・ Solvent (cyclohexanone) 20 parts ・ Solvent (isopropyl alcohol) 55 parts

From the results in Table 1, it can be confirmed that the antiglare film of the example is excellent in antiglare property, suppresses reflected scattered light, and is excellent in jet blackness.

10: Transparent substrate 20: Anti-glare layer 21: Binder resin 22: Organic particles 100: Anti-glare film 110: Display element 120: Image display device 200: Observer

Claims (14)

An antiglare film having an antiglare layer, wherein the antiglare film has an uneven surface and the smoothing reflected light intensity measured under the following measurement conditions satisfies the following conditions 1 and 2.
<Measurement conditions>
(1) In the transmission measurement mode of the variable-angle photometer, visible light is emitted as parallel light from the light source of the variable-angle photometer, and the intensity of the emitted light is measured at an opening angle of 1 degree without going through the sample, and the maximum is reached. Standardize so that the strength is 100,000.
(2) A black plate is attached to the surface of the antiglare film on the side opposite to the uneven surface of the antiglare film via a transparent adhesive layer, and the antiglare film, the transparent adhesive layer and the black plate are laminated. A sample α having the uneven surface is prepared.
(3) The sample α is placed on the variable-angle photometer, and the uneven surface of the sample α is irradiated with visible light as parallel light from the light source of the variable-angle photometer, and the reflected light intensity is set to an opening angle of 1 degree. Measure with. The irradiation angle of the parallel light beam shall be a direction inclined by +45 degrees from the normal direction of the sample α. The reflected light intensity is measured at 1 degree intervals from 0 degrees to −85 degrees, which is the normal direction of the sample α. Further, in order to maintain the effect of the standard adjustment of (1), the reflected light intensity is measured in the transmission measurement mode.
(4) The smoothing process represented by the following formula (i) is performed at each angle from 0 degrees to −85 degrees, and the reflected light intensity after the smoothing process is defined as the smoothed reflected light intensity at each angle.
N degree smoothing reflected light intensity = ([n-2 degree reflected light intensity] + [n-1 degree reflected light intensity] + [n degree reflected light intensity] + [n + 1 degree reflected light intensity] + [Reflected light intensity of n + 2 degrees]) / 5 (i)
<Condition 1>
When the smoothed reflected light intensity of n degrees is defined as Rn and the smoothed reflected light intensity of n-1 degrees is defined as Rn-1, the maximum value of the absolute value of the difference between Rn and Rn-1 is 2.00 or less. ..
<Condition 2>
Smoothed reflected light intensity of -35 degrees is 4.0 or less. The antiglare film according to claim 1, wherein the maximum value of the absolute value of the difference is 1.00 or less under condition 1. The antiglare film according to claim 1 or 2, which further satisfies the following condition 3.
<Condition 3>
Smoothed reflected light intensity of -45 degrees is 8.0 or less. The antiglare film according to any one of claims 1 to 3, wherein the haze of JIS K7136: 2000 is 60 to 98%. The antiglare film according to any one of claims 1 to 4, wherein the antiglare layer contains a binder resin and particles. The antiglare film according to claim 5, wherein the D / T is 0.20 to 0.96 when the thickness of the antiglare layer is defined as T and the average particle size of the particles is defined as D. The antiglare film according to claim 5 or 6, wherein the average particle size D of the particles is 1.0 to 5.0 μm. The antiglare film according to any one of claims 5 to 7, which contains 40 to 200 parts by mass of the particles with respect to 100 parts by mass of the binder resin. The antiglare film according to any one of claims 5 to 8, wherein the particles are organic particles. The antiglare film according to any one of claims 5 to 9, wherein the antiglare layer further contains inorganic fine particles. The antiglare film according to claim 10, wherein the inorganic fine particles are contained in an amount of 40 to 200 parts by mass with respect to 100 parts by mass of the binder resin. The antiglare film according to any one of claims 5 to 11, wherein the binder resin contains a cured product of an ionizing radiation curable resin composition and a thermoplastic resin. The antiglare film according to any one of claims 1 to 12, further comprising an antireflection layer on the antiglare layer, and the surface of the antireflection layer is the uneven surface. The surface of the antiglare film according to any one of claims 1 to 13 on the uneven surface side is arranged on the display element so as to face the side opposite to the display element, and the antiglare film is the most. An image display device placed on the surface.

Images