JP2021103121A - Blister testing machine and blister testing method - Google Patents

Abstract

To provide a blister testing machine and a blister testing method that can speedily heat a test piece up to a set temperature so as to shorten a measurement time, and can suppress overshooting caused as a result.SOLUTION: A blister testing machine 1 comprises: a test piece retainer 3 which retains a test piece; a heater 4 which heats the test piece up to a set temperature set to be lower than the fusion point of the test piece; a temperature sensor 6 which detects a temperature of the test piece; a cooling device 5 which sends a gas to the test piece; and a control device 7 which controls the cooling device 5. The control device 7 controls, when a detection result obtained from the temperature sensor 6 becomes larger than a previously set threshold as a result of a rise responding to heating by the heater 4, the cooling device 5 to send the gas to the test piece.SELECTED DRAWING: Figure 1

Description

The present invention relates to a blister tester and a blister test method.

It has long been known that castings such as die castings are formed with cavities by entraining air, decomposition gas of a mold release agent, or the like in the casting process. The cavities are cavities generated inside the casting, and the casting in which the cavities are formed is a defective product.

The cavities can be inspected by heating the casting. When a casting having a cavity is heated, bubbles (blisters) appear on the surface of the casting, and the presence or absence of the blister indicates the presence or absence of the cavities. A blister tester is known as an apparatus for performing this (see, for example, Patent Document 1).

In this type of blister tester, a molten salt is placed in a heating pot, and a casting such as die casting is immersed therein to heat the casting. Heat the casting to a temperature at which blisters can occur, and check the status of blisters.

Jitsuto 300 9463 Gazette

By the way, in the blister tester described in Patent Document 1, the temperature of the casting is raised by immersing the casting in the molten salt, but since it takes time to handle and manage the molten salt, a heater is used. It is considered to heat the casting.

In order to use a heater to heat a casting in a short time to a temperature at which blisters can occur, it is necessary to drive the heater at a high output. However, when the heater is driven at a high output, the temperature rise of the casting becomes steep, and it is easy to overshoot the target temperature, which may affect the generation of blisters.

The present invention has been made in view of the above circumstances, and provides a blister tester and a blister test method capable of quickly heating a test piece to a set temperature in order to shorten the measurement time and suppressing an overshoot caused thereby. The purpose is.

In one aspect of the blister tester according to the present invention, a test body holder for holding the test body, a heater for heating the test body to a set temperature set smaller than the melting point of the test body, and a temperature of the test body are used. It includes a temperature sensor for detecting, a cooling device for sending gas to the test piece, and a control device for controlling the cooling device. The control device controls the cooling device so as to send gas to the test piece when the detection result obtained from the temperature sensor rises in response to heating by the heater and becomes equal to or higher than a preset threshold value.

One aspect of the blister test method according to the present invention is a blister test method for evaluating the blister expressed in the test body by heating the test body to a set temperature set below the melting point of the test body. As a result of heating the test body, the temperature of the test body rises, and when the test body exceeds a predetermined temperature value, a cooling gas is sent to the test body.

The blister tester and the blister test method according to the above aspect according to the present invention have an advantage that the test piece can be quickly heated to a set temperature in order to shorten the measurement time, and the overshoot that accompanies it can be suppressed. ..

FIG. 1 is a schematic cross-sectional view of a blister testing machine according to an embodiment of the present invention. FIG. 2 is a block diagram of the control device of the blister tester of the same as above. FIG. 3 is a flowchart illustrating the operation of the blister tester as described above. FIG. 4 is a graph showing the relationship between the temperature rise time and the work temperature in Examples and Comparative Examples. 5 (A) and 5 (B) are flowcharts for explaining the operation of the blister tester according to the modified example.

(1) Overall Embodiment (1.1) Hereinafter, the blister tester 1 according to the present embodiment will be described in detail.

The blister tester 1 is an apparatus for carrying out the blister test method, and heats the test piece X1 above the softening point. The test body X1 heated to the softening point or higher develops swelling such as bubbles depending on the amount of gas contained in the test body X1. In the blister test method, the test piece X1 can be inspected by evaluating the state of occurrence of this swelling visually or by an image recognition technique.

The "test body X1" referred to here means an object to be inspected in the blister test method. The “test body X1” may be, for example, a sample of an actual product or a part of a material constituting the product. Examples of the test body X1 include aluminum alloys, aluminum magnesium alloys, zinc, copper, and alloys obtained by combining at least two of these. Hereinafter, a case where an aluminum die-cast product composed of ADC 12 is used as the test body X1 will be described.

Further, the "softening point" means the temperature (softening temperature) at which the test piece X1 begins to be deformed by heating. The "softening point" here means the temperature at which the metal is softened by heating and the metal begins to expand due to the expansion of the gas inside the metal. For example, the softening point of an aluminum die-cast product composed of ADC 12 is 535 ° C. The "melting point" as used herein means the temperature at which the test piece X1 melts into a completely liquid state, and it is assumed that the melting point> the softening point.

As shown in FIG. 1, the blister tester 1 includes a furnace 2, a specimen holder 3, a plurality of heaters 4, a cooling device 5, a temperature sensor 6 (FIG. 2), and a control device 7. Be prepared.

(1.2) Reactor Reactor 2 is a box-shaped instrument that houses a test piece holder 3, a heater 4, and a temperature sensor 6 inside. The furnace 2 includes heat insulating materials 21 and 22, and an opening / closing lid 23. In the following, as the heat insulating materials 21 and 22, the heat insulating material inside the furnace 2 is referred to as the inner heat insulating material 21, and the outer heat insulating material is referred to as the outer heat insulating material 22.

The inner heat insulating material 21 is a heat insulating material that forms an accommodating space for accommodating the test body X1 inside. The material of the inner heat insulating material 21 is not particularly limited, and examples thereof include ceramics, metal, white porcelain, platinum, quartz, and alumina. Examples of ceramics include silica, magnesia, and calcia. The inner heat insulating material 21 includes a bottom wall 211, a peripheral wall 212, and a top wall 213, and is formed in a bottomed box shape. The top wall 213 is formed with an opening 214 that penetrates inside and outside. The specimen holder 3 is attached to the opening / closing lid 23, and by moving the opening / closing lid 23 upward, the specimen holder 3 can be positioned above the top wall 213 through the opening 214. it can. On the other hand, by moving the opening / closing lid 23 downward, the opening 214 can be closed and the test piece holder 3 can be arranged at a predetermined position. Therefore, the user places the test body X1 on the test body holder 3 with the test body holder 3 positioned above the top wall 213, and then lowers the opening / closing lid 23 to lower the test body X1. Can be stored inside.

The outer heat insulating material 22 covers the outer surface of the inner heat insulating material 21, and specifically, at least covers the bottom wall 211 and the peripheral wall 212 of the inner heat insulating material 21. By covering the outer surface of the inner heat insulating material 21 with the outer heat insulating material 22, the temperature inside the inner heat insulating material 21 can be maintained, and even if the inner heat insulating material 21 becomes hot, the inner heat insulating material 21 can be used. It is possible to prevent the user from contacting.

The opening / closing lid 23 closes the opening 214 of the top wall 213 of the inner heat insulating material 21 so as to be openable / closable. The opening / closing lid 23 moves in the vertical direction between the first position for closing the opening 214 and the second position for opening the opening 214. The opening / closing lid 23 is moved by, for example, an air cylinder, a hydraulic cylinder, an electric cylinder, a linear actuator, a crane, a hoisting device, or the like. The material of the opening / closing lid 23 is not particularly limited, and examples thereof include ceramics, metal, white porcelain, platinum, quartz, and alumina.

The furnace 2 is formed with an air supply hole 24 for entering the gas sent from the cooling device 5 and an exhaust hole 25 for exhausting the gas inside. The air supply hole 24 penetrates the bottom wall 211 of the inner heat insulating material 21 and the outer heat insulating material 22 that covers the bottom wall 211. The exhaust hole 25 penetrates the peripheral wall 212 of the inner heat insulating material 21 and the outer heat insulating material 22 that covers the peripheral wall 212. However, in the present invention, there is no particular limitation on the positions where the air supply holes 24 and the exhaust holes 25 are formed.

A cooling device 5 described later is connected to the air supply hole 24. The cooling device 5 supplies gas into the furnace 2 from the air supply hole 24, and the gas supplied from the cooling device 5 is blown out from the inner opening of the furnace 2 in the air supply hole 24 toward the test piece X1. Thereby, the temperature of the test body X1 in the high temperature state can be lowered. This will be described in detail in "(2) Operation example" described later.

(1.3) Specimen retainer The specimen retainer 3 holds the specimen X1 in the furnace 2. The term "holding" as used herein means keeping the position of the test piece X1 in the furnace 2. In addition to maintaining the position by fixing the test body X1 in the furnace 2 with a jig or the like, for example, by fitting the test body X1 on a concave or concave curved surface, the position of the test body X1 in the furnace 2 can be determined. Keeping the test piece X1 and keeping the position of the test piece X1 in the furnace 2 by placing the test piece X1 on a flat surface are also included in the category of "holding" here. The test body holder 3 according to the present embodiment includes a flat mounting table 31 and a support portion 32 that supports the mounting table 31.

The mounting table 31 is a portion on which the test body X1 is placed. In the present embodiment, the mounting table 31 has a flat plate shape, but in the present invention, the mounting table 31 may have, for example, a syndric shape, a spherical shape, a donut shape, a wavefront shape, a container shape, or the like. The mounting table 31 has a plurality of through holes penetrating in the thickness direction. As a result, infrared rays and gas directed to the test body X1 mounted on the mounting table 31 can be passed through. The mounting table 31 is made of, for example, a net body, a punching metal, an expanded metal, or the like, but is preferably made of a net body from the viewpoint of passing infrared rays as efficiently as possible.

The mounting table 31 is arranged at a position facing the air supply hole 24 of the bottom wall 211, and is arranged at a position where it can easily hit the gas emitted from the air supply hole 24. Further, the mounting table 31 is supported by the opening / closing lid 23 by the support portion 32, and is arranged below the opening / closing opening 214 when the opening / closing lid 23 closes the opening / closing opening 214. The upper surface (sometimes referred to as the mounting surface) and the lower surface of the mounting table 31 are along a horizontal plane.

The support portion 32 is a portion that supports the mounting table 31. The support portion 32 supports the mounting base 31 by suspending the mounting base 31 from the opening / closing lid 23. However, the support portion 32 is not limited to the structure in which the mounting base 31 is suspended from the opening / closing lid 23, and the mounting base 31 may be suspended from the top wall 213, or the pillar material is raised from the bottom wall 211 and the pillar material is raised. A mounting table 31 may be provided at the upper end of the wall, or a horizontal member may be hung between the facing peripheral walls 212 to provide a mounting table 31 on the horizontal member, or the peripheral wall 212 may be formed in a cantilever shape. The cross member may be projected and the mounting table 31 may be provided on the cross member.

(1.4) Heater The heater 4 heats the test piece X1 to a set temperature. The heater 4 is feedback-controlled by the control device 7 based on the detection result of the temperature sensor 6. The feedback control is not particularly limited, and includes PID (Proportional-Integral-Differential) control, PD control (differential control), P control (proportional control), etc., but the output of the heater 4 can be finely controlled. PID control is preferable from the viewpoint of being able to do so.

The "set temperature" here means the temperature of the test body X1 which is the target when the test body X1 is heated. The set temperature is set smaller than the melting point. In the present embodiment, the set temperature is set to be smaller than the melting point and above the softening point. In this embodiment, the set temperature is, for example, 535 ° C.

Each heater 4 is a rod-shaped infrared heater that irradiates the test body X1 with infrared rays. The plurality of heaters 4 (eight in this case) surround the mounting table 31 when viewed from above (hereinafter referred to as a plan view). The plurality of infrared heaters are arranged along the peripheral wall 212 of the inner heat insulating material 21.

However, in the present invention, the number of the plurality of infrared heaters is not limited to eight, and may be seven or less, or nine or more. Further, the infrared heater may not be arranged so as to surround the mounting table 31 in a plan view, and may be arranged in either one or both of the mounting table 31 in the vertical direction. In this case, the test piece X1 may be heated by one infrared heater. A power source is connected to each infrared heater, and electric power is supplied.

Examples of the infrared heater include a sheathed heater, a ceramic heater, a quartz heater, a carbon lamp heater, a halogen lamp heater (tungsten heater), and the like, but a carbon lamp heater is preferable from the viewpoint of thermal efficiency.

A halogen lamp heater is a heater in which linear tungsten is passed as a heating element in a quartz tube filled with halogen gas. The halogen lamp heater emits infrared rays evenly over the entire circumference of the quartz tube. Therefore, according to the halogen lamp heater, the test body X1 is indirectly irradiated from the inside of the furnace 2 having heat by the infrared rays directly emitted from the halogen lamp heater and the infrared rays emitted from the halogen lamp heater. It is possible to irradiate infrared rays from both the emitted infrared rays.

A carbon lamp heater is a heater in which carbon fiber, which is a conductive material, is used for a heating element. Compared to halogen lamp heaters, carbon lamp heaters have more radiant energy in the mid-infrared region. The heating element of the carbon lamp heater is formed in a substantially flat shape, and emits infrared rays mainly in the direction orthogonal to the heating element. The heating element of the carbon lamp heater emits almost no infrared rays in a range exceeding 30 ° with respect to the direction orthogonal to the heating element. Therefore, the carbon lamp heater has higher directivity than the halogen lamp heater that radiates over 360 °, and can directly irradiate the test body X1 with infrared rays.

The infrared heater is arranged in a direction and position so that infrared rays are irradiated to the test body X1. Of the infrared rays radiated from the heating element, the infrared rays that are not directly radiated to the test body X1 are radiated to the inner surface of the furnace 2 and heat the furnace 2. Then, the heated furnace 2 heats the test body X1 by radiant heat.

The heating temperature (heating element temperature) of each infrared heater is preferably 1050 ° C or higher and 1650 ° C or lower, more preferably 1250 ° C or higher and 1650 ° C or lower, and further preferably 1650 ° C. By using an infrared heater as the heater 4, the time required for the test piece X1 to rise from room temperature to a set temperature can be shortened.

However, in the present invention, the heat generation temperature of each heater 4 may be outside the range of 1050 ° C. or higher and 1650 ° C. or lower. Further, the infrared heater preferably radiates mainly mid-infrared rays (mostly in the intensity ratio), but may radiate mainly near-infrared rays or far-infrared rays (wavelength 25 μm or more and less than 1 mm).

(1.5) Cooling device The cooling device 5 is a device that sends gas to the test piece X1. When the cooling device 5 sends gas to the test body X1, an air flow is generated around the test body X1 and the gas around the test body X1 moves. Then, the temperature of the test body X1 is lowered by heat exchange between the test body X1 and the gas in contact with the test body X1. Therefore, the term "sending gas" here includes a case where the gas is sent so that the gas flows around the test body X1 and a case where the gas is blown onto the test body X1.

In the present embodiment, gas is sent from the air supply hole 24 of the bottom wall 211, but the gas is blown to the test body X1 through the through hole of the mounting table 31. When the gas is blown onto the test body X1, the gas around the test body X1 also moves at the same time. Therefore, the surface temperature of the test body X1 can be brought close to uniform, and the temperature unevenness on the surface of the test body X1 can be suppressed.

As shown in FIG. 1, the cooling device 5 includes a gas supply source 51, a flow path 52, and a control valve 53.

The supply source 51 is a portion that serves as a base for supplying gas. The supply source 51 is a compressor in the present embodiment, but may be, for example, a blower, a cylinder containing a positive pressure gas, or the like. The supply source 51 supplies compressed air (air) as a gas. However, the gas supplied from the supply source 51 is not limited to air, and may be, for example, another inert gas such as hydrogen gas or sulfur hexafluoride gas.

The flow path 52 is a path connecting the supply source 51 and the inside of the furnace 2. The gas supplied from the supply source 51 is supplied into the furnace 2 through the flow path 52.

The control valve 53 is provided in the flow path 52 and controls the flow rate of the gas passing through the flow path 52. Examples of the control valve 53 include a solenoid valve, an electric valve, an air-driven valve, and the like. In the present embodiment, the solenoid valve is used. The control valve 53 switches the valve body between a position in the flow path 52 that allows the passage of gas (this is referred to as “ON”) and a position in the flow path 52 that does not allow the passage of gas (this is referred to as “OFF”). .. The control valve 53 is driven and controlled by the control device 7.

(1.6) Temperature sensor The temperature sensor 6 detects the temperature of the test piece X1. The temperature sensor 6 can detect the temperatures at a plurality of different locations on the test body X1. The detection result obtained by the temperature sensor 6 may adopt the temperature of a specific location among the temperatures of the plurality of locations, or may adopt the highest temperature or the lowest temperature among the temperatures of the plurality of locations. , The temperature obtained by averaging the temperatures of a plurality of locations may be adopted.

The temperature sensor 6 is a contact type sensor in this embodiment. However, the temperature sensor 6 is not limited to the contact type sensor, and may be a non-contact sensor. The temperature sensor 6 is arranged in the furnace 2 and outputs an electric signal generated by detecting the temperature to the control device 7.

(1.7) Control device The control device 7 is composed of, for example, a computer having a processor and a memory. The processor executes various processes by executing a program stored in the memory. As shown in FIG. 2, the control device 7 includes a determination unit 71, a cooling device control unit 72 that controls the cooling device 5, and a heater control unit 73 that controls the output of the heater 4.

(1.7.1) Judgment unit When an electric signal from the temperature sensor 6 is input, the determination unit 71 determines whether or not the temperature of the test body X1 is equal to or higher than the threshold value. The threshold value is a numerical value for the cooling device control unit 72 to switch the control valve 53 to ON and / or to start the heater 4 output reduction by the heater control unit 73. That is, when the temperature of the test body X1 becomes equal to or higher than the threshold value, air is sent to the test body X1 by the cooling device 5, the output of the heater 4 is suppressed, and the temperature rise of the test body X1 is suppressed.

The information obtained by the determination unit 71 (hereinafter referred to as determination information) is output to the cooling device control unit 72 and the heater control unit 73.

(1.7.2) Cooling device control unit The cooling device control unit 72 controls the cooling device 5. Specifically, the cooling device control unit 72 switches between ON and OFF of the control valve 53, thereby switching between a state of sending gas into the furnace 2 and a state of stopping sending gas. The cooling device control unit 72 executes drive control of the control valve 53 based on the determination information input from the determination unit 71.

When the information that the temperature of the test body X1 is equal to or higher than the threshold value is input as the determination information, the cooling device control unit 72 switches the control valve 53 to ON. When the control valve 53 is switched to ON, gas is sent to the test body X1 in the furnace 2, and as a result, the temperature of the test body X1 drops.

Here, the steeper the temperature gradient of heating by the heater 4 until the set temperature is reached, the more likely it is that an overshoot will occur when the set temperature is reached. However, in the present embodiment, the predetermined temperature (for example, for example) is higher than the set temperature. The threshold is set low (20 ° C or higher and 30 ° or lower). Therefore, when the temperature of the test body X1 is lower than the set temperature, gas is sent from the cooling device 5, so that the temperature gradient becomes gentle just before reaching the set temperature and exceeds the temperature of the test body X1. Shooting is unlikely to occur. Therefore, according to the blister tester 1 according to the present embodiment, for example, the heater 4 is output at the maximum output from room temperature to the set temperature, and the test piece X1 is heated to the set temperature in a short time. When it reaches, overshoot can be prevented.

The threshold value is appropriately set to a value that appropriately suppresses overshoot, taking into consideration, for example, the size and material of the test piece X1, the flow rate of the gas supplied by the cooling device 5, the temperature of the gas, the output value of the heater 4, and the like. Set. In the blister tester 1 according to the present embodiment, the threshold value is set to 509 ° C. under the condition that air at room temperature having a flow rate of 100 L / min is supplied into the furnace 2 for the test body X1 of 300 g.

The threshold value may be set to a value higher than the set temperature as long as the overshoot when the temperature of the test body X1 reaches the set temperature can be suppressed within a predetermined range. For example, the threshold value may be set to a temperature equal to or higher than the set temperature by increasing the flow rate of the gas sprayed on the test body X1 or lowering the temperature of the gas below room temperature. The "predetermined range" here means a range in which the blister test is less likely to be affected by the overshoot, and examples thereof include a range of the set temperature + 10 ° C. or lower. An appropriate value can be obtained for the threshold value by repeatedly trying the test on the test body X1.

(1.7.3) Heater control unit The heater control unit 73 controls the output of the heater 4. As described above, the heater control unit 73 maintains the temperature of the test body X1 at the set temperature by feedback-controlling the heater 4, but in the present embodiment, the determination unit 71 is in the process from the initial temperature to the set temperature. However, when it is determined that the temperature of the test body X1 is equal to or higher than the threshold value, the output of the heater 4 is lowered.

Therefore, in addition to switching the control valve 53 by the cooling device 5 to ON, the heater 4 is also controlled to reduce the output. Therefore, in the process of heating the test body X1 from the initial temperature to the set temperature, the heater 4 is used. It is possible to effectively suppress the occurrence of overshoot while heating in a short time by increasing the output of the above as much as possible.

After heating the test body X1 from the initial temperature to the set temperature, the heater control unit 73 performs feedback control (here, PID control) for setting the set temperature to the target temperature in cooperation with the cooling device 5. Execute.

In the cooling device control unit 72 according to the present embodiment, the test is completed when the gas sent to the test body X1 is sent to the test body X1 for a predetermined time (here, when the temperature of the test body X1 becomes equal to or higher than the threshold value). The cooling device 5 is controlled so as to continuously feed the gas. Then, in response to this, the heater control unit 73 executes feedback control on the heater 4 based on the detection result of the temperature sensor 6 while corresponding to the predetermined time.

Generally, if the time for turning off the output of the heater 4 continues for a predetermined time (for example, 10 seconds or more), the feedback control (PID control) tends to become unstable. However, according to the blister tester 1 according to the present embodiment, since the output of the heater 4 is maintained at a low output while the cooling device 5 is driven, it is possible to prevent the feedback control from becoming unstable.

(2) Operation Example Next, an operation example of the blister tester 1 according to the present embodiment will be described with reference to the flowchart of FIG.

As shown in FIG. 3, when the operation of the blister tester 1 is started, the control device 7 activates the heater 4 to radiate infrared rays. As a result, the test piece X1 is heated (steps 1 and 2).

When the test body X1 is heated, the temperature sensor 6 detects the temperature of the test body X1. When the determination unit 71 determines from the detection result by the temperature sensor 6 whether or not the temperature value of the test body X1 is equal to or higher than the threshold value (step 3) and determines that the temperature value of the test body X1 is less than the threshold value. The heater control unit 73 continues to radiate infrared rays by the heater 4 (step 3 → step 2).

On the other hand, when the determination unit 71 determines that the temperature value of the test body X1 is equal to or higher than the threshold value, the cooling device control unit 72 switches the control valve 53 to ON and sends gas to the test body X1 (step 3 → Step 4). Further, the heater control unit 73 controls the output of the heater 4 to lower the output of the heater 4 than before reaching the threshold value (step 5). After that, feedback control is executed for the heater 4 to maintain the temperature of the test body X1 at the set temperature (here, 535 ° C.) (step 6). For example, after the temperature of the test body X1 reaches the set temperature, the driving of the cooling device 5 and the heater 4 is continued for about 3 minutes.

As a result, blisters may occur in the test body X1. In this way, in order to maximize the output of the heater 4 until the threshold value is reached, for example, heating for about 1.8 minutes and then maintaining the temperature for 1 minute, for a total of about 3 minutes, is a test piece. X1 blisters can occur. Therefore, according to the blister testing machine according to the present embodiment, the test can be realized in a relatively short time.

(3) Test The blister test method was carried out using the same blister tester 1 as in the above embodiment. A graph of the temperature change at this time is shown in FIG.

The set temperature of the examples was set to 535 ° C, and the threshold value was set to 509 ° C. The gas blown by the cooling device 5 was room temperature air having a flow rate of 100 L / min. An infrared heater was used as the heater 4, and when the temperature of the test piece X1 exceeded the threshold value, the output of the heater 4 was lowered.

An example in which gas was not blown by the cooling device 5 under the same conditions as in the examples was used as a comparative example. Here, when the temperature of the test body X1 becomes 509 ° C. or higher, the output of the heater 4 is lowered as in the embodiment.

As shown in FIG. 4, the maximum temperature of the comparative example was 561.9 ° C., and an overshoot of 25 ° C. or higher was observed with respect to the set temperature of 535 ° C. On the other hand, the maximum temperature of the example was suppressed to 538.6 ° C, and the overshoot remained at about 3.6 ° C with respect to the set temperature of 535 ° C.

From this test result, it was found that the cooling device 5 appropriately suppresses the overshoot.

(4) Modified Example The above embodiment is only one of various embodiments of the present invention. The embodiment can be changed in various ways depending on the design and the like as long as the object of the present invention can be achieved. Hereinafter, modified examples of the embodiments are listed. The modifications described below can be applied in combination as appropriate.

In the above embodiment, the control device 7 includes a cooling device control unit 72 and a heater control unit 73, and controls in conjunction with each other. However, in the present invention, the cooling device control unit 72 and the heater control unit 72 are used. Control may be performed independently of 73. For example, FIGS. 5A and 5B show a flowchart for independently controlling the heater 4 and the cooling device 5.

As shown in FIG. 5A, when the operation of the blister tester 1 is started, the heater control unit 73 activates the heater 4 to radiate infrared rays. As a result, the test piece X1 is heated (steps 1A and 2A). When the test body X1 is heated, the temperature sensor 6 detects the temperature of the test body X1. When the determination unit 71 determines from the detection result by the temperature sensor 6 whether or not the temperature value of the test body X1 is equal to or higher than the threshold value (step 3A) and determines that the temperature value of the test body X1 is equal to or higher than the threshold value. The cooling device control unit 72 switches the control valve 53 to ON, sends gas to the test body X1 (step 4A), and stops the cooling device 5 after a certain period of time has elapsed.

On the other hand, the heater control unit 73 controls the heater 4 as follows. The heater control unit 73 activates the heater 4 (step 1B) and radiates infrared rays (step 2B). After that, the heater control unit 73 executes feedback control on the heater 4 regardless of whether or not the test body X1 is equal to or higher than the threshold value (step 3B), and stops the heater 4 after a lapse of a certain period of time.

Therefore, according to this modification, unlike the first embodiment, as a result, the control of the output decrease of the heater may be executed earlier than the ON switching of the control valve.

In the above embodiment, the control device 7 controls the cooling device 5 so as to continuously send gas to the test body X1 without intermittent operation. However, in the present invention, the test body X1 On the other hand, the cooling device 5 may be controlled so as to send the gas intermittently. For example, with the set temperature + 5 ° C as the threshold, when the temperature of the test body X1 reaches the set temperature + 5 ° C, the control valve 53 is switched to ON, and then the temperature of the test body X1 drops and the temperature of the test body X1 is set. The control of switching the control valve 53 to OFF when the temperature is reached may be repeatedly executed.

In the above embodiment, each heater 4 is formed in a rod shape, but in the present invention, it may be a planar heater. Further, the heater 4 is not limited to the infrared heater, and may be another heater.

In the above embodiment, the plurality of heaters 4 are arranged along the inner surface of the furnace 2, but in the present invention, they may be embedded in the wall of the furnace 2 and installed.

In the above embodiment, one control device 7 includes a cooling device control unit 72 and a heater control unit 73, but these do not have to be built in one housing and are in separate housings. It may be arranged in a distributed manner.

(5) Aspects As described above, in the blister tester 1 according to the first aspect, the test body holder 3 for holding the test body X1 and the test body X1 are set to be smaller than the melting point of the test body X1. A heater 4 for heating to a set temperature, a temperature sensor 6 for detecting the temperature of the test body X1, a cooling device 5 for sending gas to the test body X1, and a control device 7 for controlling the cooling device 5 are provided. .. The control device 7 is a cooling device 5 so as to send a gas to the test body X1 when the detection result obtained from the temperature sensor 6 rises in response to the heating by the heater 4 and becomes equal to or higher than a preset threshold value. To control.

According to this aspect, the heater 4 can quickly heat the test piece X1 to a set temperature in order to shorten the measurement time, and can suppress the overshoot that occurs with the heater 4.

In the blister tester 1 according to the second aspect, in the first aspect, the threshold value is set lower than the set temperature.

According to this aspect, it is possible to more effectively suppress the overshoot that occurs when the test piece X1 is heated to a set temperature.

In the blister tester 1 according to the third aspect, in the first or second aspect, the heater 4 is an infrared heater that irradiates the test body X1 with infrared rays.

According to this aspect, the heating time when heating from the initial temperature to the set temperature can be shortened, and the overshoot that tends to occur at that time can be suppressed.

The blister tester 1 according to the fourth aspect further includes a heater control unit 73 that controls the output of the heater 4 in any one of the first to third aspects. The heater control unit 73 controls the heater 4 so as to reduce the output of the heater 4 when the detection result obtained from the temperature sensor 6 rises in response to the heating by the heater 4 and becomes equal to or higher than the threshold value.

According to this aspect, it is possible to more effectively suppress the overshoot that occurs when the test piece X1 is heated to a set temperature.

In the blister tester 1 according to the fifth aspect, in the fourth aspect, the control device 7 controls the cooling device 5 so as to maintain a state of sending gas to the test body X1 for a predetermined time. The heater control unit 73 controls the output of the heater 4 based on the detection result of the temperature sensor 6 while corresponding to a predetermined time.

According to this aspect, stable feedback control can be realized for the control of the heater 4.

In the blister tester 1 according to the sixth aspect, the gas is air in any one of the first to fifth aspects.

According to this aspect, the gas can be obtained from the environment in which the blister tester 1 is installed without separately preparing the gas.

In the blister tester 1 according to the seventh aspect, in any one of the first to sixth aspects, the cooling device 5 is configured to blow gas onto the test body X1.

According to this aspect, the temperature of the test body X1 can be effectively lowered, and the overshoot that occurs when the test body X1 is heated to the set temperature can be suppressed more effectively.

The testing machine according to the eighth aspect further includes a furnace 2 for accommodating the specimen holder 3. The cooling device 5 has a gas supply source 51, a flow path 52 connecting the supply source 51 and the inside of the furnace 2, and a control valve 53 provided in the flow path 52 and driven and controlled by the control device 7.

According to this aspect, the cooling device 5 having a simplified configuration can be installed.

The blister test method according to the ninth aspect is a blister test method for evaluating the blister expressed in the test body X1 by heating the test body X1 to a set temperature set below the melting point of the test body X1. As a result of heating the test body X1, the temperature of the test body X1 rises, and when the test body X1 becomes equal to or higher than a predetermined temperature value, a cooling gas is sent to the test body X1.

According to this aspect, the overshoot that occurs when the test piece X1 is heated to a set temperature can be suppressed.

The configuration according to the second to eighth aspects is not an essential configuration for the blister tester 1, and can be omitted as appropriate.

1 Blister tester 2 Furnace 3 Specimen holder 4 Heater 5 Cooling device 51 Source 52 Flow path 53 Control valve 6 Temperature sensor 7 Control device X1 Specimen

Claims (9)

Specimen holder for holding the specimen and
A heater that heats the test piece to a set temperature set smaller than the melting point of the test piece, and
A temperature sensor that detects the temperature of the test piece and
A cooling device that sends gas to the test piece,
A control device that controls the cooling device and
With
When the detection result obtained from the temperature sensor rises in response to heating by the heater and becomes equal to or higher than a preset threshold value, the control device cools the test piece so as to send the gas to the test piece. Control the device,
Blister testing machine. The threshold is set lower than the set temperature.
The blister testing machine according to claim 1. The heater is an infrared heater that irradiates the test piece with infrared rays.
The blister testing machine according to claim 1 or 2. A heater control unit for controlling the output of the heater is further provided.
The heater control unit controls the heater so as to reduce the output of the heater when the detection result obtained from the temperature sensor rises in response to heating by the heater and becomes equal to or higher than the threshold value.
The blister testing machine according to any one of claims 1 to 3. The control device controls the cooling device so as to maintain a state of sending the gas to the test piece for a predetermined time.
The heater control unit controls the output of the heater based on the detection result of the temperature sensor while corresponding to the predetermined time.
The blister testing machine according to claim 4. The gas is air,
The blister testing machine according to any one of claims 1 to 5. The cooling device is configured to blow the gas onto the test piece.
The blister testing machine according to any one of claims 1 to 6. Further equipped with a furnace for accommodating the test piece holder,
The cooling device is
With the gas source
A flow path connecting the supply source and the inside of the furnace,
A control valve provided in the flow path and driven and controlled by the control device,
Have,
The blister testing machine according to any one of claims 1 to 7. A blister test method for evaluating blister expressed on a test body by heating the test body to a set temperature set below the melting point of the test body.
As a result of heating the test body, the temperature of the test body rises, and when the test body exceeds a predetermined temperature value, a cooling gas is sent to the test body.
Blister test method.

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