JP2020173119A - Test apparatus and test method - Google Patents

Abstract

To obtain a test apparatus capable of performing a test in an environment close to an actual usage environment.SOLUTION: A test apparatus 100 includes a constant temperature bath 1, a plurality of sample folders 5 holding a plurality of samples 16, disposed inside the constant temperature bath 1, each of the samples 16 being an electronic device module in which an electronic device is sealed with a resin, a light source 4 disposed inside the constant temperature bath 1, for irradiating the samples 16 with light, and power output adjusting devices 9 each for driving the electronic device of the sample 16.SELECTED DRAWING: Figure 1

Description

The present invention relates to a test device and a test method for performing a weather resistance test of an electronic device module.

Conventionally, as an electronic device module installed outdoors, for example, there are an LED (Light Emitting Diode) module and a photovoltaic power generation module. Such an electronic device module has a structure in which the electronic device is sealed with a resin such as a polymer material in order to protect the built-in electronic device from rain and wind.

Resins used outdoors have been tested to evaluate the weather resistance of the resins. In addition, a test device for carrying out a weather resistance test of a resin has been developed.

For example, Patent Document 1 describes a constant temperature bath, a temperature control means for controlling the temperature inside the constant temperature bath, a plurality of sample tables arranged inside the constant temperature bath on which a resin sample is placed, and a constant temperature. A test apparatus is described that is arranged inside the tank and includes a light source that irradiates the sample with light. The test apparatus described in Patent Document 1 has a sample temperature measuring means for individually measuring the temperature of each of a plurality of samples, and individually controls the temperature of each of the plurality of samples based on the measurement results of the sample temperature measuring means. It is provided with a sample temperature control means. In the test apparatus described in Patent Document 1, it is possible to carry out a test in which the temperature of each resin sample is different while each resin sample receives light.

Japanese Unexamined Patent Publication No. 2015-102437

When an electronic device module is actually used, the electronic device generates heat when it is energized. However, since the test apparatus described in Patent Document 1 can only test the resin alone, it is difficult to predict the life of the resin in consideration of the influence of heat generation of the electronic device.

The present invention has been made in view of the above, and an object of the present invention is to obtain a test apparatus capable of conducting a test in an environment close to an actual usage environment.

In order to solve the above-mentioned problems and achieve the object, the test apparatus according to the present invention includes a constant temperature bath and a plurality of electronic device modules in which the electronic device is sealed with a resin. It includes a plurality of sample folders for holding the sample, a light source which is arranged inside the constant temperature bath and irradiates the sample with light, and a power output adjusting device for driving the electronic device of the sample.

According to the present invention, it is possible to carry out the test in an environment close to the actual usage environment.

Sectional drawing which shows the test apparatus which concerns on Embodiment 1 of this invention. Top view showing the test apparatus according to the first embodiment. Top view showing a power feeding unit and a power receiving unit according to the first embodiment. Sectional drawing of the feeding part and the power receiving part shown in FIG. 3 along the IV-IV line. It is sectional drawing which shows the power feeding part and the power receiving part of the test apparatus which concerns on Embodiment 2 of this invention, and corresponds to the sectional drawing along line IV-IV shown in FIG. Sectional drawing which shows the test apparatus which concerns on Embodiment 3 of this invention. Top view showing the power feeding unit and the power receiving unit according to the third embodiment. Sectional drawing of the feeding part and the power receiving part shown in FIG. 7 along the line VIII-VIII. Sectional drawing which shows the test apparatus which concerns on Embodiment 4 of this invention. Top view showing the first power feeding unit and the first power receiving unit according to the fourth embodiment. The plan view which shows the 2nd power feeding part and the 2nd power receiving part which concerns on Embodiment 4. Cross-sectional view of the power receiving and distribution device shown in FIG. 9 along the XII-XII line.

Hereinafter, the test apparatus and the test method according to the embodiment of the present invention will be described in detail with reference to the drawings. The present invention is not limited to this embodiment.

Embodiment 1.
FIG. 1 is a cross-sectional view showing a test apparatus 100 according to a first embodiment of the present invention. The test device 100 includes a constant temperature bath 1, a temperature control device 2 in the tank, a control unit 3, a light source 4, a sample folder 5, a rotating device 6, a sprinkler 7, a sample temperature control device 8, and a power supply. An output adjusting device 9 and a power receiving / distributing device 10 are provided.

A test space 1a is formed inside the constant temperature bath 1. The test space 1a is a space in which a sample folder 5 or the like is installed when performing a weather resistance test.

The light source 4 is a device arranged in the test space 1a and irradiating a plurality of samples 16 to be tested with light for a weather resistance test. The light source 4 is suspended from the upper wall of the constant temperature bath 1. The light source 4 is, for example, a xenon arc lamp, a sunshine carbon arc lamp, an ultraviolet carbon arc lamp, a metal halide lamp, or an ultraviolet fluorescent lamp. Sample 16 is, for example, an electronic device module in which an electronic device is sealed with a resin. The electronic device module is, for example, an LED module or a photovoltaic power generation module. The electronic device is, for example, an LED element or a solar cell. The resin is, for example, a polymer material. The light source 4 is electrically connected to the control unit 3 by wire. The ON and OFF of the light source 4 are controlled by the control unit 3.

The plurality of sample folders 5 are members arranged around the light source 4 in the test space 1a and holding the sample 16. The test space 1a is provided with a first mounting frame 17 and a second mounting frame 18 arranged apart from each other in the vertical direction. The upper end of the sample folder 5 is detachably attached to the first attachment frame 17. The lower end of the sample folder 5 is detachably attached to the second attachment frame 18. A sample 16 is installed in a portion of the sample folder 5 facing the light source 4. The sample folder 5 is formed by bending a rectangular plate material at two points. The sample folder 5 has three surfaces arranged in the vertical direction. A sample 16 is installed on each surface. The number of surfaces of the sample folder 5 may be appropriately increased or decreased according to the size of the sample 16, the number of the samples 16, and the like.

FIG. 2 is a plan view showing the test apparatus 100 according to the first embodiment. FIG. 2 shows only the light source 4, the sample 16, the sample folder 5, the sample temperature adjusting device 8, the power output adjusting device 9, and the power receiving and distributing device 10 among the test devices 100. The plurality of sample folders 5 are arranged in a substantially circular shape in a plan view. The arrangement angle and the number of the sample folders 5 are not particularly limited, but in the present embodiment, 12 sample folders 5 are arranged at intervals of 30 degrees.

As shown in FIG. 1, the rotating device 6 is a device that rotates the sample folder 5 and the like relative to the light source 4. The rotating device 6 has a motor 6a and a turntable 6c fixed to the shaft 6b of the motor 6a. The motor 6a is arranged inside the bottom wall of the constant temperature bath 1. The shaft 6b projects from the inside of the bottom wall into the test space 1a. The turntable 6c is arranged below the light source 4, the sample folder 5, and the second mounting frame 18. The turntable 6c is connected to the second mounting frame 18. The center of rotation of the turntable 6c coincides with the center line along the vertical direction passing through the center of the light source 4. The rotation direction X of the rotating device 6 is counterclockwise in the present embodiment, but may be clockwise. The rotating device 6 rotates at a constant speed. The rotation speed of the rotating device 6 may be appropriately changed according to the size and shape of the sample 16, the method of attaching the test accessory jig, and the like. The rotating device 6 is electrically connected to the control unit 3 by wire. ON and OFF of the rotating device 6 are controlled by the control unit 3. The rotation direction and rotation speed of the rotation device 6 are changed by the control unit 3.

The watering device 7 is a device arranged in the test space 1a to sprinkle water on the sample 16. The sprinkler 7 is arranged between the light source 4 and the sample 16. The sprinkler 7 is suspended from the upper wall of the constant temperature bath 1. By sprinkling water from the sprinkler 7 to the sample 16, a test assuming rainfall can be carried out. When the temperature of the sample 16 is high, the sample 16 can be cooled by sprinkling water from the sprinkler 7 onto the sample 16. The watering device 7 is electrically connected to the control unit 3 by wire. ON and OFF of the watering device 7 are controlled by the control unit 3. The amount of water sprinkled by the water sprinkler 7 is adjusted by the control unit 3. Although not shown, if the sprinkler 7 is not sprinkled during the test, the sprinkler 7 can be stored in the space provided inside the upper wall of the constant temperature bath 1. By storing the sprinkler 7, the sample 16 can be irradiated with the light from the light source 4 without being obstructed by the sprinkler 7. The storage and deployment of the sprinkler 7 is controlled by the control unit 3.

The sample temperature control device 8 is a device that individually measures the temperature of each of the plurality of samples 16 and individually controls the temperature of each of the plurality of samples 16 based on the measurement results. One sample temperature control device 8 is attached to each sample 16. The sample temperature control device 8 is attached to a portion of the sample 16 facing the opposite side of the light source 4. Although not shown, the sample temperature control device 8 has a probe for measuring the actual temperature of the sample 16 and a heating mechanism for heating the sample 16 or a cooling mechanism for cooling the sample 16 based on the measurement result of the probe. The measurement target of the probe may be the entire surface of the sample 16 or a part of the sample 16. The probe is, for example, a thermocouple. The heating mechanism is, for example, an electric heater. The cooling mechanism is, for example, a Peltier element. The heating mechanism and the cooling mechanism are installed in contact with the sample 16. The sample temperature control device 8 has a storage unit that stores the measurement result of the probe. The measurement result of the probe is wirelessly transmitted from the sample temperature control device 8 to the control unit 3.

The power output adjusting device 9 is a device for driving the electronic device of the sample 16. The power output adjusting device 9 drives each of the electronic devices of the plurality of samples 16 individually, and monitors the driving state and the energized state of each electronic device. The power output adjusting device 9 individually controls the voltage and current applied to each of the plurality of samples 16, and measures the voltage and current of each of the plurality of samples 16. One power output adjusting device 9 is attached to each sample 16. The power output adjusting device 9 is provided at a position corresponding to each sample 16 with the sample temperature adjusting device 8 interposed therebetween. The power output adjusting device 9 is electrically connected to the sample 16 by wire. The power output adjusting device 9 has a storage unit that stores the driving state and the energizing state of each electronic device. Information regarding the driving state and the energized state is wirelessly transmitted from the power output adjusting device 9 to the control unit 3.

The power receiving / distributing device 10 is a device that supplies electric power to the sample temperature adjusting device 8 and the power output adjusting device 9. The power receiving and distribution device 10 includes a power receiving and distribution unit 11, a power feeding unit 12, and a power receiving unit 13. The power receiving and distribution unit 11 is installed on the opposite side of the light source 4 with the power output adjusting device 9 in between. The power receiving and distribution unit 11 extends in the vertical direction. The power receiving and distribution unit 11 is connected to the sample folder 5 via the first mounting frame 17 and the second mounting frame 18. The power receiving and distribution unit 11 is electrically connected to the sample temperature adjusting device 8 and the power output adjusting device 9 by wire. The power feeding unit 12 is attached to the top surface of the inner surface surrounding the test space 1a. The power receiving unit 13 is arranged at the upper end of the power receiving and distribution unit 11. Details of the power feeding unit 12 and the power receiving unit 13 will be described later.

The temperature control device 2 in the tank is a device that adjusts the temperature of the test space 1a based on the control signal from the control unit 3. The temperature control device 2 in the tank is electrically connected to the control unit 3 by wire.

The control unit 3 monitors the state of each device constituting the test device 100 and controls each device. The control unit 3 is composed of a CPU (Central Processing Unit), a ROM (Read Only Memory), a RAM (Random Access Memory), an input / output circuit, and the like. The control unit 3 calculates the deterioration acceleration rate of the sample 16 in the middle stage of the weather resistance test based on the measurement result of the sample temperature adjusting device 8 and the information on the driving state and the energizing state transmitted from the power output adjusting device 9. To do. The method of calculating the deterioration acceleration rate will be described later. The control unit 3 operates the in-tank temperature control device 2 based on the measurement result of the sample temperature control device 8 to adjust the temperature of the test space 1a. When the driving state of the sample 16, that is, the voltage value, the current value, etc. of the sample 16 shows an abnormal value during the experiment, the control unit 3 is a device such as the power output adjusting device 9 and the sample temperature adjusting device 8. To stop. An abnormal value is a value that exceeds a predetermined threshold value. After stopping each device, the sample 16 in which the abnormality has occurred can be collected and the occurrence status of the defect can be confirmed.

FIG. 3 is a plan view showing the power feeding unit 12 and the power receiving unit 13 according to the first embodiment. The power feeding unit 12 has two power feeding terminals 14. One of the two feeding terminals 14 serves as a positive electrode, and the other of the two feeding terminals 14 serves as a negative electrode. The two power feeding terminals 14 are formed in an annular shape in a plan view and are arranged concentrically. Hereinafter, when distinguishing between the two power supply terminals 14, one power supply terminal 14 having a small diameter is referred to as a first power supply terminal 14a, and the other power supply terminal 14 having a large diameter is referred to as a second power supply terminal 14b.

The power receiving unit 13 has a power receiving terminal 15 which is a set of two. In the present embodiment, 12 sets of power receiving terminals 15 are arranged so as to be spaced apart from each other along the circumferential direction of the power feeding terminals 14. The power receiving terminal 15 is in contact with the power feeding terminal 14. Hereinafter, when distinguishing one set of power receiving terminals 15, one power receiving terminal 15 in contact with the first power feeding terminal 14a is referred to as a first power receiving terminal 15a, and the other power receiving terminal 15 in contact with the second power receiving terminal 14b is referred to. Is referred to as a second power receiving terminal 15b.

FIG. 4 is a cross-sectional view of the power feeding unit 12 and the power receiving unit 13 shown in FIG. 3 along the IV-IV line. The first power receiving terminal 15a is arranged below the first power feeding terminal 14a. The second power receiving terminal 15b is arranged below the second power feeding terminal 14b. The first power receiving terminal 15a, the second power receiving terminal 15b, and the power receiving and distribution unit 11 are provided in the same number as the sample folder 5, respectively. The arrangement of the first power supply terminal 14a, the second power supply terminal 14b, the first power reception terminal 15a, and the second power reception terminal 15b is not limited to the arrangement shown in FIGS. 3 and 4, and may be changed as appropriate. ..

The cross-sectional shape of the power feeding terminal 14 is formed in a strip shape. The power receiving terminal 15 is formed in a spring shape that can be expanded and contracted along the vertical direction. When the first power feeding terminal 14a and the first power receiving terminal 15a come into contact with each other and the second power feeding terminal 14b and the second power receiving terminal 15b come into contact with each other, power is supplied to the power receiving and distribution unit 11.

Next, with reference to FIG. 1, a test method using the test apparatus 100 according to the first embodiment will be described. The test method includes a preparation step, a setting step, and a test step. The in-tank temperature control device 2, the control unit 3, the light source 4, the rotating device 6, the sprinkler device 7, the power feeding unit 12, the first mounting frame 17, and the second mounting frame 18 are installed in the test device 100 in advance. ..

In the preparation step, the operator installs a plurality of samples 16 in the sample folder 5 outside the constant temperature bath 1, and prepares a plurality of sample folders 5 in which the plurality of samples 16 are installed. Subsequently, the operator attaches the plurality of sample folders 5 to the first mounting frame 17 and the second mounting frame 18 installed in the test space 1a. As a result, the plurality of sample folders 5 are arranged in an annular shape around the light source 4.

Next, the operator attaches the sample temperature control device 8 to each of the plurality of samples 16 via the sample folder 5. Further, the operator attaches the power output adjusting device 9 to each of the plurality of samples 16 via the sample temperature adjusting device 8, and connects the output terminal of the power output adjusting device 9 to the input terminal of the sample 16.

Next, the operator attaches the power receiving and distribution unit 11 to each of the plurality of sample folders 5 via the first mounting frame 17 and the second mounting frame 18. At that time, the power receiving unit 13 arranged at the upper end of the power receiving and distribution unit 11 and the power feeding unit 12 are connected. Subsequently, when the operator connects the wiring of the power receiving / distributing unit 11 to the sample temperature adjusting device 8 and the power output adjusting device 9, the power receiving / distributing unit 11 automatically energizes the sample temperature adjusting device 8 and the power output adjusting device 9. To be started.

In the setting step, when the input unit (not shown) receives the input of the test reference temperature of the test space 1a from the operator, the control unit 3 sets the test reference temperature of the test space 1a. The control unit 3 operates the in-tank temperature control device 2 so that the temperature of the test space 1a becomes the set test reference temperature based on the measurement result of the sample temperature control device 8, and adjusts the temperature of the test space 1a. In the setting step, when the input unit (not shown) receives the input of the test reference temperature of each sample 16 or the positive / negative temperature distributed positively or negatively with respect to the test reference temperature from the operator, the sample temperature control device 8 sends the sample 16 to each sample 16. Set the test reference temperature or positive / negative temperature individually. The sample temperature control device 8 measures the temperature of each sample 16 individually, and controls the heating mechanism or the cooling mechanism so that each sample 16 becomes the set test reference temperature or positive / negative temperature. The test reference temperature of the sample 16 is the same temperature as the test reference temperature of the test space 1a. The positive and negative temperatures are temperatures higher or lower than the test reference temperature of the test space 1a. The positive and negative temperatures are set, for example, to a temperature of + 10 ° C. or −10 ° C., which is higher than the test reference temperature of the test space 1a. The control unit 3 operates the in-tank temperature control device 2 based on the measurement result of one sample temperature control device 8 set so that the sample 16 becomes the test reference temperature, and adjusts the temperature of the test space 1a. .. In the setting step, when the input unit (not shown) receives the input of the driving conditions of the electronic device of each sample 16 from the operator, the power output adjusting device 9 individually sets the driving conditions of the electronic device of each sample 16. The power output adjusting device 9 individually drives each of the electronic devices of the plurality of samples 16 based on the set driving conditions.

The experimental step is a step of irradiating the sample 16 with the light of the light source 4 and driving the rotating device 6 to carry out a weather resistance test of the sample 16. In the experimental step, when the input unit (not shown) receives the ON input of the light source 4 from the operator, the control unit 3 operates the light source 4. The light source 4 irradiates a plurality of samples 16 with light for a weather resistance test. In the experimental step, when an input unit (not shown) receives an ON input of the rotating device 6 from an operator, the control unit 3 operates the rotating device 6. When the shaft 6b of the motor 6a rotates, the turntable 6c connected to the shaft 6b rotates. As the turntable 6c rotates, the sample folder 5, the sample 16, the first mounting frame 17, the second mounting frame 18, the sample temperature adjusting device 8, the power output adjusting device 9, the power receiving and distribution unit 11, and the power receiving unit 13 are the light sources. Rotate around 4. When simulating rainfall, water may be sprinkled from the sprinkler 7 to the sample 16 as needed. In the experimental step, when an input unit (not shown) receives an ON input of the water sprinkler 7 from an operator, the control unit 3 operates the water sprinkler 7.

By measuring the physical and chemical properties of the sample 16 deteriorated under several temperature conditions, driving conditions, and the same ultraviolet intensity in this way, it was carried out when the test was carried out as illustrated below. It is possible to estimate the deterioration acceleration rate at temperatures and driving conditions other than the test.

For example, by plotting the physical and chemical property measurement results and the inverse of the temperature at that time on a semi-log graph using the well-known Arrhenius plot, the activation energy is calculated by using the regression analysis method. Etc. can be obtained experimentally. First, in the equation "logk =-(Ea / RT) + logA" when the logarithm of the Arrhenius equation is taken, "y = logk, m = -E / R, x = 1 / T, b = logA" If a variable is taken, it can be regarded as "y = mx + b". In addition, k is a reaction rate, A is a frequency factor, Ea is an activation energy per mole, R is a gas constant, and T is an absolute temperature.

If the operator plots the actually measured reaction rate k and the reciprocal of the temperature at the time of measurement on a semi-log graph, that is, Arrhenius plot, the coefficient m and the coefficient b can be obtained, and the activation energy and the like can be experimentally obtained. it can. As an example of actual use, for example, the value of the inclination when the wiring resistance of the electronic device increases in proportion to the ultraviolet irradiation time due to the deterioration of the sealing resin by irradiating with ultraviolet rays is used instead of the reaction rate k in the above equation. The coefficient m and the coefficient b are obtained by regression analysis. By using the equations for obtaining the coefficient m and the coefficient b in this way, it is possible to estimate the deterioration acceleration rate at temperatures and driving conditions other than those in which the test was performed.

Next, the operation and effect of the test apparatus 100 and the test method according to the first embodiment will be described.

In the present embodiment, the test device 100 includes a sample 16 in which the electronic device is an electronic device module sealed with a resin, and a power output adjusting device 9 for driving the electronic device of the sample 16. This makes it possible to carry out a weather resistance test of the electronic device module in an environment close to the actual usage environment, and to predict the life of the resin in consideration of the influence of heat generation of the electronic device. For example, when the electronic device module is an LED module, the power output adjusting device 9 drives the LED element to emit light, and the power output adjusting device 9 directly adjusts the brightness of the LED element by controlling the voltage and current. This makes it possible to carry out a weather resistance test of the LED module in an environment close to the actual usage environment, the discoloration of the sealing resin becomes remarkable, and the life of the resin considering the influence of heat generation of the LED element is extended. Can be predicted. Further, for example, when the electronic device module is a photovoltaic module, the power output adjusting device 9 energizes the solar cell to generate heat in the solar cell. This makes it possible to carry out a weather resistance test of the photovoltaic power generation module in an environment close to the actual usage environment, and to predict the life of the resin in consideration of the influence of heat generation of the solar cell.

In the present embodiment, the test apparatus 100 includes a rotating apparatus 6 that rotates a plurality of sample folders 5 relative to the light source 4, so that the light of the light source 4 can be uniformly applied to the plurality of samples 16. it can.

In the present embodiment, the test apparatus 100 includes a rotating apparatus 6 that rotates the plurality of sample folders 5 relative to the light source 4, and a power supply that individually controls the voltage and current applied to each of the plurality of samples 16. It includes an output adjusting device 9. As a result, it is possible to carry out tests in which the driving conditions of the samples 16 are different while the plurality of samples 16 receive the same intensity of light.

In the present embodiment, the power output adjusting device 9 can monitor the driving state of the sample 16 by measuring the voltage and the current of each of the plurality of samples 16.

In the present embodiment, the test device 100 individually measures the temperatures of the rotating device 6 that rotates the plurality of sample folders 5 relative to the light source 4 and the temperatures of the plurality of samples 16 based on the measurement results. A sample temperature control device 8 for individually controlling the temperature of each of the plurality of samples 16 is provided. As a result, it is possible to carry out tests in which the temperatures of the samples 16 are different while the plurality of samples 16 receive the same intensity of light.

In the present embodiment, the test device 100 includes a power receiving / distributing device 10 that supplies electric power to the power output adjusting device 9 and the sample temperature adjusting device 8, so that the electric power required for driving the sample 16 can be supplied to the power output adjusting device. The electric power required for temperature control of the sample 16 can be supplied to the sample temperature control device 8 as well as being supplied to the sample 16.

In the present embodiment, the power receiving and distributing device 10 is installed in each sample folder 5 by having an annular power feeding terminal 14 and a power receiving terminal 15 in contact with the power feeding terminal 14 and provided in the same number as the sample folders 5. Power can be reliably supplied to the power output adjusting device 9 and the sample temperature adjusting device 8. Further, since the power feeding terminals 14 are formed in an annular shape, one power feeding terminal 14 can come into contact with a plurality of power receiving terminals 15, so that the number of power feeding terminals 14 can be reduced.

In the present embodiment, since the power receiving terminal 15 is formed in a spring shape that can expand and contract along the vertical direction, the sample folder 5 can be distorted and displaced due to the load of the sample 16 and the test accessory jig. The contact condition of the power receiving terminal 15 with respect to the power feeding terminal 14 can be easily adjusted before and after the test.

Embodiment 2.
FIG. 5 is a cross-sectional view showing a power feeding unit 12 and a power receiving unit 13 of the test apparatus 100 according to the second embodiment of the present invention, and corresponds to a cross-sectional view taken along the line IV-IV shown in FIG. It is a figure. The test device 100 according to the second embodiment is different from the first embodiment in the configurations of the power feeding unit 12 and the power receiving unit 13. In the second embodiment, the same reference numerals are given to the parts that overlap with the first embodiment, and the description thereof will be omitted.

A recess 151 is formed on the surface of the power receiving terminal 15 of the power receiving unit 13 according to the second embodiment facing the power feeding terminal 14. A part of the power feeding terminal 14 is fitted in the recess 151. According to this embodiment, a part of the power feeding terminal 14 is fitted into the recess 151 of the power receiving terminal 15, so that the contact state between the power feeding terminal 14 and the power receiving terminal 15 can be stabilized. Further, since a sufficient contact area between the power feeding terminal 14 and the power receiving terminal 15 can be secured, it is possible to support high voltage and large current tests. The arrangement of the power feeding terminal 14 and the power receiving terminal 15 is not limited to the arrangement shown in FIG. 5, and may be changed as appropriate. The test method is the same as that of the first embodiment.

Embodiment 3.
FIG. 6 is a cross-sectional view showing the test apparatus 100 according to the third embodiment of the present invention. FIG. 7 is a plan view showing the power feeding unit 12 and the power receiving unit 13 according to the third embodiment. FIG. 8 is a cross-sectional view of the power feeding unit 12 and the power receiving unit 13 shown in FIG. 7 along the line VIII-VIII. The test device 100 according to the third embodiment is different from the first embodiment in the configurations of the power feeding unit 12 and the power receiving unit 13. In the third embodiment, the same reference numerals are given to the parts that overlap with the first embodiment, and the description thereof will be omitted.

As shown in FIG. 6, the power feeding unit 12 and the power receiving unit 13 according to the third embodiment are arranged below the power receiving and distributing unit 11. The power feeding unit 12 is attached to the bottom surface of the inner surface surrounding the test space 1a. The power receiving unit 13 is arranged at the lower end of the power receiving and distribution unit 11. As shown in FIGS. 7 and 8, the first power receiving terminal 15a is arranged above the first power feeding terminal 14a. The second power receiving terminal 15b is arranged above the second power feeding terminal 14b. The first power receiving terminal 15a, the second power receiving terminal 15b, and the power receiving and distribution unit 11 are provided in the same number as the sample folder 5, respectively.

A recess 141 is formed on the surface of the power feeding terminal 14 of the power feeding unit 12 facing the power receiving terminal 15. A power receiving terminal 15 is fitted in the recess 141. According to this embodiment, the power receiving terminal 15 is fitted into the recess 141 of the power feeding terminal 14, so that the contact state between the power receiving terminal 14 and the power receiving terminal 15 can be stabilized. Further, since a sufficient contact area between the power feeding terminal 14 and the power receiving terminal 15 can be secured, it is possible to support high voltage and large current tests. Further, as shown in FIG. 6, since the power receiving unit 13 and the power receiving and distributing unit 11 are supported by the bottom wall of the constant temperature bath 1 via the power feeding unit 12, the load of the sample folder 5 connected to the power receiving and distributing unit 11 is applied. It can be transmitted to the bottom wall of the constant temperature bath 1. As a result, the load applied to the turntable 6c can be reduced, so that the sample folder 5 and the like can be smoothly rotated. The arrangement of the first power supply terminal 14a, the second power supply terminal 14b, the first power reception terminal 15a, and the second power reception terminal 15b is not limited to the arrangement shown in FIGS. 7 and 8, and may be changed as appropriate. .. The test method is the same as that of the first embodiment.

Embodiment 4.
FIG. 9 is a cross-sectional view showing the test apparatus 100 according to the fourth embodiment of the present invention. FIG. 10 is a plan view showing the first power feeding unit 12a and the first power receiving unit 13a according to the fourth embodiment. FIG. 11 is a plan view showing the second power feeding unit 12b and the second power receiving unit 13b according to the fourth embodiment. FIG. 12 is a cross-sectional view of the power receiving and distribution device 10 shown in FIG. 9 along the XII-XII line. The test device 100 according to the fourth embodiment is different from the first embodiment in the configurations of the power feeding unit 12 and the power receiving unit 13. In the fourth embodiment, the same reference numerals are given to the parts that overlap with the first embodiment, and the description thereof will be omitted.

As shown in FIG. 9, the power feeding unit 12 and the power receiving unit 13 according to the fourth embodiment are arranged above and below the power receiving and distribution unit 11, respectively. Hereinafter, when distinguishing between the two power supply units 12, one power supply unit 12 arranged above the power reception and distribution unit 11 is referred to as a first power supply unit 12a, and the other power supply unit 12 arranged below the power reception and distribution unit 11 is referred to. The power feeding unit 12 is referred to as a second power feeding unit 12b. When distinguishing between the two power receiving units 13, one power receiving unit 13 arranged at the upper end of the power receiving / distributing unit 11 is referred to as a first power receiving unit 13a, and the other power receiving unit 13 arranged at the lower end of the power receiving / distributing unit 11 is referred to. The power receiving unit 13 is referred to as a second power receiving unit 13b.

The first feeding portion 12a is attached to the top surface of the inner surface surrounding the test space 1a. The first power receiving unit 13a is arranged at the upper end of the power receiving and distribution unit 11. As shown in FIG. 10, the first power feeding unit 12a has one power feeding terminal 14. The first power receiving unit 13a has a plurality of power receiving terminals 15. As shown in FIG. 12, the power receiving terminal 15 of the first power receiving unit 13a is arranged below the power feeding terminal 14 of the first power feeding unit 12a. A recess 151 is formed on the surface of the power receiving terminal 15 of the first power receiving unit 13a facing the power supply terminal 14 of the first power feeding unit 12a. The power supply terminal 14 of the first power supply unit 12a is fitted in the recess 151.

As shown in FIG. 9, the second feeding portion 12b is attached to the bottom surface of the inner surface surrounding the test space 1a. The second power receiving unit 13b is arranged at the lower end of the power receiving and distribution unit 11. As shown in FIG. 11, the second power feeding unit 12b has one power feeding terminal 14. The second power receiving unit 13b has a plurality of power receiving terminals 15. As shown in FIG. 12, the power receiving terminal 15 of the second power receiving unit 13b is arranged above the power feeding terminal 14 of the second power feeding unit 12b. A recess 141 is formed on the surface of the power receiving terminal 14 of the second power feeding unit 12b facing the power receiving terminal 15 of the second power receiving unit 13b. The power receiving terminal 15 of the second power receiving unit 13b is fitted in the recess 141. One of the upper and lower feeding terminals 14 serves as a positive electrode, and the other of the upper and lower feeding terminals 14 serves as a negative electrode. The same number of power receiving terminals 15 of the first power receiving unit 13a, the power receiving terminals 15 of the second power receiving unit 13b, and the power receiving and distribution unit 11 are provided as the sample folders 5.

According to the present embodiment, the power supply terminal 14 of the first power supply unit 12a is fitted into the recess 151 of the power reception terminal 15, and the power reception terminal 15 of the second power reception unit 13b is fitted into the recess 141 of the power supply terminal 14. The contact state between the power feeding terminal 14 and the power receiving terminal 15 can be stabilized. Further, since a sufficient contact area between the power feeding terminal 14 and the power receiving terminal 15 can be secured, it is possible to support high voltage and large current tests. Further, as shown in FIG. 9, since the second power receiving unit 13b and the power receiving and distributing unit 11 are supported by the bottom wall of the constant temperature bath 1 via the second power feeding unit 12b, the sample folder 5 connected to the power receiving and distributing unit 11 is connected. Such a load can be transmitted to the bottom wall of the constant temperature bath 1. As a result, the load applied to the turntable 6c can be reduced, so that the sample folder 5 and the like can be smoothly rotated.

Further, since the power feeding unit 12 and the power receiving unit 13 are installed above and below the power receiving and distribution unit 11, the positive electrode and the negative electrode are not on the same surface, so that the power feeding terminal 14 and the power receiving terminal 15 are used when water is sprinkled by the water sprinkler 7. It is possible to prevent the ingress of moisture into. As a result, the occurrence of a short circuit can be prevented. Further, since the numbers of the power feeding terminals 14 and the power receiving terminals 15 are dispersed vertically, the space in the rotation direction X in the constant temperature bath 1 is increased as compared with the case where the two power feeding terminals 14 are arranged concentrically on the same plane. Can be reduced. This can contribute to the miniaturization of the test apparatus 100. The arrangement of the power feeding terminal 14 and the power receiving terminal 15 is not limited to the arrangement shown in FIGS. 10, 11 and 12, and may be changed as appropriate. The test method is the same as that of the first embodiment.

The configuration shown in the above-described embodiment shows an example of the content of the present invention, can be combined with another known technique, and is one of the configurations without departing from the gist of the present invention. It is also possible to omit or change the part.

1 Constant temperature bath, 1a Test space, 2 Tank temperature control device, 3 Control unit, 4 Light source, 5 Sample folder, 6 Rotating device, 6a motor, 6b shaft, 6c turntable, 7 Sprinkler, 8 Sample temperature control device, 9 Power output regulator, 10 Power receiving and distribution device, 11 Power receiving and distribution unit, 12 Power supply unit, 12a 1st power supply unit, 12b 2nd power supply unit, 13 Power receiving unit, 13a 1st power receiving unit, 13b 2nd power receiving unit, 14 Power supply Terminal, 14a 1st power supply terminal, 14b 2nd power supply terminal, 15 power receiving terminal, 15a 1st power receiving terminal, 15b 2nd power receiving terminal, 16 sample, 17 1st mounting frame, 18 2nd mounting frame, 100 test device, 141 , 151 recess.

Claims (9)

With a constant temperature bath
A plurality of sample folders arranged inside the constant temperature bath and holding a plurality of samples in which the electronic device is an electronic device module sealed with a resin,
A light source that is placed inside the constant temperature bath and irradiates the sample with light,
A power output regulator that drives the electronic device of the sample,
A test device comprising. The power output adjusting device is characterized in that the voltage and current applied to each of the electronic devices of the plurality of samples are individually controlled, and the voltage and current of each of the electronic devices of the plurality of samples are measured. The test apparatus according to claim 1. The test apparatus according to claim 1 or 2, further comprising a power receiving and distributing device for supplying electric power to the power output adjusting device. The power receiving and distribution device
An annular power supply terminal and
A plurality of power receiving terminals that are in contact with the power feeding terminal and are arranged at intervals along the circumferential direction of the power feeding terminal.
The test apparatus according to claim 3, wherein the test apparatus is provided with. Any of claims 1 to 4, further comprising a sample temperature control device that individually measures the temperature of each of the plurality of samples and individually controls the temperature of each of the plurality of samples based on the measurement result. The test apparatus according to item 1. The test apparatus according to any one of claims 1 to 5, further comprising a sprinkler for sprinkling water on the sample, which is arranged inside the constant temperature bath. The sample folder is arranged around the light source.
The test device according to any one of claims 1 to 6, further comprising a rotating device that rotates a plurality of the sample folders relative to the light source. A preparatory process for installing multiple samples, which are electronic device modules in which the electronic device is sealed with resin, inside a constant temperature bath, and
A test step of irradiating the sample with light from a light source while driving the electronic devices of the plurality of samples.
A test method comprising. The test method according to claim 8, wherein in the test step, the voltage and current applied to each of the electronic devices of the plurality of samples are individually controlled.

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