JP2019211314A5

JP2019211314A5 -

Info

Publication number: JP2019211314A5
Application number: JP2018107017A
Authority: JP
Filing date: 2018-06-04
Publication date: 2020-12-10
Anticipated expiration: 2038-06-04

Description

本発明は、ベクトルネットワークアナライザ（以下「ＶＮＡ」と呼ぶ）を用いた反射係数の測定方法に関し、より具体的には、ＶＮＡの校正を含む１ポートでの被対象物（以下「ＤＵＴ」と呼ぶ）の反射係数の測定方法に関する。 The present invention relates to a method for measuring a reflectance coefficient using a vector network analyzer (hereinafter referred to as "VNA"), and more specifically, an object to be subjected to one port including calibration of VNA (hereinafter referred to as "DUT"). ) Is related to the measurement method of the reflectance coefficient.

本発明は、ベクトルネットワークアナライザ（ＶＮＡ）を用いた反射係数の測定方法を提供する。その測定方法は、（ａ）ＶＮＡの１つのポートに直接接続された被測定物の反射係数Γ_ｄｍを測定するステップと、（ｂ）その１つのポートにＳパラメータＳ_ｉｊ，Ｘ（ｉ、ｊ＝１、２、Ｘ＝Ａ、Ｂ、Ｃ）が既知の長さが異なる３つのラインＡ、Ｂ、Ｃを介して接続された被測定物の反射係数Γ_Ｘｍ（Ｘ＝Ａ、Ｂ、Ｃ）を測定するステップと、（ｃ）反射係数Γ_ｄｍ、Γ_Ｘｍ及びＳパラメータＳ_ｉｊ，Ｘを用いて被測定物の真の反射係数Γ_ｄを求めるステップと、を含む。 The present invention provides a method for measuring a reflectance coefficient using a vector network analyzer (VNA). Its measurement method, (a) a step of measuring a reflection coefficient gamma _dm of the object that is directly connected to one port of VNA, (b) S parameter _{S ij} to the one port, X (i, j = 1, 2, X = A, B, C) Reflection coefficient Γ _Xm (X = A, B, C) of the object to be measured connected via three lines A, B, C with different known lengths. ), And (c) finding the true reflection coefficient Γ _d of the object under test using the reflection coefficients Γ _dm , Γ _Xm and the S-parameters _{Sij, X.}

本発明によれば、ＶＮＡの１つのポートでのＤＵＴの反射係数の測定においてＶＮＡの回路エラーを全て取り除いた、すなわち回路エラーの校正を含む測定が可能である。高精度の測定結果（真の反射係数）を得ることができる。また、基準器として長さの異なる３つのラインのみを用いるのでその製造や長さを基にした特性評価が容易である。 According to the present invention to remove any circuit errors of the VNA in the measurement of the reflection coefficient of the DUT at one port VNA, i.e. it is possible to measure including calibration circuitry error. Highly accurate measurement results (true reflectance coefficient) can be obtained. Moreover, since only three lines having different lengths are used as the reference device, it is easy to manufacture the lines and evaluate the characteristics based on the lengths.

図２は、本発明の一実施形態のＶＮＡの１ポートでのＤＵＴの反射係数の測定の概念図である。図２では、図１の場合同様に、ＶＮＡ２０の内部回路（部品）として、信号源１１と受信器１２のみを記載している。実際にはＶＮＡ２０は他に信号分離器（スプリッタ、カプラ）、検波器、信号処理部（プロセッサ）、表示部等を含む。図２の四角枠内のδ、μ、τは、順番に方向性、トラッキング、マッチングのＶＮＡ内部の回路エラーを意味している。 FIG. 2 is a conceptual diagram of measuring the reflectance coefficient of a DUT at one port of a VNA according to an embodiment of the present invention. In Figure 2, similarly if the Figure 1, as the internal circuit of VNA20 (parts) describes only the receiver 12 and the signal source 11. Actually, the VNA 20 also includes a signal separator (splitter, coupler), a detector, a signal processing unit (processor), a display unit, and the like. Δ, μ, and τ in the square frame of FIG. 2 mean circuit errors inside the VNA of directionality, tracking, and matching in order.

１、１１：信号源
２、１２：受信器
３、１３：被測定物（ＤＵＴ）
１０、２０：ベクトルネットワークアナライザ（ＶＮＡ）
１５、１６、１７：ラインＡ、Ｂ、Ｃ 1, 11: Signal source 2, 12: Receiver 3, 13: Object to be measured (DUT)
10, 20: Vector network analyzer (VNA)
15, 16, 17: Lines A, B, C

Claims

A method of measuring the reflectance coefficient using a vector network analyzer (VNA).
The step of measuring the reflectance coefficient Γ _{dm of the} object to be measured directly connected to one port of the VNA,
The object to be measured is via three lines A, B, and C having S-parameters S _{ij, X} (i, j = 1, 2, X = A, B, C) known to the one port and having different lengths. And the step of measuring the reflectance coefficient Γ _Xm (X = A, B, C) when
A measurement method including a step of obtaining the true reflection coefficient Γ _d of the object to be measured by using the reflection coefficients Γ _dm and Γ _Xm and the S parameters _{Sij and X.}

The measuring method according to claim 1, wherein the lengths of the three lines A, B, and C are set so that the phases of the reflection coefficients Γ _dm and Γ _Xm at the measurement frequency are shifted by π / 4.

The step of finding the true reflectance coefficient Γ _d of the object to be measured is derived from the following four equations, where δ, μ, and τ mean a circuit error of directionality, tracking, and matching.

The measuring method according to claim 1 or 2, comprising the step of obtaining the true reflection coefficient Γ _d .

The step of measuring the reflectance coefficient Γ _{Xm of the} object to be measured is
A step of measuring the reflectance coefficient Γ _Am when the object to be measured is connected to the one port via the line A, and
A step of measuring the reflectance coefficient Γ _Bm when the object to be measured is connected to the one port via the line B, and
The measuring method according to any one of claims 1 to 3, comprising a step of measuring a reflectance coefficient Γ _Cm when the object to be measured is connected to the one port via the line C.

The measuring method according to any one of claims 1 to 4, wherein the three lines A, B, and C include any of an air line, a waveguide, and a planar circuit.