[go: up one dir, main page]

JP2019096584A - Contact plating structure - Google Patents

Contact plating structure Download PDF

Info

Publication number
JP2019096584A
JP2019096584A JP2017227755A JP2017227755A JP2019096584A JP 2019096584 A JP2019096584 A JP 2019096584A JP 2017227755 A JP2017227755 A JP 2017227755A JP 2017227755 A JP2017227755 A JP 2017227755A JP 2019096584 A JP2019096584 A JP 2019096584A
Authority
JP
Japan
Prior art keywords
plating layer
contact
layer
contact portion
plating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
JP2017227755A
Other languages
Japanese (ja)
Inventor
隆博 弓立
Takahiro Yudate
隆博 弓立
広志 川▲崎▼
Hiroshi Kawasaki
広志 川▲崎▼
隼 豊泉
Jun Toyoizumi
隼 豊泉
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yazaki Corp
Original Assignee
Yazaki Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yazaki Corp filed Critical Yazaki Corp
Priority to JP2017227755A priority Critical patent/JP2019096584A/en
Publication of JP2019096584A publication Critical patent/JP2019096584A/en
Abandoned legal-status Critical Current

Links

Images

Landscapes

  • Electroplating Methods And Accessories (AREA)

Abstract

【課題】接点部の接触面積を増大することができ、接触抵抗を低減することができる接点めっき構造を提供する。
【解決手段】互いに接触可能な接点部3と、接点部3の最表面に形成された表面めっき層5と、接点部3の母材7と表面めっき層5との間に形成された下地めっき層9とを備えた接点めっき構造1において、表面めっき層5と下地めっき層9との間に、接点部3が接触したときに表面めっき層5に対して延性を付与する中間めっき層11を形成した。
【選択図】図2
An object of the present invention is to provide a contact plating structure capable of increasing a contact area of a contact portion and reducing contact resistance.
SOLUTION: A contact portion 3 capable of contacting each other, a surface plating layer 5 formed on the outermost surface of the contact portion 3, and a base plating formed between a base material 7 of the contact portion 3 and the surface plating layer 5 In contact plating structure 1 having layer 9, intermediate plating layer 11 is provided between surface plating layer 5 and base plating layer 9 to provide ductility to surface plating layer 5 when contact portion 3 contacts. It formed.
[Selected figure] Figure 2

Description

本発明は、接点めっき構造に関する。詳細には、互いに接触可能な接点部の表面に形成されるめっきを有する接点めっき構造に関する。   The present invention relates to a contact plating structure. In particular, the present invention relates to a contact plating structure having a plating formed on surfaces of contact portions that can contact each other.

従来、接点めっき構造としては、互いに接触可能な接点部としての電気接点と、この電気接点の最表面に形成された表面めっき層としてのAg層と、電気接点の母材とAg層との間に形成されたAg−Sn合金層とを備えたものが知られている(例えば、特許文献1参照)。   Conventionally, as a contact plating structure, an electrical contact as a contact portion that can be contacted with each other, an Ag layer as a surface plating layer formed on the outermost surface of the electrical contact, and a base material of the electrical contact and the Ag layer The thing provided with the Ag-Sn alloy layer formed in is known (for example, refer patent document 1).

この接点めっき構造では、電気接点の最表面にAg層を形成することにより、相手方コネクタ用端子との接触抵抗を低くし、Ag層の下方にAg−Sn層を形成することにより、耐熱性や耐摩耗性を向上させている。   In this contact plating structure, the contact resistance with the other connector terminal is reduced by forming an Ag layer on the outermost surface of the electrical contact, and the Ag-Sn layer is formed below the Ag layer to achieve heat resistance and the like. Improves wear resistance.

このような接点めっき構造では、電気接点の母材が銅や銅合金からなり、温度の上昇によって電気接点の母材から銅原子が最表面に拡散して酸化物を形成することを抑制するために、電気接点の母材上に下地めっき層としてのNi層が形成されている。   In such a contact plating structure, the base material of the electric contact is made of copper or copper alloy, and it is suppressed that the copper atoms diffuse from the base material of the electric contact to the outermost surface to form an oxide due to the temperature rise. In addition, a Ni layer as a base plating layer is formed on the base material of the electrical contact.

特開2015−219975号公報JP, 2015-219975, A

ところで、上記特許文献1のような接点めっき構造では、銀(Ag)からなる表面めっき層と、銀(Ag)と錫(Sn)とからなるAg−Sn層との結びつきが強く、ニッケル(Ni)からなる下地めっき層と、Ag−Sn層との結びつきが強い。   By the way, in the contact plating structure as in Patent Document 1, the connection between the surface plating layer made of silver (Ag) and the Ag-Sn layer made of silver (Ag) and tin (Sn) is strong, and nickel (Ni (Ni) There is a strong bond between the base plating layer of A) and the Ag-Sn layer.

しかしながら、表面めっき層と下地めっき層との間に結びつきが強いAg−Sn層のような中間めっき層を形成してしまうと、接点部が接触したときに、表面めっき層が中間めっき層の表面上で延びにくく、接点部の接触面積があまり増大せず、接触抵抗を効率よく低減することができなかった。   However, when an intermediate plating layer such as an Ag-Sn layer having a strong bond between the surface plating layer and the base plating layer is formed, the surface plating layer is the surface of the intermediate plating layer when the contact portion comes in contact. It was difficult to extend upward, the contact area of the contact portion did not increase so much, and the contact resistance could not be reduced efficiently.

そこで、この発明は、接点部の接触面積を増大することができ、接触抵抗を低減することができる接点めっき構造の提供を目的としている。   Then, this invention can increase the contact area of a contact part, and it aims at provision of the contact plating structure which can reduce contact resistance.

請求項1記載の発明は、互いに接触可能な接点部と、前記接点部の最表面に形成された表面めっき層と、前記接点部の母材と前記表面めっき層との間に形成された下地めっき層と、前記表面めっき層と前記下地めっき層との間に形成され前記接点部が接触したときに前記表面めっき層に対して延性を付与する中間めっき層とを有することを特徴とする接点めっき構造である。   The invention according to claim 1 is a contact portion which can be mutually contacted, a surface plating layer formed on the outermost surface of the contact portion, and a base formed between a base material of the contact portion and the surface plating layer. A contact comprising: a plating layer; and an intermediate plating layer which is formed between the surface plating layer and the base plating layer and which imparts ductility to the surface plating layer when the contact portion comes in contact with each other. It is a plating structure.

この接点めっき構造では、表面めっき層と下地めっき層との間に、接点部が接触したときに表面めっき層に対して延性を付与する中間めっき層が形成されているので、中間めっき層による延性の付与によって表面めっき層が延びやすくなり、接点部の接触面積を増大させることができる。   In this contact plating structure, since an intermediate plating layer is provided between the surface plating layer and the base plating layer to impart ductility to the surface plating layer when the contact portion comes in contact, the ductility by the intermediate plating layer is formed. The surface plating layer can be easily extended by the application of the above, and the contact area of the contact portion can be increased.

従って、このような接点めっき構造では、接点部の接触面積を増大することができ、接触抵抗を低減することができる。   Therefore, in such a contact plating structure, the contact area of the contact portion can be increased, and the contact resistance can be reduced.

請求項2記載の発明は、請求項1記載の接点めっき構造であって、前記中間めっき層は、前記表面めっき層に対して前記下地めっき層より親和性の低い材料からなることを特徴とする。   The invention according to claim 2 is the contact plating structure according to claim 1, wherein the intermediate plating layer is made of a material having a lower affinity than the base plating layer with respect to the surface plating layer. .

この接点めっき構造では、中間めっき層が、表面めっき層に対して下地めっき層より親和性の低い材料からなるので、表面めっき層と中間めっき層との結びつきを低減させることができ、表面めっき層が中間めっき層の表面上を流動し易くなり、接点部の接触面積を増大させることができる。   In this contact plating structure, since the intermediate plating layer is made of a material having a lower affinity to the surface plating layer than the base plating layer, bonding between the surface plating layer and the intermediate plating layer can be reduced. Is likely to flow on the surface of the intermediate plating layer, and the contact area of the contact portion can be increased.

請求項3記載の発明は、請求項1記載の接点めっき構造であって、前記中間めっき層は、前記表面めっき層より硬度の低い材料からなることを特徴とする。   The invention according to a third aspect is the contact plating structure according to the first aspect, wherein the intermediate plating layer is made of a material having a hardness lower than that of the surface plating layer.

この接点めっき構造では、中間めっき層が、表面めっき層より硬度の低い材料からなるので、中間めっき層の柔軟性によって表面めっき層が変形し易くなり、接点部の接触面積を増大させることができる。   In this contact plating structure, since the intermediate plating layer is made of a material having a hardness lower than that of the surface plating layer, the flexibility of the intermediate plating layer makes it easy to deform the surface plating layer, and the contact area of the contact portion can be increased. .

本発明によれば、接点部の接触面積を増大することができ、接触抵抗を低減することができる接点めっき構造を提供することができるという効果を奏する。   According to the present invention, the contact area of the contact portion can be increased, and the contact plating structure capable of reducing the contact resistance can be provided.

本発明の実施の形態に係る接点めっき構造が適用される一例としての雄端子と雌端子との断面図である。It is sectional drawing of the male terminal as an example to which the contact point plating structure which concerns on embodiment of this invention is applied, and a female terminal. 本発明の第1実施形態に係る接点めっき構造の断面図である。It is sectional drawing of the contact point plating structure which concerns on 1st Embodiment of this invention. 本発明の第1実施形態に係る接点めっき構造の接続部側の断面図である。It is sectional drawing of the connection part side of the contact point plating structure which concerns on 1st Embodiment of this invention. 本発明の第2実施形態に係る接点めっき構造の断面図である。It is sectional drawing of the contact point plating structure which concerns on 2nd Embodiment of this invention. 本発明の第2実施形態に係る接点めっき構造の接続部側の断面図である。It is sectional drawing of the connection part side of the contact point plating structure which concerns on 2nd Embodiment of this invention.

まず、図1を用いて本発明の実施の形態に係る接点めっき構造が適用される全体的な構造の一例について説明する。   First, an example of the entire structure to which the contact plating structure according to the embodiment of the present invention is applied will be described using FIG.

本発明の実施の形態に係る接点めっき構造は、例えば、図1に示すように、雄端子13と、雌端子15との電気的な接続を行う接点部3に適用される。   The contact plating structure according to the embodiment of the present invention is applied to, for example, the contact portion 3 for electrically connecting the male terminal 13 and the female terminal 15 as shown in FIG.

雄端子13は、銅(Cu)や銅合金などの銅系金属からなる薄板状の母材に対して、加工を施すことにより、タブ状の接続部17を有している。   The male terminal 13 has a tab-like connection portion 17 by processing a thin plate-like base material made of a copper-based metal such as copper (Cu) or a copper alloy.

この雄端子13は、接続部17と反対側が電源や機器などに電気的に接続され、接続部17が雌端子15の箱状の接続部19に挿入されることにより、雄端子13と雌端子15とが電気的に接続される。   The male terminal 13 is electrically connected to a power source, equipment, etc. on the opposite side to the connecting portion 17, and the connecting portion 17 is inserted into the box-like connecting portion 19 of the female terminal 15, whereby the male terminal 13 and the female terminal are connected. And 15 are electrically connected.

雌端子15は、銅や銅合金などの銅系金属からなる薄板状の母材に対して、加工を施すことにより、箱状の接続部19を有している。   The female terminal 15 has a box-like connection portion 19 by processing a thin plate-like base material made of a copper-based metal such as copper or copper alloy.

この雌端子15は、接続部19と反対側が電源や機器などに電気的に接続され、雄端子13のタブ状の接続部17が挿入される接続部19内に、タブ状の接続部17に接触される接触部21が設けられている。   The female terminal 15 is electrically connected to the power supply, equipment, etc. on the opposite side to the connecting portion 19, and is connected to the tab-shaped connecting portion 17 in the connecting portion 19 into which the tab-shaped connecting portion 17 of the male terminal 13 is inserted. A contact portion 21 to be contacted is provided.

接触部21は、接続部19内で弾性変形可能に設けられた弾性片23に突設され、接続部19内にタブ状の接続部17が挿入された状態で、弾性片23の付勢力によってタブ状の接続部17に接触され、雄端子13と雌端子15とを電気的に接続させる。   The contact portion 21 is provided so as to protrude from the elastic piece 23 provided so as to be elastically deformable in the connection portion 19, and the tab-like connection portion 17 is inserted into the connection portion 19. The male terminal 13 and the female terminal 15 are electrically connected by being in contact with the tab-like connection portion 17.

以下、図2〜図5を用いて、このような雄端子13の接続部17と雌端子15の接触部21との接触のような接点部3における本発明の実施の形態に係る接点めっき構造について説明する。   Hereinafter, the contact plating structure according to the embodiment of the present invention in the contact portion 3 such as the contact between the connection portion 17 of the male terminal 13 and the contact portion 21 of the female terminal 15 with reference to FIGS. Will be explained.

(第1実施形態)
図2,図3を用いて第1実施形態について説明する。
First Embodiment
The first embodiment will be described using FIGS. 2 and 3.

本実施の形態に係る接点めっき構造1は、互いに接触可能な接点部3と、接点部3の最表面に形成された表面めっき層5と、接点部3の母材7と表面めっき層5との間に形成された下地めっき層9とを備えている。   The contact plating structure 1 according to the present embodiment includes the contact portion 3 capable of contacting each other, the surface plating layer 5 formed on the outermost surface of the contact portion 3, the base material 7 of the contact portion 3 and the surface plating layer 5 And a base plating layer 9 formed between the two.

そして、表面めっき層5と下地めっき層9との間には、接点部3が接触したときに表面めっき層5に対して延性を付与する中間めっき層11が形成されている。   Then, an intermediate plating layer 11 is provided between the surface plating layer 5 and the base plating layer 9 to impart ductility to the surface plating layer 5 when the contact portion 3 contacts.

また、中間めっき層11は、表面めっき層5に対して下地めっき層9より親和性の低い材料からなる。   Further, the intermediate plating layer 11 is made of a material having a lower affinity to the surface plating layer 5 than the base plating layer 9.

図2,図3に示すように、接点部3における雄端子13(図1参照)の接続部17の少なくとも雌端子15(図1参照)の接触部21と接触する部分の近傍には、表面めっき層5と、下地めっき層9と、中間めっき層11とが形成されている。   As shown in FIG. 2 and FIG. 3, the surface of the contact portion 3 in the vicinity of a portion in contact with the contact portion 21 of at least the female terminal 15 (see FIG. 1) of the connection portion 17 of the male terminal 13 (see FIG. A plated layer 5, a base plated layer 9, and an intermediate plated layer 11 are formed.

表面めっき層5は、金(Au)又はAu合金、或いは銀(Ag)又はAg合金からなり、接点部3(接続部17)の最表面に形成されている。   The surface plating layer 5 is made of gold (Au), Au alloy, silver (Ag) or Ag alloy, and is formed on the outermost surface of the contact portion 3 (connection portion 17).

この表面めっき層5は、接点部3において、接触部21が接続部17に接触したときに、接触部21の表面に接触し、Au或いはAgで構成することにより、接触抵抗を低減する。   The surface plating layer 5 contacts the surface of the contact portion 21 when the contact portion 21 contacts the connection portion 17 in the contact portion 3 and reduces contact resistance by being made of Au or Ag.

下地めっき層9は、ニッケル(Ni)からなり、接点部3の母材7と表面めっき層5との間で、接点部3の母材7の表面に一体に形成されている。   The base plating layer 9 is made of nickel (Ni), and is integrally formed on the surface of the base material 7 of the contact portion 3 between the base material 7 of the contact portion 3 and the surface plating layer 5.

この下地めっき層9は、接点部3の母材7を構成する銅(Cu)が、温度の上昇によって、母材7からCu原子が表面めっき層5の表面に拡散して酸化物を形成することを抑制する。   In the base plating layer 9, copper (Cu) constituting the base material 7 of the contact portion 3 diffuses Cu atoms from the base material 7 to the surface of the surface plating layer 5 to form an oxide when the temperature rises. Suppress that.

中間めっき層11は、表面めっき層5と下地めっき層9との間で、表面めっき層5の表面と下地めっき層9の表面とに一体に形成されている。   The intermediate plating layer 11 is integrally formed on the surface of the surface plating layer 5 and the surface of the base plating layer 9 between the surface plating layer 5 and the base plating layer 9.

ここで、表面めっき層5と下地めっき層9との間に中間めっき層11を設けていない場合、接点部3の母材7の表面に下地めっき層9が一体に形成され、下地めっき層9の表面に表面めっき層5が一体に形成されていることになる。   Here, when the intermediate plating layer 11 is not provided between the surface plating layer 5 and the base plating layer 9, the base plating layer 9 is integrally formed on the surface of the base material 7 of the contact portion 3. The surface plating layer 5 is integrally formed on the surface of the.

このようなめっき構造において、下地めっき層9(Ni)と表面めっき層5(Au)とは、互いの結びつき(密着性)が強く、接触部21が接続部17に接触したときに、表面めっき層5が延びにくく、接触部21に対する接続部17の接触面積を稼ぐことが困難であった。   In such a plating structure, the base plating layer 9 (Ni) and the surface plating layer 5 (Au) have a strong bond (adhesion) to each other, and when the contact portion 21 contacts the connection portion 17, surface plating The layer 5 was difficult to extend, and it was difficult to obtain the contact area of the connection portion 17 with the contact portion 21.

そこで、中間めっき層11は、接触部21が接続部17に接触したときに、表面めっき層5に対して延性を付与する材料からなる。   Therefore, the intermediate plating layer 11 is made of a material that imparts ductility to the surface plating layer 5 when the contact portion 21 contacts the connection portion 17.

詳細には、中間めっき層11は、例えば、下地めっき層9のNiより表面めっき層5のAuとの相互溶解度の低い金属からなる。   Specifically, the intermediate plating layer 11 is made of, for example, a metal having lower mutual solubility with Au of the surface plating layer 5 than Ni of the base plating layer 9.

この中間めっき層11を設けることにより、表面めっき層5に対して下地めっき層9より中間めっき層11の方が親和性が低くなり、表面めっき層5と中間めっき層11との結びつき(密着性)を弱くすることができる。   By providing the intermediate plating layer 11, the affinity of the intermediate plating layer 11 to the surface plating layer 5 is lower than that of the base plating layer 9, and the connection between the surface plating layer 5 and the intermediate plating layer 11 (adhesion) ) Can be weakened.

このため、表面めっき層5は、接触部21が接続部17に接触したときに、下地めっき層9の表面に形成されている場合よりも、図2の矢印で示すように、中間めっき層11の表面上で流動して延びやすくなり、接触部21に対する接続部17の接触面積を稼ぐことができる。   Therefore, when the contact portion 21 comes in contact with the connection portion 17, the surface plating layer 5 has the intermediate plating layer 11 as shown by the arrow in FIG. 2 than when it is formed on the surface of the base plating layer 9. It becomes easy to flow and to extend on the surface of the contact surface, and the contact area of the connection portion 17 with the contact portion 21 can be gained.

このような接点めっき構造1では、表面めっき層5と下地めっき層9との間に、接点部3が接触したときに表面めっき層5に対して延性を付与する中間めっき層11が形成されているので、中間めっき層11による延性の付与によって表面めっき層5が延びやすくなり、接点部3の接触面積を増大させることができる。   In such a contact plating structure 1, an intermediate plating layer 11 is formed between the surface plating layer 5 and the base plating layer 9 to impart ductility to the surface plating layer 5 when the contact portion 3 comes into contact. Therefore, the provision of ductility by the intermediate plating layer 11 facilitates the surface plating layer 5 to be extended, and the contact area of the contact portion 3 can be increased.

従って、このような接点めっき構造1では、接点部3の接触面積を増大することができ、接触抵抗を低減することができる。   Therefore, in such a contact plating structure 1, the contact area of the contact portion 3 can be increased, and the contact resistance can be reduced.

また、中間めっき層11は、表面めっき層5に対して下地めっき層9より親和性の低い材料からなるので、表面めっき層5と中間めっき層11との結びつきを低減させることができ、表面めっき層5が中間めっき層11の表面上を流動し易くなり、接点部3の接触面積を増大させることができる。   Further, since the intermediate plating layer 11 is made of a material having a lower affinity to the surface plating layer 5 than the base plating layer 9, the connection between the surface plating layer 5 and the intermediate plating layer 11 can be reduced. The layer 5 can easily flow on the surface of the intermediate plating layer 11, and the contact area of the contact portion 3 can be increased.

(第2実施形態)
図4,図5を用いて第2実施形態について説明する。
Second Embodiment
The second embodiment will be described with reference to FIGS. 4 and 5.

本実施の形態に係る接点めっき構造101は、中間めっき層103が、表面めっき層5より硬度の低い材料からなる。   In contact plating structure 101 according to the present embodiment, intermediate plating layer 103 is made of a material having a hardness lower than that of surface plating layer 5.

なお、第1実施形態と同一の構成には、同一の記号を記して構成及び機能説明は第1実施形態を参照するものとし省略するが、第1実施形態と同一の構成であるので、得られる効果は同一である。   The same components as those in the first embodiment are indicated by the same symbols, and the explanation of the configuration and functions will be made with reference to the first embodiment, but the explanation will be omitted because they are the same as the first embodiment. The effects are the same.

図4,図5に示すように、表面めっき層5は、金(Au)又はAu合金、或いは銀(Ag)又はAg合金からなり、接点部3(接続部17)の最表面に形成されている。   As shown in FIGS. 4 and 5, the surface plated layer 5 is made of gold (Au), Au alloy, silver (Ag) or Ag alloy, and is formed on the outermost surface of the contact portion 3 (connection portion 17). There is.

この表面めっき層5と下地めっき層9との間には、中間めっき層103が表面めっき層5の表面と下地めっき層9の表面とに一体に形成されている。   An intermediate plated layer 103 is integrally formed on the surface of the surface plated layer 5 and the surface of the base plated layer 9 between the surface plated layer 5 and the base plated layer 9.

なお、本実施の形態においては、表面めっき層5と下地めっき層9と中間めっき層103とが接触部21側にも設けられているが、接続部17側のめっき層と同様の構成であるので、同様の符号を記して接触部21側の説明については省略する。   In the present embodiment, surface plating layer 5, base plating layer 9, and intermediate plating layer 103 are provided also on the side of contact portion 21, but have the same configuration as the plating layer on the side of connection portion 17. Therefore, the same reference numerals are given and the explanation of the contact portion 21 is omitted.

中間めっき層103は、接触部21が接続部17に接触したときに、表面めっき層5に対して延性を付与する材料からなる。   The intermediate plating layer 103 is made of a material that imparts ductility to the surface plating layer 5 when the contact portion 21 contacts the connection portion 17.

詳細には、中間めっき層103は、例えば、表面めっき層5のAuやAgより硬度の低い錫(Sn)からなる。   Specifically, the intermediate plating layer 103 is made of, for example, tin (Sn) having a hardness lower than that of Au or Ag of the surface plating layer 5.

この中間めっき層103を設けることにより、表面めっき層5の下地が軟らかくなって、表面めっき層5が中間めっき層103に追従して変形し易くなる。   By providing the intermediate plating layer 103, the base of the surface plating layer 5 becomes soft, and the surface plating layer 5 easily deforms following the intermediate plating layer 103.

このため、表面めっき層5は、接触部21が接続部17に接触したときに、中間めっき層103の変形に追従して延びやすくなり、接触部21に対する接続部17の接触面積を稼ぐことができる。   Therefore, when the contact portion 21 contacts the connection portion 17, the surface plating layer 5 is likely to extend following the deformation of the intermediate plating layer 103, and the contact area of the connection portion 17 with the contact portion 21 can be increased. it can.

このような接点めっき構造101では、中間めっき層103が、表面めっき層5より硬度の低い材料からなるので、中間めっき層103の柔軟性によって表面めっき層5が変形し易くなり、接点部3の接触面積を増大させることができる。   In such a contact plating structure 101, since the intermediate plating layer 103 is made of a material having a hardness lower than that of the surface plating layer 5, the surface plating layer 5 is easily deformed by the flexibility of the intermediate plating layer 103. The contact area can be increased.

なお、本発明の実施の形態に係る接点めっき構造では、めっき層に用いられる金属を例示しているが、例示した金属に限らず、表面めっき層や下地めっき層にはどのような金属を用いてもよく、中間めっき層には接点部が接触したときに表面めっき層に対して延性を付与するものであればどのような金属を用いてもよい。   In addition, although the metal used for a plating layer is illustrated in the contact point plating structure which concerns on embodiment of this invention, not only the illustrated metal but what kind of metal is used for a surface plating layer and a base plating layer Any metal may be used as the intermediate plating layer as long as it imparts ductility to the surface plating layer when the contact portion is in contact.

加えて、中間めっき層は、表面めっき層に対して下地めっき層より親和性の低いもの、或いは表面めっき層より硬度の低いものであればどのような金属であってもよい。   In addition, the intermediate plating layer may be any metal having a lower affinity to the surface plating layer than the base plating layer or a lower hardness than the surface plating layer.

1,101…接点めっき構造
3…接点部
5…表面めっき層
7…母材
9…下地めっき層
11,103…中間めっき層
1, 101 ... contact plating structure 3 ... contact portion 5 ... surface plating layer 7 ... base material 9 ... base plating layer 11, 103 ... intermediate plating layer

Claims (3)

互いに接触可能な接点部と、
前記接点部の最表面に形成された表面めっき層と、
前記接点部の母材と前記表面めっき層との間に形成された下地めっき層と、
前記表面めっき層と前記下地めっき層との間に形成され前記接点部が接触したときに前記表面めっき層に対して延性を付与する中間めっき層と、
を有することを特徴とする接点めっき構造。
Contact parts that can contact each other;
A surface plating layer formed on the outermost surface of the contact portion;
An undercoating layer formed between the base material of the contact portion and the surface plating layer;
An intermediate plating layer formed between the surface plating layer and the base plating layer to impart ductility to the surface plating layer when the contact portion comes in contact;
Contact plating structure characterized by having.
請求項1記載の接点めっき構造であって、
前記中間めっき層は、前記表面めっき層に対して前記下地めっき層より親和性の低い材料からなることを特徴とする接点めっき構造。
The contact plating structure according to claim 1, wherein
The contact plating structure, wherein the intermediate plating layer is made of a material having a lower affinity to the surface plating layer than the base plating layer.
請求項1記載の接点めっき構造であって、
前記中間めっき層は、前記表面めっき層より硬度の低い材料からなることを特徴とする接点めっき構造。
The contact plating structure according to claim 1, wherein
The contact plating structure, wherein the intermediate plating layer is made of a material having a hardness lower than that of the surface plating layer.
JP2017227755A 2017-11-28 2017-11-28 Contact plating structure Abandoned JP2019096584A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2017227755A JP2019096584A (en) 2017-11-28 2017-11-28 Contact plating structure

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2017227755A JP2019096584A (en) 2017-11-28 2017-11-28 Contact plating structure

Publications (1)

Publication Number Publication Date
JP2019096584A true JP2019096584A (en) 2019-06-20

Family

ID=66971919

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2017227755A Abandoned JP2019096584A (en) 2017-11-28 2017-11-28 Contact plating structure

Country Status (1)

Country Link
JP (1) JP2019096584A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117026345A (en) * 2023-10-08 2023-11-10 西安诚惠金属材料保护有限公司 Aluminum magnesium alloy surface treatment device and treatment process

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005344157A (en) * 2004-06-02 2005-12-15 Yuken Industry Co Ltd Method for suppressing whisker formation from tin or tin alloy plating layer and contact member
JP2013032588A (en) * 2011-07-26 2013-02-14 Rohm & Haas Electronic Materials Llc High temperature resistant silver coated substrate

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005344157A (en) * 2004-06-02 2005-12-15 Yuken Industry Co Ltd Method for suppressing whisker formation from tin or tin alloy plating layer and contact member
JP2013032588A (en) * 2011-07-26 2013-02-14 Rohm & Haas Electronic Materials Llc High temperature resistant silver coated substrate

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117026345A (en) * 2023-10-08 2023-11-10 西安诚惠金属材料保护有限公司 Aluminum magnesium alloy surface treatment device and treatment process
CN117026345B (en) * 2023-10-08 2024-01-02 西安诚惠金属材料保护有限公司 Aluminum-magnesium alloy surface treatment device and treatment process

Similar Documents

Publication Publication Date Title
JP4834023B2 (en) Silver coating material for movable contact parts and manufacturing method thereof
JP2013037791A (en) Connection structure of circuit board and terminal fitting
JP6060875B2 (en) Board terminals and board connectors
US10418736B2 (en) Metal plate for terminal, terminal, and terminal pair
JP2014049375A (en) Connection terminal
JP2013168362A (en) Electric connector and method for manufacturing the same
JP6451385B2 (en) Terminal fittings and connectors
JP6379416B2 (en) Contact member
JP6377599B2 (en) Terminal pairs and connectors
JPWO2010109569A1 (en) Connector connection structure and headlamp light source lighting device using the same
US10033124B2 (en) Electrical contact pair and connector terminal pair
JP2019096584A (en) Contact plating structure
JP2019079735A (en) Electric connector terminal
JP2000277194A (en) Fitting type connecting terminal
JP2018070909A (en) Electrical contacts, connector terminal pairs, and connector pairs
JP2015210941A (en) Contact connection structure
JP2019085627A (en) Contact plating structure
JP2015225704A (en) Terminal
JP2014075255A (en) Connector terminal and material for the same
JP2014225375A (en) Terminal metal fitting, and method of manufacturing the same
WO2016147894A1 (en) Electrical contact pair and connector terminal pair
JP2017027714A (en) connector
TWM486871U (en) Improved structure of electric contact element
JP2015210864A (en) Contact connection structure
JP6371103B2 (en) Contact connection structure

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20201019

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20210624

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20210629

A762 Written abandonment of application

Free format text: JAPANESE INTERMEDIATE CODE: A762

Effective date: 20210802