JP2018122426A - 研磨パッドの製造方法 - Google Patents
研磨パッドの製造方法 Download PDFInfo
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- JP2018122426A JP2018122426A JP2017019061A JP2017019061A JP2018122426A JP 2018122426 A JP2018122426 A JP 2018122426A JP 2017019061 A JP2017019061 A JP 2017019061A JP 2017019061 A JP2017019061 A JP 2017019061A JP 2018122426 A JP2018122426 A JP 2018122426A
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- resin
- epoxy resin
- polishing pad
- polishing
- epoxy
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- 238000005498 polishing Methods 0.000 title claims abstract description 155
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 16
- 239000003822 epoxy resin Substances 0.000 claims abstract description 80
- 229920000647 polyepoxide Polymers 0.000 claims abstract description 80
- IISBACLAFKSPIT-UHFFFAOYSA-N bisphenol A Chemical compound C=1C=C(O)C=CC=1C(C)(C)C1=CC=C(O)C=C1 IISBACLAFKSPIT-UHFFFAOYSA-N 0.000 claims abstract description 48
- 229920005989 resin Polymers 0.000 claims abstract description 38
- 239000011347 resin Substances 0.000 claims abstract description 38
- 239000004593 Epoxy Substances 0.000 claims abstract description 32
- 239000000463 material Substances 0.000 claims abstract description 29
- PXKLMJQFEQBVLD-UHFFFAOYSA-N bisphenol F Chemical compound C1=CC(O)=CC=C1CC1=CC=C(O)C=C1 PXKLMJQFEQBVLD-UHFFFAOYSA-N 0.000 claims abstract description 24
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims abstract description 22
- 229910052739 hydrogen Inorganic materials 0.000 claims abstract description 22
- 239000001257 hydrogen Substances 0.000 claims abstract description 22
- 239000000203 mixture Substances 0.000 claims abstract description 13
- 239000000758 substrate Substances 0.000 claims abstract description 12
- 239000003085 diluting agent Substances 0.000 claims abstract description 11
- 150000001412 amines Chemical class 0.000 claims abstract description 10
- 239000002002 slurry Substances 0.000 claims abstract description 10
- 238000010538 cationic polymerization reaction Methods 0.000 claims abstract description 9
- 239000002685 polymerization catalyst Substances 0.000 claims abstract description 8
- 229920002803 thermoplastic polyurethane Polymers 0.000 claims description 43
- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 claims description 12
- 238000002156 mixing Methods 0.000 claims description 12
- IBOFVQJTBBUKMU-UHFFFAOYSA-N 4,4'-methylene-bis-(2-chloroaniline) Chemical compound C1=C(Cl)C(N)=CC=C1CC1=CC=C(N)C(Cl)=C1 IBOFVQJTBBUKMU-UHFFFAOYSA-N 0.000 claims description 10
- 241001112258 Moca Species 0.000 claims description 9
- 239000003082 abrasive agent Substances 0.000 claims description 5
- 229920002635 polyurethane Polymers 0.000 claims description 3
- 239000004814 polyurethane Substances 0.000 claims description 3
- 239000003795 chemical substances by application Substances 0.000 abstract description 74
- 239000004745 nonwoven fabric Substances 0.000 abstract description 14
- 239000000835 fiber Substances 0.000 abstract description 13
- 238000010586 diagram Methods 0.000 abstract description 5
- 239000002841 Lewis acid Substances 0.000 abstract description 4
- 150000007517 lewis acids Chemical class 0.000 abstract description 4
- 239000002759 woven fabric Substances 0.000 abstract description 4
- 238000000034 method Methods 0.000 abstract description 3
- 150000001875 compounds Chemical class 0.000 abstract 1
- 244000144992 flock Species 0.000 abstract 1
- 239000006061 abrasive grain Substances 0.000 description 22
- 229920003023 plastic Polymers 0.000 description 13
- 239000004033 plastic Substances 0.000 description 13
- 239000011521 glass Substances 0.000 description 10
- 239000007788 liquid Substances 0.000 description 9
- 239000004088 foaming agent Substances 0.000 description 8
- 239000000126 substance Substances 0.000 description 8
- 230000003746 surface roughness Effects 0.000 description 8
- CDBYLPFSWZWCQE-UHFFFAOYSA-L Sodium Carbonate Chemical compound [Na+].[Na+].[O-]C([O-])=O CDBYLPFSWZWCQE-UHFFFAOYSA-L 0.000 description 7
- 229910000420 cerium oxide Inorganic materials 0.000 description 7
- BMMGVYCKOGBVEV-UHFFFAOYSA-N oxo(oxoceriooxy)cerium Chemical compound [Ce]=O.O=[Ce]=O BMMGVYCKOGBVEV-UHFFFAOYSA-N 0.000 description 7
- 239000002075 main ingredient Substances 0.000 description 5
- 125000003700 epoxy group Chemical group 0.000 description 4
- 239000010410 layer Substances 0.000 description 4
- 239000011148 porous material Substances 0.000 description 4
- 125000002723 alicyclic group Chemical group 0.000 description 3
- 150000001408 amides Chemical class 0.000 description 3
- 230000000052 comparative effect Effects 0.000 description 3
- 150000002148 esters Chemical class 0.000 description 3
- LNEPOXFFQSENCJ-UHFFFAOYSA-N haloperidol Chemical compound C1CC(O)(C=2C=CC(Cl)=CC=2)CCN1CCCC(=O)C1=CC=C(F)C=C1 LNEPOXFFQSENCJ-UHFFFAOYSA-N 0.000 description 3
- 230000014759 maintenance of location Effects 0.000 description 3
- 229920001778 nylon Polymers 0.000 description 3
- 239000010980 sapphire Substances 0.000 description 3
- 229910052594 sapphire Inorganic materials 0.000 description 3
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 3
- 229910010271 silicon carbide Inorganic materials 0.000 description 3
- 238000010408 sweeping Methods 0.000 description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 3
- 229930185605 Bisphenol Natural products 0.000 description 2
- UFWIBTONFRDIAS-UHFFFAOYSA-N Naphthalene Chemical compound C1=CC=CC2=CC=CC=C21 UFWIBTONFRDIAS-UHFFFAOYSA-N 0.000 description 2
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 2
- 125000001931 aliphatic group Chemical group 0.000 description 2
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 239000004973 liquid crystal related substance Substances 0.000 description 2
- 238000007517 polishing process Methods 0.000 description 2
- 229920000728 polyester Polymers 0.000 description 2
- 229920005749 polyurethane resin Polymers 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 229910052709 silver Inorganic materials 0.000 description 2
- 239000004332 silver Substances 0.000 description 2
- 239000002344 surface layer Substances 0.000 description 2
- FWVCSXWHVOOTFJ-UHFFFAOYSA-N 1-(2-chloroethylsulfanyl)-2-[2-(2-chloroethylsulfanyl)ethoxy]ethane Chemical compound ClCCSCCOCCSCCCl FWVCSXWHVOOTFJ-UHFFFAOYSA-N 0.000 description 1
- 239000004677 Nylon Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 238000005299 abrasion Methods 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- -1 amine compound Chemical class 0.000 description 1
- 238000006555 catalytic reaction Methods 0.000 description 1
- 239000008119 colloidal silica Substances 0.000 description 1
- 238000013329 compounding Methods 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- TVKRSHXXACIRAW-UHFFFAOYSA-N ethoxycarbonylcarbamic acid Chemical compound CCOC(=O)NC(O)=O TVKRSHXXACIRAW-UHFFFAOYSA-N 0.000 description 1
- 238000007730 finishing process Methods 0.000 description 1
- 238000000227 grinding Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 229920003986 novolac Polymers 0.000 description 1
- 239000005304 optical glass Substances 0.000 description 1
- AFEQENGXSMURHA-UHFFFAOYSA-N oxiran-2-ylmethanamine Chemical compound NCC1CO1 AFEQENGXSMURHA-UHFFFAOYSA-N 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 230000035515 penetration Effects 0.000 description 1
- 238000005191 phase separation Methods 0.000 description 1
- 239000003505 polymerization initiator Substances 0.000 description 1
- 229920000909 polytetrahydrofuran Polymers 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 229920001187 thermosetting polymer Polymers 0.000 description 1
- 235000012431 wafers Nutrition 0.000 description 1
Images
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- Epoxy Resins (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Compositions Of Macromolecular Compounds (AREA)
Abstract
Description
Claims (4)
- エポキシ樹脂を主成分とする樹脂を硬化させた基材または繊維からなる組成物にエポキシ樹脂が含まれる樹脂を含浸、硬化させた基材を有し、工作物との間に研磨材を含有するスラリーを供給しながら前記工作物を相対的に移動させて工作物を研磨する研磨パッドの製造方法であって、
前記基材を形成するエポキシ樹脂の主剤がエポキシ当量150〜300で反応性希釈剤を含まないビスフェノールA型またはビスフェノールF型であってカチオン重合触媒により硬化させることを特徴とする研磨パッドの製造方法。 - エポキシ樹脂を主成分とする樹脂を硬化させた基材または繊維からなる組成物にエポキシ樹脂が含まれる樹脂を含浸、硬化させた基材を有し、工作物との間に研磨材を含有するスラリーを供給しながら前記工作物を相対的に移動させて工作物を研磨する研磨パッドの製造方法であって、
前記基材を形成するエポキシ樹脂の主剤がエポキシ当量150〜300で反応性希釈剤を含まないビスフェノールA型またはビスフェノールF型であって、活性水素当量(アミン当量)が200〜500である硬化剤により硬化させることを特徴とする研磨パッドの製造方法。 - 前記エポキシ樹脂を主成分とする樹脂に混合される樹脂がウレタン樹脂であって、そのウレタン樹脂の主剤がMOCA配合量10〜30phrのエーテル系ポリウレタンであることを特徴とする請求項1または2記載の研磨パッドの製造方法。
- 前記エポキシ樹脂を主成分とする樹脂に混合される樹脂がウレタン樹脂であってエポキシ樹脂とウレタン樹脂の割合が1:1〜4:1の範囲にあることを特徴とする請求項1,2,または3記載の研磨パッドの製造方法。
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114952608A (zh) * | 2022-06-15 | 2022-08-30 | 郑州磨料磨具磨削研究所有限公司 | 一种基于光引发前端聚合反应的固结磨料研磨垫及其制备方法 |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH11138420A (ja) * | 1997-11-07 | 1999-05-25 | Nikon Corp | Cmp用研磨パッド及びそれを用いた研磨装置 |
JP2004303983A (ja) * | 2003-03-31 | 2004-10-28 | Fuji Photo Film Co Ltd | 研磨パッド |
JP2012081566A (ja) * | 2010-10-13 | 2012-04-26 | Ritsumeikan | 研磨パッド |
JP2012081565A (ja) * | 2010-10-13 | 2012-04-26 | Kokonoe Denki Kk | 研磨パッド |
JP2012101298A (ja) * | 2010-11-08 | 2012-05-31 | Ritsumeikan | 研磨パッド |
JP2015081306A (ja) * | 2013-10-23 | 2015-04-27 | 阪本薬品工業株式会社 | エポキシ樹脂組成物 |
WO2016061585A1 (en) * | 2014-10-17 | 2016-04-21 | Applied Materials, Inc. | Polishing pads produced by an additive manufacturing process |
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2017
- 2017-02-03 JP JP2017019061A patent/JP2018122426A/ja active Pending
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH11138420A (ja) * | 1997-11-07 | 1999-05-25 | Nikon Corp | Cmp用研磨パッド及びそれを用いた研磨装置 |
JP2004303983A (ja) * | 2003-03-31 | 2004-10-28 | Fuji Photo Film Co Ltd | 研磨パッド |
JP2012081566A (ja) * | 2010-10-13 | 2012-04-26 | Ritsumeikan | 研磨パッド |
JP2012081565A (ja) * | 2010-10-13 | 2012-04-26 | Kokonoe Denki Kk | 研磨パッド |
JP2012101298A (ja) * | 2010-11-08 | 2012-05-31 | Ritsumeikan | 研磨パッド |
JP2015081306A (ja) * | 2013-10-23 | 2015-04-27 | 阪本薬品工業株式会社 | エポキシ樹脂組成物 |
WO2016061585A1 (en) * | 2014-10-17 | 2016-04-21 | Applied Materials, Inc. | Polishing pads produced by an additive manufacturing process |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114952608A (zh) * | 2022-06-15 | 2022-08-30 | 郑州磨料磨具磨削研究所有限公司 | 一种基于光引发前端聚合反应的固结磨料研磨垫及其制备方法 |
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