JP2017527118A - 二次元層状材料の量子井戸接合デバイス、多重量子井戸デバイス及び量子井戸デバイスの製造方法 - Google Patents
二次元層状材料の量子井戸接合デバイス、多重量子井戸デバイス及び量子井戸デバイスの製造方法 Download PDFInfo
- Publication number
- JP2017527118A JP2017527118A JP2017511609A JP2017511609A JP2017527118A JP 2017527118 A JP2017527118 A JP 2017527118A JP 2017511609 A JP2017511609 A JP 2017511609A JP 2017511609 A JP2017511609 A JP 2017511609A JP 2017527118 A JP2017527118 A JP 2017527118A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- quantum well
- dimensional material
- well device
- van der
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000463 material Substances 0.000 title claims abstract description 125
- 238000004519 manufacturing process Methods 0.000 title claims description 5
- 239000003530 quantum well junction Substances 0.000 title description 2
- 238000005411 Van der Waals force Methods 0.000 claims abstract description 21
- 238000000151 deposition Methods 0.000 claims description 14
- 238000000034 method Methods 0.000 claims description 14
- 239000004065 semiconductor Substances 0.000 claims description 14
- 238000005229 chemical vapour deposition Methods 0.000 claims description 11
- 239000000758 substrate Substances 0.000 claims description 10
- 238000000231 atomic layer deposition Methods 0.000 claims description 9
- 238000005215 recombination Methods 0.000 claims 1
- 230000006798 recombination Effects 0.000 claims 1
- 239000010410 layer Substances 0.000 description 128
- 239000000126 substance Substances 0.000 description 14
- 238000010586 diagram Methods 0.000 description 9
- 229910052751 metal Inorganic materials 0.000 description 8
- 239000002184 metal Substances 0.000 description 8
- CWQXQMHSOZUFJS-UHFFFAOYSA-N molybdenum disulfide Chemical compound S=[Mo]=S CWQXQMHSOZUFJS-UHFFFAOYSA-N 0.000 description 7
- 229910052982 molybdenum disulfide Inorganic materials 0.000 description 7
- 229910052582 BN Inorganic materials 0.000 description 4
- PZNSFCLAULLKQX-UHFFFAOYSA-N Boron nitride Chemical compound N#B PZNSFCLAULLKQX-UHFFFAOYSA-N 0.000 description 4
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 4
- 230000003287 optical effect Effects 0.000 description 4
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 3
- 239000013078 crystal Substances 0.000 description 3
- 230000005693 optoelectronics Effects 0.000 description 3
- 239000007787 solid Substances 0.000 description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 239000000969 carrier Substances 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- 230000001808 coupling effect Effects 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 2
- 229910052759 nickel Inorganic materials 0.000 description 2
- 229920000642 polymer Polymers 0.000 description 2
- 229920000307 polymer substrate Polymers 0.000 description 2
- 239000002243 precursor Substances 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- 238000007740 vapor deposition Methods 0.000 description 2
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 1
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 1
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- 239000002390 adhesive tape Substances 0.000 description 1
- MDPILPRLPQYEEN-UHFFFAOYSA-N aluminium arsenide Chemical compound [As]#[Al] MDPILPRLPQYEEN-UHFFFAOYSA-N 0.000 description 1
- CXRFFSKFQFGBOT-UHFFFAOYSA-N bis(selanylidene)niobium Chemical compound [Se]=[Nb]=[Se] CXRFFSKFQFGBOT-UHFFFAOYSA-N 0.000 description 1
- ROUIDRHELGULJS-UHFFFAOYSA-N bis(selanylidene)tungsten Chemical compound [Se]=[W]=[Se] ROUIDRHELGULJS-UHFFFAOYSA-N 0.000 description 1
- VRSMQRZDMZDXAU-UHFFFAOYSA-N bis(sulfanylidene)niobium Chemical compound S=[Nb]=S VRSMQRZDMZDXAU-UHFFFAOYSA-N 0.000 description 1
- FBGGJHZVZAAUKJ-UHFFFAOYSA-N bismuth selenide Chemical compound [Se-2].[Se-2].[Se-2].[Bi+3].[Bi+3] FBGGJHZVZAAUKJ-UHFFFAOYSA-N 0.000 description 1
- 150000004770 chalcogenides Chemical class 0.000 description 1
- 239000002800 charge carrier Substances 0.000 description 1
- ZZEMEJKDTZOXOI-UHFFFAOYSA-N digallium;selenium(2-) Chemical compound [Ga+3].[Ga+3].[Se-2].[Se-2].[Se-2] ZZEMEJKDTZOXOI-UHFFFAOYSA-N 0.000 description 1
- 229910052733 gallium Inorganic materials 0.000 description 1
- 229910021389 graphene Inorganic materials 0.000 description 1
- 230000005283 ground state Effects 0.000 description 1
- AKUCEXGLFUSJCD-UHFFFAOYSA-N indium(3+);selenium(2-) Chemical compound [Se-2].[Se-2].[Se-2].[In+3].[In+3] AKUCEXGLFUSJCD-UHFFFAOYSA-N 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 238000003475 lamination Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- MHWZQNGIEIYAQJ-UHFFFAOYSA-N molybdenum diselenide Chemical compound [Se]=[Mo]=[Se] MHWZQNGIEIYAQJ-UHFFFAOYSA-N 0.000 description 1
- 229910021428 silicene Inorganic materials 0.000 description 1
- 239000002356 single layer Substances 0.000 description 1
- WWNBZGLDODTKEM-UHFFFAOYSA-N sulfanylidenenickel Chemical compound [Ni]=S WWNBZGLDODTKEM-UHFFFAOYSA-N 0.000 description 1
- RCYJPSGNXVLIBO-UHFFFAOYSA-N sulfanylidenetitanium Chemical compound [S].[Ti] RCYJPSGNXVLIBO-UHFFFAOYSA-N 0.000 description 1
- FAWYJKSBSAKOFP-UHFFFAOYSA-N tantalum(iv) sulfide Chemical compound S=[Ta]=S FAWYJKSBSAKOFP-UHFFFAOYSA-N 0.000 description 1
- XSOKHXFFCGXDJZ-UHFFFAOYSA-N telluride(2-) Chemical compound [Te-2] XSOKHXFFCGXDJZ-UHFFFAOYSA-N 0.000 description 1
- ITRNXVSDJBHYNJ-UHFFFAOYSA-N tungsten disulfide Chemical compound S=[W]=S ITRNXVSDJBHYNJ-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/10—Semiconductor bodies
- H10F77/14—Shape of semiconductor bodies; Shapes, relative sizes or dispositions of semiconductor regions within semiconductor bodies
- H10F77/146—Superlattices; Multiple quantum well structures
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y30/00—Nanotechnology for materials or surface science, e.g. nanocomposites
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02436—Intermediate layers between substrates and deposited layers
- H01L21/02439—Materials
- H01L21/02485—Other chalcogenide semiconducting materials not being oxides, e.g. ternary compounds
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02436—Intermediate layers between substrates and deposited layers
- H01L21/02494—Structure
- H01L21/02496—Layer structure
- H01L21/02499—Monolayers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02436—Intermediate layers between substrates and deposited layers
- H01L21/02494—Structure
- H01L21/02496—Layer structure
- H01L21/02502—Layer structure consisting of two layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02568—Chalcogenide semiconducting materials not being oxides, e.g. ternary compounds
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/80—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/80—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
- H10D62/81—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials of structures exhibiting quantum-confinement effects, e.g. single quantum wells; of structures having periodic or quasi-periodic potential variation
- H10D62/812—Single quantum well structures
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/80—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
- H10D62/82—Heterojunctions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D8/00—Diodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F71/00—Manufacture or treatment of devices covered by this subclass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/10—Semiconductor bodies
- H10F77/12—Active materials
- H10F77/124—Active materials comprising only Group III-V materials, e.g. GaAs
- H10F77/1246—III-V nitrides, e.g. GaN
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/10—Semiconductor bodies
- H10F77/12—Active materials
- H10F77/127—Active materials comprising only Group IV-VI or only Group II-IV-VI chalcogenide materials, e.g. PbSnTe
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F77/00—Constructional details of devices covered by this subclass
- H10F77/10—Semiconductor bodies
- H10F77/14—Shape of semiconductor bodies; Shapes, relative sizes or dispositions of semiconductor regions within semiconductor bodies
- H10F77/143—Shape of semiconductor bodies; Shapes, relative sizes or dispositions of semiconductor regions within semiconductor bodies comprising quantum structures
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/81—Bodies
- H10H20/811—Bodies having quantum effect structures or superlattices, e.g. tunnel junctions
- H10H20/812—Bodies having quantum effect structures or superlattices, e.g. tunnel junctions within the light-emitting regions, e.g. having quantum confinement structures
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
- H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
- H10H20/80—Constructional details
- H10H20/81—Bodies
- H10H20/822—Materials of the light-emitting regions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/80—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
- H10D62/85—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being Group III-V materials, e.g. GaAs
- H10D62/8503—Nitride Group III-V materials, e.g. AlN or GaN
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/544—Solar cells from Group III-V materials
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Nanotechnology (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Composite Materials (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biophysics (AREA)
- Optics & Photonics (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Led Devices (AREA)
- Light Receiving Elements (AREA)
- Photovoltaic Devices (AREA)
Abstract
Description
Claims (21)
- 第1二次元材料の第1層と、
第2二次元材料の第2層と、
前記第1層と前記第2層の間に配置される第3二次元材料の第3層と、を備え、
前記第1層、前記第2層及び前記第3層は、主にファンデルワールス力によって付着していることを特徴とする量子井戸デバイス。 - 前記第3層は、
印加バイアス電圧を受け、
前記印加バイアス電圧によって所定のエネルギー準位の光子を吸収し、
前記吸収された光子によって電流を発生させるように適合されることを特徴とする請求項1に記載の量子井戸デバイス。 - 前記第1二次元材料は、n型半導体となるようドープされることを特徴とする請求項2に記載の量子井戸デバイス。
- 前記第2二次元材料は、p型半導体となるようドープされることを特徴とする請求項2に記載の量子井戸デバイス。
- 前記第3層は、前記第3二次元材料の複数の副層を備えており、前記複数の副層の各々は、主にファンデルワールス力によって付着していることを特徴とする請求項2に記載の量子井戸デバイス。
- 前記第3層のバンドギャップは、前記第1層及び前記第2層のバンドギャップよりも小さく、前記第3層の前記副層の数を変えることで調節可能であることを特徴とする請求項5に記載の量子井戸デバイス。
- 前記第3層は、
駆動電圧を受け、
前記駆動電圧によって前記第1層から前記第3層へ複数の電子を駆動し、
前記駆動電圧によって前記第2層から前記第3層へ複数のホールを駆動し、
前記複数の駆動された電子からの電子及び前記複数の駆動されたホールからのホールの再結合により複数の光子を生成するように適合されることを特徴とする請求項1に記載の量子井戸デバイス。 - 前記第1二次元材料は、n型半導体となるようドープされることを特徴とする請求項7に記載の量子井戸デバイス。
- 前記第2二次元材料は、p型半導体となるようドープされることを特徴とする請求項7に記載の量子井戸デバイス。
- 前記第3層は、前記第3二次元材料の複数の副層を備えており、前記複数の副層の各々は、主にファンデルワールス力によって付着していることを特徴とする請求項7に記載の量子井戸デバイス。
- 前記第3層のバンドギャップは、前記第1層及び前記第2層のバンドギャップよりも小さく、前記第3層の前記副層の数を変えることで調節可能であることを特徴とする請求項10に記載の量子井戸デバイス。
- 請求項1に記載の量子井戸デバイスを少なくとも一つ備えることを特徴とする多重量子井戸デバイス。
- 基板及び第1二次元材料の第1層が主にファンデルワールス力によって付着するように前記第1層を前記基板上に堆積する工程と、
前記第1層及び第2二次元材料の第2層が主にファンデルワールス力によって付着するように前記第2層を前記第1層上に堆積する工程と、
前記第2層及び第3二次元材料の第3層が主にファンデルワールス力によって付着するように前記第3層を前記第2層上に堆積する工程と、
前記第3層上に第1コンタクトを堆積する工程と、
前記第1層の一部を露出する工程と、
前記第1層上に第2コンタクトを堆積する工程と、を備えることを特徴とする量子井戸デバイスの製造方法。 - 前記第1層は、機械的剥離、化学蒸着又は原子層堆積のいずれかによって堆積されることを特徴とする請求項12に記載の方法。
- 前記第2層は、機械的剥離、化学蒸着又は原子層堆積のいずれかによって堆積されることを特徴とする請求項12に記載の方法。
- 前記第3層は、機械的剥離、化学蒸着又は原子層堆積のいずれかによって堆積されることを特徴とする請求項12に記載の方法。
- 前記第1二次元材料は、n型半導体となるようドープされることを特徴とする請求項12に記載の方法。
- 前記第3二次元材料は、p型半導体となるようドープされることを特徴とする請求項12に記載の方法。
- 前記第2層を堆積する工程は、前記第2二次元材料の複数の副層を堆積する工程を含み、前記複数の副層の各々は主にファンデルワールス力によって付着することを特徴とする請求項12に記載の方法。
- 前記第2層のバンドギャップは、前記第1層及び前記第3層のバンドギャップよりも小さいことを特徴とする請求項18に記載の方法。
- 前記第2層の前記副層の数を変えることで前記第2層のバンドギャップを調節する工程を更に備えることを特徴とする請求項19に記載の方法。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201462043196P | 2014-08-28 | 2014-08-28 | |
US62/043,196 | 2014-08-28 | ||
PCT/US2015/042913 WO2016032680A1 (en) | 2014-08-28 | 2015-07-30 | Two dimensional layered material quantum well junction devices |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2017527118A true JP2017527118A (ja) | 2017-09-14 |
JP6479164B2 JP6479164B2 (ja) | 2019-03-06 |
Family
ID=55400305
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2017511609A Active JP6479164B2 (ja) | 2014-08-28 | 2015-07-30 | 二次元層状材料の量子井戸接合デバイス、多重量子井戸デバイス及び量子井戸デバイスの製造方法 |
Country Status (4)
Country | Link |
---|---|
US (1) | US10446705B2 (ja) |
EP (1) | EP3186836B1 (ja) |
JP (1) | JP6479164B2 (ja) |
WO (1) | WO2016032680A1 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20200043884A (ko) * | 2018-10-18 | 2020-04-28 | 한양대학교 산학협력단 | 막 구조체, 소자 및 멀티레벨 소자 |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US11560606B2 (en) | 2016-05-10 | 2023-01-24 | United States Steel Corporation | Methods of producing continuously cast hot rolled high strength steel sheet products |
US10504722B2 (en) | 2017-07-25 | 2019-12-10 | United States Of America As Represented By The Secretary Of The Air Force | Growth of III-nitride semiconductors on thin van der Waals buffers for mechanical lift off and transfer |
CN108206218B (zh) * | 2018-02-02 | 2024-08-27 | 华南理工大学 | 一种MoS2基金属半导体场效应晶体管及其制备方法 |
US11152542B2 (en) * | 2018-12-19 | 2021-10-19 | Purdue Research Foundation | Semiconductor device and method of making the same |
Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04156518A (ja) * | 1990-10-19 | 1992-05-29 | Matsushita Electric Ind Co Ltd | 空間光変調素子および薄膜の製作方法 |
JPH063712A (ja) * | 1992-06-22 | 1994-01-14 | Kanegafuchi Chem Ind Co Ltd | 多層膜調光材料 |
JPH07325329A (ja) * | 1994-06-01 | 1995-12-12 | Mitsubishi Electric Corp | 有機超格子材料、その製造方法および該材料を用いた素子 |
JPH11282033A (ja) * | 1998-03-30 | 1999-10-15 | Hitachi Ltd | 有機無機複合材料 |
JP2005303266A (ja) * | 2004-03-19 | 2005-10-27 | Fuji Photo Film Co Ltd | 撮像素子、その電場印加方法および印加した素子 |
US20120141799A1 (en) * | 2010-12-03 | 2012-06-07 | Francis Kub | Film on Graphene on a Substrate and Method and Devices Therefor |
WO2013140181A1 (en) * | 2012-03-22 | 2013-09-26 | The University Of Manchester | Photovoltaic cells |
JP2014045094A (ja) * | 2012-08-27 | 2014-03-13 | Sharp Corp | 高透過率保護膜作製方法および半導体発光素子の製造方法 |
JP2014060255A (ja) * | 2012-09-18 | 2014-04-03 | Asahi Kasei Corp | 窒化物半導体の深紫外発光素子の製造方法 |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3104979B2 (ja) * | 1990-07-27 | 2000-10-30 | 株式会社東芝 | 紫外域半導体レーザ,半導体素子およびこれらの製造方法 |
AUPP147398A0 (en) * | 1998-01-23 | 1998-02-19 | Defence Science And Technology Organisation | Dual non-parallel electronic field electro-optic effect device |
US20050077539A1 (en) | 2003-08-18 | 2005-04-14 | Jan Lipson | Semiconductor avalanche photodetector with vacuum or gaseous gap electron acceleration region |
US20100071100A1 (en) * | 2005-04-07 | 2010-03-18 | Faris Sadeg M | Probes, Methods of Making Probes, and Applications using Probes |
US7751655B2 (en) * | 2007-07-27 | 2010-07-06 | Hewlett-Packard Development Company, L.P. | Micro-ring optical detector/modulator |
CN103493203B (zh) * | 2011-03-22 | 2016-12-28 | 曼彻斯特大学 | 晶体管器件以及用于制造晶体管器件的材料 |
WO2013063399A1 (en) * | 2011-10-28 | 2013-05-02 | Georgetown University | Method and system for generating a photo-response from mos2 schottky junctions |
KR101803537B1 (ko) * | 2012-02-09 | 2017-11-30 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 발광 소자 |
KR20130130915A (ko) * | 2012-05-23 | 2013-12-03 | 경희대학교 산학협력단 | 다층 전이금속 칼코겐화합물 소자 및 이를 이용한 반도체 소자 |
US8916451B2 (en) * | 2013-02-05 | 2014-12-23 | International Business Machines Corporation | Thin film wafer transfer and structure for electronic devices |
US9698286B2 (en) * | 2013-02-20 | 2017-07-04 | The Research Foundation Of The City University Of New York | Quantum well infrared photodetectors using II-VI material systems |
US9806164B1 (en) * | 2013-03-26 | 2017-10-31 | The Penn State Research Foundation | Controlled synthesis and transfer of large area heterostructures made of bilayer and multilayer transition metal dichalocogenides |
WO2015142358A1 (en) * | 2014-03-21 | 2015-09-24 | Intel Corporation | Transition metal dichalcogenide semiconductor assemblies |
KR102237826B1 (ko) * | 2014-07-18 | 2021-04-08 | 삼성전자주식회사 | 그래핀 소자와 그 제조 및 동작방법과 그래핀 소자를 포함하는 전자장치 |
-
2015
- 2015-07-30 US US15/507,621 patent/US10446705B2/en active Active
- 2015-07-30 WO PCT/US2015/042913 patent/WO2016032680A1/en active Application Filing
- 2015-07-30 EP EP15836954.6A patent/EP3186836B1/en active Active
- 2015-07-30 JP JP2017511609A patent/JP6479164B2/ja active Active
Patent Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04156518A (ja) * | 1990-10-19 | 1992-05-29 | Matsushita Electric Ind Co Ltd | 空間光変調素子および薄膜の製作方法 |
JPH063712A (ja) * | 1992-06-22 | 1994-01-14 | Kanegafuchi Chem Ind Co Ltd | 多層膜調光材料 |
JPH07325329A (ja) * | 1994-06-01 | 1995-12-12 | Mitsubishi Electric Corp | 有機超格子材料、その製造方法および該材料を用いた素子 |
JPH11282033A (ja) * | 1998-03-30 | 1999-10-15 | Hitachi Ltd | 有機無機複合材料 |
JP2005303266A (ja) * | 2004-03-19 | 2005-10-27 | Fuji Photo Film Co Ltd | 撮像素子、その電場印加方法および印加した素子 |
US20120141799A1 (en) * | 2010-12-03 | 2012-06-07 | Francis Kub | Film on Graphene on a Substrate and Method and Devices Therefor |
WO2013140181A1 (en) * | 2012-03-22 | 2013-09-26 | The University Of Manchester | Photovoltaic cells |
JP2014045094A (ja) * | 2012-08-27 | 2014-03-13 | Sharp Corp | 高透過率保護膜作製方法および半導体発光素子の製造方法 |
JP2014060255A (ja) * | 2012-09-18 | 2014-04-03 | Asahi Kasei Corp | 窒化物半導体の深紫外発光素子の製造方法 |
Non-Patent Citations (1)
Title |
---|
"Layered boron nitride as a release layer for mechanical transfer of GaN-based devices", 2014 SILICON NANOELECTRONICS WORKSHOP, JPN6018033480, 8 June 2014 (2014-06-08), US, ISSN: 0003960738 * |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20200043884A (ko) * | 2018-10-18 | 2020-04-28 | 한양대학교 산학협력단 | 막 구조체, 소자 및 멀티레벨 소자 |
KR102250011B1 (ko) * | 2018-10-18 | 2021-05-10 | 한양대학교 산학협력단 | 막 구조체, 소자 및 멀티레벨 소자 |
US11985835B2 (en) | 2018-10-18 | 2024-05-14 | Iucf-Hyu (Industry-University Cooperation Foundation Hanyang University) | Film structure, element, and multilevel element |
Also Published As
Publication number | Publication date |
---|---|
US20170309762A1 (en) | 2017-10-26 |
US10446705B2 (en) | 2019-10-15 |
EP3186836B1 (en) | 2019-04-17 |
EP3186836A4 (en) | 2018-04-25 |
WO2016032680A1 (en) | 2016-03-03 |
JP6479164B2 (ja) | 2019-03-06 |
EP3186836A1 (en) | 2017-07-05 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP6479164B2 (ja) | 二次元層状材料の量子井戸接合デバイス、多重量子井戸デバイス及び量子井戸デバイスの製造方法 | |
KR102103040B1 (ko) | 에피택셜 리프트 오프의 가속을 위한 변형 제어 | |
JP2012119569A (ja) | 窒化物半導体素子 | |
JP5626847B2 (ja) | ナノ構造体およびその製造方法 | |
US10374159B2 (en) | Optoelectronics integration by transfer process | |
JP2015527732A (ja) | 光電子デバイス用透明電極 | |
KR101598779B1 (ko) | 그래핀 핫 전자 나노 다이오드 | |
KR101263286B1 (ko) | 반도체 광소자 및 그 제조 방법 | |
JP2010267934A (ja) | 太陽電池およびその製造方法 | |
JP7081551B2 (ja) | アバランシェフォトダイオードおよびその製造方法 | |
JP5732410B2 (ja) | 量子ドット構造体の形成方法ならびに波長変換素子、光光変換装置および光電変換装置 | |
JP5469145B2 (ja) | タンデム太陽電池セルおよびその製造方法 | |
JP2010186915A (ja) | 太陽電池 | |
JP5669228B2 (ja) | 多接合太陽電池およびその製造方法 | |
JP7044048B2 (ja) | アバランシェフォトダイオードおよびその製造方法 | |
JP6100468B2 (ja) | 光電池および光電池の作製方法 | |
US20120318337A1 (en) | Solar Cell | |
TWI469389B (zh) | 垂直式固態發光元件之製程 | |
KR20120079730A (ko) | 발광 소자 및 그 제조 방법 | |
CN112103374B (zh) | 半导体发光单元及级联型中红外光发光二极管 | |
JP2008078257A (ja) | 半導体積層構造および半導体素子 | |
JP2016027638A (ja) | 光電変換装置 | |
KR20110101349A (ko) | 박막형 태양전지 및 그의 제조방법 | |
TWI740418B (zh) | 發光元件及其製造方法 | |
TWI491067B (zh) | 半導體裝置的形成方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20170612 |
|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20170921 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20180817 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20180828 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20181112 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20190122 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20190205 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 6479164 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |