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JP2017079228A - Terminal for semiconductor element - Google Patents

Terminal for semiconductor element Download PDF

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Publication number
JP2017079228A
JP2017079228A JP2015205468A JP2015205468A JP2017079228A JP 2017079228 A JP2017079228 A JP 2017079228A JP 2015205468 A JP2015205468 A JP 2015205468A JP 2015205468 A JP2015205468 A JP 2015205468A JP 2017079228 A JP2017079228 A JP 2017079228A
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terminal
solder
semiconductor element
protruding
diode
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規正 和田
Norimasa Wada
規正 和田
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Sansha Electric Manufacturing Co Ltd
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Sansha Electric Manufacturing Co Ltd
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Priority to JP2015205468A priority Critical patent/JP2017079228A/en
Publication of JP2017079228A publication Critical patent/JP2017079228A/en
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/33Structure, shape, material or disposition of the layer connectors after the connecting process of a plurality of layer connectors

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Abstract

PROBLEM TO BE SOLVED: To provide a terminal which prevents a semiconductor element from being inclined due to contractive force during cooling of a solder fillet part when soldering is performed.SOLUTION: In a semiconductor element in which a base plate, a semiconductor element, and a terminal connection part are connected in this order by solder, the terminal connection part has a bent part whose one end part protrudes upward and a protrusion formed by protruding the other end part different from one end part upward, and the bent part is connected to a terminal.SELECTED DRAWING: Figure 2

Description

この発明は、半導体素子用端子に関する。   The present invention relates to a semiconductor element terminal.

半導体素子と端子を半田リフロー炉等を用いて半田付けする工程では、半導体素子と端子等の部品要素を、半田レジストパターンによるセルフアライメントや冶具を使って水平方向の位置合わせをする。   In the process of soldering the semiconductor element and the terminal using a solder reflow furnace or the like, the component elements such as the semiconductor element and the terminal are aligned in the horizontal direction using self-alignment using a solder resist pattern or a jig.

しかし、半田付け工程では、半田自身が溶融するために、その溶融状況によっては部品要素の垂直方向の位置合わせが不確実となる。   However, since the solder itself melts in the soldering process, the vertical alignment of the component elements becomes uncertain depending on the melting state.

そこで、上記の問題を解決するために、上部のチップ部品の電極面積を下部電極の電極面積よりも小さくすることで、半田付け時の半田の分布の均一性を担保し、それにより部品要素の垂直方向の位置合わせを確実化する提案がなされている(特許文献1)   Therefore, in order to solve the above problem, by making the electrode area of the upper chip component smaller than the electrode area of the lower electrode, the uniformity of the solder distribution during soldering is ensured, thereby Proposals have been made to ensure vertical alignment (Patent Document 1).

特開2015−39028号公報JP2015-39028A

しかし、先行文献の構造は、上下の部品要素の半田付けは確実化することが可能であるが、この構造は上下の2つの部品要素の半田付けにのみに対応したものであって、垂直方向の3つの部品要素の半田付けを行う半導体素子に対しては垂直方向の位置合わせを確実化出来ない。   However, the structure of the prior art can ensure the soldering of the upper and lower component elements, but this structure corresponds only to the soldering of the upper and lower two component elements, and the vertical direction The vertical alignment cannot be ensured for the semiconductor element that solders the three component elements.

以下、このことについて図1を参照して説明する。   Hereinafter, this will be described with reference to FIG.

図1は、ベース板1上に、半導体素子の一例としてダイオード2と端子を実装した状態を示し、同図(A)は理想の半田付け状態を示し、同図(B)は半田付け時に不具合が生じた状態を示している。ここでは、ダイオード2は、PN接合を有する半導体チップで、表面にアノード電極2Aと裏面にカソード電極2Kを備えているチップ状の部品である。この例では、ベース板1がダイオード2のカソード電極2Kの面積に対して十分に大きく、また、端子接続部4がダイオード2のアノード電極2Aの面積に対して小さい。また、端子接続部4は、右側端部が上方に折曲されている折曲部40を備え、この折曲部40に端子6が連接している。   FIG. 1 shows a state in which a diode 2 and a terminal as an example of a semiconductor element are mounted on a base plate 1, FIG. 1A shows an ideal soldering state, and FIG. 1B shows a problem during soldering. This shows a state in which has occurred. Here, the diode 2 is a semiconductor chip having a PN junction, and is a chip-like component having an anode electrode 2A on the front surface and a cathode electrode 2K on the back surface. In this example, the base plate 1 is sufficiently larger than the area of the cathode electrode 2 </ b> K of the diode 2, and the terminal connection portion 4 is smaller than the area of the anode electrode 2 </ b> A of the diode 2. The terminal connecting portion 4 includes a bent portion 40 whose right end is bent upward, and the terminal 6 is connected to the bent portion 40.

半田付け工程では、半田材料として板半田や半田ペレットを用いる場合もあるが、本例では半田ペーストを用いる。以下、説明の便宜上溶融前、溶融中の半田材料とこれが固化した物を全て半田と呼ぶ。ベース板1とダイオード2のカソード電極2Kの間、ダイオード2のアノード電極2Aと端子接続部4の間に半田3、5が塗布されて半田リフロー炉で半田付けされる。このとき、端子6は冶具によって固定され位置合わせがされている。そして、半田リフロー炉内で半田3、5が溶融し、その後冷却によって半田3、5が固化するが、このとき、半田3、5が垂直方向に均一に分布すると同図(A)に示すように、ダイオード2が垂直方向に傾くことがない。   In the soldering process, plate solder or solder pellets may be used as the solder material, but in this example, solder paste is used. Hereinafter, for convenience of explanation, the solder material before melting and the melted solder material and the solidified material are all called solder. Solders 3 and 5 are applied between the base plate 1 and the cathode electrode 2K of the diode 2 and between the anode electrode 2A of the diode 2 and the terminal connection portion 4 and soldered in a solder reflow furnace. At this time, the terminal 6 is fixed and positioned by a jig. Then, the solders 3 and 5 are melted in the solder reflow furnace, and then the solders 3 and 5 are solidified by cooling. At this time, when the solders 3 and 5 are uniformly distributed in the vertical direction, as shown in FIG. Furthermore, the diode 2 does not tilt in the vertical direction.

ところが、実際は図1(B)に示すように、半田が固化したときに、ダイオード2の右端部が上方に傾いてしまうことがある。この現象が生じる理由は次のとおりである。   However, in practice, as shown in FIG. 1B, when the solder is solidified, the right end portion of the diode 2 may be inclined upward. The reason why this phenomenon occurs is as follows.

端子接続部4を端子6に連接するために、端子接続部4の右端部が折曲されて折曲部40を構成しているが、半田5が溶融して固化する過程では、折曲部40付近の半田が折曲部40の右端面に沿って上方に這い上がり、この這い上がった半田が固化して半田フィレット50が形成される。そして、この半田フィレット50が形成される直前に、半田フィレットが折曲部40に向かって収縮し、図の矢印Fで示す方向に半田を引っ張る力が発生する。このとき、ダイオード2の右端部と端子接続部4の間に位置する半田5が折曲部40に向かって引っ張られるためにダイオード2の右端部と端子接続部4の間の半田の厚みが減少し、かつ端子6は冶具でその位置が固定されていることから、ダイオード2の折曲部40側が矢印Fで示す折曲部40に向かう方向に引っ張られ、ダイオード2の右端部が図1で上方に傾く。   In order to connect the terminal connecting portion 4 to the terminal 6, the right end portion of the terminal connecting portion 4 is bent to constitute the bent portion 40. In the process of melting and solidifying the solder 5, the bent portion The solder in the vicinity of 40 crawls upward along the right end surface of the bent portion 40, and the scooped solder is solidified to form a solder fillet 50. And just before this solder fillet 50 is formed, the solder fillet contracts toward the bent portion 40, and a force is generated that pulls the solder in the direction indicated by the arrow F in the figure. At this time, since the solder 5 located between the right end portion of the diode 2 and the terminal connection portion 4 is pulled toward the bent portion 40, the thickness of the solder between the right end portion of the diode 2 and the terminal connection portion 4 is reduced. Since the position of the terminal 6 is fixed with a jig, the bent portion 40 side of the diode 2 is pulled in the direction toward the bent portion 40 indicated by the arrow F, and the right end portion of the diode 2 is shown in FIG. Tilt upwards.

こうして、ダイオード2の右端部が上方に傾いてしまうと、半田3、5の分布が不均一になる為に、半田3、5内の熱伝導率が不均一となり、全体として放熱性が悪く、また、熱ストレスによる半田劣化も早くなり、この半田3、5内部にクラックが生じやすくなる。   Thus, if the right end of the diode 2 is tilted upward, the distribution of the solders 3 and 5 becomes non-uniform, so that the thermal conductivity in the solders 3 and 5 becomes non-uniform, and the heat dissipation is poor overall. In addition, solder deterioration due to thermal stress is accelerated, and cracks are likely to occur inside the solders 3 and 5.

この発明は、半田付け時に半田フィレット50の収縮力による半田を引っ張る力を原因として半導体チップが傾くことのない半導体素子用端子を提供することにある。   An object of the present invention is to provide a semiconductor element terminal in which a semiconductor chip does not tilt due to a force of pulling solder due to a contraction force of a solder fillet 50 during soldering.

この発明の半導体素子用端子は、ベース板、チップ状の半導体素子、端子接続部がこの順に半田で接続されている半導体素子において、
前記端子接続部は、その一端部に上方に突出する折曲部と前記一端部とは異なる他端部に上方に突出する突出部を有し、前記折曲部が端子に連接されていることを特徴とする。
The semiconductor element terminal of the present invention is a semiconductor element in which a base plate, a chip-like semiconductor element, and a terminal connection portion are connected by solder in this order.
The terminal connecting portion has a bent portion protruding upward at one end portion thereof and a protruding portion protruding upward at the other end portion different from the one end portion, and the bent portion is connected to the terminal. It is characterized by.

端子接続部は、上方に突出する折曲部と突出部を有することで、半田付け時に半田の這い上がりが折曲部と突出部で生じる。このため、半田付け時において、半導体素子と端子接続部との間の垂直方向の半田の分布が均一となり、半導体素子が傾斜することがなくなる。折曲部と突出部を端子接続部の対向する端子に設けると、半田の分布がより均一になるが、半田の分布が著しく異なることを防止できるように、端子接続部の異なる端部、例えば隣接する端部に設けても良い。   Since the terminal connecting portion has a bent portion and a protruding portion protruding upward, the solder rises at the bent portion and the protruding portion during soldering. For this reason, during soldering, the distribution of solder in the vertical direction between the semiconductor element and the terminal connection portion becomes uniform, and the semiconductor element does not tilt. If the bent part and the protruding part are provided on the terminals facing the terminal connection part, the distribution of the solder becomes more uniform, but different ends of the terminal connection part, for example, so as to prevent the solder distribution from being significantly different, for example, You may provide in an adjacent edge part.

この発明の半導体素子用端子は、端子接続部は一端部に上方に突出する折曲部と前記一端とは異なる他端部に上方に突出する突出部を有するため、半田付け時に半田の這い上がりが両端部で同様に生じるから、半田付け時において、両端部での垂直方向の半田の分布が均一となる。このため、半導体チップの傾斜を防ぐことが出来る。   In the terminal for a semiconductor element according to the present invention, the terminal connection portion has a bent portion protruding upward at one end portion and a protruding portion protruding upward at the other end portion different from the one end, so that the solder rises during soldering. Therefore, the distribution of the solder in the vertical direction at both ends becomes uniform at the time of soldering. For this reason, the inclination of the semiconductor chip can be prevented.

従来の半導体素子の実装状態の不具合について説明するための図The figure for demonstrating the malfunction of the mounting state of the conventional semiconductor element この発明の実施形態の端子を採用した半導体素子の実装状態を示す図The figure which shows the mounting state of the semiconductor element which employ | adopted the terminal of embodiment of this invention この発明の他の実施形態の端子を採用した半導体素子の実装状態を示す図The figure which shows the mounting state of the semiconductor element which employ | adopted the terminal of other embodiment of this invention. この発明のさらに他の実施形態の端子を示す図The figure which shows the terminal of further another embodiment of this invention.

図2(A)は、この発明の実施形態用端子を採用した半導体素子の実装状態を示す図である。ここでは、半導体素子の一例としてダイオード2を示している。   FIG. 2A is a diagram showing a mounting state of a semiconductor element employing the terminal for an embodiment of the present invention. Here, a diode 2 is shown as an example of the semiconductor element.

このダイオード2の実装状態は、図1に示すダイオード2の実装状態と全体として同じ実装状態であり、相違点は端子接続部4の構成である。   The mounting state of the diode 2 is the same as the mounting state of the diode 2 shown in FIG. 1 as a whole, and the difference is the configuration of the terminal connection portion 4.

すなわち、端子接続部4は、その一端部に上方に略垂直に突出する折曲部40と前記一端部とは異なる他端部に上方に略垂直に突出する突出部41を有している。同図において、右側の折曲部40は端子6に連接する。実際には、端子6と端子接続部4は1枚のCu板を折曲して形成される。   That is, the terminal connection portion 4 has a bent portion 40 protruding substantially vertically upward at one end portion and a protruding portion 41 protruding substantially vertically upward at the other end portion different from the one end portion. In the drawing, the right bent portion 40 is connected to the terminal 6. Actually, the terminal 6 and the terminal connection portion 4 are formed by bending one Cu plate.

ダイオード2の実装方法は、図1に示すダイオード2の実装方法と同じである。すなわち、ベース板1とダイオード2のカソード電極2Kの間、ダイオード2のアノード電極2Aと端子接続部4の間に半田3、5が塗布されて半田リフロー炉で半田付けされる。このとき、端子6は冶具によって固定され位置合わせがされている。そして、半田リフロー炉内で半田3、5が溶融し、その後冷却によって半田3、5が固化するが、このとき、端子接続部4の一端部に、上方に略垂直に突出する折曲部40と前記一端部とは異なる他端部に上方に略垂直に突出する突出部41を有しているため、半田付け時に、半田の這い上がりが折曲部40と突出部41の外側面において生じ、図示のように両側に同じ半田フィレット50、51が形成される。   The mounting method of the diode 2 is the same as the mounting method of the diode 2 shown in FIG. That is, solders 3 and 5 are applied between the base plate 1 and the cathode electrode 2K of the diode 2 and between the anode electrode 2A of the diode 2 and the terminal connection portion 4 and soldered in a solder reflow furnace. At this time, the terminal 6 is fixed and positioned by a jig. Then, the solders 3 and 5 are melted in the solder reflow furnace, and then the solders 3 and 5 are solidified by cooling. At this time, the bent portion 40 that protrudes substantially vertically upward at one end portion of the terminal connection portion 4. And the other end portion different from the one end portion has a protruding portion 41 protruding substantially vertically upward, so that solder scooping occurs on the outer surface of the bent portion 40 and the protruding portion 41 during soldering. As shown in the drawing, the same solder fillets 50 and 51 are formed on both sides.

本実施形態では、半田付け工程で端子接続部4の両端部の折曲部40と突出部41の外側面に半田フィレット50、51が形成され、半田フィレット50、51が固化する過程で端子接続部が夫々反対方向に向けて引っ張られる力が発生する。このため、従来のように(図1(B))、ダイオード2の片側に対してだけ半田を引っ張る力が作用することがなくなり、その結果、ダイオード2は垂直方向に傾くことがなくなる。   In the present embodiment, the solder fillets 50 and 51 are formed on the outer surfaces of the bent portions 40 and the protruding portions 41 at both ends of the terminal connection portion 4 in the soldering process, and the terminal connection is performed in the process in which the solder fillets 50 and 51 are solidified. A force is generated that each part is pulled in the opposite direction. For this reason, as in the prior art (FIG. 1B), the force of pulling the solder does not act only on one side of the diode 2, and as a result, the diode 2 does not tilt in the vertical direction.

図2(B)に示すように、ダイオード2のアノード電極2Aとカソード電極2Kを反対に実装することもできる。ダイオード2のアノード電極2Aの周囲には耐圧維持構造が形成されており、カソード電極2Kと比較してアノード電極2Aの面積は小さくなっている。このようなダイオード2の構造では半田3で半田付けされるアノード電極2Aの面積が小さいためにダイオード2の安定性が悪く、ダイオード2が半田付け工程中により傾斜し易い傾向にある。しかし、本例のように、カソード電極2K上に折曲部40と突出部41を有する端子接続部4を半田付けすると、ダイオード2を引っ張る力が均等に作用し半田の分布が均一となるために、ダイオード2の傾斜を防ぐことが出来る。   As shown in FIG. 2B, the anode electrode 2A and the cathode electrode 2K of the diode 2 can be mounted in reverse. A breakdown voltage maintaining structure is formed around the anode electrode 2A of the diode 2, and the area of the anode electrode 2A is smaller than that of the cathode electrode 2K. In such a structure of the diode 2, since the area of the anode electrode 2A soldered with the solder 3 is small, the stability of the diode 2 is poor, and the diode 2 tends to be inclined more easily during the soldering process. However, when the terminal connection portion 4 having the bent portion 40 and the protruding portion 41 is soldered on the cathode electrode 2K as in this example, the force that pulls the diode 2 acts evenly and the distribution of the solder becomes uniform. In addition, the inclination of the diode 2 can be prevented.

図3は、他の実施形態を示す。この例では、端子接続部4の一端部に上方に突出する折曲部40と前記一端部とは異なる他端部に上方に突出する突出部41とが設けられ、これらは、該両端部の外側上方に斜めに突出している。このように、折曲部40と突出部41を外側上方に斜めに突出したものにすることで、半田5が折曲部40に沿って這い上がり易くなり、半田フィレット50、51が形成され易く、半田フィレット50、51が固化して収縮する際に、ダイオード2に均等な引っ張る力が作用して、ダイオード2が傾くことなく端子接続部4がダイオード2のカソード電極2Kにより強固に接続される。   FIG. 3 shows another embodiment. In this example, a bent portion 40 that protrudes upward at one end of the terminal connection portion 4 and a protruding portion 41 that protrudes upward at the other end different from the one end are provided. It protrudes diagonally upward on the outside. In this way, by making the bent portion 40 and the protruding portion 41 obliquely protrude outward and upward, the solder 5 is likely to crawl along the bent portion 40 and the solder fillets 50 and 51 are easily formed. When the solder fillets 50 and 51 solidify and contract, a uniform pulling force acts on the diode 2, and the terminal connection portion 4 is firmly connected to the cathode electrode 2 </ b> K of the diode 2 without tilting the diode 2. .

上記の例で、折曲部40と突出部41の傾斜角θ1、θ2は同じ角度であることが望ましい。このようにすることで、半田フィレット50、51の大きさが同一になり、半田フィレット50,51が折曲部40と突出部41に沿って互いに半田を逆向きに引っ張る力が同一となり、ダイオード2の傾き防止効果がさらに増大する。   In the above example, it is desirable that the inclination angles θ1 and θ2 of the bent portion 40 and the protruding portion 41 are the same angle. By doing so, the sizes of the solder fillets 50 and 51 become the same, and the force with which the solder fillets 50 and 51 pull the solder in opposite directions along the bent portion 40 and the protruding portion 41 becomes the same, and the diode The tilt prevention effect of 2 is further increased.

上記の例で、折曲部40と突出部41は、端子接続部4の対向する端部に設けられていることが望ましい。このようにすると、半田付け時に、半田5の這い上がりが対向する折曲部40と突出部41の外側面において、同じ半田フィレット50、51が対向して形成されることによって、半田フィレット50、51が半田5を互いに逆向きに引っ張るため、半田5の分布を均一にすることができる。このため、ダイオード2の傾き防止効果がさらに増大する。   In the above example, it is desirable that the bent portion 40 and the protruding portion 41 are provided at opposite ends of the terminal connecting portion 4. In this way, when soldering, the same solder fillets 50 and 51 are formed to face each other on the outer surface of the bent portion 40 and the protruding portion 41 where the rising of the solder 5 faces, so that the solder fillet 50, Since 51 pulls the solder 5 in opposite directions, the distribution of the solder 5 can be made uniform. For this reason, the tilt prevention effect of the diode 2 is further increased.

上記の例で、折曲部40と突出部41は、端子接続部4の隣接する端部に設けられていてもよい。折曲部40に隣接して突出部41を設けることによって、折曲部40に沿う一つの方向にのみ半田5が引っ張られる従来の実施例と比べて、半田フィレット50、51が複数の方向に半田を引っ張るので、半田分布が不均一にならないようにできる。この場合、突出部41を折曲部40の両側に隣接する位置に形成してもよい。また、端子接続部4の平面形状が略三角形の場合でも、折曲部40に隣接して突出部41を設ければ、同様に半田の分布が不均一にならないようにできる。   In the above example, the bent portion 40 and the protruding portion 41 may be provided at the adjacent end portions of the terminal connecting portion 4. By providing the protruding portion 41 adjacent to the bent portion 40, the solder fillets 50 and 51 are arranged in a plurality of directions as compared with the conventional embodiment in which the solder 5 is pulled only in one direction along the bent portion 40. Since the solder is pulled, it is possible to prevent the solder distribution from becoming uneven. In this case, the protruding portion 41 may be formed at a position adjacent to both sides of the bent portion 40. Even when the planar shape of the terminal connection portion 4 is substantially triangular, if the protruding portion 41 is provided adjacent to the bent portion 40, the distribution of the solder can be prevented from becoming uneven in the same manner.

図4は、さらに他の実施形態を示す。同図(A)、(B)は、それぞれ端子接続部4の平面図、斜視図を示す。端子接続部4以外は、上記の各実施形態と同じである。   FIG. 4 shows yet another embodiment. FIGS. 4A and 4B are a plan view and a perspective view, respectively, of the terminal connection portion 4. Except for the terminal connection portion 4, the present embodiment is the same as the above embodiments.

この例では、端子接続部4は矩形状の半田付け部44の左右前後の端子接続部4の側部に折曲部40と突出部41、42、43がそれぞれ同じ傾斜角で形成されている。図2、図3に示す例では、左右方向だけに折曲部40と突出部41が形成されているが、図4ではさらに前後方向に突出部42、43が形成されている。このように夫々の端部に突出部41を形成することによって、複数の位置と方向に半田フィレット50が半田を引っ張るので、半田5の分布が均一化されダイオード2の傾き防止効果に貢献する。   In this example, the terminal connection portion 4 has a bent portion 40 and protruding portions 41, 42, 43 formed at the same inclination angle on the side portions of the terminal connection portion 4 on the left and right sides of the rectangular soldering portion 44. . In the example shown in FIGS. 2 and 3, the bent portion 40 and the protruding portion 41 are formed only in the left-right direction, but in FIG. 4, the protruding portions 42 and 43 are further formed in the front-rear direction. By forming the protrusions 41 at the respective end portions in this way, the solder fillet 50 pulls the solder in a plurality of positions and directions, so that the distribution of the solder 5 is made uniform and contributes to the tilt prevention effect of the diode 2.

各実施形態では、端子接続部4の平面形状を略長方形の例で示したが、端子接続部4の平面形状が多角形とし、折曲部40が形成されていない任意の端部に突出部を設置することも可能である。例えば、端子接続部4の平面形状を五角形とし、その端部の一ケ所に折曲部40を形成し、この端部と隣接しない端部に突出部41を形成してもよい。また、折曲部と突出部の幅を適宜異なるように設定し、半田フィレット50、51の幅も変更することで、半田フィレット50、51が半田5を引っ張る力を調整して、ダイオードの傾きを防ぐこともできる。更に、折曲部と突出部の角度や、この角度と幅の組み合わせを選択することによっても半田フィレット50、51が半田5を引っ張る力を調整することがでダイオード2の傾きを防止することもできる。   In each embodiment, although the planar shape of the terminal connection part 4 was shown by the example of the substantially rectangular shape, the planar shape of the terminal connection part 4 is made into a polygon, and it protrudes in the arbitrary edge parts in which the bending part 40 is not formed. It is also possible to install. For example, the planar shape of the terminal connection portion 4 may be a pentagon, the bent portion 40 may be formed at one end of the end portion, and the protruding portion 41 may be formed at an end portion not adjacent to the end portion. Also, by setting the widths of the bent part and the protruding part to be appropriately different and changing the widths of the solder fillets 50 and 51, the force with which the solder fillets 50 and 51 pull the solder 5 is adjusted, and the inclination of the diode Can also be prevented. Furthermore, the inclination of the diode 2 can be prevented by adjusting the force with which the solder fillets 50 and 51 pull the solder 5 by selecting the angle between the bent portion and the protruding portion, and the combination of the angle and the width. it can.

なお、以上の実施形態では、半導体素子としてPN接合面を有するダイオード2を例示したが、本発明は、サイリスタ等、これ以外の半導体素子にも適用可能である。   In the above embodiment, the diode 2 having a PN junction surface is exemplified as the semiconductor element. However, the present invention can also be applied to other semiconductor elements such as a thyristor.

1−ベース板
2−ダイオード
3、5−半田
4−端子接続部
40−折曲部
41−突出部
6−端子
1-base plate 2-diode 3, 5-solder 4-terminal connecting portion 40-bending portion 41-projecting portion 6-terminal

Claims (6)

ベース板、チップ状の半導体素子、端子接続部がこの順に半田で接続されている半導体素子において、
前記端子接続部は、その一端部に上方に突出する折曲部と前記一端部とは異なる他端部に上方に突出する突出部を有し、前記折曲部が端子に連接されていることを特徴とする半導体素子用端子。
In the semiconductor element in which the base plate, the chip-like semiconductor element, and the terminal connection portion are connected by solder in this order,
The terminal connecting portion has a bent portion protruding upward at one end portion thereof and a protruding portion protruding upward at the other end portion different from the one end portion, and the bent portion is connected to the terminal. A terminal for a semiconductor element.
前記折曲部と前記突出部は、前記端子接続部に外側上方に斜めに突出している、請求項1記載の半導体素子用端子。   The terminal for a semiconductor element according to claim 1, wherein the bent portion and the protruding portion protrude obliquely outward and upward from the terminal connection portion. 前記折曲部と前記突出部の傾斜角は同一である請求項2記載の半導体素子用端子。   The semiconductor element terminal according to claim 2, wherein the bent portion and the protruding portion have the same inclination angle. 前記折曲部と前記突出部は、前記端子接続部の対向する端部に設けられている、請求項1〜3のいずれかに記載の半導体素子用端子。   The terminal for a semiconductor element according to claim 1, wherein the bent portion and the protruding portion are provided at opposite ends of the terminal connection portion. 前記折曲部と前記突出部は、前記端子接続部の隣接する端部に設けられている、請求項1〜3のいずれかに記載の半導体素子用端子。   The terminal for a semiconductor element according to claim 1, wherein the bent portion and the protruding portion are provided at adjacent ends of the terminal connection portion. 前記端子接続部は、前記折曲部が設けられている端部を除く全ての端部に上方に突出する突出部を有する、請求項1〜3のいずれかに記載の半導体素子用端子。   The said terminal connection part is a terminal for semiconductor elements in any one of Claims 1-3 which has the protrusion part which protrudes upwards in all the edge parts except the edge part in which the said bending part is provided.
JP2015205468A 2015-10-19 2015-10-19 Terminal for semiconductor element Pending JP2017079228A (en)

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WO2020208677A1 (en) * 2019-04-08 2020-10-15 新電元工業株式会社 Semiconductor device
JPWO2020208677A1 (en) * 2019-04-08 2021-05-06 新電元工業株式会社 Semiconductor device
CN113056813A (en) * 2019-04-08 2021-06-29 新电元工业株式会社 Semiconductor device with a plurality of semiconductor chips
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