JP2009075071A5 - - Google Patents
Download PDFInfo
- Publication number
- JP2009075071A5 JP2009075071A5 JP2008165175A JP2008165175A JP2009075071A5 JP 2009075071 A5 JP2009075071 A5 JP 2009075071A5 JP 2008165175 A JP2008165175 A JP 2008165175A JP 2008165175 A JP2008165175 A JP 2008165175A JP 2009075071 A5 JP2009075071 A5 JP 2009075071A5
- Authority
- JP
- Japan
- Prior art keywords
- transmission line
- distance
- terahertz wave
- inspection object
- inspection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000007689 inspection Methods 0.000 claims 30
- 230000005540 biological transmission Effects 0.000 claims 28
- 230000001902 propagating effect Effects 0.000 claims 10
- 230000005672 electromagnetic field Effects 0.000 claims 9
- 238000001514 detection method Methods 0.000 claims 8
- 230000003993 interaction Effects 0.000 claims 8
- 238000000034 method Methods 0.000 claims 6
- 230000000644 propagated effect Effects 0.000 claims 3
- 239000000523 sample Substances 0.000 claims 1
Claims (12)
前記伝送線路を伝搬するテラヘルツ波を発生させるための発生部と、
前記伝送線路を伝搬したテラヘルツ波を検出するための検出部と、
前記伝送線路におけるテラヘルツ波の伝搬方向に対して交差する方向に前記距離を変更させるための距離変更手段と、
前記距離変更手段を制御するための制御部と、を備え、
前記伝送線路を伝搬するテラヘルツ波と前記検査物とが相互作用するように構成されており、
前記制御部は、前記検出部で検出したテラヘルツ波のうち、少なくとも該相互作用したテラヘルツ波に関する情報を用いて前記距離変更手段を制御することを特徴とする距離調整装置。 A distance adjustment device for adjusting a distance between the transmission line and an inspection object using the terahertz wave , including a transmission line for propagating the terahertz wave ,
A generator for generating a terahertz wave propagating through the transmission line ;
A detection unit for detecting a terahertz wave propagated through the transmission line,
A distance change means for varying exposed the distance in a direction intersecting the propagation direction of the terahertz wave in the transmission line,
A control unit for controlling the distance changing means ,
The terahertz wave propagating through the transmission line is configured to interact with the inspection object,
Wherein the control unit, the out of the terahertz wave detected by the detection unit, a distance adjusting device and controls the distance changing means using information on the terahertz waves at least said interaction.
前記検出部で検出したテラヘルツ波に関する情報が、前記参照情報から変化したとき、前記相互作用が生じたことを判断するための判断部と、を備えることを特徴とする請求項1あるいは2に記載の距離調整装置。 Said interaction Keru Contact the absence Ji raw said distance, a storage unit for storing information about the terahertz wave detected by the detecting unit as the reference information,
Information about the terahertz wave detected by the detection unit, when the change from the reference information, according to claim 1 or 2, characterized in that and a determination unit for determining that the interaction occurs Distance adjustment device.
前記判断部の結果を用いて、前記漏れ電磁界の強度を調整するための調整手段を備えることを特徴とする請求項3に記載の距離調整装置。The distance adjusting device according to claim 3, further comprising an adjusting unit configured to adjust the strength of the leakage electromagnetic field using a result of the determination unit.
前記検出部で検出したテラヘルツ波の信号であり、前記遅延部を用いて得る、前記タイミングの異なる複数の信号から、該テラヘルツ波の時間波形に関する情報を取得するための処理部と、を備えることを特徴とする請求項1乃至4のいずれか1項に記載の距離調整装置。 A delay unit for changing the timing of detecting the terahertz wave in the detection unit;
Wherein a terahertz wave signal detected by the detection unit, obtained using the delay unit, different from the plurality of signals said timing, be provided with a processing unit for obtaining information about the time waveform of the terahertz wave The distance adjusting device according to claim 1, wherein:
前記検査物を保持するための検査物保持部を備え、
前記テラヘルツ波に関する情報を用いて前記距離を決定し、該決定された距離で前記相互作用させ、該相互作用したテラヘルツ波に関する情報を用いて前記検査物を検査することを特徴とする検査装置。 An inspection device for inspecting the inspection object, comprising the distance adjusting device according to any one of claims 1 to 6 ,
An inspection object holding unit for holding the inspection object;
An inspection apparatus , wherein the distance is determined using information on the terahertz wave, the interaction is performed at the determined distance, and the inspection object is inspected using information on the interacted terahertz wave .
前記伝送線路を先端に設ける内視鏡プローブを備えることを特徴とする検査装置。 An inspection device for inspecting the inspection object, comprising the distance adjusting device according to any one of claims 1 to 6 ,
An inspection apparatus comprising an endoscope probe having the transmission line at a tip .
前記伝送線路と前記検査物との間の第1の距離において、前記伝送線路を伝搬したテラヘルツ波を検出する第1の検出工程と、A first detection step of detecting a terahertz wave propagated through the transmission line at a first distance between the transmission line and the inspection object;
前記伝送線路におけるテラヘルツ波の伝搬方向に対して交差する方向に関して、前記第1の距離を第2の距離に変更する変更工程と、Regarding the direction intersecting the propagation direction of the terahertz wave in the transmission line, a changing step of changing the first distance to a second distance;
前記第2の距離において、前記伝送線路を伝搬したテラヘルツ波を検出する第2の検出工程と、 A second detection step of detecting a terahertz wave propagated through the transmission line at the second distance;
前記第1及び第2の検出工程で検出したテラヘルツ波を用いて、前記伝送線路と前記検査物の距離を認識する認識工程と、を含み、Recognizing the distance between the transmission line and the inspection object using the terahertz wave detected in the first and second detection steps,
前記認識の後に決定された距離において、前記伝送線路を伝搬するテラヘルツ波と前記検査物とを相互作用させ、該相互作用したテラヘルツ波を用いて前記検査物を検査することを特徴とする検査方法。An inspection method characterized by causing a terahertz wave propagating through the transmission line to interact with the inspection object at a distance determined after the recognition, and inspecting the inspection object using the interacted terahertz wave .
前記第3の距離において、前記伝送線路を伝播するテラヘルツ波による漏れ電磁界と前記検査物との相互作用に関する情報を取得して前記検査物を検査することを特徴とする請求項9に記載の検査方法。10. The inspection object according to claim 9, wherein at the third distance, the inspection object is inspected by acquiring information on an interaction between a leakage electromagnetic field caused by a terahertz wave propagating through the transmission line and the inspection object. Inspection method.
前記テラヘルツ波を伝搬させるための伝送線路を、漏れ電磁界の強度の弱い第1の伝送線路から、第1の伝送線路より漏れ電磁界の強度が強い第2の伝送線路に切替えることで前記漏れ電磁界の強度を増加させるか、あるいは、
前記伝送線路を伝播するテラヘルツ波の強度を増加することで前記漏れ電磁界の強度を増加させることを特徴とする請求項11に記載の検査方法。
In the increasing step,
The leakage by switching the transmission line for propagating the terahertz wave from the first transmission line having a weak leakage electromagnetic field strength to the second transmission line having a stronger leakage electromagnetic field strength than the first transmission line. Increase the strength of the electromagnetic field, or
The inspection method according to claim 11, wherein the intensity of the leakage electromagnetic field is increased by increasing the intensity of the terahertz wave propagating through the transmission line.
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2008165175A JP4859250B2 (en) | 2007-08-31 | 2008-06-25 | Distance adjustment apparatus and method for inspection object, inspection apparatus and method |
US12/201,745 US7737402B2 (en) | 2007-08-31 | 2008-08-29 | Distance adjusting apparatus and method, and object examining apparatus and method |
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007224942 | 2007-08-31 | ||
JP2007224942 | 2007-08-31 | ||
JP2008165175A JP4859250B2 (en) | 2007-08-31 | 2008-06-25 | Distance adjustment apparatus and method for inspection object, inspection apparatus and method |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2009075071A JP2009075071A (en) | 2009-04-09 |
JP2009075071A5 true JP2009075071A5 (en) | 2010-03-11 |
JP4859250B2 JP4859250B2 (en) | 2012-01-25 |
Family
ID=40610163
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2008165175A Expired - Fee Related JP4859250B2 (en) | 2007-08-31 | 2008-06-25 | Distance adjustment apparatus and method for inspection object, inspection apparatus and method |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP4859250B2 (en) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9194829B2 (en) | 2012-12-28 | 2015-11-24 | Fei Company | Process for performing automated mineralogy |
DE102018109250A1 (en) * | 2018-04-18 | 2019-10-24 | INOEX GmbH Innovationen und Ausrüstungen für die Extrusionstechnik | Method and THz measuring device for measuring a measurement object with electromagnetic radiation |
CN115951221B (en) * | 2022-01-04 | 2023-07-25 | 国仪量子(合肥)技术有限公司 | Method and equipment for detecting leakage discharge performance of battery pack |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3950820B2 (en) * | 2003-06-25 | 2007-08-01 | キヤノン株式会社 | High frequency electric signal control device and sensing system |
JP2006218193A (en) * | 2005-02-14 | 2006-08-24 | Pentax Corp | Optical element |
JP4636917B2 (en) * | 2005-03-28 | 2011-02-23 | キヤノン株式会社 | Sample holding device, sample detection apparatus and sample detection method using the same |
JP2006275910A (en) * | 2005-03-30 | 2006-10-12 | Canon Inc | System and method for position sensing |
-
2008
- 2008-06-25 JP JP2008165175A patent/JP4859250B2/en not_active Expired - Fee Related
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN104132693B (en) | Extracting method while vibrating signal location and frequency in phase place OTDR system | |
EP2031374A3 (en) | Apparatus and method for obtaining information related to terahertz waves | |
EP2711731A3 (en) | Method for detecting an object using ultrasonic waves and detection device for an object using the same | |
WO2009069818A3 (en) | Inspection apparatus and inspection method using electromagnetic wave | |
WO2017011850A8 (en) | Method and system for pipeline condition analysis | |
JP2015024125A5 (en) | SUBJECT INFORMATION ACQUISITION DEVICE, CONTROL METHOD FOR SUBJECT INFORMATION ACQUISITION DEVICE, AND PROGRAM | |
EP2335579A3 (en) | Component concentration measuring device and method of controlling component concentration measuring device | |
JP2008151618A5 (en) | ||
WO2009156862A3 (en) | Integrated multi-sensor non-destructive testing | |
EP2354786A3 (en) | System and method for measuring damage length | |
WO2014109952A3 (en) | Apparatus and method for determining temperature | |
JP2010160136A5 (en) | ||
SG11201903421VA (en) | Semiconductor device inspection apparatus and semiconductor device inspection method | |
JP2012002798A5 (en) | ||
JP2015125008A (en) | Ultrasonic flaw detection system, and control method of ultrasonic flaw detection system | |
SA522431992B1 (en) | Ultrasonic testing method and ultrasonic testing device | |
JP6034057B2 (en) | Ultrasonic scanning using local gain interval | |
SG11201903415VA (en) | Ultrasonic inspection device and ultrasonic inspection method | |
JP2012105903A5 (en) | ||
JP2009075071A5 (en) | ||
JP2013195176A5 (en) | ||
JP2009236620A (en) | Ultrasonic flaw detection method | |
CN204008571U (en) | A kind of multi-faceted detection ultrasonic test block | |
ATE499605T1 (en) | METHOD AND DEVICE FOR EVALUATION OF RECEIVED SIGNALS OF A NON-DESTRUCTIVE ULTRASONIC WAVE TESTING ON A TEST SPECIMEN | |
JP2013011526A (en) | Ultrasonic flaw detection method and ultrasonic flaw detection device |