JP2009004423A - Copper foil with carrier foil - Google Patents
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- JP2009004423A JP2009004423A JP2007161175A JP2007161175A JP2009004423A JP 2009004423 A JP2009004423 A JP 2009004423A JP 2007161175 A JP2007161175 A JP 2007161175A JP 2007161175 A JP2007161175 A JP 2007161175A JP 2009004423 A JP2009004423 A JP 2009004423A
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- copper foil
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- carrier foil
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- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 title claims abstract description 143
- 239000011889 copper foil Substances 0.000 title claims abstract description 125
- 239000011888 foil Substances 0.000 title claims abstract description 115
- 230000015572 biosynthetic process Effects 0.000 claims abstract description 42
- 239000000463 material Substances 0.000 claims abstract description 16
- 229910000881 Cu alloy Inorganic materials 0.000 claims abstract description 12
- 238000007747 plating Methods 0.000 claims description 37
- 239000010949 copper Substances 0.000 claims description 21
- 229910052802 copper Inorganic materials 0.000 claims description 17
- 230000003746 surface roughness Effects 0.000 claims description 12
- 229910001182 Mo alloy Inorganic materials 0.000 claims description 5
- WUUZKBJEUBFVMV-UHFFFAOYSA-N copper molybdenum Chemical compound [Cu].[Mo] WUUZKBJEUBFVMV-UHFFFAOYSA-N 0.000 claims description 5
- 238000004519 manufacturing process Methods 0.000 description 23
- 235000019646 color tone Nutrition 0.000 description 16
- 238000000034 method Methods 0.000 description 16
- 230000000052 comparative effect Effects 0.000 description 10
- 238000005304 joining Methods 0.000 description 10
- 239000000758 substrate Substances 0.000 description 9
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 8
- 229910052751 metal Inorganic materials 0.000 description 7
- 239000002184 metal Substances 0.000 description 7
- 239000000203 mixture Substances 0.000 description 7
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 6
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 6
- KRKNYBCHXYNGOX-UHFFFAOYSA-N citric acid Chemical compound OC(=O)CC(O)(C(O)=O)CC(O)=O KRKNYBCHXYNGOX-UHFFFAOYSA-N 0.000 description 6
- 238000005530 etching Methods 0.000 description 6
- 229910052750 molybdenum Inorganic materials 0.000 description 6
- 239000011733 molybdenum Substances 0.000 description 6
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 5
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 5
- 238000010586 diagram Methods 0.000 description 5
- 238000005868 electrolysis reaction Methods 0.000 description 5
- 238000005259 measurement Methods 0.000 description 5
- 239000002994 raw material Substances 0.000 description 5
- 238000007788 roughening Methods 0.000 description 5
- 239000007864 aqueous solution Substances 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 239000007788 liquid Substances 0.000 description 4
- 229920001721 polyimide Polymers 0.000 description 4
- 238000012545 processing Methods 0.000 description 4
- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 description 3
- 238000010438 heat treatment Methods 0.000 description 3
- 229910017604 nitric acid Inorganic materials 0.000 description 3
- 239000009719 polyimide resin Substances 0.000 description 3
- 239000000243 solution Substances 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- 239000002966 varnish Substances 0.000 description 3
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 2
- CDBYLPFSWZWCQE-UHFFFAOYSA-L Sodium Carbonate Chemical compound [Na+].[Na+].[O-]C([O-])=O CDBYLPFSWZWCQE-UHFFFAOYSA-L 0.000 description 2
- 239000003795 chemical substances by application Substances 0.000 description 2
- 229910000365 copper sulfate Inorganic materials 0.000 description 2
- ARUVKPQLZAKDPS-UHFFFAOYSA-L copper(II) sulfate Chemical compound [Cu+2].[O-][S+2]([O-])([O-])[O-] ARUVKPQLZAKDPS-UHFFFAOYSA-L 0.000 description 2
- 230000008878 coupling Effects 0.000 description 2
- 238000010168 coupling process Methods 0.000 description 2
- 238000005859 coupling reaction Methods 0.000 description 2
- 238000009713 electroplating Methods 0.000 description 2
- 229910000358 iron sulfate Inorganic materials 0.000 description 2
- BAUYGSIQEAFULO-UHFFFAOYSA-L iron(2+) sulfate (anhydrous) Chemical compound [Fe+2].[O-]S([O-])(=O)=O BAUYGSIQEAFULO-UHFFFAOYSA-L 0.000 description 2
- JEIPFZHSYJVQDO-UHFFFAOYSA-N iron(III) oxide Inorganic materials O=[Fe]O[Fe]=O JEIPFZHSYJVQDO-UHFFFAOYSA-N 0.000 description 2
- 229910052759 nickel Inorganic materials 0.000 description 2
- 230000002265 prevention Effects 0.000 description 2
- 229910000077 silane Inorganic materials 0.000 description 2
- 239000011734 sodium Substances 0.000 description 2
- 239000011684 sodium molybdate Substances 0.000 description 2
- 235000015393 sodium molybdate Nutrition 0.000 description 2
- TVXXNOYZHKPKGW-UHFFFAOYSA-N sodium molybdate (anhydrous) Chemical compound [Na+].[Na+].[O-][Mo]([O-])(=O)=O TVXXNOYZHKPKGW-UHFFFAOYSA-N 0.000 description 2
- 238000004381 surface treatment Methods 0.000 description 2
- JBQYATWDVHIOAR-UHFFFAOYSA-N tellanylidenegermanium Chemical compound [Te]=[Ge] JBQYATWDVHIOAR-UHFFFAOYSA-N 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 230000037303 wrinkles Effects 0.000 description 2
- 229910021578 Iron(III) chloride Inorganic materials 0.000 description 1
- 241000080590 Niso Species 0.000 description 1
- ZLMJMSJWJFRBEC-UHFFFAOYSA-N Potassium Chemical compound [K] ZLMJMSJWJFRBEC-UHFFFAOYSA-N 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 238000005238 degreasing Methods 0.000 description 1
- PEVJCYPAFCUXEZ-UHFFFAOYSA-J dicopper;phosphonato phosphate Chemical compound [Cu+2].[Cu+2].[O-]P([O-])(=O)OP([O-])([O-])=O PEVJCYPAFCUXEZ-UHFFFAOYSA-J 0.000 description 1
- 238000004090 dissolution Methods 0.000 description 1
- 238000007772 electroless plating Methods 0.000 description 1
- 230000005484 gravity Effects 0.000 description 1
- 230000006698 induction Effects 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- RBTARNINKXHZNM-UHFFFAOYSA-K iron trichloride Chemical compound Cl[Fe](Cl)Cl RBTARNINKXHZNM-UHFFFAOYSA-K 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- MEFBJEMVZONFCJ-UHFFFAOYSA-N molybdate Chemical compound [O-][Mo]([O-])(=O)=O MEFBJEMVZONFCJ-UHFFFAOYSA-N 0.000 description 1
- LGQLOGILCSXPEA-UHFFFAOYSA-L nickel sulfate Chemical compound [Ni+2].[O-]S([O-])(=O)=O LGQLOGILCSXPEA-UHFFFAOYSA-L 0.000 description 1
- 229910000363 nickel(II) sulfate Inorganic materials 0.000 description 1
- 150000002894 organic compounds Chemical class 0.000 description 1
- 238000005554 pickling Methods 0.000 description 1
- 229920005575 poly(amic acid) Polymers 0.000 description 1
- 229910052700 potassium Inorganic materials 0.000 description 1
- 239000011591 potassium Substances 0.000 description 1
- 239000002243 precursor Substances 0.000 description 1
- 150000003839 salts Chemical class 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 229910000029 sodium carbonate Inorganic materials 0.000 description 1
- 238000010183 spectrum analysis Methods 0.000 description 1
- NWONKYPBYAMBJT-UHFFFAOYSA-L zinc sulfate Chemical compound [Zn+2].[O-]S([O-])(=O)=O NWONKYPBYAMBJT-UHFFFAOYSA-L 0.000 description 1
- 229910000368 zinc sulfate Inorganic materials 0.000 description 1
- 229960001763 zinc sulfate Drugs 0.000 description 1
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- Parts Printed On Printed Circuit Boards (AREA)
- Laminated Bodies (AREA)
- Electroplating Methods And Accessories (AREA)
Abstract
【課題】フレキシブルプリント配線板等における回路配線の微細化に対応可能な、キャリア箔の安定した剥離性と回路配線の優れた画像認識性を併せ持ったキャリア箔付き銅箔を提供する。
【解決手段】フレキシブルプリント配線板等における回路配線の微細化に対応可能な本発明のキャリア箔付き銅箔は、キャリア箔の片面または両面に直接接触する回路形成用銅箔として所定の銅合金めっき層を備え、かつ前記回路形成用銅箔が基材と接着する面の色調を、L*a*b*表色系において、L*≦40、−10≦a*≦10、−10≦b*≦10とする。
【選択図】図2Provided is a copper foil with a carrier foil, which can cope with miniaturization of circuit wiring in a flexible printed wiring board or the like and has both stable peelability of the carrier foil and excellent image recognition of the circuit wiring.
The copper foil with a carrier foil of the present invention that can cope with miniaturization of circuit wiring in a flexible printed wiring board or the like is plated with a predetermined copper alloy as a copper foil for circuit formation that directly contacts one or both surfaces of the carrier foil. Layer, and the color tone of the surface on which the circuit forming copper foil adheres to the base material is represented by L * ≦ 40, −10 ≦ a * ≦ 10, −10 ≦ b in the L * a * b * color system * ≤10.
[Selection] Figure 2
Description
本発明は、キャリア箔付き銅箔に関し、特に、フレキシブルプリント配線板等の微細配線部品の製造に好適な、回路配線の画像認識性に優れたキャリア箔付き銅箔に関するものである。 The present invention relates to a copper foil with a carrier foil, and more particularly to a copper foil with a carrier foil that is suitable for manufacturing fine wiring components such as a flexible printed wiring board and excellent in image recognition of circuit wiring.
銅箔は導電体用途としてよく用いられている。特にフレキシブルプリント配線板の分野では、回路用銅箔にポリイミド系樹脂フィルムをラミネート(積層)したり、あるいはポリイミド系樹脂の前駆体であるポリアミック酸を主成分とするワニスを塗布したりすることによってプリント配線板用部材が製造される。その後、該プリント配線板用部材の回路用銅箔部分に対し、エッチング等によって回路配線を形成することでプリント配線板が製造される。以下、この時に用いるポリイミド系樹脂フィルムやワニス、またはワニスを硬化させたもの等を「プリント配線板用基材」または単に「基材」と表し、回路用銅箔と基材を積層する工程を「接合工程」と称する。 Copper foil is often used as a conductor. Especially in the field of flexible printed wiring boards, a polyimide resin film is laminated (laminated) on a copper foil for circuits, or a varnish mainly composed of a polyamic acid that is a precursor of a polyimide resin is applied. A printed wiring board member is manufactured. Then, a printed wiring board is manufactured by forming a circuit wiring by etching etc. with respect to the copper foil part for circuits of this printed wiring board member. Hereinafter, a polyimide resin film or varnish used at this time, or a cured varnish is referred to as a “substrate for printed wiring board” or simply “substrate”, and a step of laminating a copper foil for circuit and a substrate This is referred to as “joining process”.
近年、電子機器の小型化の進展により、フレキシブルプリント配線板の回路も微細化の一途を辿っている。回路配線の微細化(配線幅および配線間隔の縮小化)のためには、例えば、回路用銅箔の厚みを薄くしてエッチング量を精密に制御する必要があるが、極薄の銅箔を使用すると、上記接合工程において該銅箔にシワが発生しやすくなる。また、そのシワからクラックが発生し、回路部分が破断に至ってしまう場合がある。このような問題を防止するため、キャリア箔として厚さ18μm程度の銅箔を用いたキャリア箔付き銅箔を用いて接合工程を施し、その後、回路形成前にキャリア箔を剥離するプリント配線板の製造方法が用いられるようになってきた。 In recent years, with the progress of miniaturization of electronic devices, the circuits of flexible printed wiring boards have been increasingly miniaturized. For miniaturization of circuit wiring (reduction of wiring width and wiring interval), for example, it is necessary to reduce the thickness of the circuit copper foil and precisely control the etching amount. If used, wrinkles are likely to occur in the copper foil in the joining step. In addition, cracks may be generated from the wrinkles and the circuit portion may be broken. In order to prevent such problems, a bonding process is performed using a copper foil with a carrier foil using a copper foil having a thickness of about 18 μm as a carrier foil, and then the printed wiring board is peeled off before forming the circuit. Manufacturing methods have come to be used.
図1は、キャリア箔と回路用銅箔の境界部分に剥離層を設けたキャリア箔付き銅箔の断面構造例を示す模式図である。従来、キャリア箔付き銅箔10においては、接合工程後にキャリア箔1の剥離を容易にするための剥離層5が、キャリア箔1となる銅箔と回路用銅箔2’の境界部分に設けられていた。この剥離層5としては、例えば、特許文献1(特許第3690962号公報)や特許文献2(特開2003−94553号公報)で開示されているような金属、合金、または金属酸化物皮膜によって構成される無機系剥離層と、特許文献3(特許第3612594号公報)で開示されているような有機化合物によって構成される有機系剥離層に大別される。しかしながら、いずれの剥離層5においても剥離層形成のための処理工程が必要であることから、キャリア箔付き銅箔10の製造工程は、一般の銅箔の製造工程に比して煩雑なものとなってしまい、製造コストが高くなる問題を有していた。
FIG. 1 is a schematic diagram showing an example of a cross-sectional structure of a copper foil with a carrier foil in which a release layer is provided at the boundary between the carrier foil and the circuit copper foil. Conventionally, in the
この問題を解決するために、特許文献4(特開2005−307270号公報)では、キャリア箔と回路形成層のいずれか一方を電解により形成した有機剤を含有する析出銅層とし、他方を99.9mass%以上の純銅層としたキャリア箔付き電解銅箔が開示されている。このキャリア箔付き電解銅箔は、前述した剥離層が不要であるため、製造プロセスおよび製造コストを削減できるとしている。 In order to solve this problem, in Patent Document 4 (Japanese Patent Laid-Open No. 2005-307270), one of the carrier foil and the circuit forming layer is a deposited copper layer containing an organic agent formed by electrolysis, and the other is 99.9. An electrolytic copper foil with a carrier foil having a pure copper layer of mass% or more is disclosed. This electrolytic copper foil with a carrier foil does not require the above-described release layer, and therefore can reduce the manufacturing process and manufacturing cost.
一方、フレキシブルプリント配線板の製造において、回路形成後(キャリア箔は剥離済み)に行われるビアホールの形成工程やシリコンチップのボンディング工程は、形成された回路配線をプリント配線板用基材側からの画像認識によって自動位置決めして行われることが多い。このため、配線の微細化に伴ってより良好な画像認識性が要求されており、回路用銅箔の基材との接着面は、黒色を呈することが求められるようになった。 On the other hand, in the manufacture of flexible printed wiring boards, via hole forming processes and silicon chip bonding processes performed after circuit formation (carrier foil has already been peeled off), the formed circuit wiring is transferred from the printed wiring board substrate side. In many cases, automatic positioning is performed by image recognition. For this reason, with the miniaturization of wiring, better image recognizability is required, and the adhesion surface of the circuit copper foil with the base material is required to exhibit a black color.
しかしながら、上述した従来のキャリア箔付き銅箔は、回路形成前にキャリア箔を剥離する際の剥離性に主眼を置いたものであり、回路形成後に良好な画像認識性が確保されない懸念がある。これは、回路配線が微細化されたフレキシブルプリント配線板の製造に対し、製造速度の低下や歩留まりの低下を引き起こす要因となる。 However, the above-described conventional copper foil with a carrier foil focuses on the peelability when the carrier foil is peeled off before forming a circuit, and there is a concern that good image recognizability cannot be ensured after the circuit is formed. This becomes a factor that causes a decrease in manufacturing speed and a yield in manufacturing a flexible printed wiring board in which circuit wiring is miniaturized.
従って、本発明の目的は、フレキシブルプリント配線板等における回路配線の微細化に対応可能な、キャリア箔の安定した剥離性と回路配線の優れた画像認識性を併せ持ったキャリア箔付き銅箔を提供することにある。 Accordingly, an object of the present invention is to provide a copper foil with a carrier foil that can cope with the miniaturization of circuit wiring in a flexible printed wiring board or the like and has both stable peelability of the carrier foil and excellent image recognition of the circuit wiring. There is to do.
本発明者らは、キャリア箔付き銅箔において、キャリア箔表面上に直接形成する回路形成用銅箔を所定の銅合金めっき層とすることで、キャリア箔の安定した剥離性を確保すると共に、回路形成用銅箔の表面(回路形成用銅箔が基材と接着する面)の色調を望ましい黒色に制御できることを見出したことに基づき、本発明を完成した。 In the copper foil with a carrier foil, the present inventors ensure a stable peelability of the carrier foil by making the circuit forming copper foil directly formed on the surface of the carrier foil a predetermined copper alloy plating layer, The present invention was completed based on the finding that the color tone of the surface of the circuit forming copper foil (surface on which the circuit forming copper foil adheres to the base material) can be controlled to a desirable black color.
本発明は、上記目的を達成するため、キャリア箔の片面または両面に直接接触する回路形成用銅箔を備えるキャリア箔付き銅箔であって、前記回路形成用銅箔が基材と接着する面の色調が、L*a*b*表色系において、40以下のL*、−10以上10以下のa*、−10以上10以下のb*であることを特徴とするキャリア箔付き銅箔を提供する。 In order to achieve the above object, the present invention is a copper foil with a carrier foil comprising a copper foil for circuit formation that directly contacts one or both surfaces of the carrier foil, and the surface on which the copper foil for circuit formation adheres to a substrate the color tone, the L * a * b * color system, 40 the following L *, -10 to 10 a *, carrier foil copper foil, which is a -10 to 10 for b * I will provide a.
また、本発明は、上記目的を達成するため、上記の本発明に係るキャリア箔付き銅箔において、前記キャリア箔の前記回路形成用銅箔を形成する面の表面粗さが、Ra≦0.2μmであり、特に、前記キャリア箔が圧延銅箔であることを特徴とするキャリア箔付き銅箔を提供する。 In order to achieve the above object, the present invention provides a copper foil with a carrier foil according to the present invention, wherein the surface roughness of the surface of the carrier foil on which the circuit forming copper foil is formed is R a ≦ 0.2. In particular, the present invention provides a copper foil with a carrier foil, wherein the carrier foil is a rolled copper foil.
また、本発明は、上記目的を達成するため、上記の本発明に係るキャリア箔付き銅箔において、前記回路形成用銅箔が銅合金めっき層であり、特に、銅−モリブデン合金めっき層であることを特徴とするキャリア箔付き銅箔を提供する。 In order to achieve the above object, the present invention provides the above-described copper foil with a carrier foil according to the present invention, wherein the copper foil for circuit formation is a copper alloy plating layer, particularly a copper-molybdenum alloy plating layer. A copper foil with a carrier foil is provided.
また、本発明は、上記の本発明に係るキャリア箔付き銅箔を用いて得られる銅張積層板を提供する。 Moreover, this invention provides the copper clad laminated board obtained using said copper foil with a carrier foil which concerns on this invention.
本発明によれば、フレキシブルプリント配線板等における回路配線の微細化に対応可能な、キャリア箔の安定した剥離性と回路配線の優れた画像認識性を併せ持ったキャリア箔付き銅箔を低い製造コストで提供することができる。 According to the present invention, a copper foil with a carrier foil that can cope with the miniaturization of circuit wiring in a flexible printed wiring board or the like and has both stable peelability of the carrier foil and excellent image recognition of the circuit wiring is manufactured at low cost. Can be offered at.
(キャリア箔付き銅箔の構造)
図2は、本発明の実施の形態に係るキャリア箔付き銅箔の構造例を示す断面模式図である。図2(a)はキャリア箔1の片面に回路形成用銅箔2が形成されているキャリア箔付き銅箔20の場合であり、図2(b)はキャリア箔1の両面に回路形成用銅箔2が形成されているキャリア箔付き銅箔30の場合である。
(Structure of copper foil with carrier foil)
FIG. 2 is a schematic cross-sectional view showing a structural example of a copper foil with a carrier foil according to an embodiment of the present invention. 2A shows the case of the
キャリア箔1としては圧延銅箔または電解銅箔のいずれを使用しても良いが、回路形成用銅箔を形成する面の表面粗さは、Ra≦0.2μmであることが望ましい。該表面粗さが0.2μm<Raであると、アンカー効果によりキャリア箔1と回路形成用銅箔2の接合性が高まり、キャリア箔1の剥離が困難になる。より望ましい表面粗さは0.06μm≦Ra≦0.2μmであり、更に望ましくは0.06μm≦Ra≦0.1μmである。上記の観点から、キャリア箔の両面に回路形成用銅箔を形成する場合(図3(b))、キャリア箔1として両面とも平滑な圧延銅箔を用いることは非常に有効である。また、キャリア箔表面の平滑性を向上させるために、キャリア箔1の表面に銅めっきを施すことも有効である(例えば、特開2005-340635号公報を参照)。なお、該表面粗さがRa<0.06μmになると、平滑性向上のための製造コストの増大に見合った剥離性への効果が見られない。また、Raは、JIS B 0601 (1994)に準拠するものとする。
Although either rolled copper foil or electrolytic copper foil may be used as the
このようなキャリア箔1の表面に銅−モリブデン合金めっきを施すことにより、回路配線の画像認識性に優れた黒色を呈する回路形成用銅箔2を得ることができる。ここで言う黒色とは、JIS Z8729に定義されるL*a*b*表色系において、L*≦40、−10≦a*≦10、−10≦b*≦10である色調を示す。なお、色調の測定は、色彩色差計(例えば、コニカミノルタ製、型式:CR-400)を用いて行うことができる。L*が40より大きいと灰色となり、回路配線の画像認識性が劣化する。また、a*が−10より小さいと緑色が強くなり、10より大きくなると赤色が強くなるため回路配線の画像認識性が劣化する。また、b*が−10より小さいと青色が強くなり、10より大きくなると黄色が強くなるため回路配線の画像認識性が劣化する。より望ましい色調はL*≦35、−9≦a*≦9、−9≦b*≦9であり、更に望ましい色調はL*≦30、−8≦a*≦8、−8≦b*≦8である。
By performing copper-molybdenum alloy plating on the surface of the
また、前記回路形成用銅箔2の平均厚さは、0.5〜3μmであることが望ましい。該回路形成用銅箔の平均厚さが0.5μm未満では、上述した色調を確保することが困難になる。一方、該回路形成用銅箔2の平均厚さを3μmより厚くすると、回路形成時のエッチング量制御が困難になり、所望の微細配線パターンが得られない。
The average thickness of the circuit forming
さらに、フレキシブルプリント配線板等の製造においては、上述の回路形成用銅箔2に対し、基材との密着性、耐薬品性、耐熱性、および耐湿性といった接着信頼性の向上を図るため、防錆処理やシランカップリング処理などの表面処理がしばしば施される。このとき、いずれの処理においても公知の技術を用いて構わない。ただし、防錆処理における金属種や皮膜量、シランカップリング液の種類などは、積層する基材や接合工程における熱処理条件等を考慮して適宜選択することが好ましい。
Furthermore, in the production of flexible printed wiring boards and the like, in order to improve adhesion reliability such as adhesion to the substrate, chemical resistance, heat resistance, and moisture resistance for the above-described
(回路形成用銅箔の形成方法)
前述したように、回路形成用銅箔2の形成は銅合金めっきによって行う。基材との接合工程後、キャリア箔1の剥離を容易にするため、回路形成用銅箔2はキャリア箔1との密着性が制御され、かつ接合工程における熱処理等に対して安定な(不活性な)層であることが望ましい。
(Method of forming copper foil for circuit formation)
As described above, the formation of the circuit forming
回路形成用銅箔の銅合金めっきは、銅母相中にモリブデンを微量添加した銅‐モリブデン合金めっきを行うのが好ましい。銅めっきへ添加する異種金属として、融点が高く熱的に安定なモリブデンを用いることで、接合工程における熱処理に対しても安定な層を得ることができる。また、該銅合金めっきは、限界電流密度以上の電流密度で行うことが望ましい。回路形成用銅箔を銅合金めっき層とし、かつ限界電流密度以上の電流密度でめっきを行うことにより、格子ひずみを内在しためっき皮膜が形成される。これにより、めっき皮膜の素地であるキャリア箔の格子定数と回路形成用銅箔の格子定数に差異が生じ、結果としてキャリア箔と回路形成用銅箔の密着性を低く制御することができる(例えば、0.1N/mm以下)。 The copper alloy plating of the circuit forming copper foil is preferably performed by copper-molybdenum alloy plating in which a small amount of molybdenum is added to a copper matrix phase. By using molybdenum which has a high melting point and is thermally stable as the dissimilar metal added to the copper plating, a layer that is stable against heat treatment in the bonding step can be obtained. The copper alloy plating is preferably performed at a current density that is equal to or higher than the limit current density. By using the copper foil for circuit formation as a copper alloy plating layer and plating at a current density equal to or higher than the limit current density, a plating film containing lattice strain is formed. Thereby, a difference arises in the lattice constant of the carrier foil which is the base of the plating film, and the lattice constant of the copper foil for circuit formation, and as a result, the adhesion between the carrier foil and the copper foil for circuit formation can be controlled to be low (for example, 0.1 N / mm or less).
次に、銅合金の電解めっき条件の一例を示す。銅(Cu)の供給源としては硫酸銅やピロリン酸銅、モリブデン(Mo)の供給源としてはモリブデン酸ナトリウムやモリブデン酸カリウムなどの金属塩を使用しても構わない。また、めっき装置に特段の制限は無い。
Cu: 0.4〜0.5 mol/L
Mo: 0.01〜0.04 mol/L
硫酸: 0.03〜0.1 mol/L
液温: 30〜50℃
電流密度: 10〜30 A/dm2
処理時間: 1〜4秒
Next, an example of electrolytic plating conditions for a copper alloy is shown. A copper (Cu) supply source may be copper sulfate or copper pyrophosphate, and a molybdenum (Mo) supply source may be a metal salt such as sodium molybdate or potassium molybdate. Moreover, there is no special restriction | limiting in a plating apparatus.
Cu: 0.4-0.5 mol / L
Mo: 0.01-0.04 mol / L
Sulfuric acid: 0.03-0.1 mol / L
Liquid temperature: 30-50 ° C
Current density: 10-30 A / dm 2
Processing time: 1-4 seconds
上記条件の範囲から大きく逸脱した場合、キャリア箔との密着性が高くなり剥離が困難になったり、液抵抗が増大してめっき処理自体が困難になったりするような不具合が生じる場合がある。よって、量産(安定した製造)を考慮した場合、上記の範囲が好ましい。また、回路形成用銅箔の色調や基材との密着性などを制御するために、上記めっき浴に対しクエン酸や鉄、ニッケルなどを微量添加してもよい。 When deviating greatly from the range of the above conditions, there may be a problem that the adhesion with the carrier foil becomes high and peeling becomes difficult, or the liquid resistance increases and the plating process itself becomes difficult. Therefore, when considering mass production (stable production), the above range is preferable. Moreover, in order to control the color tone of the copper foil for circuit formation, the adhesiveness with a base material, etc., you may add a trace amount of citric acid, iron, nickel, etc. with respect to the said plating bath.
(フレキシブルプリント配線板の製造工程)
本発明に係るキャリア箔付き銅箔を用いたフレキシブルプリント配線板の製造工程を概略的に説明する。図3は、本発明に係るキャリア箔付き銅箔を用いたフレキシブルプリント配線板の製造工程の模式図である。図3に示したように、キャリア箔1の表面上に直接設けられた回路形成用銅箔2を有するキャリア箔付き銅箔に対し、ポリイミドフィルムなどの基材3を積層する(接合工程)。なお、接合工程の前に、回路形成用銅箔に対する表面処理を予め行っておくことは好ましい。次に、キャリア箔1を回路形成用銅箔2から剥離する(剥離工程)。その後、基材3上の回路形成用銅箔2に対し、エッチング等により微細配線(配線幅および配線間隔の縮小化)の回路パターンを形成する(回路パターン形成工程)。回路パターン形成工程の後、配線に要求される導電性を確保する(配線抵抗を低減する)ために、極薄・微細配線パターン上に配線用銅めっき4を施して、配線厚みを増やす場合もある(配線形成工程)。このときの配線用銅めっき4は、電解めっき、無電解めっきのいずれを用いてもよい。
(Manufacturing process of flexible printed wiring board)
The manufacturing process of the flexible printed wiring board using the copper foil with carrier foil which concerns on this invention is demonstrated roughly. Drawing 3 is a mimetic diagram of a manufacturing process of a flexible printed wiring board using copper foil with a carrier foil concerning the present invention. As shown in FIG. 3, a
〔実施の形態の効果〕
上記の本発明の実施の形態によれば、下記の効果を奏する。
(1)キャリア箔表面上に直接形成する回路形成用銅箔を所定の銅合金めっき層とすることにより、回路形成用銅箔の表面(回路形成用銅箔が基材と接合する面)の色調を望ましい黒色に制御でき、微細化された回路配線の優れた画像認識性を有するキャリア箔付き銅箔が得られる。
(2)キャリア箔表面上に直接形成する回路形成用銅箔を所定の銅合金めっき層とすることにより、付加的な剥離層を省略してもキャリア箔の安定した剥離性が確保され、製造プロセスおよび製造コストを削減したキャリア箔付き銅箔が得られる。
(3)キャリア箔表面上に直接形成する回路形成用銅箔の平均厚さを0.5〜3μmと制御することにより、回路パターン形成工程におけるエッチング制御が容易となり、微細配線の精度が高いプリント配線板が得られる。
(4)回路配線の優れた画像認識性を有するキャリア箔付き銅箔を用いることにより、フレキシブルプリント配線板の製造における製造速度や歩留まりを向上でき、製造コストの低いプリント配線板が得られる。
[Effect of the embodiment]
According to the above embodiment of the present invention, the following effects can be obtained.
(1) By forming the copper foil for circuit formation directly formed on the surface of the carrier foil as a predetermined copper alloy plating layer, the surface of the copper foil for circuit formation (surface on which the copper foil for circuit formation is bonded to the base material) A copper foil with a carrier foil can be obtained, which can control the color tone to a desirable black color and has excellent image recognition of fine circuit wiring.
(2) By forming the copper foil for circuit formation directly formed on the surface of the carrier foil as a predetermined copper alloy plating layer, even if an additional release layer is omitted, stable release of the carrier foil is ensured and manufactured. A copper foil with a carrier foil with reduced process and manufacturing costs can be obtained.
(3) By controlling the average thickness of the circuit forming copper foil directly formed on the surface of the carrier foil to 0.5 to 3 μm, the etching control in the circuit pattern forming process becomes easy and the precision of the fine wiring is high. Is obtained.
(4) By using a copper foil with a carrier foil having excellent image recognizability of circuit wiring, the manufacturing speed and yield in manufacturing a flexible printed wiring board can be improved, and a printed wiring board with low manufacturing cost can be obtained.
以下、本発明を実施例に基づいて更に詳しく説明するが、本発明はこれらに限定されるものではない。 EXAMPLES Hereinafter, although this invention is demonstrated in more detail based on an Example, this invention is not limited to these.
(実施例1〜6および比較例1〜5の作製)
キャリア箔として厚さ16.3μmの圧延銅箔(無酸素銅、JIS H3100 C1020)を用意した。このキャリア箔に対し、水酸化ナトリウム(和光純薬工業株式会社製、品番:194−02135、分子式:NaOH)が1mol/L、炭酸ナトリウム(純正化学株式会社製、品番:43350−1250、分子式:Na2CO3)が0.2 mol/Lの水溶液において、温度40℃、電流密度5A/dm2、処理時間10秒で陰極電解にて電解脱脂処理を行った。その後、硫酸(純正化学株式会社製、品番:83010−0330、分子式:H2SO4)0.5 mol/Lの水溶液において温度25℃、処理時間10秒で浸漬することにより酸洗処理を施した。
(Production of Examples 1 to 6 and Comparative Examples 1 to 5)
A rolled copper foil (oxygen-free copper, JIS H3100 C1020) having a thickness of 16.3 μm was prepared as a carrier foil. To this carrier foil, sodium hydroxide (manufactured by Wako Pure Chemical Industries, Ltd., product number: 194-02135, molecular formula: NaOH) is 1 mol / L, sodium carbonate (manufactured by Junsei Chemical Co., Ltd., product number: 43350-1250, molecular formula: In an aqueous solution of Na 2 CO 3 ) of 0.2 mol / L, electrolytic degreasing treatment was performed by cathode electrolysis at a temperature of 40 ° C., a current density of 5 A / dm 2 , and a treatment time of 10 seconds. Then, pickling treatment was performed by immersing in a 0.5 mol / L aqueous solution of sulfuric acid (manufactured by Junsei Co., Ltd., product number: 83010-0330, molecular formula: H 2 SO 4 ) at a temperature of 25 ° C. and a treatment time of 10 seconds.
上記のキャリア箔に対し、表面粗さ測定機(株式会社小坂製作所製、型式:SE500)を用いて表面粗さを測定したところ、Ra≒0.08μmであった。 When the surface roughness of the carrier foil was measured using a surface roughness measuring machine (manufactured by Kosaka Manufacturing Co., Ltd., model: SE500), R a ≈0.08 μm.
次に、上記キャリア箔の1つに対し、下記に示す条件で銅めっき粗化処理を行った。なお、銅(Cu)成分原料として硫酸銅(純正化学株式会社製、品番:83435−1201、分子式:CuSO4・5H2O)、鉄(Fe)成分原料として硫酸鉄(純正化学株式会社製、品番:83380−1201、分子式:FeSO4・7H2O)を用い、電流値制御でめっきを行った。
Cu: 0.40 mol/L
Fe: 0.07 mol/L
硫酸: 1.3 mol/L
液温: 30℃
電流密度: 40 A/dm2
処理時間: 4秒
Next, a copper plating roughening treatment was performed on one of the carrier foils under the following conditions. In addition, copper sulfate (manufactured by Junsei Chemical Co., Ltd., product number: 83435-1201, molecular formula: CuSO 4 · 5H 2 O) as a copper (Cu) component raw material, iron sulfate (manufactured by Junsei Chemical Co., Ltd.) as an iron (Fe) component raw material, (Product No .: 83380-1201, molecular formula: FeSO 4 · 7H 2 O), and plating was performed with current value control.
Cu: 0.40 mol / L
Fe: 0.07 mol / L
Sulfuric acid: 1.3 mol / L
Liquid temperature: 30 ℃
Current density: 40 A / dm 2
Processing time: 4 seconds
粗化処理を行ったキャリア箔に対し、表面粗さ測定機(株式会社小坂製作所製、型式:SE500)を用いて表面粗さを測定したところ、Ra≒0.25μmであった。この粗化処理を行ったキャリア箔を比較例5用のキャリア箔とし、粗化処理を行わなかったキャリア箔を実施例1〜6および比較例1〜4用のキャリア箔とした。 When the surface roughness of the carrier foil subjected to the roughening treatment was measured using a surface roughness measuring machine (manufactured by Kosaka Manufacturing Co., Ltd., model: SE500), R a ≈0.25 μm. The carrier foil subjected to the roughening treatment was used as a carrier foil for Comparative Example 5, and the carrier foil not subjected to the roughening treatment was used as the carrier foil for Examples 1 to 6 and Comparative Examples 1 to 4.
上記キャリア箔に対して、表1に示すようなめっき浴組成・電解条件で銅−モリブデン合金めっきを施し、平均厚さが約0.5μmの回路形成用銅箔を形成した。なお、モリブデン(Mo)成分原料としてモリブデン酸ナトリウム(例純正化学株式会社製、品番:77080−1201、分子式:Na2MoO4・2H2O)、鉄(Fe)成分原料として硫酸鉄(純正化学株式会社製、品番:83380−1201、分子式:FeSO4・7H2O)、ニッケル(Ni)成分原料として硫酸ニッケル(和光純薬工業株式会社製、品番:148−01175、分子式:NiSO4・6H2O)、亜鉛(Zn)成分原料として硫酸亜鉛(純正化学株式会社製、品番:83060−0301、分子式:ZnSO4・7H2O)、調整剤としてクエン酸(純正化学株式会社製、品番:26040−1201、分子式:C6H8O7・H2O)を用い、電流値制御でめっきを行った。 The carrier foil was subjected to copper-molybdenum alloy plating under the plating bath composition and electrolysis conditions as shown in Table 1 to form a circuit forming copper foil having an average thickness of about 0.5 μm. In addition, sodium molybdate as a molybdenum (Mo) component raw material (eg Junsei Chemical Co., Ltd., product number: 77080-1201, molecular formula: Na 2 MoO 4 · 2H 2 O), iron sulfate (Fe) Co., Ltd., product number: 83380-1201, molecular formula: FeSO 4 · 7H 2 O), nickel (Ni) component raw material nickel sulfate (manufactured by Wako Pure Chemical Industries, Ltd., product number: 148-01175, molecular formula: NiSO 4 · 6H 2 O), zinc (Zn) component raw material zinc sulfate (manufactured by Junsei Chemical Co., Ltd., product number: 83060-3001, molecular formula: ZnSO 4 · 7H 2 O), and adjusting agent citric acid (manufactured by Junsei Chemical Co., Ltd., product number: 26040-1201, molecular formula: C 6 H 8 O 7 · H 2 O), and plating was performed with current value control.
(回路形成用銅箔の色調および剥離強度の測定)
上記の各試料に対して、回路形成用銅箔の色調およびキャリア箔の剥離強度を測定した。回路形成用銅箔表面の色調は、色彩色差計(コニカミノルタ製、型式:CR-400)を用いて測定した。測定結果を表2に示す。
(Measurement of color tone and peel strength of copper foil for circuit formation)
For each of the above samples, the color tone of the circuit forming copper foil and the peel strength of the carrier foil were measured. The color tone of the surface of the copper foil for circuit formation was measured using a color difference meter (manufactured by Konica Minolta, model: CR-400). The measurement results are shown in Table 2.
また、キャリア箔の剥離強度は次のような手順で測定した。まず、プリント配線板用基材としてFR−4基材(JIS C6480におけるGE4F)を用い、上記で作製したキャリア箔付き銅箔と温間プレス(175℃×1時間、面圧:0.4MPa)により接合した。次に、塩化第二鉄エッチング液(サンハヤト株式会社製、品番:H−20L)を用いてキャリア箔と回路形成用銅箔をエッチングして、線幅1mmの直線配線を形成した。次に、直線配線を形成した該キャリア箔付き銅箔に対し、万能試験機(株式会社島津製作所製、型式:AGS−500A)を用いて、直線配線のキャリア箔を基材面に対して略直角方向に50mm/minの速さで引っ張る引き剥がし試験を行い、その時の強度を剥離強度とした。接合工程後のキャリア銅箔の剥離強度が0.1N/mm以下であれば、容易に引き剥がすことが可能と言われていることから、良好な剥離性の判断基準を0.1N/mmとした。測定結果を表2に併記する。 The peel strength of the carrier foil was measured by the following procedure. First, FR-4 base material (GE4F in JIS C6480) is used as the base material for printed wiring board, and the copper foil with carrier foil prepared above and warm press (175 ° C x 1 hour, surface pressure: 0.4 MPa) Joined. Next, the carrier foil and the copper foil for circuit formation were etched using a ferric chloride etching solution (manufactured by Sanhayato Co., Ltd., product number: H-20L) to form a linear wiring having a line width of 1 mm. Next, with respect to the copper foil with the carrier foil in which the straight wiring is formed, the carrier foil of the straight wiring is substantially omitted with respect to the substrate surface using a universal testing machine (manufactured by Shimadzu Corporation, model: AGS-500A). A peeling test was conducted by pulling at a speed of 50 mm / min in the perpendicular direction, and the strength at that time was defined as the peel strength. Since it is said that if the peel strength of the carrier copper foil after the joining step is 0.1 N / mm or less, it can be easily peeled off, the criterion for determining good peelability was set to 0.1 N / mm. The measurement results are also shown in Table 2.
表1,2から明らかなように、実施例1〜6のキャリア箔付き銅箔は、回路形成用銅箔の表面(基材と接合する面)が望ましい色調(L*≦40、−10≦a*≦10、−10≦b*≦10)を有し、かつ接合工程後に良好な剥離性(0.1N/mm以下)を有していることが判る。これに対し、比較例1〜5は、色調および/または剥離強度が望ましい範囲から外れており、回路配線の画像認識性および/またはキャリア箔の剥離性に劣ることが判る。 As is clear from Tables 1 and 2, the copper foils with carrier foils of Examples 1 to 6 have a color tone (L * ≦ 40, −10 ≦) in which the surface of the copper foil for circuit formation (surface to be bonded to the base material) is desirable. a * ≦ 10, −10 ≦ b * ≦ 10), and good peelability (0.1 N / mm or less) after the joining step. On the other hand, in Comparative Examples 1 to 5, the color tone and / or the peel strength are out of the desired ranges, and it can be seen that the image recognition property of the circuit wiring and / or the peelability of the carrier foil is inferior.
比較例1においては、実施例1のめっき浴組成に比して硫酸濃度が過剰になっており、その結果、色調が明るく光沢を持った表面状態となり、剥離性も劣化していた。 In Comparative Example 1, the sulfuric acid concentration was excessive as compared with the plating bath composition of Example 1. As a result, the surface state was bright and glossy, and the peelability was also deteriorated.
比較例2においては、実施例1のめっき浴組成に比してモリブデン濃度が過少になっており、その結果、通常の銅の粗化めっきに近づくことから、色調が明るい。また、キャリア箔との格子定数の差異が小さくなることから、剥離性が劣化したものと考えられる。 In Comparative Example 2, the molybdenum concentration is too low as compared with the plating bath composition of Example 1, and as a result, the color tone is bright because it approaches normal copper roughening plating. Moreover, since the difference in lattice constant with the carrier foil is small, it is considered that the peelability has deteriorated.
比較例3は、実施例1のめっき浴組成に対して亜鉛(Zn)を添加したものであり、その結果、色調が望ましい範囲に到達しなかった。また、剥離性も悪かった。 In Comparative Example 3, zinc (Zn) was added to the plating bath composition of Example 1, and as a result, the color tone did not reach the desired range. Moreover, the peelability was also poor.
比較例4においては、実施例の電解条件に比して電流密度が低く限界電流密度未満になっており、その結果、光沢を持った表面状態となり色調も明るい。また、めっき皮膜に内在する歪みが小さくなったために、剥離性が劣化したものと考えられる。 In Comparative Example 4, the current density is lower than the electrolysis condition of the example and lower than the limit current density. As a result, the surface state is glossy and the color tone is bright. Moreover, since the distortion inherent in the plating film is reduced, it is considered that the peelability is deteriorated.
比較例5においては、キャリア箔の表面粗さが実施例のそれに比して大きくなっており、その結果、キャリア箔と回路形成用銅箔の密着性が増大したことから、剥離性が劣化したものと考えられる。 In Comparative Example 5, the surface roughness of the carrier foil is larger than that of the example, and as a result, the adhesion between the carrier foil and the copper foil for circuit formation has increased, so that the peelability has deteriorated. It is considered a thing.
(回路形成用銅箔の組成分析)
表1に示した条件と同じ条件で別途用意した実施例1〜6および比較例1〜4のキャリア箔付き銅箔を用いて、回路形成用銅箔の付着金属量を測定して組成分析を行った。測定手順を次に示す。
(Composition analysis of copper foil for circuit formation)
Using the copper foils with carrier foils of Examples 1 to 6 and Comparative Examples 1 to 4 separately prepared under the same conditions as shown in Table 1, the amount of metal deposited on the copper foil for circuit formation was measured and the composition analysis was performed. went. The measurement procedure is as follows.
まず、各試料に対し、前述と同様に基材の接合を行った。次に、接合工程後の試料を40mm×100mmの大きさに切り出した後、キャリア箔を剥離して基材上に回路形成用銅箔のみを残した。次に、回路形成用銅箔を酸溶解させた後、誘導プラズマ発光分光分析装置(IPC−AES、株式会社島津製作所製、型式:ICPS−7000)を用いて測定を行った。酸溶解には、体積比として硝酸1(濃度60 〜61質量%、比重1.38)に対して純水9を混合させた硝酸水溶液を用いた。該硝酸水溶液30mLを用いて回路形成用銅箔を溶解し、基材を取り出す。その後、該溶解液に純水を加えて100mLとした。この溶解液中の金属濃度をIPC−AESにより測定した。測定結果を表3に示す。 First, the base materials were joined to each sample in the same manner as described above. Next, after cutting the sample after the joining step into a size of 40 mm × 100 mm, the carrier foil was peeled off, and only the copper foil for circuit formation was left on the substrate. Next, after acid-dissolving the copper foil for circuit formation, it measured using the induction plasma emission-spectral-analysis apparatus (IPC-AES, Shimadzu Corporation make, model: ICPS-7000). For acid dissolution, a nitric acid aqueous solution in which pure water 9 was mixed with nitric acid 1 (concentration 60 to 61 mass%, specific gravity 1.38) as a volume ratio was used. The copper foil for circuit formation is melt | dissolved using this nitric acid aqueous solution 30mL, and a base material is taken out. Thereafter, pure water was added to the solution to make 100 mL. The metal concentration in this solution was measured by IPC-AES. Table 3 shows the measurement results.
表1〜3の結果を総合的に見ると、回路形成用銅箔が好ましい黒色を呈し、キャリア箔が安定した剥離性を有するためには、銅とモリブデンの付着金属量そのものよりも、めっき条件(めっき浴組成と電解条件)やキャリア箔の表面粗さが重要であることが判る。 When the results of Tables 1 to 3 are viewed comprehensively, the copper foil for circuit formation exhibits a preferable black color, and in order for the carrier foil to have a stable releasability, the plating conditions are more than the amount of deposited metal of copper and molybdenum itself. It can be seen that (plating bath composition and electrolysis conditions) and the surface roughness of the carrier foil are important.
1…キャリア箔、2…回路形成用銅箔、2’…回路用銅箔、3…プリント配線板用基材(基材)、4…配線用銅めっき、5…剥離層、10,20,30…キャリア箔付き銅箔、40…プリント配線板。
DESCRIPTION OF
Claims (6)
前記回路形成用銅箔が基材と接着する面の色調が、L*a*b*表色系において、L*≦40、−10≦a*≦10、−10≦b*≦10であることを特徴とするキャリア箔付き銅箔。 A copper foil with a carrier foil comprising a circuit forming copper foil that directly contacts one or both sides of the carrier foil,
In the L * a * b * color system, the color tone of the surface where the copper foil for circuit formation adheres to the base material is L * ≦ 40, −10 ≦ a * ≦ 10, −10 ≦ b * ≦ 10 A copper foil with a carrier foil.
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