[go: up one dir, main page]

JP2008021916A - Electronic component device and its manufacturing method - Google Patents

Electronic component device and its manufacturing method Download PDF

Info

Publication number
JP2008021916A
JP2008021916A JP2006194253A JP2006194253A JP2008021916A JP 2008021916 A JP2008021916 A JP 2008021916A JP 2006194253 A JP2006194253 A JP 2006194253A JP 2006194253 A JP2006194253 A JP 2006194253A JP 2008021916 A JP2008021916 A JP 2008021916A
Authority
JP
Japan
Prior art keywords
conductive
insulating substrate
land
electronic component
sheet
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2006194253A
Other languages
Japanese (ja)
Inventor
Yoshiaki Isobe
善朗 礒部
Yoshitaka Sato
義隆 佐藤
Sadao Sato
貞夫 佐藤
Hirosuke Fujiwara
啓輔 藤原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP2006194253A priority Critical patent/JP2008021916A/en
Publication of JP2008021916A publication Critical patent/JP2008021916A/en
Pending legal-status Critical Current

Links

Images

Landscapes

  • Structures For Mounting Electric Components On Printed Circuit Boards (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)

Abstract

<P>PROBLEM TO BE SOLVED: To provide an electronic component device and its manufacturing method which can prevent land exfoliation of the conductor land generated at the time of reflow by the side of the printed wiring board, while securing connection with the printed wiring board, even if electronic components has a high-density electrode. <P>SOLUTION: The electronic component device comprises: an insulating substrate; a conductive land formed on this insulating substrate; an electronic components arranged on this conductive land; a non-conductive sheet fixed to the insulating substrate other than the conductive land for covering at least one portion of the periphery of the conductive land, and also for opening other portions of the conductive land; and a connection means for connecting the conductive land and the electronic components electrically, in the portion for opening the conductive land of this non-conductive sheet. <P>COPYRIGHT: (C)2008,JPO&INPIT

Description

この発明は、エリアアレイなど高密度電極を有する部品を含む電子部品を実装する電子部品装置及びその製造方法に関するものである。   The present invention relates to an electronic component device for mounting an electronic component including a component having a high-density electrode such as an area array, and a manufacturing method thereof.

近年、エリアアレイであるBGA(BALL・GRID・ARRAY)やCSP(CHIP・SCALE・PACKAGE)部品の多ピン化・狭ピッチ化により、BGAやCSPとプリント配線板との接続の信頼性を確保するために接続部であるはんだボール周辺にアンダーフィル(充填材)を充填する方法が取られている。このアンダーフィルの充填に際しては、プリント配線板側の表面層は平滑であることが好ましい。   In recent years, BGA (BALL / GRID / ARRAY) and CSP (CHIP / SCALE / PACKAGE) parts, which are area arrays, have a high pin count and narrow pitch to ensure the reliability of connection between BGA / CSP and printed wiring board. Therefore, a method of filling an underfill (filler) around a solder ball as a connecting portion is taken. When filling the underfill, the surface layer on the printed wiring board side is preferably smooth.

また、アンダーフィルを充填するBGAなどが実装される領域の導体ランド(パッド)の周りには、導体パターン(引き出しパターン)や貫通・非貫通ビアが設置してある場合が多く、アンダーフィルのスムーズな流れが妨げられる。加えてプリント配線板の表面層は、無鉛はんだ材適用による高温リフロー時のパッド剥離やパターン保護のためソルダーレジスト材で絶縁層を形成し、導体ランド周辺を覆い導体ランドの剥離防止としている。 Also, there are many cases where conductor patterns (drawing patterns) and through / non-through vias are installed around the conductor lands (pads) in the area where the BGA that fills the underfill is mounted. Flow is hindered. In addition, the surface layer of the printed wiring board forms an insulating layer with a solder resist material for pad peeling and pattern protection at the time of high temperature reflow using lead-free solder material, and covers the periphery of the conductor land to prevent peeling of the conductor land.

例えば、比較的融点の高い無鉛はんだ材を使用した回路基板のランド剥離を軽減するために特開2002−237674号公報図1(特許文献1参照)には電子部品のリード3が挿入される貫通孔4を有するランド2で、リード3とランド2とを無鉛はんだ6を用いて電気接続すると共に回路基板1を保護するソルダーレジスト5がランド外周端部2aの少なくとも一部を覆うように形成するものが開示されている。   For example, in order to reduce the land peeling of a circuit board using a lead-free solder material having a relatively high melting point, a through hole in which a lead 3 of an electronic component is inserted in FIG. In the land 2 having the hole 4, the lead 3 and the land 2 are electrically connected using the lead-free solder 6 and the solder resist 5 for protecting the circuit board 1 is formed so as to cover at least a part of the land outer peripheral end 2a. Are disclosed.

また、複数枚の積層板を重ねた積層板表面を平滑にするものとして、特開平11−320593号公報図1(特許文献2参照)にはBステージまで進めたプリプレグを用意し、プリプレグの層を成形用プレートに挟み、熱盤間で加熱加圧成形したものが開示されている。   Further, as a means for smoothing the surface of a laminated plate in which a plurality of laminated plates are stacked, a prepreg advanced to the B stage is prepared in FIG. 1 of Japanese Patent Application Laid-Open No. 11-320593 (refer to Patent Document 2). Is sandwiched between molding plates and heated and pressed between hot plates.

特開2002−237674号公報(第1図)Japanese Patent Laid-Open No. 2002-237664 (FIG. 1)

特開平11−320593号公報(第1図 段落0002)Japanese Patent Laid-Open No. 11-320593 (FIG. 1, paragraph 0002)

しかしながら特許文献1に記載のものでは、絶縁層にソルダーレジストを使用するので、BGAなどの狭ピッチに対応するには、印刷による絶縁層の中抜きパターンを形成するにはソルダーレジストの濡れ性や印刷精度の観点から適用が困難であり、ソルダーレジストを積層後、写真製版でエッチングする場合であってもソルダーレジストの膜厚は比較的厚いため、エッチング時間が長く必要であると言う問題点があった。また、ソルダーレジストは樹脂であるため、固化した状態は表面粗度が粗いので導体ランドなどのパターン厚みによる段差も加わり、プリント配線板としての表面層は凸凹しており、アンダーフィルなどの充填が困難であると言う問題点もある。   However, in the thing of patent document 1, since a solder resist is used for an insulating layer, in order to respond | correspond to narrow pitches, such as BGA, in order to form the hollow pattern of an insulating layer by printing, the wettability of a solder resist or It is difficult to apply from the viewpoint of printing accuracy, and even if the solder resist is laminated and etched by photoengraving, the film thickness of the solder resist is relatively thick, so there is a problem that a long etching time is required. there were. Also, since the solder resist is a resin, the solid state has a rough surface roughness, so a step due to the pattern thickness such as the conductor land is added, and the surface layer as a printed wiring board is uneven, and filling such as underfill is not possible. There is also a problem that it is difficult.

特許文献2に記載のものでは、積層板の表層の平滑性を向上させるためには適切であるものの上部に構成する電子部品などとの関係については言及されていない。   In the thing of patent document 2, although it is suitable in order to improve the smoothness of the surface layer of a laminated board, the relationship with the electronic component etc. which are comprised on the upper part is not mentioned.

この発明は上記のような課題を解消するためになされたものであり、高密度電極を有する電子部品であってもプリント配線板との接続を確保すると共にはんだ付け時に発生するプリント配線板側の導体ランドのランド剥離も防止できる電子部品装置を提供することを目的とする。 The present invention has been made in order to solve the above-described problems. Even in an electronic component having a high-density electrode, the connection with the printed wiring board is ensured and the printed wiring board side generated at the time of soldering is secured. An object of the present invention is to provide an electronic component device capable of preventing the land of a conductor land from being separated.

請求項1の発明に係る電子部品装置は、絶縁性基板と、この絶縁性基板上に設けられた導電性ランドと、この導電性ランド上に設けられた電子部品と、前記導電性ランドの周縁部の少なくとも一部分を被覆し、かつ、前記導電性ランドの他の部分を開放し、前記導電性ランド以外における前記絶縁性基板に固定された非導体シートと、この非導体シートの前記導電性ランドを開放する部分において前記導電性ランドと前記電子部品とを電気的に接続する接続手段とを備えたものである。   An electronic component device according to a first aspect of the present invention includes an insulating substrate, a conductive land provided on the insulating substrate, an electronic component provided on the conductive land, and a peripheral edge of the conductive land. A non-conductive sheet that covers at least a part of the portion and opens the other part of the conductive land and is fixed to the insulating substrate other than the conductive land, and the conductive land of the non-conductive sheet And a connection means for electrically connecting the conductive land and the electronic component at a portion where the opening is opened.

請求項2の発明に係る電子部品装置は、絶縁性基板と、この絶縁性基板上に設けられた第1及び第2導電性ランドと、前記絶縁性基板上に設けられた一及び他の電子部品と、前記第1及び第2導電性ランドの周縁部の少なくとも一部分をそれぞれ被覆し、かつ、前記第1及び第2導電性ランドの他の部分をそれぞれ開放し、前記第1及び第2導電性ランド以外における前記絶縁性基板に固定された非導体シートと、この非導体シートの前記第1及び第2導電性ランドを開放する部分において、前記第1導電性ランドと前記一の電子部品とを電気的に接続するとともに、前記第2導電性ランドと前記他の電子部品に接続されたリード線とを電気的に接続する接続手段とを備えたものである。   According to a second aspect of the present invention, there is provided an electronic component device comprising: an insulating substrate; first and second conductive lands provided on the insulating substrate; and one and other electrons provided on the insulating substrate. Covering the component and at least a part of the peripheral edge of each of the first and second conductive lands, and opening the other parts of the first and second conductive lands, respectively. A non-conductive sheet fixed to the insulating substrate other than the conductive land, and a portion of the non-conductive sheet that opens the first and second conductive lands, the first conductive land and the one electronic component; And a connecting means for electrically connecting the second conductive land and the lead wire connected to the other electronic component.

請求項3の発明に係る電子部品装置は、絶縁性基板と、この絶縁性基板の一方及び他方の主面側に設けられた一方及び他方の導電性ランドと、前記絶縁性基板に設けられたスルーホールを介して前記一方及び他方の導体ランドを電気的に接続する第1接続手段と、前記一方の導電性ランド上に設けられた電子部品と、前記一方及び他方の導電性ランドの周縁部において少なくとも一部分を被覆し、かつ、前記一方の導電性ランドにおいて他の部分を開放し、前記一方及び他方の導電性ランド以外における前記絶縁性基板に固定された非導体シートと、この非導体シートの前記一方の導電性ランドを開放する部分において前記一方の導電性ランドと前記電子部品とを電気的に接続する接続手段とを備えたものである。   An electronic component device according to a third aspect of the present invention is provided on an insulating substrate, one and other conductive lands provided on one and the other main surface sides of the insulating substrate, and the insulating substrate. A first connecting means for electrically connecting the one and the other conductor lands through a through hole; an electronic component provided on the one conductive land; and a peripheral portion of the one and the other conductive lands A non-conductive sheet that covers at least a portion of the conductive land and opens the other portion of the one conductive land and is fixed to the insulating substrate other than the one and other conductive lands, and the non-conductive sheet And a connecting means for electrically connecting the one conductive land and the electronic component at a portion where the one conductive land is opened.

請求項4の発明に係る電子部品装置の製造方法は、絶縁性基板の主面に導電性ランドを形成する導電性ランド形成工程と、前記導電性ランドの少なくとも周縁部を覆い、前記絶縁性基板上に非導電性シートを形成する非導電性シート形成工程と、前記導電性ランド上に導電性の接続部材を形成する接続部材形成工程と、前記接続部材上に電子部品を配置する電子部品配置工程と、これらの工程後に、加熱処理により前記電子部品を前記接続手段により前記導電性ランドに接続し、同時に前記非導電性シートを前記絶縁性基板に固定する加熱処理工程とを備えたものである。   According to a fourth aspect of the present invention, there is provided a method for manufacturing an electronic component device comprising: a conductive land forming step of forming a conductive land on a main surface of an insulating substrate; and at least a peripheral edge portion of the conductive land. A non-conductive sheet forming step for forming a non-conductive sheet thereon, a connection member forming step for forming a conductive connection member on the conductive land, and an electronic component arrangement for arranging an electronic component on the connection member And a heat treatment step for connecting the electronic component to the conductive land by the connecting means by heat treatment and fixing the non-conductive sheet to the insulating substrate at the same time after the steps. is there.

この発明に係る電子部品装置によれば、エリアアレイ部品と基板との間に装着した非導電シートにより、ソルダーレジスト材などの絶縁層を積層しなくても非導電シートが導体ランドの外周端部と融着するので高融点はんだ材を電気接続手段として使用しても電子部品のはんだ付け時に発生するランド剥離を防止できる効果がある。 According to the electronic component device of the present invention, the non-conductive sheet is mounted between the area array component and the substrate, so that the non-conductive sheet can be formed on the outer peripheral edge of the conductor land without laminating an insulating layer such as solder resist material Therefore, even if a high-melting-point solder material is used as an electrical connection means, there is an effect that it is possible to prevent land peeling that occurs when soldering electronic components.

また、非導電シートを基材の表層と融着させるので、部品実装ランド以外に設けられた貫通スルーホール部(信号線ランド部)をこのシートで封着することにより、スルーホール部から発生する銅や電解めっき材料の残渣を封じ込めることが可能で光学部品搭載基板の品質を向上させることができる。   In addition, since the non-conductive sheet is fused to the surface layer of the base material, the through-through hole portion (signal line land portion) provided in addition to the component mounting land is sealed with this sheet, and is generated from the through-hole portion. It is possible to contain copper and electrolytic plating material residues, and the quality of the optical component mounting substrate can be improved.

また、部品自動実装時の基板搬送工程においてはスルーホール部からの空気漏れがないので真空チャック不良(基板搬送不良)を防止できる。   In addition, since there is no air leakage from the through-hole portion in the board transfer process during automatic component mounting, it is possible to prevent a vacuum chuck failure (substrate transfer failure).

実施例1.
以下、この発明の実施例1について図1を用いて説明する。図1は、BGAを実装した電子部品装置の部分断面図である。図1において、1は絶縁基板(絶縁性基板)であり、1aは表層基板、1bは内層基板である。2は絶縁基板1にパターン形成された導体ランド(導電性ランド 導体ランドパターンとも呼ぶ)もしくは実装パッド(パッド)、3は導体ランド2などからの信号を伝達する信号線(引き出しパターン)であり、3aは表層パターン、3bは内層パターンである。4は信号線3を層間接続するビアであり、4aは貫通ビア、4bは非貫通ビアである。5は表層の信号線3を保護するソルダーレジスト材で構成された絶縁層、6は無鉛(鉛フリー)や共晶のクリームはんだ材などであって、実装する電子部品の電極に対応する絶縁基板1の導体ランド2上に印刷形成した電気接続手段(接続手段)である。
Example 1.
Embodiment 1 of the present invention will be described below with reference to FIG. FIG. 1 is a partial cross-sectional view of an electronic component device mounted with a BGA. In FIG. 1, 1 is an insulating substrate (insulating substrate), 1a is a surface layer substrate, and 1b is an inner layer substrate. 2 is a conductor land (also referred to as a conductive land conductor land pattern) or mounting pad (pad) patterned on the insulating substrate 1, and 3 is a signal line (drawing pattern) for transmitting a signal from the conductor land 2 or the like, 3a is a surface layer pattern, and 3b is an inner layer pattern. Reference numeral 4 denotes a via for connecting the signal lines 3 to each other, 4a is a through via, and 4b is a non-through via. 5 is an insulating layer made of a solder resist material for protecting the signal wire 3 on the surface layer, and 6 is a lead-free (eutectic) or eutectic cream solder material, which is an insulating substrate corresponding to the electrode of the electronic component to be mounted 1 is an electrical connection means (connection means) printed and formed on one conductor land 2.

7は絶縁基板1に設置された非導電性のプリプレグシート(非導電シート 非導体シートとも呼ぶ)であり、7aは周縁を折り曲げたプリプレグシート7の屈曲部を示す。8ははんだ材などの導体で構成されたバンプ(バンプ電極)、9はエリアアレイとしてのBGAであり、通常バンプ電極8と一体化構成されている。10は絶縁基板1上のプリプレグシート7とBGA9との隙間に注入され、BGA9のバンプ電極(はんだバンプ)8領域に充填されたアンダーフィル(充填材)である。   Reference numeral 7 denotes a non-conductive prepreg sheet (also referred to as a non-conductive sheet non-conductive sheet) installed on the insulating substrate 1, and 7 a denotes a bent portion of the prepreg sheet 7 with its peripheral edge bent. 8 is a bump (bump electrode) made of a conductor such as a solder material, and 9 is a BGA as an area array, which is usually integrated with the bump electrode 8. Reference numeral 10 denotes an underfill (filler) that is injected into a gap between the prepreg sheet 7 and the BGA 9 on the insulating substrate 1 and is filled in the bump electrode (solder bump) 8 region of the BGA 9.

なお、プリプレグシート7は平織のガラスクロスにエポキシ樹脂を含浸させ、半硬化状態(Bステージ)にしたものである。このプリプレグシート7は後述するようにシートに加工を施してパンチ穴を設け、シートの周縁に切込みを設けその切込み部をシートの転移温度(Tg)以上で昇温して折り曲げて屈曲部を形成する処理を行い、加えて処理後のシートをBGA9と絶縁基板1との間に装着し、リフロー炉でリフローし、シートと絶縁基板1とを融着するものであるので以下のようなものである。加工品質面では、(1)Bステージのプリプレグシート7のポットライフは保管条件20℃50%RHで3ヶ月程度である。(2)融着させる際、絶縁基板1上にあるビア4などにシートの樹脂の一部が流動したりして付着しないもの。(3)リフロー時のはんだクリーム材による導体ランド2とバンプ電極8の溶着時間より硬化時間(ゲルタイム)が短いもの。以上のような条件から、適用できるプリプレグ材は、例えば松下電工社製プリプレグR-1661や日立化成社製プリプレグGEA−67N等が適当である。   The prepreg sheet 7 is obtained by impregnating a plain woven glass cloth with an epoxy resin to be in a semi-cured state (B stage). As will be described later, this prepreg sheet 7 is processed to provide punch holes, cuts are made in the periphery of the sheet, and the cut part is heated to a temperature higher than the transition temperature (Tg) of the sheet and bent to form a bent part. In addition, the processed sheet is mounted between the BGA 9 and the insulating substrate 1, reflowed in a reflow furnace, and the sheet and the insulating substrate 1 are fused. is there. In terms of processing quality, (1) the pot life of the B stage prepreg sheet 7 is about 3 months under storage conditions of 20 ° C. and 50% RH. (2) A part of the resin of the sheet does not flow or adhere to the via 4 or the like on the insulating substrate 1 when fused. (3) The curing time (gel time) is shorter than the welding time of the conductor land 2 and the bump electrode 8 by the solder cream material during reflow. From the above conditions, suitable prepreg materials are, for example, prepreg R-1661 manufactured by Matsushita Electric Works, prepreg GEA-67N manufactured by Hitachi Chemical.

次に絶縁基板1とBGA9との間隙に装着するプリプレグシート7の加工方法について図2を用いて説明する。図2(a)はプリプレグシート7の部分平面図を示したものである。図2(a)において7bはプリプレグシート7に設けられた貫通穴(加工穴)であり、参考表示した絶縁基板1の導体ランド2のパッド径がφ0.6mmに対してプリプレグシート7側の穴径をφ0.8mmとしたものである。図2(b)は図2(a)で示したプリプレグシート7の加工順序を説明する斜視図であり、プリプレグシート7は穴加工後、周縁を折り曲げ屈曲部7aを形成する。   Next, a processing method of the prepreg sheet 7 mounted in the gap between the insulating substrate 1 and the BGA 9 will be described with reference to FIG. FIG. 2A shows a partial plan view of the prepreg sheet 7. In FIG. 2 (a), 7b is a through hole (processed hole) provided in the prepreg sheet 7, and the hole on the prepreg sheet 7 side with respect to the pad diameter of the conductor land 2 of the insulating substrate 1 shown as reference is φ0.6 mm. The diameter is 0.8 mm. FIG. 2B is a perspective view for explaining the processing order of the prepreg sheet 7 shown in FIG. 2A, and the prepreg sheet 7 is bent to form a bent portion 7a after drilling.

BGA9のバンプ電極8のそれぞれに対応する導体ランド2の周囲にプリプレグシート7を装着するが、BGA9のバンプ電極8や絶縁基板1の導体ランド2がプリプレグシート7で隠れてしまわないように、プリプレグシート7にあらかじめパンチ穴(加工穴)7bをあける。パンチ穴7bのサイズは導体ランド2の直径プラス0.2mm程度を目安とする。例えば図2で示すように導体ランド2のサイズが0.6mmで、BGA9のバンプ電極8のピッチが1.0mmの場合孔径は0.8mmとなる。   The prepreg sheet 7 is mounted around the conductor land 2 corresponding to each of the bump electrodes 8 of the BGA 9, but the prepreg sheet 7 is not covered with the prepreg sheet 7 so that the bump electrode 8 of the BGA 9 and the conductor land 2 of the insulating substrate 1 are not hidden. A punch hole (processed hole) 7b is formed in the sheet 7 in advance. The size of the punch hole 7b is about the diameter of the conductor land 2 plus about 0.2 mm. For example, as shown in FIG. 2, when the size of the conductor land 2 is 0.6 mm and the pitch of the bump electrodes 8 of the BGA 9 is 1.0 mm, the hole diameter is 0.8 mm.

プリプレグシート7の厚みに関しては、BGA9と絶縁基板1との間の絶縁基板1側に装着し、その後アンダーフィル10を充填するので、プリプレグシート7の厚さが厚すぎるとBGA9と絶縁基板1との間隔が狭くなり、アンダーフィル10の充填が困難になる。またプリプレグシート7をリフローで絶縁基板1と融着(接着)させるが、プリプレグシート7の厚みが0.1mmを超えるとプリプレグ中のガラスクロスのたわみが大きくなるので絶縁基板1との密着性が弱くなる。そのためプリプレグシート7の厚さは0.1mm以下とし、好ましくは0.06mm以下にすることが好ましい。   Regarding the thickness of the prepreg sheet 7, since it is mounted on the insulating substrate 1 side between the BGA 9 and the insulating substrate 1 and then filled with the underfill 10, if the thickness of the prepreg sheet 7 is too thick, the BGA 9 and the insulating substrate 1 And the underfill 10 is difficult to be filled. Further, the prepreg sheet 7 is fused (adhered) to the insulating substrate 1 by reflow. However, if the thickness of the prepreg sheet 7 exceeds 0.1 mm, the deflection of the glass cloth in the prepreg increases, so that the adhesion to the insulating substrate 1 is improved. become weak. Therefore, the thickness of the prepreg sheet 7 is 0.1 mm or less, preferably 0.06 mm or less.

プリプレグシート7のサイズは、折り曲げたときのトレイ状の高さが実装するBGA9の高さと略同一となるようにする。よってプリプレグシート7の一辺の長さは、実装するBGA9の一辺の長さとBGA9のバンプ電極8を含めた高さの和に3mm程度の余裕を持たせた長さとする。   The size of the prepreg sheet 7 is set so that the height of the tray shape when folded is substantially the same as the height of the BGA 9 to be mounted. Therefore, the length of one side of the prepreg sheet 7 is set to a length having a margin of about 3 mm in the sum of the length of one side of the BGA 9 to be mounted and the height including the bump electrode 8 of the BGA 9.

折り曲げにあたっては所望の周縁領域の折り曲げ線(折り曲げ位置)に沿って切り溝を入れ、折り曲げ線が交差した端部の不要領域は切り取り、その後プリプレグシート7の折り曲げ線に沿って局部的に加熱し周縁を屈曲させる。互いに直交する屈曲部7aの交差部は熱硬化性樹脂で適宜接着し、枠を形成する。この局部加熱は、スポット径が約100μm程度の赤外線加熱器で300℃前後の温度を熱放射する。また人的には簡単な熱板(棒)を用いて手動で加熱しながら折り曲げても良い。このプリプレグシート7の周縁はアンダーフィル10を堰きとめることが目的なのでアンダーフィル10が低粘度の場合にはプリプレグシート7の屈曲部7aはプリプレグシート7の平面に対して直立させることが好ましいが高粘度のチクソ性を有するものであればこの限りではない。   In folding, a kerf is formed along a fold line (folding position) in a desired peripheral area, an unnecessary area at an end where the fold line intersects is cut off, and then heated locally along the fold line of the prepreg sheet 7. Bend the periphery. The intersecting portions of the bent portions 7a orthogonal to each other are appropriately bonded with a thermosetting resin to form a frame. In this local heating, a temperature of about 300 ° C. is radiated by an infrared heater having a spot diameter of about 100 μm. Alternatively, it may be bent while being heated manually using a simple hot plate (bar). Since the peripheral edge of the prepreg sheet 7 is intended to dam the underfill 10, it is preferable that the bent portion 7a of the prepreg sheet 7 is upright with respect to the plane of the prepreg sheet 7 when the underfill 10 has a low viscosity. This does not apply as long as it has thixotropic viscosity.

次にBGA9を実装する基材(基板、プリント配線板とも呼ぶ場合がある)の形成方法について図1及び図3図を用いて説明する。図1に示すようにガラス布基材エポキシ樹脂を用いた外層(表層)基板1a及び内層基板1bのそれぞれに予め形成された銅箔を所望のマスクパターンを用いて写真製版により露光・現像・エッチングする。すなわち、図3に示すようにBGA9のバンプ電極8の位置に対応する導体ランド2及び導体ランド2に電気的に接続する信号線(引き出しパターン)3や貫通ビア4a及び非貫通ビア4bの引き出しパターン3a、3bを形成する。その後、外層基板1aと内層基板1bとを積層し、所定位置に対して穴加工を行い、ニッケル(Ni)や金(Au)材を用いて無電解めっきや電解めっきを施す。なお、穴加工は積層前の前処理段階で実施しても良い。   Next, a method for forming a base material (also referred to as a substrate or a printed wiring board) on which BGA 9 is mounted will be described with reference to FIGS. As shown in FIG. 1, a copper foil previously formed on each of an outer layer (surface layer) substrate 1a and an inner layer substrate 1b using a glass cloth base epoxy resin is exposed, developed and etched by photolithography using a desired mask pattern. To do. That is, as shown in FIG. 3, the conductor land 2 corresponding to the position of the bump electrode 8 of the BGA 9 and the signal line (drawer pattern) 3 electrically connected to the conductor land 2 and the lead pattern of the through via 4a and the non-through via 4b. 3a and 3b are formed. Thereafter, the outer layer substrate 1a and the inner layer substrate 1b are laminated, a hole is drilled at a predetermined position, and electroless plating or electrolytic plating is performed using a nickel (Ni) or gold (Au) material. In addition, you may implement a hole process in the pre-processing stage before lamination | stacking.

次に上記プリント配線板を用いた電子部品装置の組み立て(製造順序)について図4〜図9を用いて説明する。図4に示すように、プリント配線板上のBGA9のバンプ電極8に対応する導体ランド2の周囲に導体ランド2を囲むようにソルダーレジスト材を用いてスクリーン印刷し所望の絶縁層5のパターンを形成する。もしくは全面印刷後写真製版技術で絶縁層5を形成しても良い。   Next, the assembly (manufacturing order) of the electronic component device using the printed wiring board will be described with reference to FIGS. As shown in FIG. 4, the pattern of a desired insulating layer 5 is formed by screen printing using a solder resist material so as to surround the conductor land 2 around the conductor land 2 corresponding to the bump electrode 8 of the BGA 9 on the printed wiring board. Form. Alternatively, the insulating layer 5 may be formed by photolithography after full surface printing.

次に導体ランド2上にクリームはんだ6をスクリーン印刷する。次に図5及び図6に示すように、プリプレグシート7を絶縁基板1のBGA9搭載領域の導体ランド2側に設置する。その際、各々の導体ランド2がプリプレグシート7の加工穴7bから完全に露出するように位置合わせする。位置決めは人的位置合わせでも良いが、あらかじめ絶縁基板1やプリプレグシート7の端部などに同径の基準穴を設け、位置決めピンを用いて位置合わせする。絶縁基板1とプリプレグシート7との固定にはプリプレグシート7の周縁部を除く平面4隅を利用して接着剤等を塗布し仮固定する。   Next, the cream solder 6 is screen-printed on the conductor land 2. Next, as shown in FIGS. 5 and 6, the prepreg sheet 7 is installed on the conductor land 2 side of the BGA 9 mounting region of the insulating substrate 1. At that time, each conductor land 2 is aligned so as to be completely exposed from the processed hole 7 b of the prepreg sheet 7. Positioning may be performed by human positioning, but a reference hole having the same diameter is provided in advance at the end of the insulating substrate 1 or the prepreg sheet 7 and the positioning is performed using positioning pins. For fixing the insulating substrate 1 and the prepreg sheet 7, an adhesive or the like is applied and temporarily fixed using four corners of the prepreg sheet 7 excluding the peripheral edge.

その後プリプレグシート7が仮固定された絶縁基板1をチップマウンタなどの部品実装装置(自装機)にセットし、図7に示すようにBGA9を絶縁基板1の表面に実装する。   Thereafter, the insulating substrate 1 on which the prepreg sheet 7 is temporarily fixed is set in a component mounting apparatus (self-mounting machine) such as a chip mounter, and the BGA 9 is mounted on the surface of the insulating substrate 1 as shown in FIG.

次にBGA9を含む表面実装部品を自装後、設定温度が240℃前後のリフロー炉で表面実装部品の通常のリフロー温度条件でリフローはんだ付けを行い、電子部品と絶縁基板1の導体ランド2との電気接続をクリームはんだ6を介して行う。同時にプリプレグシート7も基材の転移温度よりも高い温度で加熱されるので絶縁基板1とプリプレグシート7の接着は強固になり、完全接着状態となりプリプレグシート7も硬化し、Aステージ(硬化)状態となる。   Next, after self-mounting the surface mount component including the BGA 9, reflow soldering is performed under a normal reflow temperature condition of the surface mount component in a reflow furnace whose set temperature is around 240 ° C., and the electronic component and the conductor land 2 of the insulating substrate 1 Are connected via cream solder 6. At the same time, since the prepreg sheet 7 is also heated at a temperature higher than the transition temperature of the base material, the adhesion between the insulating substrate 1 and the prepreg sheet 7 becomes strong, becomes a completely bonded state, and the prepreg sheet 7 is cured, and is in an A stage (cured) state. It becomes.

次にアンダーフィル6の塗布方法について説明する。図8は、BGA9を実装した電子部品装置の部分断面図であり、図1と同一である。アンダーフィル10は、BGA9の搭載領域外側に設けられたトレイ状の屈曲部7aの屈曲していない周縁の一端からプリプレグシート7とBGA9との隙間に注入され、プリプレグシート7の貫通穴7bにも充填され、プリプレグシート7の屈曲部7aで堰きとめられる構成となっている。   Next, a method for applying the underfill 6 will be described. FIG. 8 is a partial cross-sectional view of the electronic component device on which the BGA 9 is mounted, and is the same as FIG. The underfill 10 is injected into the gap between the prepreg sheet 7 and the BGA 9 from one end of the unbent peripheral edge of the tray-like bent portion 7 a provided outside the BGA 9 mounting region, and also into the through hole 7 b of the prepreg sheet 7. The prepreg sheet 7 is filled and dammed by the bent portion 7a.

図9はアンダーフィル10を注入する方法を説明する図である。図9においてアンダーフィル10をあらかじめ収納したディスペンサ100からアンダーフィル10をBGA9のバンプ電極8の領域に充填する際には図に示すように基材(プリント配線板)を傾斜させてアンダーフィル10を注入する。この角度(θ)は水平面に対して15〜75度が好ましい。また基材はアンダーフィル10の特性に応じて加熱しながら充填することが好ましい。加熱が足りない場合アンダーフィル10の流動性が悪く、加熱しすぎるとアンダーフィル10の反応が進み硬化時間が早くなり、大型のBGA部品では充填可能領域が狭くなるので45〜55℃の環境温度と基板温度で管理することが望ましい。なお、図1乃至図9中、同一符号は同一又は相当部分を示す。   FIG. 9 is a diagram for explaining a method of injecting the underfill 10. In FIG. 9, when filling the underfill 10 into the area of the bump electrode 8 of the BGA 9 from the dispenser 100 in which the underfill 10 is stored in advance, the substrate (printed wiring board) is inclined as shown in FIG. inject. This angle (θ) is preferably 15 to 75 degrees with respect to the horizontal plane. Further, it is preferable to fill the substrate while heating according to the characteristics of the underfill 10. If underheating is insufficient, the fluidity of the underfill 10 is poor. If it is heated too much, the reaction of the underfill 10 proceeds and the curing time is accelerated, and the fillable area is narrowed for large BGA parts, so the ambient temperature is 45 to 55 ° C. It is desirable to manage with the substrate temperature. 1 to 9, the same reference numerals denote the same or corresponding parts.

アンダーフィル10の充填が進行するにつれて、BGA9の周囲からアンダーフィル10は流出するが、BGA9の周囲に設けられたトレイ状に折り曲げられたプリプレグシート7の周縁部によりアンダーフィル10は堰塞される。 As the filling of the underfill 10 proceeds, the underfill 10 flows out from the periphery of the BGA 9, but the underfill 10 is blocked by the peripheral edge portion of the prepreg sheet 7 bent in a tray shape provided around the BGA 9. .

以上からBGA9の導体ランド2周囲にあるビア4や引き出しパターン3は、プリプレグシート7を装着していない場合にはアンダーフィル10の塗布領域平面に露出しており、そのためアンダーフィル10の流れを妨げるが、プリプレグシート7を装着することによりBGA9の搭載領域全体にわたる平滑性が得られ、広範囲にアンダーフィル10を注入することが可能となる効果がある。 As described above, the via 4 and the lead pattern 3 around the conductor land 2 of the BGA 9 are exposed to the plane of the application region of the underfill 10 when the prepreg sheet 7 is not attached, and thus the flow of the underfill 10 is obstructed. However, by mounting the prepreg sheet 7, smoothness over the entire mounting area of the BGA 9 can be obtained, and the underfill 10 can be injected over a wide range.

またビア4がプリプレグシート7により覆われるので導体ランド2の周囲にあるビア4から基板の裏面側へのアンダーフィル10が流出することも防ぐことができ、ビア4を塞ぐためのマスキングを施す工程が不要になると言う利点もある。 Further, since the via 4 is covered with the prepreg sheet 7, it is possible to prevent the underfill 10 from flowing out from the via 4 around the conductor land 2 to the back side of the substrate, and to perform masking for closing the via 4. There is also an advantage that is no longer necessary.

実施例2.
実施例1では絶縁基板1上に搭載するBGA9について説明を行なったが、実施例2ではBGA9とBGA9以外の電子部品とを同時に搭載する場合について図10を用いて説明する。図10はBGA9と他の電子部品とを同一基材に搭載する電子部品装置の実装模式図である。図10において、70はBGA9の搭載領域の基材上に融着するプリプレグシート、71はBGA以外の電子部品搭載領域の基材上に融着するプリプレグシート、72は絶縁基板1の裏面(S面)側の基材上に融着するプリプレグシート、110は電子回路の入出力用のコネクタ、120は基材に搭載されたディスクリートの抵抗器、120aは抵抗器120の電極(リード電極)、130は表面実装されたコンデンサ、130aはコンデンサ130の電極(チップ電極)である。なお、図中、図1と同一符号は同一又は相当部分を示す。
Example 2
In the first embodiment, the BGA 9 mounted on the insulating substrate 1 has been described. In the second embodiment, the case where the BGA 9 and electronic components other than the BGA 9 are simultaneously mounted will be described with reference to FIG. FIG. 10 is a mounting schematic diagram of an electronic component device in which the BGA 9 and other electronic components are mounted on the same substrate. In FIG. 10, 70 is a prepreg sheet fused on the base material in the BGA 9 mounting area, 71 is a prepreg sheet fused on the base material in the electronic component mounting area other than the BGA, and 72 is the back surface of the insulating substrate 1 (S Prepreg sheet to be fused on the surface) side substrate, 110 is an input / output connector for an electronic circuit, 120 is a discrete resistor mounted on the substrate, 120a is an electrode (lead electrode) of the resistor 120, 130 is a surface-mounted capacitor, and 130a is an electrode (chip electrode) of the capacitor 130. In the figure, the same reference numerals as those in FIG. 1 denote the same or corresponding parts.

図11は図10に示した実装模式図のBGA9搭載領域側の基材のX−X’領域の部分断面図であり、70bはプリプレグシート70に設けられた貫通穴(加工穴)である。図中、図1及び図10と同一符号は同一又は相当部分を示す。   11 is a partial cross-sectional view of the X-X ′ region of the base material on the BGA 9 mounting region side of the mounting schematic diagram shown in FIG. 10, and 70 b is a through hole (working hole) provided in the prepreg sheet 70. In the figure, the same reference numerals as those in FIGS. 1 and 10 denote the same or corresponding parts.

図12は図10に示した実装模式図のBGA9以外の電子部品搭載側の電子部品装置のX−X’領域の部分断面図であり、抵抗器120のリード電極120aは絶縁基板1を貫通して設置されている。又コンデンサ130のチップ電極130aは絶縁基板1の表層に表面実装される。図中、図1及び図10と同一符号は同一又は相当部分を示す。   FIG. 12 is a partial cross-sectional view of the electronic component device on the electronic component mounting side other than the BGA 9 in the mounting schematic diagram shown in FIG. 10, and the lead electrode 120 a of the resistor 120 penetrates the insulating substrate 1. Installed. The chip electrode 130 a of the capacitor 130 is surface-mounted on the surface layer of the insulating substrate 1. In the figure, the same reference numerals as those in FIGS. 1 and 10 denote the same or corresponding parts.

実施例1と異なる大きな点は、実施例1の図5においては絶縁層5を設けたが実施例2では絶縁層5を設けていない点で異なる。又、加工穴70bは実施例1とは異なり、絶縁基板1の導体ランド2の外周端部覆うように設置することにより、プリプレグシート70と導体ランド2の一部パターンとを融着させる構成とする。   The major difference from the first embodiment is that the insulating layer 5 is provided in FIG. 5 of the first embodiment, but the insulating layer 5 is not provided in the second embodiment. Further, unlike the first embodiment, the processing hole 70b is installed so as to cover the outer peripheral end portion of the conductor land 2 of the insulating substrate 1 so that the prepreg sheet 70 and a partial pattern of the conductor land 2 are fused. To do.

すなわち、図13(a)に示すように絶縁基板1の表裏を貫通して電子部品のリード電極を挿入する場合、リード電極径が0.5mmでは、導体ランド2の穴径を0.7mmとし、プリプレグシートに設けられた中空の穴径0.85mmより大きな導体ランド2の外形とする。又、図13(b)に示すように絶縁基板1の表面に電子部品のチップ電極を取り付ける場合、少なくとも導体ランド2の外周端部の一部を覆うようにプリプレグシートが位置するようにプリプレグシートを位置決めして載置する。同時に導体ランド2パターン内に設置された電気接続手段領域からは外れた領域にプリプレグシートの中空部があるように載置する。   That is, when the lead electrode of the electronic component is inserted through the front and back of the insulating substrate 1 as shown in FIG. 13A, if the lead electrode diameter is 0.5 mm, the hole diameter of the conductor land 2 is 0.7 mm. The outer shape of the conductor land 2 is larger than the hollow hole diameter of 0.85 mm provided in the prepreg sheet. Further, as shown in FIG. 13B, when mounting the chip electrode of the electronic component on the surface of the insulating substrate 1, the prepreg sheet is positioned so that at least a part of the outer peripheral end of the conductor land 2 is covered. Is positioned and placed. At the same time, the prepreg sheet is placed so that the hollow portion of the prepreg sheet is located in a region deviated from the electrical connection means region installed in the conductor land 2 pattern.

次に絶縁基板1の両面にプリプレグシート70、71、72を載置し融着させるので、プリプレグシート71、72部分の固定方法について詳述する。   Next, since the prepreg sheets 70, 71, 72 are placed and fused on both surfaces of the insulating substrate 1, a method for fixing the prepreg sheets 71, 72 will be described in detail.

まず、パンチ穴加工されたプリプレグシート71、72に図14に示す参考図の層構成のように重ね合わせる。プリプレグシート71、72の外側に例えば厚さ50〜75μmの離型フィルム(旭ガラス社製のアフレックス等テトラフルオロエチレン、エチレン共重合体)を重ね、その上部にクッション材として厚さが100μmの耐熱紙を3枚程度重ね合せる。   First, the prepreg sheets 71 and 72 that have been punched are overlaid as shown in the reference diagram of FIG. On the outside of the prepreg sheets 71 and 72, for example, a release film having a thickness of 50 to 75 μm is stacked (tetrafluoroethylene such as Aflex manufactured by Asahi Glass Co., Ltd.) and a thickness of 100 μm as a cushioning material on the upper part. Overlay about 3 sheets of heat-resistant paper.

絶縁基板1の導電ランド2とプリプレグシート71、72との位置合わせは予め絶縁基板1とプリプレグシート71、72の層構成単位に同一径の穴を設けておき、位置合わせ用のピンを用いて、絶縁基板1とプリプレグシート71、72との層構成単位で位置合わせを行う。位置合わせ後に絶縁基板1とプリプレグシート71、72の周縁の離型フィルムと耐熱紙とを設置した領域にポリイミドテープを用いて基材の側面を介して両面で固定する。次に、温度130〜150℃、圧力10kg/cmで30分程度熱圧着を行い、絶縁基板1とプリプレグシート71、72とを貼りつける。貼り付け後、位置合わせ用のピンを抜き、離型フィルムなどを剥がす。次にクリームはんだ6を印刷し、BGA9や表面実装用の電子部品を自装機で絶縁基板1上に実装し、実施例1同様のリフローを行う。その後、挿入タイプの電子部品のリード電極をスルーホールに挿入し、フローはんだ付けや手はんだ付けを行う。 The alignment between the conductive land 2 of the insulating substrate 1 and the prepreg sheets 71 and 72 is made in advance by providing holes of the same diameter in the layer constituent units of the insulating substrate 1 and the prepreg sheets 71 and 72, and using alignment pins. Alignment is performed in units of layer constitution between the insulating substrate 1 and the prepreg sheets 71 and 72. After alignment, the insulating substrate 1 and the release film on the periphery of the prepreg sheets 71 and 72 and the heat-resistant paper are fixed on both sides via the side surface of the base material using polyimide tape. Next, thermocompression bonding is performed at a temperature of 130 to 150 ° C. and a pressure of 10 kg / cm 2 for about 30 minutes, and the insulating substrate 1 and the prepreg sheets 71 and 72 are attached. After pasting, remove the alignment pin and peel off the release film. Next, the cream solder 6 is printed, and the BGA 9 and the electronic components for surface mounting are mounted on the insulating substrate 1 by the self-mounting machine, and reflow similar to that of the first embodiment is performed. Thereafter, the lead electrode of the insertion type electronic component is inserted into the through hole, and flow soldering or manual soldering is performed.

以上から実施例1で説明した絶縁層5に替えてプリプレグシート71、72を絶縁基板1の両面に設置することによりBGA9両域のみならずBGA9以外の電子部品設置領域にある貫通ビア4aや非貫通ビア4bもプリプレグシート71、72により覆われるので導体ランド2の周囲にある貫通ビア4aから絶縁基板1のS面側へのアンダーフィル10が流出することを防ぐ効果がある。   From the above, by replacing the insulating layer 5 described in the first embodiment with the prepreg sheets 71 and 72 on both surfaces of the insulating substrate 1, not only through the BGA 9 but also through vias 4a in the electronic component installation area other than the BGA 9 Since the through via 4 b is also covered with the prepreg sheets 71 and 72, there is an effect of preventing the underfill 10 from flowing out from the through via 4 a around the conductor land 2 to the S surface side of the insulating substrate 1.

また、実施例1ではBGA9搭載領域に設けたプリプレグシート7は周縁部分に屈曲部7aを設けたが、屈曲部7aを通常の平坦なプリプレグシートとすることにより、プリプレグシート70は実施例1で説明したソルダーレジスト材で構成された絶縁層5の代替となる。またプリプレグシート70の表面は樹脂を固化させたソルダーレジスト材で構成した絶縁層5表面より平滑性が高いのでBGA9搭載領域にアンダーフィル10を塗布する場合でも容易に注入可能である。   In the first embodiment, the prepreg sheet 7 provided in the BGA 9 mounting region has the bent portion 7a at the peripheral portion. However, the prepreg sheet 70 in the first embodiment is formed by using the bent portion 7a as a normal flat prepreg sheet. It becomes an alternative to the insulating layer 5 made of the solder resist material described. Further, since the surface of the prepreg sheet 70 has higher smoothness than the surface of the insulating layer 5 made of a solder resist material obtained by solidifying a resin, it can be easily injected even when the underfill 10 is applied to the BGA 9 mounting region.

すなわち、実施例1で示した絶縁層5の配置パターンと同一の配置パターンをプリプレグのシート70で構成し、絶縁層5では覆うことが不可能であった貫通ビア4aや非貫通ビア4bの穴(スルーホール穴)をプリプレグのシートで覆うことにより、短絡を含む絶縁耐圧の向上や信号線(配線パターン)などの腐食防止のために用いる絶縁層5の印刷又は写真製版による30〜50μm程の厚みの積層工程が省略できると共に自装機による電子部品装置の搬送時の吸着工程(真空チャック)にあっては貫通ビア4aからの空気漏れによる吸着不良を改善でき、且つ貫通ビア4aや非貫通ビア4b内の無電解めっきや電解めっき工程で生じた導電性の残渣を完全に絶縁基板1の内部に封じ込め導電物質の飛散による短絡不良を防止できる効果がある。   In other words, the same arrangement pattern as that of the insulating layer 5 shown in the first embodiment is configured by the prepreg sheet 70, and the holes of the through via 4a and the non-through via 4b that cannot be covered by the insulating layer 5 are used. By covering the (through-hole hole) with a prepreg sheet, the insulation layer 5 used for improving the dielectric strength including short-circuiting and preventing corrosion of signal lines (wiring patterns) or the like, by printing or photoengraving about 30-50 μm The thickness stacking process can be omitted, and in the suction process (vacuum chuck) when the electronic component device is transported by the self-mounting machine, the suction failure due to air leakage from the through via 4a can be improved, and the through via 4a or non-through The effect that the conductive residue generated in the electroless plating or electrolytic plating process in the via 4b is completely enclosed in the insulating substrate 1 and the short circuit failure due to the scattering of the conductive material can be prevented. A.

実施例3.
実施例2ではBGA9とBGA9以外の電子部品とを搭載する領域のプリプレグシート70とプリプレグシート71、72とは分離されたものであった。実施例3では実装する電子部品の全領域に亘って一体化形成したプリプレグシートについて図15を用いて説明する。図15は一体化されたプリプレグシートの平面図であり、73は一体化されたプリプレグシート(非導電シート)、73aはプリプレグシート73の屈曲部、73bはプリプレグシート73に設けられた絶縁基板1の導体ランド2に対応する加工穴、73cは表層(表面)部品はんだ付けリード穴、73dは表面実装部品搭載穴、73eは背面(S面)部品はんだ付けリード穴、73fは背面(S面)実装部品搭載穴、73gはコネクタ搭載用の導体ランド2に対応する加工穴である。
Example 3
In Example 2, the prepreg sheet 70 and the prepreg sheets 71 and 72 in the area where the BGA 9 and the electronic components other than the BGA 9 are mounted are separated. In Example 3, a prepreg sheet integrally formed over the entire area of the electronic component to be mounted will be described with reference to FIG. FIG. 15 is a plan view of the integrated prepreg sheet, 73 is an integrated prepreg sheet (non-conductive sheet), 73 a is a bent portion of the prepreg sheet 73, and 73 b is an insulating substrate 1 provided on the prepreg sheet 73. Machining hole corresponding to the conductor land 2, 73 c is a surface layer (surface) component soldering lead hole, 73 d is a surface mounting component mounting hole, 73 e is a back surface (S surface) component soldering lead hole, and 73 f is a back surface (S surface). The mounting component mounting hole 73g is a processing hole corresponding to the conductor land 2 for mounting the connector.

次にプリプレグシート73に設置された加工穴73b〜73gの構成について説明する。加工穴73bは図1で示すBGA9のバンプ電極8に対応する穴であり、導体ランド2の外周端部を覆う。加工穴73cは抵抗器120などのリード電極120aを絶縁基板1の表層で導体ランド2に電気接続手段で取り付ける場合の導体ランド2の外周端部を覆う。加工穴73dは抵抗器やコンデンサ130などのチップ部品を表層に搭載する場合の矩形穴であり、チップ電極130aなどは絶縁基板1の表層で導体ランド2に電気接続手段で取り付けられ、加工穴73dは導体ランド2の外周端部を覆う。   Next, the structure of the processing holes 73b to 73g installed in the prepreg sheet 73 will be described. The processing hole 73 b is a hole corresponding to the bump electrode 8 of the BGA 9 shown in FIG. 1 and covers the outer peripheral end of the conductor land 2. The processing hole 73c covers an outer peripheral end portion of the conductor land 2 when the lead electrode 120a such as the resistor 120 is attached to the conductor land 2 on the surface layer of the insulating substrate 1 by electrical connection means. The processing hole 73d is a rectangular hole when chip components such as a resistor and a capacitor 130 are mounted on the surface layer, and the chip electrode 130a and the like are attached to the conductor land 2 on the surface layer of the insulating substrate 1 by electrical connection means. Covers the outer peripheral edge of the conductor land 2.

加工穴73eは抵抗器120などのリード電極120aを絶縁基板1のS面表層で導体ランド2に電気接続手段で取り付ける場合の導体ランド2の外周端部を覆う。加工穴73fは抵抗器120やコンデンサ130などのチップ部品をS面表層に搭載する場合の矩形穴であり、チップ電極130aなどは絶縁基板1のS面表層で導体ランド2に電気接続手段で取り付けられ、加工穴73fは導体ランド2の外周端部を覆う。加工穴73gはコネクタ110の端子(図示せず)を貫通させ、コネクタ110の端子と電気接続する導体ランド2の外周端部を覆う。加えて、加工穴73hは部品リード挿入穴であり、挿入位置に導体ランド2が設けられる場合には導体ランド2の外周端部を覆う。なお、絶縁基板1の表層に露出した内層回路接続用のスルーホールはすべてプリプレグシート73で覆われる。   The processing hole 73e covers the outer peripheral end portion of the conductor land 2 when the lead electrode 120a such as the resistor 120 is attached to the conductor land 2 by the electric connection means on the surface of the S surface of the insulating substrate 1. The processing hole 73f is a rectangular hole when chip components such as the resistor 120 and the capacitor 130 are mounted on the surface of the S surface, and the chip electrode 130a and the like are attached to the conductor land 2 on the S surface surface of the insulating substrate 1 by electrical connection means. The processed hole 73 f covers the outer peripheral end of the conductor land 2. The processing hole 73g penetrates a terminal (not shown) of the connector 110 and covers the outer peripheral end of the conductor land 2 that is electrically connected to the terminal of the connector 110. In addition, the processing hole 73h is a component lead insertion hole, and covers the outer peripheral end of the conductor land 2 when the conductor land 2 is provided at the insertion position. Note that all the through holes for connecting the inner layer circuit exposed on the surface layer of the insulating substrate 1 are covered with the prepreg sheet 73.

なお、図15においてはプリプレグシート73の屈曲部73aは折り曲げてアンダーフィル10の流れ止めとするが、アンダーフィル10がチクソ性を有するものであれば、屈曲部73aは形成されなくとも良い。   In FIG. 15, the bent portion 73a of the prepreg sheet 73 is bent to prevent the underfill 10 from flowing. However, if the underfill 10 has thixotropy, the bent portion 73a may not be formed.

以上からプリプレグシート73を一体化構成し、絶縁基板1の表層に融着させることにより、ソルダーレジストなどによる絶縁層5の代替として使用できるので、実施例2で示した効果の他にプリプレグシートの部品数の削減を図ることができる。
なお、実施例1乃至3においては非導電シートとしてBステージのプリプレグシートを使用したが、ソルダーレジストフィルムやポリミドフィルムを穴あけ加工して絶縁基板1と熱圧着しても相応の効果がある。
From the above, the prepreg sheet 73 is integrated and fused to the surface layer of the insulating substrate 1 so that it can be used as an alternative to the insulating layer 5 using a solder resist or the like. The number of parts can be reduced.
In Examples 1 to 3, a B-stage prepreg sheet was used as the non-conductive sheet. However, even if a solder resist film or a polyimide film is punched and thermocompression bonded to the insulating substrate 1, there is a corresponding effect.

この発明の実施例1によるBGAを実装した電子部品装置の部分断面図である。It is a fragmentary sectional view of the electronic component apparatus which mounted BGA by Example 1 of this invention. この発明の実施例1による電子部品装置のプリプレグシートの加工方法について説明する図であり、図2(a)はプリプレグシートの平面図、図2(b)は加工順序を示す。It is a figure explaining the processing method of the prepreg sheet | seat of the electronic component apparatus by Example 1 of this invention, Fig.2 (a) is a top view of a prepreg sheet | seat, FIG.2 (b) shows a process order. この発明の実施例1による電子部品装置の導電ランドや信号線の模式パターン図である。FIG. 3 is a schematic pattern diagram of conductive lands and signal lines of the electronic component device according to Embodiment 1 of the present invention. この発明の実施例1による電子部品装置の組み立て順序を説明する部分断面図である。It is a fragmentary sectional view explaining the assembly order of the electronic component apparatus by Example 1 of this invention. この発明の実施例1による電子部品装置の組み立て順序を説明する部分断面図である。It is a fragmentary sectional view explaining the assembly order of the electronic component apparatus by Example 1 of this invention. この発明の実施例1による電子部品装置の非導電シートの載置方法を説明する斜視図である。It is a perspective view explaining the mounting method of the nonelectroconductive sheet of the electronic component apparatus by Example 1 of this invention. この発明の実施例1による電子部品装置のBGAの搭載方法を説明する斜視図である。It is a perspective view explaining the mounting method of BGA of the electronic component apparatus by Example 1 of this invention. この発明の実施例1による電子部品装置の組み立て順序を説明する部分断面図である。It is a fragmentary sectional view explaining the assembly order of the electronic component apparatus by Example 1 of this invention. この発明の実施例1による電子部品装置のアンダーフィル注入方法を説明する図である。It is a figure explaining the underfill injection | pouring method of the electronic component apparatus by Example 1 of this invention. この発明の実施例2による電子部品装置の実装模式図である。It is the mounting schematic diagram of the electronic component apparatus by Example 2 of this invention. この発明の実施例2による電子部品装置のBGA領域側の部分断面図である。It is a fragmentary sectional view by the side of the BGA area | region of the electronic component apparatus by Example 2 of this invention. この発明の実施例2による電子部品装置のBGA領域を除く電子部品側の部分断面図である。It is a fragmentary sectional view by the side of the electronic component except the BGA area | region of the electronic component apparatus by Example 2 of this invention. この発明の実施例2による電子部品装置の導体ランドとプリプレグシートとの中空部との位置関係を説明する図であり、図13(a)は表裏貫通する実装部品の場合であり、図13(b)は表面実装部品の場合である。It is a figure explaining the positional relationship of the conductor land of the electronic component apparatus by Example 2 of this invention, and the hollow part of a prepreg sheet, Fig.13 (a) is a case of the mounting component which penetrates front and back, FIG.13 ( b) is a case of a surface mount component. この発明の実施例2による非導電シートの貼り付け方法を説明する図である。It is a figure explaining the sticking method of the nonelectroconductive sheet by Example 2 of this invention. この発明の実施例3による非道電シートの平面図である。It is a top view of the non-electricity sheet | seat by Example 3 of this invention.

符号の説明Explanation of symbols

1 絶縁基板、 1a 表層基板、 1b 内層基板、 2 導体ランド(実装パッド)、 3 信号線(引き出しパターン)、 3a 表層パターン、 3b 内層パターン、 4 ビア、 4a 貫通ビア、 4b 非貫通ビア、 5 絶縁層、 6 電気接続手段、 7 非導電シート(プリプレグシート)、 7a 屈曲部、 7b 加工穴(貫通穴)、 8 バンプ電極、 9 BGA(エリアアレイ)、 10 アンダーフィル、 70 非道電シート、 71非道電シート、 72 非導電シート、 73a 屈曲部、 73b〜73h 加工穴(貫通穴)、 100 ディスペンサ、 110 コネクタ、 120 抵抗器、 120a 電極、 130 コンデンサ、 130a 電極。
DESCRIPTION OF SYMBOLS 1 Insulating substrate, 1a Surface layer substrate, 1b Inner layer substrate, 2 Conductor land (mounting pad), 3 Signal line (drawing pattern), 3a Surface layer pattern, 3b Inner layer pattern, 4 Via, 4a Through-via, 4b Non-through via, 5 Insulation Layer, 6 electrical connection means, 7 non-conductive sheet (prepreg sheet), 7a bent portion, 7b processed hole (through hole), 8 bump electrode, 9 BGA (area array), 10 underfill, 70 non-conductive sheet, 71 non-conductive Electrical sheet, 72 Non-conductive sheet, 73a Bending part, 73b-73h Processing hole (through hole), 100 dispenser, 110 connector, 120 resistor, 120a electrode, 130 capacitor, 130a electrode.

Claims (4)

絶縁性基板と、この絶縁性基板上に設けられた導電性ランドと、この導電性ランド上に設けられた電子部品と、前記導電性ランドの周縁部の少なくとも一部分を被覆し、かつ、前記導電性ランドの他の部分を開放し、前記導電性ランド以外における前記絶縁性基板に固定された非導体シートと、この非導体シートの前記導電性ランドを開放する部分において前記導電性ランドと前記電子部品とを電気的に接続する接続手段とを備えた電子部品装置。 An insulating substrate; a conductive land provided on the insulating substrate; an electronic component provided on the conductive land; and covering at least a part of a peripheral portion of the conductive land; The other part of the conductive land is opened, the non-conductive sheet fixed to the insulating substrate other than the conductive land, and the part of the non-conductive sheet that opens the conductive land and the conductive land and the electron An electronic component device comprising connection means for electrically connecting a component. 絶縁性基板と、この絶縁性基板上に設けられた第1及び第2導電性ランドと、前記絶縁性基板上に設けられた一及び他の電子部品と、前記第1及び第2導電性ランドの周縁部の少なくとも一部分をそれぞれ被覆し、かつ、前記第1及び第2導電性ランドの他の部分をそれぞれ開放し、前記第1及び第2導電性ランド以外における前記絶縁性基板に固定された非導体シートと、この非導体シートの前記第1及び第2導電性ランドを開放する部分において、前記第1導電性ランドと前記一の電子部品とを電気的に接続するとともに、前記第2導電性ランドと前記他の電子部品に接続されたリード線とを電気的に接続する接続手段とを備えた電子部品装置。 Insulating substrate, first and second conductive lands provided on the insulating substrate, one and other electronic components provided on the insulating substrate, and the first and second conductive lands Each of the peripheral edges of the first and second conductive lands is covered, and the other portions of the first and second conductive lands are opened and fixed to the insulating substrate other than the first and second conductive lands. The first conductive land and the one electronic component are electrically connected to each other at the portion where the first and second conductive lands of the non-conductive sheet are opened, and the second conductive An electronic component device comprising a connecting means for electrically connecting a conductive land and a lead wire connected to the other electronic component. 絶縁性基板と、この絶縁性基板の一方及び他方の主面側に設けられた一方及び他方の導電性ランドと、前記絶縁性基板に設けられたスルーホールを介して前記一方及び他方の導体ランドを電気的に接続する第1接続手段と、前記一方の導電性ランド上に設けられた電子部品と、前記一方及び他方の導電性ランドの周縁部において少なくとも一部分を被覆し、かつ、前記一方の導電性ランドにおいて他の部分を開放し、前記一方及び他方の導電性ランド以外における前記絶縁性基板に固定された非導体シートと、この非導体シートの前記一方の導電性ランドを開放する部分において前記一方の導電性ランドと前記電子部品とを電気的に接続する接続手段とを備えた電子部品装置。 Insulating substrate, one and other conductive lands provided on one and other main surface sides of the insulating substrate, and the one and other conductor lands via a through hole provided in the insulating substrate A first connecting means for electrically connecting the electronic component, an electronic component provided on the one conductive land, and at least a part of the peripheral edge of the one and the other conductive land, and the one In the conductive land, the other part is opened, and the non-conductive sheet fixed to the insulating substrate other than the one and the other conductive lands, and the one conductive land of the non-conductive sheet are opened. An electronic component device comprising connection means for electrically connecting the one conductive land and the electronic component. 絶縁性基板の主面に導電性ランドを形成する導電性ランド形成工程と、前記導電性ランドの少なくとも周縁部を覆い、前記絶縁性基板上に非導電性シートを形成する非導電性シート形成工程と、前記導電性ランド上に導電性の接続部材を形成する接続部材形成工程と、前記接続部材上に電子部品を配置する電子部品配置工程と、これらの工程後に、加熱処理により前記電子部品を前記接続手段により前記導電性ランドに接続し、同時に前記非導電性シートを前記絶縁性基板に固定する加熱処理工程とを備えた電子部品装置の製造方法。
A conductive land forming step for forming a conductive land on the main surface of the insulating substrate, and a nonconductive sheet forming step for covering at least a peripheral portion of the conductive land and forming a nonconductive sheet on the insulating substrate. A connecting member forming step of forming a conductive connecting member on the conductive land, an electronic component arranging step of arranging an electronic component on the connecting member, and after these steps, the electronic component is heated by heat treatment. A method of manufacturing an electronic component device, comprising: a heat treatment step of connecting to the conductive land by the connecting means and simultaneously fixing the nonconductive sheet to the insulating substrate.
JP2006194253A 2006-07-14 2006-07-14 Electronic component device and its manufacturing method Pending JP2008021916A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2006194253A JP2008021916A (en) 2006-07-14 2006-07-14 Electronic component device and its manufacturing method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006194253A JP2008021916A (en) 2006-07-14 2006-07-14 Electronic component device and its manufacturing method

Publications (1)

Publication Number Publication Date
JP2008021916A true JP2008021916A (en) 2008-01-31

Family

ID=39077651

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006194253A Pending JP2008021916A (en) 2006-07-14 2006-07-14 Electronic component device and its manufacturing method

Country Status (1)

Country Link
JP (1) JP2008021916A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011166096A (en) * 2009-03-06 2011-08-25 Panasonic Corp Surface-mounted device and printed board, and structure for mounting surface-mounted device using them

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011166096A (en) * 2009-03-06 2011-08-25 Panasonic Corp Surface-mounted device and printed board, and structure for mounting surface-mounted device using them

Similar Documents

Publication Publication Date Title
TWI451536B (en) Multi-layer wiring board and method of manufacturing the same
US8110754B2 (en) Multi-layer wiring board and method of manufacturing the same
US6768064B2 (en) Multilayer wiring board assembly, multilayer wiring board assembly component and method of manufacture thereof
JP5113114B2 (en) Wiring board manufacturing method and wiring board
JP5100081B2 (en) Electronic component-mounted multilayer wiring board and manufacturing method thereof
JP5604876B2 (en) Electronic device and manufacturing method thereof
TWI461118B (en) Electronic-component-mounted wiring substrate and method of manufacturing the same
TWI733829B (en) Manufacturing method of multilayer circuit board
TWI777958B (en) Manufacturing method of multilayer circuit board
JP4835629B2 (en) Manufacturing method of semiconductor device
JP2009135391A (en) Electronic device and method of manufacturing the same
KR20080073648A (en) Multilayer wiring board and its manufacturing method
KR20120050834A (en) Method of manufacturing the package board
JP2008021916A (en) Electronic component device and its manufacturing method
JP2007305636A (en) Component packaging module
JP2004327743A (en) Wiring board with solder bumps and method of manufacturing the same
JP2008021915A (en) Electronic component device, and its manufacturing method
JP4161463B2 (en) Chip carrier manufacturing method
JP2005039136A (en) Circuit board and method for connection thereof
JP2015141953A (en) Component built-in wiring board and method for manufacturing the same
JP5095456B2 (en) Manufacturing method of wiring board with built-in components
JP4003556B2 (en) Printed circuit board manufacturing method
KR20120047098A (en) Lead pin for package substrate and semiconductor package printed circuit board and method for manufacturing the same
JP2005109188A (en) Circuit board and multilayer board, and method for manufacturing circuit board and multilayer board
JP3730980B2 (en) Manufacturing method of mounted circuit board

Legal Events

Date Code Title Description
A977 Report on retrieval

Effective date: 20080529

Free format text: JAPANESE INTERMEDIATE CODE: A971007

A131 Notification of reasons for refusal

Effective date: 20080624

Free format text: JAPANESE INTERMEDIATE CODE: A131

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20080725

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20090203

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20090609