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JP2007013048A - Multilayer wiring board manufacturing method - Google Patents

Multilayer wiring board manufacturing method Download PDF

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JP2007013048A
JP2007013048A JP2005195126A JP2005195126A JP2007013048A JP 2007013048 A JP2007013048 A JP 2007013048A JP 2005195126 A JP2005195126 A JP 2005195126A JP 2005195126 A JP2005195126 A JP 2005195126A JP 2007013048 A JP2007013048 A JP 2007013048A
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metal layer
wiring board
layer
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forming
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Eiji Yoshimura
栄二 吉村
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Daiwa Kogyo Co Ltd
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a multilayer wiring board manufacturing method capable of efficiently manufacturing a multilayer wiring board on which all layers are conductively connected by inter-layer connection bodies, capable of preventing laminates from being easily peeled off or turned up from a temporary fitting base material, having a high handling property, and forming guide holes. <P>SOLUTION: The multilayer wiring substrate manufacturing method comprises a process (a) for forming first metallic layers 10 of which the peripheries are partially stuck to both surfaces of the temporary fitting base material CL; a process (b) for forming protection metallic layers 11 composed of metals different from the first metallic layers 10 approximately on the whole surfaces of the first metallic layers 10; a process (c) for successively or repeatedly forming insulating layers 21 having interlayer connection bodies 14a and wiring layers 18 or metallic layers on the protection metallic layers 11, to form wiring substrate precursors BP in which all layers are connected by the interlayer connection bodies 14a; and a process (d) for cutting off the portions to which the first metallic layers 10 are stuck to separate the wiring substrate precursors BP from the temporary fitting base material 1. <P>COPYRIGHT: (C)2007,JPO&INPIT

Description

本発明は、仮着用基材を用いて、その両側にビルドアップで各層を形成して配線基板前駆体を製造する工程を含む多層配線基板の製造方法に関する。   The present invention relates to a method for manufacturing a multilayer wiring board including a step of manufacturing a wiring board precursor by forming each layer by build-up on both sides thereof using a temporary wearing base material.

近年、電子機器等の小形化や高機能化に伴い、電子部品を実装するための多層配線基板に対しても、多層化、薄層化、ファインパターン化等の要求が高まっている。このような高密度の多層配線基板を製造する方法としては、ビルドアップ工法や一括積層法などが知られている。そして、配線層の層数が多い程、後者の一括積層法が有利となると考えられている。   In recent years, with the miniaturization and high functionality of electronic devices and the like, demands for multilayering, thinning, fine patterning, etc. are increasing for multilayer wiring boards for mounting electronic components. As a method for producing such a high-density multilayer wiring board, a build-up method, a batch lamination method, or the like is known. And it is thought that the latter batch lamination method becomes more advantageous as the number of wiring layers increases.

前者のビルドアップ工法には、コアとなる両面配線基板の両面に、絶縁層と配線層とを順次積層形成していく方法や、回路形成した両面配線基板をコアとなる両面配線基板の両面に、更に積層形成していく方法などがある。また、一括積層法には、積層単位(ユニット)が1層の配線層を有するタイプと、2層の配線層(即ち両面配線基板)を有するタイプとがある。   The former build-up method includes a method in which an insulating layer and a wiring layer are sequentially laminated on both sides of a double-sided wiring board that is a core, or a double-sided wiring board that has a circuit formed on both sides of a double-sided wiring board that is a core. Further, there is a method of further forming a laminate. Further, the batch lamination method includes a type in which a lamination unit (unit) has one wiring layer and a type in which two wiring layers (that is, double-sided wiring boards).

一方、何れの方法で多層配線基板を製造する場合にも、上下の配線層間を導電接続する構造が必要となり、導電性ペースト、レーザービア、フィルドビア、メッキバンプなどの層間接続構造が知られている。そして、一括積層法の積層単位としては、絶縁層を貫通してこれらの層間接続構造が形成され、その片面又は両面に配線パターンが形成されたものが、一般に使用される。そして、当該配線パターンは、エッチングなどで形成されており、絶縁層の表面に配線パターンが凸状に形成された形状が一般的である(例えば、非特許文献1参照)。   On the other hand, when manufacturing a multilayer wiring board by any method, a structure for conductive connection between upper and lower wiring layers is required, and interlayer connection structures such as conductive paste, laser via, filled via, and plating bump are known. . And as a lamination | stacking unit of a batch lamination method, what penetrated the insulating layer, these interlayer connection structures were formed, and the wiring pattern was formed in the single side | surface or both surfaces is generally used. And the said wiring pattern is formed by the etching etc., and the shape by which the wiring pattern was convexly formed in the surface of the insulating layer is common (for example, refer nonpatent literature 1).

また、特許文献1には、接続の信頼性の高い層間接続構造を有し、配線パターンの形成面がフラットな配線基板部材、及びその製造方法が開示されている。この製造方法では、鏡面板などの仮着用基材に配線パターン、保護金属層、別の金属層を順次形成した後、金属層をマスクして選択的にエッチングしてバンプを形成し、更に絶縁層形成材を形成してから仮着用基材を除去する方法を採用している。   Patent Document 1 discloses a wiring board member having an interlayer connection structure with high connection reliability and a flat wiring pattern forming surface, and a manufacturing method thereof. In this manufacturing method, after a wiring pattern, a protective metal layer, and another metal layer are sequentially formed on a temporary wearing base material such as a mirror plate, a metal layer is masked and selectively etched to form a bump, and further insulation is performed. A method of removing the temporary wearing substrate after forming the layer forming material is employed.

しかしながら、仮着用基材として鏡面板を使用する場合、配線パターンの下層にメッキで金属層を形成する場合でも、金属層が鏡面板から剥離し易く、後の工程を実施する際に積層物の剥がれやメクレが生じるという問題があった。また、鏡面板では重量が大きいため、各工程におけるハンドリング性が悪くなっていた。更に、鏡面板の存在によって、積層物にドリリングする際に孔開けが困難となるため、位置決めのためのガイド孔を設けることができなかった。   However, when a mirror plate is used as a temporary wearing base material, even when a metal layer is formed by plating on the lower layer of the wiring pattern, the metal layer is easily peeled off from the mirror plate, and when the subsequent process is performed, There was a problem that peeling and mekre occurred. Further, since the mirror plate is heavy, handling properties in each process are poor. Furthermore, the presence of the mirror plate makes it difficult to make a hole when drilling into the laminate, and therefore a guide hole for positioning cannot be provided.

特開2004−221310号公報JP 2004-221310 A 長野県工科短期大学校公開技術講演会(2002年7月24日)テキスト、最新の高性能多層基板技術「一括積層基板技術と高速多層基板技術」Nagano Prefectural Institute of Technology Junior College Open Technology Lecture (July 24, 2002) Text, Latest High-Performance Multi-layer Substrate Technology “Batch Multi-layer Substrate Technology and High-Speed Multi-layer Substrate Technology”

そこで、本発明の目的は、全層が層間接続体で導電接続された多層配線基板を効率良く製造することができ、仮着用基材から積層物の剥がれやメクレが生じにくい多層配線基板の製造方法を提供することにある。   Accordingly, an object of the present invention is to efficiently produce a multilayer wiring board in which all layers are conductively connected by an interlayer connection body, and to produce a multilayer wiring board that is less likely to cause peeling or peeling of a laminate from a temporary wearing base material. It is to provide a method.

上記目的は、下記の如き本発明により達成できる。
即ち、本発明の多層配線基板の製造方法は、仮着用基材の両面に周辺部が部分的に接着された配線基板前駆体を形成する工程、及び前記配線基板前駆体が接着した部分を切除して、前記仮着用基材と前記配線基板前駆体とを分離する工程を含むことを特徴とする。
The above object can be achieved by the present invention as described below.
That is, the method for manufacturing a multilayer wiring board of the present invention includes a step of forming a wiring board precursor in which peripheral portions are partially bonded to both surfaces of a temporary wearing base material, and a portion where the wiring board precursor is bonded. And the process of isolate | separating the said temporary wearing base material and the said wiring board precursor is characterized by the above-mentioned.

本発明の多層配線基板の製造方法によると、周辺部が部分的に接着された配線基板前駆体を形成するため、後の工程で積層物の剥がれやメクレが生じにくくなり、後に配線基板前駆体が接着した部分を切除することにより、仮着用基材と配線基板前駆体とを容易に分離することができる。また、仮着用基材の両面に配線基板前駆体を形成するため、裏面のマスクやメッキなどの無駄がなくなり、製造速度や製造コストの面から製造効率を高めることができる。更に、層間接続体を有する絶縁層と配線層又は金属層とを順次又は繰り返し形成することで、全層が層間接続体で導電接続された多層配線基板を製造することができる。   According to the method for manufacturing a multilayer wiring board of the present invention, a wiring board precursor having a peripheral portion partially bonded is formed. Therefore, peeling of the laminate and creaking are less likely to occur in a later process, and the wiring board precursor later. By excising the part where the adhesive is adhered, the temporary wearing base material and the wiring board precursor can be easily separated. Moreover, since the wiring board precursor is formed on both surfaces of the temporary wearing base material, there is no waste of a mask or plating on the back surface, and the manufacturing efficiency can be increased in terms of manufacturing speed and manufacturing cost. Furthermore, a multilayer wiring board in which all layers are conductively connected with the interlayer connector can be manufactured by sequentially or repeatedly forming the insulating layer having the interlayer connector and the wiring layer or the metal layer.

本発明の好ましい多層配線基板の製造方法は、
(a)仮着用基材の両面に周辺部が部分的に接着された第1金属層を形成する工程、
(b)この第1金属層とは異なる金属の保護金属層を前記第1金属層の略全面に形成する工程、
(c)前記保護金属層の上に層間接続体を有する絶縁層と配線層又は金属層とを順次又は繰り返し形成して、前記層間接続体で全層が接続された配線基板前駆体を形成する工程、及び
(d)前記第1金属層が接着した部分を切除して、前記仮着用基材と前記配線基板前駆体とを分離する工程、を含むことを特徴とする。
A preferred method for producing a multilayer wiring board of the present invention is as follows.
(A) a step of forming a first metal layer in which peripheral portions are partially bonded to both surfaces of a temporary wearing substrate;
(B) forming a protective metal layer made of a metal different from the first metal layer on substantially the entire surface of the first metal layer;
(C) An insulating layer having an interlayer connector and a wiring layer or a metal layer are sequentially or repeatedly formed on the protective metal layer to form a wiring board precursor in which all layers are connected by the interlayer connector. And (d) cutting the portion where the first metal layer is bonded, and separating the temporary wearing base material and the wiring board precursor.

この多層配線基板の製造方法によると、周辺部が部分的に接着された第1金属層を形成するため、後の工程で積層物の剥がれやメクレが生じにくくなり、後に第1金属層が接着した部分を切除することにより、仮着用基材と配線基板前駆体とを容易に分離することができる。また、仮着用基材の両面に配線基板前駆体を形成するため、裏面のマスクやメッキなどの無駄がなくなり、製造速度や製造コストの面から製造効率を高めることができる。更に、層間接続体を有する絶縁層と配線層又は金属層とを順次又は繰り返し形成するため、全層が層間接続体で導電接続された多層配線基板を製造することができる。   According to this method for manufacturing a multilayer wiring board, the first metal layer with the peripheral portion partially bonded is formed, and therefore, it is difficult for the laminate to be peeled off or peeled off in a later step, and the first metal layer is bonded later. By excising the part that has been removed, the temporary wearing base material and the wiring board precursor can be easily separated. Moreover, since the wiring board precursor is formed on both surfaces of the temporary wearing base material, there is no waste of a mask or plating on the back surface, and the manufacturing efficiency can be increased in terms of manufacturing speed and manufacturing cost. Furthermore, since the insulating layer having the interlayer connection and the wiring layer or the metal layer are formed sequentially or repeatedly, a multilayer wiring board in which all the layers are conductively connected with the interlayer connection can be manufactured.

上記において、前記(a)工程で、プリプレグの両面に部分的に配置された金属箔を介して第1金属層をラミネートして、前記仮着用基材の両面に周辺が部分的に接着された第1金属層を形成することが好ましい。この方法によると、部分的に配置された金属箔とプリプレグが接着されるが、その部分では金属箔と第1金属層とが接着されず、第1金属層が接着した部分を切除することにより、仮着用基材と配線基板前駆体とを容易に分離することができる。金属箔と第1金属層とが同じ金属などである場合、両者は適度な密着性を有する。また、仮着用基材の主材としてプリプレグを用いるため、鏡面板などの金属板に比べて軽量となり、各工程においてハンドリング性が良好になる。更に、金属板に比べて、ドリリング等でガイド孔を形成し易くなる。   In the above, in the step (a), the first metal layer was laminated through the metal foil partially disposed on both surfaces of the prepreg, and the periphery was partially adhered to both surfaces of the temporary wearing base material. It is preferable to form a first metal layer. According to this method, the partially disposed metal foil and the prepreg are bonded, but the metal foil and the first metal layer are not bonded to each other, and the portion where the first metal layer is bonded is cut off. The temporary wearing base material and the wiring board precursor can be easily separated. When the metal foil and the first metal layer are the same metal or the like, both have appropriate adhesion. Moreover, since a prepreg is used as a main material of a temporary wearing base material, it becomes lightweight compared with metal plates, such as a mirror surface board, and handling property becomes favorable in each process. Furthermore, it becomes easier to form the guide hole by drilling or the like than the metal plate.

また、前記(c)工程は、前記保護金属層とは異なる金属で構成され前記層間接続体となる第2金属層を形成した後、その第2金属層の層間接続体を形成する表面部分にマスク層を形成してから、第2金属層を選択的にエッチングして層間接続体を形成し、更に絶縁層を形成する工程を含むことが好ましい。   Further, in the step (c), after forming a second metal layer made of a metal different from the protective metal layer and serving as the interlayer connector, a surface portion of the second metal layer forming the interlayer connector is formed. It is preferable to include a step of forming a mask layer, selectively etching the second metal layer to form an interlayer connection, and further forming an insulating layer.

この工程によると、エッチングにより金属の層間接続体が形成されるが、その際、保護金属層が第1金属層を保護するため、層間接続体の形成後も、第1金属層の全面によって仮着用基材との適度な付着力を維持することができる。また、絶縁層の形成によって、更に配線層を形成するなどして、第1金属層に保護金属層を介して電気的に接続した配線基板前駆体を形成することができる。   According to this step, the metal interlayer connection is formed by etching. At this time, since the protective metal layer protects the first metal layer, the temporary connection is made over the entire surface of the first metal layer even after the formation of the interlayer connection. An appropriate adhesion force with the wearing base material can be maintained. In addition, a wiring substrate precursor electrically connected to the first metal layer through the protective metal layer can be formed by forming an insulating layer and further forming a wiring layer.

以下、本発明の実施の形態について、図面を参照しながら説明する。図1〜図5は、本発明に係る多層配線基板の製造方法の一例を示す工程図である。図6は、本発明の製造方法に用いられる仮着用基材を示す平面図である。   Hereinafter, embodiments of the present invention will be described with reference to the drawings. 1 to 5 are process diagrams showing an example of a method for manufacturing a multilayer wiring board according to the present invention. FIG. 6 is a plan view showing a temporary wearing substrate used in the production method of the present invention.

本発明の多層配線基板の製造方法は、仮着用基材の両面に周辺部が部分的に接着された配線基板前駆体を形成する工程、及び前記配線基板前駆体が接着した部分を切除して、前記仮着用基材と前記配線基板前駆体とを分離する工程を含むことを特徴とする。   The method for producing a multilayer wiring board according to the present invention includes a step of forming a wiring board precursor in which peripheral portions are partially bonded to both surfaces of a temporary wearing base material, and a portion where the wiring board precursor is bonded And a step of separating the temporary wearing base material and the wiring board precursor.

本発明の好ましい多層配線基板の製造方法は、図1〜図5に示すように、(a)仮着用基材CLの両面に周辺部が部分的に接着された第1金属層10を形成する工程、(b)この第1金属層10とは異なる金属の保護金属層11を前記第1金属層10の略全面に形成する工程、(c)前記保護金属層11の上に層間接続体14aを有する絶縁層21と配線層18又は金属層とを順次又は繰り返し形成して、前記層間接続体で全層が接続された配線基板前駆体BPを形成する工程、及び(d)前記第1金属層10が接着した部分を切除して、仮着用基材1と配線基板前駆体BPとを分離する工程、を含むことを特徴とする。以下、これを例にとって説明する。   As shown in FIGS. 1 to 5, a preferable method for manufacturing a multilayer wiring board according to the present invention forms (a) a first metal layer 10 in which peripheral portions are partially bonded to both surfaces of a temporary wearing substrate CL. A step, (b) a step of forming a protective metal layer 11 made of a metal different from the first metal layer 10 on substantially the entire surface of the first metal layer 10, and (c) an interlayer connector 14a on the protective metal layer 11. Forming a wiring board precursor BP in which all layers are connected by the interlayer connector, and (d) the first metal. A step of cutting off the portion to which the layer 10 is bonded to separate the temporary wearing base material 1 and the wiring board precursor BP. Hereinafter, this will be described as an example.

この多層配線基板の製造方法は、図1(A)〜(B)に示すように、仮着用基材CLの両面に周辺部が部分的に接着された第1金属層10を形成する工程(a)工程を含む。本実施形態では、プリプレグ1の両面に部分的に配置された金属箔2を介して第1金属層10をラミネートして、仮着用基材CLの両面に周辺が部分的に接着された第1金属層10を形成する例を示す。   In this method of manufacturing a multilayer wiring board, as shown in FIGS. 1A to 1B, a step of forming a first metal layer 10 in which peripheral portions are partially bonded to both surfaces of a temporary wearing base material CL ( a) including a step. In this embodiment, the 1st metal layer 10 is laminated via the metal foil 2 partially arrange | positioned on both surfaces of the prepreg 1, and the periphery was adhere | attached partially on both surfaces of the temporary wearing base material CL. The example which forms the metal layer 10 is shown.

まず、図1(A)に示すように、プリプレグ1と金属箔2と第1金属層10とを積層配置する。プリプレグ1としては、配線基板に要求される耐熱性を有するものであれば何れの材料でもよい。具体的には、ポリイミド樹脂、フェノール樹脂、エポキシ樹脂等の各種反応硬化性樹脂や、それとガラス繊維、セラミック繊維、アラミド繊維等との複合体などが挙げられる。   First, as shown in FIG. 1A, a prepreg 1, a metal foil 2, and a first metal layer 10 are laminated. The prepreg 1 may be any material as long as it has heat resistance required for the wiring board. Specific examples include various reaction curable resins such as polyimide resins, phenol resins, and epoxy resins, and composites thereof with glass fibers, ceramic fibers, aramid fibers, and the like.

金属箔2はいずれの金属でもよいが、第1金属層10と同じ金属が好ましく、例えば銅、銅合金、ニッケル、錫、アルミニウム等が使用できる。金属箔2の厚みは何れでも良いが、例えば1〜100μmが挙げられる。   Although any metal may be sufficient as the metal foil 2, the same metal as the 1st metal layer 10 is preferable, for example, copper, copper alloy, nickel, tin, aluminum etc. can be used. Although the thickness of the metal foil 2 may be any, 1-100 micrometers is mentioned, for example.

金属箔2は、図6(A)〜(B)に示すように、プリプレグ1の両面に部分的に配置される。これによって、接着部1aが露出することになり、この部分に第1金属層10を接着させることで、仮着用基材CLの両面に、周辺部が部分的に接着された第1金属層10を形成することができる。   The metal foil 2 is partially disposed on both surfaces of the prepreg 1 as shown in FIGS. As a result, the bonding portion 1a is exposed, and the first metal layer 10 in which the peripheral portion is partially bonded to both surfaces of the temporary wearing substrate CL by bonding the first metal layer 10 to this portion. Can be formed.

第1金属層10としては、銅、銅合金、ニッケル、錫等が使用できる。第1金属層10の厚みとしては、これが配線層の厚みとなるため、例えば1〜100μmが挙げられる。   As the first metal layer 10, copper, copper alloy, nickel, tin or the like can be used. As thickness of the 1st metal layer 10, since this becomes the thickness of a wiring layer, 1-100 micrometers is mentioned, for example.

上記(a)工程の完了後に、ドリリング、パンチ等で、第1金属層10を形成した仮着用基材CLにガイド孔を形成することができる。このガイド孔を基準として、後の工程において配線や層間接続体のパターン形成を、高精度に行うことができるようになる。   After completion of the step (a), a guide hole can be formed in the temporary wearing substrate CL on which the first metal layer 10 is formed by drilling, punching, or the like. With this guide hole as a reference, the pattern formation of wirings and interlayer connectors can be performed with high accuracy in a later process.

次いで、図1(B)に示すように、プリプレグ1と金属箔2と第1金属層10とのラミネートを行う。ラミネートの条件としては、プリプレグ1の種類に応じた圧力、温度、時間が設定される。ラミネートによって、プリプレグ1の接着部1aと第1金属層10とが強固に接着する。   Next, as shown in FIG. 1B, the prepreg 1, the metal foil 2, and the first metal layer 10 are laminated. As conditions for laminating, the pressure, temperature, and time corresponding to the type of prepreg 1 are set. By the lamination, the bonding portion 1a of the prepreg 1 and the first metal layer 10 are firmly bonded.

本発明の多層配線基板の製造方法は、図2(A)に示すように、第1金属層10とは異なる金属の保護金属層11を前記第1金属層10の略全面に形成する(b)工程を含む。なお、この図2(A)は、中央部を示しているため、接着部1aが示されていない。   In the method for manufacturing a multilayer wiring board according to the present invention, as shown in FIG. 2A, a protective metal layer 11 made of a metal different from the first metal layer 10 is formed on substantially the entire surface of the first metal layer 10 (b). ) Process. In addition, since this FIG. 2 (A) has shown the center part, the adhesion part 1a is not shown.

保護金属層11としては、第1金属層10を構成する金属が銅である場合、例えば金、銀、亜鉛、パラジウム、ルテニウム、ニッケル、ロジウム、鉛−錫系はんだ合金、又はニッケル−金合金等が使用される。但し、本発明は、これらの金属の組合せに限らず、上記金属のエッチング時に耐性を示す別の金属との組合せが何れも使用可能である。これに関しては、第2金属層14を構成する金属と保護金属層11との関係についても同様である。   As the protective metal layer 11, when the metal constituting the first metal layer 10 is copper, for example, gold, silver, zinc, palladium, ruthenium, nickel, rhodium, lead-tin solder alloy, nickel-gold alloy, or the like Is used. However, the present invention is not limited to the combination of these metals, and any combination with another metal exhibiting resistance when the metal is etched can be used. The same applies to the relationship between the metal constituting the second metal layer 14 and the protective metal layer 11.

保護金属層11の形成は、例えばメッキ、スパッタリング、蒸着などにより行えるが、メッキ、特に電解メッキを利用するのが好ましい。保護金属層2の厚みは、例えば1〜20μm程度である。   The protective metal layer 11 can be formed by, for example, plating, sputtering, vapor deposition, etc., but it is preferable to use plating, particularly electrolytic plating. The thickness of the protective metal layer 2 is, for example, about 1 to 20 μm.

電解メッキは、周知の方法で行うことができるが、一般的には、対象となる積層板をメッキ浴内に浸漬しながら、積層板を陰極とし、メッキする金属の金属イオン補給源を陽極として、電気分解反応により陰極側に金属を析出させることにより行われる。   Electrolytic plating can be performed by a known method. In general, while immersing the target laminated plate in a plating bath, the laminated plate is used as a cathode, and the metal ion supply source of the metal to be plated is used as an anode. This is carried out by depositing a metal on the cathode side by an electrolysis reaction.

無電解メッキのメッキ液は、各種金属に対応して周知であり、各種のものが市販されている。一般的には、液組成として、金属イオン源、アルカリ源、還元剤、キレート剤、安定剤などを含有する。なお、無電解メッキに先立って、パラジウム等のメッキ触媒を沈着させてもよい。   Electroless plating solutions are well known for various metals, and various types are commercially available. In general, the liquid composition contains a metal ion source, an alkali source, a reducing agent, a chelating agent, a stabilizer, and the like. A plating catalyst such as palladium may be deposited prior to electroless plating.

本発明の多層配線基板の製造方法は、前記保護金属層11の上に層間接続体14aを有する絶縁層21と配線層18又は金属層とを順次又は繰り返し形成して、前記層間接続体で全層が接続された配線基板前駆体BPを形成する(c)工程を含む。本実施形態では、この(c)工程が、保護金属層11とは異なる金属で構成され層間接続体14aとなる第2金属層14を形成した後、その第2金属層14の層間接続体14aを形成する表面部分にマスク層15を形成してから、第2金属層14を選択的にエッチングして層間接続体14aを形成し、更に絶縁層15を形成する工程を含む例を示す。   In the method for manufacturing a multilayer wiring board according to the present invention, an insulating layer 21 having an interlayer connector 14a and a wiring layer 18 or a metal layer are sequentially or repeatedly formed on the protective metal layer 11, and the entire interlayer connector is used. (C) The process of forming the wiring board precursor BP with which the layer was connected is included. In this embodiment, after the step (c) is performed, the second metal layer 14 made of a metal different from the protective metal layer 11 and serving as the interlayer connector 14a is formed, and then the interlayer connector 14a of the second metal layer 14 is formed. An example including a step of forming a mask layer 15 on the surface portion on which the second metal layer 14 is formed, selectively etching the second metal layer 14 to form an interlayer connector 14a, and further forming an insulating layer 15 is shown.

本実施形態では、図2(B)に示すように、保護金属層11とは異なる金属で構成され層間接続体14aとなる第2金属層14を形成する。第2金属層14としては、例えば銅、銅合金、ニッケル、錫等が使用できる。本発明では、第1金属層10と第2金属層14とが銅で構成され、保護金属層11がニッケルで構成されていることが好ましい。   In the present embodiment, as shown in FIG. 2B, the second metal layer 14 that is made of a metal different from the protective metal layer 11 and serves as the interlayer connector 14a is formed. As the second metal layer 14, for example, copper, copper alloy, nickel, tin or the like can be used. In the present invention, the first metal layer 10 and the second metal layer 14 are preferably made of copper, and the protective metal layer 11 is preferably made of nickel.

第2金属層14の形成は、例えばメッキ、スパッタリング、蒸着などにより行えるが、メッキ、特に電解メッキを利用するのが好ましい。第2金属層14の厚みは、例えば30〜1000μmである。   The second metal layer 14 can be formed by, for example, plating, sputtering, vapor deposition, etc., but it is preferable to use plating, particularly electrolytic plating. The thickness of the second metal layer 14 is, for example, 30 to 1000 μm.

次に、図2(C)に示すように、その第2金属層14の第2層間接続体14aを形成する表面部分にマスク層15を形成する。マスク層15の形成は、感光性樹脂の塗布後またはドライフィルムレジストのラミネート後に、露光・現像する方法、あるいはスクリーン印刷などにより行うことができる。   Next, as shown in FIG. 2C, a mask layer 15 is formed on the surface portion of the second metal layer 14 where the second interlayer connector 14a is to be formed. The mask layer 15 can be formed by a method of exposure / development or screen printing after applying a photosensitive resin or laminating a dry film resist.

マスク層15の個々の大きさ(面積又は外径等)は、層間接続体14aの大きさに対応して決定され、配線層間の導電接続(ビア)のための層間接続体14aの外径としては、例えば50〜1000μm、また、放熱構造のための層間接続体14aの外径としては、1000μm以上の外径を有するものも可能である。マスク層15の形状は何れでもよく、円形、楕円形、四角形、多角形、パターン形状等が挙げられ、当該形状に応じた層間接続体14aを形成することができる。   The individual size (area, outer diameter, etc.) of the mask layer 15 is determined in accordance with the size of the interlayer connector 14a, and is defined as the outer diameter of the interlayer connector 14a for conductive connection (via) between wiring layers. Can be, for example, 50 to 1000 μm, and the outer diameter of the interlayer connector 14a for the heat dissipation structure can be 1000 μm or more. The mask layer 15 may have any shape, and may be a circle, an ellipse, a quadrangle, a polygon, a pattern, or the like, and the interlayer connector 14a corresponding to the shape can be formed.

次いで、図3(A)に示すように、第2金属層14を選択的にエッチングして層間接続体14aを形成するものである。その際、エッチングによる浸食量が多過ぎると、形成される層間接続体14aが小径化(アンダーカットの増大)して、後の工程に支障をきたす場合が生じ、逆に、浸食量が少な過ぎると、非パターン部に第2金属層14が残存して、短絡の原因となる場合が生じる。従って、上記のエッチングによる浸食の程度は、図3(A)に示す程度か、或いはこれより多少増減する範囲内が好ましい。
エッチングの方法としては、第2金属層14及び保護金属層11を構成する各金属の種類に応じた、各種エッチング液を用いたエッチング方法が挙げられる。例えば、第2金属層14が銅であり、保護金属層11が前述の金属(金属系レジストを含む)の場合、市販のアルカリエッチング液、過硫酸アンモニウム、過酸化水素/硫酸等が使用できる。
Next, as shown in FIG. 3A, the second metal layer 14 is selectively etched to form an interlayer connector 14a. At this time, if the amount of erosion caused by etching is too large, the formed interlayer connector 14a may be reduced in diameter (increase in undercut), thereby hindering subsequent processes, and conversely, the amount of erosion is too small. Then, the second metal layer 14 may remain in the non-patterned portion, causing a short circuit. Therefore, the degree of erosion due to the etching is preferably as shown in FIG. 3A or within a range that slightly increases or decreases.
Examples of the etching method include etching methods using various etching liquids according to the types of metals constituting the second metal layer 14 and the protective metal layer 11. For example, when the second metal layer 14 is copper and the protective metal layer 11 is the aforementioned metal (including a metal resist), a commercially available alkaline etching solution, ammonium persulfate, hydrogen peroxide / sulfuric acid, or the like can be used.

次に、図3(B)に示すように、マスク層15の除去と絶縁材16aの塗布を行う。マスク層15の除去は、薬剤除去、剥離除去など、マスク層15の種類に応じて適宜選択すればよい。例えば、スクリーン印刷により形成された感光性のインクである場合、アルカリ等の薬品にて除去される。   Next, as shown in FIG. 3B, the mask layer 15 is removed and the insulating material 16a is applied. The removal of the mask layer 15 may be appropriately selected according to the type of the mask layer 15 such as removal of chemicals and removal of peeling. For example, in the case of photosensitive ink formed by screen printing, it is removed with chemicals such as alkali.

絶縁材を塗布する際の絶縁材としては、例えば絶縁性が良好で安価な液状ポリイミド樹脂、エポキシ樹脂等の反応硬化性樹脂を用いることができる。これを各種方法で、層間接続体14aの高さよりやや厚くなるように塗布した後、加熱又は光照射等により硬化させればよい。塗布方法としては、カーテンコーターなどの各種コーターを使用できる。また、反応硬化性樹脂等を含有する接着性シート、プリプレグ等を用いて、ホットプレスや真空ラミネート等する方法でもよい。   As an insulating material at the time of applying the insulating material, for example, a reactive curable resin such as a liquid polyimide resin or an epoxy resin that has good insulating properties and is inexpensive can be used. This may be applied by various methods so as to be slightly thicker than the height of the interlayer connector 14a, and then cured by heating or light irradiation. As a coating method, various coaters such as a curtain coater can be used. Alternatively, a hot pressing or vacuum laminating method may be used using an adhesive sheet, a prepreg, or the like containing a reactive curable resin.

次に、図3(C)に示すように、層間接続体14が露出した絶縁層16を形成する。本実施形態では、絶縁層形成材を積層後に層間接続体14aを露出させる例を示す。この例では、硬化した絶縁材を研削・研磨等することにより、層間接続体14aの高さと略同じ厚さを有する絶縁層16を形成する。研削の方法としては、ダイヤモンド製等の硬質刃を回転板の半径方向に複数配置した硬質回転刃を有する研削装置を使用する方法が挙げられ、当該硬質回転刃を回転させながら、固定支持された配線基板の上面に沿って移動させることによって、上面を平坦化することができる。また、研磨の方法としては、ベルトサンダ、バフ研磨等により軽く研磨する方法が挙げられる。   Next, as shown in FIG. 3C, an insulating layer 16 in which the interlayer connector 14 is exposed is formed. In the present embodiment, an example is shown in which the interlayer connector 14a is exposed after the insulating layer forming material is laminated. In this example, the insulating layer 16 having substantially the same thickness as the height of the interlayer connector 14a is formed by grinding and polishing the hardened insulating material. Examples of the grinding method include a method using a grinding apparatus having a hard rotary blade in which a plurality of hard blades made of diamond or the like are arranged in the radial direction of the rotary plate, and the hard rotary blade is fixedly supported while rotating. By moving along the upper surface of the wiring board, the upper surface can be planarized. Moreover, as a grinding | polishing method, the method of lightly grind | polishing by a belt sander, buff grinding | polishing etc. is mentioned.

本実施形態では、図4(A)〜(B)に示すように、更に配線層18、層間接続体20を有する絶縁層21を順次形成する例を示す。   In the present embodiment, as shown in FIGS. 4A to 4B, an example in which an insulating layer 21 having a wiring layer 18 and an interlayer connector 20 is sequentially formed is shown.

配線層18を構成する金属としては、通常、銅、銅合金、ニッケル、錫等が使用できるが、層間接続体14aと同じ金属で構成するのが好ましい。配線層18のパターン形成の方法はいずれでもよく、例えば、エッチングレジストを使用してパターン形成するパネルメッキ法や、パターンメッキ用レジストを使用してメッキで形成するパターンメッキ法等が挙げられる。配線層18の厚みは例えば1〜100μmである。   Usually, copper, copper alloy, nickel, tin, or the like can be used as the metal constituting the wiring layer 18, but it is preferable that the wiring layer 18 be made of the same metal as the interlayer connector 14a. Any pattern forming method may be used for the wiring layer 18, and examples thereof include a panel plating method in which a pattern is formed using an etching resist, and a pattern plating method in which a pattern plating resist is used for plating. The thickness of the wiring layer 18 is, for example, 1 to 100 μm.

層間接続体20を有する絶縁層21を形成する方法としては、少なくとも配線層18を被覆する保護金属層19を形成する工程、その保護金属層19とは別の金属層を更に形成する工程、その金属層の層間接続体20を形成する表面部分にマスク層を形成する工程、前記マスク層を形成した金属層を選択的にエッチングする工程、前記保護金属層19を選択的にエッチングする工程、および層間接続体を有する絶縁層21を形成する工程を含む方法が好ましい。   As a method of forming the insulating layer 21 having the interlayer connector 20, a step of forming a protective metal layer 19 covering at least the wiring layer 18, a step of further forming a metal layer different from the protective metal layer 19, A step of forming a mask layer on the surface portion of the metal layer on which the interlayer connector 20 is formed, a step of selectively etching the metal layer on which the mask layer is formed, a step of selectively etching the protective metal layer 19, and A method including the step of forming the insulating layer 21 having an interlayer connector is preferable.

本実施形態では、配線基板前駆体BPを剥離する前に、配線パターンを形成するための金属層22を形成する例を示す。金属層22の形成は、例えば無電解メッキや無電解メッキと電解メッキとの組合せにより行うことができる。   In the present embodiment, an example in which the metal layer 22 for forming a wiring pattern is formed before the wiring board precursor BP is peeled off is shown. The metal layer 22 can be formed by, for example, electroless plating or a combination of electroless plating and electrolytic plating.

本発明の製造方法は、図4(C)に示すように、前記第1金属層10が接着した部分を切除して、仮着用基材1と配線基板前駆体BPとを分離する(d)工程を含むものである。切除にはルータ、回転刃等を用いることができる。これにより、仮着用基材1との接着力が無くなり、第1金属層10を剥離するのが容易になる。なお、ルータ等で接着した部分のみを切断除去する場合、配線基板前駆体は、その部分以外の領域に配線層等を形成しておくことが好ましい。   In the manufacturing method of the present invention, as shown in FIG. 4 (C), the portion where the first metal layer 10 is bonded is excised to separate the temporary wearing base material 1 and the wiring board precursor BP (d). It includes a process. A router, a rotary blade, or the like can be used for cutting. Thereby, the adhesive force with the temporary wearing base material 1 is lost, and it becomes easy to peel the first metal layer 10. In the case where only a portion bonded by a router or the like is cut and removed, the wiring board precursor is preferably formed with a wiring layer or the like in a region other than the portion.

本実施形態では、最外層に、配線パターンを形成する前の金属層22が形成された状態で剥離を行っているが、このようにすると、第1金属層10と金属層22とを同時にエッチングして配線パターンを形成できるため、後の工程がより簡略化するというメリットがある。   In this embodiment, peeling is performed in a state in which the metal layer 22 before forming the wiring pattern is formed on the outermost layer, but in this case, the first metal layer 10 and the metal layer 22 are etched simultaneously. Thus, since the wiring pattern can be formed, there is an advantage that the subsequent process is further simplified.

次いで、図5(A)〜(B)に示すように、金属層22と第1金属層10をエッチングして配線パターン22a,10aを形成する。その際、エッチングレジスト23が用いられる。エッチングレジスト23は、感光性樹脂やドライフィルムレジスト(フォトレジスト)などが使用できる。   Next, as shown in FIGS. 5A to 5B, the metal layer 22 and the first metal layer 10 are etched to form wiring patterns 22a and 10a. At that time, an etching resist 23 is used. As the etching resist 23, a photosensitive resin, a dry film resist (photoresist), or the like can be used.

エッチングの方法としては、保護金属層11及び金属層22、第1金属層10を構成する各金属の種類に応じた、各種エッチング液を用いたエッチング方法が挙げられる。例えば、金属層22,10が銅であり、保護金属層11が前述の金属(金属系レジストを含む)の場合、市販のアルカリエッチング液、過硫酸アンモニウム、過酸化水素/硫酸等が使用できる。エッチング後には、エッチングレジスト4が除去される。   Examples of the etching method include etching methods using various etching solutions according to the types of each metal constituting the protective metal layer 11, the metal layer 22, and the first metal layer 10. For example, when the metal layers 22 and 10 are copper and the protective metal layer 11 is the aforementioned metal (including a metal resist), a commercially available alkaline etching solution, ammonium persulfate, hydrogen peroxide / sulfuric acid, or the like can be used. After the etching, the etching resist 4 is removed.

更に、図5(C)に示すように、保護金属層11の少なくとも非パターン部を、選択的にエッチングして除去する。   Further, as shown in FIG. 5C, at least the non-patterned portion of the protective metal layer 11 is selectively etched and removed.

エッチングの方法としては、第2金属層とは異なるエッチング液を用いたエッチング方法が挙げられるが、塩化物エッチング液を用いると金属系レジスト及び銅の両者が浸食されるため、その他のエッチング液を用いるのが好ましい。具体的には、層間接続体14aと配線パターン22a,10aが銅であり、保護金属層11が前記の金属である場合、はんだ剥離用として市販されている、硝酸系、硫酸系、シアン系などの酸系のエッチング液等を用いるのが好ましい。   As an etching method, an etching method using an etching solution different from that of the second metal layer can be mentioned. However, when a chloride etching solution is used, both the metal-based resist and copper are eroded, so other etching solutions are used. It is preferable to use it. Specifically, when the interlayer connector 14a and the wiring patterns 22a and 10a are copper, and the protective metal layer 11 is the above-mentioned metal, nitric acid-based, sulfuric acid-based, cyan-based, etc., which are commercially available for solder peeling. It is preferable to use an acid-based etching solution or the like.

なお、更に配線層を積層する場合、エッチングで露出したパターン部に対しては、黒化処理などの表面処理を行って、絶縁層との密着性を高めておくのが好ましい。これは、他の導体パターンについても同様である。   In the case where a wiring layer is further laminated, it is preferable to perform surface treatment such as blackening treatment on the pattern portion exposed by etching to improve the adhesion with the insulating layer. The same applies to other conductor patterns.

以上のような本発明の製造方法によって、図5(C)に示すように、配線層10aの上面にこれとは別の金属からなる保護金属層11、これとは別の金属からなる層間接続体14aが形成され、更にその上面に配線層18、これとは別の金属からなる保護金属層19、これとは別の金属からなる層間接続体20が形成され、更にその上面に配線層22aが形成された多層配線基板を製造することができる。   By the manufacturing method of the present invention as described above, as shown in FIG. 5C, a protective metal layer 11 made of a metal different from this and an interlayer connection made of a metal different from this are formed on the upper surface of the wiring layer 10a. The body 14a is formed, the wiring layer 18 is formed on the upper surface thereof, the protective metal layer 19 made of a metal different from this, and the interlayer connection body 20 made of a metal different from this is formed. Further, the wiring layer 22a is formed on the upper surface thereof. A multilayer wiring board on which is formed can be manufactured.

〔別の実施形態〕
以下、本発明の別の実施形態について説明する。
[Another embodiment]
Hereinafter, another embodiment of the present invention will be described.

(1)前記の実施形態では、プリプレグの両面に部分的に配置された金属箔を介して第1金属層をラミネートして、前記仮着用基材の両面に周辺が部分的に接着された第1金属層を形成する例を示したが、仮着用基材としては、樹脂を主成分とするものが好ましく、金属箔の代わりに離型フィルムを設けた樹脂シートや補強繊維を含む樹脂シートなどでもよい。また、感光性樹脂などを用いて、部分的に硬化反応を行ったものを用いて、仮着用基材の両面に周辺が部分的に接着された第1金属層を形成してもよい。なお、仮着用基材としては、鏡面板等の金属板などを用いることも可能である。また、2層のプリプレグの間にコア材が介在する構造でもよい。   (1) In the above embodiment, the first metal layer is laminated via the metal foil partially disposed on both surfaces of the prepreg, and the periphery is partially bonded to both surfaces of the temporary wearing base material. Although the example which forms 1 metal layer was shown, as a temporary wearing base material, what has resin as a main component is preferable, the resin sheet which provided the release film instead of metal foil, the resin sheet containing a reinforced fiber, etc. But you can. Moreover, you may form the 1st metal layer by which the periphery was partially adhere | attached on both surfaces of the temporary wearing base material using what performed the hardening reaction partially using photosensitive resin. In addition, as a temporary wearing base material, it is also possible to use metal plates, such as a mirror surface board. Moreover, the structure where a core material interposes between two layers of prepregs may be sufficient.

(2)前記の実施形態では、3層の配線層を有する配線基板の前駆体を仮着用基材から剥離する例を示したが、2層の配線層を有する配線基板の前駆体や、4層以上の配線層を有する配線基板の前駆体を仮着用基材から剥離する方法であってもよい。   (2) In the above-described embodiment, an example in which the precursor of the wiring board having three wiring layers is peeled from the temporary wearing base material has been described, but the precursor of the wiring board having two wiring layers and 4 The method of peeling the precursor of the wiring board which has a wiring layer more than a layer from a temporary wearing base material may be sufficient.

また、前記の実施形態では、最外層に配線パターンを形成する前の金属層22が形成された状態で剥離を行っているが、最外層に配線パターンが形成されている配線基板前駆体を仮着用基材から剥離してもよい。   Further, in the above-described embodiment, peeling is performed in a state where the metal layer 22 before forming the wiring pattern is formed on the outermost layer, but the wiring board precursor having the wiring pattern formed on the outermost layer is temporarily used. You may peel from a wearing base material.

(3)前記の実施形態では、第2金属層を選択的にエッチングして層間接続体を形成する例を示したが、レーザビア、フォトビア、導電性ペースト、フィルドビアなどで層間接続体を形成してもよい。   (3) In the above embodiment, the example in which the second metal layer is selectively etched to form the interlayer connector is shown. However, the interlayer connector is formed by using a laser via, a photo via, a conductive paste, a filled via, or the like. Also good.

(4)前記の実施形態では、ラミネート時のプリプレグの接着力によって、第1金属層を接着する例を示したが、接着剤、両面テープなどの接着力によって、仮着用基材の両面に周辺が部分的に接着された第1金属層を形成してもよい。   (4) In the above-described embodiment, an example in which the first metal layer is bonded by the adhesive force of the prepreg at the time of lamination has been described. A first metal layer partially bonded may be formed.

(5)前記の実施形態では、(a)工程〜(d)工程を含む多層配線基板の製造方法の例を示したが、(a)仮着用基材の両面に周辺部が部分的に接着された第1金属層を形成する工程、(b‘)絶縁層を前記第1金属層の略全面に形成する工程、
(c‘)前記絶縁層の上に配線層又は金属層と層間接続体を有する絶縁層とを順次又は繰り返し形成して配線基板前駆体を形成する工程、及び
(d)前記第1金属層が接着した部分を切除して、前記仮着用基材と前記配線基板前駆体とを分離する工程、
を含む多層配線基板の製造方法であってもよい。
(5) In the above-described embodiment, an example of a method for manufacturing a multilayer wiring board including the steps (a) to (d) has been described. (A) The peripheral portion is partially bonded to both surfaces of the temporary wearing base material. Forming a first metal layer formed; (b ′) forming an insulating layer on substantially the entire surface of the first metal layer;
(C ′) forming a wiring board precursor by sequentially or repeatedly forming a wiring layer or a metal layer and an insulating layer having an interlayer connection on the insulating layer; and (d) the first metal layer comprising: Cutting the bonded part and separating the temporary wearing base material and the wiring board precursor;
The manufacturing method of the multilayer wiring board containing this may be sufficient.

その場合、第1金属層としては、放熱特性を良好にする上で、厚み100μm〜5mmとするのが好ましい。また、(b‘)工程で形成する絶縁層は、伝熱特性を高める上で、伝熱性フィラーを含有するものや、厚み100μm以下のものが好ましい。この絶縁層の上には、例えば図4(A)〜図5(B)に示すような工程によって、配線層又は金属層と層間接続体を有する絶縁層とを順次又は繰り返し形成することができる。   In this case, the first metal layer preferably has a thickness of 100 μm to 5 mm in order to improve heat dissipation characteristics. In addition, the insulating layer formed in the step (b ′) preferably contains a heat conductive filler or has a thickness of 100 μm or less in order to improve heat transfer characteristics. On the insulating layer, a wiring layer or a metal layer and an insulating layer having an interlayer connector can be sequentially or repeatedly formed by, for example, the steps shown in FIGS. 4A to 5B. .

本発明の多層配線基板の製造方法の一例を示す工程図Process drawing which shows an example of the manufacturing method of the multilayer wiring board of this invention 本発明の多層配線基板の製造方法の一例を示す工程図Process drawing which shows an example of the manufacturing method of the multilayer wiring board of this invention 本発明の多層配線基板の製造方法の一例を示す工程図Process drawing which shows an example of the manufacturing method of the multilayer wiring board of this invention 本発明の多層配線基板の製造方法の一例を示す工程図Process drawing which shows an example of the manufacturing method of the multilayer wiring board of this invention 本発明の多層配線基板の製造方法の一例を示す工程図Process drawing which shows an example of the manufacturing method of the multilayer wiring board of this invention 本発明の製造方法に用いられる仮着用基材を示す平面図The top view which shows the temporary wearing base material used for the manufacturing method of this invention

符号の説明Explanation of symbols

1 プリプレグ
1a プリプレグの接着部
2 金属箔
10 第1金属層
11 保護金属層
14 第2金属層
14a 層間接続体
15 マスク層
16 絶縁層
18 配線層(配線パターン)
21 絶縁層
BP 配線基板前駆体
CL 仮着用基材
DESCRIPTION OF SYMBOLS 1 Prepreg 1a Adhesion part of prepreg 2 Metal foil 10 1st metal layer 11 Protective metal layer 14 2nd metal layer 14a Interlayer connection body 15 Mask layer 16 Insulating layer 18 Wiring layer (wiring pattern)
21 Insulating layer BP Wiring board precursor CL Temporary wearing base material

Claims (4)

仮着用基材の両面に周辺部が部分的に接着された配線基板前駆体を形成する工程、及び
前記配線基板前駆体が接着した部分を切除して、前記仮着用基材と前記配線基板前駆体とを分離する工程、
を含む多層配線基板の製造方法。
A step of forming a wiring board precursor in which peripheral portions are partially bonded to both surfaces of the temporary wearing base material; and a portion where the wiring board precursor is bonded is excised to form the temporary wearing base material and the wiring board precursor. Separating the body,
A method of manufacturing a multilayer wiring board including:
(a)仮着用基材の両面に周辺部が部分的に接着された第1金属層を形成する工程、
(b)この第1金属層とは異なる金属の保護金属層を前記第1金属層の略全面に形成する工程、
(c)前記保護金属層の上に層間接続体を有する絶縁層と配線層又は金属層とを順次又は繰り返し形成して、前記層間接続体で全層が接続された配線基板前駆体を形成する工程、及び
(d)前記第1金属層が接着した部分を切除して、前記仮着用基材と前記配線基板前駆体とを分離する工程、
を含む多層配線基板の製造方法。
(A) a step of forming a first metal layer in which peripheral portions are partially bonded to both surfaces of a temporary wearing substrate;
(B) forming a protective metal layer made of a metal different from the first metal layer on substantially the entire surface of the first metal layer;
(C) An insulating layer having an interlayer connector and a wiring layer or a metal layer are sequentially or repeatedly formed on the protective metal layer to form a wiring board precursor in which all layers are connected by the interlayer connector. And (d) a step of excising a portion where the first metal layer is bonded to separate the temporary wearing base material and the wiring board precursor.
A method of manufacturing a multilayer wiring board including:
前記(a)工程で、プリプレグの両面に部分的に配置された金属箔を介して第1金属層をラミネートして、前記仮着用基材の両面に周辺が部分的に接着された第1金属層を形成する請求項2に記載の多層配線基板の製造方法。   A first metal obtained by laminating a first metal layer through metal foils partially disposed on both sides of the prepreg in the step (a) and partially adhering the periphery to both sides of the temporary wearing substrate. The manufacturing method of the multilayer wiring board of Claim 2 which forms a layer. 前記(c)工程は、前記保護金属層とは異なる金属で構成され前記層間接続体となる第2金属層を形成した後、その第2金属層の層間接続体を形成する表面部分にマスク層を形成してから、第2金属層を選択的にエッチングして層間接続体を形成し、更に絶縁層を形成する工程を含む請求項2又は3に記載の多層配線基板の製造方法。   In the step (c), after forming a second metal layer made of a metal different from the protective metal layer and serving as the interlayer connection, a mask layer is formed on the surface portion of the second metal layer where the interlayer connection is formed. 4. The method of manufacturing a multilayer wiring board according to claim 2, further comprising a step of selectively etching the second metal layer to form an interlayer connector and further forming an insulating layer.
JP2005195126A 2005-07-04 2005-07-04 Multilayer wiring board manufacturing method Pending JP2007013048A (en)

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JP2010080595A (en) * 2008-09-25 2010-04-08 Hitachi Chem Co Ltd Method of manufacturing three-layer wiring board
JP2011199077A (en) * 2010-03-19 2011-10-06 Ngk Spark Plug Co Ltd Method of manufacturing multilayer wiring board
JP2013030808A (en) * 2012-10-26 2013-02-07 Shinko Electric Ind Co Ltd Temporary substrate for wiring board manufacturing and manufacturing method of the same
JP2013069745A (en) * 2011-09-21 2013-04-18 Panasonic Corp Support body and method for manufacturing printed wiring board
JP2014027250A (en) * 2012-07-26 2014-02-06 Samsung Electro-Mechanics Co Ltd Multilayer type coreless substrate and method of manufacturing the same

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JP2004235323A (en) * 2003-01-29 2004-08-19 Fujitsu Ltd Manufacturing method of wiring board
JP2004363536A (en) * 2003-02-06 2004-12-24 Lg Electron Inc Interconnecting method for multilayer printed circuit board

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JP2004087701A (en) * 2002-08-26 2004-03-18 Nec Toppan Circuit Solutions Toyama Inc Method for manufacturing multilayer interconnection structure and method for mounting semiconductor device
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JP2010056231A (en) * 2008-08-27 2010-03-11 Kyocer Slc Technologies Corp Method of manufacturing wiring substrate
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JP2011199077A (en) * 2010-03-19 2011-10-06 Ngk Spark Plug Co Ltd Method of manufacturing multilayer wiring board
JP2013069745A (en) * 2011-09-21 2013-04-18 Panasonic Corp Support body and method for manufacturing printed wiring board
JP2014027250A (en) * 2012-07-26 2014-02-06 Samsung Electro-Mechanics Co Ltd Multilayer type coreless substrate and method of manufacturing the same
JP2013030808A (en) * 2012-10-26 2013-02-07 Shinko Electric Ind Co Ltd Temporary substrate for wiring board manufacturing and manufacturing method of the same

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