JP2006285133A - Photosensitive resin composition, photosensitive element, method for producing resist pattern and method for producing printed wiring board - Google Patents
Photosensitive resin composition, photosensitive element, method for producing resist pattern and method for producing printed wiring board Download PDFInfo
- Publication number
- JP2006285133A JP2006285133A JP2005108529A JP2005108529A JP2006285133A JP 2006285133 A JP2006285133 A JP 2006285133A JP 2005108529 A JP2005108529 A JP 2005108529A JP 2005108529 A JP2005108529 A JP 2005108529A JP 2006285133 A JP2006285133 A JP 2006285133A
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- Prior art keywords
- resin composition
- photosensitive resin
- producing
- meth
- resist pattern
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 239000011342 resin composition Substances 0.000 title claims abstract description 42
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 17
- 229920000642 polymer Polymers 0.000 claims abstract description 18
- 239000011230 binding agent Substances 0.000 claims abstract description 17
- 239000000178 monomer Substances 0.000 claims abstract description 17
- 239000003999 initiator Substances 0.000 claims abstract description 13
- 238000010521 absorption reaction Methods 0.000 claims abstract description 12
- 238000011161 development Methods 0.000 claims description 21
- CERQOIWHTDAKMF-UHFFFAOYSA-N Methacrylic acid Chemical compound CC(=C)C(O)=O CERQOIWHTDAKMF-UHFFFAOYSA-N 0.000 claims description 10
- 238000007747 plating Methods 0.000 claims description 10
- 239000000758 substrate Substances 0.000 claims description 10
- 238000001035 drying Methods 0.000 claims description 7
- 238000005530 etching Methods 0.000 claims description 7
- 238000007334 copolymerization reaction Methods 0.000 claims description 4
- 239000011248 coating agent Substances 0.000 claims description 3
- 238000000576 coating method Methods 0.000 claims description 3
- 239000000470 constituent Substances 0.000 claims description 2
- 230000035945 sensitivity Effects 0.000 abstract description 5
- -1 methacryloyl group Chemical group 0.000 description 26
- 239000010410 layer Substances 0.000 description 18
- 229940048053 acrylate Drugs 0.000 description 17
- 238000000034 method Methods 0.000 description 15
- 230000001681 protective effect Effects 0.000 description 13
- NIXOWILDQLNWCW-UHFFFAOYSA-M Acrylate Chemical compound [O-]C(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-M 0.000 description 12
- 150000001875 compounds Chemical class 0.000 description 11
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 10
- 238000002835 absorbance Methods 0.000 description 10
- 239000007864 aqueous solution Substances 0.000 description 10
- 229910052802 copper Inorganic materials 0.000 description 9
- 239000010949 copper Substances 0.000 description 9
- 239000000243 solution Substances 0.000 description 9
- ATUOYWHBWRKTHZ-UHFFFAOYSA-N Propane Chemical compound CCC ATUOYWHBWRKTHZ-UHFFFAOYSA-N 0.000 description 8
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 6
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- 206010034972 Photosensitivity reaction Diseases 0.000 description 5
- 238000011156 evaluation Methods 0.000 description 5
- 230000036211 photosensitivity Effects 0.000 description 5
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- 125000000217 alkyl group Chemical group 0.000 description 4
- IISBACLAFKSPIT-UHFFFAOYSA-N bisphenol A Chemical compound C=1C=C(O)C=CC=1C(C)(C)C1=CC=C(O)C=C1 IISBACLAFKSPIT-UHFFFAOYSA-N 0.000 description 4
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- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 4
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- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 3
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 3
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 3
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- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 description 3
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- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 3
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- 239000007921 spray Substances 0.000 description 3
- 150000003440 styrenes Chemical class 0.000 description 3
- VZCYOOQTPOCHFL-UHFFFAOYSA-N trans-butenedioic acid Natural products OC(=O)C=CC(O)=O VZCYOOQTPOCHFL-UHFFFAOYSA-N 0.000 description 3
- UAJRSHJHFRVGMG-UHFFFAOYSA-N 1-ethenyl-4-methoxybenzene Chemical compound COC1=CC=C(C=C)C=C1 UAJRSHJHFRVGMG-UHFFFAOYSA-N 0.000 description 2
- VVBLNCFGVYUYGU-UHFFFAOYSA-N 4,4'-Bis(dimethylamino)benzophenone Chemical compound C1=CC(N(C)C)=CC=C1C(=O)C1=CC=C(N(C)C)C=C1 VVBLNCFGVYUYGU-UHFFFAOYSA-N 0.000 description 2
- VZCYOOQTPOCHFL-OWOJBTEDSA-N Fumaric acid Chemical compound OC(=O)\C=C\C(O)=O VZCYOOQTPOCHFL-OWOJBTEDSA-N 0.000 description 2
- NPKSPKHJBVJUKB-UHFFFAOYSA-N N-phenylglycine Chemical compound OC(=O)CNC1=CC=CC=C1 NPKSPKHJBVJUKB-UHFFFAOYSA-N 0.000 description 2
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- OFOBLEOULBTSOW-UHFFFAOYSA-N Propanedioic acid Natural products OC(=O)CC(O)=O OFOBLEOULBTSOW-UHFFFAOYSA-N 0.000 description 2
- 239000002253 acid Substances 0.000 description 2
- 229920000122 acrylonitrile butadiene styrene Polymers 0.000 description 2
- 125000003647 acryloyl group Chemical group O=C([*])C([H])=C([H])[H] 0.000 description 2
- 239000000853 adhesive Substances 0.000 description 2
- 230000001070 adhesive effect Effects 0.000 description 2
- 239000000956 alloy Substances 0.000 description 2
- 229910045601 alloy Inorganic materials 0.000 description 2
- 239000002518 antifoaming agent Substances 0.000 description 2
- 125000000484 butyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 2
- 125000004432 carbon atom Chemical group C* 0.000 description 2
- ORTQZVOHEJQUHG-UHFFFAOYSA-L copper(II) chloride Chemical compound Cl[Cu]Cl ORTQZVOHEJQUHG-UHFFFAOYSA-L 0.000 description 2
- ZYGHJZDHTFUPRJ-UHFFFAOYSA-N coumarin Chemical compound C1=CC=C2OC(=O)C=CC2=C1 ZYGHJZDHTFUPRJ-UHFFFAOYSA-N 0.000 description 2
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 2
- 125000003187 heptyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 2
- 125000004051 hexyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 2
- 229910052742 iron Inorganic materials 0.000 description 2
- 238000010030 laminating Methods 0.000 description 2
- 238000003475 lamination Methods 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- VZCYOOQTPOCHFL-UPHRSURJSA-N maleic acid Chemical compound OC(=O)\C=C/C(O)=O VZCYOOQTPOCHFL-UPHRSURJSA-N 0.000 description 2
- 239000011976 maleic acid Substances 0.000 description 2
- 229910052753 mercury Inorganic materials 0.000 description 2
- 125000002347 octyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 2
- 125000001147 pentyl group Chemical group C(CCCC)* 0.000 description 2
- 238000000016 photochemical curing Methods 0.000 description 2
- 238000005498 polishing Methods 0.000 description 2
- BWHMMNNQKKPAPP-UHFFFAOYSA-L potassium carbonate Chemical compound [K+].[K+].[O-]C([O-])=O BWHMMNNQKKPAPP-UHFFFAOYSA-L 0.000 description 2
- 125000001436 propyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])[H] 0.000 description 2
- 238000010526 radical polymerization reaction Methods 0.000 description 2
- 229920005989 resin Polymers 0.000 description 2
- 239000011347 resin Substances 0.000 description 2
- 229910000029 sodium carbonate Inorganic materials 0.000 description 2
- 238000002834 transmittance Methods 0.000 description 2
- 150000007934 α,β-unsaturated carboxylic acids Chemical class 0.000 description 2
- LWHOMMCIJIJIGV-UHFFFAOYSA-N (1,3-dioxobenzo[de]isoquinolin-2-yl) trifluoromethanesulfonate Chemical compound C1=CC(C(N(OS(=O)(=O)C(F)(F)F)C2=O)=O)=C3C2=CC=CC3=C1 LWHOMMCIJIJIGV-UHFFFAOYSA-N 0.000 description 1
- CDUQMGQIHYISOP-RMKNXTFCSA-N (e)-2-cyano-3-phenylprop-2-enoic acid Chemical compound OC(=O)C(\C#N)=C\C1=CC=CC=C1 CDUQMGQIHYISOP-RMKNXTFCSA-N 0.000 description 1
- FWUIHQFQLSWYED-ARJAWSKDSA-N (z)-4-oxo-4-propan-2-yloxybut-2-enoic acid Chemical compound CC(C)OC(=O)\C=C/C(O)=O FWUIHQFQLSWYED-ARJAWSKDSA-N 0.000 description 1
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- KTZVZZJJVJQZHV-UHFFFAOYSA-N 1-chloro-4-ethenylbenzene Chemical compound ClC1=CC=C(C=C)C=C1 KTZVZZJJVJQZHV-UHFFFAOYSA-N 0.000 description 1
- UZKWTJUDCOPSNM-UHFFFAOYSA-N 1-ethenoxybutane Chemical compound CCCCOC=C UZKWTJUDCOPSNM-UHFFFAOYSA-N 0.000 description 1
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- WHFHDVDXYKOSKI-UHFFFAOYSA-N 1-ethenyl-4-ethylbenzene Chemical compound CCC1=CC=C(C=C)C=C1 WHFHDVDXYKOSKI-UHFFFAOYSA-N 0.000 description 1
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- UCSGWEMRGIONEW-UHFFFAOYSA-N 2-(2-chlorophenyl)-4,5-bis(2-methoxyphenyl)-1h-imidazole Chemical class COC1=CC=CC=C1C1=C(C=2C(=CC=CC=2)OC)NC(C=2C(=CC=CC=2)Cl)=N1 UCSGWEMRGIONEW-UHFFFAOYSA-N 0.000 description 1
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- 229920000915 polyvinyl chloride Polymers 0.000 description 1
- 229910000027 potassium carbonate Inorganic materials 0.000 description 1
- HJWLCRVIBGQPNF-UHFFFAOYSA-N prop-2-enylbenzene Chemical compound C=CCC1=CC=CC=C1 HJWLCRVIBGQPNF-UHFFFAOYSA-N 0.000 description 1
- UORVCLMRJXCDCP-UHFFFAOYSA-N propynoic acid Chemical compound OC(=O)C#C UORVCLMRJXCDCP-UHFFFAOYSA-N 0.000 description 1
- 239000011241 protective layer Substances 0.000 description 1
- 150000004053 quinones Chemical class 0.000 description 1
- 150000003839 salts Chemical class 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000003381 stabilizer Substances 0.000 description 1
- 150000005846 sugar alcohols Polymers 0.000 description 1
- 239000004094 surface-active agent Substances 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- LMYRWZFENFIFIT-UHFFFAOYSA-N toluene-4-sulfonamide Chemical compound CC1=CC=C(S(N)(=O)=O)C=C1 LMYRWZFENFIFIT-UHFFFAOYSA-N 0.000 description 1
- LDHQCZJRKDOVOX-UHFFFAOYSA-N trans-crotonic acid Natural products CC=CC(O)=O LDHQCZJRKDOVOX-UHFFFAOYSA-N 0.000 description 1
- DWWMSEANWMWMCB-UHFFFAOYSA-N tribromomethylsulfonylbenzene Chemical compound BrC(Br)(Br)S(=O)(=O)C1=CC=CC=C1 DWWMSEANWMWMCB-UHFFFAOYSA-N 0.000 description 1
- 125000002948 undecyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 238000005406 washing Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
- 238000004804 winding Methods 0.000 description 1
- 229910052724 xenon Inorganic materials 0.000 description 1
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 1
Landscapes
- Manufacturing Of Printed Wiring (AREA)
- Materials For Photolithography (AREA)
- Manufacturing Of Printed Circuit Boards (AREA)
Abstract
Description
本発明は、感光性樹脂組成物、感光性エレメント、レジストパターンの製造方法及びプリント配線板の製造方法に関する。 The present invention relates to a photosensitive resin composition, a photosensitive element, a method for producing a resist pattern, and a method for producing a printed wiring board.
従来、プリント配線板の製造分野において、エッチング及びめっき等に用いられるレジスト材料としては、感光性樹脂組成物およびそれに支持体と保護フィルムを用いて得られる感光性エレメントが広く用いられている。
プリント配線板は、感光性エレメントを銅基板上にラミネートして、パターン露光した後、未露光部分を現像液で除去し、エッチング又はめっき処理を施して、パターンを形成させた後、硬化部分を基板上から剥離除去する方法によって製造されている。
感光性エレメントは、近年のプリント配線板の高密度化及び需要増大に伴い、従来の感光性エレメントに比べて高解像度・高密着性及び高作業性、高歩留化が要求されている。
感度及び解像度・密着性を支配する因子として、感光性樹脂組成物の吸光度が挙げられる。これまでの感光性エレメントの技術では、バインダーポリマ、光重合性モノマ及び光重合開始剤等により解像度・密着性の向上を実現してきたが、未だ十分とは言えない。また、高感度化のためには吸光度を上げる手法が一般的であるが、底部のレジストの硬化性が低下して密着性が悪化する問題点がある。
Conventionally, in the field of manufacturing printed wiring boards, as a resist material used for etching and plating, a photosensitive resin composition and a photosensitive element obtained using a support and a protective film are widely used.
A printed wiring board is formed by laminating a photosensitive element on a copper substrate, pattern exposure, removing the unexposed portion with a developer, etching or plating, forming a pattern, and then curing the cured portion. It is manufactured by a method of peeling off from the substrate.
The photosensitive element is required to have higher resolution, higher adhesion, higher workability, and higher yield than conventional photosensitive elements as the density of printed wiring boards and the demand increase in recent years.
As a factor governing sensitivity, resolution, and adhesion, the absorbance of the photosensitive resin composition can be mentioned. In the conventional photosensitive element technology, improvement of resolution and adhesion has been realized by a binder polymer, a photopolymerizable monomer, a photopolymerization initiator, and the like, but it is still not sufficient. Further, for increasing the sensitivity, a method of increasing the absorbance is common, but there is a problem that the curability of the resist at the bottom is lowered and the adhesion is deteriorated.
本発明は、高感度で且つ解像度及び密着性に優れる感光性樹脂組成物、感光性エレメント、レジストパターンの製造方法及びプリント配線板の製造方法を提供することにある。 An object of the present invention is to provide a photosensitive resin composition, a photosensitive element, a method for producing a resist pattern, and a method for producing a printed wiring board, which are highly sensitive and excellent in resolution and adhesion.
本発明は、[1] (A)バインダーポリマー、(B)エチレン性不飽和光重合性モノマ、(C)光重合開始剤を有する感光性樹脂組成物において、前記(C)光重合開始剤の光照射後の最大吸収波長が、光照射前の最大吸収波長よりも30nm以上低波長側にシフトすることを特徴とする感光性樹脂組成物に関する。
また、本発明は[2] 前記(A)バインダーポリマーが、少なくとも(メタ)アクリル酸及び(メタ)アクリル酸エステルを共重合成分の構成モノマとする前記[1]に記載の感光性樹脂組成物に関する。
また、本発明は[3] 前記(C)光重合開始剤が、オキシムエステル結合を有することを特徴とする前記[1]又は前記[2]に記載の感光性樹脂組成物に関する。
また、本発明は[4] 前記[1]ないし前記[3]のいずれかに記載の感光性樹脂組成物を支持体上に塗布、乾燥してなる感光性エレメントに関する。
また、本発明は[5] 前記[4]に記載の感光性エレメントを、回路形成用基板上に感光性樹脂組成物層が密着するようにして積層し、活性光線を画像状に照射し、露光部を光硬化させ、未露光部を現像により除去することを特徴とするレジストパターンの製造方法に関する。
また、本発明は[6] 前記[5]に記載のレジストパターンの製造方法により、レジストパターンの製造された回路形成用基板をエッチング又はめっきすることを特徴とするプリント配線板の製造方法に関する。
The present invention provides [1] a photosensitive resin composition having (A) a binder polymer, (B) an ethylenically unsaturated photopolymerizable monomer, and (C) a photopolymerization initiator. The present invention relates to a photosensitive resin composition characterized in that the maximum absorption wavelength after light irradiation is shifted to a lower wavelength side by 30 nm or more than the maximum absorption wavelength before light irradiation.
In addition, the present invention provides: [2] The photosensitive resin composition according to [1], wherein the (A) binder polymer includes at least (meth) acrylic acid and (meth) acrylic acid ester as a constituent monomer of a copolymerization component. About.
The present invention also relates to [3] the photosensitive resin composition as described in [1] or [2] above, wherein the (C) photopolymerization initiator has an oxime ester bond.
The present invention also relates to [4] a photosensitive element obtained by coating the photosensitive resin composition according to any one of [1] to [3] on a support and drying.
The present invention also provides [5] the photosensitive element according to the above [4], wherein the photosensitive resin composition layer is laminated on the circuit forming substrate, and irradiated with actinic rays in an image form, The present invention relates to a method for producing a resist pattern, wherein an exposed portion is photocured and an unexposed portion is removed by development.
Moreover, this invention relates to the manufacturing method of the printed wiring board characterized by etching or plating the circuit formation board | substrate with which the resist pattern was manufactured by the manufacturing method of the resist pattern as described in [6] said [5].
本発明の感光性樹脂組成物、これを用いた感光性エレメント、レジストパターンの製造方法及びプリント配線板の製造方法は、高感度且つ解像度及び密着性に優れ、これらを良好にする。 The photosensitive resin composition of the present invention, the photosensitive element using the same, the method for producing a resist pattern, and the method for producing a printed wiring board have high sensitivity, excellent resolution and adhesion, and improve these.
以下、本発明について詳細に説明する。なお、本発明における(メタ)アクリル酸とはアクリル酸及びそれに対応するメタクリル酸を意味し、(メタ)アクリレートとはアクリレート及びそれに対応するメタクリレートを意味し、(メタ)アクリロイル基とはアクリロイル基及びそれに対応するメタクリロイル基を意味する。
本発明の感光性樹脂組成物は、(A)バインダーポリマー、(B)エチレン性不飽和光重合性モノマ、(C)光重合開始剤を有する感光性樹脂組成物において、前記(C)光重合開始剤の光照射後の最大吸収波長が、光照射前の最大吸収波長よりも30nm以上低波長側にシフトすることを特徴とする。
Hereinafter, the present invention will be described in detail. In the present invention, (meth) acrylic acid means acrylic acid and methacrylic acid corresponding thereto, (meth) acrylate means acrylate and corresponding methacrylate, (meth) acryloyl group means acryloyl group and The corresponding methacryloyl group is meant.
The photosensitive resin composition of the present invention comprises (A) a binder polymer, (B) an ethylenically unsaturated photopolymerizable monomer, and (C) a photopolymerization initiator. The maximum absorption wavelength after light irradiation of the initiator is shifted to a lower wavelength side by 30 nm or more than the maximum absorption wavelength before light irradiation.
前記(A)バインダーポリマーは、例えば、重合性単量体をラジカル重合させることにより製造することができる。上記重合性単量体としては、例えば、スチレン、ビニルトルエン、α−メチルスチレン、p−メチルスチレン、p−エチルスチレン、p−メトキシスチレン、p−エトキシスチレン、p−クロロスチレン、p−ブロモスチレン等の重合可能なスチレン誘導体、アクリルアミド、アクリロニトリル、ビニル−n−ブチルエーテル等のビニルアルコールのエステル類、(メタ)アクリル酸アルキルエステル、(メタ)アクリル酸テトラヒドロフルフリルエステル、(メタ)アクリル酸ジメチルアミノエチルエステル、(メタ)アクリル酸ジエチルアミノエチルエステル、(メタ)アクリル酸グリシジルエステル、2,2,2−トリフルオロエチル(メタ)アクリレート、2,2,3,3−テトラフルオロプロピル(メタ)アクリレート、(メタ)アクリル酸、α−ブロモ(メタ)アクリル酸、α−クロル(メタ)アクリル酸、β−フリル(メタ)アクリル酸、β−スチリル(メタ)アクリル酸、マレイン酸、マレイン酸無水物、マレイン酸モノメチル、マレイン酸モノエチル、マレイン酸モノイソプロピル等のマレイン酸モノエステル、フマール酸、ケイ皮酸、α−シアノケイ皮酸、イタコン酸、クロトン酸、プロピオール酸などが挙げられる。
上記(メタ)アクリル酸アルキルエステルとしては、例えば、一般式(I)で表される化合物、これらの化合物のアルキル基に水酸基、エポキシ基、ハロゲン基等が置換した化合物などが挙げられる。
The (A) binder polymer can be produced, for example, by radical polymerization of a polymerizable monomer. Examples of the polymerizable monomer include styrene, vinyltoluene, α-methylstyrene, p-methylstyrene, p-ethylstyrene, p-methoxystyrene, p-ethoxystyrene, p-chlorostyrene, and p-bromostyrene. Polymerizable styrene derivatives such as acrylamide, acrylonitrile, vinyl alcohol esters such as vinyl-n-butyl ether, (meth) acrylic acid alkyl ester, (meth) acrylic acid tetrahydrofurfuryl ester, (meth) acrylic acid dimethylamino Ethyl ester, (meth) acrylic acid diethylaminoethyl ester, (meth) acrylic acid glycidyl ester, 2,2,2-trifluoroethyl (meth) acrylate, 2,2,3,3-tetrafluoropropyl (meth) acrylate, (Meta) Crylic acid, α-bromo (meth) acrylic acid, α-chloro (meth) acrylic acid, β-furyl (meth) acrylic acid, β-styryl (meth) acrylic acid, maleic acid, maleic anhydride, monomethyl maleate And maleic acid monoesters such as monoethyl maleate and monoisopropyl maleate, fumaric acid, cinnamic acid, α-cyanocinnamic acid, itaconic acid, crotonic acid and propiolic acid.
As said (meth) acrylic-acid alkylester, the compound etc. which the hydroxyl group, the epoxy group, the halogen group, etc. substituted the alkyl group of these compounds and the alkyl group of these compounds are mentioned, for example.
上記一般式(I)中のR2で示される炭素数1〜12のアルキル基としては、例えば、メチル基、エチル基、プロピル基、ブチル基、ペンチル基、ヘキシル基、ヘプチル基、オクチル基、ノニル基、デシル基、ウンデシル基、ドデシル基及びこれらの構造異性体が挙げられる。
Examples of the alkyl group having 1 to 12 carbon atoms represented by R 2 in the general formula (I) include a methyl group, an ethyl group, a propyl group, a butyl group, a pentyl group, a hexyl group, a heptyl group, an octyl group, Nonyl group, decyl group, undecyl group, dodecyl group and structural isomers thereof can be mentioned.
上記一般式(I)で表される単量体としては、例えば、(メタ)アクリル酸メチル、(メタ)アクリル酸エチル、(メタ)アクリル酸プロピル、(メタ)アクリル酸ブチル、(メタ)アクリル酸ペンチル、(メタ)アクリル酸ヘキシル、(メタ)アクリル酸ヘプチル、(メタ)アクリル酸オクチル、(メタ)アクリル酸2−エチルヘキシル等が挙げられる。これらは単独で又は2種以上を組み合わせて用いることができる。 Examples of the monomer represented by the general formula (I) include methyl (meth) acrylate, ethyl (meth) acrylate, propyl (meth) acrylate, butyl (meth) acrylate, and (meth) acrylic. Examples include pentyl acid, hexyl (meth) acrylate, heptyl (meth) acrylate, octyl (meth) acrylate, and 2-ethylhexyl (meth) acrylate. These can be used alone or in combination of two or more.
前記(A)バインダーポリマーは、アルカリ現像性の見地から、カルボキシル基を含有させることが好ましく、例えば、カルボキシル基を有する重合性単量体とその他の重合性単量体をラジカル重合させることにより製造することができる。上記カルボキシル基を有する重合性単量体としては、メタクリル酸が好ましい。また、前記(A)バインダーポリマーは、可とう性の見地からスチレン又はスチレン誘導体を重合性単量体として含有させることが好ましい。
上記スチレン又はスチレン誘導体を共重合成分として、密着性及び剥離特性を共に良好にするには、2〜30重量%含むことが好ましく、2〜28重量%含むことがより好ましく、2〜27重量%含むことが特に好ましい。この含有量が2重量%未満では密着性が劣る傾向があり、30重量%を超えると剥離片が大きくなり、剥離時間が長くなる傾向がある。
The binder polymer (A) preferably contains a carboxyl group from the viewpoint of alkali developability, and is produced, for example, by radical polymerization of a polymerizable monomer having a carboxyl group and other polymerizable monomers. can do. As the polymerizable monomer having a carboxyl group, methacrylic acid is preferable. Further, the (A) binder polymer preferably contains styrene or a styrene derivative as a polymerizable monomer from the viewpoint of flexibility.
In order to make both the adhesiveness and the release property good by using the above styrene or styrene derivative as a copolymerization component, it is preferable to contain 2 to 30% by weight, more preferably 2 to 28% by weight, It is particularly preferable to include it. When the content is less than 2% by weight, the adhesion tends to be inferior, and when it exceeds 30% by weight, the peel piece tends to be large and the peel time tends to be long.
これらのバインダーポリマーは、単独で又は2種類以上を組み合わせて使用される。2種類以上を組み合わせて使用する場合のバインダーポリマーとしては、例えば、異なる共重合成分からなる2種類以上のバインダーポリマー、異なる重量平均分子量の2種類以上のバインダーポリマー、異なる分散度の2種類以上のバインダーポリマーなどが挙げられる。また、特開平11−327137号公報記載のマルチモード分子量分布を有するポリマーを使用するもできる。 These binder polymers are used alone or in combination of two or more. As a binder polymer in the case of using two or more types in combination, for example, two or more types of binder polymers comprising different copolymerization components, two or more types of binder polymers having different weight average molecular weights, and two or more types of binder polymers having different degrees of dispersion are used. Examples thereof include a binder polymer. In addition, a polymer having a multimode molecular weight distribution described in JP-A No. 11-327137 can be used.
前記(B)エチレン性不飽和光重合性モノマの例としては、多価アルコールにα,β−不飽和カルボン酸を反応させて得られる化合物、2,2−ビス(4−((メタ)アクリロキシポリエトキシ)フェニル)プロパン、2,2−ビス(4−((メタ)アクリロキシポリプロポキシ)フェニル)プロパン、2,2−ビス(4−((メタ)アクリロキシポリブトキシ)フェニル)プロパン、2,2−ビス(4−((メタ)アクリロキシポリエトキシポリプロポキシ)フェニル)プロパン等のビスフェノールA系(メタ)アクリレート化合物、グリシジル基含有化合物にα、β−不飽和カルボン酸を反応させで得られる化合物、分子内にウレタン結合を有する(メタ)アクリレート化合物等のウレタンモノマー、ノニルフェノキシポリエチレンオキシアクリレート、γ−クロロ−β−ヒドロキシプロピル−β’−(メタ)アクリロイルオキシエチル−o−フタレート、β−ヒドロキシアルキル−β’−(メタ)アクリロイルオキシアルキル−o−フタレート等のフタル酸系化合物、(メタ)アクリル酸アルキルエステル等が挙げられるが、ビスフェノールA系(メタ)アクリレート化合物又は分子内にウレタン結合を有する(メタ)アクリレート化合物を必須成分とすることが好ましい。これらは単独で又は2種類以上を組み合わせて使用される。 Examples of the (B) ethylenically unsaturated photopolymerizable monomer include a compound obtained by reacting a polyhydric alcohol with an α, β-unsaturated carboxylic acid, 2,2-bis (4-((meth) acrylic). Loxypolyethoxy) phenyl) propane, 2,2-bis (4-((meth) acryloxypolypropoxy) phenyl) propane, 2,2-bis (4-((meth) acryloxypolybutoxy) phenyl) propane, By reacting an α, β-unsaturated carboxylic acid with a bisphenol A-based (meth) acrylate compound such as 2,2-bis (4-((meth) acryloxypolyethoxypolypropoxy) phenyl) propane or a glycidyl group-containing compound. Compound obtained, urethane monomer such as (meth) acrylate compound having urethane bond in molecule, nonylphenoxypolyethyleneoxy Phthalate compounds such as acrylate, γ-chloro-β-hydroxypropyl-β ′-(meth) acryloyloxyethyl-o-phthalate, β-hydroxyalkyl-β ′-(meth) acryloyloxyalkyl-o-phthalate, (Meth) acrylic acid alkyl ester and the like can be mentioned, but a bisphenol A-based (meth) acrylate compound or a (meth) acrylate compound having a urethane bond in the molecule is preferably an essential component. These may be used alone or in combination of two or more.
前記(C)光重合開始剤を有する感光性樹脂組成物において、前記(C)光重合開始剤の光照射後の最大吸収波長が、光照射前の最大吸収波長よりも30nm以上低波長側にシフトする化合物の例としては、IRGACURE OXE01、PA−101及びNAI―105の様にオキシムエステルを有する化合物が挙げられる。また、上記光重合開始剤と併せてアクリジン又は分子内に少なくとも1つのアクリジニル基を有するアクリジン系化合物、ベンゾフェノン、N,N’−テトラメチル−4,4’−ジアミノベンゾフェノン(ミヒラーケトン)等のN,N’−テトラアルキル−4,4’−ジアミノベンゾフェノン、アルキルアントラキノン等のキノン類、2−(o−クロロフェニル)−4,5−ジフェニルイミダゾール二量体、2−(o−クロロフェニル)−4,5−ジ(メトキシフェニル)イミダゾール二量体、2−(o−フルオロフェニル)−4,5−ジフェニルイミダゾール二量体、2−(o−メトキシフェニル)−4,5−ジフェニルイミダゾール二量体、2−(p−メトキシフェニル)−4,5−ジフェニルイミダゾール二量体等の2,4,5−トリアリールイミダゾール二量体誘導体、N−フェニルグリシン、N−フェニルグリシン誘導体、クマリン系化合物、オニウム塩などを2種類以上組み合わせて使用される。 In the photosensitive resin composition having the (C) photopolymerization initiator, the maximum absorption wavelength after light irradiation of the (C) photopolymerization initiator is 30 nm or more lower than the maximum absorption wavelength before light irradiation. Examples of compounds that shift include compounds having oxime esters such as IRGACURE OXE01, PA-101 and NAI-105. Also, N, such as acridine or an acridine compound having at least one acridinyl group in the molecule, benzophenone, N, N′-tetramethyl-4,4′-diaminobenzophenone (Michler's ketone) in combination with the photopolymerization initiator Quinones such as N′-tetraalkyl-4,4′-diaminobenzophenone and alkylanthraquinone, 2- (o-chlorophenyl) -4,5-diphenylimidazole dimer, 2- (o-chlorophenyl) -4,5 -Di (methoxyphenyl) imidazole dimer, 2- (o-fluorophenyl) -4,5-diphenylimidazole dimer, 2- (o-methoxyphenyl) -4,5-diphenylimidazole dimer, 2 2,4,5-triphenyl such as-(p-methoxyphenyl) -4,5-diphenylimidazole dimer Reel imidazole dimer derivatives, N- phenylglycine, N- phenylglycine derivatives, coumarin-based compounds are used in combination, such as onium salts of two or more.
前記(A)バインダーポリマーの配合量は、(A)成分及び(B)成分の総量100重量部に対して、40〜80重量部であることが好ましく、45〜70重量部であることがより好ましい。この配合量が40重量部未満では光硬化物が脆くなり易く、感光性エレメントとして用いた場合に塗膜性が劣る傾向があり、80重量部を超えると光感度が不充分となる傾向がある。 The blending amount of the (A) binder polymer is preferably 40 to 80 parts by weight and more preferably 45 to 70 parts by weight with respect to 100 parts by weight of the total amount of the components (A) and (B). preferable. If this blending amount is less than 40 parts by weight, the photocured product tends to be brittle, and when used as a photosensitive element, the coating properties tend to be inferior, and if it exceeds 80 parts by weight, the photosensitivity tends to be insufficient. .
前記(B)エチレン性不飽和光重合性モノマの配合量は、(A)成分及び(B)成分の総量100重量部に対して、20〜60重量部であることが好ましく、30〜55重量部であることがより好ましい。この配合量が20重量部未満では光感度が不充分となる傾向があり、60重量部を超えると光硬化物が脆くなる傾向がある。 The blending amount of the (B) ethylenically unsaturated photopolymerizable monomer is preferably 20 to 60 parts by weight, and 30 to 55 parts by weight with respect to 100 parts by weight of the total amount of the components (A) and (B). More preferably, it is a part. If this amount is less than 20 parts by weight, the photosensitivity tends to be insufficient, and if it exceeds 60 parts by weight, the photocured product tends to be brittle.
前記(C)光重合開始剤の配合量は、感光性樹脂組成物の吸光度が露光(光照射)前において0〜2.0の範囲内に入る重量部であることが好ましく、更に露光前の吸光度が0.3〜1.0の範囲内に入る重量部であることがなお好ましい。この際、露光後の吸光度は露光前の吸光度以下になることが好ましく、更に露光後の吸光度は0になるのが最も好ましい。但し、この際の露光量は1〜500mJ/cm2で、照射光の波長は200nm〜600nmの範囲内のものとする。
露光前の吸光度が0.3未満では光感度が不充分となり、解像度が悪化する傾向がある。また、光透過率が高すぎることで、下地の銅基板によるハレーション効果が生じ、レジストの底部が太くなる傾向がある。逆に、露光前の吸光度が2.0を超えると、露光の際に組成物の表面での吸収が増大して内部の光硬化が不充分となる傾向がある。
また、露光後の吸光度が露光前以上になると、露光量が増加するのに伴い光透過率が下がることで内部の光硬化が不充分となり、好ましくない。
The blending amount of the photopolymerization initiator (C) is preferably a part by weight in which the absorbance of the photosensitive resin composition falls within the range of 0 to 2.0 before exposure (light irradiation), and further before exposure. It is still more preferable that the absorbance is within the range of 0.3 to 1.0. At this time, the absorbance after exposure is preferably less than the absorbance before exposure, and the absorbance after exposure is most preferably 0. However, the exposure amount in this case is 1 to 500 mJ / cm 2 , and the wavelength of the irradiation light is in the range of 200 nm to 600 nm.
If the absorbance before exposure is less than 0.3, the photosensitivity becomes insufficient and the resolution tends to deteriorate. Further, since the light transmittance is too high, a halation effect is caused by the underlying copper substrate, and the bottom of the resist tends to be thick. On the other hand, if the absorbance before exposure exceeds 2.0, absorption at the surface of the composition during exposure tends to increase and internal photocuring tends to be insufficient.
On the other hand, if the absorbance after exposure is higher than that before exposure, the light transmittance decreases as the exposure amount increases, and the internal photocuring becomes insufficient, which is not preferable.
前記感光性樹脂組成物には、必要に応じて、分子内に少なくとも1つのカチオン重合可能な環状エーテル基を有する光重合性化合物、カチオン重合開始剤、マラカイトグリーン等の染料、トリブロモメチルフェニルスルホン、ロイコクリスタルバイオレット等の光発色剤、熱発色防止剤、p−トルエンスルホンアミド等の可塑剤、顔料、充填剤、消泡剤、難燃剤、安定剤、密着性付与剤、レベリング剤、剥離促進剤、酸化防止剤、香料、イメージング剤、熱架橋剤などを(A)成分及び(B)成分の総量100重量部に対して各々0.01〜20重量部程度含有することができる。これらは単独で又は2種類以上を組み合わせて使用される。 The photosensitive resin composition includes a photopolymerizable compound having at least one cationically polymerizable cyclic ether group in the molecule, a cationic polymerization initiator, a dye such as malachite green, tribromomethylphenylsulfone, if necessary. , Photochromic agents such as leuco crystal violet, thermochromic inhibitors, plasticizers such as p-toluenesulfonamide, pigments, fillers, antifoaming agents, flame retardants, stabilizers, adhesion-imparting agents, leveling agents, peeling promotion An agent, an antioxidant, a fragrance, an imaging agent, a thermal crosslinking agent and the like can be contained in an amount of about 0.01 to 20 parts by weight with respect to 100 parts by weight of the total amount of the component (A) and the component (B). These may be used alone or in combination of two or more.
前記感光性樹脂組成物は、必要に応じて、メタノール、エタノール、アセトン、メチルエチルケトン、メチルセロソルブ、エチルセロソルブ、トルエン、N,N−ジメチルホルムアミド、プロピレングリコールモノメチルエーテル等の有機溶剤又はこれらの混合溶剤に溶解して固形分30〜60重量%程度の溶液として塗布することができる。 The photosensitive resin composition may be added to an organic solvent such as methanol, ethanol, acetone, methyl ethyl ketone, methyl cellosolve, ethyl cellosolve, toluene, N, N-dimethylformamide, propylene glycol monomethyl ether, or a mixed solvent thereof as necessary. It can melt | dissolve and can apply | coat as a solution about 30 to 60 weight% of solid content.
前記感光性樹脂組成物は、特に制限はないが、銅、銅系合金、鉄、鉄系合金等の金属面上に、液状レジストとして塗布して乾燥後、必要に応じて保護フィルムを被覆して用いるか、感光性エレメントの形態で用いられることが好ましい。
また、感光性樹脂組成物層の厚みは、用途により異なるが、乾燥後の厚みで1〜100μm程度であることが好ましい。液状レジストに保護フィルムを被覆して用いる場合は、保護フィルムとして、ポリエチレン、ポリプロピレン等の重合体フィルムなどが挙げられる。
The photosensitive resin composition is not particularly limited, but is coated as a liquid resist on a metal surface such as copper, a copper-based alloy, iron, and an iron-based alloy, dried, and then covered with a protective film as necessary. Or used in the form of a photosensitive element.
Moreover, although the thickness of the photosensitive resin composition layer changes with uses, it is preferable that it is about 1-100 micrometers by the thickness after drying. In the case of using a liquid resist coated with a protective film, examples of the protective film include polymer films such as polyethylene and polypropylene.
上記感光性エレメントは、例えば、支持体として、ポリエチレンテレフタレート、ポリプロピレン、ポリエチレン、ポリエステル等の重合体フィルム上に感光性樹脂組成物を塗布、乾燥することにより得ることができる。上記塗布は、例えば、ロールコータ、コンマコータ、グラビアコータ、エアーナイフコータ、ダイコータ、バーコータ等の公知の方法で行うことができる。また、乾燥は、70〜150℃、5〜30分間程度で行うことができる。
これらの重合体フィルムの厚みは、1〜100μmとすることが好ましい。これらの重合体フィルムの一つは感光性樹脂組成物層の支持体として、他の一つは感光性樹脂組成物の保護フィルムとして感光性樹脂組成物層の両面に積層してもよい。保護フィルムとしては、感光性樹脂組成物層及び支持体の接着力よりも、感光性樹脂組成物層及び保護フィルムの接着力の方が小さいものが好ましく、また、低フィッシュアイのフィルムが好ましい。
また、前記感光性エレメントは、感光性樹脂組成物層、支持体及び保護フィルムの他に、クッション層、接着層、光吸収層、ガスバリア層等の中間層や保護層を有していてもよい。
The photosensitive element can be obtained, for example, by applying and drying a photosensitive resin composition on a polymer film such as polyethylene terephthalate, polypropylene, polyethylene, or polyester as a support. The application can be performed by a known method such as a roll coater, a comma coater, a gravure coater, an air knife coater, a die coater, or a bar coater. Moreover, drying can be performed at 70-150 degreeC and about 5 to 30 minutes.
The thickness of these polymer films is preferably 1 to 100 μm. One of these polymer films may be laminated on both sides of the photosensitive resin composition layer as a support for the photosensitive resin composition layer, and the other as a protective film for the photosensitive resin composition. As the protective film, those having a smaller adhesive strength between the photosensitive resin composition layer and the protective film than the adhesive strength between the photosensitive resin composition layer and the support are preferable, and a film having a low fish eye is preferable.
In addition to the photosensitive resin composition layer, the support and the protective film, the photosensitive element may have an intermediate layer or protective layer such as a cushion layer, an adhesive layer, a light absorption layer, or a gas barrier layer. .
前記感光性エレメントは、例えば、そのまま又は感光性樹脂組成物層の他の面に保護フィルムをさらに積層して円筒状の巻芯に巻きとって貯蔵される。なお、この際支持体が1番外側になるように巻き取られることが好ましい。上記ロール状の感光性エレメントロールの端面には、端面保護の見地から端面セパレータを設置することが好ましく、耐エッジフュージョンの見地から防湿端面セパレータを設置することが好ましい。また、梱包方法として、透湿性の小さいブラックシートに包んで包装することが好ましい。
上記巻芯としては、例えば、ポリエチレン樹脂、ポリプロピレン樹脂、ポリスチレン樹脂、ポリ塩化ビニル樹脂、ABS樹脂(アクリロニトリル−ブタジエン−スチレン共重合体)等のプラスチックなどが挙げられる。
The photosensitive element is stored, for example, as it is or after a protective film is further laminated on the other surface of the photosensitive resin composition layer and wound around a cylindrical core. In addition, it is preferable to wind up so that a support body may become the 1st outer side at this time. An end face separator is preferably installed on the end face of the roll-shaped photosensitive element roll from the viewpoint of end face protection, and a moisture-proof end face separator is preferably installed from the viewpoint of edge fusion resistance. Moreover, as a packing method, it is preferable to wrap and package in a black sheet with low moisture permeability.
Examples of the winding core include plastics such as polyethylene resin, polypropylene resin, polystyrene resin, polyvinyl chloride resin, and ABS resin (acrylonitrile-butadiene-styrene copolymer).
上記感光性エレメントを用いてレジストパターンを製造するに際しては、前記の保護フィルムが存在している場合には、保護フィルムを除去後、感光性樹脂組成物層を70〜130℃程度に加熱しながら回路形成用基板に0.1〜1MPa程度(1〜10kgf/cm2程度)の圧力で圧着することにより積層する方法などが挙げられ、減圧下で積層することも可能である。積層される表面は、通常金属面であるが、特に制限はない。
このようにして積層が完了した感光性樹脂組成物層は、ネガ又はポジマスクパターンを通して活性光線が画像状に照射される。上記活性光線の光源としては、公知の光源、例えば、カーボンアーク灯、水銀蒸気アーク灯、高圧水銀灯、キセノンランプ等の紫外線、可視光などを有効に放射するものが用いられる。
次いで、露光後、感光性樹脂組成物層上に支持体が存在している場合には、支持体を除去した後、アルカリ性水溶液、水系現像液、有機溶剤等の現像液によるウエット現像、ドライ現像等で未露光部を除去して現像し、レジストパターンを製造することができる。上記アルカリ性水溶液としては、例えば、0.1〜5重量%炭酸ナトリウムの希薄溶液、0.1〜5重量%炭酸カリウムの希薄溶液、0.1〜5重量%水酸化ナトリウムの希薄溶液等が挙げられる。上記アルカリ性水溶液のpHは9〜11の範囲とすることが好ましく、その温度は、感光性樹脂組成物層の現像性に合わせて調節される。また、アルカリ性水溶液中には、表面活性剤、消泡剤、有機溶剤等を混入させてもよい。上記現像の方式としては、例えば、ディップ方式、スプレー方式、ブラッシング、スラッピング等が挙げられる。
現像後の処理として、必要に応じて60〜250℃程度の加熱又は0.2〜10J/cm2程度の露光を行うことによりレジストパターンをさらに硬化して用いてもよい。
In producing a resist pattern using the photosensitive element, if the protective film is present, the protective film is removed and then the photosensitive resin composition layer is heated to about 70 to 130 ° C. For example, a method of laminating by pressure bonding to a circuit forming substrate at a pressure of about 0.1 to 1 MPa (about 1 to 10 kgf / cm 2 ) may be mentioned, and the lamination may be performed under reduced pressure. The surface to be laminated is usually a metal surface, but is not particularly limited.
The photosensitive resin composition layer thus laminated is irradiated with actinic rays in an image form through a negative or positive mask pattern. As the light source of the actinic light, a known light source, for example, a light source that effectively emits ultraviolet light, visible light, or the like, such as a carbon arc lamp, a mercury vapor arc lamp, a high-pressure mercury lamp, or a xenon lamp is used.
Next, after exposure, when a support is present on the photosensitive resin composition layer, the support is removed, and then wet development or dry development with a developer such as an alkaline aqueous solution, an aqueous developer, or an organic solvent. The resist pattern can be manufactured by removing the unexposed portion with development or the like and developing. Examples of the alkaline aqueous solution include a dilute solution of 0.1 to 5 wt% sodium carbonate, a dilute solution of 0.1 to 5 wt% potassium carbonate, a dilute solution of 0.1 to 5 wt% sodium hydroxide, and the like. It is done. The pH of the alkaline aqueous solution is preferably in the range of 9 to 11, and the temperature is adjusted according to the developability of the photosensitive resin composition layer. Further, a surfactant, an antifoaming agent, an organic solvent, or the like may be mixed in the alkaline aqueous solution. Examples of the development method include a dip method, a spray method, brushing, and slapping.
As the treatment after development, the resist pattern may be further cured and used by heating at about 60 to 250 ° C. or exposure at about 0.2 to 10 J / cm 2 as necessary.
現像後に行われる金属面のエッチングには、例えば、塩化第二銅溶液、塩化第二鉄溶液、アルカリエッチング溶液等を用いることができる。
本発明の感光性エレメントを用いてプリント配線板を製造する場合、現像されたレジストパターンをマスクとして、回路形成用基板の表面を、エッチング、めっき等の公知方法で処理する。上記めっき法としては、例えば、銅めっき、はんだめっき、ニッケルめっき、金めっきなどがある。次いで、レジストパターンは、例えば、現像に用いたアルカリ性水溶液よりさらに強アルカリ性の水溶液で剥離することができる。上記強アルカリ性の水溶液としては、例えば、1〜10重量%水酸化ナトリウム水溶液、1〜10重量%水酸化カリウム水溶液等が用いられる。上記剥離方式としては、例えば、浸漬方式、スプレイ方式等が挙げられる。また、レジストパターンが形成されたプリント配線板は、多層プリント配線板でもよく、小径スルーホールを有していてもよい。
For the etching of the metal surface performed after development, for example, a cupric chloride solution, a ferric chloride solution, an alkaline etching solution, or the like can be used.
When a printed wiring board is produced using the photosensitive element of the present invention, the surface of the circuit forming substrate is treated by a known method such as etching or plating using the developed resist pattern as a mask. Examples of the plating method include copper plating, solder plating, nickel plating, and gold plating. Next, the resist pattern can be peeled with a stronger alkaline aqueous solution than the alkaline aqueous solution used for development, for example. As said strong alkaline aqueous solution, 1-10 weight% sodium hydroxide aqueous solution, 1-10 weight% potassium hydroxide aqueous solution, etc. are used, for example. Examples of the peeling method include an immersion method and a spray method. The printed wiring board on which the resist pattern is formed may be a multilayer printed wiring board or may have a small diameter through hole.
以下、本発明を実施例により具体的に説明する。
(実施例1、2及び比較例1〜3)
表1及び表2に示した材料を配合し、感光性樹脂組成物溶液を得た。
Hereinafter, the present invention will be specifically described by way of examples.
(Examples 1 and 2 and Comparative Examples 1 to 3)
The materials shown in Table 1 and Table 2 were blended to obtain a photosensitive resin composition solution.
なお、表1及び表2において使用した材料を下記に示す。
BPE−500:下記式において、m+n=10(平均値)である化合物(新中村化学工業株式会社製商品名)
In addition, the material used in Table 1 and Table 2 is shown below.
BPE-500: a compound in which m + n = 10 (average value) in the following formula (trade name, manufactured by Shin-Nakamura Chemical Co., Ltd.)
M−113:下記式で示されるノニルフェニルポリエチレン変性アクリレート
(東亜合成化学株式会社製商品名)
M-113: Nonylphenyl polyethylene modified acrylate represented by the following formula (trade name, manufactured by Toagosei Co., Ltd.)
IRGACURE OXE01:下記式で示されるオキシムエステル化合物
(チバ・スペシャルケミカルズ株式会社製商品名)
IRGACURE OXE01: an oxime ester compound represented by the following formula (trade name, manufactured by Ciba Special Chemicals Co., Ltd.)
PAI−101:下記式で示されるオキシムエステル化合物
(みどり化学株式会社製商品名)
PAI-101: Oxime ester compound represented by the following formula (trade name, manufactured by Midori Chemical Co., Ltd.)
次いで、得られた感光性樹脂組成物の溶液を、16μm厚のポリエチレンテレフタレートフィルム(帝人株式会社製商品名G2−16)上に均一に塗布し、100℃の熱風対流式乾燥機で10分間乾燥した後、ポリエチレン製保護フィルム(タマポリ株式会社製商品名NF−13)で保護し感光性エレメントを得た。感光性樹脂組成物層の乾燥後の膜厚は40μmであった。
次いで、銅箔(厚み35μm)を両面に積層したガラスエポキシ材である銅張積層板(日立化成工業株式会社製商品名MCL−E−61)の銅表面を#600相当のブラシを持つ研磨機(三啓株式会社製)を用いて研磨し、水洗後、空気流で乾燥し、得られた銅張積層板を80℃に加温し、その銅表面上に前記感光性樹脂組成物層を保護フィルムを剥がしながら120℃のヒートロールを用い1.5m/分の速度でラミネートした。
次に、高圧水銀灯ランプを有する露光機(オーク株式会社製商品名HMW−201B)を用いて、ネガとしてストーファー21段ステップタブレットを試験片の上に置いて露光した。
Next, the obtained photosensitive resin composition solution was uniformly applied onto a 16 μm-thick polyethylene terephthalate film (trade name G2-16, manufactured by Teijin Ltd.), and dried for 10 minutes with a 100 ° C. hot air convection dryer. Then, it was protected with a polyethylene protective film (trade name NF-13, manufactured by Tamapoly Co., Ltd.) to obtain a photosensitive element. The film thickness after drying of the photosensitive resin composition layer was 40 μm.
Next, a polishing machine having a brush equivalent to # 600 on the copper surface of a copper clad laminate (trade name MCL-E-61, manufactured by Hitachi Chemical Co., Ltd.), which is a glass epoxy material in which copper foil (thickness 35 μm) is laminated on both sides. (Sankei Co., Ltd.) was used for polishing, washing with water, and drying with an air stream. The obtained copper-clad laminate was heated to 80 ° C., and the photosensitive resin composition layer was placed on the copper surface. Lamination was carried out at a speed of 1.5 m / min using a 120 ° C. heat roll while peeling off the protective film.
Next, using an exposure machine (trade name HMW-201B, manufactured by Oak Co., Ltd.) having a high-pressure mercury lamp lamp, a stove 21-step tablet was placed on the test piece as a negative and exposed.
次に、ポリエチレンテレフタレートフィルムを剥離し、30℃で1重量%炭酸ナトリウム水溶液をスプレーし(スプレー(現像)時間:最少現像時間×2)、未露光部分を除去した後、銅張積層板上に形成された光硬化膜のステップタブレットの段数(x/21)を測定し、ST=8/21を示す露光量を光感度とした。この露光量が小さいほど、光感度が高いことを示す。
最少現像時間は未露光部のレジストが現像処理によって完全に除去された時間を測定した。
解像度は、ストーファーの21段ステップタブレットを有するフォトツールと解像度評価用ネガとしてスペース幅/ライン幅が30/400〜200/400(単位:μm)の配線パターンを有するフォトツールを密着させ、ストーファーの21段ステップタブレットの現像(現像時間:最少現像時間×2)後における残存ステップ段数が8.0となるエネルギー量で露光を行った。ここで、解像度は、現像処理によって未露光部をきれいに除去することができたライン幅間のスペース幅の最も小さい値により評価した。解像度の評価は数値が小さいほど良好な値である。
密着性は、ストーファーの21段ステップタブレットを有するフォトツールと密着性評価用ネガとしてライン幅/スペース幅が30/400〜200/400(単位:μm)の配線パターンを有するフォトツールを密着させ、ストーファーの21段ステップタブレットの現像(現像時間:最少現像時間×2)後における残存ステップ段数が8.0となるエネルギー量で露光を行った。ここで密着性は、現像後、ラインを形成しているレジストが基板にしっかりと密着していて剥がれている箇所が無く、また、ラインが蛇行していたり、曲がったりしていないライン幅の最も小さい値により評価した。密着性の評価は数値が小さいほど良好な値である。また、光重合開始剤の光照射前後の最大吸収波長(nm)を測定し、それらの結果をまとめて表3に示した。
Next, the polyethylene terephthalate film is peeled off and sprayed with a 1% by weight sodium carbonate aqueous solution at 30 ° C. (spray (development) time: minimum development time × 2), and after removing the unexposed part, on the copper clad laminate. The number of steps (x / 21) of the step tablet of the formed photocured film was measured, and the exposure amount indicating ST = 8/21 was defined as photosensitivity. It shows that photosensitivity is so high that this exposure amount is small.
The minimum development time was measured as the time when the unexposed resist was completely removed by the development process.
As for resolution, a photo tool having a stove 21-step tablet and a photo tool having a wiring pattern with a space width / line width of 30/400 to 200/400 (unit: μm) are closely attached as a negative for resolution evaluation. Exposure was carried out with an energy amount such that the number of steps remaining after development of the 21-step tablet of fur (development time: minimum development time × 2) was 8.0. Here, the resolution was evaluated based on the smallest value of the space width between the line widths in which the unexposed portion could be cleanly removed by the development process. The smaller the numerical value, the better the resolution evaluation.
Adhesion is achieved by adhering a phototool having a stove 21-step tablet and a phototool having a wiring pattern with a line width / space width of 30/400 to 200/400 (unit: μm) as a negative for adhesion evaluation. The exposure was carried out with an energy amount such that the number of remaining step steps after development (development time: minimum development time × 2) of the 21-step tablet of Stöffer was 8.0. Here, after the development, the resist forming the line is firmly attached to the substrate so that there is no part where the resist is peeled off, and the line width is the most where the line does not meander or bend. Evaluation was based on small values. The smaller the numerical value, the better the evaluation of adhesion. Moreover, the maximum absorption wavelength (nm) before and behind light irradiation of a photoinitiator was measured, and those results were collectively shown in Table 3.
表3から明らかなように、実施例1、2は高感度で且つ解像度・密着性が優れている。
As is apparent from Table 3, Examples 1 and 2 have high sensitivity and excellent resolution and adhesion.
Claims (6)
A method for producing a printed wiring board, comprising etching or plating a circuit forming substrate on which a resist pattern has been produced by the method for producing a resist pattern according to claim 5.
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Cited By (2)
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JP2007192892A (en) * | 2006-01-17 | 2007-08-02 | Fujifilm Corp | Dye-containing negative curable composition, color filter and method for producing the same |
JP2012220794A (en) * | 2011-04-11 | 2012-11-12 | Hitachi Chem Co Ltd | Photosensitive resin composition, photosensitive element, method for producing resist pattern, method for manufacturing printed wiring board, and printed wiring |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
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JP2007192892A (en) * | 2006-01-17 | 2007-08-02 | Fujifilm Corp | Dye-containing negative curable composition, color filter and method for producing the same |
JP2012220794A (en) * | 2011-04-11 | 2012-11-12 | Hitachi Chem Co Ltd | Photosensitive resin composition, photosensitive element, method for producing resist pattern, method for manufacturing printed wiring board, and printed wiring |
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