JP2005098777A - Inspection device - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide an inspection device capable of solving problems caused by the storage place of a defective sample display device. <P>SOLUTION: When inspection results 51 to the number of 20 are acquired in a sample irregul inspection, when the first defective sample image is displayed by the first defective sample data at the delivery time and inspection results 52 to the number of 20 are also acquired in inspection, before the start of work; and it is determined that this inspection device 1 is operated normally, and the image is displayed on, for example, an inspection monitor 41. When inspection results 53 to the number of 40 are acquired in the inspection before start of work, although inspection results 51 to the number of 20 have been acquired in the sample irregularity inspection at the delivery time, it is determined that the inspection device 1 has not operated normally, and a confirmation work of each place of the inspection device 1 is urged. <P>COPYRIGHT: (C)2005,JPO&NCIPI

Description

  The present invention relates to an inspection apparatus that inspects a display image on a display apparatus and has a self-diagnosis function.

  Conventionally, when inspecting a display device such as a plasma display or a liquid crystal monitor, an inspection device 101 is used as shown in FIG. 10, and the inspection device 101 outputs a display signal to the display device. An image is displayed, and this image is input by a camera (not shown) and subjected to inspection processing for the presence / absence of unevenness, whereby a display image on the display device can be detected.

  When starting inspection or periodic inspection in the inspection device 101, the defective sample display device 112 in which unevenness or the like has occurred from the back surface of the lighting device 111 can be inserted and erected so that the defective sample display device 112 can be set. It is configured.

  As a result, a plurality of previously prepared defective sample display devices 112 are sequentially replaced and set so that inspection by each defective sample display device 112 can be performed. The operation state of the inspection apparatus 101 is confirmed based on whether or not a defective is detected.

  However, in such a conventional inspection apparatus 101, it is necessary to prepare a plurality of defective sample display devices 112 for inspection, and there is a problem that a large storage place is required for storing the defective sample display devices. there were.

  The present invention has been made in view of such conventional problems, and an object of the present invention is to provide an inspection apparatus that can solve the occurrence of problems caused by the storage location of a defective sample display device. is there.

  In order to solve the above-described problems, in the inspection apparatus of the present invention, in the inspection apparatus that outputs a display signal to the display device to display an image, and inputs the image with a camera to inspect the display image , Defective sample data for displaying a defective sample image on the display device, storage means for storing a defective sample inspection result obtained when the defective sample image is displayed with the defective sample data, and the defective sample data The defective sample image display means for displaying the defective sample image in step, the inspection means for inputting the displayed defective sample image with the camera and performing the inspection processing, and the inspection result in the inspection processing means for the defect Self-diagnosis means for evaluating the operating state in comparison with the defective sample inspection result obtained when displaying the sample image, That.

  That is, when starting inspection or periodic inspection with this inspection device, the defective sample image is displayed on a normal display device using the defective sample data stored in the storage means, and the displayed defective sample image is displayed. Input with the camera and perform the inspection process. Then, the operation result is evaluated by comparing the inspection result obtained by this inspection process with the defective sample inspection result stored in the storage means.

  At this time, if the inspection result matches the defective sample inspection result, or the difference is within an allowable range, it is determined that the inspection apparatus is operating normally. Further, when there is a large difference between the inspection result and the defective sample inspection result, it is determined that the inspection apparatus is not operating normally.

  As described above, in the inspection apparatus of the present invention, by using the defective sample data stored in the storage means and the defective sample inspection result obtained from the defective sample image displayed with the defective sample data, It can be determined whether or not the inspection apparatus is operating normally.

  Thus, the self-diagnosis of the inspection device can be performed without using the defective sample display device in which the failure has occurred. For this reason, it is possible to obtain the same effect as in the case where the inspection is performed with a plurality of defective sample display devices only by preparing a plurality of the defective sample data and the defective sample inspection results. Therefore, compared with the case where storage of a plurality of defective sample display devices is required, a large storage place is not required.

  In addition, the inspection time can be shortened as compared with the conventional case where replacement to a plurality of defective sample display devices is necessary.

  Hereinafter, an embodiment of the present invention will be described with reference to the drawings. FIG. 1 is a diagram showing an inspection apparatus 1 according to the present embodiment. The inspection apparatus 1 includes a lighting device on which a display apparatus 2 such as a plasma display or a liquid crystal monitor is set, as in the conventional example. (Not shown). The inspection device 1 outputs a display signal to the display device 2 set in the lighting device to display an image, acquires the display image, and performs an inspection process for the presence or absence of unevenness to perform the display. This is a device for detecting a display image on the device 2.

  The inspection apparatus 1 is mainly configured of an inspection PC 11, and the inspection PC 11 includes a hard disk as a storage device. The hard disk stores in advance the first to fifty defective sample data for displaying the first to fifty defective sample images on the display device 2, and displays the defective sample image with each defective sample data. A storage area for storing the first to fifty defective sample inspection results obtained at the time of making is associated with each defective sample data and secured.

  A lighting control unit 12 is connected to the inspection PC 11, and a display signal can be output to the display device 2 via the lighting control unit 12. As a result, an image corresponding to the signal from the inspection PC 11 is displayed on the display screen 13 of the display device 2 so that inspection of unevenness and the like occurring in the display device 2 can be performed.

  In addition, the inspection apparatus 1 includes a CCD camera 21 that captures a display on the display device 2. The CCD camera 21 is connected to the inspection PC 11 via a camera interface 22, and is configured so that an image photographed by the CCD camera 21 is sent to the inspection PC 11.

  The CCD camera 21 is supported via an XZ stage, and the XZ stage is configured to be driven by a drive signal from a drive unit 31. The drive unit 31 is connected to the inspection PC 11 and is configured to move the CCD camera 21 by driving the XZ stage with a control signal from the inspection PC 11.

  The inspection PC 11 is configured to operate according to a program stored therein, and uses display control on the display device 2, drive control of the CCD camera 21, and images acquired by the CCD camera 21. The inspection process is performed and the inspection result is output to the inspection monitor 41 and displayed.

  This embodiment according to the above configuration will be described with reference to the flowcharts shown in FIGS.

  That is, in the delivery data storage process performed when the inspection device 1 is delivered, the display device 2 conveyed by the conveyor is set in the lighting device (S1), and a display signal is output to the display device 2 via the lighting control unit 12. Then, the display device 2 is turned on in the uniform white, black, red, green, and blue colors on the entire surface (S2), and a visual inspection is performed by an inspector (S3). In this visual inspection, when unevenness or the like is found in the display image, the display device 2 is removed from the lighting device (S4), and the process returns to step S1 to perform a visual inspection of the next display device 2. In the visual inspection in step S3, when no unevenness is found in the display image and the display device 2 is non-defective, the process proceeds to step S5.

  In step S5, one defective sample data stored in the hard disk is output to the display device 2 via the lighting control unit 12, and the display device 2 displays a calibration image including a uniform white image. At the same time (S5), the calibration image displayed on the display device 2 is picked up by the CCD camera 21 and input via the camera interface 22 (S6). Then, calibration data (1) as a defective sample inspection result is created from the image input by the CCD camera 21, and the calibration data (1) is stored in the hard disk in association with the calibration image. (S7). This calibration is performed so that the luminance distribution of the input image becomes uniform.

  Then, after setting the internal counter n to 1 (S8), the n-th defective sample data is read from the hard disk and the n-th defective sample image is displayed on the display device 2 (S9) and displayed on the display device 2 The n-th defective sample image thus inputted is inputted through the CCD camera 21 and the camera interface 22 (S10), and the inputted image is analyzed to perform the unevenness inspection (S11).

  In this unevenness inspection, as shown in FIG. 4, the inspection result is output with a maximum of 50 points. Specifically, when the input image is viewed, 0 points are displayed when “unevenness is not visible”, 10 points are “slightly visible”, 20 points are “visible but not worrisome”, “Not to be” is output as 30 points, “I get in the way” is 40 points, and “Very disturbing” is output as 50 points. Is output.

  After obtaining the score output in the unevenness inspection as the nth defective sample inspection result and storing the nth defective sample result in the hard disk in association with the nth defective sample data (S12), It is determined whether or not the counter n is 50 (S13). If the counter n is not 50, the counter n is incremented by 1 and counted up, and then the process branches to step S9 to execute the above processes. repeat.

  In step S13, when the counter n reaches 50, the display device 2 is removed from the lighting device (S14), and the display device 2 is stored in a storage place as a reference display device (S15). The delivery data storage process is terminated.

  Next, when the inspection device 1 is inspected before the start of work, as shown in FIGS. 5 and 6, the display device 2 conveyed by the conveyor is set in the lighting device (SB1), and the lighting control unit 12 is used. Then, a display signal is output to the display device 2 so that the display device 2 is lit in uniform colors of white, black, red, green and blue (SB2), and a visual inspection is performed by an inspector (SB3). . In this visual inspection, when unevenness or the like is found in the display image, the display device 2 is removed from the lighting device (SB4), and the process returns to step S1 to perform a visual inspection of the next display device 2. In the visual inspection in step SB3, when no irregularity is found in the display image and the display device 2 is a non-defective product, the process proceeds to step SB5.

  In step SB5, one defective sample data stored in the hard disk is output to the display device 2 via the lighting control unit 12, and the display device 2 displays a calibration image composed of a uniform white image. At the same time (SB5), the calibration image displayed on the display device 2 is picked up by the CCD camera 21 and input via the camera interface 22 (SB6). Then, calibration data (2) as a defective sample inspection result is created from the image input by the CCD camera 21, and the calibration data (2) is stored in the hard disk in association with the calibration image. (SB7).

  Then, after the internal counter n is set to 1 (SB8), the nth defective sample data is read from the hard disk and the nth defective sample image is displayed on the display device 2 (SB9) and displayed on the display device 2. The n-th defective sample image that has been input is input via the CCD camera 21 and the camera interface 22 (SB10), and the input image is analyzed to perform unevenness inspection (SB11).

  In this unevenness inspection, as described above, since the inspection result is output with a maximum of 50 points, the output score is obtained as the nth defective sample inspection result, and the nth defective sample result is obtained as the above-mentioned nth defective sample result. After being stored in the buffer area of the hard disk in association with n defective sample data (SB12), it is determined whether or not the counter n is 50 (SB13). If the counter n is not 50, the counter n is After adding 1 and counting up, the process branches to step SB9 to repeat the processes.

  In step SB13, when the counter n reaches 50, the first to fifty defective sample inspection results stored in the hard disk in the delivery data storage process and the current hard disk buffer area are stored. It is compared whether the first to fifty defective sample inspection results are the same (SB14).

  At this time, if the inspection results are different, it is determined that the inspection apparatus 1 is not operating normally, and this is displayed on the inspection monitor 41 to prompt confirmation of each place, and the substrate, wiring, etc. of the inspection apparatus 1 The state of the input / output circuit is confirmed (SB15), movable parts such as an XZ stage and a drive motor are confirmed (SB16), and each sensor such as a CCD element and hardware are confirmed (SB17). Further, after confirming the program (SB18) and confirming the hard disk (SB19), the process branches to the step B5 and self-diagnosis is performed again.

  If the first to fifty defective sample inspection results in the delivery data storage process are the same as the current first to fifty defective sample inspection results in step SB14, After determining that the inspection device 1 is operating normally and loading the calibration data (1) (SB20), the display device 2 is removed from the lighting device (SB21), and the pre-start inspection is completed.

  More specifically, as shown in FIG. 7, 20 points of inspection results 51 are obtained in the unevenness inspection when the first defective sample image is displayed with the first defective sample data at the time of delivery. When 20 points are obtained even in the inspection result 52 in the previous inspection, it is determined that the inspection apparatus 1 is operating normally, and this image is displayed on the inspection monitor 41, for example.

  On the other hand, in the unevenness inspection at the time of delivery, an inspection result 51 of 20 points was obtained. However, when 40 points were obtained in the inspection result 53 of the inspection before the start of work, the inspection apparatus 1 is operating normally. It is determined that there is no such item, and confirmation work for each part of the inspection apparatus 1 is prompted.

  When the inspection device 1 is regularly inspected, as shown in FIGS. 8 and 9, the reference display device stored in the storage location is set in the lighting device (SC1), and then stored in the hard disk. The defective sample data is output to the display device 2 via the lighting control unit 12 to display a calibration image composed of a uniform white image on the display device 2 (SC2) and displayed on the display device 2 The obtained calibration image is picked up by the CCD camera 21 and inputted through the camera interface 22 (SC3). Then, calibration data (2) as a defective sample inspection result is created from the image input by the CCD camera 21, and the calibration data (2) is stored in the hard disk in association with the calibration image. (SC4).

  Next, after setting the internal counter n to 1 (SC5), the nth defective sample data is read from the hard disk and the nth defective sample image is displayed on the display device 2 (SC6). The displayed n-th defective sample image is input via the CCD camera 21 and the camera interface 22 (SC7), and the input image is analyzed to perform unevenness inspection (SC8).

  In this unevenness inspection, as described above, since the inspection result is output with a maximum of 50 points, the output score is obtained as the n-th defective sample inspection result, and the n-th defective sample result is obtained as the above-mentioned number. After being stored in the buffer area of the hard disk in association with n defective sample data (SC9), it is determined whether or not the counter n is 50 (SC10). If the counter n is not 50, the counter n is After incrementing by 1 and branching to the step SC6, each of the above processes is repeated.

  In step SC10, when the counter n reaches 50, the first to fifty defective sample inspection results saved in the hard disk in the delivery data saving process and the current hard disk buffer area are stored. It is compared whether the first to fifty defective sample inspection results are the same (SC11).

  At this time, if the inspection results are different, it is determined that the inspection apparatus 1 is not operating normally, and this is displayed on the inspection monitor 41 to prompt confirmation of each place, and the substrate, wiring, etc. of the inspection apparatus 1 The state of the input / output circuit is confirmed (SC12), movable parts such as an XZ stage and a drive motor are confirmed (SC13), and each sensor such as a CCD element and hardware are confirmed (SC14). Further, after confirming the program (SC15) and confirming the hard disk (SC16), the process branches to step SC2 and self-diagnosis is performed again.

  If the first to fifty defective sample inspection results in the delivery data storage process and the current first to fifty defective sample inspection results are the same in step SC11, After determining that the inspection device 1 is operating normally and loading calibration data (1) (SC17), the display device 2 is removed from the lighting device (SC18), and the periodic inspection is terminated.

  As described above, by using the defective sample data stored in the hard disk and the defective sample inspection result obtained from the defective sample image displayed on the reference display device with the defective sample data, the inspection apparatus 1 operates normally. It can be determined whether or not.

  In this way, the self-diagnosis of the inspection apparatus 1 can be performed without using a defective sample display device in which a defect has occurred. For this reason, it is possible to obtain the same effect as in the case where the inspection is performed with a plurality of defective sample display devices only by preparing a plurality of the defective sample data and the defective sample inspection results in advance. Therefore, as compared with the case where it is necessary to store a plurality of defective sample display devices, only one reference display device needs to be stored, and a large storage space is not required.

  In addition, the inspection time can be shortened as compared with the conventional case where replacement to a plurality of defective sample display devices is necessary.

It is a block diagram which shows one embodiment of this invention. It is a flowchart which shows the data storage process at the time of delivery of the embodiment. It is a flowchart following FIG. It is a figure which shows the test result of the same embodiment. It is a flowchart which shows the inspection process before the start of the embodiment. It is a flowchart following FIG. It is explanatory drawing which shows operation | movement of the embodiment. It is a flowchart which shows the periodic inspection process of the embodiment. It is a flowchart following FIG. It is a perspective view which shows the conventional inspection apparatus.

Explanation of symbols

DESCRIPTION OF SYMBOLS 1 Inspection apparatus 2 Display apparatus 11 Inspection PC
21 CCD camera

Claims (1)

In an inspection apparatus that outputs a display signal to a display device to display an image and inputs the image with a camera to inspect the display image,
Storage means for storing defective sample data for displaying a defective sample image on the display device, and a defective sample inspection result obtained when the defective sample image is displayed with the defective sample data;
A defective sample image display means for displaying the defective sample image with the defective sample data;
Inspection means for performing the inspection process by inputting the displayed defective sample image with the camera;
A self-diagnosis means for evaluating the operating state by comparing the inspection result in the inspection processing means with the defective sample inspection result obtained when the defective sample image is displayed;
An inspection apparatus comprising:

Images