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JP2003337106A - Macro inspection equipment - Google Patents

Macro inspection equipment

Info

Publication number
JP2003337106A
JP2003337106A JP2002144441A JP2002144441A JP2003337106A JP 2003337106 A JP2003337106 A JP 2003337106A JP 2002144441 A JP2002144441 A JP 2002144441A JP 2002144441 A JP2002144441 A JP 2002144441A JP 2003337106 A JP2003337106 A JP 2003337106A
Authority
JP
Japan
Prior art keywords
light
support member
instantaneous
transmitted
inspection object
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2002144441A
Other languages
Japanese (ja)
Other versions
JP4074779B2 (en
Inventor
Satoshi Hirokawa
智 廣川
Kiyoshi Iyori
潔 伊従
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kokusai Denki Electric Inc
Original Assignee
Hitachi Kokusai Electric Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Kokusai Electric Inc filed Critical Hitachi Kokusai Electric Inc
Priority to JP2002144441A priority Critical patent/JP4074779B2/en
Publication of JP2003337106A publication Critical patent/JP2003337106A/en
Application granted granted Critical
Publication of JP4074779B2 publication Critical patent/JP4074779B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Liquid Crystal (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

(57)【要約】 【課題】被検査物の被熱性、装置の小型化を図ったマク
ロ検査装置を提供する。 【解決手段】投射光L1、L3をそれぞれ切り替えるシャ
ッタ50a、50bと、投射光L1及びL3をそれぞれ平
行光にするフレネルレンズ5及びフレネルレンズ8と、
被検査物2を載置する被検査物保持部1の支持する固定
支持部材43及び伸縮自在に支持する伸縮支持部材4
4,45と、固定支持部材43及び伸縮支持部材44,4
5を設けた基台42と、被検査物2の姿勢を制御する制
御手段60を備え、被検査物2の姿勢に従い平行光L3
を被検査物2の表面に反射させ又は平行光L4を被検査
物2の背面に透過させるように構成したものである。
(57) [Summary] To provide a macro inspection apparatus which aims to reduce the heat resistance of an object to be inspected and the size of the apparatus. A shutter (50a, 50b) for switching projection light (L1, L3), a Fresnel lens (5) and a Fresnel lens (8) for parallelizing the projection light (L1, L3), respectively;
A fixed support member 43 for supporting the inspection object holder 1 on which the inspection object 2 is placed, and a telescopic support member 4 for supporting the inspection object 2 so as to extend and contract.
4, 45, the fixed support member 43 and the telescopic support members 44, 4
And a control means 60 for controlling the attitude of the object 2, and the parallel light L 3 according to the attitude of the object 2.
Is reflected on the surface of the inspection object 2 or the parallel light L4 is transmitted to the back surface of the inspection object 2.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、マクロ検査装置に
係り、例えば液晶基板やPDP等の製造工程において、
その表面のキズ、汚れ等の欠陥を検査するマクロ検査装
置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a macro inspection apparatus, for example, in a manufacturing process of liquid crystal substrates, PDPs, etc.
The present invention relates to a macro inspection device that inspects for defects such as scratches and stains on the surface.

【0002】[0002]

【従来の技術】例えば、液晶基板やPDPの製造工程に
おいて、被検査物表面のキズ汚れ等の欠陥を検査する必
要がある。従来、表面のキズ、汚れ等の欠陥を検査する
装置としては、一般に被検査物に多色光の照明を投射
し、被検査物を任意の角度に移動させながら、目視に
て、マクロ検査することが既に知られている。
2. Description of the Related Art For example, in a manufacturing process of a liquid crystal substrate or a PDP, it is necessary to inspect defects such as scratches and stains on the surface of an object to be inspected. Conventionally, as a device for inspecting defects such as scratches and dirt on the surface, generally, macroscopic inspection is performed by projecting multicolor light illumination on the inspection object and visually moving it while moving the inspection object at an arbitrary angle. Is already known.

【0003】従来、このような検査装置には、例えば図
4のようなマクロ検査装置が用いられていた。図4は従
来技術のマクロ検査装置の構造説明図である。マクロ検
査装置100は、その筺体100Bの上部に二個の反射
光源3a、3b(図示では重なって見えるので3aのみ
が表示されている)と、その筺体100Aの底面に垂直
に透過光源4が立設されている。なお、前記反射光源3
a、3b及び透過光源4の取付け機構については図示が
省略されている。図示しない制御装置からの電気配線も
煩瑣となるので省略する。
Conventionally, for such an inspection apparatus, a macro inspection apparatus as shown in FIG. 4, for example, has been used. FIG. 4 is a structural explanatory view of a macro inspection device of a conventional technique. In the macro inspection apparatus 100, two reflection light sources 3a and 3b (only 3a is displayed because they are seen to overlap in the drawing) are provided on the top of the housing 100B, and a transmission light source 4 is vertically provided on the bottom surface of the housing 100A. It is set up. The reflective light source 3
Illustrations of the attachment mechanisms of a and 3b and the transmitted light source 4 are omitted. The electrical wiring from the control device (not shown) is also troublesome and will not be described.

【0004】前記筺体100Bの底面上に設けられた図
示しない制御装置により、回動可能に制御される基台4
2と、該基台42上に所定の固定支持部材43と、上下
方向にそれぞれ伸縮可能な伸縮支持部材44、45(図
示では重なって見えるので紙面に近い44のみが表示さ
れている)と、該固定支持部材43によって軸継手(図
示しない)及び伸縮支持部材44、45によって自在軸
継手(図示しない)を介して変位可能に支持されている
被検査物保持部1とからなっている。
A base 4 rotatably controlled by a controller (not shown) provided on the bottom surface of the housing 100B.
2, a predetermined fixed support member 43 on the base 42, and expandable and contractible support members 44 and 45 that can be expanded and contracted in the vertical direction (only 44 close to the paper surface is shown in the drawing because they appear to overlap). The fixed support member 43 includes a shaft joint (not shown), and the expansion and contraction support members 44 and 45 displaceably supported via a universal shaft joint (not shown).

【0005】伸縮支持部材44、45が制御装置により
上下の同一方向に伸縮するよう制御された場合には、被
検査物保持部1の紙面に垂直な方向の高さを同一に保持
したまま俯仰する姿勢をとるようになっている。前記伸
縮支持部材44、45が制御装置により上下の逆方向に
伸縮するように制御された場合には、被検査物保持部1
の紙面に垂直な両端の高さが異なるように保持したま
ま、俯仰する姿勢をとるようになっている。例えば伸縮
支持部材44が伸張し、伸縮支持部材45が縮小するよ
うに制御された場合には、被検査物保持部1は紙面側が
高くなり、反対側が低くなる。前記伸縮支持部材44、
45の伸縮が反対となるよう制御された場合は前記被検
査物保持部1の高低が逆になる。
When the expansion and contraction support members 44 and 45 are controlled to expand and contract in the same vertical direction by the control device, the subject holding unit 1 is elevated while keeping the same height in the direction perpendicular to the paper surface. It takes a posture to When the expansion and contraction support members 44 and 45 are controlled by the control device so as to expand and contract in the opposite vertical directions, the inspection object holding unit 1
While holding different heights of both ends perpendicular to the plane of the paper, it takes a posture of raising. For example, when the expansion and contraction support member 44 is controlled to expand and the expansion and contraction support member 45 is contracted, the inspection object holding unit 1 becomes high on the paper surface side and becomes low on the opposite side. The elastic support member 44,
When the expansion and contraction of 45 is controlled to be opposite, the height of the inspection object holding unit 1 becomes opposite.

【0006】このような構成のマクロ検査装置において
は、被検査物保持部1上に被検査物2(図示せず)を搭載
し、制御装置により、基台42及び固定支持部材43並
びに伸縮支持部材44,45によって被検査物保持部1
を任意の姿勢にし、かつ多色光の反射照明3及び多色光
の透過照明4を前記被検査物保持部1の姿勢に応じて切
り替えて投射し、目視により前方(紙面左方)から表面
のキズ,汚れ等のマクロ検査を行うようになっている。
In the macro inspection apparatus having such a structure, the inspection object 2 (not shown) is mounted on the inspection object holding unit 1, and the control unit controls the base 42, the fixed support member 43, and the expansion / contraction support. The inspection object holding unit 1 by the members 44 and 45
In an arbitrary posture, and the reflective illumination 3 of the polychromatic light and the transmissive illumination 4 of the polychromatic light are switched and projected in accordance with the posture of the object holding unit 1, and the surface is scratched from the front (the left side of the paper) visually. , Macro inspection for dirt etc. is performed.

【0007】[0007]

【発明が解決しようとする課題】しかし、従来において
は、被検査物の表面のキズ,汚れ等の欠陥検査する際に
用いる反射照明、透過照明は、多色光のみの発光であ
る。そのため、その多色光では発見しづらい表面のキ
ズ,汚れ等の欠陥を見逃す可能性がある。さらに、被検
査物の膜むら等は検出できないという問題があった。
However, conventionally, the reflection illumination and the transmission illumination used for inspecting for defects such as scratches and stains on the surface of the object to be inspected are only polychromatic light emission. As a result, defects such as scratches and stains on the surface that are difficult to find with the polychromatic light may be missed. Further, there is a problem that the unevenness of the film of the inspection object cannot be detected.

【0008】また、被検査物に直接照明を投射している
ため、被検査物の被熱性考慮がなされていないし、さら
に、照明をミラーにて折り返していないため、装置が大
型化しているという問題があった。
Further, since the illumination is projected directly onto the object to be inspected, the heat resistance of the object to be inspected is not taken into consideration, and further, the illumination is not folded back by the mirror, so that the apparatus is large in size. was there.

【0009】かかる上記従来技術の問題点を解決するた
めになされたものであり、本発明の構成によれば、反射
光及び透過光にプロジェクタ装置と瞬間調光フィルター
とフリネルレンズを用いることにより、ランプを点滅す
ることなく、任意の投射光を選択する共に、ランプ特性
を安定させることにより、被検査物の表面のキズ,汚れ
等の欠陥を見つける迅速、且つ精度を向上させることを
その第一の目的とするものである。
The present invention has been made in order to solve the above-mentioned problems of the prior art. According to the configuration of the present invention, a lamp is provided by using a projector device, an instantaneous light control filter and a Fresnel lens for reflected light and transmitted light. The first is to improve the quickness and accuracy of finding defects such as scratches and stains on the surface of the object to be inspected by selecting an arbitrary projection light without blinking and stabilizing the lamp characteristics. It is intended.

【0010】さらに、発明者の実験により、キズ,汚れ
等の欠陥を見つける人間の視覚がもっとも鋭敏な波長が
黄色、緑色であることの知見に従い、黄色及び緑色の単
色光を用い、感度のよりよくすることをその第二の目的
とするものである。
Further, according to the finding by the inventor of the present invention that the most sensitive wavelengths for human vision to find defects such as scratches and stains are yellow and green, yellow and green monochromatic lights are used to improve sensitivity. The second purpose is to do well.

【0011】さらにまた、投射光をミラーにて折り返し
たのち、被検査物に投射することにより、被検査物の被
熱性考慮がなされ、かつ、装置の小型化が実現すること
をその第三の目的とするものである。
Furthermore, the projection light is reflected by a mirror and then projected onto an object to be inspected, so that the heat resistance of the object to be inspected is taken into consideration and the size of the apparatus can be reduced. It is intended.

【0012】[0012]

【課題を解決するための手段】上記目的を達成するた
め、本発明に係わるマクロ検査装置の構成は、被検査物
に反射光を投射し、該投射されている反射光を透過、遮
断する第一の切り替え手段を具備する第一の光源と、被
検査物に透過光を投射し、該投射されている透過光を透
過、遮断する第二の切り替え手段を具備する第二の光源
と、前記被検査物を保持する被検査物保持部と、該被検
査物保持部を支持する支持部材と、前記支持部材を駆動
し前記被検査物保持部の姿勢を制御し、該姿勢に応じて
前記第一、第二の切り替え手段を制御する制御手段とを
備え、前記反射光を前記被検査物の表面に投射したりま
たは前記透過光を前記被検査物の背面に投射して該被検
査物の欠陥を目視で観察するようにしたことを特徴とす
るものである。
In order to achieve the above object, the structure of a macro inspection apparatus according to the present invention is such that a reflected light is projected onto an object to be inspected, and the projected reflected light is transmitted or blocked. A first light source having one switching means, a second light source having a second switching means for projecting transmitted light on an object to be inspected, and transmitting and blocking the projected transmitted light; An inspection object holding unit that holds the inspection object, a support member that supports the inspection object holding unit, and a posture of the inspection object holding unit that drives the support member to control the posture, and according to the posture, A control means for controlling the first and second switching means, wherein the reflected light is projected onto the surface of the object to be inspected or the transmitted light is projected onto the back surface of the object to be inspected. The defect is characterized in that it is visually observed.

【0013】本発明に係わるマクロ検査装置の他の構成
は、前項に記載のマクロ検査装置において、前記反射光
系は、反射光を投射する第一のランプ部と、前記反射光
の光路中に挿入され、該反射光を透過、遮断する第一の
瞬間調光ガラスもしくは瞬間調光フィルターのいずれか
と、前記第一の瞬間調光ガラスもしくは瞬間調光フィル
ターのいずれかを透過した光を平行光にする第一のフレ
ネルレンズと、からなり、前記透過光系は、透過光を投
射する第二のランプ部と、前記透過光の光路中に挿入さ
れ、該透過光を透過、遮断する第二の瞬間調光ガラスも
しくは瞬間調光フィルターのいずれかと、前記第二の瞬
間調光ガラスもしくは瞬間調光フィルターのいずれかを
透過した光を平行光にする第二のフレネルレンズと、か
らなることを特徴とするものである。
Another structure of the macro inspection apparatus according to the present invention is the macro inspection apparatus described in the preceding paragraph, wherein the reflected light system includes a first lamp section for projecting reflected light and an optical path of the reflected light. Parallel light that is inserted and transmits either the first momentary light control glass or the momentary light control filter that transmits or blocks the reflected light and the light that passes through either the first momentary light control glass or the momentary light control filter. A second Fresnel lens for projecting the transmitted light, and a second Fresnel lens for transmitting the transmitted light and blocking the transmitted light. And a second Fresnel lens for collimating the light transmitted through either the second instantaneous light control glass or the instantaneous light control filter, and the second Fresnel lens. Characteristic It is intended to.

【0014】前項に記載のマクロ検査装置において、前
記支持部材は、前記被検査物保持部を軸継手を介して支
持する固定支持部材及び自在軸継手を介して支持する伸
縮自在な伸縮支持部材と、前記固定支持部材及び伸縮支
持部材が取付けられ、且つ水平方向に回動する基台とか
らなり、前記制御手段は、伸縮支持部材及び基台を駆動
して前記被検査物保持部の姿勢及び該姿勢に応じて、前
記第一の瞬間調光ガラスもしくは瞬間調光フィルターの
いずれかを光の透過もしくは遮断となし、該光の透過も
しくは遮断に対して前記第二の瞬間調光ガラスもしくは
瞬間調光フィルターのいずれかを光の遮断もしくは透過
の状態となるように、制御するように構成したことを特
徴とするものである。
In the macro inspection apparatus described in the preceding paragraph, the support member includes a fixed support member that supports the object holding portion through a shaft joint and a telescopic support member that supports through a universal shaft joint. A base to which the fixed support member and the expansion and contraction support member are attached and which rotates in the horizontal direction, and the control means drives the expansion and contraction support member and the base to adjust the posture of the inspection object holder and Depending on the posture, either the first momentary light control glass or the momentary light control filter is made to transmit or block light, and the second momentary light control glass or moment is set for transmission or block of the light. It is characterized in that any one of the light control filters is controlled so as to be in a state of blocking or transmitting light.

【0015】前項いずれかに記載のマクロ検査装置にお
いて、前記第一のランプ部及び第二のランプ部は、それ
ぞれ投射光を投射するランプと該投射光を均一光にする
ホモナイザとからなり、前記ランプとホモナイザ間に黄
色もしくは緑色光を透過するフィルターを切り替え可能
に配設したプロジェクタ装置であることを特徴とするも
のである。
In the macro inspection apparatus according to any one of the preceding paragraphs, each of the first lamp section and the second lamp section comprises a lamp for projecting projected light and a homogenizer for making the projected light uniform. The projector device is characterized in that a filter for transmitting yellow or green light is switchably arranged between the lamp and the homogenizer.

【0016】前項いずれかに記載のマクロ検査装置にお
いて、前記目視位置にCCDカメラを配設したことを特徴
とするものである。
The macro inspection apparatus according to any one of the preceding paragraphs is characterized in that a CCD camera is arranged at the visual position.

【0017】前項いずれかに記載のマクロ検査装置にお
いて、前記プロジェクタ装置と被検査物との間に光軸を
変更する反射ミラーを配設したことを特徴とするもので
ある。
The macro inspection apparatus according to any one of the preceding paragraphs is characterized in that a reflection mirror for changing the optical axis is arranged between the projector device and the inspection object.

【0018】[0018]

【発明の実施の形態】以下,本発明にかかわるマクロ検
査装置の一実施形態について、図1乃至図3を参照して
説明する。図1は、本発明に係わるマクロ検査装置の一
実施形態の説明図、図2は図1のマクロ検査装置の正面
部分説明図、図3は、図1のマクロ検査装置に用いられ
る光源部の説明図である。なお、従来技術のマクロ検査
装置を示す図4と同一機能、同一部材は同一符号を用い
て説明する。また、制御装置60(後述)と各部材との
電気配線は図1、2、3が煩瑣となることをさけるた
め、図示を省略する。
BEST MODE FOR CARRYING OUT THE INVENTION An embodiment of a macro inspection apparatus according to the present invention will be described below with reference to FIGS. FIG. 1 is an explanatory view of an embodiment of a macro inspection apparatus according to the present invention, FIG. 2 is a front partial explanatory view of the macro inspection apparatus of FIG. 1, and FIG. 3 is a light source section used in the macro inspection apparatus of FIG. FIG. It should be noted that the same functions and the same members as those in FIG. 4 showing the macro inspection device of the prior art will be described using the same reference numerals. In addition, the electrical wiring between the control device 60 (described later) and each member is omitted because it avoids the trouble of FIGS.

【0019】図1に示すように、マクロ検査装置100
は、被検査物2を載置する検査物保持部1と、該検査物
保持部1に反射光を投射する反射光系Rと、前記検査物
保持部1に透過光を投射する透過光系Tと、前記検査物
保持部1を軸継手を介して支持する固定支持部材43、
自在軸継手を介して支持する複数の伸縮支持部材44,
45と、前記固定支持部材43、伸縮支持部材44,4
5が取付けられている基台42と、前記反射光系R及び
透過光系T並びに前記基台42、伸縮支持部材44,4
5等を制御する制御部60から構成されており、前記の
各部材が遮光ケースを兼ねた筺体100A内に配設され
ている。前記筺体100Aの上部は測定時においては、
前方の監視窓(図示左方)を除いて瞬間調光ガラスもしく
は瞬間調光フィルター(符号なし)のいずれかを張設し
て遮光するようになっている。
As shown in FIG. 1, the macro inspection apparatus 100
Is an inspection object holding unit 1 on which the inspection object 2 is placed, a reflected light system R for projecting reflected light on the inspection object holding unit 1, and a transmitted light system for projecting transmitted light on the inspection object holding unit 1. T and a fixed support member 43 that supports the inspection object holding unit 1 via a shaft joint,
A plurality of telescopic support members 44 supported via a universal shaft joint,
45, the fixed support member 43, the expansion and contraction support members 44, 4
5, the base 42 to which the 5 is attached, the reflected light system R and the transmitted light system T, the base 42, and the expansion and contraction support members 44 and 4.
The control unit 60 controls the control unit 5 and the like, and each of the above-mentioned members is arranged in a housing 100A that also serves as a light shielding case. At the time of measurement, the upper part of the housing 100A is
Except for the front monitoring window (on the left side in the figure), either an instantaneous light control glass or an instantaneous light control filter (no code) is installed to block light.

【0020】ここに、瞬間調光ガラスとは、二枚のガラ
ス板の内側表面にそれぞれ形成された透明電極と、ポリ
ママトリックスの中に液晶の球状小滴が分散されている
ものであり、透明電極に電圧を印加することで、液晶の
球状小滴の光軸を制御し、光の透過状態にしたり、遮断
状態にするものである。また、瞬間調光フィルターと
は、光の透過状態と遮断状態を電源の状態で切り替わる
ようになっており、通常液晶フィルター等で構成されて
いる。以下の実施形態では、瞬間調光フィルターが使用
されている場合を説明する。
Here, the instantaneous light control glass is a transparent electrode formed on the inner surface of each of two glass plates, and a liquid crystal spherical droplet dispersed in a polymer matrix. By applying a voltage to the electrodes, the optical axis of the spherical small droplets of liquid crystal is controlled so that the liquid crystal is in a light transmitting state or a light blocking state. The instantaneous light control filter is adapted to switch between a light transmission state and a light blocking state depending on the state of the power source, and is usually composed of a liquid crystal filter or the like. In the following embodiments, a case where an instantaneous light control filter is used will be described.

【0021】反射光系Rは、投射光L1を投射するため
の光源系10と、投射光L1を検査可能な投射光L2とす
る共に、該投射光L2を被検査物2に投射する光学系2
0とからなっている。図3に示すように、前記光源系1
0は、投射光を投射するための一個のランプLpと、該
ランプLpからの投射光を所定波長の単一色の波長光
(単波長光という)、例えば人の視覚に最も鋭敏な黄色
若しくは緑色の単色光とする色フィルターFと、該色フ
ィルターFからの単色光を均一な強さの光L1にするホ
モナイザHからなっている。これを以下、プロジェクタ
装置3という。
The reflected light system R uses a light source system 10 for projecting the projection light L1 and an optical system for projecting the projection light L1 onto the object 2 to be inspected as well as the projection light L2 which can be inspected. Two
It consists of 0. As shown in FIG. 3, the light source system 1
Reference numeral 0 denotes one lamp Lp for projecting the projected light, and the projected light from the lamp Lp having a single wavelength of a predetermined wavelength (referred to as single wavelength light), for example, yellow or green which is most sensitive to human vision. Of the monochromatic light F, and a homogenizer H for converting the monochromatic light from the color filter F into the light L1 of uniform intensity. This is hereinafter referred to as the projector device 3.

【0022】プロジェクタ装置3は筺体100Aの上部
壁面の所定位置に適宜な手段で取付けられている。ま
た、色フィルターFは、図示では該色フィルターF、例
えば、緑色若しくは黄色の色フィルターFを駆動部Fd
により前後に移動して交換する平行移動式が示されてい
るが、該色フィルターFを回転させる回転式でも差し支
えない。詳細な図示を省略するが、回転式は複数の狭帯
式フィルターが円板状容器の収められており、この円板
状容器がモータ等で回転する。このようにして、平行移
動式及び回転式共に、所望の色フィルターFを投射光内
に挿入することができる。
The projector device 3 is attached to a predetermined position on the upper wall surface of the housing 100A by appropriate means. Further, in the drawing, the color filter F is a color filter F, for example, a green or yellow color filter F, which is a driving unit Fd.
Shows a parallel movement type in which the color filter F is rotated and moved back and forth to be replaced, but a rotation type in which the color filter F is rotated may be used. Although not shown in detail, in the rotary type, a plurality of narrow band filters are housed in a disk-shaped container, and the disk-shaped container is rotated by a motor or the like. In this way, the desired color filter F can be inserted into the projection light in both the parallel movement type and the rotation type.

【0023】光学系20は、制御装置60により制御さ
れる検査物保持部1の姿勢に応じて(これら姿勢の制御
については後述)ホモナイザHからの均一強さの単波長
光L1を透過、遮光する、例えば瞬間調光フィルター5
0aと、該瞬間調光フィルター50aを透過したホモナ
イザHからの均一強さの単波長光L1を設定された角
度、図示では下方側に光軸を変更する反射ミラー6と、
該反射ミラー6からの反射光を平行光L2にして被検査
物2を投射するフレネルレンズ5とからなっている。こ
のようにして、光源系10と光学系20により反射光系
Rである第一の光源を構成している。前記平行光L2
は、被検査物保持部1に載置された前記被検査物2を上
方から垂直に投射するようになっている。なお、前記瞬
間調光フィルター50aは、遮光時においては、前記単
波長光L1の漏れがないように、十分な大きさを有して
おり、筺体100Aに適宜な手段で取付けられている。
The optical system 20 transmits and blocks the single-wavelength light L1 of uniform intensity from the homogenizer H according to the posture of the inspection object holding unit 1 controlled by the control device 60 (the control of these postures will be described later). Yes, for example, the instantaneous light control filter 5
0a, and a reflection mirror 6 for changing the optical axis to a set angle of the single-wavelength light L1 of uniform intensity from the homogenizer H that has passed through the instantaneous light control filter 50a, the downward direction in the figure,
It is composed of a Fresnel lens 5 for projecting the object to be inspected 2 by converting the reflected light from the reflecting mirror 6 into parallel light L2. In this way, the light source system 10 and the optical system 20 constitute a first light source which is the reflected light system R. The parallel light L2
Is configured to vertically project the inspection object 2 placed on the inspection object holding portion 1 from above. The instantaneous light control filter 50a has a sufficient size so as not to leak the single-wavelength light L1 when it is shielded from light, and is attached to the housing 100A by an appropriate means.

【0024】透過光系Tは、反射光系Rと同様の構成で
あるので、図示を省略すると共に、詳細な説明は煩瑣と
なるので、簡単に説明する。前記透過光系Tは、投射光
L3を投射するための光源系30と、該投射光L3を被検
査物2に反射すると共に、投射光L3を検査可能な投射
光L4とするため光学系40とからなっている。図3に
示す光源系10と同様に、前記光源系30は、投射光を
投射するための一個のランプLpと、該ランプLpから
の投射光を所定波長の単波長光とする色フィルターF
と、前記単波長光を均一な強さの光L3にするホモナイ
ザHからなっている。これを以下、プロジェクタ装置4
という。該プロジェクタ装置4は筺体100Aの上部壁
面の所要位置に適宜な手段で取付けられている。なお、
プロジェクタ装置3、4の筺体100Aへの適宜な取付
け手段については、煩瑣となるので、図示および説明を
省略する。また、色フィルターFは、図示では駆動部F
dによる平行移動式が示されているが、回転式でも差し
支えない。
Since the transmitted light system T has the same structure as the reflected light system R, the illustration thereof is omitted and the detailed description is complicated, so that it will be briefly described. The transmitted light system T is a light source system 30 for projecting the projection light L3, and an optical system 40 for reflecting the projection light L3 to the inspection object 2 and for making the projection light L3 into the inspectable projection light L4. It consists of Similar to the light source system 10 shown in FIG. 3, the light source system 30 includes one lamp Lp for projecting projection light and a color filter F for making the projection light from the lamp Lp a single wavelength light of a predetermined wavelength.
And a homogenizer H for converting the single-wavelength light into light L3 having a uniform intensity. Hereinafter, this is referred to as the projector device 4
Say. The projector device 4 is attached to a required position on the upper wall surface of the housing 100A by appropriate means. In addition,
Appropriate means for attaching the projector devices 3 and 4 to the housing 100A is complicated, and therefore illustration and description thereof are omitted. Further, the color filter F is a drive unit F in the figure.
Although a parallel movement type by d is shown, a rotary type may also be used.

【0025】光学系40は、制御装置60により制御さ
れる検査物保持部1の姿勢に応じて(これら姿勢の制御
については後述)ホモナイザHからの均一強さの単波長
光L3を透過、遮断する例えば瞬間調光フィルター50
bと、該瞬間調光フィルター50bを透過したホモナイ
ザHからの均一強さの単波長光L3を設定された角度に
光軸を変更する反射ミラー6と、該反射ミラー6からの
反射光を平行光L4にして被検査物2を投射するフレネ
ルレンズ8Tからなっている。このようにして、光源系
30と光学系40により透過光系Tである第二の光源を
構成している。前記瞬間調光フィルター50bは、瞬間
調光フィルター50aと同様であるので説明を省略す
る。
The optical system 40 transmits and blocks the single-wavelength light L3 of uniform intensity from the homogenizer H according to the postures of the inspection object holding unit 1 controlled by the control device 60 (the control of these postures will be described later). For example, instantaneous light control filter 50
b, a reflection mirror 6 that changes the optical axis of the single-wavelength light L3 of uniform intensity from the homogenizer H that has passed through the instantaneous light control filter 50b to a set angle, and the reflection light from the reflection mirror 6 is parallel. It is composed of a Fresnel lens 8T which projects light L4 into the object 2 to be inspected. In this way, the light source system 30 and the optical system 40 constitute a second light source which is the transmitted light system T. Since the instantaneous light control filter 50b is similar to the instantaneous light control filter 50a, a description thereof will be omitted.

【0026】このように瞬間調光フィルター50a及び
瞬間調光フィルター50bを設置することにより、ラン
プLpを点滅する必要がないので、該ランプLpの特性
を安定させ、検出精度が向上する。また、このように反
射ミラー6、7の設置により、投射光L1、L2をそれぞ
れ該反射ミラー6、7にて折り返したのちに、被検査物
2に投射できるため、被熱性考慮がなされ、且つマクロ
検査装置の小型化が実現することができる。
By thus installing the instantaneous light control filter 50a and the instantaneous light control filter 50b, it is not necessary to blink the lamp Lp, so that the characteristics of the lamp Lp are stabilized and the detection accuracy is improved. In addition, since the reflection mirrors 6 and 7 are installed in this manner, the projection lights L1 and L2 can be reflected by the reflection mirrors 6 and 7, respectively, and then projected onto the object to be inspected 2. The macro inspection device can be miniaturized.

【0027】平行光L4は、被検査物保持部1に載置さ
れた被検査物2を背面から水平に投射するようになって
いる。このため、被検査物2を載置する被検査物保持部
1には、詳細な図示を省略するが裏面に瞬間調光フィル
ターが張設されているガラス板が設けられている。該ガ
ラス板の機能については後述する。
The parallel light L4 is adapted to horizontally project the inspection object 2 placed on the inspection object holding portion 1 from the rear surface. For this reason, the inspected object holding portion 1 on which the inspected object 2 is placed is provided with a glass plate on the back surface of which an instantaneous light control filter is stretched, although detailed illustration is omitted. The function of the glass plate will be described later.

【0028】次に、被検査物保持部1を支持する支持部
材について説明する。図1に示すごとく、筺体100A
の底面上に設けられ、制御装置60により、水平面を回
動可能に制御される基台42、該基台42に設けられ、
且つ該基台42に対してそれぞれ伸縮可能に制御される
伸縮支持部材44、45及び該基台42上に所定の高さ
を有し、所定位置に設けられた固定支持部材43と、前
記固定支持部材43は上方部(基台42とは反対側)先
端で軸受けを介し、また、伸縮支持部材44、45の上
方部(基台42とは反対側)先端で自在軸継手80a,8
0b、例えば球面軸受けを介してそれぞれ変位可能に支
持されている被検査物保持部1とからなっている。前記
伸縮支持部材44、45は、それぞれ筒状体の中から該
筒状体の中に設けられたモータ(図示せず)で駆動され
て伸縮する伸縮棒材44a、45bが前記自在軸継手8
0a,80bと連結されている。
Next, a supporting member for supporting the object holding portion 1 will be described. As shown in Fig. 1, the housing 100A
A base 42 which is provided on the bottom surface of the base plate and is rotatably controlled by a control device 60 on a horizontal plane;
In addition, the expansion and contraction support members 44 and 45 that are controlled to expand and contract with respect to the base 42, the fixed support member 43 that has a predetermined height on the base 42, and is provided at a predetermined position, and the fixed member. The support member 43 has a bearing at the tip of the upper portion (on the side opposite to the base 42) via a bearing, and the universal member 80a, 8 at the tip of the upper portion (on the side opposite to the base 42) of the telescopic support members 44, 45.
0b, for example, the inspected object holding portion 1 which is displaceably supported via spherical bearings. The elastic support members 44 and 45 are elastic rod members 44a and 45b that are expanded and contracted by being driven by a motor (not shown) provided in the cylindrical body from the cylindrical body.
It is connected to 0a and 80b.

【0029】図2の矢印に示すように、伸縮支持部材4
4、45がそれぞれ制御装置60により上下同一方向に
伸縮した場合には、被検査物保持部1の紙面に垂直な方
向の高さを同一に保持したまま、俯仰するようになって
いる。前記伸縮支持部材44、45がそれぞれ制御装置
60により上下逆方向に伸縮した場合には、被検査物保
持部1の紙面に垂直な方向(図2では左右の方向、以下
も同様)の両端の高さが異なるように保持したまま、俯
仰するようになっている。例えば、伸縮支持部材44が
伸張し、伸縮支持部材45が縮小した場合には被検査物
保持部1は紙面側(図2では右側)が高くなり、反対側
が低くなる。前記伸縮支持部材44、45の伸縮が反対
の場合は前記被検査物保持部1の高低が逆になる。これ
らの場合において、自在軸継手80a,80bは、被検査
物保持部1を自在に調節する働きをするようになってい
る。
As shown by the arrow in FIG. 2, the elastic support member 4
When the control device 60 expands and contracts 4 and 45 in the same vertical direction, the inspection object holding unit 1 is elevated while keeping the same height in the direction perpendicular to the paper surface. When the expansion and contraction support members 44 and 45 are respectively expanded and contracted in the upside-down direction by the control device 60, both ends of the inspection object holding unit 1 in the direction perpendicular to the paper surface (the left and right directions in FIG. 2, the same applies below). It is designed to look up while holding different heights. For example, when the expansion / contraction support member 44 expands and the expansion / contraction support member 45 contracts, the inspection object holding unit 1 becomes higher on the paper surface side (right side in FIG. 2) and lower on the opposite side. When the expansion and contraction of the expansion and contraction support members 44 and 45 are opposite, the height of the inspected object holding unit 1 is reversed. In these cases, the universal shaft couplings 80a and 80b function to freely adjust the object holding unit 1.

【0030】制御装置60は、筺体100Aの前方(図
示では左方)の傾斜部70に設けられている。その表面
部には操作部60aが設けられおり、この操作部60aに
種々の操作ボタンが設けられ、これらを操作することに
より、検査物保持部1の姿勢に応じて(これらについて
は後述)、例えば瞬間調光フィルター50a、bが動作
し、それぞれホモナイザHからの均一強さの光L1、L2
を透過、遮断する。さらに、基台42を伸縮支持部材4
4(図示),45もしくは固定支持部材43の基部が中
心となり、水平に回転すると共に、固定支持部材43を
そのままの状態にして、伸縮支持部材44,45を同方
向にまたは反対方向に伸縮させるようになっている。
The control device 60 is provided on the inclined portion 70 on the front side (left side in the drawing) of the housing 100A. An operation unit 60a is provided on the surface thereof, and various operation buttons are provided on the operation unit 60a. By operating these, depending on the posture of the inspection object holding unit 1 (these will be described later), For example, the instantaneous light control filters 50a and 50b are activated, and the lights L1 and L2 from the homogenizer H have uniform intensity.
Permeate and block. Further, the base 42 is attached to the telescopic support member 4
4 (illustrated), 45 or the base portion of the fixed support member 43 as a center, and horizontally rotates, while leaving the fixed support member 43 as it is, the expansion and contraction support members 44 and 45 are expanded and contracted in the same direction or in opposite directions. It is like this.

【0031】また、色フイルターFは、駆動装置Fdが
駆動され、光源Lpの光路中に入れられ、人間の視覚に
鋭敏な黄色光もしくは緑色光の単波長光になるように制
御されるようになっている。このように制御することに
より、黄色光もしくは緑色光の単波長光となり、検査物
保持部1を所望の姿勢に制御し、該所望の姿勢に応じ
て、反射光系R及び透過光系Tを点灯したまま、シャッ
タ50a、bがそれぞれ開閉され、反射光系Rまたは透
過光系Tを切り替えて、被検査物2に投射するようにな
っている。
Further, the color filter F is driven by the driving device Fd, is put in the optical path of the light source Lp, and is controlled so as to become a single wavelength light of yellow light or green light which is sensitive to human vision. Has become. By controlling in this way, a single-wavelength light of yellow light or green light is obtained, the inspection object holding unit 1 is controlled to a desired posture, and the reflected light system R and the transmitted light system T are set in accordance with the desired posture. The shutters 50a and 50b are opened and closed while the light is on, and the reflected light system R or the transmitted light system T is switched to project on the inspection object 2.

【0032】さらに、制御装置60は、詳細な図示を省
略するが、反射光系R及び透過光系Tの切り替えに応じ
て、上述の如く、検査物保持部1に設けられた瞬間調光
フィルターが張設されたガラス板50を設け、前記反射
光Rが投射された場合はガラス板50が遮光状態とな
り、透過光が投射された場合は、前記ガラス板50が光
の透過状態となるように制御されるようになっている。
なお、伸縮支持部材44、45が制御装置60により上
下同一方向にのみ伸縮させ、被検査物保持部1の紙面に
垂直な方向の高さを同一に保持したまま俯仰させる場合
は、固定支持部材43及び伸縮支持部材44、45の上
方部(基台42側とは反対側)先端は通常の軸継手で十
分である。また、伸縮支持部材44、45は、両者の中
間位置上に一本設けただけでも差し支えない。
Further, although not shown in detail, the control device 60 responds to the switching of the reflected light system R and the transmitted light system T, as described above, and the instantaneous light control filter provided in the inspection object holding unit 1. Is provided so that the glass plate 50 is in a light blocking state when the reflected light R is projected, and the glass plate 50 is in a light transmitting state when transmitted light is projected. It is controlled by.
When the expansion / contraction support members 44 and 45 are expanded / contracted only in the same vertical direction by the control device 60 and are elevated while keeping the same height of the inspection object holding unit 1 in the direction perpendicular to the paper surface, the fixed support member is used. A normal shaft coupling is sufficient for the tips of the upper portions (opposite to the base 42 side) of 43 and the expansion and contraction support members 44, 45. Further, the expansion and contraction support members 44 and 45 may be provided only one at an intermediate position between them.

【0033】前記構成のマクロ検査装置100の動作に
ついて説明する。被検査物保持部1上に被検査物2を搭
載する。反射光系R、透過系Tのプロジェクタ装置3及
び4それぞれのランプLpを点灯する(以下、反射光系
Rを点灯するという。また、透過光系Tを点灯するとい
う)。制御装置60は、反射光系Rの色フイルターF
を、例えば黄色にして単波長光を選択する。ホモナイザ
Hにより均一な強さの単波長光L1にする。
The operation of the macro inspection apparatus 100 having the above configuration will be described. The inspection object 2 is mounted on the inspection object holding unit 1. The lamps Lp of the projector devices 3 and 4 of the reflected light system R and the transmitted light system T are turned on (hereinafter, the reflected light system R is turned on, and the transmitted light system T is turned on). The control device 60 controls the color filter F of the reflected light system R.
Is made yellow, and single-wavelength light is selected. The homogenizer H produces a single-wavelength light L1 of uniform intensity.

【0034】次いで、制御部60が瞬間調光フィルター
50aを光の透過状態となるように制御し、単波長光L
1を透過させる。反射ミラー6により前記単波長光L1の
光軸を変え、フレネルレンズ5により平行光L2にす
る。この場合、透過系Tの瞬間調光フィルター50bは
遮光状態となり、プロジェクタ装置4の単波長光L3は
遮断される。
Next, the control unit 60 controls the instantaneous light control filter 50a so that it is in a light transmitting state, and the single wavelength light L
Make 1 transparent. The optical axis of the single wavelength light L1 is changed by the reflection mirror 6, and the parallel light L2 is changed by the Fresnel lens 5. In this case, the instantaneous light control filter 50b of the transmissive system T is in a light blocking state, and the single wavelength light L3 of the projector device 4 is blocked.

【0035】次に、伸縮支持部材44,45の筒状体の
内部から伸縮棒材44a,45bを伸縮させて制御し(以
下、伸縮支持部材44,45を伸縮するように制御し、
という)、マクロ試験装置100の検査物保持部1が水
平となるようにし、このとき、検査物保持部1は、マク
ロ試験装置100の基台42に平行になっている。次
に、制御部60は検査物保持部1のガラス板を遮光状態
にして、フレネルレンズ5からの平行光L2が十分に反
射するようにする。検査者Mは前記反射光L2の反射に
より被検査物2の欠陥を検査する。
Next, the expansion / contraction rods 44a, 45b are expanded / contracted from the inside of the tubular body of the expansion / contraction support members 44, 45 to control (hereinafter, the expansion / contraction support members 44, 45 are controlled to expand and contract,
That is, the test object holding unit 1 of the macro test apparatus 100 is made horizontal, and at this time, the test object holding unit 1 is parallel to the base 42 of the macro test apparatus 100. Next, the control unit 60 sets the glass plate of the inspection object holding unit 1 in a light-shielded state so that the parallel light L2 from the Fresnel lens 5 is sufficiently reflected. The inspector M inspects the defect of the inspection object 2 by the reflection of the reflected light L2.

【0036】次に、制御装置60により伸縮支持部材4
4,45を同方向に伸縮するように制御し、被検査物保
持部1を俯仰させる。仰向く姿勢の場合は、そのまま検
査者Mが被検査物2の欠陥を検査する。俯向く姿勢の場
合は、そのままでは検査者Mが被検査物2の欠陥を検査
することができないので、制御装置60が基台42を水
平方向に回動させ、被検査物2の前方側(図示左方側)
が低くなるようにし、検査者Mが被検査物2の欠陥を検
査しやすいようにする。
Next, the expansion and contraction support member 4 is controlled by the control device 60.
4, 45 are controlled to expand and contract in the same direction, and the inspection object holding unit 1 is raised. In the case of the upright posture, the inspector M directly inspects the inspection object 2 for defects. In the case of the downward posture, since the inspector M cannot inspect the defect of the inspection object 2 as it is, the control device 60 rotates the base 42 in the horizontal direction and the front side of the inspection object 2 ( (Left side in the figure)
Is set so that the inspector M can easily inspect the inspection object 2 for defects.

【0037】次に、制御装置60により反射光系Rの色
フイルターを選択して緑色単波長光にして、黄色単波長
光の場合と同様のマクロ検査を実施する。このようにし
て、被検査物保持部1が任意の位置において被検査物2
を自由に視覚に鋭敏な黄色単波長光または緑色単波長光
の反射光で表面のキズ,汚れ等をマクロ検査することが
できる。
Next, the controller 60 selects a color filter of the reflected light system R to make it a green single-wavelength light, and the same macro inspection as in the case of the yellow single-wavelength light is carried out. In this way, the object to be inspected 1 is held at the arbitrary position by the object to be inspected 2
It is possible to macro-inspect the surface for scratches, stains, etc. with reflected light of yellow single-wavelength light or green single-wavelength light, which is free of visual sensitivity.

【0038】次に、制御装置60は、被検査物保持部1
上に被検査物2を搭載したまま、反射光系Rの瞬間調光
フィルター50aを遮光状態にし、単波長光L1を遮断
する。この場合、透過系Tの瞬間調光フィルター50b
は光の透過状態にする。次に、制御装置60は、透過光
系Tの色フイルターFを、例えば黄色にして単波長光を
選択する。ホモナイザHにより均一な強さの単波長光L
3にする。反射ミラー6により単波長光L3の光軸を変
え、フレネルレンズ5により平行光L4にする。
Next, the control device 60 controls the inspection object holding unit 1
With the object to be inspected 2 mounted thereon, the instantaneous light control filter 50a of the reflected light system R is put in the light-shielding state, and the single-wavelength light L1 is cut off. In this case, the transmission system T instantaneous light control filter 50b
Sets the light transmission state. Next, the control device 60 makes the color filter F of the transmitted light system T yellow, for example, and selects single wavelength light. Single wavelength light L with uniform intensity by homogenizer H
Set to 3. The optical axis of the single-wavelength light L3 is changed by the reflection mirror 6, and the parallel light L4 is changed by the Fresnel lens 5.

【0039】次に、制御装置60により、検査物保持部
1の開口面部50を開き、フレネルレンズ5からの透過
光L4が十分に透過するようにする。さらに、伸縮支持
部材44,45を同方向に伸縮し、被検査物保持部1を
俯仰させる。仰向く姿勢の場合は、その仰角が所定以上
の場合は、被検査物2の背面(図示右方)から透過光L
4を投射し、前方(図示左方)から欠陥を検査する。俯
向く姿勢の場合は検査者Mが被検査物2の欠陥を検査す
ることができない。
Next, the control device 60 opens the opening surface portion 50 of the inspection object holding portion 1 so that the transmitted light L4 from the Fresnel lens 5 is sufficiently transmitted. Further, the expansion and contraction support members 44 and 45 are expanded and contracted in the same direction, and the inspection object holding unit 1 is raised. In the case of an upright posture, if the elevation angle is greater than or equal to a predetermined value, the transmitted light L is transmitted from the rear surface (right side in the drawing) of the inspection object 2.
4 is projected and the defect is inspected from the front (the left side in the drawing). In the downward posture, the inspector M cannot inspect the inspection object 2 for defects.

【0040】次に、透過光系Tの色フイルターを選択し
て緑色単波長光にして、黄色単波長光の場合と同様のマ
クロ検査を実施する。このようにして、被検査物保持部
1が任意の位置において被検査物2を自由に視覚に鋭敏
な黄色単波長光または黄色単波長光の透過光で表面のキ
ズ,汚れ等をマクロ検査することができる。
Next, the color filter of the transmitted light system T is selected to be green single-wavelength light, and the same macro inspection as in the case of yellow single-wavelength light is carried out. In this way, the inspection object holding unit 1 macro-inspects the inspection object 2 freely at any position with the visually insensitive yellow single-wavelength light or the transmitted light of the yellow single-wavelength light for surface scratches, stains, and the like. be able to.

【0041】制御装置60により、伸縮支持部材44、
45が上下逆方向に伸縮した場合には、被検査物保持部
1の紙面に垂直な方向の両端の高さが異なるように保持
したまま、俯仰させた場合については、詳細な説明を省
略するが、反射光系R、透過光系Tを瞬間調光フィルタ
ー50a、50bを切り替えることにより反射光、透過
光で検査することができる。
By the control device 60, the telescopic support member 44,
When 45 is expanded and contracted in the upside down direction, detailed description is omitted for the case where the inspection object holding unit 1 is lifted while being held so that the heights of both ends in the direction perpendicular to the paper surface are different. However, the reflected light system R and the transmitted light system T can be inspected by the reflected light and the transmitted light by switching the instantaneous light control filters 50a and 50b.

【0042】このようにして、基台42、固定支持部材
43、伸縮支持部材44、45及び自在軸継手80a、
80bにより被検査物保持部1が任意の位置にすること
ができ、該被検査物保持部1上に載置した被検査物2を
自由に表面のキズ,汚れ等をマクロ検査することができ
る。さらに、目視の位置にCCDカメラを配設して映像
記録するようにしても差し支えない。また、本実施形態
においては、瞬間調光フィルター50a、50bを用い
た場合を説明したが、瞬間調光ガラスを用いても同様の
効果が得られる。
In this way, the base 42, the fixed support member 43, the expansion and contraction support members 44 and 45, and the universal shaft coupling 80a,
The object to be inspected 1 can be set to an arbitrary position by 80b, and the object to be inspected 2 placed on the object to be inspected 1 can be freely macro-inspected for scratches, dirt and the like. . Further, a CCD camera may be provided at the visual position to record an image. Further, although the case where the instant light control filters 50a and 50b are used has been described in the present embodiment, the same effect can be obtained by using the instant light control glass.

【0043】[0043]

【発明の効果】以上の詳細な説明で明らかな如く、本発
明に係わるマクロ検査装置の構成によれば、反射光系及
び透過光系に、プロジェクタ装置と瞬間調光フィルター
とフリネルレンズを用いることにより、ランプを点滅す
ることなく、任意の投射光を選択する共に、ランプ特性
を安定させることにより、被検査物の表面のキズ,汚れ
等の欠陥を見つける迅速、且つ精度を向上させたマクロ
検査装置を提供することができる。さらに、キズ,汚れ
等の欠陥を見つける人間の視覚がもっとも鋭敏な波長が
黄色、緑色であることにより、黄色及び緑色の単色光を
用い、感度のよりマクロ検査装置を提供することができ
る。さらにまた、投射光をミラーにて折り返したのち、
被検査物に投射することにより、被検査物の被熱性考慮
がなされ、かつ、装置の小型化が実現したマクロ検査装
置を提供することができる。
As is apparent from the above detailed description, according to the configuration of the macro inspection apparatus of the present invention, the projector apparatus, the instantaneous light control filter, and the Fresnel lens are used for the reflected light system and the transmitted light system. , A macro inspection device that selects any projection light without blinking the lamp and stabilizes the lamp characteristics to find defects such as scratches and dirt on the surface of the object to be inspected quickly and with improved accuracy Can be provided. Furthermore, since the wavelengths most sensitive to human vision for finding defects such as scratches and stains are yellow and green, it is possible to provide a macro inspection apparatus with higher sensitivity using monochromatic light of yellow and green. Furthermore, after returning the projected light with a mirror,
It is possible to provide a macro inspection apparatus in which the heat resistance of the inspection object is taken into consideration and the size of the apparatus is reduced by projecting onto the inspection object.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明に係わるマクロ検査装置の一実施形態に
説明図である。
FIG. 1 is an explanatory diagram of an embodiment of a macro inspection apparatus according to the present invention.

【図2】図1のマクロ検査装置の正面部分説明図であ
る。
FIG. 2 is a front part explanatory view of the macro inspection apparatus of FIG.

【図3】図1のマクロ検査装置に用いられる光源部の説
明図である。
FIG. 3 is an explanatory diagram of a light source unit used in the macro inspection apparatus of FIG.

【図4】従来技術のマクロ検査装置の構造説明図であ
る。
FIG. 4 is a structural explanatory view of a conventional macro inspection apparatus.

【符号の説明】[Explanation of symbols]

1 被検査物保持部 2 被検査物 R 反射光系 T 透過光系 3 反射光系のプロジェクタ装置 4 透過光系のプロジェクタ装置 5 反射光系のフレネルレンズ 6 反射光系の反射ミラー 7 透過光系のフレネルレンズ 8 透過光系の反射ミラー 42 基台 43 固定支持部材 44,45 伸縮支持部材 44a、45b 伸縮棒材 50 ガラス板 50a、b 瞬間調光フィルター 60 制御装置 80a,80b 自在軸継手 Lp 光源 H ホモナイザ F 色フィルター Fd フィルターの駆動装置 M 検査者 100 マクロ検査装置 100A マクロ検査装置の筺体 1 Inspection object holder 2 Inspected R reflected light system T transmitted light system 3 Reflected light projector device 4 Transmitted light projector device 5 Fresnel lens of reflected light system 6 Reflective mirror of reflected light system 7 Fresnel lens of transmitted light system 8 Reflection mirror of transmitted light system 42 base 43 Fixed support member 44, 45 telescopic support member 44a, 45b Telescopic rod material 50 glass plate 50a, b Instantaneous light control filter 60 control device 80a, 80b Universal shaft coupling Lp light source H homogenizer F color filter Fd filter drive M inspector 100 macro inspection equipment 100A macro inspection device housing

フロントページの続き Fターム(参考) 2G051 AA90 AB02 BA01 BB01 BB07 CA04 CA11 CB01 CB02 DA05 2H088 FA13 HA01 2H090 JC18 Continued front page    F term (reference) 2G051 AA90 AB02 BA01 BB01 BB07                       CA04 CA11 CB01 CB02 DA05                 2H088 FA13 HA01                 2H090 JC18

Claims (6)

【特許請求の範囲】[Claims] 【請求項1】被検査物に反射光を投射し、該投射されて
いる反射光を透過、遮断する第一の切り替え手段を具備
する反射光系と、被検査物に透過光を投射し、該投射さ
れている透過光を透過、遮断する第二の切り替え手段を
具備する透過光系と、前記被検査物を保持する被検査物
保持部と、該被検査物保持部を支持する支持部材と、前
記支持部材を駆動し前記被検査物保持部の姿勢を制御
し、該姿勢に応じて前記第一、第二の切り替え手段を制
御する制御手段とを備え、 前記第一の光源からの反射光を前記被検査物の表面に投
射したりまたは前記第二の光源からの透過光を前記被検
査物の背面に投射するようにしたことを特徴とするマク
ロ検査装置。
1. A reflected light system having a first switching means for projecting reflected light onto an object to be inspected and transmitting and blocking the reflected light projected thereon, and projecting transmitted light onto the object to be inspected, A transmitted light system having a second switching means for transmitting and blocking the transmitted transmitted light, an inspection object holding portion for holding the inspection object, and a support member for supporting the inspection object holding portion. And a control unit that drives the support member to control the posture of the inspection object holding unit, and controls the first and second switching units according to the posture. A macro inspection apparatus, characterized in that reflected light is projected onto the surface of the object to be inspected, or light transmitted from the second light source is projected onto the back surface of the object to be inspected.
【請求項2】請求項1に記載のマクロ検査装置におい
て、 前記反射光系は、反射光を投射する第一のランプ部と、
前記反射光の光路中に挿入され、該反射光を透過、遮断
する第一の瞬間調光ガラスもしくは瞬間調光フィルター
のいずれかと、前記第一の瞬間調光ガラスもしくは瞬間
調光フィルターのいずれかを透過した光を平行光にする
第一のフレネルレンズと、からなり、 前記透過光系は、透過光を投射する第二のランプ部と、
前記透過光の光路中に挿入され、該透過光を透過、遮断
する第二の瞬間調光ガラスもしくは瞬間調光フィルター
のいずれかと、前記第二の瞬間調光ガラスもしくは瞬間
調光フィルターのいずれかを透過した光を平行光にする
第二のフレネルレンズと、からなることを特徴とするマ
クロ検査装置。
2. The macro inspection apparatus according to claim 1, wherein the reflected light system includes a first lamp unit that projects reflected light,
Either the first instantaneous light control glass or the instantaneous light control filter which is inserted into the optical path of the reflected light and transmits or blocks the reflected light, and either the first instantaneous light control glass or the instantaneous light control filter. A first Fresnel lens for collimating the light transmitted through to, and the transmitted light system, a second lamp unit for projecting the transmitted light,
Either the second instantaneous light control glass or the instantaneous light control filter, which is inserted in the optical path of the transmitted light and transmits or blocks the transmitted light, and either the second instantaneous light control glass or the instantaneous light control filter. A second Fresnel lens for collimating the light transmitted through the second parallel light, and a macro inspection device.
【請求項3】請求項2に記載のマクロ検査装置におい
て、 前記支持部材は、前記被検査物保持部を軸継手を介して
支持する固定支持部材及び自在軸継手を介して支持する
伸縮自在な伸縮支持部材と、前記固定支持部材及び伸縮
支持部材が取付けられ、且つ水平方向に回動する基台と
からなり、 前記制御手段は、伸縮支持部材及び基台を駆動して前記
被検査物保持部の姿勢及び該姿勢に応じて、前記第一の
瞬間調光ガラスもしくは瞬間調光フィルターのいずれか
を光の透過もしくは遮断となし、該光の透過もしくは遮
断に対して前記第二の瞬間調光ガラスもしくは瞬間調光
フィルターのいずれかを光の遮断もしくは透過の状態と
なるように、制御するように構成したことを特徴とする
マクロ検査装置。
3. The macro inspection apparatus according to claim 2, wherein the support member is a fixed support member that supports the object-to-be-inspected holding portion via a shaft joint, and an expandable and contractable member that supports the support member via a universal shaft joint. It comprises an expansion and contraction support member, and a base on which the fixed support member and the expansion and contraction support member are attached and which rotates in the horizontal direction, and the control means drives the expansion and contraction support member and the base to hold the inspection object. Depending on the posture of the part and the posture, either the first instantaneous light control glass or the instantaneous light control filter is made to transmit or block light, and the second instantaneous light control is made for transmission or block of the light. A macro inspection apparatus characterized in that either the optical glass or the instantaneous light control filter is configured to be controlled so as to block or transmit light.
【請求項4】請求項2、3のいずれかに記載のマクロ検
査装置において、 前記第一のランプ部及び第二のランプ部は、それぞれ投
射光を投射するランプと該投射光を均一光にするホモナ
イザとからなり、前記ランプとホモナイザ間に黄色もし
くは緑色光を透過するフィルターを切り替え可能に配設
したプロジェクタ装置であることを特徴とするマクロ検
査装置。
4. The macro inspection apparatus according to claim 2, wherein the first lamp section and the second lamp section respectively project a projection light and a uniform projection light. A macroinspection device comprising a homogenizer, which is a projector device in which a filter that transmits yellow or green light is switchably arranged between the lamp and the homogenizer.
【請求項5】請求項1、2、3,4のいずれかに記載の
マクロ検査装置において、前記目視位置にCCDカメラを
配設したことを特徴とするマクロ検査装置。
5. The macro inspection apparatus according to any one of claims 1, 2, 3 and 4, wherein a CCD camera is provided at the visual position.
【請求項6】請求項4,5のいずれかに記載のマクロ検
査装置において、前記プロジェクタ装置と被検査物との
間に光軸を変更する反射ミラーを配設したことを特徴と
するマクロ検査装置。
6. The macro inspection apparatus according to claim 4, wherein a reflecting mirror for changing an optical axis is arranged between the projector device and the inspection object. apparatus.
JP2002144441A 2002-05-20 2002-05-20 Macro inspection device Expired - Fee Related JP4074779B2 (en)

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Application Number Priority Date Filing Date Title
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JP4074779B2 JP4074779B2 (en) 2008-04-09

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Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007155486A (en) * 2005-12-05 2007-06-21 Fujimori Gijutsu Kenkyusho:Kk Visual examination method of inspection target and visual examination device
JP2007298437A (en) * 2006-05-01 2007-11-15 Fujimori Gijutsu Kenkyusho:Kk Visual inspection method and visual inspection device for inspection object
KR100795080B1 (en) 2005-09-20 2008-01-17 가부시키가이샤 모리텍스 Board inspection lighting device
CN100465797C (en) * 2007-01-24 2009-03-04 友达光电股份有限公司 Developing device with macroscopic detection
CN102033336B (en) * 2009-09-24 2012-09-05 北京京东方光电科技有限公司 Detection equipment and detection method of liquid crystal display device
CN115616003A (en) * 2022-10-17 2023-01-17 四川长虹电器股份有限公司 Fresnel optical film inspection equipment and inspection method thereof

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100795080B1 (en) 2005-09-20 2008-01-17 가부시키가이샤 모리텍스 Board inspection lighting device
JP2007155486A (en) * 2005-12-05 2007-06-21 Fujimori Gijutsu Kenkyusho:Kk Visual examination method of inspection target and visual examination device
JP2007298437A (en) * 2006-05-01 2007-11-15 Fujimori Gijutsu Kenkyusho:Kk Visual inspection method and visual inspection device for inspection object
CN100465797C (en) * 2007-01-24 2009-03-04 友达光电股份有限公司 Developing device with macroscopic detection
CN102033336B (en) * 2009-09-24 2012-09-05 北京京东方光电科技有限公司 Detection equipment and detection method of liquid crystal display device
CN115616003A (en) * 2022-10-17 2023-01-17 四川长虹电器股份有限公司 Fresnel optical film inspection equipment and inspection method thereof
CN115616003B (en) * 2022-10-17 2024-06-11 四川长虹电器股份有限公司 Fresnel optical film inspection device and inspection method thereof

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