JP2003218675A5 - - Google Patents
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- JP2003218675A5 JP2003218675A5 JP2002012285A JP2002012285A JP2003218675A5 JP 2003218675 A5 JP2003218675 A5 JP 2003218675A5 JP 2002012285 A JP2002012285 A JP 2002012285A JP 2002012285 A JP2002012285 A JP 2002012285A JP 2003218675 A5 JP2003218675 A5 JP 2003218675A5
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- voltage
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- semiconductor element
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- 239000004065 semiconductor Substances 0.000 claims 27
- 238000006243 chemical reaction Methods 0.000 claims 4
- 238000000034 method Methods 0.000 claims 2
- 230000002093 peripheral effect Effects 0.000 claims 2
- 239000000758 substrate Substances 0.000 claims 1
Claims (13)
前記過電圧サージ電圧の抑制時に、前記制御端子に流れる電流を制限する要素と、前記主半導体素子の遮断時に制御端子の電圧を放電する回路に流れる電流を制限する要素と、前記電流により駆動回路内で発生する損失を低減する要素とを備えたことを特徴とする半導体素子の駆動装置。A first terminal related to the input and output of the connected main current to the first power supply, a second terminal, a driving device for a semi conductor device having a control terminal, the conduction and interruption of the main current In the drive device that controls according to the input signal and suppresses the overvoltage surge that occurs when the main current is turned on and off,
An element that limits the current flowing to the control terminal when the overvoltage surge voltage is suppressed; an element that limits the current flowing to a circuit that discharges the voltage of the control terminal when the main semiconductor element is shut off; and the current in the drive circuit And a device for reducing loss generated in the semiconductor device.
MOSFETを備え、前記入力信号が前記主半導体素子の主電流を遮断する指令を発生した時に、前記複数のMOSFETが導通状態に変化して低抵抗状態となり、その後少なくとも1つ以上のMOSFETが遮断状態となることで高抵抗となることを特徴とする半導体素子の駆動装置。7. The method according to claim 1, wherein the first variable resistance means includes a plurality of MOSFETs connected in parallel, and when the input signal generates a command to cut off a main current of the main semiconductor element. The semiconductor device driving device is characterized in that the MOSFET is turned into a conductive state and is in a low resistance state, and then at least one or more MOSFETs are cut off to become a high resistance.
VBを第1の電源電圧、fを電力変換装置キャリア周波数、Ron(V)を前記主半導体装置のオン抵抗を素子の耐電圧の関数として表したときに、前記第1の電圧を、下記の式(1)を満たす電圧Vの近傍に設定したことを特徴とする電力変換装置。
dRon(V)/dV=Ls×f/2×VB/(V−VB)2 …(1)In the power conversion device in which the semiconductor element is driven by the driving device according to any one of claims 1 to 9, and the main circuit inductance between the main semiconductor element and the first power source is Ls.
When VB is a first power supply voltage, f is a power converter carrier frequency, and Ron (V) is an on-resistance of the main semiconductor device as a function of a withstand voltage of the element, the first voltage is expressed as follows: A power converter characterized by being set in the vicinity of a voltage V that satisfies Equation (1).
dRon (V) / dV = Ls × f / 2 × VB / (V−VB) 2 (1)
前記駆動装置の主半導体素子への制御信号の出力回路部が集積回路の周辺部に形成され、前記集積回路の周辺沿面方向に、第1の相の上アーム,第2の相の上アーム,第3の相の上アーム,第3の相の下アーム,第2の相の下アーム,第1の相の上アームの順番に設け、前記インバータの制御のための前記制御回路への外部信号の入力回路を、第1の相の上アーム,第2の相の上アーム,第3の相の上アーム、第3の相の下アームの各領域の間以外の領域に設けたことを特徴とする電力変換装置。In a three-phase inverter type power converter in which a driving device for controlling a main semiconductor element related to input / output of a main current is integrated on a one-chip semiconductor substrate,
An output circuit portion for a control signal to the main semiconductor element of the driving device is formed in the peripheral portion of the integrated circuit, and the upper arm of the first phase, the upper arm of the second phase in the peripheral creeping direction of the integrated circuit, An external signal to the control circuit for controlling the inverter is provided in the order of the upper arm of the third phase, the lower arm of the third phase, the lower arm of the second phase, and the upper arm of the first phase. Is provided in a region other than between the regions of the upper arm of the first phase, the upper arm of the second phase, the upper arm of the third phase, and the lower arm of the third phase. A power converter.
dRon(V)/dV=Ls×f/2×VB/(V−VB)2 …(1)
を満たす電圧近傍に設けられており、前記主半導体素子の第1及び第2の端子間の耐電圧が前記第1の電圧より大きくかつその近傍の値となることを特徴とする電気車。13. An electric vehicle comprising the power conversion device according to claim 5, wherein the main semiconductor element is a MOSFET, and the semiconductor drive device of the power conversion device is integrated on one integrated circuit chip. Where V B is the first power supply voltage, f is the power converter carrier frequency, and Ron (V) is the on-resistance of the main semiconductor device as a function of the withstand voltage of the element, the upper limit is (1)
dRon (V) / dV = Ls × f / 2 × VB / (V−VB) 2 (1)
An electric vehicle characterized in that the withstand voltage between the first and second terminals of the main semiconductor element is greater than and close to the first voltage.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2002012285A JP3979096B2 (en) | 2002-01-22 | 2002-01-22 | Semiconductor device driving apparatus and power conversion apparatus using the same |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2002012285A JP3979096B2 (en) | 2002-01-22 | 2002-01-22 | Semiconductor device driving apparatus and power conversion apparatus using the same |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2003218675A JP2003218675A (en) | 2003-07-31 |
JP2003218675A5 true JP2003218675A5 (en) | 2005-06-09 |
JP3979096B2 JP3979096B2 (en) | 2007-09-19 |
Family
ID=27649524
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2002012285A Expired - Fee Related JP3979096B2 (en) | 2002-01-22 | 2002-01-22 | Semiconductor device driving apparatus and power conversion apparatus using the same |
Country Status (1)
Country | Link |
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JP (1) | JP3979096B2 (en) |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
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JP4506276B2 (en) * | 2004-05-17 | 2010-07-21 | 富士電機システムズ株式会社 | Drive circuit for self-extinguishing semiconductor device |
JP2006025516A (en) * | 2004-07-07 | 2006-01-26 | Toshiba Corp | Switching element drive circuit |
JP4866672B2 (en) * | 2006-07-27 | 2012-02-01 | ルネサスエレクトロニクス株式会社 | Load drive circuit |
JP5200559B2 (en) * | 2008-01-29 | 2013-06-05 | 東京電力株式会社 | Active gate circuit |
JP5970194B2 (en) | 2012-02-03 | 2016-08-17 | 株式会社 日立パワーデバイス | Semiconductor switching element drive circuit and power conversion circuit using the same |
JP6349897B2 (en) * | 2014-04-11 | 2018-07-04 | 株式会社デンソー | Timing adjustment method for drive circuit and timing adjustment circuit for drive circuit |
JP6527788B2 (en) * | 2015-08-21 | 2019-06-05 | 日立オートモティブシステムズ株式会社 | Electromagnetic load drive |
JP6825223B2 (en) * | 2016-04-15 | 2021-02-03 | 富士電機株式会社 | Drive and inductive load drive |
FR3051299B1 (en) * | 2016-05-11 | 2018-04-27 | Valeo Systemes De Controle Moteur | SWITCH SYSTEM AND ELECTRIC CONVERTER HAVING SUCH A SWITCH SYSTEM |
DE102017202184A1 (en) * | 2017-02-13 | 2018-08-16 | Robert Bosch Gmbh | Circuit arrangement for increasing the freewheeling voltage of an inductive load and output stage |
JP2019047416A (en) * | 2017-09-06 | 2019-03-22 | 日立オートモティブシステムズ株式会社 | Load control device |
CN108054743B (en) * | 2017-12-22 | 2019-05-10 | 上海艾为电子技术股份有限公司 | A kind of load switch integrated circuit and electronic equipment |
JP7131978B2 (en) * | 2018-06-21 | 2022-09-06 | 株式会社東芝 | Power semiconductor drive device and power conversion device |
JP7196044B2 (en) * | 2019-09-06 | 2022-12-26 | 株式会社 日立パワーデバイス | Semiconductor equipment and power conversion equipment |
JP7232788B2 (en) * | 2020-03-23 | 2023-03-03 | 日立Astemo株式会社 | Semiconductor devices, power modules, inverter devices, and electric vehicles |
US20240128966A1 (en) * | 2021-02-17 | 2024-04-18 | Mitsubishi Electric Corporation | Drive circuit for semiconductor switching device |
CN118100380B (en) * | 2024-04-29 | 2024-08-09 | 华羿微电子股份有限公司 | BMS active clamp protection circuit and chip |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
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JPS5866404A (en) * | 1981-10-16 | 1983-04-20 | Hitachi Ltd | transistor protection circuit |
JPH0225107A (en) * | 1988-07-13 | 1990-01-26 | Fuji Electric Co Ltd | Overvoltage suppression circuit for semiconductor switch elements |
JP2605854B2 (en) * | 1989-01-24 | 1997-04-30 | 富士電機株式会社 | Switch circuit with overvoltage protection circuit |
JPH05299990A (en) * | 1992-02-17 | 1993-11-12 | Fuji Electric Co Ltd | Semiconductor device |
JP3141613B2 (en) * | 1993-03-31 | 2001-03-05 | 株式会社日立製作所 | Method and circuit for driving voltage-driven element |
JPH07147726A (en) * | 1993-11-26 | 1995-06-06 | Fuji Electric Co Ltd | Overvoltage limiting circuit for semiconductor device |
JP3421507B2 (en) * | 1996-07-05 | 2003-06-30 | 三菱電機株式会社 | Driver circuit for semiconductor device |
JPH1188133A (en) * | 1997-07-17 | 1999-03-30 | Denso Corp | Load drive circuit |
JP3752943B2 (en) * | 2000-01-31 | 2006-03-08 | 株式会社日立製作所 | Semiconductor device driving apparatus and control method thereof |
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2002
- 2002-01-22 JP JP2002012285A patent/JP3979096B2/en not_active Expired - Fee Related
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