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JP2002296193A - Methods for establishing judgement-made value in flawed glass bottle inspection machine and for collecting reference data indispensable to the same value - Google Patents

Methods for establishing judgement-made value in flawed glass bottle inspection machine and for collecting reference data indispensable to the same value

Info

Publication number
JP2002296193A
JP2002296193A JP2001095684A JP2001095684A JP2002296193A JP 2002296193 A JP2002296193 A JP 2002296193A JP 2001095684 A JP2001095684 A JP 2001095684A JP 2001095684 A JP2001095684 A JP 2001095684A JP 2002296193 A JP2002296193 A JP 2002296193A
Authority
JP
Japan
Prior art keywords
value
data
inspection machine
bottle
voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2001095684A
Other languages
Japanese (ja)
Inventor
Katsutoshi Okawa
勝利 大川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toyo Glass Co Ltd
Original Assignee
Toyo Glass Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toyo Glass Co Ltd filed Critical Toyo Glass Co Ltd
Priority to JP2001095684A priority Critical patent/JP2002296193A/en
Publication of JP2002296193A publication Critical patent/JP2002296193A/en
Pending legal-status Critical Current

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  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide a method for establishing a judgement-made value in a simple way as well as in a very short time in a flawed glass bottle inspection machine, also requiring no more an individual adjuster's skill in setting up the same value. SOLUTION: A voltage waveform per bottle being outputted from each of respective flaw-detecting substrate at plural channels of the inspection machine is imported into each of respective bottom-hold circuits, wherein a minimum voltage value amid the inspection-timing thereof is measured. Then, such minimum voltage data having been measured at each channel are introduced into a device for collecting the maximum data of the flawed bottle, and the same minimum voltage value in the form of analogous quantities is converted to digital, the one thus digitized being transmitted to a computer, wherein the reference data at each bottle and channel involved therein are written on the tabular computing software. Thus, since the statistical data compilation is made possible, such an individual's dedicated skill in determining the setpoint value is no more required and the inspection itself can also be stepped up in precision.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、ガラスびんの内面
異物、傷、びり(ひび)などの欠点(以下単に「びり」
という)を総合的に検査する欠点検査機(いわゆるFP
検査機)において、正常か欠点があるかの適正な判定値
を設定する方法、及び判定値を設定するためのデータ収
集方法に関する。
BACKGROUND OF THE INVENTION The present invention relates to a defect (hereinafter simply referred to as "battery") such as foreign matter on the inner surface of a glass bottle, scratches, and cracks.
Defect inspection machine (so-called FP)
(Inspection machine), a method for setting an appropriate judgment value of normality or a defect, and a data collection method for setting the judgment value.

【0002】[0002]

【従来の技術】びり検査は、ガラスびんに光を当て、ガ
ラスびんから反射する光量を太陽電池素子を有するびり
検出基板で受光し、その光量を電圧信号(びり電圧)に
変換する。びん内面に「びり」がある場合は、びりがな
い場合と比較して反射する光量が多くなるため、このび
り電圧に判定値を設けてびりの有無を判定している。す
なわち、びり電圧が判定値よりも小さい(光量が多い)
ときには「欠点あり」、逆の場合は「正常」といった具
合である。判定値は受光素子の位置、光源の位置やガラ
スびんの種類などによって変化するため、製品(ガラス
びん)の品種変更があった場合は、びり検出基板から出
力されるびり電圧をオシロスコープ(電圧波形測定器)
を使って目視で観測し、適正な判定値(電圧値)を設定
している。
2. Description of the Related Art In a vibration inspection, light is applied to a glass bottle, a light amount reflected from the glass bottle is received by a vibration detection substrate having a solar cell element, and the light amount is converted into a voltage signal (battery voltage). When there is "chatter" on the inner surface of the bottle, the amount of reflected light is greater than when there is no chatter. Therefore, a determination value is provided for this chatter voltage to determine the presence or absence of chatter. That is, the chatter voltage is smaller than the determination value (the light amount is large).
Sometimes it is "faulty", and the opposite is "normal". The judgment value changes depending on the position of the light-receiving element, the position of the light source, the type of glass bottle, etc., so if there is a change in the product (glass bottle) type, the chatter voltage output from the chatter detection board will be Measuring instrument)
Is used for visual observation, and an appropriate judgment value (voltage value) is set.

【0003】[0003]

【発明が解決しようとする課題】従来、適正な判定値を
設定する場合、オシロスコープでびん1本あたり1回測
定される電圧波形を目視で観測するため、調整員によっ
て個人差があることと、検査を行う位置(びり検出基板
の数)が最大で十数カ所と多数あり、それぞれについて
判定値の設定が必要になるため、判定値の設定にきわめ
て長時間を要するという問題がある。
Conventionally, when an appropriate judgment value is set, a voltage waveform measured once per bottle with an oscilloscope is visually observed. There are a large number of positions (the number of vibration detection boards) where the inspection is performed, which are dozens or more, and it is necessary to set a judgment value for each of them. Therefore, there is a problem that setting the judgment value takes an extremely long time.

【0004】本発明は、FP検査機の判定値を簡単かつ
短時間で、しかも調整員の個人差といったばらつきがな
く設定することを課題としてなされたものである。
An object of the present invention is to set a determination value of an FP inspection machine simply and in a short time, and without variation such as individual differences among coordinators.

【0005】[0005]

【課題を解決するための手段】本発明は、検査機の複数
のチャンネルの各びり検出基板から出力されるびん1本
あたりの電圧波形をそれぞれボトムホールド回路に取り
込み、その検査タイミング中の最低電圧値を測定し、各
チャンネルで測定された最低電圧データをびり最大値デ
ータ収集装置に取り込んで最低電圧のアナログ値をデジ
タル値へ変換し、数値化された最低電圧をコンピュータ
に転送し、表計算ソフト上に各びん、各チャンネルごと
に記述することを特徴とするガラスびんの欠点検査機の
判定値を設定するためのデータ収集方法である。
According to the present invention, a voltage waveform per bottle output from each of the chatter detection boards of a plurality of channels of an inspection machine is taken into a bottom hold circuit, and the lowest voltage during the inspection timing is obtained. Measure the value, take the lowest voltage data measured in each channel, take it to the maximum value data collection device, convert the analog value of the lowest voltage into a digital value, transfer the digitized lowest voltage to the computer, and spreadsheet This is a data collection method for setting a judgment value of a defect inspection machine for glass bottles, which is described for each bottle and each channel on software.

【0006】なお、ボトムホールド回路は、デジタルメ
ータリレーを使い、指定したサンプリング期間内の最低
値を計測し、その最低値を保持する回路である。たとえ
ば、測定したい電圧が+5V〜−7Vの間をふらついて
いた場合、−7Vを保持して、次のホールド信号でその
アナログ電圧を出力する回路である。
The bottom hold circuit is a circuit that measures the lowest value within a specified sampling period using a digital meter relay and holds the lowest value. For example, when the voltage to be measured fluctuates between + 5V and -7V, the circuit holds -7V and outputs the analog voltage with the next hold signal.

【0007】また、びり最大値データ収集装置は、その
アナログ電圧を、取込み信号(収集装置のデータ取込み
信号)のタイミングで、複数チャンネル(以後「CH」
と記述する)を高速でサンプリングし、高精度でデジタ
ルデータに変換して大容量メモリに蓄え、PCカードを
介してコンピュータでダイレクトにデータ収集できるよ
うにした装置である。
Further, the chatter maximum value data collecting device converts the analog voltage into a plurality of channels (hereinafter "CH") at the timing of a capture signal (data capture signal of the capture device).
) Is sampled at high speed, converted into digital data with high precision, stored in a large-capacity memory, and directly collected by a computer via a PC card.

【0008】ボトムホールド回路のホールド開始、終
了、リセットの動作、及び、びり最大値データ収集装置
のデータ受け取り動作の制御は、FP検査機に接続した
シーケンサのFP検査機からのタイミング信号に基づく
制御により行うことができる。
The control of the start, end, and reset operations of the bottom hold circuit, and the control of the data receiving operation of the maximum vibration data collecting device are controlled based on a timing signal from the FP inspection machine of the sequencer connected to the FP inspection machine. Can be performed.

【0009】さらに本発明は、前記の方法によって収集
されたデータに基づいて判定値を設定することを特徴と
するガラスびんの欠点検査機の判定値設定方法である。
データの統計的な処理が可能となるため、設定する判定
値の個人差が無くなり、検査精度の向上を図ることがで
きる。
Further, the present invention is a method for setting a judgment value of a glass bottle defect inspection machine, wherein the judgment value is set based on the data collected by the above method.
Since the data can be statistically processed, there is no individual difference in the set determination value, and the inspection accuracy can be improved.

【0010】[0010]

【発明の実施の形態】以下、実施例に関する図面に基づ
いて本発明を詳細に説明する。図1は本発明を実施する
ための機器の概略説明図、図2は機器における信号の流
れを示す説明図、図3は制御信号の説明図、図4はデー
タシートの一例を示す説明図である。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be described below in detail with reference to the drawings relating to embodiments. FIG. 1 is a schematic explanatory view of a device for implementing the present invention, FIG. 2 is an explanatory diagram showing a signal flow in the device, FIG. 3 is an explanatory diagram of a control signal, and FIG. 4 is an explanatory diagram showing an example of a data sheet. is there.

【0011】図1に示すFP検査機は、びり基板の数
(検査カ所の数)が14CHある場合の例である。FP
検査機のCH1〜14の各びり検出基板から出力される
びん1本あたりの電圧波形をそれぞれボトムホールド回
路CH1〜14に取り込み、その検査タイミング中の最
低電圧値(びり検出基板は太陽電池素子の受光量が多い
ほどマイナス電圧を出力する)を測定する。各14CH
で測定された最低電圧データをびり最大値データ収集装
置に取り込み、最低電圧のアナログ値をデジタル値へ変
換する。数値化された最低電圧は上位のコンピュータに
転送され、表計算ソフト上にCHごとに記述される。例
えば、25本のびんを流し、各CHごとに25個のデー
タを収集し、統計的に処理し、判定値(電圧値)を設定
することができる。
The FP inspection machine shown in FIG. 1 is an example in which the number of chatter substrates (the number of inspection locations) is 14CH. FP
The voltage waveform per bottle output from each of the chatter detection boards CH1 to CH14 of the inspection machine is taken into the bottom hold circuits CH1 to CH14, respectively, and the lowest voltage value during the inspection timing (the chatter detection board is the (The more the amount of received light, the more negative voltage is output.) 14CH each
The minimum voltage data measured in step (1) is input to the maximum value data collection device, and the analog value of the minimum voltage is converted into a digital value. The digitized minimum voltage is transferred to the host computer, and described for each CH on spreadsheet software. For example, it is possible to flow 25 bottles, collect 25 data for each CH, process the data statistically, and set a determination value (voltage value).

【0012】図2、3に基づいて前記の機器における信
号の流れを説明する。FP検査機は所定の周期で検査を
行い、その都度びり電圧14CHとタイミング信号とを
出力する。びり電圧はボトムホールド回路に、タイミン
グ信号はシーケンサに送られる。シーケンサはタイミン
グ信号の開始時と終了時にボトムホールド回路に対して
ホールド信号を出力し、タイミング信号の終了時からタ
イマ設定値経過後に収集装置に対して取込み信号(デー
タの取り込みを指令する信号)を出力する。ボトムホー
ルド回路はデジタルメータリレーであり、シーケンサか
らホールド信号を受け取ると、これまでホールドしてい
た最低電圧値を一旦リセットし、電圧値のホールドを開
始する。図3のホールド電圧がホールド回路がホールド
している最低電圧を表している。そして、ホールド信号
から次のホールド信号までの間、その前のホールド信号
間の最低電圧値を出力し続ける。図3のホールド回路出
力が示すように、検査タイミングでホールドした最低電
圧aは、次のホールド信号とホールド信号の間中出力さ
れ続ける。びり最大値データ収集装置は、アナログ電圧
を高速でサンプリングする装置であり、シーケンサから
の取込み信号によって各CH毎のボトムホールド回路か
ら出力されている最低電圧を取り込み、高精度にデジタ
ルデータに変換し、コンピュータに転送する。コンピュ
ータは、びり最大値データ収集装置に対してスタート
(収集開始の指令)、本数(びん何本のデータを収集す
るかの指令)、検査CH(例えば1CH〜14CHのデ
ータを収集せよという指令)指令を行う。
Referring to FIGS. 2 and 3, the flow of signals in the above device will be described. The FP inspection machine performs an inspection at a predetermined cycle, and outputs a chatter voltage 14CH and a timing signal each time. The chatter voltage is sent to the bottom hold circuit, and the timing signal is sent to the sequencer. The sequencer outputs a hold signal to the bottom hold circuit at the start and end of the timing signal, and outputs a capture signal (a signal for instructing data capture) to the collection device after the timer set value has elapsed since the end of the timing signal. Output. The bottom hold circuit is a digital meter relay, and upon receiving a hold signal from the sequencer, resets the lowest voltage value that has been held so far and starts holding the voltage value. The hold voltage in FIG. 3 represents the lowest voltage held by the hold circuit. Then, from the hold signal to the next hold signal, the lowest voltage value between the previous hold signals is continuously output. As indicated by the output of the hold circuit in FIG. 3, the lowest voltage a held at the inspection timing is continuously output during the next hold signal. The maximum vibration value data collection device is a device that samples analog voltage at high speed, captures the lowest voltage output from the bottom hold circuit for each channel by a capture signal from the sequencer, and converts it to digital data with high accuracy. Transfer to computer. The computer starts (instructions to start collection), the number (instruction of how many bottles of data to collect), the inspection CH (for example, an instruction to collect data of 1CH to 14CH) to the chatter maximum value data collecting device. Make a command.

【0013】例えば図4に示すように、コンピュータは
収集装置から受け取ったデジタル最低電圧を各びん、各
CHごとにデータシート上に書き込む。また、必要に応
じて平均値、最小値、最大値、標準偏差などを書き込ん
でもよい。
For example, as shown in FIG. 4, the computer writes the digital minimum voltage received from the collection device on a data sheet for each bottle and each CH. Further, an average value, a minimum value, a maximum value, a standard deviation, and the like may be written as needed.

【0014】判定値を求める統計的処理は図4に示すよ
うなデータに基づいて行われる。例えば、同じ欠点(び
りの大きさ)のびんを100回サンプリングして、びり
最大値(大きなびりと判断した電圧最低値)とびり最小
値(小さなびりと判断した電圧最高値)の差が大きく、
ばらつきが大きい場合は、びりを検出する各ステーショ
ンのハンドリングがうまくセットされていないと判断で
きる。また、検査機のセット終了後、オンラインで良品
びんを流してデータをサンプリングしたときの集計デー
タを用い、各CH毎に製品の良否判断のしきい値を導き
出すことができ、良品誤排除を減らすことができる。し
たがって、経験の浅い調整員でも、これらの統計的処理
結果を用いて、短時間に14CHすべてに対し、確実に
欠点びんを排除し、良品びんを排除しないしきい値の設
定が可能になる。
The statistical processing for obtaining the judgment value is performed based on data as shown in FIG. For example, a bottle having the same defect (the magnitude of the chatter) is sampled 100 times, and the difference between the maximum chatter (the minimum voltage determined as a large chatter) and the minimum chatter (the maximum voltage as the small chatter) is large. ,
If the variation is large, it can be determined that the handling of each station for detecting chatter is not set properly. Also, after completing the setting of the inspection machine, the threshold of product quality can be derived for each channel by using the total data obtained by sampling the data by flowing non-defective bottles online, thereby reducing false rejection of non-defective products. be able to. Therefore, even an inexperienced adjuster can use these statistical processing results to set a threshold value for all 14 channels in a short period of time without fail to eliminate defective bottles and eliminate non-defective bottles.

【0015】[0015]

【発明の効果】本発明は次の効果を有するものである。 多数のチャンネルのびり電圧を同時に自動的に収集
できるため、調整時間の大幅な短縮を実現できる。 統計的な処理が可能となるため、設定する判定値の
個人差が無くなり、検査精度の向上を図ることができ
る。 多数のチャンネルのデータを同時にコンピュータ画
面上に表示することができ、それぞれ他のチャンネルと
の比較ができるため、照明や検出部の調整による不具合
や、ハンドリング調整の不良などを発見することができ
る。
The present invention has the following effects. Since the chatter voltages of many channels can be automatically collected at the same time, the adjustment time can be significantly reduced. Since statistical processing is possible, there is no individual difference in the set judgment value, and the inspection accuracy can be improved. Since data of a large number of channels can be displayed on the computer screen at the same time and can be compared with each other channel, it is possible to find a defect due to adjustment of the lighting and the detection unit, a defect in handling adjustment, and the like.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明を実施するための機器の概略説明図であ
る。
FIG. 1 is a schematic explanatory view of a device for carrying out the present invention.

【図2】機器における信号の流れを示す説明図である。FIG. 2 is an explanatory diagram showing a signal flow in the device.

【図3】びり電圧、ホールド電圧、ホールド回路出力及
び各信号の説明図である。
FIG. 3 is an explanatory diagram of a chatter voltage, a hold voltage, a hold circuit output, and each signal.

【図4】データシートの一例を示す説明図である。FIG. 4 is an explanatory diagram showing an example of a data sheet.

フロントページの続き Fターム(参考) 2F065 AA49 BB08 BB22 CC00 DD06 FF42 QQ23 QQ25 RR08 2G051 AA12 CA01 DA13 EA02 EA05 EA11 EA12 EA14 EB01 EC03 FA01 Continued on front page F term (reference) 2F065 AA49 BB08 BB22 CC00 DD06 FF42 QQ23 QQ25 RR08 2G051 AA12 CA01 DA13 EA02 EA05 EA11 EA12 EA14 EB01 EC03 FA01

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 検査機の複数のチャンネルの各びり検出
基板から出力されるびん1本あたりの電圧波形をそれぞ
れボトムホールド回路に取り込み、その検査タイミング
中の最低電圧値を測定し、各チャンネルで測定された最
低電圧データをびり最大値データ収集装置に取り込んで
最低電圧のアナログ値をデジタル値へ変換し、数値化さ
れた最低電圧をコンピュータに転送し、表計算ソフト上
に各びん、各チャンネルごとに記述することを特徴とす
るガラスびんの欠点検査機の判定値を設定するためのデ
ータ収集方法。
1. A voltage waveform per bottle output from each of the vibration detection boards of a plurality of channels of an inspection machine is taken into a bottom hold circuit, and the lowest voltage value during the inspection timing is measured. The measured minimum voltage data is loaded into the maximum value data collection device, the analog value of the minimum voltage is converted to a digital value, the minimum voltage quantified is transferred to the computer, and each bottle and each channel are displayed on spreadsheet software. A data collection method for setting a judgment value of a glass bottle defect inspection machine, characterized in that it is described for each.
【請求項2】 請求項1のデータ収集方法において、前
記ボトムホールド回路のホールド開始、終了、リセット
の動作が、前記検査機に接続したシーケンサが検査機か
ら受け取ったタイミング信号に基づいてボトムホールド
回路に対して出力するホールド信号によって制御され、
びり最大値データ収集装置のデータ取り込み動作が、前
記シーケンサが前記検査機から受け取ったタイミング信
号に基づいて該収集装置に対して出力する取込み信号に
よって制御されることを特徴とするガラスびんの欠点検
査機の判定値を設定するためのデータ収集方法。
2. The data collection method according to claim 1, wherein the start, end, and reset operations of the bottom hold circuit are performed based on a timing signal received from the tester by a sequencer connected to the tester. Is controlled by the hold signal output to
A defect inspection of a glass bottle, wherein a data capturing operation of the maximum vibration data collecting apparatus is controlled by a capturing signal output to the collecting apparatus based on a timing signal received by the sequencer from the inspection machine. Data collection method for setting machine judgment values.
【請求項3】 請求項2又は3の方法によって収集され
たデータに基づいて判定値を設定することを特徴とする
ガラスびんの欠点検査機の判定値設定方法
3. A method for setting a judgment value of a glass bottle defect inspection machine, wherein the judgment value is set based on data collected by the method according to claim 2 or 3.
JP2001095684A 2001-03-29 2001-03-29 Methods for establishing judgement-made value in flawed glass bottle inspection machine and for collecting reference data indispensable to the same value Pending JP2002296193A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001095684A JP2002296193A (en) 2001-03-29 2001-03-29 Methods for establishing judgement-made value in flawed glass bottle inspection machine and for collecting reference data indispensable to the same value

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001095684A JP2002296193A (en) 2001-03-29 2001-03-29 Methods for establishing judgement-made value in flawed glass bottle inspection machine and for collecting reference data indispensable to the same value

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011174730A (en) * 2010-02-23 2011-09-08 Yokogawa Electric Corp Measurement apparatus

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JPH01263539A (en) * 1988-04-15 1989-10-20 Hitachi Ltd Foreign matter inspecting apparatus
JPH10318841A (en) * 1997-05-14 1998-12-04 Nissan Motor Co Ltd Method and device for judging unevenness in color of metallic painting
JPH11344451A (en) * 1998-03-31 1999-12-14 Nihon Yamamura Glass Co Ltd Apparatus for inspecting check cracks of mouth part of glass bottle
JP2000081312A (en) * 1998-07-07 2000-03-21 Nippon Makushisu:Kk Inspecting method and apparatus for transparent substrate

Patent Citations (4)

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JPH01263539A (en) * 1988-04-15 1989-10-20 Hitachi Ltd Foreign matter inspecting apparatus
JPH10318841A (en) * 1997-05-14 1998-12-04 Nissan Motor Co Ltd Method and device for judging unevenness in color of metallic painting
JPH11344451A (en) * 1998-03-31 1999-12-14 Nihon Yamamura Glass Co Ltd Apparatus for inspecting check cracks of mouth part of glass bottle
JP2000081312A (en) * 1998-07-07 2000-03-21 Nippon Makushisu:Kk Inspecting method and apparatus for transparent substrate

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011174730A (en) * 2010-02-23 2011-09-08 Yokogawa Electric Corp Measurement apparatus

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