JP2002248465A - Evaporation-to-dryness method for wastewater - Google Patents
Evaporation-to-dryness method for wastewaterInfo
- Publication number
- JP2002248465A JP2002248465A JP2001050930A JP2001050930A JP2002248465A JP 2002248465 A JP2002248465 A JP 2002248465A JP 2001050930 A JP2001050930 A JP 2001050930A JP 2001050930 A JP2001050930 A JP 2001050930A JP 2002248465 A JP2002248465 A JP 2002248465A
- Authority
- JP
- Japan
- Prior art keywords
- wastewater
- solidified
- cmp
- waste
- cmp process
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- Heat Treatment Of Water, Waste Water Or Sewage (AREA)
Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明は、例えば、半導体デ
バイス製造工程から排出される廃水を蒸発乾燥処理装置
で処理して、固化廃棄物を得る方法に関するものであ
る。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for obtaining solidified waste by, for example, treating wastewater discharged from a semiconductor device manufacturing process by an evaporative drying apparatus.
【0002】[0002]
【従来の技術】半導体ウエハのような極めて清浄な表面
を得ることが求めれる被洗浄物の洗浄用脱塩水として
は、微粒子、コロイダル物質、有機物、金属及びイオン
類などが可能な限り除去された高純度な「超純水」と称
される水が用いられる。このような超純水は脱塩装置で
製造され、被洗浄物を洗浄する使用場所に供給される。
使用場所から排出された排水は、汚染が著しいものは廃
水処理装置に送られる。廃水処理装置では廃水を中和
し、有機物、窒素及びリン等の濃度低減化処理を行った
後、放流される。近年、環境保護関連の規制強化に伴う
放流規制などにより、放流設備を備えず脱塩排水をエバ
ポレータで濃縮し、その濃縮液を蒸発乾燥装置で処理
し、その固化廃棄物を廃棄物処理業者に引き渡すクロー
ズドシステム方式の排水処理装置が知られている。2. Description of the Related Art As demineralized water for cleaning an object to be cleaned which is required to obtain an extremely clean surface such as a semiconductor wafer, fine particles, colloidal substances, organic substances, metals and ions are removed as much as possible. High-purity water called "ultra pure water" is used. Such ultrapure water is produced by a desalination apparatus and supplied to a place where the object to be cleaned is cleaned.
Wastewater discharged from the place of use is sent to a wastewater treatment device if it is extremely contaminated. In the wastewater treatment device, the wastewater is neutralized and subjected to concentration reduction treatment of organic substances, nitrogen, phosphorus and the like, and then discharged. In recent years, dewatering wastewater has been concentrated by an evaporator without a discharge facility due to stricter regulations related to environmental protection, and the concentrated liquid is processed by an evaporator and the solidified waste is sent to a waste disposal company. 2. Description of the Related Art There is known a closed system type wastewater treatment device to be delivered.
【0003】クローズドシステム方式の排水処理装置で
使用される蒸発乾燥装置としては、伝熱加熱型乾燥機又
は圧力空気熱風乾燥機などが知られている。伝熱加熱型
乾燥機は、熱源から熱伝導によって、被処理物を間接加
熱して乾燥を行うもので、円筒ドラムの外周表面を利用
するドラム型乾燥機、中空円板の両側面を伝熱面として
利用するCD(Compact Disc)型乾燥機がある。これら
はいずれも、円筒ドラムの外周表面や円板の両側面に付
着した固化物をスクレーパーでかき落としている。ま
た、圧力空気熱風乾燥機は、乾燥ゾーンで乾燥した固化
物を下方部に設けた固化物排出口から系外へ排出してい
る。これらの蒸発乾燥装置では、固化物が連続的に系外
へ排出されることが生産コストを抑制する点で特に望ま
れている。As the evaporative drying device used in the closed system type wastewater treatment device, a heat transfer heating type dryer or a pressurized air hot air dryer is known. Heat transfer heating dryers are used to dry the workpiece by indirect heating by heat conduction from a heat source.Drum dryers that use the outer peripheral surface of a cylindrical drum, and heat transfer on both sides of a hollow disk There is a CD (Compact Disc) type dryer used as a surface. In each of these, the solidified material adhering to the outer peripheral surface of the cylindrical drum and both side surfaces of the disk is scraped off with a scraper. Further, the pressurized air hot air dryer discharges the solidified matter dried in the drying zone from the solidified matter discharge port provided at the lower part to the outside of the system. In these evaporative drying apparatuses, it is particularly desired that the solidified material be continuously discharged to the outside of the system in terms of suppressing the production cost.
【0004】[0004]
【発明が解決しようとする課題】しかしながら、伝熱加
熱型乾燥機では、廃水中の塩類や有機物の濃縮に伴いド
ラム表面で乾燥固化された固形物がべたついたり、硬く
なり過ぎたりして、固化物をドラムから剥離し難くな
る。固化物が伝熱表面に蓄積してくると、伝熱効率が著
しく低下し、その処理量が蓄積が無い状態の半分以下に
まで低下してくるという問題がある。一方、圧力空気熱
風乾燥機では、廃水中の塩類や有機物の影響で、固化物
排出口あるいはその近傍の壁部で乾燥固化された固化物
が吸湿して付着したり、あるいは、固化物排出口の上方
の壁部に蓄積した固化物が大きな塊状物となって下方に
崩落し、固化物排出口を閉塞させてしまうという問題が
ある。これらの問題を解決するには、付着あるいは蓄積
した固化物を定期的に清掃して除去する必要があるが、
このような重労働を行う清掃作業員の確保も困難であ
り、また、生産コストを押し上げるという問題がある。However, in a heat transfer heating dryer, solids dried and solidified on the drum surface become sticky or too hard due to the concentration of salts and organic substances in wastewater, and solidification occurs. It is difficult to peel off objects from the drum. When the solidified material accumulates on the heat transfer surface, there is a problem that the heat transfer efficiency is remarkably reduced, and the processing amount is reduced to less than half of the state without accumulation. On the other hand, in the pressurized air hot air dryer, the solidified matter dried and solidified at the solidified substance discharge port or the wall near the solid substance absorbs and adheres to the solidified substance discharge port due to the influence of salts and organic substances in the wastewater, or the solidified substance discharge port There is a problem that the solidified matter accumulated on the upper wall of the above becomes a large lump and collapses downward, thereby blocking the solidified matter discharge port. In order to solve these problems, it is necessary to periodically clean and remove the adhered or accumulated solids,
It is difficult to secure cleaning workers who perform such heavy labor, and there is a problem of increasing production costs.
【0005】従って、本発明の目的は、廃水を蒸発乾燥
処理装置で処理して、固化廃棄物を得る方法において、
伝熱面や固化物排出口近傍で固化物が付着することな
く、円滑に系外へ排出でき、従って、その処理能力が低
下することがなく、安定した運転が可能な廃水の蒸発乾
燥処理方法を提供することにある。Therefore, an object of the present invention is to provide a method for obtaining solidified waste by treating wastewater with an evaporative drying treatment apparatus.
A method of evaporating and drying wastewater that can be discharged smoothly without solidified matter adhering to the heat transfer surface or near the solidified matter discharge port, and therefore can be operated stably without reducing its treatment capacity. Is to provide.
【0006】[0006]
【課題を解決するための手段】かかる実情において、本
発明者らは鋭意検討を行った結果、廃水を蒸発乾燥処理
装置で処理して、固化廃棄物を得る方法において、廃水
にCMP排水を添加した後、該蒸発乾燥処理装置で処理
すれば、伝熱面や固化物排出口近傍で固化物が付着する
ことなく、連続して且つ円滑に固化物を系外へ排出でき
ることを見出し、本発明を完成するに至った。Under these circumstances, the present inventors have conducted intensive studies and as a result, in a method of treating waste water with an evaporative drying treatment apparatus to obtain solidified waste, CMP wastewater was added to the waste water. After that, the solidified material can be continuously and smoothly discharged to the outside of the system without being adhered to the heat transfer surface and the vicinity of the solidified material discharge port by treating with the evaporative drying treatment apparatus. Was completed.
【0007】すなわち、本発明(1)は、廃水を蒸発乾
燥処理装置で処理して、固化廃棄物を得る方法であっ
て、該廃水にCMP工程排水を添加した後、該蒸発乾燥
処理装置で処理する廃水の蒸発乾燥処理方法を提供する
ものである。かかる構成を採ることにより、伝熱加熱型
乾燥機では、廃水中の塩類や有機物の濃縮があっても、
ドラム表面に乾燥固化された固形物の付着が起こらず、
圧力空気熱風乾燥機では、固化物排出口あるいはその近
傍の壁部で固化物が付着したり、大きな塊状物となるこ
ともなく、連続して且つ円滑に固化物を系外へ排出でき
る。[0007] That is, the present invention (1) is a method for obtaining solidified waste by treating wastewater with an evaporative drying treatment apparatus. After adding wastewater from a CMP step to the wastewater, the evaporative drying treatment apparatus is used. An object of the present invention is to provide a method of evaporating and drying wastewater to be treated. By adopting such a configuration, in the heat transfer heating dryer, even if there is concentration of salts and organic substances in the wastewater,
There is no adhesion of dried and solidified solids on the drum surface,
In the pressurized air hot air dryer, the solidified material can be continuously and smoothly discharged to the outside of the system without the solidified material adhering to the solidified material discharge port or a wall near the solidified material outlet or forming a large lump.
【0008】また、本発明(2)は、前記廃水及び前記
CMP工程排水は共に、同じ半導体デバイス製造工場か
ら排出されたものである前記(1)記載の蒸発乾燥処理
方法を提供するものである。かかる構成を採ることによ
り、同じ半導体デバイス製造工場から排出されるCMP
工程排水を有効利用することができ、別途の固化調整剤
を購入する際に発生する種々の作業や工程を省略するこ
とができる。Further, the present invention (2) provides the evaporative drying treatment method according to the above (1), wherein the wastewater and the wastewater in the CMP step are both discharged from the same semiconductor device manufacturing factory. . By adopting such a configuration, CMP discharged from the same semiconductor device manufacturing factory
The process wastewater can be effectively used, and various operations and processes that occur when a separate solidification regulator is purchased can be omitted.
【0009】また、本発明(3)は、前記CMP工程排
水は、該CMP工程排水を分離膜で濃縮処理して容量を
減容させたCMP工程排水濃縮物である前記(1)又は
(2)記載の蒸発乾燥処理方法を提供するものである。
かかる構成を採ることにより、後の蒸発乾燥処理がより
一層効率的に行わせることができる。In the present invention (3), the CMP process wastewater is a CMP process wastewater concentrate obtained by reducing the volume of the CMP process wastewater by concentrating the wastewater with a separation membrane. )).
By adopting such a configuration, the subsequent evaporative drying process can be performed more efficiently.
【0010】[0010]
【発明の実施の形態】本発明の蒸発乾燥処理方法で使用
する廃水としては、半導体デバイス製造工場などから排
出される塩類などの不純物濃度が高められた排水が挙げ
られる。具体的には、半導体デバイス製造工場などにお
ける脱塩装置のうち、電気式脱イオン水製造装置の濃縮
室から排出される濃縮水、逆浸透膜装置の濃縮室から排
出される濃縮水及びイオン交換装置の再生時に排出され
る再生廃液などである。これらの濃縮水や再生廃液は、
蒸発乾燥処理装置に供給される前に更にエバポレータで
濃縮し、更に塩類濃度が高められた濃縮水とすること
が、蒸発乾燥処理における効率が一層高められる点で好
適である。廃水中、芒硝(硫酸ナトリウムの十水塩)が
高濃度で含まれるような場合、伝熱加熱型乾燥機の円筒
ドラム外周表面や中空円板の両側面などの伝熱面、圧力
空気熱風乾燥機の固化物排出口近傍に固化物が付着し易
くなり、後述するCMP工程排水の添加効果がより顕著
に表れる。BEST MODE FOR CARRYING OUT THE INVENTION The wastewater used in the evaporative drying treatment method of the present invention includes wastewater having an increased concentration of impurities such as salts discharged from a semiconductor device manufacturing factory or the like. Specifically, of the desalination equipment in a semiconductor device manufacturing factory, etc., concentrated water discharged from the concentration chamber of the electric deionized water production apparatus, concentrated water discharged from the concentration chamber of the reverse osmosis membrane apparatus, and ion exchange Regeneration waste liquid discharged when the apparatus is regenerated. These concentrated water and recycled wastewater are
Before being supplied to the evaporative drying apparatus, it is preferable to further concentrate by an evaporator to obtain a concentrated water having a higher salt concentration, since the efficiency in the evaporative drying processing is further enhanced. When wastewater contains high concentration of sodium sulfate (dehydrate of sodium sulfate), heat transfer surface such as cylindrical drum outer peripheral surface of heat transfer heating type dryer and both sides of hollow disk, pressure air hot air drying The solidified matter easily adheres to the vicinity of the solidified matter discharge port of the machine, and the effect of adding the wastewater from the CMP process described later is more remarkably exhibited.
【0011】本発明においては、上記廃水を蒸発乾燥処
理する前に、該廃水にケミカルメカニカルポリッシング
(CMP)工程排水を添加する。このCMP工程排水の
添加により、蒸発乾燥装置の伝熱面や固化物排出口ある
いはその近傍の壁部に固化物が付着しなくなり、固化廃
棄物の系外への排出が円滑に行われる。当該CMP工程
排水において、CMP工程は、半導体デバイスの製造に
おいては、例えば、層間絶縁膜の平坦化工程、素子分離
形成のための精密化工程など種々の研磨工程を言う。具
体的には、コロイダルシリカ(SiO2 )、Al
2 O3 、MnO2 などの研磨剤粒子を、アンモニウム塩
やカリウム塩などの電解質、過酸化水素などの酸化剤、
硝酸、ふっ酸などの無機酸、カルボン酸などの有機酸、
無機又はアルカリ剤、有機系分散剤や界面活性剤などの
薬剤を含む水中に分散させて得られる分散体を研磨液
(CMPスラリー)として用いて研磨する工程を言い、
通常、ポリウレタンなどからなる研磨パッド上で研磨す
る。AlやWの研磨用CMPスラリーは酸性、Cuの研
磨用CMPスラリーは弱酸性又は中性付近であるのが一
般的である。In the present invention, before the wastewater is subjected to the evaporative drying treatment, wastewater from a chemical mechanical polishing (CMP) step is added to the wastewater. By the addition of the wastewater from the CMP step, the solidified substance does not adhere to the heat transfer surface of the evaporative drying apparatus, the solidified substance discharge port or a wall in the vicinity thereof, and the solidified waste is smoothly discharged out of the system. In the CMP process drainage, the CMP process refers to various polishing processes such as a flattening process of an interlayer insulating film and a precision process for forming an element isolation in the manufacture of a semiconductor device. Specifically, colloidal silica (SiO 2 ), Al
Abrasive particles such as 2 O 3 , MnO 2 , an electrolyte such as an ammonium salt or a potassium salt, an oxidizing agent such as hydrogen peroxide,
Inorganic acids such as nitric acid and hydrofluoric acid, organic acids such as carboxylic acid,
A step of polishing using a dispersion obtained by dispersing in water containing a chemical such as an inorganic or alkaline agent, an organic dispersant or a surfactant as a polishing liquid (CMP slurry),
Usually, polishing is performed on a polishing pad made of polyurethane or the like. Generally, the CMP slurry for polishing Al or W is acidic, and the CMP slurry for polishing Cu is weakly acidic or near neutral.
【0012】本発明において、上記CMPスラリーを用
いたCMP工程を行って生じるCMP工程排水は、上記
CMPスラリー成分の他、Ti、TiN、TaNなどの
バリアメタル、メタル膜、層間絶縁膜などの被研磨物の
屑や研磨パッド屑などを含み、リンス水で希釈されて排
出されたものである。In the present invention, the CMP process wastewater generated by performing the CMP process using the above-mentioned CMP slurry is not only the above-mentioned CMP slurry component but also a barrier metal such as Ti, TiN and TaN, a metal film, an interlayer insulating film and the like. It contains refuse of polishing material, polishing pad debris, etc., and is diluted with rinsing water and discharged.
【0013】前記CMP工程排水は、該CMP工程排水
を分離膜で濃縮処理して容量を減容させたCMP工程排
水濃縮物として、前記廃水に添加することが、後の蒸発
乾燥処理をより一層効率的に行わせることができる点で
好ましい。分離膜(濾過膜)としては、特に制限されな
いが、例えば、有機系やセラミック系の限外濾過膜や精
密濾過膜が挙げられる。該CMP工程排水濃縮物は、通
常、産業廃棄物処理として処分がなされていたものであ
るが、本発明で使用することにより、有効利用が図れ極
めて都合がよい。CMP工程排水を分離膜で濃縮処理し
て得られる分離水(濾過水)は活性炭処理などを行っ
て、脱塩装置の原水に戻してもよい。また、前記CMP
工程排水は、前記廃水が排出される半導体デバイス製造
工場と同じ工場から排出されたものを使用すると、廃水
に係る本発明の課題を簡便で、低コストで解決すること
ができると共に、別途の固化調整剤を購入する際に発生
する種々の作業や工程を省略することができる。同じ半
導体デバイス製造工場とは、同一建屋のものに限定され
ず、廃水へのCMP工程排水の添加が配管施工できる程
度の範囲内にあれば、同一敷地内のものから隣接敷地内
のものも含まれる。[0013] The CMP process wastewater may be added to the wastewater as a CMP process wastewater concentrate whose volume has been reduced by concentrating the CMP process wastewater with a separation membrane, so that the subsequent evaporative drying treatment is further performed. This is preferable in that it can be performed efficiently. The separation membrane (filtration membrane) is not particularly limited, and examples thereof include an organic or ceramic ultrafiltration membrane and a microfiltration membrane. The CMP process wastewater concentrate is usually disposed of as an industrial waste treatment, but by using it in the present invention, effective utilization can be achieved and it is extremely convenient. Separated water (filtrated water) obtained by condensing the wastewater from the CMP step with a separation membrane may be subjected to an activated carbon treatment or the like, and then returned to the raw water of the desalination apparatus. In addition, the CMP
If the process wastewater is discharged from the same factory as the semiconductor device manufacturing plant from which the wastewater is discharged, the problem of the present invention relating to the wastewater can be simply and at low cost and can be separately solidified. Various operations and steps that occur when purchasing the adjusting agent can be omitted. The same semiconductor device manufacturing plant is not limited to the same building, but includes the same site to the adjacent site as long as the addition of the wastewater from the CMP process to the wastewater is within the range that can be carried out by piping. It is.
【0014】廃水に対するCMP工程排水又はCMP工
程排水濃縮物(以下、区別して述べる場合を除いて、単
に「CMP工程排水等」と言う。)の添加割合として
は、特に制限されないが、例えば、エバポレータで濃縮
された廃水に対してCMP工程排水濃縮物を添加する場
合、エバポレータで濃縮された廃水100重量部に対し
て、CMP工程排水濃縮物25重量部〜100重量部で
あり、全蒸発残留物濃度(%)基準で、CMP工程排水
濃縮物の添加量は、エバポレータで濃縮された廃水に対
して、0.1〜1.0倍とすることが、後の蒸発乾燥処
理効率を高めることができる点で好ましい。エバポレー
タで濃縮された廃水に対してCMP工程排水濃縮物の添
加量が少なすぎると、固化物が蒸発乾燥処理装置の伝熱
面や固化物排出口近傍で付着してしまう。一方、添加を
多くし過ぎても固化物付着低減効果は飽和しており、過
剰添加分、廃水の蒸発乾燥処理効率を低下させてしま
う。The ratio of addition of the wastewater of the CMP process or the concentrate of the wastewater of the CMP process (hereinafter simply referred to as “the wastewater of the CMP process, etc.” to the wastewater) is not particularly limited, but may be, for example, an evaporator. When the CMP process wastewater concentrate is added to the wastewater concentrated in the step, the CMP process wastewater concentrate is 25 parts by weight to 100 parts by weight with respect to 100 parts by weight of the wastewater concentrated by the evaporator. On the basis of the concentration (%), the amount of the wastewater concentrate added in the CMP process should be 0.1 to 1.0 times the wastewater concentrated by the evaporator, so that the efficiency of the subsequent evaporative drying treatment can be increased. It is preferable because it can be performed. If the addition amount of the wastewater concentrate in the CMP process is too small relative to the wastewater concentrated by the evaporator, the solidified matter adheres on the heat transfer surface of the evaporative drying apparatus or in the vicinity of the solidified matter discharge port. On the other hand, even if the addition is excessive, the effect of reducing solid matter adhesion is saturated, and the amount of excess addition and the efficiency of the evaporative drying treatment of wastewater are reduced.
【0015】本発明において、蒸発乾燥処理装置として
は、従来から使用されている公知のものが使用でき、例
えば、伝熱加熱型乾燥機及び圧力空気熱風乾燥機などが
挙げられる。伝熱加熱型乾燥機は、熱源から熱伝導によ
って、被処理物を間接加熱して乾燥を行うもので、例え
ば、円筒ドラムの外周表面を利用するドラム型乾燥機及
び中空円板の両側面を伝熱面として利用するCD(Comp
act Disc)型乾燥機が挙げられる。圧力空気熱風乾燥機
は、例えば、ノズルを通過中の廃水に圧縮空気を吹きつ
け、霧状にすることで乾燥し易くしたもので、水分は瞬
時に蒸発し、粉末化した固化物を集塵機から排出する構
造のものである。In the present invention, as the evaporative drying apparatus, a conventionally known apparatus can be used, and examples thereof include a heat transfer heating dryer and a pressurized air hot air dryer. The heat transfer heating dryer is a device that performs indirect heating and drying of the object to be processed by heat conduction from a heat source.For example, a drum dryer using the outer peripheral surface of a cylindrical drum and both sides of a hollow disc are used. CD used as heat transfer surface (Comp
act Disc) type dryer. A pressure air hot air dryer, for example, blows compressed air into wastewater that is passing through a nozzle and makes it easier to dry by atomization, moisture evaporates instantaneously, and powdered solidified matter is collected from a dust collector. It has a structure to discharge.
【0016】本発明において、廃水とCMP工程排水等
との混合物を蒸発乾燥処理する方法としては、特に制限
されず、従来の公知の方法が適用されるが、その一例を
図1を参照して説明する。図1は、本発明の実施の形態
における蒸発乾燥処理方法を実施するフロー図である。
図中、廃水処理装置10は、半導体デバイス製造工場か
ら排出された脱塩装置系の廃水と同工場から排出された
CMP工程排水系からなる被処理液供給部Aと、蒸発乾
燥処理装置部Bとから構成される。エバポレータ(不図
示)により濃縮された廃水濃縮物は途中、配管9により
供給されるCMP工程排水濃縮物と混合され、該混合物
(被処理液)は被処理液供給配管7により3流体ノズル
2に供給される。3流体ノズル2には更に、配管11か
ら300〜600℃の熱風と、配管12から圧縮空気が
それぞれ供給されている。CMP工程排水濃縮物は、C
MP工程排水を濾過装置1により濾別された濃縮側のも
のであり、濾過側は濾過水として配管14により再利用
などに供される。3流体ノズル2に送られた被処理液は
圧縮空気で霧状にされ、単位体積当たりの表面積が拡大
され、これが前記温度範囲にある熱風によって、乾燥ゾ
ーン3a内に噴出される。この際、被処理液は圧縮空気
と熱風により微細な水滴の状態で噴出され、微細な水滴
は瞬間的に蒸発し、蒸発した水分と粉状物はバグフィル
ター4で分離され、粉状となった固化廃棄物は重力によ
り比較的低温のホッパーの壁6などの固化物排出口近傍
に落ちる。本発明においては、例え、吸湿性の高い芒硝
などを多量に含有する廃水であっても、CMP工程排水
中に含まれる無機研磨剤粒子や無機研磨屑などが効果的
に作用し、吸湿を抑制して乾燥状態を維持したり、ある
いは珪素化合物が固化廃棄物に包含され、固化廃棄物の
比重が大きくなり脱落し易くなるなどの理由で、該脱落
物はホッパーの壁6などを伝って、ホッパーの下方に付
設された固化物排出口5から開状態の開閉弁51及び配
管13を通って系外へ円滑に排出される。一方、蒸発し
た水分は配管41を通って系外へ排気される。乾燥ゾー
ン3aの温度は通常は125℃前後である。In the present invention, the method for evaporating and drying the mixture of wastewater and wastewater from the CMP step is not particularly limited, and a conventionally known method is applied. One example of the method is shown in FIG. explain. FIG. 1 is a flowchart for carrying out an evaporative drying method according to an embodiment of the present invention.
In the figure, a wastewater treatment apparatus 10 includes a treatment liquid supply unit A including a desalination system wastewater discharged from a semiconductor device manufacturing plant and a CMP process drainage system discharged from the semiconductor device manufacturing plant, and an evaporative drying treatment unit B. It is composed of The wastewater concentrate concentrated by the evaporator (not shown) is mixed with the wastewater concentrate in the CMP process supplied by the pipe 9 on the way, and the mixture (liquid to be treated) is supplied to the three-fluid nozzle 2 by the liquid supply pipe 7 to be treated. Supplied. The three-fluid nozzle 2 is further supplied with hot air at 300 to 600 ° C. from the pipe 11 and compressed air from the pipe 12, respectively. CMP process wastewater concentrate
The wastewater from the MP process is drained off by the filtration device 1 on the concentration side, and the filtration side is reused as filtered water through the pipe 14. The liquid to be treated sent to the three-fluid nozzle 2 is atomized by compressed air, the surface area per unit volume is enlarged, and this is jetted into the drying zone 3a by hot air within the above temperature range. At this time, the liquid to be treated is ejected in the form of fine water droplets by compressed air and hot air, and the fine water droplets evaporate instantaneously, and the evaporated water and powder are separated by the bag filter 4 to become powder. The solidified waste falls due to gravity near the solidified material discharge port such as a relatively low temperature hopper wall 6. In the present invention, for example, even in the case of wastewater containing a large amount of highly hygroscopic sodium sulfate, inorganic abrasive particles and inorganic polishing debris contained in the wastewater of the CMP process act effectively to suppress moisture absorption. In order to maintain the dry state or to contain the silicon compound in the solidified waste, the specific gravity of the solidified waste is increased, and the solidified waste is easily dropped off. Solid matter is smoothly discharged out of the system through the open / close valve 51 and the pipe 13 from the solidified matter discharge port 5 provided below the hopper. On the other hand, the evaporated water is exhausted out of the system through the pipe 41. The temperature of the drying zone 3a is usually around 125 ° C.
【0017】[0017]
【実施例】次に、実施例を挙げて本発明を更に具体的に
説明するが、これは単に例示であって、本発明を制限す
るものではない。 実施例1 図1に示すフローの廃水処理装置を使用し、且つ前述の
処理方法に従い、エバポレータで濃縮された廃水とCM
P工程排水濃縮物の混合物を蒸発乾燥処理装置3で連続
24時間処理した。エバポレータで濃縮された廃水(E
VP濃縮水)、及びCMP工程排水濃縮物(CMP濃縮
水)の性状を表1に示す。また、固化廃棄物のホッパー
の壁6への堆積、あるいは配管13からの排出状況を下
記に示す評価方法で観察した。結果を表2に示す。Next, the present invention will be described in more detail with reference to examples, but this is merely an example and does not limit the present invention. Example 1 Wastewater and CM concentrated by an evaporator using a wastewater treatment apparatus having the flow shown in FIG. 1 and according to the above-described treatment method
The mixture of the P step wastewater concentrate was treated in the evaporative drying treatment apparatus 3 continuously for 24 hours. Wastewater concentrated in the evaporator (E
Table 1 shows the properties of the VP concentrated water) and the CMP process wastewater concentrate (CMP concentrated water). Further, the state of accumulation of the solidified waste on the wall 6 of the hopper or the state of discharge from the pipe 13 was observed by the following evaluation method. Table 2 shows the results.
【0018】(被処理液) ・EVP濃縮水:CMP濃縮水=4:1(重量比) (蒸発乾燥処理装置) ・CCドライヤーLタイプ(荏原実業株式会社) 廃水処理量;560kg/ 時間 (評価方法) ・処理運転中、配管13から系外への固化廃棄物の排出
状況を観察する。一方、連続運転終了後、乾燥ゾーン内
点検口(不図示)からホッパーの壁6の近傍における固
化廃棄物の堆積状況を観察する。また、堆積物がある場
合、こき棒で堆積物をこき落とし、堆積物の付着状況を
観察する。(Liquid to be treated) EVP concentrated water: CMP concentrated water = 4: 1 (weight ratio) (Evaporation drying treatment equipment) CC dryer L type (EBARA BUSINESS CO., LTD.) Wastewater treatment amount: 560 kg / hour (Evaluation Method)-During the treatment operation, the state of discharge of the solidified waste from the pipe 13 to the outside of the system is observed. On the other hand, after the end of the continuous operation, the accumulation state of the solidified waste in the vicinity of the wall 6 of the hopper is observed from the inspection port (not shown) in the drying zone. In addition, if there is a deposit, the deposit is scraped off with a pestle, and the adhesion state of the deposit is observed.
【0019】[0019]
【表1】 [Table 1]
【0020】実施例2〜4 EVP濃縮水とCMP濃縮水の比4:1(重量比)を、
8:3(重量比)(実施例2)、2:1(重量比)(実
施例3)、3:2(重量比)(実施例4)とした以外
は、実施例1と同様の方法で行った。結果を表2に示
す。Examples 2 to 4 The ratio of 4: 1 (weight ratio) of EVP concentrated water to CMP concentrated water was
8: 3 (weight ratio) (Example 2), 2: 1 (weight ratio) (Example 3), 3: 2 (weight ratio) (Example 4) I went in. Table 2 shows the results.
【0021】比較例1 CMP濃縮水を添加することなく、EVP濃縮水をその
まま、蒸発乾燥処理装置に供給した以外は、実施例1と
同様の方法で行った。結果を表2に示す。Comparative Example 1 The same procedure as in Example 1 was carried out, except that the EVP concentrated water was supplied as it was to the evaporative drying apparatus without adding the CMP concentrated water. Table 2 shows the results.
【0022】[0022]
【表2】 [Table 2]
【0023】表2より明らかなように、廃水であるEV
P濃縮水をCMP濃縮水の添加なしで、蒸発乾燥処理し
た比較例1は、運転時間2時間後において、ホッパーの
壁部に吸湿性の塊状物が堆積していることから、適当な
時期での清掃作業が必要となる状況であった。一方、E
VP濃縮水にCMP濃縮水を添加して蒸発乾燥処理した
実施例1〜4は、いずれも、固化廃棄物は乾燥してお
り、系外へ円滑に排出され、24時間の連続運転を何ら
支障なく行うことができた。As can be seen from Table 2, the wastewater EV
In Comparative Example 1 in which the P-concentrated water was evaporated and dried without adding the CMP-concentrated water, the hygroscopic mass was deposited on the wall of the hopper after an operation time of 2 hours. Cleaning work was required. On the other hand, E
In Examples 1 to 4 in which the CMP concentrated water was added to the VP concentrated water to evaporate and dry, the solidified waste was dry and smoothly discharged to the outside of the system, which hindered continuous operation for 24 hours. Could be done without.
【0024】[0024]
【発明の効果】本発明(1)によれば、伝熱加熱型乾燥
機では、廃水中の塩類や有機物の濃縮があっても、ドラ
ム表面に乾燥固化された固形物の付着が起こらず、圧力
空気熱風乾燥機では、固化物排出口あるいはその近傍の
壁部で固化物が付着したり、大きな塊状物となることも
なく、連続して且つ円滑に固化物を系外へ排出できる。
また、本発明(2)によれば、同じ半導体デバイス製造
工場から排出されるCMP工程排水を有効利用すること
ができ、別途の固化調整剤を購入する際に発生する種々
の作業や工程を省略することができる。また、本発明
(3)によれば、後の蒸発乾燥処理をより一層効率的に
行わせることができる。According to the present invention (1), in the heat transfer heating dryer, even when salts and organic substances in the wastewater are concentrated, the solidified solids do not adhere to the drum surface. In the pressurized air hot air dryer, the solidified material can be continuously and smoothly discharged to the outside of the system without the solidified material adhering to the solidified material discharge port or a wall near the solidified material outlet or forming a large lump.
Further, according to the present invention (2), the wastewater from the CMP process discharged from the same semiconductor device manufacturing factory can be effectively used, and various operations and processes that occur when purchasing a separate solidification regulator are omitted. can do. Further, according to the present invention (3), the subsequent evaporative drying can be performed more efficiently.
【図1】本発明の実施の形態における蒸発乾燥処理方法
を実施するフロー図である。FIG. 1 is a flowchart for carrying out an evaporative drying method according to an embodiment of the present invention.
1 濾過装置 2 3流体ノズル 3 蒸発乾燥処理装置 3a 乾燥ゾーン 4 バグフィルター 5 固化物排出口 6 ホッパーの壁 7 被処理液供給配管 9、11、12、、13、14、41 配管 10 廃水処理装置 51 開閉弁 A 被処理液供給部 B 蒸発乾燥処理装置部 DESCRIPTION OF SYMBOLS 1 Filtration apparatus 2 3 Fluid nozzle 3 Evaporation drying processing apparatus 3a Drying zone 4 Bag filter 5 Solidified substance discharge port 6 Wall of hopper 7 Liquid supply pipe to be processed 9, 11, 12, 13, 14, 41 Pipe 10 Waste water treatment apparatus 51 On-off valve A Liquid supply part to be treated B Evaporation drying processing part
Claims (3)
化廃棄物を得る方法であって、該廃水にCMP工程排水
を添加した後、該蒸発乾燥処理装置で処理することを特
徴とする廃水の蒸発乾燥処理方法。1. A method for obtaining solidified waste by treating wastewater with an evaporative drying apparatus, comprising adding wastewater from a CMP process to the wastewater and treating the wastewater with the evaporative drying apparatus. Wastewater evaporation drying method.
に、同じ半導体デバイス製造工場から排出されたもので
あることを特徴とする請求項1記載の蒸発乾燥処理方
法。2. The method according to claim 1, wherein the wastewater and the wastewater from the CMP step are both discharged from the same semiconductor device manufacturing factory.
水を分離膜で濃縮処理して容量を減容させたCMP工程
排水濃縮物であることを特徴とする請求項1又は2記載
の蒸発乾燥処理方法。3. The evaporative drying according to claim 1, wherein the CMP process wastewater is a CMP process wastewater concentrate obtained by reducing the volume of the CMP process wastewater by concentrating the wastewater with a separation membrane. Processing method.
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CN105521984A (en) * | 2015-12-29 | 2016-04-27 | 黄贺明 | Horizontal production line for recycling, processing and treating ceramic sludge |
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