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JP2001342450A - Adhesive and electronic parts using the same - Google Patents

Adhesive and electronic parts using the same

Info

Publication number
JP2001342450A
JP2001342450A JP2000161262A JP2000161262A JP2001342450A JP 2001342450 A JP2001342450 A JP 2001342450A JP 2000161262 A JP2000161262 A JP 2000161262A JP 2000161262 A JP2000161262 A JP 2000161262A JP 2001342450 A JP2001342450 A JP 2001342450A
Authority
JP
Japan
Prior art keywords
adhesive
adhesive layer
wiring conductor
resin
weight
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2000161262A
Other languages
Japanese (ja)
Inventor
Isamu Kirikihira
勇 桐木平
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kyocera Corp
Original Assignee
Kyocera Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kyocera Corp filed Critical Kyocera Corp
Priority to JP2000161262A priority Critical patent/JP2001342450A/en
Publication of JP2001342450A publication Critical patent/JP2001342450A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • H01L2224/161Disposition
    • H01L2224/16151Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/16221Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/16225Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321Disposition
    • H01L2224/32151Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/32221Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/32225Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73201Location after the connecting process on the same surface
    • H01L2224/73203Bump and layer connectors
    • H01L2224/73204Bump and layer connectors the bump connector being embedded into the layer connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/1517Multilayer substrate
    • H01L2924/15192Resurf arrangement of the internal vias
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/153Connection portion
    • H01L2924/1531Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
    • H01L2924/15311Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA

Landscapes

  • Polymerisation Methods In General (AREA)
  • Adhesives Or Adhesive Processes (AREA)
  • Macromonomer-Based Addition Polymer (AREA)
  • Manufacturing Of Printed Wiring (AREA)
  • Adhesive Tapes (AREA)

Abstract

(57)【要約】 【課題】 電子部品を構成する配線基板用の接着材層の
表面に配線導体層と強固に密着する粗面を形成できない
ため、熱膨張と熱収縮に伴う歪みにより配線導体層の剥
がれが発生する。 【解決手段】 絶縁基板4上に形成され、表面に配線導
体層6が被着形成される接着材層5用の接着材であっ
て、芳香族・複素環系樹脂変性物と、ラジカル重合性の
架橋材と、重量平均分子量が10000〜500000であって粗
化液に溶解する熱可塑性樹脂と、ガラス転移温度Tgが
−60〜−20℃のエラストマーと、フィラーとから成り、
硬化後の破断伸びが3〜10%であることを特徴とするも
のである。本発明の接着材によれば、接着材層5表面に
良好な粗面を形成することができ、配線導体層6の密着
強度を向上させることができる。
(57) Abstract: A wiring conductor cannot be formed on a surface of an adhesive layer for a wiring board constituting an electronic component, because a rough surface that firmly adheres to the wiring conductor layer cannot be formed. Peeling of the layer occurs. An adhesive for an adhesive layer (5) formed on an insulating substrate (4) and having a wiring conductor layer (6) adhered to the surface thereof, comprising an aromatic / heterocyclic resin modified product and a radical polymerizable resin. A cross-linking material, a thermoplastic resin having a weight average molecular weight of 10,000 to 500,000 and dissolved in a roughening liquid, an elastomer having a glass transition temperature Tg of -60 to -20 ° C, and a filler,
The elongation at break after curing is 3 to 10%. According to the adhesive of the present invention, a good rough surface can be formed on the surface of the adhesive layer 5, and the adhesion strength of the wiring conductor layer 6 can be improved.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、表面に配線導体層
が被着される接着材層を形成するための接着材およびこ
れを用いた電子部品に関するものであり、特に、配線導
体層との密着強度に優れた接着材層を形成するための接
着材およびこれを用いた高周波特性ならびに耐熱性に優
れた高信頼性を有する電子部品に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an adhesive for forming an adhesive layer on a surface of which a wiring conductor layer is adhered, and an electronic component using the same. The present invention relates to an adhesive for forming an adhesive layer having excellent adhesion strength, and a high reliability electronic component having excellent high frequency characteristics and heat resistance using the same.

【0002】[0002]

【従来の技術】従来より、高密度配線が可能な配線基板
として有機樹脂を主成分とする絶縁基板を具備した配線
基板が知られている。このような配線基板としては、機
械的強度を確保するとともに配線導体との熱膨張の整合
性の観点から、例えば、ガラス繊維やアラミド繊維等の
補強材に耐熱性や耐薬品性を有するエポキシ樹脂に代表
される熱硬化性樹脂を含浸させて複合化した絶縁基板上
に、エポキシ樹脂等の熱硬化性樹脂から成る接着材を塗
布して接着材層を形成するとともに接着材層を加熱硬化
させた後、接着材層にレーザで貫通孔を穿設し、しかる
後、接着材層表面を化学粗化し、さらに無電解銅メッキ
により貫通孔内部に導体層を形成すると同時に接着材層
表面に配線導体層を形成してパターンニングし、最後
に、電解銅めっきにより配線パターンを被着形成して成
るビルドアップ工法により製作された配線基板が知られ
ている。
2. Description of the Related Art A wiring board provided with an insulating substrate containing an organic resin as a main component has been known as a wiring board capable of high-density wiring. As such a wiring board, from the viewpoint of ensuring mechanical strength and matching thermal expansion with a wiring conductor, for example, an epoxy resin having heat resistance or chemical resistance as a reinforcing material such as glass fiber or aramid fiber is used. An adhesive made of a thermosetting resin, such as an epoxy resin, is applied to an insulating substrate that is impregnated with a thermosetting resin represented by a composite to form an adhesive layer, and the adhesive layer is cured by heating. After that, a through-hole is drilled in the adhesive layer with a laser, and then the surface of the adhesive layer is chemically roughened, and a conductor layer is formed inside the through-hole by electroless copper plating. 2. Description of the Related Art There is known a wiring board manufactured by a build-up method in which a conductor layer is formed and patterned, and finally, a wiring pattern is adhered and formed by electrolytic copper plating.

【0003】しかしながらこのような配線基板は、機械
的強度や耐熱性に優れてはいるものの、絶縁基板や接着
材に含有されるエポキシ樹脂等の熱硬化性樹脂の誘電率
εが3.5程度と高いために、信号伝送の際に誘電損失が
大きなものと成り、信号の高速処理が必要とされる高周
波領域で使用される配線基板としては使用できないとい
う欠点を有していた。
[0003] However, such a wiring board is excellent in mechanical strength and heat resistance, but has a high dielectric constant ε of about 3.5 of a thermosetting resin such as an epoxy resin contained in an insulating substrate or an adhesive. For this reason, the dielectric loss is large at the time of signal transmission, and it has a drawback that it cannot be used as a wiring board used in a high-frequency region where high-speed signal processing is required.

【0004】一方、高周波領域で使用される配線基板用
の樹脂材料としてフッ素樹脂や架橋ポリエチレンが用い
られることもあったが、これらはいずれもガラス転移温
度Tgが−100℃以下と低いことから、温度や湿度等の
使用環境条件により誘電率と誘電損失が大きく変化する
という欠点があった。
On the other hand, fluororesins and cross-linked polyethylene have been used as resin materials for wiring boards used in the high-frequency region, but these have a low glass transition temperature Tg of -100 ° C. or lower. There is a drawback that the dielectric constant and the dielectric loss change greatly depending on the use environment conditions such as temperature and humidity.

【0005】このような誘電特性を改善するために、配
線基板用の樹脂材料として、低誘電率でガラス転移温度
Tgが比較的高く、使用環境条件にかかわらず誘電特性
が安定しているポリエーテルサルホンやポリエーテルイ
ミド・ポリフェニレンオキサイド・ポリサルフォン・ノ
ルボルネン等の各種変性樹脂が開発されてきたが、これ
らはいずれも熱可塑性樹脂であることから、このままで
は半田耐熱性等の耐熱特性に劣るという欠点があった。
In order to improve such dielectric properties, polyethers having a low dielectric constant, a relatively high glass transition temperature Tg, and stable dielectric properties irrespective of the use environment are used as resin materials for wiring boards. Various modified resins such as sulfone, polyetherimide, polyphenylene oxide, polysulfone, norbornene, etc. have been developed, but since these are all thermoplastic resins, the disadvantage is that they are inferior in heat resistance such as solder heat resistance as they are. was there.

【0006】そこでかかる耐熱特性上の欠点を解消する
ために、剛直な分子構造を有し、低誘電率でラジカル重
合可能な二重結合を分子鎖に有する変性ポリフェニレン
エーテルや変性ポリスチレン・変性ノルボルネン等の芳
香族・複素環系樹脂変性物にラジカル重合性の架橋材を
混合して架橋密度を高くしたり、あるいはガラス転移温
度Tgが高く、誘電特性に優れた熱可塑性ノルボルネン
樹脂に放射線架橋性の良い樹脂・放射線架橋助剤を添加
した樹脂組成物に放射線を照射し架橋反応を起こして架
橋密度を高くしたりして、芳香族・複素環系樹脂変性物
や熱可塑性ノルボルネン樹脂が有する優れた高周波特性
を阻害することなく耐熱性を改善した配線基板用の接着
材が提案されている。
Therefore, in order to eliminate the drawbacks in the heat resistance characteristics, modified polyphenylene ether, modified polystyrene and modified norbornene having a rigid molecular structure and having a double bond capable of radical polymerization with a low dielectric constant in the molecular chain. Radical polymerizable cross-linking agent is mixed with the modified aromatic / heterocyclic resin to increase the cross-linking density, or the radiation-crosslinkability of thermoplastic norbornene resin with high glass transition temperature Tg and excellent dielectric properties Radiation is applied to a resin composition to which a good resin / radiation crosslinking aid has been added to cause a crosslinking reaction to increase the crosslinking density, and the aromatic / heterocyclic resin modified product and thermoplastic norbornene resin have excellent properties. There has been proposed an adhesive for a wiring board having improved heat resistance without impairing high-frequency characteristics.

【0007】このような変性ポリフェニレンエーテルや
変性ポリスチレン・変性ノルボルネン等の芳香族・複素
環系樹脂変性物や、熱可塑性ノルボルネン樹脂を放射線
架橋した樹脂はいずれも低誘電率で耐熱性に優れてお
り、また、架橋密度が高く耐薬品性にも極めて優れてい
る。
Aromatic / heterocyclic resin modified products such as modified polyphenylene ether, modified polystyrene and modified norbornene, and resins obtained by radiation crosslinking of thermoplastic norbornene resin are all low in dielectric constant and excellent in heat resistance. Also, the crosslinking density is high and the chemical resistance is extremely excellent.

【0008】[0008]

【発明が解決しようとする課題】しかしながら、ビルド
アップ工法により製作される微細な高密度配線が要求さ
れる配線基板においては、接着材層の表面と配線導体層
との密着性を高め配線基板の良好な耐熱疲労性や耐久性
等の高い信頼性を得るために、接着材層の表面を酸化剤
から成る粗化液を用いてその一部を溶解する化学粗化法
により触針式表面粗さ測定器で計測した最大粗さRma
xが0.5〜10μm程度に粗化することが行われている
が、上記の芳香族・複素環系樹脂変性物や熱可塑性ノル
ボルネン樹脂を放射線架橋した樹脂で形成された接着材
層は耐薬品性に極めて優れていることから、これらの樹
脂で形成された接着材層の表面を化学粗化法で溶解する
ことが困難であり、接着材層表面に配線導体層と十分な
密着強度が得られる粗面を形成することができず、その
結果、温度サイクル試験(TCT)やプレッシャークッ
カー試験(PCT)等の信頼性試験で配線導体層の剥が
れ等が発生し電気接続の信頼性が低くなり、高密度配線
基板等への適用が困難であるという問題点を有してい
た。
However, in the case of a wiring board which requires fine high-density wiring manufactured by the build-up method, the adhesion between the surface of the adhesive layer and the wiring conductor layer is improved. In order to obtain high reliability such as good thermal fatigue resistance and durability, the surface of the adhesive layer is roughened using a roughening solution consisting of an oxidizing agent. Roughness Rma measured with a height measuring instrument
Although x is roughened to about 0.5 to 10 μm, the adhesive layer formed of the above-mentioned modified aromatic / heterocyclic resin or a resin obtained by radiation-crosslinking a thermoplastic norbornene resin has a chemical resistance. It is difficult to dissolve the surface of the adhesive layer formed of these resins by the chemical roughening method, and sufficient adhesive strength with the wiring conductor layer can be obtained on the surface of the adhesive layer. A rough surface cannot be formed. As a result, peeling of a wiring conductor layer occurs in a reliability test such as a temperature cycle test (TCT) or a pressure cooker test (PCT), and the reliability of electrical connection is reduced. There is a problem that application to a high-density wiring board or the like is difficult.

【0009】また、芳香族・複素環系樹脂変性物や熱可
塑性ノルボルネン樹脂を放射線架橋した樹脂は、樹脂骨
格が剛直で架橋密度が高いために破断伸びが3%未満と
可撓性に劣り、一般的な信頼性試験であるTCTを行っ
た際の熱膨張と熱収縮に伴う歪みに耐えられず、クラッ
クを生じ易いという問題点も有していた。
A resin obtained by radiation-crosslinking a modified aromatic / heterocyclic resin or a thermoplastic norbornene resin is inferior in flexibility to less than 3% in elongation at break because the resin skeleton is rigid and has a high crosslinking density. There was also a problem that it was not able to withstand distortion due to thermal expansion and thermal shrinkage when performing TCT, which is a general reliability test, and cracks were easily generated.

【0010】さらに、従来、接着材層の表面粗さは触針
式表面粗さ測定器で計測されていたが、この測定器では
接着材層と配線導体層との密着性に大きく影響する0.5
μm以下の微小な凹凸を正確に測定することができず、
配線導体層のピール強度を精度良く管理することができ
ないという課題も有していた。
Further, conventionally, the surface roughness of the adhesive layer has been measured by a stylus type surface roughness measuring instrument. However, this measuring instrument greatly affects the adhesion between the adhesive layer and the wiring conductor layer.
It is not possible to accurately measure minute irregularities less than μm,
There was also a problem that the peel strength of the wiring conductor layer could not be accurately controlled.

【0011】本発明はかかる従来技術の問題点に鑑み案
出されたものであり、その目的は、配線基板の配線導体
層との密着性に優れた接着材層を形成する接着材、およ
びこの接着材を用いて製作したTCTやPCT等の信頼
性試験での耐久性および高周波特性に優れた電子部品を
提供することにある。
The present invention has been devised in view of the problems of the prior art, and has as its object to provide an adhesive for forming an adhesive layer having excellent adhesion to a wiring conductor layer of a wiring board, An object of the present invention is to provide an electronic component having excellent durability and high-frequency characteristics in reliability tests such as TCT and PCT manufactured using an adhesive.

【0012】[0012]

【課題を解決するための手段】本発明の接着材は、芳香
族・複素環系樹脂変性物と、ラジカル重合性の架橋材
と、重量平均分子量が10000〜500000であって粗化液に
溶解する熱可塑性樹脂と、ガラス転移温度Tgが−60〜
−20℃のエラストマーと、フィラーとから成り、硬化後
の破断伸びが3〜10%であることを特徴とするものであ
る。
The adhesive of the present invention comprises a modified aromatic / heterocyclic resin, a radically polymerizable cross-linking agent, a weight average molecular weight of 10,000 to 500,000, and is dissolved in a roughening solution. And a glass transition temperature Tg of -60 to
It comprises an elastomer at −20 ° C. and a filler, and has an elongation at break of 3 to 10% after curing.

【0013】また、本発明の電子部品は、絶縁基板と、
その絶縁基板上に上記の接着材を用いて形成された接着
材層と、絶縁基板および接着材層の各表面に形成された
複数の配線導体層と、接着材層に穿設された貫通孔の内
部に形成され、複数の配線導体層間を電気的に接続する
貫通導体とから成る配線基板に電子素子を実装した電子
部品であって、原子間力顕微鏡で測定した接着材層表面
の算術平均粗さRaが0.1〜1μmであることを特徴と
するものである。
Further, the electronic component of the present invention comprises: an insulating substrate;
An adhesive layer formed on the insulating substrate using the above adhesive, a plurality of wiring conductor layers formed on each surface of the insulating substrate and the adhesive layer, and a through hole formed in the adhesive layer; An electronic component in which an electronic element is mounted on a wiring board that is formed inside and has a through conductor that electrically connects a plurality of wiring conductor layers, the arithmetic mean of the surface of the adhesive layer measured by an atomic force microscope The roughness Ra is 0.1 to 1 μm.

【0014】本発明の接着材によれば、芳香族・複素環
系樹脂変性物をラジカル重合性の架橋材で高密度に架橋
していることから、熱による芳香族化合物・複素環式化
合物系樹脂変性物の分子切断や、これらで形成される樹
脂中への水分の浸入を抑制でき、耐熱性および耐湿性に
優れた接着材とすることができる。
According to the adhesive of the present invention, the aromatic / heterocyclic resin-modified product is cross-linked at a high density with a radical polymerizable cross-linking material. It is possible to suppress molecular breakage of the resin-modified product and intrusion of moisture into the resin formed by these, and to provide an adhesive excellent in heat resistance and moisture resistance.

【0015】また、本発明の接着材によれば、重量平均
分子量が10000〜500000であって粗化液に溶解する熱可
塑性樹脂を含有していることから、伸縮性に富みフィル
ム成形性に優れているとともに表面に配線導体層との密
着性向上に効果的な粗面を形成することができる接着材
とすることができる。
Further, according to the adhesive of the present invention, since the weight average molecular weight is 10,000 to 500,000 and contains a thermoplastic resin which is dissolved in a roughening liquid, the adhesive has excellent stretchability and excellent film formability. And an adhesive capable of forming a rough surface effective for improving the adhesion to the wiring conductor layer on the surface.

【0016】さらに、本発明の接着材によれば、ガラス
転移温度Tgが−60〜−20℃のエラストマーを含有して
いることから、未硬化のフィルムは可撓性に優れており
取り扱いが容易であると共に、硬化後のフィルムでも破
断伸びが3〜10%と可撓性を維持し熱変化による応力を
吸収でき、その結果、耐熱疲労性の良好な接着材とする
ことができる。
Further, according to the adhesive of the present invention, since the glass transition temperature Tg contains an elastomer having a temperature of -60 to -20 ° C., the uncured film has excellent flexibility and is easy to handle. In addition, the cured film can maintain the flexibility at break elongation of 3 to 10% and absorb the stress caused by heat change, and as a result, can provide an adhesive material having good thermal fatigue resistance.

【0017】また、本発明の電子部品によれば、原子間
力顕微鏡で測定した接着材層表面の算術平均粗さRaを
0.1〜1μmとしたことから、接着材層と配線導体層と
の密着性を良好としピール強度を向上させることがで
き、TCTによる耐熱疲労性やPCTによる耐湿性等の
信頼性試験に対して良好な配線基板を具備した電子部品
とすることができる。
Further, according to the electronic component of the present invention, the arithmetic average roughness Ra of the surface of the adhesive layer measured by an atomic force microscope can be reduced.
Since the thickness is set to 0.1 to 1 μm, the adhesion between the adhesive layer and the wiring conductor layer can be improved and the peel strength can be improved, which is good for reliability tests such as thermal fatigue resistance by TCT and moisture resistance by PCT. An electronic component having a suitable wiring board can be obtained.

【0018】[0018]

【発明の実施の形態】次に、本発明の接着材およびこれ
を用いた電子部品について詳細に説明する。本発明の接
着材は、芳香族・複素環系樹脂変性物と、ラジカル重合
性の架橋材と、重量平均分子量が10000〜500000であっ
て粗化液に溶解する熱可塑性樹脂と、ガラス転移温度T
gが−60〜−20℃のエラストマーと、フィラーとから構
成されている。
Next, the adhesive of the present invention and an electronic component using the same will be described in detail. The adhesive of the present invention is a modified aromatic / heterocyclic resin, a radically polymerizable crosslinker, a thermoplastic resin having a weight average molecular weight of 10,000 to 500,000 and being dissolved in a roughening liquid, and a glass transition temperature. T
It is composed of an elastomer having a g of -60 to -20C and a filler.

【0019】本発明の接着材は、液状ワニス状または固
形フィルム状のいずれでも使用可能であるが、表面の平
坦性や厚さ制御の容易性等の観点からはフィルム状が好
ましい。なお、ここでフィルムとは厚さ数μmから数10
0μm程度の薄いシートを意味している。
The adhesive of the present invention may be used in the form of a liquid varnish or a solid film, but is preferably in the form of a film from the viewpoints of surface flatness and easy control of thickness. Here, the film means a thickness of several μm to several tens
It means a thin sheet of about 0 μm.

【0020】また、本発明で芳香族とはベンゼン核を有
する炭素環式化合物であり、また複素環系とは2種また
はそれ以上の元素の原子から環が構成されている5員環
や6員環等の環式化合物であり、芳香族・複素環系樹脂
とは上記のうち1種類または2種類以上の混合物から成
る樹脂を指している。
In the present invention, the aromatic is a carbocyclic compound having a benzene nucleus, and the heterocyclic system is a five-membered ring or a six-membered ring in which a ring is composed of atoms of two or more elements. It is a cyclic compound such as a membered ring, and the aromatic / heterocyclic resin refers to a resin composed of one or a mixture of two or more of the above.

【0021】本発明の接着材は、剛直な分子構造を有す
る芳香族・複素環系樹脂変成物をラジカル重合性の架橋
材で高密度に架橋していることから、熱による芳香族・
複素環系樹脂変性物の分子切断や芳香族・複素環系樹脂
変性物中への水分の浸入を抑制することができ、耐熱性
および耐湿性に優れた接着材とすることができる。
The adhesive of the present invention is obtained by crosslinking a modified aromatic / heterocyclic resin having a rigid molecular structure with a radical polymerizable crosslinking material at a high density.
It is possible to suppress the molecular cleavage of the modified heterocyclic resin and the infiltration of moisture into the modified aromatic / heterocyclic resin, and to provide an adhesive having excellent heat resistance and moisture resistance.

【0022】なお、ここで変成物とはアリル基・アクリ
ル基・メタクリル基等のラジカル重合官能基を有するも
のを指し、本発明ではこのような芳香族・複素環系樹脂
変成物として、アリル変性ポリフェニレンエーテルやア
リル変性ポリスチレン・変性ノルボルネン等が用いられ
る。
Here, the modified product refers to a product having a radical polymerization functional group such as an allyl group, an acryl group, or a methacryl group. In the present invention, such an aromatic / heterocyclic resin modified product is an allyl-modified resin. Polyphenylene ether, allyl-modified polystyrene, modified norbornene and the like are used.

【0023】また、本発明の接着材は、ラジカル重合性
の架橋材を芳香族・複素環系樹脂変成物に対して2〜10
重量%含有している。ラジカル重合性の架橋材の含有量
が2重量%より少ないと適度な可撓性を保持して接着材
を架橋・硬化させることが困難と成る傾向があり、ま
た、10重量%を超えるとTCT等の信頼性試験での耐久
性に劣るものと成る傾向がある。従って、ラジカル重合
性の架橋材の含有量は2〜10重量%の範囲が好ましい。
このようなラジカル重合性の架橋材としては、ラジカル
重合性の官能基を複数有する低分子量化合物であるモノ
マーであれば良く、例えば、トリアリルイソシアヌレー
トやジビニルベンゼン・エチレングリコールジメタクリ
レート・ジアリルフタレート等が好適に用いられる。な
お、反応温度が適合すれば、ベンゾイルパーオキサイド
やラウリルパーオキサイド等のラジカル重合開始剤を用
いても良く、反応温度としては作業性を考慮した硬化時
間および樹脂の分解を防止するという点からは150〜250
℃の範囲が好ましい。
Further, the adhesive of the present invention is characterized in that a radical polymerizable crosslinking agent is used in an amount of 2 to 10 with respect to the modified aromatic / heterocyclic resin.
% By weight. If the content of the radical polymerizable cross-linking material is less than 2% by weight, it tends to be difficult to cross-link and cure the adhesive while maintaining appropriate flexibility, and if it exceeds 10% by weight, TCT , Etc., tend to be inferior in durability in reliability tests. Therefore, the content of the radical polymerizable cross-linking material is preferably in the range of 2 to 10% by weight.
Such a radical polymerizable cross-linking material may be any monomer that is a low molecular weight compound having a plurality of radical polymerizable functional groups, such as triallyl isocyanurate, divinylbenzene, ethylene glycol dimethacrylate, and diallyl phthalate. Is preferably used. If the reaction temperature is suitable, a radical polymerization initiator such as benzoyl peroxide or lauryl peroxide may be used.The reaction temperature is set in consideration of workability and curing time and resin decomposition. 150-250
C. is preferred.

【0024】さらに、本発明の接着材は、重量平均分子
量が10000〜500000であって粗化液に溶解する熱可塑性
樹脂を芳香族・複素環系樹脂変成物に対して5〜30重量
%含有していることから、良好な伸縮性を有するととも
にフィルムの成形性に優れた接着材とすることができ
る。熱可塑性樹脂の重量平均分子量が10000より小さい
と、フィルムが脆くなり成形性が悪く成る傾向があり、
また、500000を超えると接着材の粘度が高くなり均一な
膜厚のフィルムを得られなくなる傾向がある。従って、
熱可塑性樹脂の重量平均分子量は10000〜500000の範囲
が好ましい。さらに、熱可塑性樹脂の含有量が5重量%
より少ないとフィルムが脆くなり良好な伸縮性を得られ
なくなる傾向があり、また30重量%を超えると耐熱性に
劣る傾向がある。従って、熱可塑性樹脂の含有量は5〜
30重量%の範囲であることが好ましい。
Further, the adhesive of the present invention has a weight average molecular weight of 10,000 to 500,000 and contains 5 to 30% by weight of a thermoplastic resin soluble in the roughening liquid, based on the modified aromatic / heterocyclic resin. As a result, an adhesive having good stretchability and excellent film moldability can be obtained. If the weight average molecular weight of the thermoplastic resin is less than 10,000, the film tends to become brittle and the moldability deteriorates,
On the other hand, if it exceeds 500,000, the viscosity of the adhesive becomes high, and a film having a uniform thickness tends not to be obtained. Therefore,
The weight average molecular weight of the thermoplastic resin is preferably in the range of 10,000 to 500,000. Further, the content of the thermoplastic resin is 5% by weight.
If the amount is less, the film tends to be brittle and good stretchability cannot be obtained, and if it exceeds 30% by weight, the heat resistance tends to be poor. Therefore, the content of the thermoplastic resin is 5 to
Preferably it is in the range of 30% by weight.

【0025】また、この熱可塑性樹脂は、酸化剤である
過マンガン酸塩類やクロム酸塩類の水溶液等の粗化液に
容易に溶解することから、フィルムの成形・硬化後にフ
ィルムを粗化液に浸すことにより、フィルム表面に容易
に配線導体層と密着性の良好な粗面を形成することがで
きる。なお、粗化液としては、クロム酸塩類は毒性を有
するために、一般的には過マンガン酸塩類が使用され、
特に酸化数が大きく酸化力の強い過マンガン酸カリウム
が好適に使用される。
This thermoplastic resin is easily dissolved in a roughening solution such as an aqueous solution of an oxidizing agent such as permanganates or chromates, so that the film is formed into a roughening solution after the film is formed and cured. By dipping, a rough surface having good adhesion to the wiring conductor layer can be easily formed on the film surface. As a roughening liquid, permanganates are generally used because chromates have toxicity.
Particularly, potassium permanganate having a large oxidation number and strong oxidizing power is preferably used.

【0026】このような熱可塑性樹脂としては、ポリエ
チレンフタレート(PET)やポリブチレンフタレート
(PBT)・アジピン酸アルキルエステル等のポリエス
テル類、ポリメチルメタクリレート・ポリブチルメタク
リレート等のアクリル酸エステル類が用いられる。
As such a thermoplastic resin, polyesters such as polyethylene phthalate (PET) and polybutylene phthalate (PBT) / alkyl adipate, and acrylic esters such as polymethyl methacrylate / polybutyl methacrylate are used. .

【0027】また、本発明の接着材は、ガラス転移温度
Tgが−60〜−20℃のエラストマーを芳香族・複素環系
樹脂変成物に対して10〜40重量%含有していることか
ら、未硬化のフィルムは可撓性に優れており取り扱いが
容易であるとともに、硬化後でも破断伸びが3〜10%と
可撓性を維持して熱変化による応力を吸収することがで
き、その結果、耐熱疲労性を向上することができる。ガ
ラス転移温度Tgが−60℃よりも低いと、乾燥後の接着
材のべとつきが大きなものとなりフィルムの取り扱いが
困難となる傾向があり、また、−20℃よりも高いと硬化
後のフィルムの破断伸びが小さくなる傾向がある。従っ
て、エラストマーのガラス転移温度Tgは−60〜−20℃
の範囲であることが好ましい。さらに、エラストマーの
含有量が10重量%よりも少ないと、可撓性が低下する傾
向があり、また、40重量%を超えると接着材の架橋密度
が低下して耐熱性・耐湿性が低下してしまう傾向があ
る。従って、エラストマーの含有量は10〜40重量%の範
囲が好ましい。
The adhesive of the present invention contains an elastomer having a glass transition temperature Tg of -60 to -20 ° C in an amount of 10 to 40% by weight based on the modified aromatic / heterocyclic resin. The uncured film has excellent flexibility and is easy to handle. Even after curing, the film has an elongation at break of 3 to 10%, and can maintain the flexibility to absorb the stress caused by a thermal change. , Heat fatigue resistance can be improved. When the glass transition temperature Tg is lower than −60 ° C., the tackiness of the adhesive after drying tends to be large, and the handling of the film tends to be difficult. Elongation tends to be small. Therefore, the glass transition temperature Tg of the elastomer is -60 to -20 ° C.
Is preferably within the range. Further, if the content of the elastomer is less than 10% by weight, flexibility tends to decrease, and if it exceeds 40% by weight, the crosslinking density of the adhesive decreases, and the heat resistance and moisture resistance decrease. Tend to be. Therefore, the content of the elastomer is preferably in the range of 10 to 40% by weight.

【0028】なお、ここで硬化後の破断伸びとは、接着
材で厚さ数10μmのフィルムを成形し完全硬化させた
後、このフィルムを一定の速度で破断するまで引張った
時のフィルムの伸び率で規定されるものであり、一般的
に破断伸びは3〜10%の範囲が好ましく、破断伸びが3
%より小さいとTCTにおいてクラックが発生する等耐
熱疲労性に劣る傾向があり、10%を超えると樹脂の架橋
密度が低下して耐熱性・耐湿性に劣る傾向がある。
Here, the elongation at break after curing refers to the elongation of the film when a film having a thickness of several tens of μm is molded with an adhesive and completely cured, and then pulled at a constant speed until the film breaks. The elongation at break is generally preferably in the range of 3 to 10%, and the elongation at break is preferably 3 to 10%.
If it is less than 10%, the thermal fatigue resistance tends to be inferior, for example, cracks occur in TCT, and if it exceeds 10%, the crosslinking density of the resin tends to be low, and the heat resistance and moisture resistance tend to be inferior.

【0029】このようなエラストマーとしては、アクリ
ルゴム(ACM)やアクリロニトリル−ブタジエンゴム
(NBR)・スチレン−ブタジエン−スチレントリブロ
ックエラストマー(SBS)・スチレン−イソプレン−
スチレントリブロックエラストマー(SIS)等が用い
られる。
Examples of such an elastomer include acrylic rubber (ACM), acrylonitrile-butadiene rubber (NBR), styrene-butadiene-styrene triblock elastomer (SBS), styrene-isoprene-
Styrene triblock elastomer (SIS) or the like is used.

【0030】さらにまた、本発明の接着材は、芳香族・
複素環系樹脂変成物に対して3〜10重量%のフィラーを
含有している。フィラーはフィルムの強度を高める機能
を有し、フィラーの含有量が3重量%より少ないとフィ
ルムの平坦性が悪くなる傾向があり、また、10重量%を
超えるとビアホールの穿設等のフィルムの加工性が悪く
成る傾向がある。従って、フィラの含有量は3〜10重量
%の範囲であることが好ましい。
Further, the adhesive of the present invention is preferably made of an aromatic
It contains 3 to 10% by weight of a filler based on the modified heterocyclic resin. The filler has a function of increasing the strength of the film. If the content of the filler is less than 3% by weight, the flatness of the film tends to be deteriorated. Workability tends to be poor. Therefore, the filler content is preferably in the range of 3 to 10% by weight.

【0031】このようなフィラーとしては、絶縁性の微
粉末が用いられ、シリカや酸化アルミニウム・窒化アル
ミニウム・炭化珪素・チタン酸カルシウム・酸化チタン
・ゼオライト等の無機粉末、あるいはアラミド繊維や炭
素繊維・ガラス繊維等の繊維が用いられ、フィルムの成
形性の観点からは平均粒径が20μm以下、貫通孔の穿設
性の観点からは平均粒径が10μm以下、フィラーの充填
性の観点からは平均粒径が7μm以下の微粉末が好まし
い。
As such a filler, an insulating fine powder is used, and inorganic powder such as silica, aluminum oxide, aluminum nitride, silicon carbide, calcium titanate, titanium oxide, zeolite, or aramid fiber or carbon fiber. Fibers such as glass fibers are used, the average particle diameter is 20 μm or less from the viewpoint of the moldability of the film, the average particle diameter is 10 μm or less from the viewpoint of the perforation property of the through-hole, and the average is from the viewpoint of the filler filling property. Fine powder having a particle size of 7 μm or less is preferred.

【0032】なお、本発明においては、フィルムを成形
する際に、良好な成形性を得るためにメチルエチルケト
ン(MKE)やプロピレングリコールモノメチルエーテ
ルアセテート(PMA)・ジメチルフォルムアミド(D
MF)等の溶剤を1〜3重量%含有させても良い。
In the present invention, when forming a film, methyl ethyl ketone (MKE) or propylene glycol monomethyl ether acetate (PMA) / dimethylformamide (D) is used to obtain good formability.
A solvent such as MF) may be contained in an amount of 1 to 3% by weight.

【0033】このようなフィルムは、例えば、芳香族・
複素環系樹脂変性物にラジカル重合性の架橋材・熱可塑
性樹脂・エラストマー・フィラー・添加剤・溶剤を添加
した混合物を混練して液状ワニスを得、この液状ワニス
をPET製離型シート上に塗布して60〜100℃の温度で
乾燥することにより成形される。また、フィルムを乾燥
後、フィルムの上面にポリエチレン製保護シートを積層
し、ロール状に巻き取ることにより容易に貯蔵できる。
このフィルムの厚さは自由に設定することができるが、
絶縁性の観点からは20〜100μmの範囲の厚みが好まし
い。
Such a film is, for example, aromatic
A liquid varnish is obtained by kneading a mixture obtained by adding a radical polymerizable cross-linking material, a thermoplastic resin, an elastomer, a filler, an additive, and a solvent to the modified heterocyclic resin, and the liquid varnish is placed on a PET release sheet. It is formed by coating and drying at a temperature of 60 to 100 ° C. Further, after the film is dried, a polyethylene protective sheet is laminated on the upper surface of the film, and the film can be easily stored by winding in a roll.
The thickness of this film can be set freely,
From the viewpoint of insulating properties, a thickness in the range of 20 to 100 μm is preferable.

【0034】なお、このフィルムを所望の絶縁基板上に
真空ラミネータを用いて圧着し、オーブンで熱硬化する
ことによって、絶縁基体上に接着材層を形成することが
できる。
The adhesive layer can be formed on the insulating substrate by pressing the film on a desired insulating substrate using a vacuum laminator and thermosetting in an oven.

【0035】かくして本発明の接着材によれば、その表
面に配線導体層と良好な密着性が得られる粗面を形成す
ることができ、また、硬化後の破断伸びが3〜10%と大
きく耐熱疲労性や耐熱性・耐湿性に優れた接着材層を形
成することが可能となる。
Thus, according to the adhesive of the present invention, a rough surface capable of obtaining good adhesion to the wiring conductor layer can be formed on the surface thereof, and the elongation at break after curing is as large as 3 to 10%. It is possible to form an adhesive layer excellent in heat fatigue resistance, heat resistance and moisture resistance.

【0036】なお、本発明の接着材は上述の実施例に限
定されるものではなく、本発明の要旨を逸脱しない範囲
であれば種々の変更は可能である。例えば、上述の接着
材に耐熱性の向上のためにヒンダードフェノール系酸化
防止剤を、成形性のより向上のために高級脂肪酸エステ
ルの滑剤を、また配線導体層のピール強度の向上のため
に無電解めっき触媒等を含有させることも可能である。
The adhesive of the present invention is not limited to the above embodiment, and various modifications can be made without departing from the scope of the present invention. For example, a hindered phenol-based antioxidant for improving the heat resistance of the above-mentioned adhesive, a lubricant of higher fatty acid ester for further improving the moldability, and for improving the peel strength of the wiring conductor layer. It is also possible to include an electroless plating catalyst or the like.

【0037】次に、本発明の接着材を用いた電子部品を
添付の図面に基づき詳細に説明する。
Next, an electronic component using the adhesive of the present invention will be described in detail with reference to the accompanying drawings.

【0038】図1は本発明の接着材を用いた配線基板
に、電子素子として半導体素子を搭載した場合の電子部
品の一例を示す要部断面図であり、この図において1は
配線基板2、半導体素子3から成る電子部品である。配
線基板2は、主に絶縁基板4、接着材層5、配線導体層
6から構成されており、また本図の例では、接着材層5
は絶縁基板4の表面に5a、5b、5cの3層、裏面に
5d、5e、5fの3層を形成した例を示している。
FIG. 1 is a sectional view of an essential part showing an example of an electronic component when a semiconductor element is mounted as an electronic element on a wiring board using the adhesive of the present invention. An electronic component including the semiconductor element 3. The wiring substrate 2 mainly includes an insulating substrate 4, an adhesive layer 5, and a wiring conductor layer 6. In the example of FIG.
Shows an example in which three layers 5a, 5b, and 5c are formed on the front surface of the insulating substrate 4 and three layers 5d, 5e, and 5f are formed on the back surface.

【0039】絶縁基板4は、ガラス繊維やアラミド繊維
・アリル変性ポリフェニレンエーテル樹脂・変性ノルボ
ルネン樹脂・アリル変性ポリスチレン等の樹脂材料から
成り、接着材層5の支持体として機能し、図の例では、
絶縁基板4の表裏両面に形成した銅・ニッケル・金等か
ら成る配線導体層6を、ドリル等で穿設したスルーホー
ル7の内部に形成したスルーホール導体8により電気的
に接続している。なお、絶縁基板4の内層に内部配線導
体(図示せず)を形成してもよい。
The insulating substrate 4 is made of a resin material such as glass fiber, aramid fiber, allyl-modified polyphenylene ether resin, modified norbornene resin, and allyl-modified polystyrene, and functions as a support for the adhesive layer 5.
Wiring conductor layers 6 made of copper, nickel, gold and the like formed on both front and back surfaces of the insulating substrate 4 are electrically connected by through hole conductors 8 formed inside through holes 7 formed by drilling or the like. Note that an internal wiring conductor (not shown) may be formed in an inner layer of the insulating substrate 4.

【0040】絶縁基体4の表裏両面には、本発明の接着
材を用いて形成した接着材層5が被着形成されており、
接着材層5は配線基板2に搭載する半導体素子3を支持
する支持部として機能する。
An adhesive layer 5 formed by using the adhesive of the present invention is formed on both front and back surfaces of the insulating base 4.
The adhesive layer 5 functions as a support for supporting the semiconductor element 3 mounted on the wiring board 2.

【0041】接着材層5は、本発明の接着材に溶剤等を
添加した混合物を混練して得た液状ワニスを、PETシ
ート上に乾燥後に所望の厚さとなるようにローラコータ
を用いて塗布し、60〜100℃の温度で乾燥・硬化してフ
ィルムを得、このフィルムを真空ラミネ−タにより絶縁
基体4の表裏両面に圧着することにより形成される。接
着材層5の表面には、粗化液を用いて粗化することによ
り原子間力顕微鏡による測定で算術平均粗さRaが0.1
〜1μmの粗面が形成される。これは、接着材中の熱可
塑性樹脂が未硬化状態では芳香族・複素環系樹脂変性物
に均一に溶解しているものの、硬化すると0.01から10μ
mの大きさの微粒子となって分散するため、粗化液によ
り熱可塑性樹脂が溶解して除去された接着材層5の表面
に無数の微細孔による粗面が形成されるものである。
The adhesive layer 5 is formed by applying a liquid varnish obtained by kneading a mixture obtained by adding a solvent or the like to the adhesive of the present invention to a PET sheet and drying the varnish to a desired thickness using a roller coater. The film is dried and cured at a temperature of 60 to 100 ° C. to obtain a film, and the film is formed by pressing the film on both the front and back surfaces of the insulating substrate 4 with a vacuum laminator. The surface of the adhesive layer 5 is roughened using a roughening solution to have an arithmetic average roughness Ra of 0.1 by an atomic force microscope.
A rough surface of 11 μm is formed. This is because although the thermoplastic resin in the adhesive is in the uncured state, it is uniformly dissolved in the modified aromatic / heterocyclic resin, but when cured, it is 0.01 to 10μ.
Since the particles are dispersed in the form of fine particles having a size of m, the surface of the adhesive layer 5 from which the thermoplastic resin is dissolved and removed by the roughening liquid is formed as a rough surface by countless fine holes.

【0042】また、従来、触針式表面粗さ測定器を用い
た表面粗さの測定では径が5μmの触針を使用してお
り、5μmより小さな凹凸を測定することができないの
に対して、原子間力顕微鏡は数10nm程度の微小な凹凸
をも三次元的に計測することが可能であり、接着材層5
と配線導体層6との密着性に大きく影響する、すなわち
ピール強度に大きく影響する0.5μm以下の凹凸を測定
することが可能である。
Conventionally, in the measurement of surface roughness using a stylus-type surface roughness measuring instrument, a stylus having a diameter of 5 μm is used, and irregularities smaller than 5 μm cannot be measured. The atomic force microscope is capable of three-dimensionally measuring even microscopic irregularities of about several tens of nanometers.
It is possible to measure unevenness of 0.5 μm or less which greatly affects the adhesion between the wiring conductor layer 6 and the wiring conductor layer 6, that is, greatly affects the peel strength.

【0043】このような接着材層5の表面は、原子間力
顕微鏡による測定で算術平均粗さRaが0.1〜1μmの
粗面を有することから、配線導体層6との密着性が良好
となり、ピール強度を向上させることができ、TCTや
PCT等の信頼性試験に対して良好なものとすることが
できる。接着材層5表面の原子間力顕微鏡による測定の
算術平均粗さRaが0.1μm未満であると、接着材層5
と配線導体層6間のアンカー効果が小さくなり十分なピ
ール強度が得られなくなる傾向があり、1μmを超える
と、ビルドアップ工法に必要な微細な配線パターンが形
成できなくなる傾向がある。従って、接着材層5表面の
粗さは原子間力顕微鏡による測定で算術平均粗さRaが
0.1〜1μmの範囲であることが好ましい。
Since the surface of the adhesive layer 5 has a rough surface having an arithmetic average roughness Ra of 0.1 to 1 μm as measured by an atomic force microscope, the adhesion to the wiring conductor layer 6 is improved. The peel strength can be improved, and the peel strength can be improved for reliability tests such as TCT and PCT. If the arithmetic mean roughness Ra of the surface of the adhesive layer 5 measured by an atomic force microscope is less than 0.1 μm, the adhesive layer 5
There is a tendency that the anchor effect between the wiring conductor layer 6 and the wiring conductor layer 6 becomes small and a sufficient peel strength cannot be obtained. If it exceeds 1 μm, a fine wiring pattern required for the build-up method tends to be unable to be formed. Therefore, the roughness of the surface of the adhesive layer 5 has an arithmetic average roughness Ra measured by an atomic force microscope.
It is preferably in the range of 0.1 to 1 μm.

【0044】なお、接着材層5表面の粗化は、例えば、
接着材層5表面をグリコールエーテル等の有機溶剤約10
%と水酸化ナトリウム等のアルカリ約1%とを含有した
溶液中に5分間程度浸漬し、接着材層5の表面を膨潤さ
せた後、過マンガン酸塩類等の酸化剤約10%溶液中に10
分間程度浸漬し、接着材層5の表面の熱可塑性樹脂を溶
解し、接着材層5の表面の粗さが原子間力顕微鏡による
測定で算術平均粗さRaが0.1〜1μmとなるように粗
化し、最後に硫酸の約5%水溶液に5分間程度浸漬し、
接着材層5の表面を還元することにより行なわれる。
The surface of the adhesive layer 5 can be roughened, for example, by
The surface of the adhesive layer 5 is coated with about 10 organic solvents such as glycol ether.
% And a solution containing about 1% of alkali such as sodium hydroxide for about 5 minutes to swell the surface of the adhesive layer 5 and then into a solution of about 10% of an oxidizing agent such as permanganate. Ten
Immersion for about 1 minute to dissolve the thermoplastic resin on the surface of the adhesive layer 5, and the surface of the adhesive layer 5 is roughened so that the arithmetic average roughness Ra is 0.1 to 1 μm as measured by an atomic force microscope. And finally immersed in about 5% aqueous solution of sulfuric acid for about 5 minutes,
This is performed by reducing the surface of the adhesive layer 5.

【0045】また、本発明の電子部品1の接着材層5の
表面には、配線導体層6が形成されている。配線導体層
6は半導体素子3等の電子素子を外部電気回路基板(図
示せず)に電気的に接続する導電路として機能し、接着
材層5の表面側の部位には半導体素子3の各電極がフリ
ップチップ接続等により電気的に接続され、裏側の部位
は外部電気回路基板の配線導体に半田等を介して電気的
に接続される。
The wiring conductor layer 6 is formed on the surface of the adhesive layer 5 of the electronic component 1 of the present invention. The wiring conductor layer 6 functions as a conductive path for electrically connecting an electronic element such as the semiconductor element 3 to an external electric circuit board (not shown). The electrodes are electrically connected by flip chip connection or the like, and the back side is electrically connected to the wiring conductor of the external electric circuit board via solder or the like.

【0046】配線導体層6は、サブトラクティブ法やア
ディティブ法等により形成され、粗化された接着材層5
表面に、例えば、無電解めっきで銅を被着させ、ドライ
フィルムフォトレジストでパターン加工した後に電解め
っきで銅を所定の厚さに被着形成し、しかる後、ドライ
フィルム剥離・エッチング処理を行い配線パターンを形
成することによって形成される。なお、配線導体層6
は、金・銅・ニッケル等の低抵抗金属から成り、特に低
抵抗の観点からは銅が好ましい。
The wiring conductor layer 6 is formed by a subtractive method, an additive method or the like, and the roughened adhesive material layer 5 is formed.
On the surface, for example, copper is deposited by electroless plating, copper is deposited to a predetermined thickness by electrolytic plating after patterning with a dry film photoresist, and then dry film peeling and etching are performed. It is formed by forming a wiring pattern. The wiring conductor layer 6
Is made of a low-resistance metal such as gold, copper, and nickel, and copper is particularly preferable from the viewpoint of low resistance.

【0047】また、配線導体層6は、TCTやPCTに
おける接着材層5からの剥離や断線等を防止するという
観点からは、ピール強度が0.7〜1.5kg/cmであるこ
とが好ましい。ピール強度が0.7kg/cmより小さく
なると、配線導体層6が接着材層5から剥離し易くなる
傾向があり、また、1.5kg/cmを超えると配線導体
層6と接着材層5との密着力が強すぎて接着材層5が伸
びた際に接着材層5の樹脂内部で破断が発生し易くなる
傾向がある。従って、配線導体層6のピール強度は0.7
〜1.5kg/cmの範囲であることが好ましい。
Further, the peel strength of the wiring conductor layer 6 is preferably 0.7 to 1.5 kg / cm from the viewpoint of preventing peeling or disconnection from the adhesive layer 5 in TCT or PCT. When the peel strength is smaller than 0.7 kg / cm, the wiring conductor layer 6 tends to be easily separated from the adhesive layer 5, and when the peel strength exceeds 1.5 kg / cm, the adhesion between the wiring conductor layer 6 and the adhesive layer 5 is increased. When the adhesive layer 5 is stretched due to an excessively strong force, the adhesive layer 5 tends to be easily broken inside the resin. Therefore, the peel strength of the wiring conductor layer 6 is 0.7
It is preferably in the range of 1.5 kg / cm.

【0048】なお、配線導体層6の厚みは、高速の信号
を伝達させるという観点からは、3μm以上であること
が好ましく、配線導体層6を接着材層5に被着形成させ
る際に配線導体層6に大きな応力を残留させず、配線導
体層6が接着材層5から剥離しにくいものとするために
は、50μm以下としておくことが好ましい。
The thickness of the wiring conductor layer 6 is preferably 3 μm or more from the viewpoint of transmitting a high-speed signal. In order to prevent large stress from remaining in the layer 6 and to make it difficult for the wiring conductor layer 6 to peel off from the adhesive layer 5, the thickness is preferably 50 μm or less.

【0049】このような接着材層5・配線導体層6を、
絶縁基板4上に複数層形成する場合は、接着材層5とな
るフィルムをあらかじめ複数枚形成しておき、接着材層
5のラミネートと配線導体層6の被着形成とを順次行え
ばよい良い。
The adhesive layer 5 and the wiring conductor layer 6 are
When a plurality of layers are formed on the insulating substrate 4, a plurality of films to be the adhesive layer 5 are formed in advance, and the lamination of the adhesive layer 5 and the formation of the wiring conductor layer 6 may be sequentially performed. .

【0050】また、複数の配線導体層6は、接着材層5
内部に設けた貫通孔9の内周壁に被着形成された貫通導
体10により電気的に接続されている。
Further, the plurality of wiring conductor layers 6 are
It is electrically connected by a through conductor 10 formed on the inner peripheral wall of a through hole 9 provided inside.

【0051】貫通孔9の穿設には、露光・現像法により
穿設する方法、炭酸ガスレーザ・YAGレーザ・UVレ
ーザ等のレーザ法により穿設する方法等が用いられる
が、接着材層の材料に依存せず微細加工ができ、貫通孔
径を10〜200μmの範囲に自由に設定でき、かつ加工ス
ピードの速い炭酸ガスレーザを使用することが好まし
い。なお、本発明の接着材によれば、接着材を構成する
熱可塑性樹脂の重量平均分子量が10000〜500000と大き
く酸素指数が小さいことからレーザによる熱で分解され
易く、貫通孔9を穿設する際に接着材の残滓が貫通孔9
の周辺や内部に残ることはなく、配線導体層6や貫通導
体10をめっきにより被着形成した際に電気的特性に優れ
たものとすることができる。
The through hole 9 may be formed by a method of forming a hole by an exposure and development method, a method of forming a hole by a laser method such as a carbon dioxide gas laser, a YAG laser, or a UV laser. It is preferable to use a carbon dioxide laser that can perform fine processing without depending on the diameter, can freely set the diameter of the through hole in the range of 10 to 200 μm, and has a high processing speed. According to the adhesive of the present invention, since the thermoplastic resin constituting the adhesive has a large weight average molecular weight of 10,000 to 500,000 and a small oxygen index, it is easily decomposed by heat by a laser, and the through-hole 9 is formed. At this time, the residue of the adhesive is
When the wiring conductor layer 6 and the penetrating conductor 10 are formed by plating, they can have excellent electrical characteristics.

【0052】また、貫通導体10は、配線導体層6をめっ
きにより被着させる際に、配線導体層6と同時にめっき
処理を行ない形成すればよい。なお、貫通導体10は貫通
孔9の内壁面に被着形成して成るもののほかに、貫通孔
9内部をめっきにより金属で充填して成るものであって
もよい。
The through conductor 10 may be formed by performing plating simultaneously with the wiring conductor layer 6 when the wiring conductor layer 6 is applied by plating. The through conductor 10 may be formed by filling the inside of the through hole 9 with metal by plating, in addition to the one formed by attaching the inner wall surface of the through hole 9 to the inside.

【0053】さらに、半導体素子3を最外層の接着材層
5の表面に形成された配線導体層6に間に半田等の接続
部材11を介して接続することにより、半導体素子3と配
線導体層6とが電気的に接続され、また、半導体素子3
と接着材層5との間に樹脂から成るアンダフィル12を注
入することにより、半導体素子3が接着材層5表面に強
固に固定される。
Further, the semiconductor element 3 is connected to the wiring conductor layer 6 formed on the surface of the outermost adhesive layer 5 via a connection member 11 such as solder between the semiconductor element 3 and the wiring conductor layer 6. 6 are electrically connected to each other and the semiconductor element 3
The semiconductor element 3 is firmly fixed to the surface of the adhesive layer 5 by injecting an underfill 12 made of resin between the semiconductor device 3 and the adhesive layer 5.

【0054】かくして本発明の電子部品によれば、接着
材層と配線導体層の密着性を良好としピール強度を向上
させた、TCTやPCT等の信頼性試験に対して優れた
耐久性と高い信頼性を有する電子部品とすることができ
る。
Thus, according to the electronic component of the present invention, the adhesion between the adhesive layer and the wiring conductor layer is improved and the peel strength is improved, and the durability and excellent durability against reliability tests such as TCT and PCT are achieved. An electronic component having reliability can be obtained.

【0055】なお、本発明の電子部品は上述の実施例に
限定されるものではなく、本発明の要旨を逸脱しない範
囲であれば種々の変更が可能である。例えば、上述の実
施例では、絶縁基体4の表裏両面に各3層の接着材層5
をラミネートすることにより配線基板2を製作したが、
1層や2層、あるいは4層以上の接着材層をラミネート
してもよい。また、表面あるいは裏面のみに接着材層5
をラミネートしてもよい。また、ビアホール導体10と接
着材層5との密着性を高めるために、貫通孔9の内部に
本発明の接着材等の樹脂を充填することも可能である。
The electronic component of the present invention is not limited to the above-described embodiment, and various changes can be made without departing from the scope of the present invention. For example, in the above-described embodiment, three adhesive layers 5
The wiring board 2 was manufactured by laminating
One, two, or four or more adhesive layers may be laminated. Further, the adhesive layer 5 is formed only on the front surface or the back surface.
May be laminated. Further, in order to enhance the adhesion between the via-hole conductor 10 and the adhesive layer 5, it is possible to fill the inside of the through hole 9 with a resin such as the adhesive of the present invention.

【0056】[0056]

【実施例】本発明の接着材およびこの接着材を用いた電
子部品の特性を評価するために、以下のような接着材フ
ィルムを用いた電子部品を製作した。
EXAMPLES In order to evaluate the characteristics of the adhesive of the present invention and the electronic component using the adhesive, an electronic component using the following adhesive film was manufactured.

【0057】〔接着材の実施例1〕芳香族・複素環系樹
脂変性物としてアリル変性ポリフェニレンエーテルを用
い、アリル変性ポリフェニレンエーテルに対してラジカ
ル重合性の架橋材としてトリアリルイソシアヌレートを
10重量%、ラジカル重合開始剤としてベンゾイルパーオ
キサイドを1重量%、熱可塑性樹脂として重量平均分子
量が120000のアジピン酸プロピオンエステルを20重量
%、エラストマーとしてガラス転移温度Tgが−30℃の
アクリルゴムを20重量%、フィラーとして微粉砕シリカ
を8重量%、溶剤として加熱トルエンを添加混合してワ
ニス状接着材を製作した。
[Example 1 of Adhesive] Allyl-modified polyphenylene ether was used as an aromatic / heterocyclic resin-modified product, and triallyl isocyanurate was used as a radical polymerizable cross-linking agent for the allyl-modified polyphenylene ether.
10% by weight, 1% by weight of benzoyl peroxide as a radical polymerization initiator, 20% by weight of propionate adipate having a weight average molecular weight of 120,000 as a thermoplastic resin, and an acrylic rubber having a glass transition temperature Tg of -30 ° C. as an elastomer. 20% by weight, 8% by weight of finely divided silica as a filler and heated toluene as a solvent were added and mixed to prepare a varnish-like adhesive.

【0058】このワニス状接着材をPETシート上に乾
燥後の厚みが45μmとなるようにローラーコータにて塗
布した後、60〜100℃の温度で乾燥させ接着材フィルム
(接着材フィルムA)を得た。この未硬化の接着材フィ
ルムAを可撓性評価のため180度の折り曲げ試験を行っ
たが、折り曲げ部にクラック等の異常は全く認められな
かった。
The varnish-like adhesive was applied on a PET sheet by a roller coater so that the thickness after drying became 45 μm, and then dried at a temperature of 60 to 100 ° C. to form an adhesive film (adhesive film A). Obtained. The uncured adhesive film A was subjected to a 180-degree bending test for flexibility evaluation, but no abnormality such as cracks was observed in the bent portion.

【0059】また、接着材フィルムAを200℃の温度で
3時間乾燥・硬化後、引張り測定機で5mm/分間の速
度でフィルムを引張った時の破断伸びは8%であった。
さらに、150℃の温度で100時間の熱履歴を加えたとこ
ろ、破断伸びは9%となった。
After the adhesive film A was dried and cured at a temperature of 200 ° C. for 3 hours, the elongation at break was 8% when the film was pulled at a rate of 5 mm / minute by a tensile measuring machine.
Further, when a heat history of 100 hours was added at a temperature of 150 ° C., the elongation at break was 9%.

【0060】〔接着材の実施例2〕芳香族・複素環系樹
脂変性物として変性ノルボルネン樹脂を用い、変性ノル
ボルネン樹脂に対してラジカル重合性の架橋材としてエ
チレングリコールジメタクリレートを5重量%、熱可塑
性樹脂として重量平均分子量が200000のアジピン酸ブチ
レンエステルを30重量%、エラストマーとしてガラス転
移温度Tgが−60℃のエポキシ化NBRを20重量%、フ
ィラーとして微粉砕シリカを4重量%、溶剤としてPM
Aを添加混合してワニス状接着材を製作した。
[Example 2 of Adhesive] A modified norbornene resin was used as a modified aromatic / heterocyclic resin, and ethylene glycol dimethacrylate was used as a radical polymerizable cross-linking agent in the modified norbornene resin at 5% by weight. 30% by weight of butylene adipate having a weight average molecular weight of 200,000 as a plastic resin, 20% by weight of epoxidized NBR having a glass transition temperature Tg of -60 ° C. as an elastomer, 4% by weight of finely divided silica as a filler, and PM as a solvent
A was added and mixed to produce a varnish-like adhesive.

【0061】このワニス状接着材をPETシート上に乾
燥後の厚みが30μmとなるようにローラーコータにて塗
布した後、60〜100℃の温度で乾燥させ接着材フィルム
(接着材フィルムB)を得た。この未硬化の接着材フィ
ルムBを可撓性評価のため180度の折り曲げ試験を行っ
たが、折り曲げ部にクラック等の異常は全く認められな
かった。
The varnish-like adhesive is applied on a PET sheet by a roller coater so that the thickness after drying becomes 30 μm, and then dried at a temperature of 60 to 100 ° C. to form an adhesive film (adhesive film B). Obtained. The uncured adhesive film B was subjected to a 180-degree bending test for flexibility evaluation, but no abnormality such as a crack was observed in the bent portion.

【0062】また、接着材フィルムBを180℃の温度で
3時間乾燥・硬化後、引張り測定機で5mm/分間の速
度でフィルムを引張った時の破断伸びは9%であった。
さらに、150℃の温度で100時間の熱履歴を加えたとこ
ろ、破断伸びは9%と同じ値であった。
After the adhesive film B was dried and cured at a temperature of 180 ° C. for 3 hours, the elongation at break was 9% when the film was pulled at a rate of 5 mm / minute by a tensile measuring machine.
Further, when a heat history of 100 hours was added at a temperature of 150 ° C., the elongation at break was the same as 9%.

【0063】〔接着材の比較例〕熱可塑性ノルボルネン
樹脂に対して硬化材としてスチレンモノマーを10重量
%、ベンゾイルパーオキサイドを1重量%、フィラーと
して微粉砕シリカを30重量%、溶剤としてトルエンを添
加混合してワニス状接着材を製作した。
Comparative Example of Adhesive Material 10% by weight of styrene monomer, 1% by weight of benzoyl peroxide, 1% by weight of benzoyl peroxide, 30% by weight of finely divided silica as a filler, and toluene as a solvent were added to a thermoplastic norbornene resin. A varnish-like adhesive was produced by mixing.

【0064】このワニス状接着材をPETシート上に乾
燥後の厚みが45μmとなるようにローラーコータにて塗
布した後、60〜100℃の温度で乾燥させ接着材フィルム
(接着材フィルムC)を得た。この未硬化の接着材フィ
ルムCを可撓性評価のため180度の折り曲げ試験を行っ
たところ、折り曲げ部にクラックが発生した。
The varnish-like adhesive was applied on a PET sheet by a roller coater so that the thickness after drying was 45 μm, and then dried at a temperature of 60 to 100 ° C. to form an adhesive film (adhesive film C). Obtained. When the uncured adhesive film C was subjected to a 180-degree bending test for flexibility evaluation, cracks occurred at the bent portions.

【0065】また、接着材フィルムCを150℃の温度で
1時間乾燥・硬化後、引張り試験機で5mm/分間の速
度で引張った時の破断伸びは2%であった。さらに、15
0℃の温度で100時間の熱履歴を加えたところ、破断伸び
は1%になった。
After the adhesive film C was dried and cured at a temperature of 150 ° C. for 1 hour, the elongation at break was 2% when the film was pulled at a rate of 5 mm / minute by a tensile tester. In addition, 15
When a heat history of 100 hours was added at a temperature of 0 ° C., the elongation at break was 1%.

【0066】以上の様に、本発明の接着材を用いて製作
したフィルムは、未硬化時には可撓性に優れ、硬化後の
破断伸びが8〜9%と良好なフィルムであることが確認
できた。
As described above, it was confirmed that the film produced using the adhesive of the present invention had excellent flexibility when uncured, and a good elongation at break of 8 to 9% after curing. Was.

【0067】〔電子部品の実施例1〕ガラス繊維とアリ
ル変性ポリフェニレンエーテル樹脂から成る絶縁基板の
表裏両面に、接着材フィルムAを真空ラミネーターによ
り同時にラミネートした後、接着材フィルムAからPE
Tフィルムを剥離し、その後、200℃の温度で1時間硬
化させた後、炭酸ガスレーザで貫通孔9を穿設した。つ
ぎに、フィルム表面の表面粗さRaを原子間力顕微鏡で
測定して算術平均粗さRaが0.5μmとなるように、過
マンガン酸カリウム溶液で粗化処理した。その後、パラ
ジウム系のめっき触媒で処理した後、無電解銅めっきを
施し、次いで、ドライフィルムフォトレジストで配線パ
ターン加工を行い、電解銅めっきで厚み18μmの配線導
体層6を形成した。その時の配線導体層6のピール強度
は0.8kg/cmであった。また、ピール強度を安定化
させるために200℃の温度で2時間熱処理を行った。そ
の後、接着材フィルムAのラミネートと貫通孔9の穿設
・粗化処理・めっきによる配線導体層6・貫通導体10の
形成を複数回繰返して6層の接着材層5・配線導体層6
を絶縁基板4上に形成した後、ソルダーレジスト加工し
たパッド上にニッケル・金めっきを施し、さらに半田バ
ンプを形成した。そして、この配線基板2の半田バンプ
に半導体素子3を搭載してリフロー電気接続を行った
後、半導体素子3と配線基板2との隙間にアンダーフィ
ル12材を注入して信頼性試験用のサンプルを得た このサンプルを用いて、信頼性試験として温度サイクル
試験(TCT)とプレッシャクッカー試験(PCT)を
行い、配線基板のクラックや膨れ・剥がれ等の外観と抵
抗値変化率の値で電子部品の評価を行なった。
[Embodiment 1 of Electronic Components] An adhesive film A was simultaneously laminated on both front and back surfaces of an insulating substrate made of glass fiber and allyl-modified polyphenylene ether resin by a vacuum laminator.
After the T film was peeled off and cured at a temperature of 200 ° C. for 1 hour, a through hole 9 was formed by a carbon dioxide laser. Next, the surface roughness Ra of the film surface was measured with an atomic force microscope, and the film was roughened with a potassium permanganate solution so that the arithmetic average roughness Ra was 0.5 μm. Thereafter, after treatment with a palladium-based plating catalyst, electroless copper plating was performed, then wiring pattern processing was performed with a dry film photoresist, and a wiring conductor layer 6 having a thickness of 18 μm was formed by electrolytic copper plating. At that time, the peel strength of the wiring conductor layer 6 was 0.8 kg / cm. Further, heat treatment was performed at a temperature of 200 ° C. for 2 hours to stabilize the peel strength. After that, the lamination of the adhesive film A and the formation of the wiring conductor layer 6 and the through conductor 10 by drilling, roughening, and plating of the through holes 9 are repeated a plurality of times to form the six adhesive layers 5 and the wiring conductor layers 6
Was formed on the insulating substrate 4, nickel / gold plating was performed on the pads subjected to the solder resist processing, and further, solder bumps were formed. Then, after mounting the semiconductor element 3 on the solder bumps of the wiring board 2 and performing reflow electrical connection, an underfill 12 material is injected into a gap between the semiconductor element 3 and the wiring board 2 to obtain a sample for a reliability test. Using this sample, a temperature cycle test (TCT) and a pressure cooker test (PCT) were performed as reliability tests, and the electronic components were evaluated based on the appearance of the wiring board such as cracks, swelling and peeling, and the rate of change in resistance. Was evaluated.

【0068】TCTは気相冷熱試験機を用い、サンプル
を温度が−55℃および125℃の気相中に各30分間放置し
これを1サイクルとして1000サイクルの条件で行い、抵
抗値変化率は、試験前の抵抗値と試験後の抵抗値とを測
定して計算により算出した。
The TCT was performed using a gas phase cooling / heating tester, and the sample was left in a gas phase at a temperature of −55 ° C. and 125 ° C. for 30 minutes each, and this was performed as one cycle under the conditions of 1000 cycles. The resistance value before the test and the resistance value after the test were measured and calculated.

【0069】また、PCTは温度可変寿命試験機を用
い、サンプルを温度 121℃、相対湿度100%、圧力2.1×
105Paの条件下に168時間放置して行い、抵抗変化率
は、試験前の抵抗値と試験後の抵抗値とを測定して計算
により算出した。
In the PCT, a temperature variable life tester was used, and a sample was prepared at a temperature of 121 ° C., a relative humidity of 100%, and a pressure of 2.1 ×.
The test was left for 168 hours under the condition of 105 Pa, and the resistance change rate was calculated by measuring the resistance value before the test and the resistance value after the test.

【0070】その結果、本発明の電子部品1は、TCT
1000サイクル後でもクラックが発生せず、抵抗値変化率
は5%と低い値となった。また、PCT168時間後でも
膨れや剥れがなく、抵抗変化率も7%と低い値となり良
好な電子部品であることがわかった。
As a result, the electronic component 1 of the present invention
No cracks occurred even after 1000 cycles, and the resistance value change rate was as low as 5%. Further, even after 168 hours of PCT, there was no swelling or peeling, and the rate of change in resistance was as low as 7%.

【0071】〔電子部品の実施例2〕ガラス繊維とアリ
ル変性ポリフェニレンエーテル樹脂から成る絶縁基板の
表裏両面に、接着材フィルムBを真空ラミネーターによ
り同時にラミネートした後、PETフィルムを剥離し、
180℃の温度で1時間硬化させた後、炭酸ガスレーザで
貫通孔9を穿設した。次いで、フィルム表面の表面粗さ
を原子間力顕微鏡で測定して算術平均粗さRaが0.9μ
mとなるように過マンガン酸カリウムで粗化処理した。
また、上記の配線基板2をパラジウム系のめっき触媒で
処理した後、無電解銅めっきを行い、次に、ドライフィ
ルムフォトレジストで配線パターン加工を行い、電解銅
めっきで厚さ20μmの配線導体層6を形成した。その時
の配線導体層6のピール強度は1.0kg/cmであっ
た。また、ピール強度を安定化させるために180℃の温
度で2時間熱処理を行った。次に、接着材フィルム2の
ラミネートと貫通孔9の穿設・粗化処理・めっきによる
配線導体層6・貫通導体10の成形をを複数回繰返して6
層の接着材層5・配線導体層6を絶縁基板2上に形成し
た後、ソルダーレジスト加工したパッド上にニッケル・
金めっきを施し、さらに半田バンプを形成した。
[Embodiment 2 of Electronic Parts] After an adhesive film B was simultaneously laminated on both front and back surfaces of an insulating substrate made of glass fiber and allyl-modified polyphenylene ether resin by a vacuum laminator, the PET film was peeled off.
After curing at a temperature of 180 ° C. for 1 hour, a through hole 9 was formed by a carbon dioxide laser. Next, the surface roughness of the film surface was measured with an atomic force microscope, and the arithmetic average roughness Ra was 0.9 μm.
m was roughened with potassium permanganate.
Further, after the above wiring board 2 is treated with a palladium-based plating catalyst, electroless copper plating is performed, then wiring pattern processing is performed with a dry film photoresist, and a 20 μm thick wiring conductor layer is formed by electrolytic copper plating. 6 was formed. At this time, the peel strength of the wiring conductor layer 6 was 1.0 kg / cm. Further, heat treatment was performed at a temperature of 180 ° C. for 2 hours to stabilize the peel strength. Next, the lamination of the adhesive material film 2 and the formation of the wiring conductor layer 6 and the through conductor 10 by drilling, roughening, and plating of the through hole 9 are repeated a plurality of times.
After the adhesive layer 5 and the wiring conductor layer 6 are formed on the insulating substrate 2, nickel / nickel
Gold plating was performed, and further, solder bumps were formed.

【0072】かくして得られた配線基板2の半田バンプ
に半導体素子3を搭載してリフロー電気接続を行った
後、半導体素子3と配線基板2との隙間にアンダーフィ
ル12を注入して信頼性試験用のサンプルを得た。
After mounting the semiconductor element 3 on the solder bumps of the wiring board 2 thus obtained and performing reflow electrical connection, an underfill 12 is injected into a gap between the semiconductor element 3 and the wiring board 2 to perform a reliability test. A sample was obtained.

【0073】このサンプルを用いて、信頼性試験として
(電子部品の実施例1)と同様のTCTとPCTを行
い、配線基板2のクラックや膨れ・剥がれ等の外観と抵
抗値変化率の値で評価した。
Using this sample, the same TCT and PCT as in the reliability test (Embodiment 1 of the electronic component) were performed, and the appearance of the wiring board 2 such as cracks, swelling and peeling, and the value of the rate of change in resistance were determined. evaluated.

【0074】その結果、サンプルは、TCT1000サイク
ル後でもクラックが発生せず、配線導体層6の抵抗値変
化率は6%と低い値となった。また、PCT168時間後
でも膨れや剥れがなく、配線導体層6の抵抗値変化率も
8%と低い値となった。
As a result, no cracks occurred in the sample even after 1000 TCT cycles, and the resistance change rate of the wiring conductor layer 6 was a low value of 6%. Further, even after 168 hours of PCT, there was no swelling or peeling, and the rate of change in resistance of the wiring conductor layer 6 was a low value of 8%.

【0075】〔電子部品の比較例1〕ガラス繊維とアリ
ル変性ポリフェニレンエーテル樹脂から成る絶縁基板の
表裏両面に、接着材フィルムCを真空ラミネーターによ
り同時にラミネートした後、PETフィルムを剥離し、
150℃の温度で1時間硬化させた後、炭酸ガスレーザで
貫通孔を穿設した。次いで、原子間力顕微鏡で計測した
算術平均粗さRaが0.05μmとなるように過マンガン酸
カリウム等の酸化剤で接着材層表面を粗化処理した。そ
の後、パラジウム系のめっき触媒で処理した後、無電解
銅めっきを行い、次いで、ドライフィルムフォトレジス
トで配線パターン加工を行い、電解銅めっきで厚さ18μ
mの配線導体層を形成した。その時の配線導体層のピー
ル強度は0.7kg/cmであった。また、ピール強度を
安定化させるために150℃の温度で2時間熱処理を行っ
た。次いで、前記接着材フィルムCのラミネートと貫通
孔の穿設・粗化処理・めっきを複数回繰返して、6層の
接着材層・配線導体層を絶縁基板上に形成した後、ソル
ダーレジスト加工したパッド上にニッケル・金めっきを
施し、さらに半田バンプを形成した。
[Comparative Example 1 of Electronic Parts] After an adhesive film C was simultaneously laminated on both front and back surfaces of an insulating substrate made of glass fiber and allyl-modified polyphenylene ether resin by a vacuum laminator, the PET film was peeled off.
After curing at a temperature of 150 ° C. for 1 hour, a through-hole was formed with a carbon dioxide laser. Next, the surface of the adhesive layer was roughened with an oxidizing agent such as potassium permanganate so that the arithmetic average roughness Ra measured by an atomic force microscope was 0.05 μm. After that, after treatment with a palladium-based plating catalyst, electroless copper plating is performed, and then wiring pattern processing is performed with a dry film photoresist, and a thickness of 18 μm is formed by electrolytic copper plating.
m wiring conductor layers were formed. The peel strength of the wiring conductor layer at that time was 0.7 kg / cm. In addition, heat treatment was performed at 150 ° C. for 2 hours to stabilize the peel strength. Next, the lamination of the adhesive film C and the drilling / roughening / plating of the through-holes were repeated a plurality of times to form six adhesive layers / wiring conductor layers on the insulating substrate, followed by solder resist processing. The pads were plated with nickel and gold, and solder bumps were formed.

【0076】かくして得られた配線基板の半田バンプに
半導体素子を搭載してリフロー電気接続を行った後、半
導体素子と配線基板との隙間にアンダーフィルを注入し
て信頼性試験用の電子部品の比較用試料を得た。
After mounting the semiconductor element on the solder bumps of the wiring board thus obtained and performing reflow electrical connection, an underfill is injected into a gap between the semiconductor element and the wiring board to form an electronic component for reliability test. A sample for comparison was obtained.

【0077】この比較用試料を用いて、信頼性試験とし
て電子部品の実施例1と同様のTCTとPCTを行った
ところ、本比較用試料は、TCT200サイクル後にクラ
ックが発生し、また、PCT96時間後に膨れが発生し
た。
Using this comparative sample, the same TCT and PCT as in Example 1 of the electronic component were performed as a reliability test. As a result, a crack occurred in the comparative sample after 200 cycles of TCT. Later blistering occurred.

【0078】[0078]

【発明の効果】本発明の接着材によれば、芳香族・複素
環系樹脂変性物をラジカル重合性の架橋材で高密度に架
橋していることから、熱による芳香族・複素環系樹脂変
性物の分子切断や、芳香族・複素環系樹脂変性物中への
水分の浸入を抑制でき、耐熱性および耐湿性に優れた接
着材とすることができる。
According to the adhesive of the present invention, a modified aromatic / heterocyclic resin is cross-linked at a high density with a radical polymerizable cross-linking material. It is possible to suppress the molecular breakage of the modified product and the intrusion of moisture into the modified aromatic / heterocyclic resin, and to provide an adhesive material having excellent heat resistance and moisture resistance.

【0079】また、本発明の接着材によれば、重量平均
分子量が10000〜500000であって粗化液に溶解する熱可
塑性樹脂を含有していることから、伸縮性に富みフィル
ム成形性に優れているとともに表面に配線導体層との密
着性向上に効果的な粗面を形成することができる接着材
とすることができる。
The adhesive of the present invention has a weight average molecular weight of 10,000 to 500,000 and contains a thermoplastic resin which is soluble in a roughening liquid. And an adhesive capable of forming a rough surface effective for improving the adhesion to the wiring conductor layer on the surface.

【0080】さらに、本発明の接着材によれば、ガラス
転移温度Tgが−60〜−20℃のエラストマーを含有して
いることから、未硬化のフィルムは可撓性に優れており
取り扱いが容易であると共に、硬化後のフィルムでも破
断伸びが3〜10%と可撓性を維持し熱変化による応力を
吸収でき、その結果、耐熱疲労性の良好な接着材とする
ことができる。
Further, since the adhesive of the present invention contains an elastomer having a glass transition temperature Tg of −60 to −20 ° C., the uncured film is excellent in flexibility and easy to handle. In addition, the cured film can maintain the flexibility at break elongation of 3 to 10% and absorb the stress caused by heat change, and as a result, can provide an adhesive material having good thermal fatigue resistance.

【0081】また、本発明の電子部品によれば、原子間
力顕微鏡で測定した接着材層表面の算術平均粗さRaを
0.1〜1μmとしたことから、接着材層と配線導体層と
の密着性を良好としピール強度を向上させることがで
き、TCTによる耐熱疲労性やPCTによる耐湿性等の
信頼性試験に対して良好な配線基板を具備した電子部品
とすることができる。
Further, according to the electronic component of the present invention, the arithmetic mean roughness Ra of the surface of the adhesive layer measured by an atomic force microscope is calculated as follows.
Since the thickness is set to 0.1 to 1 μm, the adhesion between the adhesive layer and the wiring conductor layer can be improved and the peel strength can be improved, which is good for reliability tests such as thermal fatigue resistance by TCT and moisture resistance by PCT. An electronic component having a suitable wiring board can be obtained.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の接着材を用いた配線基板に電子素子と
して半導体素子を搭載した場合の電子部品の一例を示す
要部断面図である。
FIG. 1 is a main part sectional view showing an example of an electronic component when a semiconductor element is mounted as an electronic element on a wiring board using the adhesive of the present invention.

【符号の説明】[Explanation of symbols]

1・・・・・・電子部品 2・・・・・・配線基板 3・・・・・・半導体素子 4・・・・・・絶縁基板 5・・・・・・接着材層 6・・・・・・配線導体層 7・・・・・・スルーホール 8・・・・・・スルーホール導体 9・・・・・・貫通孔 10・・・・・・貫通導体 11・・・・・・接続部材 12・・・・・・アンダーフィル DESCRIPTION OF SYMBOLS 1 ... Electronic component 2 ... Wiring board 3 ... Semiconductor element 4 ... Insulating substrate 5 ... Adhesive layer 6 ...・ ・ ・ Wiring conductor layer 7 ・ ・ ・ ・ ・ ・ Through hole 8 ・ ・ ・ ・ ・ ・ Through hole conductor 9 ・ ・ ・ ・ ・ ・ Through hole 10 ・ ・ ・ ・ ・ ・ Through conductor 11 ・ ・ ・ ・ ・ ・Connection member 12 ... Underfill

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.7 識別記号 FI テーマコート゛(参考) H01L 23/14 H05K 3/38 E H05K 3/38 H01L 23/14 R Fターム(参考) 4J004 AA01 AA02 AA05 AA10 AA15 AA16 AA17 AA18 BA02 FA05 4J011 PA54 PA65 PA69 PA76 PA79 PA88 PB40 PC02 4J027 AA08 AH03 BA18 BA20 BA22 BA29 CB04 CD09 4J040 CA072 DF042 DF052 DM012 ED042 ED052 EG022 FA042 FA072 FA142 FA231 FA241 FA281 HA026 HA136 HA176 HA206 HA296 HA306 HA316 HA346 HB41 JA09 KA04 KA16 KA42 LA01 LA02 LA06 LA07 LA08 LA09 MA02 MB05 NA20 5E343 AA02 AA07 AA12 AA36 BB05 BB22 CC01 CC02 CC07 CC23 CC43 CC50 DD33 DD43 EE21 EE37 GG01 ──────────────────────────────────────────────────の Continued on the front page (51) Int.Cl. 7 Identification symbol FI Theme coat ゛ (Reference) H01L 23/14 H05K 3/38 E H05K 3/38 H01L 23/14 RF term (Reference) 4J004 AA01 AA02 AA05 AA10 AA15 AA16 AA17 AA18 BA02 FA05 4J011 PA54 PA65 PA69 PA76 PA79 PA88 PB40 PC02 4J027 AA08 AH03 BA18 BA20 BA22 BA29 CB04 CD09 4J040 CA072 DF042 DF052 DM012 ED042 ED052 EG022 FA042 HA072 FA042 FA0714 KA16 KA42 LA01 LA02 LA06 LA07 LA08 LA09 MA02 MB05 NA20 5E343 AA02 AA07 AA12 AA36 BB05 BB22 CC01 CC02 CC07 CC23 CC43 CC50 DD33 DD43 EE21 EE37 GG01

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】 芳香族・複素環系樹脂変性物と、ラジカ
ル重合性の架橋材と、重量平均分子量が10000〜5
00000であって粗化液に溶解する熱可塑性樹脂と、
ガラス転移温度Tgが−60〜−20℃のエラストマー
と、フィラーとから成り、硬化後の破断伸びが3〜10
%であることを特徴とする接着材。
1. A modified aromatic / heterocyclic resin, a radical polymerizable crosslinker, and a weight average molecular weight of 10,000 to 5
A thermoplastic resin which is 00000 and is dissolved in the roughening liquid,
It consists of an elastomer having a glass transition temperature Tg of −60 to −20 ° C. and a filler, and has an elongation at break of 3 to 10 after curing.
%.
【請求項2】 前記芳香族・複素環系樹脂変性物に対し
て、前記ラジカル重合性の架橋材を2〜10重量%、前
記熱可塑性樹脂を5〜30重量%、前記エラストマーを
10〜40重量%、前記フィラーを3〜10重量%含有
させたことを特徴とする請求項1記載の接着材。
2. The radically polymerizable cross-linking material is 2 to 10% by weight, the thermoplastic resin is 5 to 30% by weight, and the elastomer is 10 to 40% by weight of the modified aromatic / heterocyclic resin. The adhesive according to claim 1, wherein the filler is contained in an amount of 3 to 10% by weight.
【請求項3】 前記接着材はフィルム状であることを特
徴とする請求項1または請求項2記載の接着材。
3. The adhesive according to claim 1, wherein the adhesive is in the form of a film.
【請求項4】 絶縁基板と、該絶縁基板上に請求項1乃
至請求項3のいずれかに記載の接着材を用いて形成され
た接着材層と、前記絶縁基板および前記接着材層の各表
面に形成された複数の配線導体層と、前記接着材層に穿
設された貫通孔内部に形成され、前記複数の配線導体層
間を電気的に接続する貫通導体とから成る配線基板に電
子素子を実装した電子部品であって、原子間力顕微鏡で
測定した前記接着材層表面の算術平均粗さRaが0.1
〜1μmであることを特徴とする電子部品。
4. An insulating substrate, an adhesive layer formed on the insulating substrate by using the adhesive according to claim 1, and each of the insulating substrate and the adhesive layer An electronic element is mounted on a wiring board comprising: a plurality of wiring conductor layers formed on the surface; and a through conductor formed inside a through hole formed in the adhesive layer and electrically connecting the plurality of wiring conductor layers. Wherein the arithmetic average roughness Ra of the surface of the adhesive layer measured by an atomic force microscope is 0.1.
An electronic component having a thickness of 1 μm to 1 μm.
【請求項5】 前記接着材層の表面に形成された前記配
線導体層のピール強度が0.7〜1.5kg/cmであ
ることを特徴とする請求項4記載の電子部品。
5. The electronic component according to claim 4, wherein the peel strength of the wiring conductor layer formed on the surface of the adhesive layer is 0.7 to 1.5 kg / cm.
JP2000161262A 2000-05-30 2000-05-30 Adhesive and electronic parts using the same Pending JP2001342450A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
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Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000161262A JP2001342450A (en) 2000-05-30 2000-05-30 Adhesive and electronic parts using the same

Publications (1)

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Family

ID=18665313

Family Applications (1)

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Country Link
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Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPWO2003103352A1 (en) * 2002-06-04 2005-10-06 住友電気工業株式会社 Printed wiring board, printed wiring board and manufacturing method thereof
JP2006083364A (en) * 2004-08-19 2006-03-30 Mitsubishi Gas Chem Co Inc Curable resin composition, curable film and film
US7692103B2 (en) 2003-11-18 2010-04-06 Ngk Spark Plug Co., Ltd. Wiring substrate and manufacturing process of the same
CN103871907A (en) * 2014-03-26 2014-06-18 华进半导体封装先导技术研发中心有限公司 Manufacturing technology of ultra-thin substrate
WO2021085008A1 (en) * 2019-10-30 2021-05-06 リンテック株式会社 Adhesive sheet for devices
WO2021181732A1 (en) * 2020-03-13 2021-09-16 リンテック株式会社 Curable adhesive sheet for device
CN115135736A (en) * 2020-03-13 2022-09-30 琳得科株式会社 Curable adhesive sheet for device

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPWO2003103352A1 (en) * 2002-06-04 2005-10-06 住友電気工業株式会社 Printed wiring board, printed wiring board and manufacturing method thereof
US8231766B2 (en) 2002-06-04 2012-07-31 Sumitomo Electric Industries, Ltd. Method for producing printed wiring board
US7692103B2 (en) 2003-11-18 2010-04-06 Ngk Spark Plug Co., Ltd. Wiring substrate and manufacturing process of the same
JP2006083364A (en) * 2004-08-19 2006-03-30 Mitsubishi Gas Chem Co Inc Curable resin composition, curable film and film
CN103871907A (en) * 2014-03-26 2014-06-18 华进半导体封装先导技术研发中心有限公司 Manufacturing technology of ultra-thin substrate
WO2021085008A1 (en) * 2019-10-30 2021-05-06 リンテック株式会社 Adhesive sheet for devices
JPWO2021085008A1 (en) * 2019-10-30 2021-11-25 リンテック株式会社 Adhesive sheet for devices
WO2021181732A1 (en) * 2020-03-13 2021-09-16 リンテック株式会社 Curable adhesive sheet for device
JP2021147621A (en) * 2020-03-13 2021-09-27 リンテック株式会社 Curable adhesive sheet for devices
CN115135736A (en) * 2020-03-13 2022-09-30 琳得科株式会社 Curable adhesive sheet for device

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