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JP2001018163A - Polishing pad - Google Patents

Polishing pad

Info

Publication number
JP2001018163A
JP2001018163A JP19197199A JP19197199A JP2001018163A JP 2001018163 A JP2001018163 A JP 2001018163A JP 19197199 A JP19197199 A JP 19197199A JP 19197199 A JP19197199 A JP 19197199A JP 2001018163 A JP2001018163 A JP 2001018163A
Authority
JP
Japan
Prior art keywords
groove
slurry
pad
level block
center
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19197199A
Other languages
Japanese (ja)
Inventor
Kazuhiko Hirata
田 和 彦 平
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SpeedFam Co Ltd
Original Assignee
SpeedFam Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SpeedFam Co Ltd filed Critical SpeedFam Co Ltd
Priority to JP19197199A priority Critical patent/JP2001018163A/en
Publication of JP2001018163A publication Critical patent/JP2001018163A/en
Pending legal-status Critical Current

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/11Lapping tools
    • B24B37/20Lapping pads for working plane surfaces
    • B24B37/26Lapping pads for working plane surfaces characterised by the shape of the lapping pad surface, e.g. grooved

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)

Abstract

PROBLEM TO BE SOLVED: To uniformly generate polishing material slurry by providing a direction of a spiral, toward the center part from a pad external peripheral part of a spiral groove connecting the pad center part and external peripheral part, in a reverse direction to a rotational direction of a level block at polishing time. SOLUTION: Polishing material slurry 6 supplied to the center of a level block 4 radially flows in its external peripheral direction by action of centrifugal force due to rotation of the level block 4, while flowing in a groove 2 and overflowing it, traverses the groove 2, reaches an external periphery of the level block, and flows out to the outside. Since a direction of a spiral of the groove 2, that is, a direction of a spiral toward the center part from an external peripheral part of the level block 4 is in a reverse direction to a rotational direction R of the level block 4, partly the slurry flowing in the groove 2 flows toward the center of the level block 4 in the groove 2 by action of centripetal force. Partly the slurry overflows the groove 2 in the halfway, but the rest of slurry, after flowing in a hollow 3, overflows in the periphery, to form again a flow of the slurry together with the newly supplied slurry 6.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、定盤の表面に貼り
付けてワークの研磨に使用する研磨パッドに関するもの
であり、更に詳しくは、半導体ウエハの化学的機械研磨
(CMP)に使用して好適な研磨パッドに関するもので
ある。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a polishing pad which is used for polishing a work by attaching it to a surface of a surface plate, and more particularly to a polishing pad used for chemical mechanical polishing (CMP) of a semiconductor wafer. It relates to a suitable polishing pad.

【0002】[0002]

【従来の技術】例えば、半導体ウエハの表面を平坦化す
る技術の一つに化学的機械研磨(CMP)がある。これ
は、回転する定盤に貼り付けられた研磨パッドにウエハ
を押し付け、研磨材スラリーを供給しながら上記研磨パ
ッドでウエハの表面を研磨するものである。
2. Description of the Related Art For example, one of the techniques for flattening the surface of a semiconductor wafer is chemical mechanical polishing (CMP). In this method, the wafer is pressed against a polishing pad attached to a rotating platen, and the surface of the wafer is polished with the polishing pad while supplying an abrasive slurry.

【0003】上記研磨パッドの表面には、供給された研
磨材スラリーをパッド全体に均一に分散させたり、パッ
ド上にできるだけ長い時間滞留させたりする目的のた
め、格子状や同心円状の溝が切られることがある(例え
ば特開平10−249710号公報参照)。
A grid or concentric groove is formed on the surface of the polishing pad for the purpose of uniformly dispersing the supplied abrasive slurry throughout the pad or retaining the slurry on the pad as long as possible. (See, for example, JP-A-10-249710).

【0004】ところが、格子状の溝を切ったものは、ス
ラリーの分散効果は高いが、定盤の回転による遠心力の
作用によって研磨材スラリーがこの溝に沿って定盤の外
周に流出し易いため、スラリーの保持効果は低い。
[0004] However, when the lattice-shaped grooves are cut, the effect of dispersing the slurry is high, but the abrasive slurry easily flows along the grooves to the outer periphery of the platen due to the action of centrifugal force due to the rotation of the platen. Therefore, the effect of holding the slurry is low.

【0005】一方、同心円状の複数の溝を切ったもの
は、各溝が定盤の外周に開口していないため、格子状の
溝を切ったものに比べるとスラリーの保持効果は高い
が、各溝が一旦スラリーで満たされると、新たに供給さ
れるスラリーは各溝上を越えて定盤の外周方向に簡単に
流出するため、各溝内には古いスラリーが残留したまま
となってスラリーの交換が行われにくく、溝内にスラッ
ジなどが溜り易いという問題があった。しかも、研磨作
業が終了した後の洗浄工程で、各溝内に残留したスラリ
ーやスラッジ等を完全に洗い流して外部に排出するのは
困難であった。
[0005] On the other hand, in the case of cutting a plurality of concentric grooves, since each groove does not open to the outer periphery of the surface plate, the slurry holding effect is higher than that in the case of cutting a lattice-like groove. Once each groove is filled with the slurry, the newly supplied slurry easily flows out over each groove toward the outer periphery of the platen, so that the old slurry remains in each groove and the slurry is removed. There is a problem that replacement is difficult and sludge or the like easily accumulates in the groove. Moreover, in the cleaning process after the polishing operation is completed, it is difficult to completely wash out the slurry, sludge, and the like remaining in each groove and discharge them to the outside.

【0006】[0006]

【発明が解決しようとする課題】本発明の技術的課題
は、研磨工程では研磨材スラリーの分散効果及び保持効
果に優れ、洗浄工程では溝内のスラリーやスラッジ等を
簡単に洗い流すことができる、使用性に優れた研磨用パ
ッドを提供することにある。
The technical problem of the present invention is that the polishing step has an excellent effect of dispersing and retaining the abrasive slurry, and the washing step can easily wash off the slurry and sludge in the grooves. An object of the present invention is to provide a polishing pad excellent in usability.

【0007】[0007]

【課題を解決するための手段】上記課題を解決するた
め、本発明によれば、定盤に貼り付けてワークの研磨に
使用する円形の研磨用パッドであって、表面にパッドの
中心部と外周部とを結ぶ螺旋状の溝を少なくとも1本有
し、この溝のパッド外周部から中心部に向かう螺旋の向
きが、研磨時における定盤の回転方向とは逆向きである
ことを特徴とする研磨用パッドが提供される。
According to the present invention, there is provided, in accordance with the present invention, a circular polishing pad which is attached to a surface plate and used for polishing a work, the surface being provided with a central portion of the pad. It has at least one spiral groove connecting the outer peripheral portion, and the direction of the spiral of the groove from the pad outer peripheral portion to the center portion is opposite to the rotation direction of the surface plate during polishing. A polishing pad is provided.

【0008】上記構成を有する本発明のパッドは、定盤
の表面にそれを貼り付け、回転する該定盤のパッド面に
ワークを押し付けて、該定盤の中心に研磨材スラリーを
供給しながらワークを研磨する。このとき、定盤の中心
に供給された研磨材スラリーは、定盤の回転による遠心
力の作用によって該定盤の外周方向に流動し、溝内に流
れ込んだり該溝から溢れ出したりしながら定盤外周に到
達し、そこから外部に流出するが、上記溝の螺旋の向
き、即ちパッドの外周部から中心部に向かう螺旋の向き
が、定盤の回転方向とは逆向きであるため、該溝内に流
れ込んだ一部のスラリーは、求心力の作用により該溝内
を定盤の中心に向かって流れていき、主として中心部で
溝から溢れ出したあと、新たに供給されたスラリーと一
緒になって再び上述したスラリーの流れを形成し、循環
的に使用されることになる。
[0008] The pad of the present invention having the above-mentioned structure is affixed to the surface of the surface plate, pressing the work against the pad surface of the rotating surface plate, and supplying the abrasive slurry to the center of the surface plate. Polish the work. At this time, the abrasive slurry supplied to the center of the platen flows in the outer circumferential direction of the platen by the action of centrifugal force due to the rotation of the platen, and flows while flowing into the groove or overflows from the groove. It reaches the outer periphery of the board and flows out therefrom.However, since the direction of the spiral of the groove, that is, the direction of the spiral from the outer peripheral portion of the pad toward the center is opposite to the rotation direction of the surface plate, Some of the slurry that has flowed into the groove flows toward the center of the platen through the groove due to the effect of centripetal force, and mainly spills out of the groove at the center, and then together with the newly supplied slurry. Then, the above-mentioned slurry flow is formed again, and the slurry is used cyclically.

【0009】このため、スラリーの分散効果及び保持効
果に優れると共に、該スラリーを循環的に効率良く使用
することができる。しかも、溝内をスラリーが良好に流
動して新しいものと適度に入れ換わるため、溝内に古い
スラリーが残留したままになったり、スラッジ等が溜り
易いといった問題も生じない。更に、研磨作業が終了し
た後の洗浄工程では、洗浄液を供給しながら定盤を加工
時とは逆方向に回転させることにより、溝内のスラリー
やスラッジ等を定盤の中心側から外周側に流動させて簡
単かつ完全に外部に排出することができる。
[0009] Therefore, the dispersing effect and the holding effect of the slurry are excellent, and the slurry can be used cyclically and efficiently. In addition, since the slurry flows satisfactorily in the groove and is appropriately replaced with a new one, there is no problem that old slurry remains in the groove or sludge or the like easily accumulates. Furthermore, in the cleaning process after the polishing operation is completed, the platen is rotated in the opposite direction to the processing while supplying the cleaning liquid, so that the slurry or sludge in the groove is moved from the center side of the platen to the outer peripheral side. It can be easily and completely discharged to the outside by flowing.

【0010】本発明において好ましくは、上記溝の溝幅
及び深さが全長にわたり均一に形成されると共に、パッ
ドの中心部に該溝の内端部に連なる液溜め用の窪みが形
成され、この窪みの径及び深さが上記溝の溝幅及び深さ
より大きく形成されていることである。
In the present invention, preferably, the groove width and depth of the groove are formed uniformly over the entire length, and a recess for a liquid reservoir is formed in the center of the pad and connected to the inner end of the groove. The diameter and the depth of the depression are formed to be larger than the groove width and the depth of the groove.

【0011】このように、溝の溝幅及び深さを均一にす
ると共に、パッドの中心部に窪みを形成することによ
り、スラリーの保持効果が向上すると共に、その流れが
円滑化して分散効果も向上する。
As described above, by making the width and depth of the grooves uniform and forming a depression in the center of the pad, the effect of holding the slurry is improved, and the flow is smoothed and the dispersion effect is also improved. improves.

【0012】[0012]

【発明の実施の形態】以下、本発明に係る研磨用パッド
の好ましい実施形態について図面を参照しながら説明す
る。図1及び図2は本発明のパッドの第1実施例を示す
もので、このパッド1は、例えばポリウレタンなどの合
成樹脂からなるスポンジ状素材や、ポリウレタン樹脂を
含浸したフェルト状素材等により、円形で均一厚さを有
するように形成されている。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Preferred embodiments of a polishing pad according to the present invention will be described below with reference to the drawings. 1 and 2 show a first embodiment of the pad of the present invention. This pad 1 is made of a sponge-like material made of a synthetic resin such as polyurethane, a felt-like material impregnated with a polyurethane resin, or the like. And has a uniform thickness.

【0013】上記パッド1の表面には、パッド中心部と
外周部とを結ぶ螺旋状の溝2が形成されている。この溝
2は、研磨加工時に研磨材スラリーを定盤表面に均一に
分散させる機能と効率良く滞留、保持させる機能とを有
するもので、該溝2の螺旋の向き、即ち、パッド1の外
周部に開口する溝の外端部2aからパッド中心側の溝内
端部2bに向かう螺旋の向きが、研磨時における定盤3
(図6参照)の回転方向Rとは逆向きとなるように形成
されている。該溝2の溝幅及び深さは全長にわたりほぼ
均一に形成することが望ましい。
On the surface of the pad 1, there is formed a spiral groove 2 connecting the central portion and the outer peripheral portion of the pad. The groove 2 has a function of uniformly dispersing the abrasive slurry on the surface of the surface plate during polishing and a function of efficiently retaining and holding the slurry. The spiral direction of the groove 2, that is, the outer peripheral portion of the pad 1 The direction of the spiral from the outer end 2a of the groove opening to the inner end 2b of the groove on the center side of the pad depends on the surface plate 3 during polishing.
(See FIG. 6). It is desirable that the groove width and depth of the groove 2 be formed substantially uniformly over the entire length.

【0014】上記溝2の断面形状は、図3に示すような
均一幅の凹字形又はU字形であっても、図4に示すよう
な溝底側の溝幅が広い鳩尾形であっても、図5に示すよ
うなV字形であっても、あるいはその他の形状であって
も良い。
The cross-sectional shape of the groove 2 may be a concave shape or a U-shape having a uniform width as shown in FIG. 3, or a dovetail shape having a wide groove width at the groove bottom side as shown in FIG. 5, a V-shape as shown in FIG. 5, or other shapes.

【0015】また、上記パッド1の中心部には、上記溝
2の内端部2bに連なる円形の窪み3が形成されてい
る。この窪み3は、研磨材スラリーを供給する際のスラ
リー受けとして機能すると共に、供給されたスラリーを
一時的に滞留させるための液溜めとして機能するもの
で、その径D及び深さHは上記溝2の溝幅d及び深さh
より大きく形成されている。この窪み3の直径Dの好ま
しい大きさは、パッド1(従って定盤4)の大きさによ
っても異なるが、一般にはパッド直径の1/5〜1/6
程度であることが望ましい。
In the center of the pad 1, there is formed a circular depression 3 connected to the inner end 2b of the groove 2. The recess 3 functions as a slurry receiver for supplying the abrasive slurry, and also functions as a liquid reservoir for temporarily retaining the supplied slurry. 2 groove width d and depth h
It is formed larger. The preferred size of the diameter D of the depression 3 varies depending on the size of the pad 1 (therefore, the platen 4), but generally, 1/5 to 1/6 of the pad diameter.
Desirably.

【0016】上記パッド1は、図6に示すように定盤4
の表面にそれを貼り付け、回転する該定盤4の表面にワ
ークWを加圧プレート等により押し付けて、該定盤4の
中心の窪み3の位置にノズル5から研磨材スラリー6を
供給しながら上記ワークWを研磨する。
As shown in FIG. 6, the pad 1 is
The workpiece W is pressed against the rotating surface of the surface plate 4 by a pressure plate or the like, and the abrasive slurry 6 is supplied from the nozzle 5 to the position of the depression 3 at the center of the surface plate 4. The work W is ground while polishing.

【0017】このとき、定盤4の中心に供給された研磨
材スラリー6は、定盤4の回転による遠心力の作用によ
って該定盤4の外周方向に放射状に流動し、溝2内に流
れ込んだり該溝2から溢れ出したりしながら該溝2を横
切って定盤の外周に到達し、外部に流出するが、上記溝
2の螺旋の向き、即ち定盤5の外周部から中心部に向か
う螺旋の向きが、該定盤4の回転方向とは逆向きである
ため、該溝2内に流れ込んだ一部のスラリーは、求心力
の作用により該溝2内を定盤4の中心に向かって流れて
いき、一部は途中で溝から溢れるが、残りのスラリーは
窪み3内に流れ込んだあと周囲に溢れ出し、新たに供給
されたスラリー6と一緒になって再び上述したスラリー
の流れを形成する。
At this time, the abrasive slurry 6 supplied to the center of the platen 4 radially flows toward the outer periphery of the platen 4 by the action of centrifugal force due to the rotation of the platen 4 and flows into the groove 2. While spilling out of the groove 2, it crosses the groove 2 to reach the outer periphery of the surface plate and flows out. However, the direction of the spiral of the groove 2, that is, from the outer periphery of the surface plate 5 toward the center portion. Since the direction of the helix is opposite to the direction of rotation of the platen 4, some of the slurry flowing into the groove 2 moves toward the center of the platen 4 in the groove 2 by the action of centripetal force. While flowing, a part of the slurry overflows from the groove on the way, but the remaining slurry overflows to the surroundings after flowing into the depression 3, and together with the newly supplied slurry 6, forms the above-mentioned slurry flow again. I do.

【0018】このため、供給されたスラリー6が直ちに
定盤4の外周方向に流れて外部に一気に流出することが
なく、ゆっくり拡散しながら流動してその一部が循環的
に再使用されるため、分散効果及び保持効果に優れる。
しかも、溝2内をスラリーが良好に流動して新しいもの
と適度に入れ換わるため、該溝2内に古いスラリーが残
留したままになったり、スラッジ等が溜り易いといった
問題も生じない。
Therefore, the supplied slurry 6 does not immediately flow in the outer peripheral direction of the platen 4 and does not flow out to the outside at once, but flows slowly while diffusing, and a part of the slurry 6 is reused cyclically. Excellent dispersing and holding effects.
In addition, since the slurry flows well in the groove 2 and is appropriately replaced with new slurry, there is no problem that the old slurry remains in the groove 2 or sludge or the like easily accumulates.

【0019】更に、研磨作業が終了した後に定盤4を洗
浄する工程で、水等の洗浄液を供給しながら該定盤4を
加工時とは逆方向に回転させることにより、溝2内のス
ラリーやスラッジ等を定盤4の中心側から外周側に流動
させて開口する外端部2aから外部に簡単かつ完全に排
出することができる。
Further, in the step of cleaning the platen 4 after the polishing operation is completed, the platen 4 is rotated in a direction opposite to the direction of processing while supplying a cleaning liquid such as water, so that the slurry in the groove 2 is rotated. The sludge and the like can be easily and completely discharged to the outside from the open outer end 2a by flowing from the center of the surface plate 4 to the outer periphery.

【0020】上記第1実施例のパッド1は1本の溝2を
備えているが、溝の数は2本又は3本以上の複数本であ
っても良く、図7には2本の溝2A,2Bを備えた第2
実施例のパッド1Aが示されている。このように複数の
溝を設ける場合には、図示したように各溝2A,2Bを
パッド1Aの中心に対して対称をなすように設けること
が望ましい。また、複数本の溝の断面形状は互いに同じ
であっても、異なっていても良い。
Although the pad 1 of the first embodiment has one groove 2, the number of grooves may be two or more than three, and FIG. 7 shows two grooves. 2nd with 2A, 2B
An example pad 1A is shown. When a plurality of grooves are provided in this manner, it is desirable to provide the grooves 2A and 2B symmetrically with respect to the center of the pad 1A as shown. Further, the cross-sectional shapes of the plurality of grooves may be the same or different.

【0021】[0021]

【発明の効果】このように本発明によれば、研磨工程で
は研磨材スラリーの分散効果及び保持効果に優れ、洗浄
工程では溝内のスラリーやスラッジ等を簡単に洗い流す
ことができる、使用性に優れた研磨用パッドを得ること
ができる。
As described above, according to the present invention, the polishing step is excellent in the effect of dispersing and retaining the abrasive slurry, and in the cleaning step, the slurry and sludge in the groove can be easily washed away. An excellent polishing pad can be obtained.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明に係るパッドの第1実施例を示す平面図
である。
FIG. 1 is a plan view showing a first embodiment of a pad according to the present invention.

【図2】図1のパッドの拡大断面図である。FIG. 2 is an enlarged sectional view of the pad of FIG.

【図3】溝の断面形状の一例を示すパッドの要部拡大断
面図である。
FIG. 3 is an enlarged sectional view of a main part of a pad showing an example of a sectional shape of a groove.

【図4】溝の断面形状の他の例を示すパッドの要部拡大
断面図である。
FIG. 4 is an enlarged sectional view of a main part of a pad showing another example of a sectional shape of a groove.

【図5】溝の断面形状の更に他の例を示すパッドの要部
拡大断面図である。
FIG. 5 is an enlarged sectional view of a main part of a pad showing still another example of a sectional shape of a groove.

【図6】上記パッドの使用状態を概念的に示す側面図で
ある。
FIG. 6 is a side view conceptually showing a use state of the pad.

【図7】本発明に係るパッドの第2実施例を示す平面図
である。
FIG. 7 is a plan view showing a second embodiment of the pad according to the present invention.

【符号の説明】[Explanation of symbols]

1,1A パッド 2,2A,2B 溝 2a 外端部 2b 内端部 3 窪み 4 定盤 6 スラリー W ワーク R 定盤の回転方向 D 窪みの径 H 窪みの深さ d 溝幅 h 溝の深さ 1, 1A pad 2, 2A, 2B groove 2a outer end 2b inner end 3 depression 4 surface plate 6 slurry W work R surface direction of rotation D direction of depression H depth of depression d groove width h depth of groove

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】定盤に貼り付けてワークの研磨に使用する
円形の研磨用パッドであって、表面にパッドの中心部と
外周部とを結ぶ螺旋状の溝を少なくとも1本有し、この
溝のパッド外周部から中心部に向かう螺旋の向きが、研
磨時における定盤の回転方向とは逆向きであることを特
徴とする研磨用パッド。
1. A circular polishing pad which is attached to a surface plate and used for polishing a work, the surface of the polishing pad having at least one spiral groove connecting a center portion and an outer peripheral portion of the pad. A polishing pad, wherein a direction of a spiral from a pad outer peripheral portion to a central portion of the groove is opposite to a rotation direction of a surface plate during polishing.
【請求項2】請求項1に記載の研磨用パッドにおいて、
上記溝の溝幅及び深さが全長にわたり均一に形成される
と共に、パッドの中心部に該溝の内端部に連なる液溜め
用の窪みが形成され、この窪みの径及び深さが上記溝の
溝幅及び深さより大きく形成されていることを特徴とす
るもの。
2. The polishing pad according to claim 1, wherein
The groove width and depth of the groove are formed uniformly over the entire length, and a recess for a liquid reservoir is formed in the center of the pad and connected to the inner end of the groove. Characterized by being formed to be larger than the groove width and depth.
JP19197199A 1999-07-06 1999-07-06 Polishing pad Pending JP2001018163A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19197199A JP2001018163A (en) 1999-07-06 1999-07-06 Polishing pad

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19197199A JP2001018163A (en) 1999-07-06 1999-07-06 Polishing pad

Publications (1)

Publication Number Publication Date
JP2001018163A true JP2001018163A (en) 2001-01-23

Family

ID=16283497

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19197199A Pending JP2001018163A (en) 1999-07-06 1999-07-06 Polishing pad

Country Status (1)

Country Link
JP (1) JP2001018163A (en)

Cited By (18)

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WO2006003697A1 (en) * 2004-06-30 2006-01-12 Toho Engineering Kabushiki Kaisha Grinding pad and method of producing the same
CN100341666C (en) * 2003-04-29 2007-10-10 Cmp罗姆和哈斯电子材料控股公司 Polishing pad with optimized grooves and method of using same
JP2007268658A (en) * 2006-03-31 2007-10-18 Tmp Co Ltd Polishing sheet and polishing method
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CN103878685A (en) * 2014-03-06 2014-06-25 浙江工业大学 Variable-granularity spiral grinding disc
CN107953243A (en) * 2017-11-30 2018-04-24 南京航空航天大学 A kind of polishing pad of quick chip removal
CN108555700A (en) * 2018-05-16 2018-09-21 福建北电新材料科技有限公司 A kind of polishing process of silicon carbide wafer
US11471999B2 (en) 2017-07-26 2022-10-18 Applied Materials, Inc. Integrated abrasive polishing pads and manufacturing methods
US11524384B2 (en) 2017-08-07 2022-12-13 Applied Materials, Inc. Abrasive delivery polishing pads and manufacturing methods thereof
US11685014B2 (en) 2018-09-04 2023-06-27 Applied Materials, Inc. Formulations for advanced polishing pads
US11724362B2 (en) 2014-10-17 2023-08-15 Applied Materials, Inc. Polishing pads produced by an additive manufacturing process
US11745302B2 (en) 2014-10-17 2023-09-05 Applied Materials, Inc. Methods and precursor formulations for forming advanced polishing pads by use of an additive manufacturing process
US11772229B2 (en) 2016-01-19 2023-10-03 Applied Materials, Inc. Method and apparatus for forming porous advanced polishing pads using an additive manufacturing process
US11958162B2 (en) 2014-10-17 2024-04-16 Applied Materials, Inc. CMP pad construction with composite material properties using additive manufacturing processes
US11964359B2 (en) 2015-10-30 2024-04-23 Applied Materials, Inc. Apparatus and method of forming a polishing article that has a desired zeta potential
US11986922B2 (en) 2015-11-06 2024-05-21 Applied Materials, Inc. Techniques for combining CMP process tracking data with 3D printed CMP consumables
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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100341666C (en) * 2003-04-29 2007-10-10 Cmp罗姆和哈斯电子材料控股公司 Polishing pad with optimized grooves and method of using same
KR101093059B1 (en) * 2003-04-29 2011-12-13 롬 앤드 하스 일렉트로닉 머티리얼스 씨엠피 홀딩스 인코포레이티드 Polishing pads with optimized grooves and forming methods thereof
WO2006003697A1 (en) * 2004-06-30 2006-01-12 Toho Engineering Kabushiki Kaisha Grinding pad and method of producing the same
JP2011240482A (en) * 2005-07-25 2011-12-01 Hoya Corp Method for manufacturing substrate for mask blank, method for manufacturing mask blank, and method for manufacturing mask
JP2007268658A (en) * 2006-03-31 2007-10-18 Tmp Co Ltd Polishing sheet and polishing method
JP2014008577A (en) * 2012-06-29 2014-01-20 Fujibo Holdings Inc Abrasive pad and manufacturing method of the same
CN103878685A (en) * 2014-03-06 2014-06-25 浙江工业大学 Variable-granularity spiral grinding disc
US11958162B2 (en) 2014-10-17 2024-04-16 Applied Materials, Inc. CMP pad construction with composite material properties using additive manufacturing processes
US11724362B2 (en) 2014-10-17 2023-08-15 Applied Materials, Inc. Polishing pads produced by an additive manufacturing process
US11745302B2 (en) 2014-10-17 2023-09-05 Applied Materials, Inc. Methods and precursor formulations for forming advanced polishing pads by use of an additive manufacturing process
US12023853B2 (en) 2014-10-17 2024-07-02 Applied Materials, Inc. Polishing articles and integrated system and methods for manufacturing chemical mechanical polishing articles
US11964359B2 (en) 2015-10-30 2024-04-23 Applied Materials, Inc. Apparatus and method of forming a polishing article that has a desired zeta potential
US11986922B2 (en) 2015-11-06 2024-05-21 Applied Materials, Inc. Techniques for combining CMP process tracking data with 3D printed CMP consumables
US11772229B2 (en) 2016-01-19 2023-10-03 Applied Materials, Inc. Method and apparatus for forming porous advanced polishing pads using an additive manufacturing process
US11471999B2 (en) 2017-07-26 2022-10-18 Applied Materials, Inc. Integrated abrasive polishing pads and manufacturing methods
US11980992B2 (en) 2017-07-26 2024-05-14 Applied Materials, Inc. Integrated abrasive polishing pads and manufacturing methods
US11524384B2 (en) 2017-08-07 2022-12-13 Applied Materials, Inc. Abrasive delivery polishing pads and manufacturing methods thereof
CN107953243A (en) * 2017-11-30 2018-04-24 南京航空航天大学 A kind of polishing pad of quick chip removal
CN108555700A (en) * 2018-05-16 2018-09-21 福建北电新材料科技有限公司 A kind of polishing process of silicon carbide wafer
US11685014B2 (en) 2018-09-04 2023-06-27 Applied Materials, Inc. Formulations for advanced polishing pads

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