JP2000035677A - Aligner - Google Patents
AlignerInfo
- Publication number
- JP2000035677A JP2000035677A JP10219809A JP21980998A JP2000035677A JP 2000035677 A JP2000035677 A JP 2000035677A JP 10219809 A JP10219809 A JP 10219809A JP 21980998 A JP21980998 A JP 21980998A JP 2000035677 A JP2000035677 A JP 2000035677A
- Authority
- JP
- Japan
- Prior art keywords
- photomask
- exposure
- cylindrical
- light
- light source
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000001678 irradiating effect Effects 0.000 claims abstract 2
- 238000000034 method Methods 0.000 claims description 3
- 230000003287 optical effect Effects 0.000 claims description 3
- 230000002093 peripheral effect Effects 0.000 claims description 2
- 239000000428 dust Substances 0.000 description 5
- 239000000463 material Substances 0.000 description 3
- 230000007547 defect Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000007261 regionalization Effects 0.000 description 1
Landscapes
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Abstract
Description
【0001】[0001]
【発明の属する技術分野】この発明は、露光装置に関す
る。[0001] The present invention relates to an exposure apparatus.
【0002】[0002]
【従来の技術】プリント回路基板などを作成する際に、
回路パターン等を描いたフォトマスクを用い、ワーク側
に回路パターンを焼き付けて回路基板を作成する方法が
普及しており、そのための露光装置が種々使用されてい
る。2. Description of the Related Art When manufacturing a printed circuit board or the like,
2. Description of the Related Art A method of printing a circuit pattern on a work side using a photomask on which a circuit pattern or the like is drawn to form a circuit board has been widely used, and various exposure apparatuses have been used.
【0003】[0003]
【発明が解決しようとする課題】上記した従来の露光装
置において、例えばフープ材のような長尺の連続的なワ
ークに連続的なパターンを形成する際には、フォトマス
クに描かれた或一定のエリア毎に露光とワーク搬送を繰
り返しながら全体の露光を行うことになる。しかし、上
記した方法による露光の場合、隣同士の露光エリアの境
目のパターンの精度に問題が生じる。即ち、露光エリア
がわずかに重なったり、ギャップが生じた状態で露光が
行われることがあり、これがパターンの寸法的な不具合
として表れる問題がある。隣同士の露光エリアが重なら
ないよう或いはギャップが生じないように露光する事は
従来の装置では不可能であり、この点の改善が望まれて
いた。本発明は上記従来技術の欠点を改善することを目
的とする。In the above-described conventional exposure apparatus, when a continuous pattern is formed on a long continuous work such as a hoop material, a fixed pattern drawn on a photomask is required. The entire exposure is performed while repeating the exposure and the work transfer for each area. However, in the case of the exposure by the above-described method, a problem occurs in the accuracy of the pattern at the boundary between adjacent exposure areas. That is, exposure may be performed in a state where the exposure areas are slightly overlapped or a gap is generated, and this is a problem that appears as a dimensional defect of the pattern. It is impossible with a conventional apparatus to perform exposure so that adjacent exposure areas do not overlap or a gap does not occur, and improvement of this point has been desired. The present invention aims to remedy the disadvantages of the prior art.
【0004】[0004]
【課題を解決するための手段】上記目的を達成するため
に、本発明の露光装置は、円筒状のフォトマスクと、露
光対象物と、前記円筒状のフォトマスクと前記露光対象
物を同期させてフォトマスクを回転させ、露光対象物を
搬送させる駆動装置と、該円筒状のフォトマスク内に配
置され、前記円筒状のフォトマスクを透過して前記露光
対象物に光を照射する光源と、を備えたことを特徴とす
る。該円筒状のフォトマスクは、フォトマスク自体を円
筒状としても良いし、或いは露光波長透過性の材質で円
筒を形成し、該円筒にフィルム状のマスクを張り付ける
等種々の態様が可能である。フォトマスクと露光対象物
は接触させても良いし、或いは非接触でも良い。該円筒
内に設けられた光源には遮光カバーと光学系を設け、前
記円筒状のフォトマスクの側周面内側に向けて円筒長さ
方向に平行な線に沿って光を照射する、ように構成する
ことが望ましい。To achieve the above object, an exposure apparatus of the present invention synchronizes a cylindrical photomask, an object to be exposed, and the cylindrical photomask with the object to be exposed. A driving device for rotating the photomask and transporting the object to be exposed, and a light source disposed in the cylindrical photomask and transmitting light to the object to be exposed through the cylindrical photomask, It is characterized by having. The cylindrical photomask may be in various forms such as a photomask itself having a cylindrical shape, or a cylinder formed of a material that transmits the exposure wavelength, and a film-shaped mask attached to the cylinder. . The photomask and the object to be exposed may be in contact with each other or may not be in contact with each other. The light source provided in the cylinder is provided with a light-shielding cover and an optical system, and irradiates light along a line parallel to the cylinder length direction toward the inside of the side peripheral surface of the cylindrical photomask. It is desirable to configure.
【0005】[0005]
【発明の実施の形態】以下本発明の実施の形態を図面に
基づいて説明する。図1及び図2において、円筒状フォ
トマスク1は矢印方向に回転可能になっており、表面に
所定のマスクパターンが描かれている。円筒状の露光波
長透過材にフォトマスクを張り付けても良い。円筒状フ
ォトマスク1の下側にワークWが矢印方向に搬送される
ようになっている。ワークW表面には感光レジストが塗
布されており、円筒状フォトマスク1のマスクパターン
に応じて感光されるようになっている。円筒状フォトマ
スク1とワークWとは接触させても良いし、非接触とし
ても良い。円筒状フォトマスク1とワークWとは制御装
置20、駆動装置21、22から成るサーボ駆動機構に
より高精度に同期させて駆動されるように構成されてい
る。Embodiments of the present invention will be described below with reference to the drawings. 1 and 2, the cylindrical photomask 1 is rotatable in the direction of an arrow, and a predetermined mask pattern is drawn on the surface. A photomask may be attached to a cylindrical exposure wavelength transmitting material. The work W is transported in the direction of the arrow below the cylindrical photomask 1. A photosensitive resist is applied to the surface of the work W, and is exposed according to the mask pattern of the cylindrical photomask 1. The cylindrical photomask 1 and the workpiece W may be in contact with each other or may be non-contact. The cylindrical photomask 1 and the workpiece W are configured to be synchronously driven with high accuracy by a servo drive mechanism including a control device 20 and drive devices 21 and 22.
【0006】円筒状フォトマスク1の内部には露光光源
2が設けられ、露光周波数の光を照射するように構成さ
れている。露光光源2は円筒状フォトマスク1の回転軸
を通る径線上に円筒長さ方向ほぼ全体にわたって設けら
れている。露光光源2には反射板3が設けられ、露光光
源2の下側(ワークW側)に設けられたレンズ6へ光を
反射して平行光とするようになっている。レンズ6は露
光光源2の光路途中に設けられており、円筒状フォトマ
スク1の円筒長さ方向ほぼ全体にわたって設けられてお
り、円筒長さ方向に所定の面積を有する線条の光を照射
するようになっている。レンズ6は露光光源2の下側か
ら円筒状フォトマスク1とワークWが接触或いは最も近
接する位置の円筒状フォトマスク1内壁側の位置に達す
るように設けられており、該位置まで露光光源2からの
光を伝播するようになっている。この位置が露光位置E
となり、この露光位置Eに円筒状フォトマスク1の円筒
長さに応じた線条の露光部が形成されるようになってい
る。レンズ6は円筒状フォトマスク1の内壁に非接触に
近接するように構成されている。遮光カバー4は露光光
源2と反射板3を覆い、遮光カバー5はレンズ6を覆う
ようになっており、露光を露光位置E以外に漏洩させな
いように構成されている。遮光カバー5は円筒状フォト
マスク1の内壁に出来る限り近接させて非接触とし、ノ
イズ光の侵入を防ぐと共に円筒状フォトマスク1の回転
を阻害しないように構成している。An exposure light source 2 is provided inside a cylindrical photomask 1 so as to irradiate light of an exposure frequency. The exposure light source 2 is provided over substantially the entire length of the cylindrical photomask 1 on a radial line passing through the rotation axis of the cylindrical photomask 1. The exposure light source 2 is provided with a reflection plate 3 so that light is reflected to a lens 6 provided below the exposure light source 2 (on the side of the work W) to become parallel light. The lens 6 is provided in the middle of the optical path of the exposure light source 2, and is provided over substantially the entire length of the cylindrical photomask 1 in the cylindrical length direction, and irradiates linear light having a predetermined area in the cylindrical length direction. It has become. The lens 6 is provided from the lower side of the exposure light source 2 so as to reach a position on the inner wall side of the cylindrical photomask 1 where the cylindrical photomask 1 and the workpiece W are in contact with or closest to each other. Light from the light source. This position is the exposure position E
In this exposure position E, a linear exposure portion corresponding to the cylindrical length of the cylindrical photomask 1 is formed. The lens 6 is configured to approach the inner wall of the cylindrical photomask 1 in a non-contact manner. The light-shielding cover 4 covers the exposure light source 2 and the reflection plate 3, and the light-shielding cover 5 covers the lens 6, so that exposure is prevented from leaking to positions other than the exposure position E. The light-shielding cover 5 is arranged so as to be as close as possible to the inner wall of the cylindrical photomask 1 so as to be in non-contact, so as to prevent intrusion of noise light and not to hinder the rotation of the cylindrical photomask 1.
【0007】円筒状フォトマスク1にはゴミ取りローラ
7が接触し、またワークWにはゴミ取りローラ8が接触
してゴミ取りを行うようになっている。A dust removing roller 7 contacts the cylindrical photomask 1 and a dust removing roller 8 contacts the work W to remove dust.
【0008】以上の構成において、ワークWは矢印方向
に搬送し、これに同期して円筒状フォトマスク1が矢印
方向に回転する。そして、露光位置Eにおいて露光光源
2からの光により線条の露光が行われる。円筒状フォト
マスク1が1回転した後も連続的に次の回転が行われる
から、円筒状フォトマスク1に描かれたマスクパターン
を連続的にワークW上に焼き付けることが可能であり、
パターンとパターンのつなぎ目にギャップや重なりが生
ずることがなく、高精度に連続的なパターン形成が可能
である。In the above configuration, the work W is transported in the direction of the arrow, and the cylindrical photomask 1 rotates in the direction of the arrow in synchronization with the transfer. Then, at the exposure position E, the light from the exposure light source 2 is used to expose the line. Since the next rotation is performed continuously even after the cylindrical photomask 1 makes one rotation, it is possible to continuously print the mask pattern drawn on the cylindrical photomask 1 on the work W,
There is no gap or overlap at the joint between the patterns, and continuous pattern formation with high precision is possible.
【0009】なお、上記では、ワークWの片面にのみ露
光する装置を説明したが、図3に示すように、同一の構
成をワークWの表裏に設けてワークWの表裏に同時に露
光を行うように構成することも可能である。この実施形
態では制御装置20は駆動装置21、21’と駆動装置
22を同期させて運転する。In the above description, the apparatus for exposing only one side of the work W has been described. However, as shown in FIG. 3, the same configuration is provided on the front and back of the work W to simultaneously expose the front and back of the work W. It is also possible to configure. In this embodiment, the control device 20 operates the drive devices 21 and 21 ′ and the drive device 22 in synchronization.
【0010】[0010]
【発明の効果】以上説明したように本発明の露光装置に
よれば、パターンの連続的な露光を行え、従来のように
露光とワークWの搬送を間欠的に行うことがなく、その
ためパターンとパターンの間にギャップを生じたり、重
なりを生じることがない。その結果高精度の連続露光が
可能になる。As described above, according to the exposure apparatus of the present invention, continuous exposure of a pattern can be performed, and exposure and transfer of a work W are not performed intermittently as in the prior art. There is no gap or overlap between the patterns. As a result, continuous exposure with high precision becomes possible.
【図1】本発明の一実施形態を示す概略正面図。FIG. 1 is a schematic front view showing an embodiment of the present invention.
【図2】本発明の一実施形態を示す概略斜視図。FIG. 2 is a schematic perspective view showing one embodiment of the present invention.
【図3】本発明の他の実施形態を示す概略正面図。FIG. 3 is a schematic front view showing another embodiment of the present invention.
1:円筒状フォトマスク、2:露光光源、3:反射板、
4:遮光カバー、5:遮光カバー、6:レンズ、7:ゴ
ミ取りローラ、8:ゴミ取りローラ、20:制御装置、
21:駆動装置、22:駆動装置。1: cylindrical photomask, 2: exposure light source, 3: reflection plate,
4: light shielding cover, 5: light shielding cover, 6: lens, 7: dust removal roller, 8: dust removal roller, 20: control device,
21: drive device, 22: drive device.
Claims (2)
てフォトマスクを回転させ、露光対象物を搬送させる駆
動装置と、 該円筒状のフォトマスク内に配置され、前記円筒状のフ
ォトマスクを透過して前記露光対象物に光を照射する光
源と、 を備えたことを特徴とする露光装置。A cylindrical photomask; an exposure object; a driving device for rotating the photomask in synchronization with the cylindrical photomask and the exposure object and transporting the exposure object; A light source disposed in a photomask having a shape, and irradiating the exposure target with light through the cylindrical photomask.
し、前記円筒状のフォトマスクの側周面内側に向けて円
筒長さ方向に沿って光を照射する、ことを特徴とする請
求項1に記載の露光装置。2. The method according to claim 1, wherein the light source has a light-shielding cover and an optical system, and irradiates light along the length of the cylinder toward the inside of the side peripheral surface of the cylindrical photomask. Item 1. The exposure apparatus according to Item 1.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10219809A JP2000035677A (en) | 1998-07-17 | 1998-07-17 | Aligner |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10219809A JP2000035677A (en) | 1998-07-17 | 1998-07-17 | Aligner |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JP2000035677A true JP2000035677A (en) | 2000-02-02 |
Family
ID=16741383
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10219809A Pending JP2000035677A (en) | 1998-07-17 | 1998-07-17 | Aligner |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2000035677A (en) |
Cited By (39)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2002065215A3 (en) * | 2001-02-15 | 2003-10-09 | Sipix Imaging Inc | Process for roll-to-roll manufacture of a display by synchronized photolithographic exposure on a substrate web |
| US6751008B2 (en) | 2000-03-03 | 2004-06-15 | Sipix Imaging, Inc. | Electrophoretic display and novel process for its manufacture |
| US6784953B2 (en) | 2001-01-11 | 2004-08-31 | Sipix Imaging, Inc. | Transmissive or reflective liquid crystal display and novel process for its manufacture |
| US6795229B2 (en) | 2001-08-28 | 2004-09-21 | Sipix Imaging, Inc. | Electrophoretic display with sub relief structure for high contrast ratio and improved shear and/or compression resistance |
| US6829078B2 (en) | 2000-03-03 | 2004-12-07 | Sipix Imaging Inc. | Electrophoretic display and novel process for its manufacture |
| US6831770B2 (en) | 2000-03-03 | 2004-12-14 | Sipix Imaging, Inc. | Electrophoretic display and novel process for its manufacture |
| US6833943B2 (en) | 2000-03-03 | 2004-12-21 | Sipix Imaging, Inc. | Electrophoretic display and novel process for its manufacture |
| US6850355B2 (en) | 2001-07-27 | 2005-02-01 | Sipix Imaging, Inc. | Electrophoretic display with color filters |
| US6865012B2 (en) | 2000-03-03 | 2005-03-08 | Sipix Imaging, Inc. | Electrophoretic display and novel process for its manufacture |
| US6885495B2 (en) | 2000-03-03 | 2005-04-26 | Sipix Imaging Inc. | Electrophoretic display with in-plane switching |
| JP2005215686A (en) * | 2004-02-02 | 2005-08-11 | Lg Electron Inc | Exposure apparatus |
| US6933098B2 (en) | 2000-01-11 | 2005-08-23 | Sipix Imaging Inc. | Process for roll-to-roll manufacture of a display by synchronized photolithographic exposure on a substrate web |
| US6947202B2 (en) | 2000-03-03 | 2005-09-20 | Sipix Imaging, Inc. | Electrophoretic display with sub relief structure for high contrast ratio and improved shear and/or compression resistance |
| US6987605B2 (en) | 2000-03-03 | 2006-01-17 | Sipix Imaging, Inc. | Transflective electrophoretic display |
| US7052571B2 (en) | 2000-03-03 | 2006-05-30 | Sipix Imaging, Inc. | Electrophoretic display and process for its manufacture |
| JP2006178111A (en) * | 2004-12-21 | 2006-07-06 | Asahi Kasei Chemicals Corp | Cylindrical mask construction |
| US7112114B2 (en) | 2000-03-03 | 2006-09-26 | Sipix Imaging, Inc. | Electrophoretic display and process for its manufacture |
| US7141279B2 (en) | 2002-11-25 | 2006-11-28 | Sipix Imaging, Inc. | Transmissive or reflective liquid crystal display and novel process for its manufacture |
| US7233429B2 (en) | 2000-03-03 | 2007-06-19 | Sipix Imaging, Inc. | Electrophoretic display |
| JP2008015085A (en) * | 2006-07-04 | 2008-01-24 | Asahi Kasei Chemicals Corp | Cylindrical mask construction |
| JP2008076650A (en) * | 2006-09-20 | 2008-04-03 | Nikon Corp | Mask, exposure apparatus, exposure method, and device manufacturing method |
| US7408696B2 (en) | 2000-03-03 | 2008-08-05 | Sipix Imaging, Inc. | Three-dimensional electrophoretic displays |
| US7557981B2 (en) | 2000-03-03 | 2009-07-07 | Sipix Imaging, Inc. | Electrophoretic display and process for its manufacture |
| US7715088B2 (en) | 2000-03-03 | 2010-05-11 | Sipix Imaging, Inc. | Electrophoretic display |
| US8023071B2 (en) | 2002-11-25 | 2011-09-20 | Sipix Imaging, Inc. | Transmissive or reflective liquid crystal display |
| US8282762B2 (en) | 2001-01-11 | 2012-10-09 | Sipix Imaging, Inc. | Transmissive or reflective liquid crystal display and process for its manufacture |
| US8582197B2 (en) | 2000-03-03 | 2013-11-12 | Sipix Imaging, Inc. | Process for preparing a display panel |
| JP2014501934A (en) * | 2010-08-23 | 2014-01-23 | ローイス インコーポレイテッド | Mask for near-field lithography and method of manufacturing the same |
| WO2014038795A1 (en) * | 2012-09-10 | 2014-03-13 | 경북대학교 산학협력단 | Light-exposure device and substrate treatment device using same |
| KR101405250B1 (en) * | 2012-11-26 | 2014-06-17 | 경북대학교 산학협력단 | Lithography device and apparatus for treating substrate employing the same |
| KR101405251B1 (en) * | 2012-09-10 | 2014-06-17 | 경북대학교 산학협력단 | Lithography and apparatus for processing substrate using the same |
| CN104105352A (en) * | 2014-06-24 | 2014-10-15 | 上海英内电子标签有限公司 | Manufacturing method of aluminum etching flexible circuit board |
| JP2015501949A (en) * | 2011-12-01 | 2015-01-19 | エルジー・ケム・リミテッド | mask |
| JP2016197241A (en) * | 2011-11-04 | 2016-11-24 | 株式会社ニコン | Pattern forming method and device |
| KR20170051695A (en) * | 2015-10-30 | 2017-05-12 | 주식회사 잉크테크 | Manufacturing Method for FPCB and Manufacturing Apparatus for FPCB |
| JP2018081321A (en) * | 2013-04-18 | 2018-05-24 | 株式会社ニコン | Scanning exposure equipment |
| JP2018081320A (en) * | 2013-04-30 | 2018-05-24 | 株式会社ニコン | Cylindrical mask and exposure method |
| WO2021010370A1 (en) * | 2019-07-12 | 2021-01-21 | 株式会社ニコン | Substrate processing method, pattern forming method, and substrate processing system |
| CN116360219A (en) * | 2021-12-21 | 2023-06-30 | 宁德时代新能源科技股份有限公司 | Exposure device |
-
1998
- 1998-07-17 JP JP10219809A patent/JP2000035677A/en active Pending
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|---|---|---|---|---|
| US6933098B2 (en) | 2000-01-11 | 2005-08-23 | Sipix Imaging Inc. | Process for roll-to-roll manufacture of a display by synchronized photolithographic exposure on a substrate web |
| US7557981B2 (en) | 2000-03-03 | 2009-07-07 | Sipix Imaging, Inc. | Electrophoretic display and process for its manufacture |
| US6751008B2 (en) | 2000-03-03 | 2004-06-15 | Sipix Imaging, Inc. | Electrophoretic display and novel process for its manufacture |
| US7408696B2 (en) | 2000-03-03 | 2008-08-05 | Sipix Imaging, Inc. | Three-dimensional electrophoretic displays |
| US7522332B2 (en) | 2000-03-03 | 2009-04-21 | Sipix Imaging, Inc. | Electrophoretic display and process for its manufacture |
| US6829078B2 (en) | 2000-03-03 | 2004-12-07 | Sipix Imaging Inc. | Electrophoretic display and novel process for its manufacture |
| US6831770B2 (en) | 2000-03-03 | 2004-12-14 | Sipix Imaging, Inc. | Electrophoretic display and novel process for its manufacture |
| US6833943B2 (en) | 2000-03-03 | 2004-12-21 | Sipix Imaging, Inc. | Electrophoretic display and novel process for its manufacture |
| US7715088B2 (en) | 2000-03-03 | 2010-05-11 | Sipix Imaging, Inc. | Electrophoretic display |
| US6859302B2 (en) | 2000-03-03 | 2005-02-22 | Sipix Imaging, Inc. | Electrophoretic display and novel process for its manufacture |
| US6865012B2 (en) | 2000-03-03 | 2005-03-08 | Sipix Imaging, Inc. | Electrophoretic display and novel process for its manufacture |
| US6867898B2 (en) | 2000-03-03 | 2005-03-15 | Sipix Imaging Inc. | Electrophoretic display and novel process for its manufacture |
| US6885495B2 (en) | 2000-03-03 | 2005-04-26 | Sipix Imaging Inc. | Electrophoretic display with in-plane switching |
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