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IT7969294A0 - DISTANCE VARIATIONS INTERFEROMETRIC DEVICE FOR MEASURING DISTANCES AND - Google Patents

DISTANCE VARIATIONS INTERFEROMETRIC DEVICE FOR MEASURING DISTANCES AND

Info

Publication number
IT7969294A0
IT7969294A0 IT7969294A IT6929479A IT7969294A0 IT 7969294 A0 IT7969294 A0 IT 7969294A0 IT 7969294 A IT7969294 A IT 7969294A IT 6929479 A IT6929479 A IT 6929479A IT 7969294 A0 IT7969294 A0 IT 7969294A0
Authority
IT
Italy
Prior art keywords
measuring distances
interferometric device
distance variations
variations
distance
Prior art date
Application number
IT7969294A
Other languages
Italian (it)
Other versions
IT1119514B (en
Inventor
Werner Krieg
Original Assignee
Jenoptik Jena Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jenoptik Jena Gmbh filed Critical Jenoptik Jena Gmbh
Publication of IT7969294A0 publication Critical patent/IT7969294A0/en
Application granted granted Critical
Publication of IT1119514B publication Critical patent/IT1119514B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/02056—Passive reduction of errors
    • G01B9/02061—Reduction or prevention of effects of tilts or misalignment
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
    • G01B9/02002—Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies
    • G01B9/02003—Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies using beat frequencies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
    • G01B9/02012—Interferometers characterised by controlling or generating intrinsic radiation properties using temporal intensity variation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02041—Interferometers characterised by particular imaging or detection techniques
    • G01B9/02045—Interferometers characterised by particular imaging or detection techniques using the Doppler effect
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/15—Cat eye, i.e. reflection always parallel to incoming beam

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optical Radar Systems And Details Thereof (AREA)
  • Length Measuring Devices By Optical Means (AREA)
IT69294/79A 1978-11-27 1979-11-27 INTERFEROMETRIC DEVICE FOR THE MEASUREMENT OF DISTANCES AND VARIATIONS OF DISTANCE IT1119514B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DD20932678A DD139760B1 (en) 1978-11-27 1978-11-27 INTERFEROMETRIC EQUIPMENT FOR MEASURING SPACES AND DISTANCE CHANGES

Publications (2)

Publication Number Publication Date
IT7969294A0 true IT7969294A0 (en) 1979-11-27
IT1119514B IT1119514B (en) 1986-03-10

Family

ID=5515499

Family Applications (1)

Application Number Title Priority Date Filing Date
IT69294/79A IT1119514B (en) 1978-11-27 1979-11-27 INTERFEROMETRIC DEVICE FOR THE MEASUREMENT OF DISTANCES AND VARIATIONS OF DISTANCE

Country Status (4)

Country Link
DD (1) DD139760B1 (en)
DE (1) DE2938079A1 (en)
IT (1) IT1119514B (en)
SU (1) SU1037063A1 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL8005258A (en) * 1980-09-22 1982-04-16 Philips Nv INTERFEROMETER.
AT399222B (en) * 1992-10-19 1995-04-25 Tabarelli Werner INTERFEROMETRIC DEVICE FOR MEASURING THE POSITION OF A REFLECTIVE OBJECT
DE102016013550B3 (en) 2016-11-08 2018-04-19 Rolf Klöden Profile measuring system for roughness and contour measurement on a surface of a workpiece

Also Published As

Publication number Publication date
SU1037063A1 (en) 1983-08-23
DD139760A1 (en) 1980-01-16
IT1119514B (en) 1986-03-10
DE2938079A1 (en) 1980-06-04
DD139760B1 (en) 1980-12-10

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