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IT1148818B - Processo per la formazione di sottili pellicole metalliche - Google Patents

Processo per la formazione di sottili pellicole metalliche

Info

Publication number
IT1148818B
IT1148818B IT21315/80A IT2131580A IT1148818B IT 1148818 B IT1148818 B IT 1148818B IT 21315/80 A IT21315/80 A IT 21315/80A IT 2131580 A IT2131580 A IT 2131580A IT 1148818 B IT1148818 B IT 1148818B
Authority
IT
Italy
Prior art keywords
formation
thin metallic
metallic films
films
thin
Prior art date
Application number
IT21315/80A
Other languages
English (en)
Other versions
IT8021315A0 (it
Inventor
Laura Beth Rothman
Paul Anthony Totta
James Francis White
Original Assignee
Ibm
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ibm filed Critical Ibm
Publication of IT8021315A0 publication Critical patent/IT8021315A0/it
Application granted granted Critical
Publication of IT1148818B publication Critical patent/IT1148818B/it

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00Field-effect transistors [FET]
    • H10D30/01Manufacture or treatment
    • H10D30/061Manufacture or treatment of FETs having Schottky gates
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/027Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
    • H01L21/0271Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers
    • H01L21/0272Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers for lift-off processes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/28Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/28Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
    • H01L21/283Deposition of conductive or insulating materials for electrodes conducting electric current
    • H01L21/285Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation
    • H01L21/28506Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers
    • H01L21/28512Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers on semiconductor bodies comprising elements of Group IV of the Periodic Table
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/482Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of lead-in layers inseparably applied to the semiconductor body (electrodes)
    • H01L23/485Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of lead-in layers inseparably applied to the semiconductor body (electrodes) consisting of layered constructions comprising conductive layers and insulating layers, e.g. planar contacts
    • H01L23/4855Overhang structure
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/80Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
    • H10D62/83Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being Group IV materials, e.g. B-doped Si or undoped Ge
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/095Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00 with a principal constituent of the material being a combination of two or more materials provided in the groups H01L2924/013 - H01L2924/0715
    • H01L2924/097Glass-ceramics, e.g. devitrified glass
    • H01L2924/09701Low temperature co-fired ceramic [LTCC]
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S438/00Semiconductor device manufacturing: process
    • Y10S438/942Masking
    • Y10S438/948Radiation resist
    • Y10S438/951Lift-off

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Weting (AREA)
IT21315/80A 1979-05-29 1980-04-11 Processo per la formazione di sottili pellicole metalliche IT1148818B (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/043,416 US4272561A (en) 1979-05-29 1979-05-29 Hybrid process for SBD metallurgies

Publications (2)

Publication Number Publication Date
IT8021315A0 IT8021315A0 (it) 1980-04-11
IT1148818B true IT1148818B (it) 1986-12-03

Family

ID=21927069

Family Applications (1)

Application Number Title Priority Date Filing Date
IT21315/80A IT1148818B (it) 1979-05-29 1980-04-11 Processo per la formazione di sottili pellicole metalliche

Country Status (6)

Country Link
US (1) US4272561A (it)
EP (1) EP0019781B1 (it)
JP (1) JPS606537B2 (it)
CA (1) CA1126629A (it)
DE (1) DE3071901D1 (it)
IT (1) IT1148818B (it)

Families Citing this family (37)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4371423A (en) * 1979-09-04 1983-02-01 Vlsi Technology Research Association Method of manufacturing semiconductor device utilizing a lift-off technique
DE3005733A1 (de) * 1980-02-15 1981-08-20 Siemens AG, 1000 Berlin und 8000 München Verfahren zur herstellung einer halbleiteranordnung und nach diesem verfahren hergestellte halbleiteranordnung
US4351892A (en) * 1981-05-04 1982-09-28 Fairchild Camera & Instrument Corp. Alignment target for electron-beam write system
US4396458A (en) * 1981-12-21 1983-08-02 International Business Machines Corporation Method for forming planar metal/insulator structures
JPS592352A (ja) * 1982-06-28 1984-01-07 Toshiba Corp 半導体装置の製造方法
US4400257A (en) * 1982-12-21 1983-08-23 Rca Corporation Method of forming metal lines
US4562091A (en) * 1982-12-23 1985-12-31 International Business Machines Corporation Use of plasma polymerized orgaosilicon films in fabrication of lift-off masks
US4493855A (en) * 1982-12-23 1985-01-15 International Business Machines Corporation Use of plasma polymerized organosilicon films in fabrication of lift-off masks
US4539222A (en) * 1983-11-30 1985-09-03 International Business Machines Corporation Process for forming metal patterns wherein metal is deposited on a thermally depolymerizable polymer and selectively removed
JPS60138940A (ja) * 1983-12-27 1985-07-23 Toshiba Corp 半導体装置の製造方法
US4519872A (en) * 1984-06-11 1985-05-28 International Business Machines Corporation Use of depolymerizable polymers in the fabrication of lift-off structure for multilevel metal processes
US4640738A (en) * 1984-06-22 1987-02-03 International Business Machines Corporation Semiconductor contact protection
US4641420A (en) * 1984-08-30 1987-02-10 At&T Bell Laboratories Metalization process for headless contact using deposited smoothing material
JPS61249481A (ja) * 1985-04-30 1986-11-06 デンカ製薬株式会社 繰返し使用できる肩こり治療具
JPS61249480A (ja) * 1985-04-30 1986-11-06 デンカ製薬株式会社 衣類に貼着する肩こり治療具
JPS61182751U (it) * 1985-05-01 1986-11-14
JPS621030U (it) * 1985-06-17 1987-01-07
JPS621294U (it) * 1985-06-17 1987-01-07
JPS6237928A (ja) * 1985-08-13 1987-02-18 Matsushita Electronics Corp 金属パタ−ン形成方法
JPS6373660A (ja) * 1986-09-17 1988-04-04 Fujitsu Ltd 半導体装置
US4687541A (en) * 1986-09-22 1987-08-18 Rockwell International Corporation Dual deposition single level lift-off process
JPS6427567A (en) * 1987-07-22 1989-01-30 Matsushita Electric Works Ltd Blood circulation promoting apparatus
US5021840A (en) * 1987-08-18 1991-06-04 Texas Instruments Incorporated Schottky or PN diode with composite sidewall
US5132775A (en) * 1987-12-11 1992-07-21 Texas Instruments Incorporated Methods for and products having self-aligned conductive pillars on interconnects
US4835086A (en) * 1988-02-12 1989-05-30 Hoechst Celanese Corporation Polysulfone barrier layer for bi-level photoresists
US5316974A (en) * 1988-12-19 1994-05-31 Texas Instruments Incorporated Integrated circuit copper metallization process using a lift-off seed layer and a thick-plated conductor layer
US5057186A (en) * 1989-07-28 1991-10-15 At&T Bell Laboratories Method of taper-etching with photoresist adhesion layer
US5118584A (en) * 1990-06-01 1992-06-02 Eastman Kodak Company Method of producing microbump circuits for flip chip mounting
US5384283A (en) * 1993-12-10 1995-01-24 International Business Machines Corporation Resist protection of ball limiting metal during etch process
US5807766A (en) * 1995-09-21 1998-09-15 Mcbride; Donald G. Process for attaching a silicon chip to a circuit board using a block of encapsulated wires and the block of wires manufactured by the process
JP2004005923A (ja) * 2002-03-29 2004-01-08 Fujitsu Ltd 磁気ヘッドの製造方法および磁気ヘッド、パターン形成方法
US7129590B2 (en) * 2003-05-14 2006-10-31 Intel Corporation Stencil and method for depositing material onto a substrate
US20060076639A1 (en) * 2004-10-13 2006-04-13 Lypen William J Schottky diodes and methods of making the same
JP4588091B2 (ja) * 2008-02-29 2010-11-24 三洋電機株式会社 半導体モジュールの製造方法
US8349727B2 (en) * 2010-04-08 2013-01-08 Liang Guo Integrated method for high-density interconnection of electronic components through stretchable interconnects
US20150340611A1 (en) * 2014-05-21 2015-11-26 Sony Corporation Method for a dry exhumation without oxidation of a cell and source line
IT201700067128A1 (it) * 2017-06-16 2018-12-16 Sambusseti Antonio Rivestimento conduttivo

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2559389A (en) * 1942-04-02 1951-07-03 Keuffel & Esser Co Method of producing precision images
US3873361A (en) * 1973-11-29 1975-03-25 Ibm Method of depositing thin film utilizing a lift-off mask
US4004044A (en) * 1975-05-09 1977-01-18 International Business Machines Corporation Method for forming patterned films utilizing a transparent lift-off mask
US4088490A (en) * 1976-06-14 1978-05-09 International Business Machines Corporation Single level masking process with two positive photoresist layers
US4076575A (en) * 1976-06-30 1978-02-28 International Business Machines Corporation Integrated fabrication method of forming connectors through insulative layers
US4045318A (en) * 1976-07-30 1977-08-30 Rca Corporation Method of transferring a surface relief pattern from a poly(olefin sulfone) layer to a metal layer
US4070501A (en) * 1976-10-28 1978-01-24 Ibm Corporation Forming self-aligned via holes in thin film interconnection systems
US4092442A (en) * 1976-12-30 1978-05-30 International Business Machines Corporation Method of depositing thin films utilizing a polyimide mask
US4132586A (en) * 1977-12-20 1979-01-02 International Business Machines Corporation Selective dry etching of substrates

Also Published As

Publication number Publication date
DE3071901D1 (en) 1987-03-05
EP0019781B1 (en) 1987-01-28
EP0019781A2 (en) 1980-12-10
JPS606537B2 (ja) 1985-02-19
JPS55158630A (en) 1980-12-10
EP0019781A3 (en) 1983-08-03
US4272561A (en) 1981-06-09
IT8021315A0 (it) 1980-04-11
CA1126629A (en) 1982-06-29

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