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IN2013MU02485A - - Google Patents

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Publication number
IN2013MU02485A
IN2013MU02485A IN2485MU2013A IN2013MU02485A IN 2013MU02485 A IN2013MU02485 A IN 2013MU02485A IN 2485MU2013 A IN2485MU2013 A IN 2485MU2013A IN 2013MU02485 A IN2013MU02485 A IN 2013MU02485A
Authority
IN
India
Prior art keywords
switching
voltage
current
current versus
under test
Prior art date
Application number
Inventor
N H Sri Krishna
Kumar Patro Gajendra
Bal Abhinav
M N Gurushiddappa
Original Assignee
Tektronix Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tektronix Inc filed Critical Tektronix Inc
Priority to IN2485MU2013 priority Critical patent/IN2013MU02485A/en
Priority to US14/257,845 priority patent/US11181581B2/en
Priority to EP14178601.2A priority patent/EP2829883B1/en
Priority to JP2014152213A priority patent/JP6483368B2/en
Priority to CN201410359046.2A priority patent/CN104345193B/en
Publication of IN2013MU02485A publication Critical patent/IN2013MU02485A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/02—Arrangements for displaying electric variables or waveforms for displaying measured electric variables in digital form
    • G01R13/0218—Circuits therefor
    • G01R13/0236—Circuits therefor for presentation of more than one variable
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor
    • G01R31/2603—Apparatus or methods therefor for curve tracing of semiconductor characteristics, e.g. on oscilloscope
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2608—Circuits therefor for testing bipolar transistors
    • G01R31/2617—Circuits therefor for testing bipolar transistors for measuring switching properties thereof
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/16—Spectrum analysis; Fourier analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02M—APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF
    • H02M3/00—Conversion of DC power input into DC power output
    • H02M3/02—Conversion of DC power input into DC power output without intermediate conversion into AC
    • H02M3/04—Conversion of DC power input into DC power output without intermediate conversion into AC by static converters
    • H02M3/10—Conversion of DC power input into DC power output without intermediate conversion into AC by static converters using discharge tubes with control electrode or semiconductor devices with control electrode
    • H02M3/145—Conversion of DC power input into DC power output without intermediate conversion into AC by static converters using discharge tubes with control electrode or semiconductor devices with control electrode using devices of a triode or transistor type requiring continuous application of a control signal
    • H02M3/155—Conversion of DC power input into DC power output without intermediate conversion into AC by static converters using discharge tubes with control electrode or semiconductor devices with control electrode using devices of a triode or transistor type requiring continuous application of a control signal using semiconductor devices only
    • H02M3/156—Conversion of DC power input into DC power output without intermediate conversion into AC by static converters using discharge tubes with control electrode or semiconductor devices with control electrode using devices of a triode or transistor type requiring continuous application of a control signal using semiconductor devices only with automatic control of output voltage or current, e.g. switching regulators
    • H02M3/157—Conversion of DC power input into DC power output without intermediate conversion into AC by static converters using discharge tubes with control electrode or semiconductor devices with control electrode using devices of a triode or transistor type requiring continuous application of a control signal using semiconductor devices only with automatic control of output voltage or current, e.g. switching regulators with digital control

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

The disclosed technology relates to a method and apparatus for graphically displaying a switching cycle of a switching device. A switching voltage and a switching current are acquired for a device under test via a voltage probe and a current probe, respectively, for a plurality of switching cycles of the device under test. The switching current versus the switching voltage is plotted on a current versus voltage plot as a curve for each of the switching cycles. Each of the curves on the current versus voltage plot overlap each other and are displayed to a user.
IN2485MU2013 2013-07-26 2013-07-26 IN2013MU02485A (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
IN2485MU2013 IN2013MU02485A (en) 2013-07-26 2013-07-26
US14/257,845 US11181581B2 (en) 2013-07-26 2014-04-21 Switching loss measurement and plot in test and measurement instrument
EP14178601.2A EP2829883B1 (en) 2013-07-26 2014-07-25 Switching loss measurement and plot in test and measurement instrument
JP2014152213A JP6483368B2 (en) 2013-07-26 2014-07-25 Switching cycle display method and test measurement apparatus
CN201410359046.2A CN104345193B (en) 2013-07-26 2014-07-25 Switching loss measurement and drawing in test and sensing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IN2485MU2013 IN2013MU02485A (en) 2013-07-26 2013-07-26

Publications (1)

Publication Number Publication Date
IN2013MU02485A true IN2013MU02485A (en) 2015-09-25

Family

ID=51485423

Family Applications (1)

Application Number Title Priority Date Filing Date
IN2485MU2013 IN2013MU02485A (en) 2013-07-26 2013-07-26

Country Status (5)

Country Link
US (1) US11181581B2 (en)
EP (1) EP2829883B1 (en)
JP (1) JP6483368B2 (en)
CN (1) CN104345193B (en)
IN (1) IN2013MU02485A (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9465074B2 (en) * 2013-10-09 2016-10-11 Ford Global Technologies, Llc System and method for measuring switching loss associated with semiconductor switching devices
GB2563686A (en) * 2017-06-23 2018-12-26 Nidec Control Techniques Ltd Method and apparatus for monitoring a semiconductor switch
US11705894B2 (en) * 2019-08-27 2023-07-18 Keithley Instruments, Llc Pulsed high current technique for characterization of device under test
JP7413124B2 (en) * 2020-03-31 2024-01-15 横河電機株式会社 Waveform measuring device and recalculation method using the waveform measuring device
US12345755B2 (en) * 2021-11-01 2025-07-01 Tektronix, Inc. Reverse recovery measurements and plots
PL246146B1 (en) * 2022-10-28 2024-12-09 Univ Morski W Gdyni Method for measuring the turn-on and turn-off energy of insulated gate bipolar power transistors and a circuit for measuring the turn-on and turn-off energy of insulated gate bipolar power transistors
JP2025099022A (en) * 2023-12-21 2025-07-03 日置電機株式会社 Display device, impedance measuring device and display method

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Also Published As

Publication number Publication date
CN104345193B (en) 2019-07-16
CN104345193A (en) 2015-02-11
JP2015025807A (en) 2015-02-05
US20150032393A1 (en) 2015-01-29
US11181581B2 (en) 2021-11-23
EP2829883A1 (en) 2015-01-28
EP2829883B1 (en) 2020-03-25
JP6483368B2 (en) 2019-03-13

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