IN2012DE00237A - - Google Patents
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- Publication number
- IN2012DE00237A IN2012DE00237A IN237DE2012A IN2012DE00237A IN 2012DE00237 A IN2012DE00237 A IN 2012DE00237A IN 237DE2012 A IN237DE2012 A IN 237DE2012A IN 2012DE00237 A IN2012DE00237 A IN 2012DE00237A
- Authority
- IN
- India
- Prior art keywords
- light
- emitting element
- waveguide
- submount
- semiconductor light
- Prior art date
Links
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/22—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/022—Mountings; Housings
- H01S5/0235—Method for mounting laser chips
- H01S5/02375—Positioning of the laser chips
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S2301/00—Functional characteristics
- H01S2301/17—Semiconductor lasers comprising special layers
- H01S2301/176—Specific passivation layers on surfaces other than the emission facet
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/022—Mountings; Housings
- H01S5/0235—Method for mounting laser chips
- H01S5/02355—Fixing laser chips on mounts
- H01S5/0237—Fixing laser chips on mounts by soldering
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/026—Monolithically integrated components, e.g. waveguides, monitoring photo-detectors, drivers
- H01S5/0265—Intensity modulators
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/028—Coatings ; Treatment of the laser facets, e.g. etching, passivation layers or reflecting layers
- H01S5/0287—Facet reflectivity
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/04—Processes or apparatus for excitation, e.g. pumping, e.g. by electron beams
- H01S5/042—Electrical excitation ; Circuits therefor
- H01S5/0425—Electrodes, e.g. characterised by the structure
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/04—Processes or apparatus for excitation, e.g. pumping, e.g. by electron beams
- H01S5/042—Electrical excitation ; Circuits therefor
- H01S5/0425—Electrodes, e.g. characterised by the structure
- H01S5/04252—Electrodes, e.g. characterised by the structure characterised by the material
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
- H01S5/065—Mode locking; Mode suppression; Mode selection ; Self pulsating
- H01S5/0657—Mode locking, i.e. generation of pulses at a frequency corresponding to a roundtrip in the cavity
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/14—External cavity lasers
- H01S5/141—External cavity lasers using a wavelength selective device, e.g. a grating or etalon
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/305—Structure or shape of the active region; Materials used for the active region characterised by the doping materials used in the laser structure
- H01S5/3086—Structure or shape of the active region; Materials used for the active region characterised by the doping materials used in the laser structure doping of the active layer
- H01S5/309—Structure or shape of the active region; Materials used for the active region characterised by the doping materials used in the laser structure doping of the active layer doping of barrier layers that confine charge carriers in the laser structure, e.g. the barriers in a quantum well structure
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
- H01S5/342—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers containing short period superlattices [SPS]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
- H01S5/343—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
- H01S5/34333—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser with a well layer based on Ga(In)N or Ga(In)P, e.g. blue laser
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/40—Arrangement of two or more semiconductor lasers, not provided for in groups H01S5/02 - H01S5/30
- H01S5/4006—Injection locking
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/50—Amplifier structures not provided for in groups H01S5/02 - H01S5/30
Landscapes
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Engineering & Computer Science (AREA)
- Nanotechnology (AREA)
- Chemical & Material Sciences (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Crystallography & Structural Chemistry (AREA)
- Biophysics (AREA)
- Geometry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Semiconductor Lasers (AREA)
- Optical Couplings Of Light Guides (AREA)
- Led Device Packages (AREA)
Abstract
A submount having a structure and a configuration resistant to an increase in manufacturing cost and a reduction in yields or reliability, and including an oblique waveguide is provided. A submount having a first surface and allowing a semiconductor light-emitting element including a waveguide to be fixed on the first surface, the waveguide having an axis line inclined at ΘWG (degrees) with respect to a normal to a light-incident/emission end surface of the semiconductor light-emitting element, and made of a semiconductor material with a refractive index nLE, the submount includes: a fusion-bonding material layer on the first surface; and an alignment mark formed in the fusion-bonding material layer, the alignment mark allowed to be recognized at an angle θSM=sin_1[nLE-sin(θWG)/n0], where a refractive index of a light-transmitting medium in proximity to the outside of the light-incident/emission end surface of the semiconductor light-emitting element is n0.
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011022540A JP2012164737A (en) | 2011-02-04 | 2011-02-04 | Sub-mount, sub-mount assembly and sub-mount assembly method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| IN2012DE00237A true IN2012DE00237A (en) | 2015-06-26 |
Family
ID=46587929
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| IN237DE2012 IN2012DE00237A (en) | 2011-02-04 | 2012-01-27 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US8982920B2 (en) |
| JP (1) | JP2012164737A (en) |
| CN (1) | CN102629732B (en) |
| IN (1) | IN2012DE00237A (en) |
| TW (1) | TW201234643A (en) |
Families Citing this family (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010027935A (en) * | 2008-07-23 | 2010-02-04 | Sony Corp | Semiconductor laser, optical disk device and optical pickup |
| JP5945213B2 (en) * | 2012-10-30 | 2016-07-05 | 日本電信電話株式会社 | Optical semiconductor device |
| TW201428905A (en) * | 2013-01-04 | 2014-07-16 | 矽品精密工業股份有限公司 | Semiconductor package and its manufacturing method |
| JP6127516B2 (en) * | 2013-01-08 | 2017-05-17 | 株式会社リコー | Optical package, optical unit, optical scanning device, image forming apparatus |
| JP2014165328A (en) * | 2013-02-25 | 2014-09-08 | Sony Corp | Semiconductor light emitting element and display device |
| JP2014220404A (en) * | 2013-05-09 | 2014-11-20 | ソニー株式会社 | Semiconductor laser device assembly |
| CN103779783A (en) * | 2014-02-10 | 2014-05-07 | 中国科学院半导体研究所 | Z-shaped self-alignment semiconductor optical amplifier heat sink |
| CN104518425A (en) * | 2014-12-17 | 2015-04-15 | 中国科学院半导体研究所 | Coupling method of oblique cavity semiconductor optical amplifier |
| EP3273551B1 (en) * | 2015-03-19 | 2025-01-29 | Sony Group Corporation | Semiconductor light emitting element and semiconductor light emitting element assembly |
| US20170146793A1 (en) * | 2015-11-20 | 2017-05-25 | Innovative Micro Technology | Microfabricated optical apparatus with integrated turning surface |
| WO2017138649A1 (en) * | 2016-02-12 | 2017-08-17 | 古河電気工業株式会社 | Laser module |
| JP6665666B2 (en) * | 2016-04-28 | 2020-03-13 | 日亜化学工業株式会社 | Method for manufacturing light emitting device, method for manufacturing laser module, and light emitting device |
| JP7166932B2 (en) | 2016-12-22 | 2022-11-08 | 古河電気工業株式会社 | Semiconductor laser module and method for manufacturing semiconductor laser module |
| JP7206494B2 (en) * | 2019-02-15 | 2023-01-18 | 日亜化学工業株式会社 | Method for manufacturing light-emitting device, light-emitting device |
| WO2020183729A1 (en) * | 2019-03-14 | 2020-09-17 | 三菱電機株式会社 | Laser device and laser machining apparatus |
| CN112968118B (en) * | 2020-11-13 | 2022-05-13 | 重庆康佳光电技术研究院有限公司 | Display backboard manufacturing method and display backboard |
| CN113300211B (en) * | 2021-06-24 | 2022-07-15 | 西安嘉合超亿光电科技有限公司 | Semiconductor laser packaging structure and preparation method thereof |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS577989A (en) * | 1980-06-17 | 1982-01-16 | Matsushita Electric Ind Co Ltd | Mount for semiconductor laser |
| JPS59110185A (en) * | 1982-12-16 | 1984-06-26 | Toshiba Corp | Formation of protection film for semiconductor laser device end surface |
| JPS60176355A (en) | 1984-02-22 | 1985-09-10 | Fujitsu Ltd | Privacy line interrupting system |
| JPS6284950U (en) * | 1985-11-15 | 1987-05-30 | ||
| US5354695A (en) * | 1992-04-08 | 1994-10-11 | Leedy Glenn J | Membrane dielectric isolation IC fabrication |
| JP3754995B2 (en) * | 1997-09-11 | 2006-03-15 | 三菱電機株式会社 | Semiconductor optical device |
| US6091755A (en) * | 1997-11-21 | 2000-07-18 | Sdl, Inc. | Optically amplifying semiconductor diodes with curved waveguides for external cavities |
| JP3235571B2 (en) * | 1998-09-03 | 2001-12-04 | 日本電気株式会社 | Measurement method for measuring relative position between active layer and positioning mark |
| JP2002094168A (en) * | 2000-09-19 | 2002-03-29 | Toshiba Corp | Semiconductor laser device and method of manufacturing the same |
| JP2003017794A (en) * | 2001-06-29 | 2003-01-17 | Ricoh Co Ltd | Submount structure and light source unit manufacturing method |
| JP2006269846A (en) * | 2005-03-25 | 2006-10-05 | Anritsu Corp | Sub-mount and optical semiconductor device using same |
| JP2007088320A (en) * | 2005-09-26 | 2007-04-05 | Fujifilm Corp | Light source device and optical semiconductor element |
| JP2010087209A (en) * | 2008-09-30 | 2010-04-15 | Oki Electric Ind Co Ltd | Integrated semiconductor laser, manufacturing method of the same, and mounting method |
-
2011
- 2011-02-04 JP JP2011022540A patent/JP2012164737A/en active Pending
-
2012
- 2012-01-20 TW TW101102725A patent/TW201234643A/en unknown
- 2012-01-27 IN IN237DE2012 patent/IN2012DE00237A/en unknown
- 2012-01-29 CN CN201210020425.XA patent/CN102629732B/en not_active Expired - Fee Related
- 2012-02-02 US US13/364,957 patent/US8982920B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| US8982920B2 (en) | 2015-03-17 |
| CN102629732A (en) | 2012-08-08 |
| US20120201259A1 (en) | 2012-08-09 |
| JP2012164737A (en) | 2012-08-30 |
| TW201234643A (en) | 2012-08-16 |
| CN102629732B (en) | 2017-04-12 |
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