HU0800733D0 - Sensor device - Google Patents
Sensor deviceInfo
- Publication number
- HU0800733D0 HU0800733D0 HU0800733A HUP0800733A HU0800733D0 HU 0800733 D0 HU0800733 D0 HU 0800733D0 HU 0800733 A HU0800733 A HU 0800733A HU P0800733 A HUP0800733 A HU P0800733A HU 0800733 D0 HU0800733 D0 HU 0800733D0
- Authority
- HU
- Hungary
- Prior art keywords
- sensor device
- sensor
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/75—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
- G01N21/77—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
- G01N21/7703—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator using reagent-clad optical fibres or optical waveguides
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02049—Interferometers characterised by particular mechanical design details
- G01B9/02051—Integrated design, e.g. on-chip or monolithic
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02055—Reduction or prevention of errors; Testing; Calibration
- G01B9/0207—Error reduction by correction of the measurement signal based on independently determined error sources, e.g. using a reference interferometer
- G01B9/02072—Error reduction by correction of the measurement signal based on independently determined error sources, e.g. using a reference interferometer by calibration or testing of interferometer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
- G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
- G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods
- G01N2021/458—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods using interferential sensor, e.g. sensor fibre, possibly on optical waveguide
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/75—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
- G01N21/77—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
- G01N2021/7769—Measurement method of reaction-produced change in sensor
- G01N2021/7779—Measurement method of reaction-produced change in sensor interferometric
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Biochemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Plasma & Fusion (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
HU0800733A HU0800733D0 (en) | 2008-12-03 | 2008-12-03 | Sensor device |
PCT/HU2009/000098 WO2010064058A1 (en) | 2008-12-03 | 2009-12-03 | Sensor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
HU0800733A HU0800733D0 (en) | 2008-12-03 | 2008-12-03 | Sensor device |
Publications (1)
Publication Number | Publication Date |
---|---|
HU0800733D0 true HU0800733D0 (en) | 2009-03-30 |
Family
ID=89988647
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
HU0800733A HU0800733D0 (en) | 2008-12-03 | 2008-12-03 | Sensor device |
Country Status (2)
Country | Link |
---|---|
HU (1) | HU0800733D0 (en) |
WO (1) | WO2010064058A1 (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20220091031A1 (en) * | 2020-09-18 | 2022-03-24 | Salvus, Llc | Interferometric Detection and Quantification System and Methods of Use in Chemical Processing |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2518197A1 (en) * | 1975-04-24 | 1976-11-04 | Guenter Dipl Phys Dr Smeets | High speed phase follow up control system - for laser interferometers with continuous recording of displacements in wide amplitude range generates difference current |
DE19546229B4 (en) * | 1995-11-30 | 2006-09-07 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Integrates polymer-based optical sensors |
IT1290554B1 (en) | 1997-02-27 | 1998-12-10 | Pirelli Cavi Spa Ora Pirelli C | METHOD FOR THE REDUCTION OF WASTE IN THE MANUFACTURE OF INTEGRATED OPTICAL COMPONENTS |
US6429023B1 (en) * | 1998-07-20 | 2002-08-06 | Shayda Technologies, Inc. | Biosensors with polymeric optical waveguides |
US6137576A (en) | 1998-07-28 | 2000-10-24 | Merck Patent Gesellschaft Mit Beschrankter Haftung | Optical transducers based on liquid crystalline phases |
US7289221B2 (en) * | 2004-09-27 | 2007-10-30 | Hewlett-Packard Development Company, L.P. | Mach Zehnder photonic crystal sensors and methods |
GB2437543B (en) | 2006-04-24 | 2010-03-31 | Yaping Zhang | Multi-channelled waveguide chemical and biochemical optical sensing device |
-
2008
- 2008-12-03 HU HU0800733A patent/HU0800733D0/en unknown
-
2009
- 2009-12-03 WO PCT/HU2009/000098 patent/WO2010064058A1/en active Application Filing
Also Published As
Publication number | Publication date |
---|---|
WO2010064058A1 (en) | 2010-06-10 |
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