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HK1105447A1 - Device and method for inspecting the internal surfaces of holes - Google Patents

Device and method for inspecting the internal surfaces of holes

Info

Publication number
HK1105447A1
HK1105447A1 HK07113736.5A HK07113736A HK1105447A1 HK 1105447 A1 HK1105447 A1 HK 1105447A1 HK 07113736 A HK07113736 A HK 07113736A HK 1105447 A1 HK1105447 A1 HK 1105447A1
Authority
HK
Hong Kong
Prior art keywords
inspecting
holes
internal surfaces
internal
Prior art date
Application number
HK07113736.5A
Other languages
English (en)
Inventor
Bernhard Messerschmidt
Karl Wisspeintner
Original Assignee
Micro Epsilon Messtechnik
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Micro Epsilon Messtechnik filed Critical Micro Epsilon Messtechnik
Publication of HK1105447A1 publication Critical patent/HK1105447A1/xx

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/306—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2210/00—Aspects not specifically covered by any group under G01B, e.g. of wheel alignment, caliper-like sensors
    • G01B2210/50—Using chromatic effects to achieve wavelength-dependent depth resolution

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
HK07113736.5A 2004-06-08 2007-12-18 Device and method for inspecting the internal surfaces of holes HK1105447A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102004027758 2004-06-08
PCT/DE2005/000914 WO2005121700A1 (de) 2004-06-08 2005-05-17 Vorrichtung und verfahren zum prüfen von oberflächen im inneren von löchern

Publications (1)

Publication Number Publication Date
HK1105447A1 true HK1105447A1 (en) 2008-02-15

Family

ID=34970367

Family Applications (1)

Application Number Title Priority Date Filing Date
HK07113736.5A HK1105447A1 (en) 2004-06-08 2007-12-18 Device and method for inspecting the internal surfaces of holes

Country Status (5)

Country Link
US (1) US7369225B2 (xx)
EP (1) EP1754018B1 (xx)
CN (1) CN1997871B (xx)
HK (1) HK1105447A1 (xx)
WO (1) WO2005121700A1 (xx)

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DE102005023351A1 (de) * 2005-05-17 2006-11-30 Micro-Epsilon Messtechnik Gmbh & Co Kg Vorrichtung und Verfahren zum Vermessen von Oberflächen
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ATE505623T1 (de) * 2006-07-24 2011-04-15 Prad Res & Dev Nv Verfahren und vorrichtung für mikrobildgebung
CN101548151B (zh) 2007-05-21 2013-08-07 微-埃普西龙测量技术有限两合公司 因彩色共焦测距传感器中的温度引起的测量误差的补偿方法
US7812971B2 (en) * 2007-06-28 2010-10-12 Quality Vision International, Inc. Multi color autofocus apparatus and method
CA2597891A1 (en) * 2007-08-20 2009-02-20 Marc Miousset Multi-beam optical probe and system for dimensional measurement
US20100079753A1 (en) * 2008-09-30 2010-04-01 The Regents Of The University Of California Raman spectrometer having wavelength-selective optical amplification
DE102010005032B4 (de) * 2010-01-15 2012-03-29 Peter Wolters Gmbh Vorrichtung und Verfahren zur Bestimmung der Position einer Arbeitsfläche einer Arbeitsscheibe
ES2364916B1 (es) * 2010-03-05 2012-09-04 Consejo Superior De Investigaciones Científicas (Csic) Instrumento para la realizacion de imagenes de campo ancho a distintas profundidades de un especimen
US8194251B2 (en) 2010-08-26 2012-06-05 Mitutoyo Corporation Method for operating a dual beam chromatic point sensor system for simultaneously measuring two surface regions
US8456637B2 (en) 2010-08-26 2013-06-04 Mitutoyo Corporation Multiple measuring point configuration for a chromatic point sensor
JP5601984B2 (ja) * 2010-11-16 2014-10-08 東洋鋼鈑株式会社 多孔板表面検査方法及び多孔板表面検査装置
DE102011056002A1 (de) * 2011-12-02 2013-06-06 Grintech Gmbh Optisch korrigierende Mikrosonde zur Weißlicht-Interferometrie
US8587772B2 (en) 2011-12-21 2013-11-19 Mitutoyo Corporation Chromatic point sensor configuration including real time spectrum compensation
US8587789B2 (en) 2011-12-21 2013-11-19 Mitutoyo Corporation Chromatic point sensor compensation including workpiece material effects
US8817240B2 (en) 2012-05-25 2014-08-26 Mitutoyo Corporation Interchangeable optics configuration for a chromatic range sensor optical pen
US8736817B2 (en) 2012-05-25 2014-05-27 Mitutoyo Corporation Interchangeable chromatic range sensor probe for a coordinate measuring machine
US9068822B2 (en) 2013-07-03 2015-06-30 Mitutoyo Corporation Chromatic range sensor probe detachment sensor
US9329026B2 (en) 2013-12-06 2016-05-03 Mitutoyo Corporation Hole-measurement systems and methods using a non-rotating chromatic point sensor (CPS) pen
US9651764B2 (en) 2014-01-30 2017-05-16 Mitutoyo Corporation Interchangeable reflective assembly for a chromatic range sensor optical pen
CN104181171A (zh) * 2014-08-08 2014-12-03 明泰信科精密仪器科技（苏州）有限公司 对圆孔工件的内外壁进行图像拍摄的方法和装置
US10295475B2 (en) 2014-09-05 2019-05-21 Rolls-Royce Corporation Inspection of machined holes
US10228669B2 (en) 2015-05-27 2019-03-12 Rolls-Royce Corporation Machine tool monitoring
FI127908B (en) * 2015-09-22 2019-05-15 Teknologian Tutkimuskeskus Vtt Oy Method and apparatus for measuring surface height
PL3156760T3 (pl) * 2015-10-14 2020-03-31 Sturm Maschinen- & Anlagenbau Gmbh Urządzenie sensorowe i sposób badania wierzchnich powierzchni cylindrycznej komory
DE102016208949B4 (de) * 2016-05-24 2018-08-16 Micro-Epsilon Messtechnik Gmbh & Co. Kg Vorrichtung und Verfahren zum Vermessen der Geometrie der Innenwand von Bohrungen
FR3080445B1 (fr) * 2018-04-19 2020-03-27 Renault S.A.S. Dispositif de mesure pour determiner l'epaisseur d'une couche d'un materiau
CN110017796B (zh) * 2019-05-16 2021-09-03 西安工业大学 一种高精度齿轮齿面光学测量方法
DE102020104386A1 (de) 2020-02-19 2021-08-19 Precitec Optronik Gmbh Vorrichtung und Verfahren zum Messen der Topografie einer Seitenfläche einer Vertiefung
CN114086790B (zh) * 2021-11-19 2022-05-17 六安金銮建筑设备有限公司 一种基于物联网的智能建筑墙面裂纹修复设备
EP4336140A1 (de) 2022-09-12 2024-03-13 3D.aero GmbH Verfahren zur beurteilung des ergebnisses einer an einem werkstück durchgeführten bohrung

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FR2588380B1 (fr) * 1985-10-07 1988-05-27 Commissariat Energie Atomique Dispositif d'examen a distance de defauts debouchant a la surface interne d'une cavite profonde
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DE102004011189B4 (de) * 2004-03-04 2011-05-05 Carl Mahr Holding Gmbh Optischer Messkopf

Also Published As

Publication number Publication date
CN1997871A (zh) 2007-07-11
EP1754018A1 (de) 2007-02-21
EP1754018B1 (de) 2018-07-11
CN1997871B (zh) 2011-06-08
US20070086000A1 (en) 2007-04-19
US7369225B2 (en) 2008-05-06
WO2005121700A1 (de) 2005-12-22

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Legal Events

Date Code Title Description
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)

Effective date: 20210515