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HK1053510A1 - Test element analysis system, test element and method - Google Patents

Test element analysis system, test element and method

Info

Publication number
HK1053510A1
HK1053510A1 HK03105772A HK03105772A HK1053510A1 HK 1053510 A1 HK1053510 A1 HK 1053510A1 HK 03105772 A HK03105772 A HK 03105772A HK 03105772 A HK03105772 A HK 03105772A HK 1053510 A1 HK1053510 A1 HK 1053510A1
Authority
HK
Hong Kong
Prior art keywords
test element
analysis system
element analysis
test
analysis
Prior art date
Application number
HK03105772A
Other languages
English (en)
Inventor
Wolfgang Petrich
Wilfried Schmid
Gerrit Kocherscheidt
Jean-Michael Asfour
Original Assignee
Roche Diagnostics Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Roche Diagnostics Gmbh filed Critical Roche Diagnostics Gmbh
Publication of HK1053510A1 publication Critical patent/HK1053510A1/xx

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
    • G01N21/77Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/8483Investigating reagent band
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
    • G01N21/77Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
    • G01N21/7703Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator using reagent-clad optical fibres or optical waveguides

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Plasma & Fusion (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Molecular Biology (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
  • Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
HK03105772A 1999-12-24 2003-08-12 Test element analysis system, test element and method HK1053510A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP99125874 1999-12-24
PCT/DE2000/004394 WO2001048461A1 (fr) 1999-12-24 2000-12-08 Systeme d'analyse a element de test

Publications (1)

Publication Number Publication Date
HK1053510A1 true HK1053510A1 (en) 2003-10-24

Family

ID=8239728

Family Applications (1)

Application Number Title Priority Date Filing Date
HK03105772A HK1053510A1 (en) 1999-12-24 2003-08-12 Test element analysis system, test element and method

Country Status (14)

Country Link
US (4) USRE44788E1 (fr)
EP (1) EP1240503B1 (fr)
JP (1) JP3655588B2 (fr)
KR (1) KR100816799B1 (fr)
CN (1) CN1243968C (fr)
AU (1) AU771677B2 (fr)
BR (1) BR0016711A (fr)
CA (1) CA2395306C (fr)
CZ (1) CZ20022206A3 (fr)
DE (1) DE10084176D2 (fr)
HK (1) HK1053510A1 (fr)
MX (1) MXPA02006170A (fr)
PL (1) PL201164B1 (fr)
WO (1) WO2001048461A1 (fr)

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Also Published As

Publication number Publication date
US8119069B2 (en) 2012-02-21
EP1240503B1 (fr) 2018-01-17
US7262061B2 (en) 2007-08-28
EP1240503A1 (fr) 2002-09-18
JP2003518618A (ja) 2003-06-10
CA2395306C (fr) 2011-08-02
KR100816799B1 (ko) 2008-03-26
PL355578A1 (en) 2004-05-04
KR20020063581A (ko) 2002-08-03
CN1413298A (zh) 2003-04-23
US8535609B2 (en) 2013-09-17
AU771677B2 (en) 2004-04-01
PL201164B1 (pl) 2009-03-31
CN1243968C (zh) 2006-03-01
DE10084176D2 (de) 2003-01-16
CZ20022206A3 (cs) 2002-10-16
AU2829901A (en) 2001-07-09
US20080180652A1 (en) 2008-07-31
CA2395306A1 (fr) 2001-07-05
BR0016711A (pt) 2002-09-03
US20110033341A1 (en) 2011-02-10
WO2001048461A1 (fr) 2001-07-05
MXPA02006170A (es) 2003-01-28
US20030157724A1 (en) 2003-08-21
JP3655588B2 (ja) 2005-06-02
USRE44788E1 (en) 2014-03-04

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Legal Events

Date Code Title Description
PC Patent ceased (i.e. patent has lapsed due to the failure to pay the renewal fee)

Effective date: 20141208