GB9617380D0 - Atomic force microscopy apparatus and a method thereof - Google Patents
Atomic force microscopy apparatus and a method thereofInfo
- Publication number
- GB9617380D0 GB9617380D0 GBGB9617380.2A GB9617380A GB9617380D0 GB 9617380 D0 GB9617380 D0 GB 9617380D0 GB 9617380 A GB9617380 A GB 9617380A GB 9617380 D0 GB9617380 D0 GB 9617380D0
- Authority
- GB
- United Kingdom
- Prior art keywords
- tip
- piezotransducer
- cantilever
- sample
- atomic force
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 title abstract 3
- 238000004630 atomic force microscopy Methods 0.000 title 1
- 238000000386 microscopy Methods 0.000 abstract 2
- 230000035945 sensitivity Effects 0.000 abstract 2
- 230000036962 time dependent Effects 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
- G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
- G01Q60/32—AC mode
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
Abstract
The microscopy apparatus comprises a cantilever (10) having an atomically sharp tip (11) and a detector (15) which monitors the deflection of the tip (11) as a measure of the atomic force between the tip and a sample. A piezotransducer (12) is provided on the end of the cantilever (10) distant from the tip (11). The piezotransducer (12) generates high frequency vibrations which are applied to the cantilever. The vibrations transmitted to the tip (11) are modulated using means such as a second piezotransducer (20) in contact with the sample and the movement of the tip (11) is then sampled by the detector (15) at a much lower frequency. The microscopy apparatus and method described is able to maintain sensitivity to the properties of the sample whilst retaining sensitivity to the output of the apparatus. The apparatus and method is particularly suited of the study of time-dependent physico-chemical and physico-mechanical properties up to nanosecond and sub-nanosecond time resolution.
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GBGB9617380.2A GB9617380D0 (en) | 1996-08-19 | 1996-08-19 | Atomic force microscopy apparatus and a method thereof |
| PCT/GB1997/002232 WO1998008046A1 (en) | 1996-08-19 | 1997-08-19 | Atomic force microscopy apparatus and a method thereof |
| AU40225/97A AU4022597A (en) | 1996-08-19 | 1997-08-19 | Atomic force microscopy apparatus and a method thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GBGB9617380.2A GB9617380D0 (en) | 1996-08-19 | 1996-08-19 | Atomic force microscopy apparatus and a method thereof |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| GB9617380D0 true GB9617380D0 (en) | 1996-10-02 |
Family
ID=10798667
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GBGB9617380.2A Pending GB9617380D0 (en) | 1996-08-19 | 1996-08-19 | Atomic force microscopy apparatus and a method thereof |
Country Status (3)
| Country | Link |
|---|---|
| AU (1) | AU4022597A (en) |
| GB (1) | GB9617380D0 (en) |
| WO (1) | WO1998008046A1 (en) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8438927B2 (en) | 2003-08-12 | 2013-05-14 | Northwestern University | Scanning near field thermoelastic acoustic holography (SNFTAH) |
| US7448269B2 (en) | 2003-08-12 | 2008-11-11 | Northwestern University | Scanning near field ultrasound holography |
| CN101317138B (en) * | 2005-10-06 | 2011-05-04 | 西北大学 | Scanning near field ultrasonic holography method and system |
| US8322220B2 (en) * | 2007-05-10 | 2012-12-04 | Veeco Instruments Inc. | Non-destructive wafer-scale sub-surface ultrasonic microscopy employing near field AFM detection |
| US8726410B2 (en) | 2010-07-30 | 2014-05-13 | The United States Of America As Represented By The Secretary Of The Air Force | Atomic force microscopy system and method for nanoscale measurement |
| CN112798205B (en) * | 2020-12-15 | 2023-04-07 | 东莞理工学院 | Atomic force microscope micro-cantilever elasticity coefficient calibration device |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4992659A (en) * | 1989-07-27 | 1991-02-12 | International Business Machines Corporation | Near-field lorentz force microscopy |
| JP2500373B2 (en) * | 1993-11-09 | 1996-05-29 | 工業技術院長 | Atomic force microscope and sample observation method in atomic force microscope |
| US5804709A (en) * | 1995-02-07 | 1998-09-08 | International Business Machines Corporation | Cantilever deflection sensor and use thereof |
-
1996
- 1996-08-19 GB GBGB9617380.2A patent/GB9617380D0/en active Pending
-
1997
- 1997-08-19 WO PCT/GB1997/002232 patent/WO1998008046A1/en active Application Filing
- 1997-08-19 AU AU40225/97A patent/AU4022597A/en not_active Abandoned
Also Published As
| Publication number | Publication date |
|---|---|
| AU4022597A (en) | 1998-03-06 |
| WO1998008046A1 (en) | 1998-02-26 |
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