GB954890A - Improvements in or relating to testing equipment for cathode ray oscilloscopes - Google Patents
Improvements in or relating to testing equipment for cathode ray oscilloscopesInfo
- Publication number
- GB954890A GB954890A GB1157560A GB1157560A GB954890A GB 954890 A GB954890 A GB 954890A GB 1157560 A GB1157560 A GB 1157560A GB 1157560 A GB1157560 A GB 1157560A GB 954890 A GB954890 A GB 954890A
- Authority
- GB
- United Kingdom
- Prior art keywords
- cathode
- point
- fed
- waveform
- ray
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/002—Testing or calibrating of apparatus covered by the other groups of this subclass of cathode ray oscilloscopes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
954,890. Non-linear and pulse circuits; cathode-ray oscilloscopes. MARCONI INSTRUMENTS Ltd. Dec. 13, 1960 [April 1, 1960], No. 11576/60. Headings H3P, H3W and H4T. [Also in Division G1] The deflection accuracy of a cathoderay oscillograph is tested by applying a waveform of the form shown in Fig. 2, the amplitude of the higher frequency portion being selected in dependence on the maximum permissible deflection error. Fig. 1 shows a circuit for generating at point 20 the waveform shown in Fig. 2. The positive half-cycles of a 50 c/s. sine wave fed to point 1 are clipped by diode 3 before being passed via resistor 7 to a further clipping diode 8. The clipping level is controlled by the rectified voltage developed across the gas-filled tubes 13, 14 and modulated by a 4 kc/s. square wave fed to the cathodes of diodes 3, 8 via capacitor 17. The negative half-cycles of the 50 c/s. sine wave at point 1 are similarly clipped and modulated by diodes 4, 9 biased by gas-filled tubes 15, 16. Cathode-ray tube displays.-The waveform shown in Fig. 2 may be fed via a calibrated variable attenuator to a cathode-ray oscilloscope having a locked or unlocked high-speed time base. The resulting display is shown in Fig. 3, the second and third lines providing 10% and 90% markers.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB1157560A GB954890A (en) | 1960-04-01 | 1960-04-01 | Improvements in or relating to testing equipment for cathode ray oscilloscopes |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB1157560A GB954890A (en) | 1960-04-01 | 1960-04-01 | Improvements in or relating to testing equipment for cathode ray oscilloscopes |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| GB954890A true GB954890A (en) | 1964-04-08 |
Family
ID=9988771
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB1157560A Expired GB954890A (en) | 1960-04-01 | 1960-04-01 | Improvements in or relating to testing equipment for cathode ray oscilloscopes |
Country Status (1)
| Country | Link |
|---|---|
| GB (1) | GB954890A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101281224B (en) * | 2008-04-18 | 2011-06-01 | 电子科技大学 | The Test Method of Waveform Capture Rate of Digital Oscilloscope |
| CN102890258A (en) * | 2012-10-22 | 2013-01-23 | 电子科技大学 | Method for testing capture rate of parallel-structure digital storage oscilloscope |
| CN110967553A (en) * | 2018-09-28 | 2020-04-07 | 大族激光科技产业集团股份有限公司 | Laser testing device and method |
-
1960
- 1960-04-01 GB GB1157560A patent/GB954890A/en not_active Expired
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101281224B (en) * | 2008-04-18 | 2011-06-01 | 电子科技大学 | The Test Method of Waveform Capture Rate of Digital Oscilloscope |
| CN102890258A (en) * | 2012-10-22 | 2013-01-23 | 电子科技大学 | Method for testing capture rate of parallel-structure digital storage oscilloscope |
| CN102890258B (en) * | 2012-10-22 | 2014-06-25 | 电子科技大学 | Method for testing capture rate of parallel-structure digital storage oscilloscope |
| CN110967553A (en) * | 2018-09-28 | 2020-04-07 | 大族激光科技产业集团股份有限公司 | Laser testing device and method |
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