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GB9024225D0 - Tester head - Google Patents

Tester head

Info

Publication number
GB9024225D0
GB9024225D0 GB909024225A GB9024225A GB9024225D0 GB 9024225 D0 GB9024225 D0 GB 9024225D0 GB 909024225 A GB909024225 A GB 909024225A GB 9024225 A GB9024225 A GB 9024225A GB 9024225 D0 GB9024225 D0 GB 9024225D0
Authority
GB
United Kingdom
Prior art keywords
tester head
tester
head
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GB909024225A
Other versions
GB2239744A (en
GB2239744B (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sharp Corp
Original Assignee
Sharp Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sharp Corp filed Critical Sharp Corp
Publication of GB9024225D0 publication Critical patent/GB9024225D0/en
Publication of GB2239744A publication Critical patent/GB2239744A/en
Application granted granted Critical
Publication of GB2239744B publication Critical patent/GB2239744B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/0735—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card arranged on a flexible frame or film

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
GB9024225A 1989-11-07 1990-11-07 Tester head Expired - Fee Related GB2239744B (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP28979389 1989-11-07
JP29063689 1989-11-08
JP30003389 1989-11-17

Publications (3)

Publication Number Publication Date
GB9024225D0 true GB9024225D0 (en) 1990-12-19
GB2239744A GB2239744A (en) 1991-07-10
GB2239744B GB2239744B (en) 1994-03-16

Family

ID=27337533

Family Applications (1)

Application Number Title Priority Date Filing Date
GB9024225A Expired - Fee Related GB2239744B (en) 1989-11-07 1990-11-07 Tester head

Country Status (1)

Country Link
GB (1) GB2239744B (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3253069B2 (en) * 1990-07-25 2002-02-04 キヤノン株式会社 Inspection method of part to be measured using electrical connection member
US5378982A (en) * 1993-02-25 1995-01-03 Hughes Aircraft Company Test probe for panel having an overlying protective member adjacent panel contacts
JP3001182B2 (en) * 1995-08-29 2000-01-24 信越ポリマー株式会社 Liquid crystal panel inspection apparatus and method of manufacturing the same
US6468098B1 (en) 1999-08-17 2002-10-22 Formfactor, Inc. Electrical contactor especially wafer level contactor using fluid pressure

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR870006645A (en) * 1985-12-23 1987-07-13 로버트 에스 헐스 Multiplexed Probe Device for Integrated Circuits
US4783719A (en) * 1987-01-20 1988-11-08 Hughes Aircraft Company Test connector for electrical devices
DK155888C (en) * 1987-05-06 1989-10-23 Reflex Promotion PROCEDURE AND TRANSFER FOR DECORATING TEXTILES OR OTHER, PRINCIPLY FLEXIBLE, MATERIALS WITH PATTERNS CONTAINING STRONGLY REFLECTING AREAS DEFINED BY COLORED AREAS
EP0304868A3 (en) * 1987-08-28 1990-10-10 Tektronix Inc. Multiple lead probe for integrated circuits in wafer form
DE68909811D1 (en) * 1988-03-01 1993-11-18 Hewlett Packard Co Membrane-based IC test probe with precisely positioned contacts.
EP0361779A1 (en) * 1988-09-26 1990-04-04 Hewlett-Packard Company Micro-strip architecture for membrane test probe

Also Published As

Publication number Publication date
GB2239744A (en) 1991-07-10
GB2239744B (en) 1994-03-16

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20051107