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GB763667A - A method of and apparatus for measuring the thickness of materials - Google Patents

A method of and apparatus for measuring the thickness of materials

Info

Publication number
GB763667A
GB763667A GB31687/54A GB3168754A GB763667A GB 763667 A GB763667 A GB 763667A GB 31687/54 A GB31687/54 A GB 31687/54A GB 3168754 A GB3168754 A GB 3168754A GB 763667 A GB763667 A GB 763667A
Authority
GB
United Kingdom
Prior art keywords
radiation
thickness
bridge
nov
strip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB31687/54A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
EXATEST GES fur MESSTECHNIK M
Original Assignee
EXATEST GES fur MESSTECHNIK M
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by EXATEST GES fur MESSTECHNIK M filed Critical EXATEST GES fur MESSTECHNIK M
Publication of GB763667A publication Critical patent/GB763667A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203—Measuring back scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G01B15/025—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness by measuring absorption
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Electromagnetism (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)

Abstract

763,667. Radiation thickness gauges. EXATEST GES. FUR MESSTECHNIK. Nov. 2, 1954 [Nov. 11, 1953], No. 31687/54. Class 40 (3). The thickness of strips such as hot rolled metal is measured by directing penetrating electromagnetic radiation on to it and comparing the secondary radiation and the transmitted radiation. As shown, radiation, which may be X-ray, gamma rays produced by cobalt or caesium isotopes or positrons produced by sodium 22, is emitted by a source 1 and is incident upon the strip 3 under test. Secondary radiation is received on an ionization counter tube 6 and transmitted radiation on a tube 7. The two counter tubes are arranged as adjacent arms of a balanced bridge circuit. A second beam from the same source is used to compare secondary and transmitted radiation from a comparison sheet 11 of the same thickness. The unbalance currents from the two bridges are compared in a third bridge 15 and shown on an indicator 16. In the embodiment of Fig. 1 (not shown), a single beam only is used the bridge being so adjusted that there is no unbalance current if the strip is of the correct thickness.
GB31687/54A 1953-11-11 1954-11-02 A method of and apparatus for measuring the thickness of materials Expired GB763667A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DEE8111A DE925197C (en) 1953-11-11 1953-11-11 Method for the non-contact thickness measurement of strip-shaped, preferably hot-rolled material by means of hard electromagnetic radiation

Publications (1)

Publication Number Publication Date
GB763667A true GB763667A (en) 1956-12-12

Family

ID=7067318

Family Applications (1)

Application Number Title Priority Date Filing Date
GB31687/54A Expired GB763667A (en) 1953-11-11 1954-11-02 A method of and apparatus for measuring the thickness of materials

Country Status (5)

Country Link
CH (1) CH327329A (en)
DE (1) DE925197C (en)
FR (1) FR1112614A (en)
GB (1) GB763667A (en)
LU (1) LU33188A1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3019338A (en) * 1957-08-28 1962-01-30 Well Surveys Inc Thickness detector for coal mining machine

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1225396B (en) * 1957-01-28 1966-09-22 Dunlop Rubber Co Device for continuous, non-contact surface weight determination of a strip
US3322962A (en) * 1963-10-01 1967-05-30 Kalle Ag Method and apparatus for continuously measuring applied coatings employing photoelectric means
FI62420C (en) * 1981-05-29 1982-12-10 Enso Gutzeit Oy FOERFARANDE FOER ATT MAETA BELAEGGNINGSMAENGD
GB9105639D0 (en) * 1991-03-18 1991-05-01 Data Measurement Corp Dynamic alloy correction gauge

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3019338A (en) * 1957-08-28 1962-01-30 Well Surveys Inc Thickness detector for coal mining machine

Also Published As

Publication number Publication date
FR1112614A (en) 1956-03-16
DE925197C (en) 1955-03-14
LU33188A1 (en) 1954-12-30
CH327329A (en) 1958-03-15

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