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GB723772A - Improvements in or relating to electron microscopes - Google Patents

Improvements in or relating to electron microscopes

Info

Publication number
GB723772A
GB723772A GB12956/51A GB1295651A GB723772A GB 723772 A GB723772 A GB 723772A GB 12956/51 A GB12956/51 A GB 12956/51A GB 1295651 A GB1295651 A GB 1295651A GB 723772 A GB723772 A GB 723772A
Authority
GB
United Kingdom
Prior art keywords
pair
coils
electron
holder
plane
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB12956/51A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens and Halske AG
Siemens Corp
Original Assignee
Siemens and Halske AG
Siemens Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens and Halske AG, Siemens Corp filed Critical Siemens and Halske AG
Publication of GB723772A publication Critical patent/GB723772A/en
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/18—Vacuum locks ; Means for obtaining or maintaining the desired pressure within the vessel
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
    • H01J37/147—Arrangements for directing or deflecting the discharge along a desired path
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/248—Components associated with high voltage supply

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Sources, Ion Sources (AREA)

Abstract

723,772. Electron microscopes. SIEMENS & HALSKE AKT.-GES. May 31, 1951 [Oct. 14, 1948], No. 12956/51. Class 39 (1). Centering of the electron beam in an electron microscope is obtained by four deflecting arrangements, one pair of which adjusts the beam in one plane and the other pair in a plane at right angles to the first mentioned plane. Deflecting plates 71 ... 74, Fig. 7, are arranged between the gun and the objective and projecting lens, and are connected to adjustable tappings on potentiotransformer 75 through the smoothing circuit 78 and rectifiers 76, 77. The tappings 86...90 are operated by the two adjustable devices 91, 92. Additional adjustment is provided by variable resistances 93 ... 96. A condenser consists of two windings 41, 42, Fig. 4, and the poles 43, 45 which are separated by a non-magnetic ring 44 and an apertured diaphragm. A holder for each pair of electromagnetic coils is fixed by a screw thread to the poles which are assembled within the electron microscope by a bayonet joint so that wire connections for the coils are connected through clips to leading-in wires 50 which are sealed by a rubber disc 53, plate 54 and a. threaded ring 55 which is screwed to the container 56. A unit which contains only one pair of deflecting plates is substituted when the electron image is reflected from the object. The object holder 59 is fitted to the electromagnetic objective 61 by a carrier 62 which is movable in the extension 57 of the container. Plates 64, 65 steer the holder into position. Coils which deflect the beam in one direction alternate with coils which deflect the beam in a direction which is at right angles thereto. Specification 660,787, is referred to.
GB12956/51A 1948-10-15 1951-05-31 Improvements in or relating to electron microscopes Expired GB723772A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE1948P0000184 DE899095C (en) 1948-10-15 1948-10-15 Arrangement on a transmission electron microscope

Publications (1)

Publication Number Publication Date
GB723772A true GB723772A (en) 1955-02-09

Family

ID=6633282

Family Applications (1)

Application Number Title Priority Date Filing Date
GB12956/51A Expired GB723772A (en) 1948-10-15 1951-05-31 Improvements in or relating to electron microscopes

Country Status (2)

Country Link
DE (1) DE899095C (en)
GB (1) GB723772A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2973433A (en) * 1957-01-03 1961-02-28 Philips Corp Method and device for adjusting the excitation of a stigmator in electronmicroscopes
US3030506A (en) * 1958-09-13 1962-04-17 Philips Corp X-ray shadow microscope

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE957421C (en) * 1951-06-17 1957-01-31 Zeiss Carl Fa Device in corpuscular beam apparatus, in particular electron microscopes, for adjusting the beam generation system
GB832500A (en) * 1955-12-12 1960-04-13 Ass Elect Ind Improvements relating to electron optical apparatus
NL108225C (en) * 1956-01-27
DE1089088B (en) * 1956-07-10 1960-09-15 Siemens Ag Arrangement for object illumination in the electron microscope
DE1236665B (en) * 1964-02-22 1967-03-16 Fernseh Gmbh Method for adjusting a refocused cathode ray tube with a flat luminescent screen and device for carrying out the method
DE1614618B1 (en) * 1967-09-29 1971-01-28 Siemens Ag Corpuscular beam device, in particular an electron microscope, with means for colored reproduction of properties characterizing a preparation to be examined, of a corpuscular radiation coming from the preparation
AT275617B (en) * 1968-02-23 1969-10-27 Zeiss Carl Fa Method and arrangement for adjusting the electron beam in an electron microscope

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE734736C (en) * 1940-04-11 1943-04-22 Aeg Electron microscope for recording with light and dark field illumination

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2973433A (en) * 1957-01-03 1961-02-28 Philips Corp Method and device for adjusting the excitation of a stigmator in electronmicroscopes
US3030506A (en) * 1958-09-13 1962-04-17 Philips Corp X-ray shadow microscope

Also Published As

Publication number Publication date
DE899095C (en) 1953-12-07

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