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GB579665A - Improvements in and relating to impedance matching transformers - Google Patents

Improvements in and relating to impedance matching transformers

Info

Publication number
GB579665A
GB579665A GB1785543A GB1785543A GB579665A GB 579665 A GB579665 A GB 579665A GB 1785543 A GB1785543 A GB 1785543A GB 1785543 A GB1785543 A GB 1785543A GB 579665 A GB579665 A GB 579665A
Authority
GB
United Kingdom
Prior art keywords
adjustable
portions
impedance
central
impedance matching
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB1785543A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Co
Original Assignee
General Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by General Electric Co filed Critical General Electric Co
Priority to GB1785543A priority Critical patent/GB579665A/en
Publication of GB579665A publication Critical patent/GB579665A/en
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
    • H01P5/00—Coupling devices of the waveguide type
    • H01P5/04—Coupling devices of the waveguide type with variable factor of coupling

Landscapes

  • Details Of Connecting Devices For Male And Female Coupling (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)

Abstract

579,665. Impedance matching devices. BRITISH THOMSON-HOUSTON CO., Ltd. (General Electric Co.). Oct. 28, 1943, No. 17855. [Class 40 (iii)] An impedance-matching device comprises two portions of coaxial line of different characteristic impedances connected by a section of which the characteristic impedance is adjustable by giving more or less eccentricity to the central or outer conductor. When the central conductor is adjustable, it may be connected to the portions on either side by flexible portions and may be supported on adjustable insulating rods 23 or may be mounted on the central conductors of the adjoining sections by stiff eccentric pivots, Fig. 3 (not shown). Where the outer conductor is adjustable, it is connected to the adjoining section by a bellows-like construction 50. Reference has been directed by the Comptroller to Specification 581,972.
GB1785543A 1943-10-28 1943-10-28 Improvements in and relating to impedance matching transformers Expired GB579665A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB1785543A GB579665A (en) 1943-10-28 1943-10-28 Improvements in and relating to impedance matching transformers

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB1785543A GB579665A (en) 1943-10-28 1943-10-28 Improvements in and relating to impedance matching transformers

Publications (1)

Publication Number Publication Date
GB579665A true GB579665A (en) 1946-08-12

Family

ID=10102391

Family Applications (1)

Application Number Title Priority Date Filing Date
GB1785543A Expired GB579665A (en) 1943-10-28 1943-10-28 Improvements in and relating to impedance matching transformers

Country Status (1)

Country Link
GB (1) GB579665A (en)

Cited By (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE947988C (en) * 1952-06-18 1956-08-23 Patelhold Patentverwertung Decoupling transformer for magnetron transmitter
DE1083362B (en) * 1959-06-22 1960-06-15 Siemens Ag Transformation line with changeable distance between inner and outer conductor
DE1125018B (en) * 1959-12-04 1962-03-08 Siemens Ag Transformation line with wave resistance that can be changed continuously within a certain range
EP0349203A3 (en) * 1988-06-27 1990-11-07 CASCADE MICROTECH, INC. (an Oregon corporation) Coaxial transmission line to microstrip transmission line launcher
US7161363B2 (en) 2002-05-23 2007-01-09 Cascade Microtech, Inc. Probe for testing a device under test
US7233160B2 (en) 2000-12-04 2007-06-19 Cascade Microtech, Inc. Wafer probe
US7271603B2 (en) 2003-05-23 2007-09-18 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7285969B2 (en) 2002-11-13 2007-10-23 Cascade Microtech, Inc. Probe for combined signals
US7403028B2 (en) 2006-06-12 2008-07-22 Cascade Microtech, Inc. Test structure and probe for differential signals
US7420381B2 (en) 2004-09-13 2008-09-02 Cascade Microtech, Inc. Double sided probing structures
US7427868B2 (en) 2003-12-24 2008-09-23 Cascade Microtech, Inc. Active wafer probe
US7443186B2 (en) 2006-06-12 2008-10-28 Cascade Microtech, Inc. On-wafer test structures for differential signals
US7449899B2 (en) 2005-06-08 2008-11-11 Cascade Microtech, Inc. Probe for high frequency signals
US7504842B2 (en) 1997-05-28 2009-03-17 Cascade Microtech, Inc. Probe holder for testing of a test device
US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors
US7609077B2 (en) 2006-06-09 2009-10-27 Cascade Microtech, Inc. Differential signal probe with integral balun
US7619419B2 (en) 2005-06-13 2009-11-17 Cascade Microtech, Inc. Wideband active-passive differential signal probe
US7656172B2 (en) 2005-01-31 2010-02-02 Cascade Microtech, Inc. System for testing semiconductors
US7723999B2 (en) 2006-06-12 2010-05-25 Cascade Microtech, Inc. Calibration structures for differential signal probing
US7764072B2 (en) 2006-06-12 2010-07-27 Cascade Microtech, Inc. Differential signal probing system
US7876114B2 (en) 2007-08-08 2011-01-25 Cascade Microtech, Inc. Differential waveguide probe

Cited By (39)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE947988C (en) * 1952-06-18 1956-08-23 Patelhold Patentverwertung Decoupling transformer for magnetron transmitter
DE1083362B (en) * 1959-06-22 1960-06-15 Siemens Ag Transformation line with changeable distance between inner and outer conductor
DE1125018B (en) * 1959-12-04 1962-03-08 Siemens Ag Transformation line with wave resistance that can be changed continuously within a certain range
EP0349203A3 (en) * 1988-06-27 1990-11-07 CASCADE MICROTECH, INC. (an Oregon corporation) Coaxial transmission line to microstrip transmission line launcher
US7504842B2 (en) 1997-05-28 2009-03-17 Cascade Microtech, Inc. Probe holder for testing of a test device
US7456646B2 (en) 2000-12-04 2008-11-25 Cascade Microtech, Inc. Wafer probe
US7233160B2 (en) 2000-12-04 2007-06-19 Cascade Microtech, Inc. Wafer probe
US7761983B2 (en) 2000-12-04 2010-07-27 Cascade Microtech, Inc. Method of assembling a wafer probe
US7495461B2 (en) 2000-12-04 2009-02-24 Cascade Microtech, Inc. Wafer probe
US7688097B2 (en) 2000-12-04 2010-03-30 Cascade Microtech, Inc. Wafer probe
US7161363B2 (en) 2002-05-23 2007-01-09 Cascade Microtech, Inc. Probe for testing a device under test
US7518387B2 (en) 2002-05-23 2009-04-14 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7304488B2 (en) 2002-05-23 2007-12-04 Cascade Microtech, Inc. Shielded probe for high-frequency testing of a device under test
US7489149B2 (en) 2002-05-23 2009-02-10 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7482823B2 (en) 2002-05-23 2009-01-27 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7417446B2 (en) 2002-11-13 2008-08-26 Cascade Microtech, Inc. Probe for combined signals
US7285969B2 (en) 2002-11-13 2007-10-23 Cascade Microtech, Inc. Probe for combined signals
US7453276B2 (en) 2002-11-13 2008-11-18 Cascade Microtech, Inc. Probe for combined signals
US7271603B2 (en) 2003-05-23 2007-09-18 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7898273B2 (en) 2003-05-23 2011-03-01 Cascade Microtech, Inc. Probe for testing a device under test
US7498829B2 (en) 2003-05-23 2009-03-03 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7501842B2 (en) 2003-05-23 2009-03-10 Cascade Microtech, Inc. Shielded probe for testing a device under test
US7427868B2 (en) 2003-12-24 2008-09-23 Cascade Microtech, Inc. Active wafer probe
US7759953B2 (en) 2003-12-24 2010-07-20 Cascade Microtech, Inc. Active wafer probe
US7420381B2 (en) 2004-09-13 2008-09-02 Cascade Microtech, Inc. Double sided probing structures
US8013623B2 (en) 2004-09-13 2011-09-06 Cascade Microtech, Inc. Double sided probing structures
US7656172B2 (en) 2005-01-31 2010-02-02 Cascade Microtech, Inc. System for testing semiconductors
US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors
US7898281B2 (en) 2005-01-31 2011-03-01 Cascade Mircotech, Inc. Interface for testing semiconductors
US7940069B2 (en) 2005-01-31 2011-05-10 Cascade Microtech, Inc. System for testing semiconductors
US7449899B2 (en) 2005-06-08 2008-11-11 Cascade Microtech, Inc. Probe for high frequency signals
US7619419B2 (en) 2005-06-13 2009-11-17 Cascade Microtech, Inc. Wideband active-passive differential signal probe
US7609077B2 (en) 2006-06-09 2009-10-27 Cascade Microtech, Inc. Differential signal probe with integral balun
US7723999B2 (en) 2006-06-12 2010-05-25 Cascade Microtech, Inc. Calibration structures for differential signal probing
US7750652B2 (en) 2006-06-12 2010-07-06 Cascade Microtech, Inc. Test structure and probe for differential signals
US7764072B2 (en) 2006-06-12 2010-07-27 Cascade Microtech, Inc. Differential signal probing system
US7443186B2 (en) 2006-06-12 2008-10-28 Cascade Microtech, Inc. On-wafer test structures for differential signals
US7403028B2 (en) 2006-06-12 2008-07-22 Cascade Microtech, Inc. Test structure and probe for differential signals
US7876114B2 (en) 2007-08-08 2011-01-25 Cascade Microtech, Inc. Differential waveguide probe

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