GB2465906A - Device for performing ionization desorption - Google Patents
Device for performing ionization desorption Download PDFInfo
- Publication number
- GB2465906A GB2465906A GB1003331A GB201003331A GB2465906A GB 2465906 A GB2465906 A GB 2465906A GB 1003331 A GB1003331 A GB 1003331A GB 201003331 A GB201003331 A GB 201003331A GB 2465906 A GB2465906 A GB 2465906A
- Authority
- GB
- United Kingdom
- Prior art keywords
- group
- groups
- silicon
- germanium
- gallium
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 238000003795 desorption Methods 0.000 title abstract description 6
- 125000002887 hydroxy group Chemical group [H]O* 0.000 claims abstract description 19
- 238000004458 analytical method Methods 0.000 claims abstract description 15
- 239000004065 semiconductor Substances 0.000 claims abstract description 15
- 239000000126 substance Substances 0.000 claims abstract description 9
- 238000011282 treatment Methods 0.000 claims abstract description 9
- CBENFWSGALASAD-UHFFFAOYSA-N Ozone Chemical compound [O-][O+]=O CBENFWSGALASAD-UHFFFAOYSA-N 0.000 claims abstract description 8
- 102000004190 Enzymes Human genes 0.000 claims abstract description 7
- 108090000790 Enzymes Proteins 0.000 claims abstract description 7
- 238000010438 heat treatment Methods 0.000 claims abstract description 7
- 238000000608 laser ablation Methods 0.000 claims abstract description 7
- 230000006378 damage Effects 0.000 claims abstract description 5
- 125000004435 hydrogen atom Chemical group [H]* 0.000 claims abstract description 4
- 125000000217 alkyl group Chemical group 0.000 claims description 52
- 239000000758 substrate Substances 0.000 claims description 39
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical group [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 34
- 229910052710 silicon Inorganic materials 0.000 claims description 33
- 239000010703 silicon Substances 0.000 claims description 33
- 229910052732 germanium Chemical group 0.000 claims description 25
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical group [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 claims description 25
- 125000003118 aryl group Chemical group 0.000 claims description 22
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical group [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 claims description 20
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical group [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 claims description 20
- 229910052733 gallium Chemical group 0.000 claims description 20
- 239000007864 aqueous solution Substances 0.000 claims description 15
- -1 cyano, amino Chemical group 0.000 claims description 15
- 229910052736 halogen Inorganic materials 0.000 claims description 14
- 150000002367 halogens Chemical class 0.000 claims description 14
- 238000000034 method Methods 0.000 claims description 14
- 125000003545 alkoxy group Chemical group 0.000 claims description 13
- 229910052785 arsenic Chemical group 0.000 claims description 12
- 239000000203 mixture Substances 0.000 claims description 12
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical group [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 11
- 239000001257 hydrogen Substances 0.000 claims description 11
- 229910052739 hydrogen Inorganic materials 0.000 claims description 11
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 claims description 11
- 150000001720 carbohydrates Chemical class 0.000 claims description 9
- 229910052799 carbon Chemical group 0.000 claims description 9
- 108090000765 processed proteins & peptides Proteins 0.000 claims description 9
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims description 8
- 125000004122 cyclic group Chemical group 0.000 claims description 8
- 238000004519 manufacturing process Methods 0.000 claims description 8
- 229910052760 oxygen Inorganic materials 0.000 claims description 8
- 239000001301 oxygen Substances 0.000 claims description 8
- 108090000623 proteins and genes Proteins 0.000 claims description 8
- 102000004169 proteins and genes Human genes 0.000 claims description 8
- 150000001450 anions Chemical class 0.000 claims description 7
- 150000001768 cations Chemical class 0.000 claims description 7
- 150000004678 hydrides Chemical class 0.000 claims description 7
- 150000007523 nucleic acids Chemical group 0.000 claims description 7
- KXDHJXZQYSOELW-UHFFFAOYSA-M Carbamate Chemical compound NC([O-])=O KXDHJXZQYSOELW-UHFFFAOYSA-M 0.000 claims description 6
- XSQUKJJJFZCRTK-UHFFFAOYSA-N Urea Chemical compound NC(N)=O XSQUKJJJFZCRTK-UHFFFAOYSA-N 0.000 claims description 6
- 150000001336 alkenes Chemical class 0.000 claims description 6
- 150000001408 amides Chemical class 0.000 claims description 6
- 239000004202 carbamide Substances 0.000 claims description 6
- 125000002915 carbonyl group Chemical group [*:2]C([*:1])=O 0.000 claims description 6
- 150000001875 compounds Chemical class 0.000 claims description 6
- ZWWCURLKEXEFQT-UHFFFAOYSA-N dinitrogen pentaoxide Chemical compound [O-][N+](=O)O[N+]([O-])=O ZWWCURLKEXEFQT-UHFFFAOYSA-N 0.000 claims description 6
- 150000002009 diols Chemical class 0.000 claims description 6
- 150000002118 epoxides Chemical class 0.000 claims description 6
- 125000004469 siloxy group Chemical group [SiH3]O* 0.000 claims description 6
- 125000000472 sulfonyl group Chemical group *S(*)(=O)=O 0.000 claims description 6
- 229940126062 Compound A Drugs 0.000 claims description 5
- NLDMNSXOCDLTTB-UHFFFAOYSA-N Heterophylliin A Natural products O1C2COC(=O)C3=CC(O)=C(O)C(O)=C3C3=C(O)C(O)=C(O)C=C3C(=O)OC2C(OC(=O)C=2C=C(O)C(O)=C(O)C=2)C(O)C1OC(=O)C1=CC(O)=C(O)C(O)=C1 NLDMNSXOCDLTTB-UHFFFAOYSA-N 0.000 claims description 5
- 125000000956 methoxy group Chemical group [H]C([H])([H])O* 0.000 claims description 3
- 239000012488 sample solution Substances 0.000 claims description 3
- 239000000243 solution Substances 0.000 claims description 3
- 229910000577 Silicon-germanium Inorganic materials 0.000 claims description 2
- LEVVHYCKPQWKOP-UHFFFAOYSA-N [Si].[Ge] Chemical group [Si].[Ge] LEVVHYCKPQWKOP-UHFFFAOYSA-N 0.000 claims description 2
- 230000001846 repelling effect Effects 0.000 claims description 2
- 238000000816 matrix-assisted laser desorption--ionisation Methods 0.000 abstract description 17
- 208000035699 Distal ileal obstruction syndrome Diseases 0.000 abstract description 4
- 230000002209 hydrophobic effect Effects 0.000 abstract description 3
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 abstract description 2
- 229910000077 silane Inorganic materials 0.000 abstract description 2
- AKYGPHVLITVSJE-UHFFFAOYSA-N chloro-dimethyl-(3,3,4,4,5,5,6,6,7,7,8,8,8-tridecafluorooctyl)silane Chemical compound C[Si](C)(Cl)CCC(F)(F)C(F)(F)C(F)(F)C(F)(F)C(F)(F)C(F)(F)F AKYGPHVLITVSJE-UHFFFAOYSA-N 0.000 abstract 1
- 239000000523 sample Substances 0.000 description 25
- 125000004432 carbon atom Chemical group C* 0.000 description 15
- WEVYAHXRMPXWCK-UHFFFAOYSA-N Acetonitrile Chemical compound CC#N WEVYAHXRMPXWCK-UHFFFAOYSA-N 0.000 description 12
- 125000000623 heterocyclic group Chemical group 0.000 description 9
- 150000002500 ions Chemical class 0.000 description 8
- 125000002723 alicyclic group Chemical group 0.000 description 7
- 125000001931 aliphatic group Chemical group 0.000 description 7
- 125000003342 alkenyl group Chemical group 0.000 description 7
- 125000004414 alkyl thio group Chemical group 0.000 description 7
- 235000014633 carbohydrates Nutrition 0.000 description 7
- 125000000753 cycloalkyl group Chemical group 0.000 description 7
- 125000000449 nitro group Chemical group [O-][N+](*)=O 0.000 description 7
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 6
- YLQBMQCUIZJEEH-UHFFFAOYSA-N Furan Chemical group C=1C=COC=1 YLQBMQCUIZJEEH-UHFFFAOYSA-N 0.000 description 6
- JUJWROOIHBZHMG-UHFFFAOYSA-N Pyridine Chemical compound C1=CC=NC=C1 JUJWROOIHBZHMG-UHFFFAOYSA-N 0.000 description 6
- 125000003282 alkyl amino group Chemical group 0.000 description 6
- 229910052731 fluorine Inorganic materials 0.000 description 6
- 239000011737 fluorine Substances 0.000 description 6
- RAXXELZNTBOGNW-UHFFFAOYSA-N imidazole Natural products C1=CNC=N1 RAXXELZNTBOGNW-UHFFFAOYSA-N 0.000 description 6
- 239000011159 matrix material Substances 0.000 description 6
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 6
- KAESVJOAVNADME-UHFFFAOYSA-N 1H-pyrrole Natural products C=1C=CNC=1 KAESVJOAVNADME-UHFFFAOYSA-N 0.000 description 5
- UHOVQNZJYSORNB-UHFFFAOYSA-N Benzene Chemical compound C1=CC=CC=C1 UHOVQNZJYSORNB-UHFFFAOYSA-N 0.000 description 5
- 125000005157 alkyl carboxy group Chemical group 0.000 description 5
- 125000003277 amino group Chemical group 0.000 description 5
- 125000001424 substituent group Chemical group 0.000 description 5
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 4
- KYQCOXFCLRTKLS-UHFFFAOYSA-N Pyrazine Chemical compound C1=CN=CC=N1 KYQCOXFCLRTKLS-UHFFFAOYSA-N 0.000 description 4
- YTPLMLYBLZKORZ-UHFFFAOYSA-N Thiophene Chemical compound C=1C=CSC=1 YTPLMLYBLZKORZ-UHFFFAOYSA-N 0.000 description 4
- 125000000304 alkynyl group Chemical group 0.000 description 4
- 125000004429 atom Chemical group 0.000 description 4
- 125000004093 cyano group Chemical group *C#N 0.000 description 4
- 125000001153 fluoro group Chemical group F* 0.000 description 4
- 150000002431 hydrogen Chemical group 0.000 description 4
- 229910052751 metal Inorganic materials 0.000 description 4
- 239000002184 metal Substances 0.000 description 4
- 125000002924 primary amino group Chemical group [H]N([H])* 0.000 description 4
- 125000002023 trifluoromethyl group Chemical group FC(F)(F)* 0.000 description 4
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 3
- AFVLVVWMAFSXCK-VMPITWQZSA-N alpha-cyano-4-hydroxycinnamic acid Chemical compound OC(=O)C(\C#N)=C\C1=CC=C(O)C=C1 AFVLVVWMAFSXCK-VMPITWQZSA-N 0.000 description 3
- 150000001413 amino acids Chemical class 0.000 description 3
- 125000003710 aryl alkyl group Chemical group 0.000 description 3
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 3
- 125000001183 hydrocarbyl group Chemical group 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 229910052757 nitrogen Inorganic materials 0.000 description 3
- 125000004430 oxygen atom Chemical group O* 0.000 description 3
- 229920000642 polymer Polymers 0.000 description 3
- UMJSCPRVCHMLSP-UHFFFAOYSA-N pyridine Natural products COC1=CC=CN=C1 UMJSCPRVCHMLSP-UHFFFAOYSA-N 0.000 description 3
- 125000003396 thiol group Chemical class [H]S* 0.000 description 3
- KDCGOANMDULRCW-UHFFFAOYSA-N 7H-purine Chemical compound N1=CNC2=NC=NC2=C1 KDCGOANMDULRCW-UHFFFAOYSA-N 0.000 description 2
- RGSFGYAAUTVSQA-UHFFFAOYSA-N Cyclopentane Chemical compound C1CCCC1 RGSFGYAAUTVSQA-UHFFFAOYSA-N 0.000 description 2
- PXGOKWXKJXAPGV-UHFFFAOYSA-N Fluorine Chemical compound FF PXGOKWXKJXAPGV-UHFFFAOYSA-N 0.000 description 2
- ZCQWOFVYLHDMMC-UHFFFAOYSA-N Oxazole Chemical compound C1=COC=N1 ZCQWOFVYLHDMMC-UHFFFAOYSA-N 0.000 description 2
- 229910019142 PO4 Inorganic materials 0.000 description 2
- PCNDJXKNXGMECE-UHFFFAOYSA-N Phenazine Natural products C1=CC=CC2=NC3=CC=CC=C3N=C21 PCNDJXKNXGMECE-UHFFFAOYSA-N 0.000 description 2
- WTKZEGDFNFYCGP-UHFFFAOYSA-N Pyrazole Chemical compound C=1C=NNC=1 WTKZEGDFNFYCGP-UHFFFAOYSA-N 0.000 description 2
- CZPWVGJYEJSRLH-UHFFFAOYSA-N Pyrimidine Chemical compound C1=CN=CN=C1 CZPWVGJYEJSRLH-UHFFFAOYSA-N 0.000 description 2
- SMWDFEZZVXVKRB-UHFFFAOYSA-N Quinoline Chemical compound N1=CC=CC2=CC=CC=C21 SMWDFEZZVXVKRB-UHFFFAOYSA-N 0.000 description 2
- FZWLAAWBMGSTSO-UHFFFAOYSA-N Thiazole Chemical compound C1=CSC=N1 FZWLAAWBMGSTSO-UHFFFAOYSA-N 0.000 description 2
- 230000021736 acetylation Effects 0.000 description 2
- 238000006640 acetylation reaction Methods 0.000 description 2
- 238000007792 addition Methods 0.000 description 2
- 125000001797 benzyl group Chemical group [H]C1=C([H])C([H])=C(C([H])=C1[H])C([H])([H])* 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 125000003917 carbamoyl group Chemical group [H]N([H])C(*)=O 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 239000012141 concentrate Substances 0.000 description 2
- 150000001925 cycloalkenes Chemical class 0.000 description 2
- ZSWFCLXCOIISFI-UHFFFAOYSA-N cyclopentadiene Chemical compound C1C=CC=C1 ZSWFCLXCOIISFI-UHFFFAOYSA-N 0.000 description 2
- 230000001747 exhibiting effect Effects 0.000 description 2
- 239000007789 gas Substances 0.000 description 2
- 125000001072 heteroaryl group Chemical group 0.000 description 2
- 125000005842 heteroatom Chemical group 0.000 description 2
- 230000033444 hydroxylation Effects 0.000 description 2
- 238000005805 hydroxylation reaction Methods 0.000 description 2
- 125000001041 indolyl group Chemical group 0.000 description 2
- 230000003993 interaction Effects 0.000 description 2
- 238000005040 ion trap Methods 0.000 description 2
- AWJUIBRHMBBTKR-UHFFFAOYSA-N isoquinoline Chemical compound C1=NC=CC2=CC=CC=C21 AWJUIBRHMBBTKR-UHFFFAOYSA-N 0.000 description 2
- 230000029226 lipidation Effects 0.000 description 2
- 239000010452 phosphate Substances 0.000 description 2
- 230000026731 phosphorylation Effects 0.000 description 2
- 238000006366 phosphorylation reaction Methods 0.000 description 2
- 125000003386 piperidinyl group Chemical group 0.000 description 2
- 239000002952 polymeric resin Substances 0.000 description 2
- 229920001343 polytetrafluoroethylene Polymers 0.000 description 2
- 239000004810 polytetrafluoroethylene Substances 0.000 description 2
- 230000013823 prenylation Effects 0.000 description 2
- 230000017854 proteolysis Effects 0.000 description 2
- PBMFSQRYOILNGV-UHFFFAOYSA-N pyridazine Chemical compound C1=CC=NN=C1 PBMFSQRYOILNGV-UHFFFAOYSA-N 0.000 description 2
- 125000000719 pyrrolidinyl group Chemical group 0.000 description 2
- 125000000168 pyrrolyl group Chemical group 0.000 description 2
- 125000000547 substituted alkyl group Chemical group 0.000 description 2
- 235000000346 sugar Nutrition 0.000 description 2
- 230000019635 sulfation Effects 0.000 description 2
- 238000005670 sulfation reaction Methods 0.000 description 2
- 229920003002 synthetic resin Polymers 0.000 description 2
- 229930192474 thiophene Natural products 0.000 description 2
- 150000003852 triazoles Chemical class 0.000 description 2
- 239000003643 water by type Substances 0.000 description 2
- KKZUMAMOMRDVKA-UHFFFAOYSA-N 2-chloropropane Chemical group [CH2]C(C)Cl KKZUMAMOMRDVKA-UHFFFAOYSA-N 0.000 description 1
- 102000007698 Alcohol dehydrogenase Human genes 0.000 description 1
- 108010021809 Alcohol dehydrogenase Proteins 0.000 description 1
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 1
- XDTMQSROBMDMFD-UHFFFAOYSA-N Cyclohexane Chemical compound C1CCCCC1 XDTMQSROBMDMFD-UHFFFAOYSA-N 0.000 description 1
- LVZWSLJZHVFIQJ-UHFFFAOYSA-N Cyclopropane Chemical compound C1CC1 LVZWSLJZHVFIQJ-UHFFFAOYSA-N 0.000 description 1
- WSFSSNUMVMOOMR-UHFFFAOYSA-N Formaldehyde Chemical compound O=C WSFSSNUMVMOOMR-UHFFFAOYSA-N 0.000 description 1
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- 229910003827 NRaRb Inorganic materials 0.000 description 1
- 229920002472 Starch Polymers 0.000 description 1
- QAOWNCQODCNURD-UHFFFAOYSA-L Sulfate Chemical group [O-]S([O-])(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-L 0.000 description 1
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 description 1
- 230000002378 acidificating effect Effects 0.000 description 1
- 125000004442 acylamino group Chemical group 0.000 description 1
- 125000004453 alkoxycarbonyl group Chemical group 0.000 description 1
- 125000005194 alkoxycarbonyloxy group Chemical group 0.000 description 1
- 125000004947 alkyl aryl amino group Chemical group 0.000 description 1
- 125000003806 alkyl carbonyl amino group Chemical group 0.000 description 1
- 125000004448 alkyl carbonyl group Chemical group 0.000 description 1
- 125000005196 alkyl carbonyloxy group Chemical group 0.000 description 1
- 125000003368 amide group Chemical group 0.000 description 1
- 125000001769 aryl amino group Chemical group 0.000 description 1
- 125000004658 aryl carbonyl amino group Chemical group 0.000 description 1
- 125000005199 aryl carbonyloxy group Chemical group 0.000 description 1
- 125000005200 aryloxy carbonyloxy group Chemical group 0.000 description 1
- 125000004104 aryloxy group Chemical group 0.000 description 1
- 125000000852 azido group Chemical group *N=[N+]=[N-] 0.000 description 1
- 150000001555 benzenes Chemical class 0.000 description 1
- 125000000499 benzofuranyl group Chemical group O1C(=CC2=C1C=CC=C2)* 0.000 description 1
- 125000001164 benzothiazolyl group Chemical group S1C(=NC2=C1C=CC=C2)* 0.000 description 1
- 125000000051 benzyloxy group Chemical group [H]C1=C([H])C([H])=C(C([H])=C1[H])C([H])([H])O* 0.000 description 1
- 125000001951 carbamoylamino group Chemical group C(N)(=O)N* 0.000 description 1
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 description 1
- 150000007942 carboxylates Chemical class 0.000 description 1
- 125000002843 carboxylic acid group Chemical group 0.000 description 1
- QABCGOSYZHCPGN-UHFFFAOYSA-N chloro(dimethyl)silicon Chemical compound C[Si](C)Cl QABCGOSYZHCPGN-UHFFFAOYSA-N 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 125000000332 coumarinyl group Chemical group O1C(=O)C(=CC2=CC=CC=C12)* 0.000 description 1
- KDUIUFJBNGTBMD-VXMYFEMYSA-N cyclooctatetraene Chemical compound C1=C\C=C/C=C\C=C1 KDUIUFJBNGTBMD-VXMYFEMYSA-N 0.000 description 1
- 125000004663 dialkyl amino group Chemical group 0.000 description 1
- 125000004986 diarylamino group Chemical group 0.000 description 1
- 238000003379 elimination reaction Methods 0.000 description 1
- 235000019256 formaldehyde Nutrition 0.000 description 1
- 125000002541 furyl group Chemical group 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- DMEGYFMYUHOHGS-UHFFFAOYSA-N heptamethylene Natural products C1CCCCCC1 DMEGYFMYUHOHGS-UHFFFAOYSA-N 0.000 description 1
- 229920001600 hydrophobic polymer Polymers 0.000 description 1
- 230000005661 hydrophobic surface Effects 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 125000002883 imidazolyl group Chemical group 0.000 description 1
- 125000000959 isobutyl group Chemical group [H]C([H])([H])C([H])(C([H])([H])[H])C([H])([H])* 0.000 description 1
- 125000001449 isopropyl group Chemical group [H]C([H])([H])C([H])(*)C([H])([H])[H] 0.000 description 1
- 238000003754 machining Methods 0.000 description 1
- 238000004949 mass spectrometry Methods 0.000 description 1
- 229910001092 metal group alloy Inorganic materials 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 125000004573 morpholin-4-yl group Chemical group N1(CCOCC1)* 0.000 description 1
- 125000004108 n-butyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 125000004123 n-propyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 150000002790 naphthalenes Chemical class 0.000 description 1
- 125000001624 naphthyl group Chemical group 0.000 description 1
- 125000004433 nitrogen atom Chemical group N* 0.000 description 1
- 102000039446 nucleic acids Human genes 0.000 description 1
- 108020004707 nucleic acids Proteins 0.000 description 1
- 239000002773 nucleotide Substances 0.000 description 1
- 125000003729 nucleotide group Chemical group 0.000 description 1
- 150000002894 organic compounds Chemical class 0.000 description 1
- 125000002971 oxazolyl group Chemical group 0.000 description 1
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 1
- NBIIXXVUZAFLBC-UHFFFAOYSA-K phosphate Chemical compound [O-]P([O-])([O-])=O NBIIXXVUZAFLBC-UHFFFAOYSA-K 0.000 description 1
- 125000003367 polycyclic group Chemical group 0.000 description 1
- 102000004196 processed proteins & peptides Human genes 0.000 description 1
- 125000003373 pyrazinyl group Chemical group 0.000 description 1
- 125000004076 pyridyl group Chemical group 0.000 description 1
- 125000000714 pyrimidinyl group Chemical group 0.000 description 1
- 125000002943 quinolinyl group Chemical group N1=C(C=CC2=CC=CC=C12)* 0.000 description 1
- 125000005493 quinolyl group Chemical group 0.000 description 1
- 229910052702 rhenium Inorganic materials 0.000 description 1
- 229920006395 saturated elastomer Polymers 0.000 description 1
- 229930195734 saturated hydrocarbon Natural products 0.000 description 1
- 125000002914 sec-butyl group Chemical group [H]C([H])([H])C([H])([H])C([H])(*)C([H])([H])[H] 0.000 description 1
- 238000006884 silylation reaction Methods 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 238000003892 spreading Methods 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 235000019698 starch Nutrition 0.000 description 1
- 125000005346 substituted cycloalkyl group Chemical group 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 150000008163 sugars Chemical class 0.000 description 1
- 125000005420 sulfonamido group Chemical group S(=O)(=O)(N*)* 0.000 description 1
- 229910052717 sulfur Inorganic materials 0.000 description 1
- 239000011593 sulfur Substances 0.000 description 1
- 125000004434 sulfur atom Chemical group 0.000 description 1
- 125000000999 tert-butyl group Chemical group [H]C([H])([H])C(*)(C([H])([H])[H])C([H])([H])[H] 0.000 description 1
- 125000003718 tetrahydrofuranyl group Chemical group 0.000 description 1
- 125000001412 tetrahydropyranyl group Chemical group 0.000 description 1
- 125000000335 thiazolyl group Chemical group 0.000 description 1
- 125000001544 thienyl group Chemical group 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
- 230000003245 working effect Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
- H01J49/0409—Sample holders or containers
- H01J49/0418—Sample holders or containers for laser desorption, e.g. matrix-assisted laser desorption/ionisation [MALDI] plates or surface enhanced laser desorption/ionisation [SELDI] plates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
- H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
- H01J49/164—Laser desorption/ionisation, e.g. matrix-assisted laser desorption/ionisation [MALDI]
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01L—CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
- B01L3/00—Containers or dishes for laboratory use, e.g. laboratory glassware; Droppers
- B01L3/50—Containers for the purpose of retaining a material to be analysed, e.g. test tubes
- B01L3/508—Containers for the purpose of retaining a material to be analysed, e.g. test tubes rigid containers not provided for above
- B01L3/5085—Containers for the purpose of retaining a material to be analysed, e.g. test tubes rigid containers not provided for above for multiple samples, e.g. microtitration plates
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- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Abstract
A device for the presentation of aqueous samples for analysis by desorption ionization, such as MALDI or DIOS, comprising a semiconductor wafer body 12 comprising a first surface 13 and plural second surfaces 14 which are surrounded by the first surface, where the second surfaces are formed by partial destruction of the first surface. The second surfaces are more hydrophilic than the first surface, and the first surface is more hydrophobic than the second surfaces so that upon application of aqueous sample to the first surface, the sample is directed towards and concentrated at the second surfaces. The second surfaces may be oxidized by ozone, and may be formed by heat treatment, chemical or enzyme treatment, or preferably laser ablation. The first surface may be functionalized with a silane, preferably (tridecafluoro-1,1,2,2-tetrahydrooctyl)dimethylchlorosilane, and the second surface may be functionalized with a hydrogen atom or hydroxyl moiety.
Description
DEVICE AND METHOD FOR PERFORMING IONIZATION DESORPTION ON
SILICON DERIVATIVES
FIELD OF THE INVENTION
The present invention is directed to a substrate for presenting a sample for desorption ionisation and to a method of making such substrate. These substrates are primarily used in laser equipped mass spectrometry instruments.
Substrates of the present invention provide consistent results after repeated use.
BACKGROUND OF THE INVENTION
Electrically conductive substrates are used with laser equipped mass spectrometers to perform analysis of samples. The substrate is usually in the form of a chip or plate having dimensions of approximately three to five centimetres long and wide and a thickness of approximately 0.5 to 5 millimetres. Sample, generally in the form of an aqueous solution, in which one or more substance is dissolved, is received on the substrate. In the case of matrix-assisted laser desorption ionization (MALDI) a radiation-adsorbing (or matrix) compound is also received on the substrate, to assist ionization. The substrate is placed in a holder in close proximity to the inlet of a mass spectrometer. A laser pulse is directed to the sample and a portion of the sample is ionized and vaporized from the surface of the substrate by the laser. * * S...
As used herein, the term "vaporized" means rendered into a gaseous state.
The term "ionized" means having a positive or negative charge.
A further portion of the ionized sample is received by the mass analyzer, for example a time-of-flight (TOF) mass spectrometer. The mass spectrometer :5: provides information as to the mass and charge of the ionized molecules that S..
* 30 comprise the sample.
I r
As used herein, the term "MALDI" refers to matrix assisted desorption ionization and the determination of mass and charge information of ions formed by laser ionisation. Such mass and charge information is typically in the form of a mass-to-charge ratio.
As used herein, the term "DIOS" refers to desorption ionization on silicon and the determination of mass and charge information of ions formed by laser ionization. Such mass and charge information is typically in the form of a mass to charge ratio.
Substrates are usually made from metals or metal alloys such as stainless steel. Such metal substrates are often coated with a hydrophobic polymer such as polytetrafluoroethylene (PTFE) to prevent aqueous sample from spreading out across the surface. Some substrates incorporate small, hydrophilic spots at points on the hydrophobic surface to aid the receiving of samples.
Metal substrates however can be expensive and difficult to manufacture, as significant machining is required to polish them to the necessary tolerances for MALDI analysis. The expense of metal substrates makes it undesirable to dispose of them after use, requiring analysts to spend valuable time cleaning substrates. Embodiments of the present invention provide a cheap and easily manufactured substrate, suitable as a single use product for MALDI analysis.
*...** 25 The term "aliphatic group" includes organic compounds characterized by straight or branched chains, typically having between 1 and 22 carbon atoms.
Aliphatic groups include alkyl groups, alkenyl groups and alkynyl groups. In complex structures, the chains can be branched or cross-linked. Alkyl groups include saturated hydrocarbons having one or more carbon atoms, including straight-chain alkyl groups and branched-chain alkyl groups. Such hydrocarbon moieties may be substituted on one or more carbons with, for example, a halogen, a hydroxyl, a thiol, an amino, an alkoxy, an alkylcarboxy,
I
an alkylthio, or a nitro group. Unless the number of carbons is otherwise specified, "lower aliphatic" as used herein means an aliphatic group, as defined above (e.g., lower alkyl, lower alkenyl, lower alkynyl), but having from one to six carbon atoms. Representative of such lower aliphatic groups, e.g., lower alkyl groups, are methyl, ethyl, n-propyl, isopropyl, 2-chloropropyl, n-butyl, sec-butyl, 2-aminobutyl, isobutyl, tert-butyl, 3-thiopentyl, and the like.
As used herein, the term "nitro" means -NO2; the term "halogen" designates -F, -Cl, -Br or -I; the term "thiol" means SH; and the term "hydroxyl" means -OH.
The term "alicyclic group" includes closed ring structures of three or more carbon atoms. Alicyclic groups include cycloparaffins which are saturated cyclic hydrocarbons, cycloolefins and naphthalenes which are unsaturated with two or more double bonds, and cycloacetylenes which have a triple bond.
They do not include aromatic groups. Examples of cycloparaffins include cyclopropane, cyclohexane, and cyclopentane. Examples of cycloolefins include cyclopentadiene and cyclooctatetraene. Alicyclic groups also include fused ring structures and substituted alicyclic groups such as alkyl substituted alicyclic groups. In the instance of the alicyclics such substituents can further comprise a lower alkyl, a lower alkenyl, a lower alkoxy, a lower alkylthio, a lower alkylamino, a lower alkylcarboxyl, a nitro, a hydroxyl, -CF3, -CN, or the like.
The term "heterocyclic group" includes closed ring structures in which one or more of the atoms in the ring is an element other than carbon, for example, nitrogen, sulfur, or oxygen. Heterocyclic groups can be saturated or unsaturated and heterocyclic groups such as pyrrole and furan can have aromatic character. They include fused ring structures such as quinoline and isoquinoline. Other examples of heterocyclic groups include pyridine and purine. Heterocyclic groups can also be substituted at one or more constituent atoms with, for example, a halogen, a lower alkyl, a lower alkenyl, a lower alkoxy, a lower alkylthio, a lower alkylamino, a lower alkylcarboxyl, a nitro, a r hydroxyl, -CF3, -CN, or the like. Suitable heteroaromatic and heteroalicyclic groups generally will have I to 3 separate or fused rings with 3 to about 8 members per ring and one or more N, 0 or S atoms, e.g. coumarinyl, quinolinyl, pyridyl, pyrazinyl, pyrimidyl, furyl, pyrrolyl, thienyl, thiazolyl, oxazolyl, imidazolyl, indolyl, benzofuranyl, benzothiazolyl, tetrahydrofuranyl, tetrahydropyranyl, piperidinyl, morpholino and pyrrolidinyl.
The term "aromatic group" includes unsaturated cyclic hydrocarbons containing one or more rings. Aromatic groups include 5-and 6-membered single-ring groups which may include from zero to four heteroatoms, for example, benzene, pyrrole, furan, thiophene, imidazole, oxazole, thiazole, triazole, pyrazole, pyridine, pyrazine, pyridazine and pyrimidine, and the like. The aromatic ring may be substituted at one or more ring positions with, for example, a halogen, a lower alkyl, a lower alkenyl, a lower alkoxy, a lower alkylthio, a lower alkylamino, a lower alkylcarboxyl, a nitro, a hydroxyl, -CF3, -CN, or the like.
The term "alkyl" includes saturated aliphatic groups, including straight-chain alkyl groups, branched-chain alkyl groups, cycloalkyl (alicyclic) groups, alkyl substituted cycloalkyl groups, and cycloalkyl substituted alkyl groups. In preferred embodiments, a straight chain or branched chain alkyl has 20 or fewer carbon atoms in its backbone (e.g., C1-C20 for straight chain, C3-C20 for branched chain), and more preferably 12 or fewer. Likewise, preferred cycloalkyls have from 4-10 carbon atoms in their ring structure, and more m.25 preferably have 4-7 carbon atoms in the ring structure. The term "lower alkyl" refers to alkyl groups having from I to 6 carbons in the chain, and to cycloalkyls having from 3 to 6 carbons in the ring structure.
Moreover, the term "alkyl" (including "lower alkyl") as used throughout the specification and claims includes both "unsubstituted alkyls" and "substituted alkyls", the latter of which refers to alkyl moieties having substituents replacing a hydrogen on one or more carbons of the hydrocarbon backbone. Such substituents can include, for example, halogen, hydroxyl, alkylcarbonyloxy, arylcarbonyloxy, alkoxycarbonyloxy, aryloxycarbonyloxy, carboxylate, alkylcarbonyl, alkoxycarbonyl, aminocarbonyl, alkyithiocarbonyl, alkoxyl, phosphate, phosphonato, phosphinato, cyano, amino (including alkyl amino, dialkylamino, arylamino, diarylamino, and alkylarylamino), acylamino (including alkylcarbonylamino, arylcarbonylamino, carbamoyl and ureido), amidino, imino, su Ithyd ryl, alkylthio, aryith io, th iocarboxylate, sulfate, sulfonato, sulfamoyl, sulfonamido, nitro, trifluoromethyl, cyano, azido, heterocyclyl, aralkyl, or an aromatic or heteroaromatic moiety. It will be understood by those skilled in the art that the moieties substituted on the hydrocarbon chain can themselves be substituted, if appropriate. Cycloalkyls can be further substituted, e.g., with the substituents described above. An "aralkyl" moiety is an alkyl substituted with an aryl, e.g., having I to 3 separate or fused rings and from 6 to about 18 carbon ring atoms, (e.g., phenylmethyl (benzyl)).
The term "alkylamino" as used herein means an alkyl group, as defined herein, having an amino group attached thereto. Suitable alkylamino groups include groups having 1 to about 12 carbon atoms, preferably from 1 to about 6 carbon atoms. The term "alkylthio" refers to an alkyl group, as defined above, having a sulfhydryl group attached thereto. Suitable alkylthio groups include groups having I to about 12 carbon atoms, preferably from I to about 6 carbon atoms.
The term "alkylcarboxyl" as used herein means an alkyl group, as defined above, having a carboxyl group attached thereto. The term "alkoxy" as used herein means an alkyl group, as defined above, having an oxygen atom *....* 25 attached thereto. Representative alkoxy groups include groups having 1 to about 12 carbon atoms, preferably 1 to about 6 carbon atoms, e.g., methoxy, ethoxy, propoxy, tert-butoxy and the like. The terms "alkenyl" and "alkynyl" *. ** * * refer to unsaturated aliphatic groups analogous to alkyls, but which contain at least one double or triple bond respectively. Suitable alkenyl and alkynyl groups include groups having 2 to about 12 carbon atoms, preferably from 1 to about 6 carbon atoms.
S (
The term "aryl" includes 5-and 6-membered single-ring aromatic groups that may include from zero to four heteroatoms, for example, unsubstituted or substituted benzene, pyrrole, furan, thiophene, imidazole, oxazole, thiazole, triazole, pyrazole, pyridine, pyrazine, pyridazine and pyrimidine, and the like.
Aryl groups also include polycyclic fused aromatic groups such as naphthyl, quinolyl, indolyl, and the like. The aromatic ring can be substituted at one or more ring positions with such substituents, e.g., as described above for alkyl groups. Suitable aryl groups include unsubstituted and substituted phenyl groups. The term "aryloxy" as used herein means an aryl group, as defined above, having an oxygen atom attached thereto. The term "aralkoxy" as used herein means an aralkyl group, as defined above, having an oxygen atom attached thereto. Suitable aralkoxy groups have 1 to 3 separate or fused rings and from 6 to about 18 carbon ring atoms, e.g., O-benzyl.
The term "amino," as used herein, refers to an unsubstituted or substituted moiety of the formula -NRaRb, in which Ra and Rb are each independently hydrogen, alkyl, aryl, or heterocyclyl, or Ra and Rb, taken together with the nitrogen atom to which they are attached, form a cyclic moiety having from 3 to 8 atoms in the ring. Thus, the term "amino" includes cyclic amino moieties such as piperidinyl or pyrrolidinyl groups, unless otherwise stated. An "amino-substituted amino group" refers to an amino group in which at least one of Ra and Rb, is further substituted with an amino group.
The term "amino acid" as used herein, refers to a moiety containing an amino **., 25 group and a carboxylic acid group. The term "amino acid" as used herein, may more specifically refer to a member of a group of 20 natural molecules of the :.. formula HNRd-CReRrCOOH, in which Rd, Re and Rf are each independently * hydrogen, alkyl, aryl or heterocyclyl, substituted or unsubstituted, or Rd and Rf * taken together, with the carbon to which R is attached and the nitrogen to which Rd is attached, form a cyclic moiety having three to eight atoms in the
I ***
I
The term "peptide" as used herein, refers to a polymeric chain of two or more amino acids, each linked by an amide group represented by the formula -COONRa, where Ra refers to hydrogen or any possible side-chain. A peptide may also include a number of modifications, including phosphorylation, lipidation, prenylation, sulfation, hydroxylation, acetylation, addition of carbohydrate, addition of prosthetic groups or cofactors, formation of disulfide bonds, proteolysis, assembly into macromolecular complexes and the like.
The term "protein" as used herein, refers to a polymeric chain of peptides. A protein may also include a number of modifications, including phosphorylation, lipidation, prenylation, sulfation, hydroxylation, acetylation, addition of carbohydrate, addition of prosthetic groups or cofactors, formation of disulfide bonds, proteolysis, assembly into macromolecular complexes and the like.
The term "nucleic acid" as used herein, refers to a polymer made up of nucleotides, themselves made up of a heterocyclic base, a sugar and a phosphate ester.
The term "carbohydrate" refers to an organic molecule containing carbon, hydrogen and oxygen, usually with the empirical formula CH2O, such as starches or sugars.
The term "cation exchanger" as used herein, refers to an unreactive, organic or inorganic, polymer resin having an acidic residue substituted into the matrix. * I Ills
The term "anion exchanger" as used herein, refers to an unreactive, organic or inorganic, polymer resin having a basic residue substituted into the matrix. 5l * I I * *
The term "leaving group" as used herein, refers to a group capable of being displaced from a molecule when said molecule undergoes a substitution or elimination reaction. I..
I
SUMMARY OF THE INVENTION
The present invention is directed to a substrate for performing MALDI or DIOS, and to a method of making such substrates.
One aspect of the present invention provides a device for the presentation of aqueous samples for analysis which device comprises, a semiconductor wafer body having a planar face including a first surface which exhibits a low affinity to aqueous solutions for repelling such solutions and second surfaces provided by treatment which includes partial destruction of a plurality of portions of the first surface to create a plurality of second surfaces arranged in a pattern on, and completely surrounded by, the first surface and whose composition is such that the second surfaces have a higher affinity to aqueous solutions than the first surface and wherein the arrangement of the second surfaces relative to the first surface is such that sample solution applied to the first surface will be directed onto, and concentrated by, the second surfaces. Preferably, the created second surfaces are oxidised.
According to a feature of this aspect of the invention, the second surfaces may be created by laser ablution of the first surface. Alternatively, the second surfaces may be created by heat treatment of the first surface. Alternatively, the second surfaces may be created by chemical or enzyme treatment of the first surface. S. 25
According to another feature of this aspect of the invention, the first surface may have a composition as described below: S..
S S. *
S n
where X is silicon or germanium or gallium or arsenic and Y is hydrogen or hydroxyl or Z, between 5mol% and 5Omol% of Y being Z, where Z is-O-WR1R2R3, wherein W is silicon germanium or carbon, groups R1, R2 and R3 are selected from the group consisting of C1 to C25 straight, cyclic or branched alkyl, alkene, aryl, alkoxyl, hydroxyl or siloxyl group, where the groups R1, R2 and R3are unsubstituted or substituted, fully or partially with one or more moieties selected from the group comprising halogen, cyano, amino, diol, nitro, ether, carbonyl, epoxide, sulfonyl, cation exchanger, anion exchanger, carbamate, amide, urea, peptide, protein, carbohydrate or nucleic acid functionalities, where the letter "n" represents the repetition of the above structure across said surface and the letter "s" represents silicon or germanium or gallium or arsenic atoms of said semiconductor wafer. Preferably, the mol% of Y being Z is 30-4Omol%.
According to another feature of this aspect of the invention, the R1 group may be partially or fully substituted with fluorine. Preferaby, the R1 group consists of a C5 to C17 straight alkyl group. Preferably, the RI group is unsubstituted at C1 to C2 and fully substituted at C3 to Cm, where m represents an integer from 3 to 17.
According to a further feature of this aspect of the invention, the groups R2 and : 25 R3 may be short alkyl chains. Preferably, the groups R2 and R3 are methyl S..
groups. It is also preferable that the groups R2 and R3 are unsubstituted. *. S S * S
:. According to another feature of this aspect of the invention, the mol% of Z on at least one of said second surface may be less than 5%. Preferably, the mol% of Z on at least one of said second surface is less than I %. Still more preferably, the mol% of Z on at least one of said second surface is less than 0.1%.
Accord ing to yet another feature of this aspect of the invention, the second surfaces each have a composition as described below s+O+1+U where U represents hydroxyl or hydrogen, and where the letter "n" represents the repetition of the above structure across said surface and the letter "s" represents silicon or germanium or gallium or arsenic atoms of said semiconductor wafer. Preferably, the mol% of Y being Z is 30 40mol%.
According to a further feature of this aspect of the invention, the R1 group consist of a C5 to C17 straight alkyl group. Preferably, the R1 group is partially According to a still further feature of this aspect of the invention, the R1 group **** 20 may be unsubstituted at C1 to C2 and fully substituted at C3 to Cm, where m represents an integer from 3 to 17. Preferably, the groups R2 and R3 are short alkyl chains. Preferably, the groups R2 and R3 are methyl groups. It also is * preferable that the groups R2 and R3 are unsubstituted.
*:*. 25 Another aspect of the invention provides a method of making a substrate for *. presentation of samples for analysis, comprising the steps of (i) providing a semiconductor body having a planar face, said planar face having at least one first surface comprising a hydride of silicon or germanium or gallium or arsenic on said substrate, (ii) reacting at least 5 mol% of said hydride with oxygen to form an oxide of silicon or germanium or gallium or arsenic, (iii) reacting the resultant oxide with a compound as shown below R1 r, I3
V
Compound A where V is a halogen, methoxy or any good leaving group, W is silicon or germanium or carbon, R1, R2 and R3 consist of a C1 to C25 straight, cyclic or branched alkyl, alkene, aryl, alkoxyl, hydroxyl or siloxyl group and are unsubstituted or substituted, fully or partially with one or more moieties selected from the group comprising halogen, cyano, amino, diol, nitro, ether, carbonyl, epoxide, sulfonyl, cation exchanger, anion exchanger, carbamate, amide, urea, peptide, protein, carbohydrate or nucleic acid functionalities, such that between 5mol% and 50mol% of said surface has structure Z, demonstrated below R1
R R3 R2 S...
* 1 IAI l1 * "3 S..... * . 0 X n x 0
__ n __ $ or ** I *.
S SI
20 where X is silicon or germanium or gallium or arsenic, where the letter "n" represents the repetition of the above structure across said surface and the letter "s" represents silicon or germanium or gallium or arsenic atoms of said semiconductor wafer, and; wherein said first surface exhibits low affinity to aqueous solutions, (iv) creating at least one second surface on said planar face by partial destruction of said first surface, wherein said second surface has a higher affinity to aqueous solutions than said first surface. Preferably, the R1 group is partially or fully substituted with fluorine. The R1 group may consist of a C5 to C17 straight alkyl group. Preferably, the R1 group is unsubstituted at C1 to C2 and fully substituted at C3 to Cm, where m represents an integer from 3 to 17. It also is preferable that the groups R2 and R3 are short alkyl chains. Preferably, the groups R2 and R3 are methyl groups. It is further preferred that the groups According to another feature of this aspect of the invention, the each second surface may be further oxidised. Preferably, the at least one second surface is further reacted with oxygen in the form of ozone.
According to yet another feature of this aspect of the invention, each second surface may be formed by laser ablation. Alternatively, each second surface may be formed by heat treatment. Alternatively, each second surface may be formed by treatment with a chemical or enzyme.
BRIEF DESCRIPTION OF THE FIGURES
A device and method embodying the invention will now be described, by way of example, with reference to the accompanying drawings, in which:-S..... * *
Figure 1 shows a substrate for performing MALDI; and *:. Figure 2 shows a mass spectrometer equipped with a laser, capable of performing MALDI. S *
* .. DETAILED DESCRIPTION OF THE INVENTION *S.
The present invention will now be described in detail as a substrate for performing MALDI or DIOS, and to a method of making substrates. An embodiment of the present invention will be described with respect to a system in which a sample is ionised and vaporised for use in a mass analyser.
However, those skilled in the art will recognise that the present invention has utility for all applications in which a sample is ionised and vaporised.
With reference to Figure 1, substrate 12 has a planar face 11. The substrate is usually rectangular or square in shape, having dimensions of approximately three to four centimetres in length, four to five centimetres in width and one half millimetre in depth. These dimensions and the shape are not critical to the working of the invention, but reflect current manufacturing and application preferences. It is common to make such substrates 11 with dimensions to cooperate with holders and other laboratory devices.
The planar face 11 of substrate 12 has a first surface 13 for directing a sample towards a plurality of second surfaces 14. One embodiment of the present invention is directed to the composition and working of the first surface 13, and further the composition and workings of the second surface 14.
Substrate 12 is fashioned from a semiconductor such as germanium or gallium arsenide, or more preferably silicon. The first surface 13 has a composition represented by the formula: * *I.. S Y **** _______ * n ****** * * Formula I *. ** : * * 25 *.* * Or ** S * * * * *S * *S s+0_1_Y Formula II X may represent silicon or germanium or gallium or arsenic and Y may represent a hydroxyl group or hydrogen or a further group, Z, between 5mol% and 5Omol% of Y being Z. Z may represent the group -O-WR1R2R3, wherein W is silicon or germanium or carbon. The groups R1, R2 and R3 are selected from the group consisting of C1 to C25 straight, cyclic or branched alkyl, alkene, aryl, alkoxyl, hydroxyl or siloxyl group, where the groups R1, R2 and R3are unsubstituted or substituted, fully or partially with one or more moieties such as halogen, cyano, amino, diol, nitro, ether, carbonyl, epoxide, sulfonyl, cation exchanger, anion exchanger, carbamate, amide, urea, peptide, protein, carbohydrate or nucleic acid functionalities.
More preferably, Z has the formula -O-WR1R2R3, wherein W is silicon, where the group R1 consists of a C5 to C20 straight alkyl chain which may be unsubstituted or substituted, fully or partially with fluorine, and where the groups R2 and R3 consist of unsubstituted methyl or ethyl groups.
Most preferably, Z has the formula -OWR1R2R3, wherein W is silicon, where the group R1 consists of a C5 to C17 straight alkyl chain, unsubstituted at C1 to C2 and fully substituted with fluorine at C3 to Cm, where m represents an integer from 3 to 17, and where the groups R2 and R3 consist of unsubstituted methyl groups. ** * * * * *
Most preferably, the mol% of Y being Z is 3Omol% to 4Omol%. I. S * * *
* * The first surface 13 has a low affinity for aqueous solutions. S..
The composition of the plurality of second surfaces 14 differs from that of the first surface 13. The mol% of Z on the second surfaces 14 may be less than 5mol%.
More preferably, the mol% of Z on the second surfaces 14 may be less than lmol%.
More preferably, the mol% of Z on the second surfaces 14 may be less than 0.lmol%.
Most preferably, the mol% of Z on the second surfaces 14 may be Omol%.
Preferably, the second surfaces 14 have a composition as described below: or _ s+O_U where U represents hydroxyl or hydrogen, the letter "n' represents the repetition of the above structure across said surface and the letter "s" represents silicon or germanium or gallium or arsenic atoms of said .... 20 semiconductor wafer. * *
The chemical composition of the first surface 13 and the second surfaces 14 is * such that the second surfaces 14 have a higher affinity to water or aqueous *** solutions than does the first surface 13. The plurality of second surfaces 14 are 25 arranged in a pattern on the planar face 11 of the substrate 12 and completely * surrounded by the first surface 13, such that the first surface 13 directs an aqueous sample solution onto the second surfaces 14.
The invention also is directed to a method of making a substrate for performing MALDI ionisation. The method comprises the steps of providing a semiconductor body having a planar face. The planar face has at least one first surface comprising a hydride of germanium or gallium or arsenic, or most preferably a hydride of silicon. At least 5 mol% of the hydride is reacted with oxygen, preferably in a reactive form such as ozone, to form an oxide of silicon or germanium or gallium or arsenic. The resultant oxide may be further reacted with a compound as shown below: R1 R3 R2 Compound A Where V is a halogen, methoxy or any good leaving group, and W is silicon or germanium or carbon. The groups R1, R2 and R3 are selected from the group consisting of C1 to C25 straight, cyclic or branched alkyl, alkene, aryl, alkoxyl, hydroxyl or siloxyl group, where the groups R1, R2 and R3 are unsubstituted or substituted, fully or partially with one or more moieties such as halogen, cyano, amino, diol, nitro, ether, carbonyl, epoxide, sulfonyl, cation exchanger, anion exchanger, carbamate, amide, urea, peptide, protein, carbohydrate or nucleic acid functionalities. The reaction is performed such that between 5mol% and 5Omol% of said surface has a structure demonstrated below: * *
S
****.I * S S. 50 * * * * e
S S..
S
S * * S * I.
S * R1
R
Ii R3 [ 2 R3 R2 11n Formula Ill Formula IV Where X is silicon or germanium or gallium or arsenic and where the letter "n" represents the repetition of the above structure across said surface and the letter "s' represents silicon or germanium or gallium or arsenic atoms of the semiconductor wafer.
More preferably, the components of Compound A are such that W is silicon, the group R1 consists of a C5 to C20 straight alkyl chain which may be unsubstituted or substituted, fully or partially with fluorine, and the groups R2 and R3 consist of methyl or ethyl groups.
Most preferably, the components of Compound A are such that W is silicon, where the group R1 consists of a C5 to C17 straight alkyl chain, unsubstituted at C1 to C2 and fully substituted with fluorine at C3 to Cm, where m represents an integer from 1 to 17, and where the groups R2 and R3 consist of unsubstituted methyl groups.
At least one second surface 14 for receiving a sample is made, the second 20 surface 14 exhibiting a higher affinity to water or aqueous solutions than the said first surface, such that the second surface concentrates aqueous solutions. The second surface is created by destroying at least one portion of the first surface, by including but not limited to such means as laser ablation, heat treatment or treatment with a chemical or enzyme. More preferably, the second surface is created by laser ablation of the first surface.
More preferably, a plurality of second surfaces for receiving a plurality of samples are made, the plurality of second surfaces exhibiting a higher affinity to water or aqueous solutions than the said first surface, such that the plurality of second surfaces concentrate aqueous solutions. The plurality of second surfaces are created by destroying a plurality of portions of the first surface, by including but not limited to such means as laser ablation, heat treatment or treatment with a chemical or enzyme. More preferably, the plurality of second surfaces is created by laser ablation of the first surface.
In a further step, the created second surface or plurality of second surfaces may be oxidised, preferably by reaction with oxygen in a reactive state such as ozone.
Substrates according to the invention are used for performing MALDI ionization. With reference to Figure 2, a complete apparatus for performing MALDI analysis 15 is provided. In such an apparatus, a substrate 12 is held in alignment with a laser 16 and in close proximity to the inlet of a mass spectrometer 17. As previously described, the substrate 12 has a first surface 13 and at least one second surface 14. The second surface 14 has a greater affinity to water and aqueous solutions than the first surface 13, owing to the surface chemistries as also previously described. * *
* . 25 **. * ** * A sample 18 is placed on the first surface 13 and is drawn away to a second surface 14 by hydrophobic and hydrophilic interactions between the sample 18 and the first surface 13 and second surface 14, respectively. Laser 16 is pulsed, such that the sample 18 is irradiated. More preferably, a sample 18 is .30 placed on a portion of the second surface 14, together with a matrix compound, and laser 16 is pulsed, such that the sample 18 is irradiated. A portion of the sample 18 may be vaporized and ionized. Vapor ions and gases are drawn into the inlet of the mass spectrometer 17, including but not limited to a time-of-flight mass analyser, quadrupole mass analyser, ion cyclotron resonance mass analyser, ion trap mass analyser, fourier transform mass analyser, orbitrap mass analyser or a magnetic sector mass analyser, for analysis. Mass spectrometer 17 provides mass and charge information, such as the mass-to-charge ratio, about the ions received.
Alternatively, a sample 18 is placed on the second surface 14 and is held to the second surface 14 by hydrophobic and hydrophilic interactions between the sample 18 and the first surface 13 and second surface 14, respectively. Laser 16 is pulsed, such that the sample 18 is irradiated. More preferably, a sample 18 is placed on a portion of the second surface 14, together with a matrix compound, and laser 16 is pulsed, such that the sample 18 is irradiated. A portion of the sample 18 may be vaporized and ionized. Vapor ions and gases are drawn into the inlet of the mass spectrometer 17, including but not limited to a time-of-flight mass analyser, quadrupole mass analyser, ion cyclotron resonance mass analyser, ion trap mass analyser, fourier transform mass analyser, orbitrap mass analyser or a magnetic sector mass analyser, for analysis. Mass spectrometer 17 provides mass and charge information, such as the mass-to-charge ratio, about the ions received.
Example 1: Substrate surface modification and MALDI analysis S...
* S....
* *25 A diced silicon chip. 1.4" x 2.1". 0.008-0.2)-cm (Sb-doped), n-type, <100> orientation, was obtained from Silicon Quest International, Inc. (Santa Clara, CA). The surface of the chip was rinsed with ethanol. dried, and then oxidized by briefly exposing to a stream of ozone (flow rate of 0.5 g/h from an ozone S generator directed at the surface for 30 seconds). The silylation reaction was * 30 performed by adding 15j.iL of neat (tridecafluoro-l, 1.2,2.tetrahydrooctyl)dimethylchlorosilane on the oxidized chip, placing the chip in a glass Petri dish, and incubating in an oven at 65°C for 15 minutes. The modified chip was then rinsed thoroughly with methanol and was dried in a stream of N2.
A 90 W CO2 laser equipped with X,Y & Z micrometer adjustments and video visual imaging was used to remove the covalently attached silane from the surface of the MALDI target. After positioning the substrate in front of the laser, the laser was then pulsed briefly to ablate the surface. The substrate was then re-exposed briefly to a stream of ozone in order to ensure that the surface-ablated regions were hydrophilic.
I tL of a sample containing 100 attomole/jiL of [Glu']-Fibrinopeptide B (GluFib) (SigmaAldrich, St. Louis, MO) dissolved in 75/25 water/acetonitrile with 0.1% TFA was spotted onto one of the ablated spots, and then allowed to dry at room temperature. Then 1 j.iL of 0.035 mg/mL a-cyano-4-hydroxycinnamic acid (CHCA) (Waters Corp.) dissolved in 75/10/15 acetonitrile/ethanol/aqueous 0.1% TFA was spotted onto the target and allowed to dry at room temperature.
The target plate was placed in the MALDI instrument for analysis in reflectron mode. 100 laser pulses were made (10 scans, 10 shots/scan). The resulting spectrum exhibited an excellent signal to noise ratio.
Example 2. Tryptic digest.
*...* A diced and ablated silicon chip was prepared in the same manner as described in Example 1. 1iL of a sample containing 100 aftomole/L of yeast alcohol dehydrogenase tryptic digest (Waters Corp.) dissolved in 75/25 water/acetonitrile 0.1% TFA was spotted onto one of the ablated spots, and then allowed to dry at room temperature. Then 1tL of 0.035 mg/mL CHCA *:*. dissolved in 75/10/15 acetonitrile/ethanol/aqueous 0.1 % TFA was spotted onto the target and allowed to dry at room temperature. The target plate was placed in the MALDI instrument for analysis in reflectron mode. 100 laser pulses were made (10 scans, 10 shots/scan).
Claims (22)
- CLAIMS1. A device for the presentation of aqueous samples for analysis which device comprises, a semiconductor wafer body having a planar face including a first surface which exhibits a low affinity to aqueous solutions for repelling such solutions and second surfaces provided by treatment which includes partial destruction of a plurality of portions of the first surface to create a plurality of second surfaces arranged in a pattern on, and completely surrounded by, the first surface and whose composition is such that the second surfaces have a higher affinity to aqueous solutions than the first surface and wherein the arrangement of the second surfaces relative to the first surface is such that sample solution applied to the first surface will be directed onto, and concentrated by, the second surfaces.
- 2. A device according to claim 1, wherein the created second surfaces are oxidised.
- 3. A device according to claim 1 or claim 2, wherein the second surfaces are created by laser ablution of the first surface.
- 4. A device according to claim I or claim 2, wherein the second surfaces are created by heat treatment of the first surface. * * ****
- 5. A device according to claim I or claim 2, wherein the second surfaces S.....are created by chemical or enzyme treatment of the first surface.*.
- 6. A device according to any of the preceding claims wherein the first surface has a composition as described below: **S * 30Ss+O_1_U where X is silicon or germanium or gallium or arsenic and Y is hydrogen or hydroxyl or Z, between 5mol% and 5Omol% of Y being Z, where Z is-O-WR1R2R3, wherein W is silicon germanium or carbon, groups R1, R2 and R3 are selected from the group consisting of C1 to C25 straight, cyclic or branched alkyl, alkene, aryl, alkoxyl, hydroxyl or siloxyl group, where the groups R1, R2 and R3 are unsubstituted or substituted, fully or partiaHy with one or more moieties selected from the group comprising halogen, cyano, amino, diol, nitro, ether, carbonyl, epoxide, sulfonyl, cation exchanger, anion exchanger, carbamate, amide, urea, peptide, protein, carbohydrate or nucleic acid functionalities, where the letter "n" represents the repetition of the above structure across said surface and the letter "s" represents silicon or germanium or gallium or arsenic atoms of said semiconductor wafer. S... * S S.'.*
- 7. The device of claim 1 wherein said mol% of Y being Z is 30-4Omol%. S.... * 20
- 8. The device of claim 6 or claim 7 wherein said R1 group is partially or fully * S
- 9. The device of any of the preceding claims wherein said R1 group S..consists of a C5 to C,7 straight alkyl group.II
- 10. The device of any of the preceding claims wherein said RI group is unsubstituted at Ci to C2 and fully substituted at C3 to Cm, where m represents an integerfrom3to 17.
- 11. The device of any of the preceding claims wherein said groups R2 and R3 are short alkyl chains.
- 12. The device of claim 11 wherein said groups R2 and R3 are methyl groups.
- 13. The device of claim 12 wherein said groups R2 and R3 are unsubstituted.
- 14. The device of any of the preceding claims wherein the mol% of Z on at least one of said second surface is less than 5%.
- 15. The device of claim 14 wherein the mol% of Z on at least one of said second surface is less than 1%
- 16. The device of claim 15 wherein the mol% of Z on at least one of said second surface is less than 0.1%.
- 17. The device of any of the preceding claims wherein said second surfaces each have a composition as described below * ***** * * ** ** * * S * * S X-U a n ** * * *. or * S.S S..S ts+O_X-U where U represents hydroxyl or hydrogen, and where the letter "n" represents the repetition of the above structure across said surface and the letter "s" represents silicon or germanium or gallium or arsenic atoms of said semiconductor wafer.
- 18. The device of claim 15 wherein said mol% of Y being Z is 30-4OmoI%.
- 19. The device of claim 17 or claim 18 wherein said R1 group consists of a C5 to C17 straight alkyl group.
- 20. The device of any of claims 17 to 19 wherein said R1 group is partially or
- 21. The device of any of claims 17 to 20 wherein said R1 group is unsubstituted at Ci to C2 and fully substituted at C3 to Cm, where m represents an integer from 3 to 17.
- 22. The device of any of claims 17 to 21 wherein said groups R2 and R3 are short alkyl chains. * * ****23. The device of claim 22 wherein said groups R2 and R3 are methyl groups. S..24. The device of claim 23 wherein said groups R2 and R3 are *SSI25. A method of making a substrate for presentation of samples for analysis, comprising the steps of (i) providing a semiconductor body having a planar face, said planar face having at least one first surface comprising a hydride of silicon or germanium or gallium or arsenic on said substrate, (ii) reacting at least 5 mol% of said hydride with oxygen to form an oxide of silicon or germanium or gallium or arsenic, (iii) reacting the resultant oxide with a compound as shown below R1 3 2 Compound A where V is a halogen, methoxy or any good leaving group, W is silicon or germanium or carbon, R1, R2 and R3 consist of a C1 to C25 straight, cyclic or branched alkyl, alkene, aryl, alkoxyl, hydroxyl or siloxyl group and are unsubstituted or substituted, fully or partially with one or more moieties selected from the group comprising halogen, cyano, amino, diol, nitro, ether, carbonyl, epoxide, sulfonyl, cation exchanger, anion exchanger, carbamate, amide, urea, peptide, protein, carbohydrate or nucleic acid functionalities, such that between 5mol% and 50mol% of said surface has structure Z, demonstrated below R1 R1 R3 R2S*SSSSS * S 0 R3 R2 S. S. 0 x 1 __ Jn -lx 0 L fl *. .: S or SSwhere X is silicon or germanium or gallium or arsenic, where the letter "n" represents the repetition of the above structure across said surface and the tIletter "s" represents silicon or germanium or gallium or arsenic atoms of said semiconductor wafer, and; wherein said first surface exhibits low affinity to aqueous solutions, (iv) creating at least one second surface on said planar face by partial destruction of said first surface, wherein said second surface has a higher affinity to aqueous solutions than said first surface.26. The method of claim 25 wherein said R1 group is partially or fully 27. The method of claim 25 or claim 26 wherein said R1 group consists of a C5 to C17 straight alkyl group.28. The method of any of claims 25 to 27 wherein said R1 group is unsubstituted at C1 to C2 and fully substituted at C3 to Cm, where m represents an integer from 3 to 17.29. The method of any of claims 25 to 28 wherein said groups R2 and R3 are short alkyl chains.30. The method of claim 29 wherein said groups R2 and R3 are methyl g rou PS. * . ****31. The method of claim 30 wherein said groups R2 and R3 are I..... S. SI * * * * S32. The method of any of claims 2 to 31 wherein said at least one second surface is further oxidised. S. * * . . * S. ** 30 33. The method of any of claims 25 to 32 wherein said at least one second surface is further reacted with oxygen in the form of ozone.34. The method of any of claims 25 to 33 wherein said at least one second surface is formed by laser ablation.35. The method of any of claims 25 to 33 wherein said at least one second surface is formed by heat treatment.36. The method of any of claims 25 to 33 wherein said at least one second surface is formed by treatment with a chemical or enzyme.37. A device for the presentation of samples for analysis substantially as hereinbefore described with reference to and as shown in the accompanying drawings. * * **.* * * a, ** * . a * a a *. * * * * * I. * * a.
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US70898505P | 2005-08-17 | 2005-08-17 | |
GB0802821A GB2442692B (en) | 2005-08-17 | 2006-08-16 | A device for performing ionization desorption on silicon derivatives |
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Citations (6)
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US6288390B1 (en) * | 1999-03-09 | 2001-09-11 | Scripps Research Institute | Desorption/ionization of analytes from porous light-absorbing semiconductor |
US20020146725A1 (en) * | 2000-11-10 | 2002-10-10 | Mullen Bette M. | Chip for large-scale use of industrial genomics in health and agriculture and method of making same |
EP1364702A2 (en) * | 2002-05-15 | 2003-11-26 | Samsung Electronics Co., Ltd. | Process for producing array plate for biomolecules having hydrophilic and hydrophobic regions |
US20040258832A1 (en) * | 2003-06-17 | 2004-12-23 | Barklund Anna M. | Method of chemical analysis using microwells patterned from self-assembled monolayers and substrates |
WO2005001423A2 (en) * | 2003-06-06 | 2005-01-06 | Waters Investments Limited | Methods, compositions and devices for performing ionization desorption on silicon derivatives |
US20050072917A1 (en) * | 2003-09-30 | 2005-04-07 | Thomas Becker | Methods of making substrates for mass spectrometry analysis and related devices |
-
2010
- 2010-02-26 GB GB1003328A patent/GB2465905A/en not_active Withdrawn
- 2010-02-26 GB GB1003331A patent/GB2465906A/en not_active Withdrawn
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6288390B1 (en) * | 1999-03-09 | 2001-09-11 | Scripps Research Institute | Desorption/ionization of analytes from porous light-absorbing semiconductor |
US20020146725A1 (en) * | 2000-11-10 | 2002-10-10 | Mullen Bette M. | Chip for large-scale use of industrial genomics in health and agriculture and method of making same |
EP1364702A2 (en) * | 2002-05-15 | 2003-11-26 | Samsung Electronics Co., Ltd. | Process for producing array plate for biomolecules having hydrophilic and hydrophobic regions |
WO2005001423A2 (en) * | 2003-06-06 | 2005-01-06 | Waters Investments Limited | Methods, compositions and devices for performing ionization desorption on silicon derivatives |
US20040258832A1 (en) * | 2003-06-17 | 2004-12-23 | Barklund Anna M. | Method of chemical analysis using microwells patterned from self-assembled monolayers and substrates |
US20050072917A1 (en) * | 2003-09-30 | 2005-04-07 | Thomas Becker | Methods of making substrates for mass spectrometry analysis and related devices |
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GB201003331D0 (en) | 2010-04-14 |
GB2465905A (en) | 2010-06-09 |
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