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GB2363855B - Impedance measuring apparatus for electronic component - Google Patents

Impedance measuring apparatus for electronic component

Info

Publication number
GB2363855B
GB2363855B GB0118165A GB0118165A GB2363855B GB 2363855 B GB2363855 B GB 2363855B GB 0118165 A GB0118165 A GB 0118165A GB 0118165 A GB0118165 A GB 0118165A GB 2363855 B GB2363855 B GB 2363855B
Authority
GB
United Kingdom
Prior art keywords
electronic component
measuring apparatus
impedance measuring
impedance
electronic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
GB0118165A
Other versions
GB2363855A (en
GB0118165D0 (en
Inventor
Gaku Kamitani
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Murata Manufacturing Co Ltd
Original Assignee
Murata Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP22199599A external-priority patent/JP3402274B2/en
Application filed by Murata Manufacturing Co Ltd filed Critical Murata Manufacturing Co Ltd
Publication of GB0118165D0 publication Critical patent/GB0118165D0/en
Publication of GB2363855A publication Critical patent/GB2363855A/en
Application granted granted Critical
Publication of GB2363855B publication Critical patent/GB2363855B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/14—Measuring resistance by measuring current or voltage obtained from a reference source

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
GB0118165A 1999-08-05 2000-07-28 Impedance measuring apparatus for electronic component Expired - Fee Related GB2363855B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP22199599A JP3402274B2 (en) 1999-08-05 1999-08-05 Electronic component impedance measuring device
GB0018664A GB2353366B (en) 1999-08-05 2000-07-28 Impedance measuring apparatus for electronic component

Publications (3)

Publication Number Publication Date
GB0118165D0 GB0118165D0 (en) 2001-09-19
GB2363855A GB2363855A (en) 2002-01-09
GB2363855B true GB2363855B (en) 2002-06-26

Family

ID=26244760

Family Applications (1)

Application Number Title Priority Date Filing Date
GB0118165A Expired - Fee Related GB2363855B (en) 1999-08-05 2000-07-28 Impedance measuring apparatus for electronic component

Country Status (1)

Country Link
GB (1) GB2363855B (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2411481B (en) * 2004-02-27 2007-11-14 Ultra Electronics Ltd Signal measurement and processing method and apparatus
US7548819B2 (en) 2004-02-27 2009-06-16 Ultra Electronics Limited Signal measurement and processing method and apparatus
US8159238B1 (en) 2009-09-30 2012-04-17 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Method and apparatus for in-situ health monitoring of solar cells in space
US10396709B2 (en) 2009-09-30 2019-08-27 United States Of America As Represented By The Administrator Of National Aeronautics And Space Administration Method and apparatus for in-situ health monitoring of solar cells in space
CN109073689A (en) * 2018-07-06 2018-12-21 深圳市汇顶科技股份有限公司 Chip impedance test method and system

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4954782A (en) * 1987-05-08 1990-09-04 The Boeing Company Self-checking ohmmeter that checks for contact resistance of its probes
JPH02232568A (en) * 1989-03-07 1990-09-14 Fujitsu Ltd 4-wire resistance measuring device
US5600249A (en) * 1994-06-29 1997-02-04 Hewlett-Packard Company Determining contact quality of an impedance meter

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4954782A (en) * 1987-05-08 1990-09-04 The Boeing Company Self-checking ohmmeter that checks for contact resistance of its probes
JPH02232568A (en) * 1989-03-07 1990-09-14 Fujitsu Ltd 4-wire resistance measuring device
US5600249A (en) * 1994-06-29 1997-02-04 Hewlett-Packard Company Determining contact quality of an impedance meter

Also Published As

Publication number Publication date
GB2363855A (en) 2002-01-09
GB0118165D0 (en) 2001-09-19

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20120728