GB2315158B - A method of manufacturing an active matrix liquid crystal display and the structure of the liquid crystal display manufactured by the same method - Google Patents
A method of manufacturing an active matrix liquid crystal display and the structure of the liquid crystal display manufactured by the same methodInfo
- Publication number
- GB2315158B GB2315158B GB9714111A GB9714111A GB2315158B GB 2315158 B GB2315158 B GB 2315158B GB 9714111 A GB9714111 A GB 9714111A GB 9714111 A GB9714111 A GB 9714111A GB 2315158 B GB2315158 B GB 2315158B
- Authority
- GB
- United Kingdom
- Prior art keywords
- liquid crystal
- crystal display
- manufacturing
- active matrix
- same method
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000004973 liquid crystal related substance Substances 0.000 title 2
- 238000004519 manufacturing process Methods 0.000 title 1
- 239000011159 matrix material Substances 0.000 title 1
- 238000000034 method Methods 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/01—Manufacture or treatment
- H10D86/021—Manufacture or treatment of multiple TFTs
- H10D86/0221—Manufacture or treatment of multiple TFTs comprising manufacture, treatment or patterning of TFT semiconductor bodies
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136227—Through-hole connection of the pixel electrode to the active element through an insulation layer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
- H01L21/02043—Cleaning before device manufacture, i.e. Begin-Of-Line process
- H01L21/02046—Dry cleaning only
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
- H01L21/28008—Making conductor-insulator-semiconductor electrodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/01—Manufacture or treatment
- H10D30/021—Manufacture or treatment of FETs having insulated gates [IGFET]
- H10D30/031—Manufacture or treatment of FETs having insulated gates [IGFET] of thin-film transistors [TFT]
- H10D30/0312—Manufacture or treatment of FETs having insulated gates [IGFET] of thin-film transistors [TFT] characterised by the gate electrodes
- H10D30/0316—Manufacture or treatment of FETs having insulated gates [IGFET] of thin-film transistors [TFT] characterised by the gate electrodes of lateral bottom-gate TFTs comprising only a single gate
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/01—Manufacture or treatment
- H10D30/021—Manufacture or treatment of FETs having insulated gates [IGFET]
- H10D30/031—Manufacture or treatment of FETs having insulated gates [IGFET] of thin-film transistors [TFT]
- H10D30/0321—Manufacture or treatment of FETs having insulated gates [IGFET] of thin-film transistors [TFT] comprising silicon, e.g. amorphous silicon or polysilicon
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/6729—Thin-film transistors [TFT] characterised by the electrodes
- H10D30/673—Thin-film transistors [TFT] characterised by the electrodes characterised by the shapes, relative sizes or dispositions of the gate electrodes
- H10D30/6732—Bottom-gate only TFTs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/6729—Thin-film transistors [TFT] characterised by the electrodes
- H10D30/6737—Thin-film transistors [TFT] characterised by the electrodes characterised by the electrode materials
- H10D30/6739—Conductor-insulator-semiconductor electrodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/674—Thin-film transistors [TFT] characterised by the active materials
- H10D30/6741—Group IV materials, e.g. germanium or silicon carbide
- H10D30/6743—Silicon
- H10D30/6746—Amorphous silicon
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
- H10D86/60—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs wherein the TFTs are in active matrices
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Nonlinear Science (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Mathematical Physics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- Optics & Photonics (AREA)
- Liquid Crystal (AREA)
- Thin Film Transistor (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019960027655A KR100213966B1 (en) | 1996-07-09 | 1996-07-09 | Manufacturing Method of Active Matrix Liquid Crystal Display and Active Matrix Liquid Crystal Display |
KR1019960027653A KR100213967B1 (en) | 1996-07-09 | 1996-07-09 | Manufacturing method of active matrix liquid crystal display device and active matrix liquid crystal display device |
Publications (3)
Publication Number | Publication Date |
---|---|
GB9714111D0 GB9714111D0 (en) | 1997-09-10 |
GB2315158A GB2315158A (en) | 1998-01-21 |
GB2315158B true GB2315158B (en) | 1999-02-10 |
Family
ID=26631999
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB9714111A Expired - Lifetime GB2315158B (en) | 1996-07-09 | 1997-07-03 | A method of manufacturing an active matrix liquid crystal display and the structure of the liquid crystal display manufactured by the same method |
Country Status (4)
Country | Link |
---|---|
JP (1) | JPH1082997A (en) |
DE (1) | DE19729176C2 (en) |
FR (1) | FR2751131B1 (en) |
GB (1) | GB2315158B (en) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100251091B1 (en) * | 1996-11-29 | 2000-04-15 | 구본준 | Manufacturing method of liquid crystal display device and liquid crystal display device manufactured by the manufacturing method |
US6541369B2 (en) * | 1999-12-07 | 2003-04-01 | Applied Materials, Inc. | Method and apparatus for reducing fixed charges in a semiconductor device |
JP2001196591A (en) | 2000-01-13 | 2001-07-19 | Internatl Business Mach Corp <Ibm> | Thin film transistor and method of manufacturing thin film transistor |
US6794311B2 (en) | 2000-07-14 | 2004-09-21 | Applied Materials Inc. | Method and apparatus for treating low k dielectric layers to reduce diffusion |
KR100720099B1 (en) * | 2001-06-21 | 2007-05-18 | 삼성전자주식회사 | Thin film transistor substrate and manufacturing method thereof |
JP2006178393A (en) * | 2004-11-24 | 2006-07-06 | Ricoh Co Ltd | Image reader, and recording device with image reader |
KR101213871B1 (en) * | 2005-12-15 | 2012-12-18 | 엘지디스플레이 주식회사 | Thin film transistor array substrate and manufacturing method of the same |
KR101251351B1 (en) | 2005-12-28 | 2013-04-05 | 삼성디스플레이 주식회사 | Thin film transistor substrate, method for making the substrate and display panel having the substrate |
KR101217182B1 (en) * | 2006-07-28 | 2012-12-31 | 삼성디스플레이 주식회사 | Thin film transistor substrate, method for making the same and display having the same |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5045905A (en) * | 1988-03-23 | 1991-09-03 | Nippon Precision Circuits Ltd. | Amorphous silicon thin film transistor |
EP0486047A2 (en) * | 1990-11-16 | 1992-05-20 | Seiko Epson Corporation | Thin film semiconductor device, process for fabricating the same, and silicon film |
JPH04257826A (en) * | 1991-02-13 | 1992-09-14 | Sharp Corp | Manufacture of active matrix substrate |
US5177588A (en) * | 1991-06-14 | 1993-01-05 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor device including nitride layer |
US5281546A (en) * | 1992-09-02 | 1994-01-25 | General Electric Company | Method of fabricating a thin film transistor using hydrogen plasma treatment of the intrinsic silicon/doped layer interface |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4636038A (en) * | 1983-07-09 | 1987-01-13 | Canon Kabushiki Kaisha | Electric circuit member and liquid crystal display device using said member |
US4704783A (en) * | 1986-05-05 | 1987-11-10 | General Electric Company | Method for passivating the back channel of amorphous silicon field effect transistors |
JPS63157476A (en) * | 1986-12-22 | 1988-06-30 | Seiko Instr & Electronics Ltd | Thin film transistor |
DE69125886T2 (en) * | 1990-05-29 | 1997-11-20 | Semiconductor Energy Lab | Thin film transistors |
JPH06267986A (en) * | 1993-03-17 | 1994-09-22 | Hitachi Ltd | Method of manufacturing thin film transistor |
US5858819A (en) * | 1994-06-15 | 1999-01-12 | Seiko Epson Corporation | Fabrication method for a thin film semiconductor device, the thin film semiconductor device itself, liquid crystal display, and electronic device |
-
1997
- 1997-06-26 FR FR9708020A patent/FR2751131B1/en not_active Expired - Lifetime
- 1997-07-02 JP JP9191987A patent/JPH1082997A/en active Pending
- 1997-07-03 GB GB9714111A patent/GB2315158B/en not_active Expired - Lifetime
- 1997-07-08 DE DE19729176A patent/DE19729176C2/en not_active Expired - Lifetime
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5045905A (en) * | 1988-03-23 | 1991-09-03 | Nippon Precision Circuits Ltd. | Amorphous silicon thin film transistor |
EP0486047A2 (en) * | 1990-11-16 | 1992-05-20 | Seiko Epson Corporation | Thin film semiconductor device, process for fabricating the same, and silicon film |
JPH04257826A (en) * | 1991-02-13 | 1992-09-14 | Sharp Corp | Manufacture of active matrix substrate |
US5177588A (en) * | 1991-06-14 | 1993-01-05 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor device including nitride layer |
US5281546A (en) * | 1992-09-02 | 1994-01-25 | General Electric Company | Method of fabricating a thin film transistor using hydrogen plasma treatment of the intrinsic silicon/doped layer interface |
Non-Patent Citations (1)
Title |
---|
Patent Abstracts of Japan, Section P, Section No 1476, Vol 17, No 45, Pg 3, 28/1/93 & JP 04 257 826 A * |
Also Published As
Publication number | Publication date |
---|---|
FR2751131B1 (en) | 2001-11-09 |
DE19729176A1 (en) | 1998-01-22 |
GB2315158A (en) | 1998-01-21 |
JPH1082997A (en) | 1998-03-31 |
DE19729176C2 (en) | 2002-04-25 |
FR2751131A1 (en) | 1998-01-16 |
GB9714111D0 (en) | 1997-09-10 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
GB2313466B (en) | Active matrix liquid crystal display and method of making the same | |
GB2322967B (en) | Structure of a liquid crystal display and a method of manufacturing the same | |
GB2323472B (en) | Structure of a liquid crystal display and method of manufacturing same | |
GB2329061B (en) | Liquid crystal display and method of manufacturing the same | |
GB2275809B (en) | Liquid crystal display and method for manufacturing the same | |
GB2323959B (en) | Liquid crystal display and method of manufacturing the same | |
GB2307087B (en) | Liquid crystal display device and a method of manufacturing the same | |
GB2319889B (en) | Liquid crystal display and method of manufacturing the same | |
AU2837695A (en) | Liquid crystal display and its manufacturing method | |
GB2311159B (en) | Active matrix liquid crystal display and method of manufacturing the same | |
EP0621501A3 (en) | A liquid crystal display element and a manufacturing method of the same. | |
DE69839935D1 (en) | Active matrix liquid crystal display and its manufacturing method | |
EP0456338A3 (en) | An active matrix display device and a method of manufacturing the same | |
EP0658869A3 (en) | Double active matrix liquid crystal display and method of driving the same. | |
GB2306747B (en) | Liquid crystal display and method of manufacturing the same | |
GB2279484B (en) | Active matrix liquid crystal display | |
EP0749030A4 (en) | Liquid crystal display element and method of manufacturing the same | |
EP0750210A4 (en) | Liquid crystal display element and method of manufacturing the same | |
GB2315158B (en) | A method of manufacturing an active matrix liquid crystal display and the structure of the liquid crystal display manufactured by the same method | |
GB2274723B (en) | Liquid crystal display and the manufacturing method thereof | |
EP0782032A3 (en) | Liquid crystal display element and a manufacturing method thereof | |
GB2312092B (en) | Liquid crystal display and method of manufacturing the same | |
GB2327768B (en) | Liquid crystal display element and manufacturing method the same | |
GB2350467B (en) | Active matrix liquid crystal display and method of making same | |
GB2324641B (en) | Liquid crystal display device and manufacturing method the same |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
732E | Amendments to the register in respect of changes of name or changes affecting rights (sect. 32/1977) | ||
PE20 | Patent expired after termination of 20 years |
Expiry date: 20170702 |