GB2312507B - X-Ray Inspection System - Google Patents
X-Ray Inspection SystemInfo
- Publication number
- GB2312507B GB2312507B GB9716193A GB9716193A GB2312507B GB 2312507 B GB2312507 B GB 2312507B GB 9716193 A GB9716193 A GB 9716193A GB 9716193 A GB9716193 A GB 9716193A GB 2312507 B GB2312507 B GB 2312507B
- Authority
- GB
- United Kingdom
- Prior art keywords
- inspection system
- ray inspection
- ray
- inspection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000007689 inspection Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
- G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
- G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
- G01V5/222—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays measuring scattered radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/201—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by measuring small-angle scattering
Landscapes
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Biochemistry (AREA)
- Analytical Chemistry (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Immunology (AREA)
- Pathology (AREA)
- High Energy & Nuclear Physics (AREA)
- General Life Sciences & Earth Sciences (AREA)
- Geophysics (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB9716193A GB2312507B (en) | 1995-02-08 | 1996-01-30 | X-Ray Inspection System |
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB9502460A GB2297835A (en) | 1995-02-08 | 1995-02-08 | Three dimensional detection of contraband using x rays |
PCT/GB1996/000195 WO1996024863A1 (en) | 1995-02-08 | 1996-01-30 | X-ray inspection system |
GB9716193A GB2312507B (en) | 1995-02-08 | 1996-01-30 | X-Ray Inspection System |
Publications (3)
Publication Number | Publication Date |
---|---|
GB9716193D0 GB9716193D0 (en) | 1997-10-08 |
GB2312507A GB2312507A (en) | 1997-10-29 |
GB2312507B true GB2312507B (en) | 1999-08-25 |
Family
ID=26306461
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB9716193A Expired - Fee Related GB2312507B (en) | 1995-02-08 | 1996-01-30 | X-Ray Inspection System |
Country Status (1)
Country | Link |
---|---|
GB (1) | GB2312507B (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2357414A (en) * | 1999-12-16 | 2001-06-20 | Secr Defence | Fast detection of X-rays using detector arrays and energy discrimination |
FR2967242B1 (en) * | 2010-11-04 | 2014-11-07 | Cray Valley Sa | SOLAR REFLECTOR OF COMPOSITE MATERIAL BASED ON FIBER REINFORCED RESIN AND USES IN SOLAR POWER PLANTS |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0311171A1 (en) * | 1987-10-09 | 1989-04-12 | Picanol N.V. | Device for coupling components which can move relative to each other, and a transport mechanism which uses this device |
EP0354045A2 (en) * | 1988-08-03 | 1990-02-07 | Ion Track Instruments | X-ray diffraction inspection system and method |
EP0358965A1 (en) * | 1988-08-26 | 1990-03-21 | THE STATE of ISRAEL Atomic Energy Commission Soreq Nuclear Research Center | Method and apparatus for the detection and imaging of heavy metals |
US4956856A (en) * | 1987-10-05 | 1990-09-11 | U.S. Philips Corporation | Arrangement for examining a body comprising a radiation source |
US5231652A (en) * | 1990-06-20 | 1993-07-27 | U.S. Philips Corp. | Arrangement for measuring the pulse transmission spectrum of x-ray quanta |
-
1996
- 1996-01-30 GB GB9716193A patent/GB2312507B/en not_active Expired - Fee Related
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4956856A (en) * | 1987-10-05 | 1990-09-11 | U.S. Philips Corporation | Arrangement for examining a body comprising a radiation source |
EP0311171A1 (en) * | 1987-10-09 | 1989-04-12 | Picanol N.V. | Device for coupling components which can move relative to each other, and a transport mechanism which uses this device |
EP0354045A2 (en) * | 1988-08-03 | 1990-02-07 | Ion Track Instruments | X-ray diffraction inspection system and method |
EP0358965A1 (en) * | 1988-08-26 | 1990-03-21 | THE STATE of ISRAEL Atomic Energy Commission Soreq Nuclear Research Center | Method and apparatus for the detection and imaging of heavy metals |
US5231652A (en) * | 1990-06-20 | 1993-07-27 | U.S. Philips Corp. | Arrangement for measuring the pulse transmission spectrum of x-ray quanta |
Also Published As
Publication number | Publication date |
---|---|
GB2312507A (en) | 1997-10-29 |
GB9716193D0 (en) | 1997-10-08 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
GB9502460D0 (en) | x-ray inspection system | |
EP0842497A4 (en) | Imaging measurement system | |
AU2187995A (en) | X-ray imaging system | |
AU7602998A (en) | X-ray inspection apparatus | |
GB2303772B (en) | Imaging apparatus | |
GB9515762D0 (en) | Imaging apparatus | |
GB9515446D0 (en) | Imaging systems | |
GB2298062B (en) | Object inspection | |
GB2302492B (en) | X-Ray system | |
GB9517491D0 (en) | Imaging apparatus | |
GB2304017B (en) | Imaging apparatus | |
GB9623786D0 (en) | Imaging system | |
GB9512717D0 (en) | Imaging | |
GB2312507B (en) | X-Ray Inspection System | |
GB2270825B (en) | An inspection system | |
GB9605902D0 (en) | Inspection apparatus | |
GB9408673D0 (en) | Visual inspection system | |
GB9512107D0 (en) | Inspection system | |
GB2322759B (en) | Imaging system | |
GB9515534D0 (en) | Imaging system | |
GB9525338D0 (en) | Imaging system | |
GB9524637D0 (en) | Imaging system | |
GB9605740D0 (en) | Imaging system | |
GB9514500D0 (en) | Imaging system | |
GB9315258D0 (en) | Inspection system |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PCNP | Patent ceased through non-payment of renewal fee |
Effective date: 20090130 |