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GB2195029B - Automatic test equipment - Google Patents

Automatic test equipment

Info

Publication number
GB2195029B
GB2195029B GB8722960A GB8722960A GB2195029B GB 2195029 B GB2195029 B GB 2195029B GB 8722960 A GB8722960 A GB 8722960A GB 8722960 A GB8722960 A GB 8722960A GB 2195029 B GB2195029 B GB 2195029B
Authority
GB
United Kingdom
Prior art keywords
bus
equipment
controller
test equipment
automatic test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB8722960A
Other versions
GB8722960D0 (en
GB2195029A (en
Inventor
John Jervis Comfort
Paul Alan Hayter
Dinesh Kargathra
Brian Robert Mason
Graham Norman Turner
Ian Robert Fisher
John William Bailey
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mars Inc
Original Assignee
Mars Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from GB838331558A external-priority patent/GB8331558D0/en
Priority claimed from GB848409794A external-priority patent/GB8409794D0/en
Priority claimed from GB08429657A external-priority patent/GB2150696B/en
Application filed by Mars Inc filed Critical Mars Inc
Priority to GB8722960A priority Critical patent/GB2195029B/en
Publication of GB8722960D0 publication Critical patent/GB8722960D0/en
Publication of GB2195029A publication Critical patent/GB2195029A/en
Application granted granted Critical
Publication of GB2195029B publication Critical patent/GB2195029B/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2637—Circuits therefor for testing other individual devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31912—Tester/user interface
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31926—Routing signals to or from the device under test [DUT], e.g. switch matrix, pin multiplexing
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/261—Functional testing by simulating additional hardware, e.g. fault simulation
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits
    • G06F11/277—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault-free response

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Human Computer Interaction (AREA)
  • Bus Control (AREA)
  • Debugging And Monitoring (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

Equipment for testing electrical circuits includes a programmable controller based upon a microcomputer (1) and selected interface modules (20-29 Fig. 1B) which can be plugged into the controller in any of a number of interconnection locations and in any combination of module types with the controller being adapted to interrogate the modules as to their function and location, and to organize its routines accordingly. A bus structure includes a data bus, a module identification bus, a synchronisation bus and analogue stimulus and measurement buses, and allows resource sharing within the equipment. <IMAGE>
GB8722960A 1983-11-25 1987-09-30 Automatic test equipment Expired GB2195029B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB8722960A GB2195029B (en) 1983-11-25 1987-09-30 Automatic test equipment

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
GB838331558A GB8331558D0 (en) 1983-11-25 1983-11-25 Automatic test equipment
GB848409794A GB8409794D0 (en) 1984-04-16 1984-04-16 Testing apparatus
GB08429657A GB2150696B (en) 1983-11-25 1984-11-23 Automatic test equipment
GB8722960A GB2195029B (en) 1983-11-25 1987-09-30 Automatic test equipment

Publications (3)

Publication Number Publication Date
GB8722960D0 GB8722960D0 (en) 1987-11-04
GB2195029A GB2195029A (en) 1988-03-23
GB2195029B true GB2195029B (en) 1988-09-01

Family

ID=27449517

Family Applications (1)

Application Number Title Priority Date Filing Date
GB8722960A Expired GB2195029B (en) 1983-11-25 1987-09-30 Automatic test equipment

Country Status (1)

Country Link
GB (1) GB2195029B (en)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2651346A1 (en) * 1989-08-23 1991-03-01 Bouzite Bouchaib Signature analyzer adapter card for an IBM PC bus
US5212443A (en) * 1990-09-05 1993-05-18 Schlumberger Technologies, Inc. Event sequencer for automatic test equipment
US5225772A (en) * 1990-09-05 1993-07-06 Schlumberger Technologies, Inc. Automatic test equipment system using pin slice architecture
JPH04326834A (en) * 1991-04-26 1992-11-16 Pioneer Electron Corp On-vehicle data communication system
US6898720B2 (en) * 2002-12-24 2005-05-24 Sunrise Telecom Incorporated Scalable extensible network test architecture
US7627445B2 (en) 2003-11-26 2009-12-01 Advantest Corporation Apparatus for testing a device with a high frequency signal
EP1687649A1 (en) 2003-11-26 2006-08-09 Advantest Corporation Testing apparatus
US7672805B2 (en) 2003-11-26 2010-03-02 Advantest Corporation Synchronization of modules for analog and mixed signal testing in an open architecture test system
US8295182B2 (en) 2007-07-03 2012-10-23 Credence Systems Corporation Routed event test system and method
CN116125960B (en) * 2023-03-27 2023-11-28 中国人民解放军32181部队 Comprehensive verification equipment of motor-driven calibration vehicle
CN117388716B (en) * 2023-12-11 2024-02-13 四川长园工程勘察设计有限公司 Battery pack fault diagnosis method, system and storage medium based on time sequence data

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3733587A (en) * 1971-05-10 1973-05-15 Westinghouse Electric Corp Universal buffer interface for computer controlled test systems
US3854125A (en) * 1971-06-15 1974-12-10 Instrumentation Engineering Automated diagnostic testing system
FR2405607A1 (en) * 1977-10-10 1979-05-04 Cit Alcatel ELECTRICAL CONTROL SYSTEM
US4397021A (en) * 1981-06-15 1983-08-02 Westinghouse Electric Corp. Multi-processor automatic test system

Also Published As

Publication number Publication date
GB8722960D0 (en) 1987-11-04
GB2195029A (en) 1988-03-23

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 19931123