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GB2178542B - Improved signature analysis device for electronic circuits - Google Patents

Improved signature analysis device for electronic circuits

Info

Publication number
GB2178542B
GB2178542B GB8611880A GB8611880A GB2178542B GB 2178542 B GB2178542 B GB 2178542B GB 8611880 A GB8611880 A GB 8611880A GB 8611880 A GB8611880 A GB 8611880A GB 2178542 B GB2178542 B GB 2178542B
Authority
GB
United Kingdom
Prior art keywords
analysis device
electronic circuits
signature analysis
improved signature
improved
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
GB8611880A
Other versions
GB8611880D0 (en
GB2178542A (en
Inventor
Marshall H Scott
Peter Quinn Oakley
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fluke Corp
Original Assignee
John Fluke Manufacturing Co Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by John Fluke Manufacturing Co Inc filed Critical John Fluke Manufacturing Co Inc
Publication of GB8611880D0 publication Critical patent/GB8611880D0/en
Publication of GB2178542A publication Critical patent/GB2178542A/en
Application granted granted Critical
Publication of GB2178542B publication Critical patent/GB2178542B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits
    • G06F11/277—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault-free response

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
GB8611880A 1985-08-01 1986-05-15 Improved signature analysis device for electronic circuits Expired - Fee Related GB2178542B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US76155885A 1985-08-01 1985-08-01

Publications (3)

Publication Number Publication Date
GB8611880D0 GB8611880D0 (en) 1986-06-25
GB2178542A GB2178542A (en) 1987-02-11
GB2178542B true GB2178542B (en) 1990-07-11

Family

ID=25062580

Family Applications (1)

Application Number Title Priority Date Filing Date
GB8611880A Expired - Fee Related GB2178542B (en) 1985-08-01 1986-05-15 Improved signature analysis device for electronic circuits

Country Status (5)

Country Link
JP (1) JPS6232376A (en)
CN (1) CN86101621A (en)
DE (1) DE3625919A1 (en)
FR (1) FR2585845A1 (en)
GB (1) GB2178542B (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5231314A (en) * 1992-03-02 1993-07-27 National Semiconductor Corporation Programmable timing circuit for integrated circuit device with test access port

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1294280A (en) * 1970-05-12 1972-10-25 Ibm Testing circuits
GB1464515A (en) * 1974-09-03 1977-02-16 Hewlett Packard Co Apparatus and method for testing digital circuits
EP0130610A1 (en) * 1983-07-05 1985-01-09 International Business Machines Corporation System data path stressing
EP0131708A2 (en) * 1983-07-13 1985-01-23 ANT Nachrichtentechnik GmbH Circuit for testing a digital circuit
EP0136204A2 (en) * 1983-08-01 1985-04-03 FAIRCHILD CAMERA & INSTRUMENT CORPORATION Control of signal timing apparatus in automatic test systems using minimal memory

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4551837A (en) * 1983-03-25 1985-11-05 International Telephone & Telegraph Corp. High speed operational recurring signature evaluator for digital equipment tester

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1294280A (en) * 1970-05-12 1972-10-25 Ibm Testing circuits
GB1464515A (en) * 1974-09-03 1977-02-16 Hewlett Packard Co Apparatus and method for testing digital circuits
EP0130610A1 (en) * 1983-07-05 1985-01-09 International Business Machines Corporation System data path stressing
EP0131708A2 (en) * 1983-07-13 1985-01-23 ANT Nachrichtentechnik GmbH Circuit for testing a digital circuit
EP0136204A2 (en) * 1983-08-01 1985-04-03 FAIRCHILD CAMERA & INSTRUMENT CORPORATION Control of signal timing apparatus in automatic test systems using minimal memory
EP0136207A1 (en) * 1983-08-01 1985-04-03 FAIRCHILD CAMERA & INSTRUMENT CORPORATION Test period generator for automatic test equipment

Also Published As

Publication number Publication date
FR2585845A1 (en) 1987-02-06
GB8611880D0 (en) 1986-06-25
CN86101621A (en) 1987-01-28
GB2178542A (en) 1987-02-11
DE3625919A1 (en) 1987-02-12
JPS6232376A (en) 1987-02-12

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee