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GB1497210A - Matrix memory - Google Patents

Matrix memory

Info

Publication number
GB1497210A
GB1497210A GB1842776A GB1842776A GB1497210A GB 1497210 A GB1497210 A GB 1497210A GB 1842776 A GB1842776 A GB 1842776A GB 1842776 A GB1842776 A GB 1842776A GB 1497210 A GB1497210 A GB 1497210A
Authority
GB
United Kingdom
Prior art keywords
fet
storage
voltage
constant current
transistor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB1842776A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NCR Voyix Corp
Original Assignee
NCR Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NCR Corp filed Critical NCR Corp
Publication of GB1497210A publication Critical patent/GB1497210A/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/06Auxiliary circuits, e.g. for writing into memory
    • G11C16/26Sensing or reading circuits; Data output circuits
    • G11C16/28Sensing or reading circuits; Data output circuits using differential sensing or reference cells, e.g. dummy cells

Landscapes

  • Read Only Memory (AREA)
  • Static Random-Access Memory (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)

Abstract

1497210 Variable threshold FET memory; read out NCR CORP 5 May 1976 [13 May 1975] 18427/76 Heading G4C [Also in Division H3T] Binary data is read from a matrix array of variable threshold storage FETS by comparing the signal from a selected storage FET with that from a variable threshold reference FET set to a predetermined one of the two binary threshold values. As shown a matrix array of MNOS storage FETS 20 has one MNOS reference FET 42, 44 per row, although it is stated that a single reference FET for the whole 'matrix could be used. The whole circuit may be formed as an integrated circuit. The comparison used on read out compensates for variations in transistor parameters. A storage FET, say 20a, is selected by decoder 32 energizing a row drive transistor 34a to connect an enabling voltage to the appropriate row, and by decoder 22 energizing a column select transistor, 28a, to connect a constant current source 52, Fig. 2 (not shown), to the appropriate column. Constant current source 52 drives a constant current through the column select transistor, the storage transistor 20a, and a conductive power supply transistor 30a. Depending on its threshold value the storage transistor 20a present a high or low impedance so that the voltage at the output of the column select transistor and the output of the constant current source, which acts independently of voltage, reflects the threshold value and hence the stored datum. Simultaneously with the selection of a storage FET the corresponding reference FET 42 is selected and is driven by an identical constant current source 54. The two voltage signals are connected to the two inputs of a bistable 50, except that the reference voltage is offset by circuit 56 so as to lie between the two voltages corresponding to the two threshold values obtained from a storage FET. The polarity of the voltage across the bistable 50 thus indicates the stored datum and sets the bistable accordingly. The constant current source Fig. 2 (not shown), includes two FETS, one of high and the other of low impedance, connected in series between power supply lines to provide a bias voltage to saturate a further FET which is connected to one of the power lines to provide a constant current independent of output voltage.
GB1842776A 1975-05-13 1976-05-05 Matrix memory Expired GB1497210A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US57714275A 1975-05-13 1975-05-13

Publications (1)

Publication Number Publication Date
GB1497210A true GB1497210A (en) 1978-01-05

Family

ID=24307446

Family Applications (1)

Application Number Title Priority Date Filing Date
GB1842776A Expired GB1497210A (en) 1975-05-13 1976-05-05 Matrix memory

Country Status (6)

Country Link
JP (1) JPS51140442A (en)
DE (1) DE2620749B2 (en)
FR (1) FR2311382A1 (en)
GB (1) GB1497210A (en)
IT (1) IT1060445B (en)
NL (1) NL7605024A (en)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4099264A (en) * 1976-10-28 1978-07-04 Sperry Rand Corporation Non-destructive interrogation control circuit for a variable threshold FET memory
US4225807A (en) * 1977-07-13 1980-09-30 Sharp Kabushiki Kaisha Readout scheme of a matrix type thin-film EL display panel
US4305135A (en) 1979-07-30 1981-12-08 International Business Machines Corp. Program controlled capacitive keyboard variable threshold sensing system
US4301518A (en) * 1979-11-01 1981-11-17 Texas Instruments Incorporated Differential sensing of single ended memory array
JPS5671898A (en) * 1979-11-15 1981-06-15 Nippon Texas Instr Kk Nonvolatile semiconductor memory device and its testing method
JPS5693363A (en) * 1979-12-04 1981-07-28 Fujitsu Ltd Semiconductor memory
JPS56156985A (en) * 1980-02-04 1981-12-03 Texas Instruments Inc Decoder
DE3153700C2 (en) * 1980-02-04 1993-01-28 Texas Instruments Inc., Dallas, Tex., Us
JPS589286A (en) * 1981-07-10 1983-01-19 Toshiba Corp Nonvolatile semiconductor memory
JPS5817594A (en) * 1981-07-23 1983-02-01 Seiko Epson Corp semiconductor storage device
JPS58208990A (en) * 1982-05-28 1983-12-05 Nec Corp Storage device
JPH0666115B2 (en) * 1983-09-26 1994-08-24 株式会社東芝 Semiconductor memory device
JPS61184794A (en) * 1985-02-13 1986-08-18 Toshiba Corp Semiconductor memory device
JPS6280899A (en) * 1985-10-04 1987-04-14 Mitsubishi Electric Corp Semiconductor storage device

Also Published As

Publication number Publication date
FR2311382A1 (en) 1976-12-10
JPS51140442A (en) 1976-12-03
FR2311382B1 (en) 1981-12-31
IT1060445B (en) 1982-08-20
DE2620749A1 (en) 1976-11-25
DE2620749B2 (en) 1977-10-27
NL7605024A (en) 1976-11-16

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Legal Events

Date Code Title Description
PS Patent sealed
PCNP Patent ceased through non-payment of renewal fee