[go: up one dir, main page]

GB1405180A - Time-of-flight mass spectrometer - Google Patents

Time-of-flight mass spectrometer

Info

Publication number
GB1405180A
GB1405180A GB3493272A GB3493272A GB1405180A GB 1405180 A GB1405180 A GB 1405180A GB 3493272 A GB3493272 A GB 3493272A GB 3493272 A GB3493272 A GB 3493272A GB 1405180 A GB1405180 A GB 1405180A
Authority
GB
United Kingdom
Prior art keywords
plane
flight path
time
july
ions
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB3493272A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Max Planck Gesellschaft zur Foerderung der Wissenschaften
Original Assignee
Max Planck Gesellschaft zur Foerderung der Wissenschaften
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Max Planck Gesellschaft zur Foerderung der Wissenschaften filed Critical Max Planck Gesellschaft zur Foerderung der Wissenschaften
Publication of GB1405180A publication Critical patent/GB1405180A/en
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/40—Time-of-flight spectrometers
    • H01J49/408—Time-of-flight spectrometers with multiple changes of direction, e.g. by using electric or magnetic sectors, closed-loop time-of-flight

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)

Abstract

1405180 Mass spectrometers MAX-PLANCKGES ZUR FORDERUNG DER WISSENSCHAFTEN CV 26 July 1972 [27 July 1971] 34932/72 Heading H1D In a time-of-flight mass spectrometer having a flight path between an entrance plane 16 and an exit plane 18 comprising a straight part and a curved part produced by either magnetic or (as shown) electric deflection, which parts are so dimensioned that the travel time dispersions of ions in the two parts cancel out, the flight path is also symmetrical about a centre point 20, and parameters of the deflecting field are so selected that a stigmatic image is produced at the exit plane 18. In the spectrometer shown the centre point 20 lies on an intermediate image plane 21. Ions from a pulsed source 10 pass to a detector 14 through a sector condenser 12, the radius ro and sect or angle # of which are selected to produce the stigmatic image. In alternative embodiments (Figs. 2, 3, not shown) utilizing magnetic deflection, the intermediate image plane occurs in the straight portions of the flight path.
GB3493272A 1971-07-27 1972-07-26 Time-of-flight mass spectrometer Expired GB1405180A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19712137520 DE2137520A1 (en) 1971-07-27 1971-07-27 FLIGHT TIME MASS SPECTROMETER

Publications (1)

Publication Number Publication Date
GB1405180A true GB1405180A (en) 1975-09-03

Family

ID=5814958

Family Applications (1)

Application Number Title Priority Date Filing Date
GB3493272A Expired GB1405180A (en) 1971-07-27 1972-07-26 Time-of-flight mass spectrometer

Country Status (3)

Country Link
DE (1) DE2137520A1 (en)
FR (1) FR2147196B1 (en)
GB (1) GB1405180A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5665967A (en) * 1995-05-26 1997-09-09 Thermo Instrument Systems Inc. Apparatus and method for surface analysis

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB8915972D0 (en) * 1989-07-12 1989-08-31 Kratos Analytical Ltd An ion mirror for a time-of-flight mass spectrometer

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5665967A (en) * 1995-05-26 1997-09-09 Thermo Instrument Systems Inc. Apparatus and method for surface analysis

Also Published As

Publication number Publication date
FR2147196A1 (en) 1973-03-09
FR2147196B1 (en) 1978-03-03
DE2137520A1 (en) 1973-02-08

Similar Documents

Publication Publication Date Title
GB1145107A (en) Ion beam microanalyser
US2427484A (en) Ionic gas analysis
GB1269017A (en) Electron beam deflector system
GB1405180A (en) Time-of-flight mass spectrometer
US3122631A (en) Apparatus for focusing a line type ion beam on a mass spectrometer analyzer
GB969943A (en) Improvements in or relating to transit-time mass spectrometers
US3379911A (en) Particle accelerator provided with an adjustable 270deg. non-dispersive magnetic charged-particle beam bender
GB1004945A (en) Improvements in or relating to mass spectroscopes
GB1341357A (en) Hyperbolic field mass filter
JPS55146847A (en) Electron gun for cathode-ray tube
GB1080191A (en) A system for directing a beam of charged particles derived from a particle accelerator
GB1404693A (en) Microanalyser convertible into a mass-spectrometer
GB1518021A (en) Cyclotron provided with a high-frequency focusing device
US3585384A (en) Ionic microanalyzers
GB1152757A (en) Improvements in and relating to Ion Sources for Mass Spectrometers
US3192383A (en) Mass spectrometer ion collector with a secondary particle collecting electrode extending over the collector
GB1214949A (en) Apparatus for heating a target in an electron beam furnace
US2845539A (en) Mass spectrometry
GB1116807A (en) Improvements in or relating to mass spectrometers
GB1158292A (en) Mass Spectrometer.
JPS5266487A (en) Wien filter form mass separator considering two axis deflection
FR2363882A1 (en) Analyser for secondary ions produced by electron gun - has gun at angle to extraction lens in examination of insulators
GB1185203A (en) Improvements in or relating to mass spectrometers
GB1035495A (en) The separation of electrically charged particles
FR2004003A1 (en) Electrostatic ion deflector for ions injected into an - annular particle accelerator

Legal Events

Date Code Title Description
PS Patent sealed
PCNP Patent ceased through non-payment of renewal fee