GB1395201A - Magnetic lenses - Google Patents
Magnetic lensesInfo
- Publication number
- GB1395201A GB1395201A GB4088872A GB4088872A GB1395201A GB 1395201 A GB1395201 A GB 1395201A GB 4088872 A GB4088872 A GB 4088872A GB 4088872 A GB4088872 A GB 4088872A GB 1395201 A GB1395201 A GB 1395201A
- Authority
- GB
- United Kingdom
- Prior art keywords
- coil
- target
- polepiece
- sept
- volumes
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000002245 particle Substances 0.000 abstract 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 abstract 1
- 229910052782 aluminium Inorganic materials 0.000 abstract 1
- 239000004411 aluminium Substances 0.000 abstract 1
- 230000004888 barrier function Effects 0.000 abstract 1
- 230000005540 biological transmission Effects 0.000 abstract 1
- 239000002826 coolant Substances 0.000 abstract 1
- 238000009413 insulation Methods 0.000 abstract 1
- 238000012423 maintenance Methods 0.000 abstract 1
- 230000002093 peripheral effect Effects 0.000 abstract 1
- 210000004894 snout Anatomy 0.000 abstract 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 abstract 1
- 238000003466 welding Methods 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J29/00—Details of cathode-ray tubes or of electron-beam tubes of the types covered by group H01J31/00
- H01J29/46—Arrangements of electrodes and associated parts for generating or controlling the ray or beam, e.g. electron-optical arrangement
- H01J29/58—Arrangements for focusing or reflecting ray or beam
- H01J29/64—Magnetic lenses
- H01J29/66—Magnetic lenses using electromagnetic means only
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/04—Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement or ion-optical arrangement
- H01J37/10—Lenses
- H01J37/14—Lenses magnetic
- H01J37/141—Electromagnetic lenses
Landscapes
- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Electron Beam Exposure (AREA)
Abstract
1395201 Cathode-ray tubes NATIONAL RESEARCH DEVELOPMENT CORP 13 Sept 1973 [4 Sept 1972] 40888/72 Heading H1D A beam of charged particles 12 is focused on to a target 17 by a magnetic lens having a coil 13 surrounding a polepiece 16, and positioned behind the target with respect to the beam source, whereby obstruction of the region in front of the target is avoided, facilitating examination on working of the target in transmission or scanning electron microscopes, X-ray microprolies, and beam welding or cutting apparatus, e.g. by permitting unimpeded positioning of a detector 18 or collector 20. In modified embodiments, (Figs. 2 and 3, not shown), the polepiece may be tapered towards, and have a snout projecting towards, the beam source, and may be provided with an axial hole (25) for the passage therethrough of charged particles transmitted by the specimen, which hole may be stepped outwardly in the direction of the beam to allow for beam spreading. The back-plate 16A of the polepiece may be extended around the peripheral surface of the coil and joined to a non- magnetic front plate (28, Fig. 2) to form a vacuum tight and water tight enclosure for the coil, through which coolant may be circulated. The coil may be of anodized aluminium tape, which avoids the use of additional insulation. The lens may be mounted either within or outside the vacuum tube envelope, and may form the barrier between two volumes within a vacuum chamber, the axial hole (25) permitting the maintenance of a pressure differential between the two volumes.
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB4088872A GB1395201A (en) | 1972-09-04 | 1972-09-04 | Magnetic lenses |
US393532A US3870891A (en) | 1972-09-04 | 1973-08-31 | Magnetic lenses |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB4088872A GB1395201A (en) | 1972-09-04 | 1972-09-04 | Magnetic lenses |
Publications (1)
Publication Number | Publication Date |
---|---|
GB1395201A true GB1395201A (en) | 1975-05-21 |
Family
ID=10417124
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB4088872A Expired GB1395201A (en) | 1972-09-04 | 1972-09-04 | Magnetic lenses |
Country Status (2)
Country | Link |
---|---|
US (1) | US3870891A (en) |
GB (1) | GB1395201A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2238426A (en) * | 1989-11-16 | 1991-05-29 | Jeol Ltd | Electromagnetic lens. |
US5780859A (en) * | 1996-02-16 | 1998-07-14 | Act Advanced Circuit Testing Gesellschaft | Electrostatic-magnetic lens arrangement |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1594465A (en) * | 1977-03-23 | 1981-07-30 | Nat Res Dev | Electron beam apparatus |
US4451738A (en) * | 1980-07-28 | 1984-05-29 | National Research Development Corporation | Microcircuit fabrication |
US4541890A (en) * | 1982-06-01 | 1985-09-17 | International Business Machines Corporation | Hall ion generator for working surfaces with a low energy high intensity ion beam |
DE3236273A1 (en) * | 1982-09-30 | 1984-04-05 | Siemens AG, 1000 Berlin und 8000 München | SPECTROMETER LENS WITH PARALLEL LENS AND SPECTROMETER FIELDS FOR POTENTIAL MEASUREMENT TECHNOLOGY |
DE3236271A1 (en) * | 1982-09-30 | 1984-04-05 | Siemens AG, 1000 Berlin und 8000 München | SPECTROMETER LENS FOR THE CARPUSULAR BEAM MEASUREMENT TECHNOLOGY |
US4810880A (en) * | 1987-06-05 | 1989-03-07 | The Perkin-Elmer Corporation | Direct imaging monochromatic electron microscope |
JP2739485B2 (en) * | 1988-11-05 | 1998-04-15 | セイコーインスツルメンツ株式会社 | Scanning electron beam device |
JP2775071B2 (en) * | 1989-02-22 | 1998-07-09 | 日本電信電話株式会社 | Charged particle beam generator |
JP2772821B2 (en) * | 1989-05-30 | 1998-07-09 | セイコーインスツルメンツ株式会社 | Electron beam equipment |
US5563415A (en) * | 1995-06-07 | 1996-10-08 | Arch Development Corporation | Magnetic lens apparatus for a low-voltage high-resolution electron microscope |
US6051839A (en) | 1996-06-07 | 2000-04-18 | Arch Development Corporation | Magnetic lens apparatus for use in high-resolution scanning electron microscopes and lithographic processes |
WO2016121224A1 (en) * | 2015-01-30 | 2016-08-04 | 松定プレシジョン株式会社 | Charged particle beam device and scanning electron microscope |
JP6177817B2 (en) | 2015-01-30 | 2017-08-09 | 松定プレシジョン株式会社 | Charged particle beam apparatus and scanning electron microscope |
WO2017094721A1 (en) | 2015-12-03 | 2017-06-08 | 松定プレシジョン株式会社 | Charged particle beam device and scanning electron microscope |
EP4350733A1 (en) * | 2022-10-07 | 2024-04-10 | ASML Netherlands B.V. | Electron-optical module |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2438971A (en) * | 1946-10-31 | 1948-04-06 | Rca Corp | Compound electron objective lens |
NL6716628A (en) * | 1967-12-07 | 1969-06-10 | ||
DE1804199C3 (en) * | 1968-03-26 | 1975-12-18 | Siemens Ag, 1000 Berlin Und 8000 Muenchen | Corpuscular beam device for the optional imaging of a specimen or its diffraction diagram |
GB1234509A (en) * | 1968-05-31 | 1971-06-03 | ||
DE1808719C3 (en) * | 1968-11-13 | 1974-04-25 | Steigerwald Strahltechnik Gmbh, 8000 Muenchen | Method and device for treating surfaces, in particular for hardening paint layers, by irradiation with charge carrier beams |
-
1972
- 1972-09-04 GB GB4088872A patent/GB1395201A/en not_active Expired
-
1973
- 1973-08-31 US US393532A patent/US3870891A/en not_active Expired - Lifetime
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2238426A (en) * | 1989-11-16 | 1991-05-29 | Jeol Ltd | Electromagnetic lens. |
GB2238426B (en) * | 1989-11-16 | 1994-04-13 | Jeol Ltd | Electromagnetic lens |
US5780859A (en) * | 1996-02-16 | 1998-07-14 | Act Advanced Circuit Testing Gesellschaft | Electrostatic-magnetic lens arrangement |
Also Published As
Publication number | Publication date |
---|---|
US3870891A (en) | 1975-03-11 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
GB1395201A (en) | Magnetic lenses | |
US3239706A (en) | X-ray target | |
US2559526A (en) | Anode target for high-voltage highvacuum uniform-field acceleration tube | |
Carpenter | Improved laboratory X‐ray source for microfluorescence analysis | |
US5780859A (en) | Electrostatic-magnetic lens arrangement | |
GB799236A (en) | Improvements in or relating to electron discharge devices | |
GB1447983A (en) | Detector for electron microscopes | |
GB1594465A (en) | Electron beam apparatus | |
US3717761A (en) | Scanning electron microscope | |
GB714470A (en) | Improvements in and relating to anode targets for x-ray tubes | |
GB1019743A (en) | An electron beam tube | |
GB1330226A (en) | Electron beam welding | |
US2950390A (en) | Electron lenses | |
EP0790634A1 (en) | Electrostatic-magnetic lens arrangement | |
GB1249341A (en) | Improvements in or relating to x-ray tubes | |
GB1084015A (en) | Flash x-ray tubes | |
McGee et al. | An image tube with Lenard window | |
CN109585244B (en) | High power density electron beam focusing device | |
JP3769029B2 (en) | X-ray tube | |
GB1096349A (en) | Improvements in electron beam tubes | |
US2499545A (en) | Rotary x-ray tube | |
GB1198126A (en) | X-Ray Source | |
JPH057820B2 (en) | ||
GB1057284A (en) | Improvements in x-ray sources | |
CN220543829U (en) | Double-view-angle X-ray projection anode assembly, X-ray tube, X-ray source and detection device |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PS | Patent sealed [section 19, patents act 1949] | ||
PCNP | Patent ceased through non-payment of renewal fee |