GB1377699A - Method of making a semiconductor device and a semiconductor device when made thereby - Google Patents
Method of making a semiconductor device and a semiconductor device when made therebyInfo
- Publication number
- GB1377699A GB1377699A GB5013572A GB5013572A GB1377699A GB 1377699 A GB1377699 A GB 1377699A GB 5013572 A GB5013572 A GB 5013572A GB 5013572 A GB5013572 A GB 5013572A GB 1377699 A GB1377699 A GB 1377699A
- Authority
- GB
- United Kingdom
- Prior art keywords
- layer
- substrate
- diffusion
- semiconductor device
- semi
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000004065 semiconductor Substances 0.000 title abstract 4
- 238000004519 manufacturing process Methods 0.000 title 1
- 239000000758 substrate Substances 0.000 abstract 4
- 238000009792 diffusion process Methods 0.000 abstract 3
- XYFCBTPGUUZFHI-UHFFFAOYSA-N Phosphine Chemical compound P XYFCBTPGUUZFHI-UHFFFAOYSA-N 0.000 abstract 2
- 239000012535 impurity Substances 0.000 abstract 2
- 229910021420 polycrystalline silicon Inorganic materials 0.000 abstract 2
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 abstract 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 abstract 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 abstract 1
- UORVGPXVDQYIDP-UHFFFAOYSA-N borane Chemical compound B UORVGPXVDQYIDP-UHFFFAOYSA-N 0.000 abstract 1
- 229910010277 boron hydride Inorganic materials 0.000 abstract 1
- 238000000034 method Methods 0.000 abstract 1
- 239000000203 mixture Substances 0.000 abstract 1
- 229910052760 oxygen Inorganic materials 0.000 abstract 1
- 239000001301 oxygen Substances 0.000 abstract 1
- 229910000073 phosphorus hydride Inorganic materials 0.000 abstract 1
- 238000001259 photo etching Methods 0.000 abstract 1
- 229910000077 silane Inorganic materials 0.000 abstract 1
- 229910052710 silicon Inorganic materials 0.000 abstract 1
- 239000010703 silicon Substances 0.000 abstract 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B31/00—Diffusion or doping processes for single crystals or homogeneous polycrystalline material with defined structure; Apparatus therefor
- C30B31/02—Diffusion or doping processes for single crystals or homogeneous polycrystalline material with defined structure; Apparatus therefor by contacting with diffusion materials in the solid state
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/22—Diffusion of impurity materials, e.g. doping materials, electrode materials, into or out of a semiconductor body, or between semiconductor regions; Interactions between two or more impurities; Redistribution of impurities
- H01L21/225—Diffusion of impurity materials, e.g. doping materials, electrode materials, into or out of a semiconductor body, or between semiconductor regions; Interactions between two or more impurities; Redistribution of impurities using diffusion into or out of a solid from or into a solid phase, e.g. a doped oxide layer
- H01L21/2251—Diffusion into or out of group IV semiconductors
- H01L21/2254—Diffusion into or out of group IV semiconductors from or through or into an applied layer, e.g. photoresist, nitrides
- H01L21/2257—Diffusion into or out of group IV semiconductors from or through or into an applied layer, e.g. photoresist, nitrides the applied layer being silicon or silicide or SIPOS, e.g. polysilicon, porous silicon
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Manufacturing & Machinery (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Formation Of Insulating Films (AREA)
- Bipolar Transistors (AREA)
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
Abstract
1377699 Semi-conductor devices SUWA SEIKOSHA KK 31 Oct 1972 [10 Nov 1971] 50135/72 Heading H1K In making a semi-conductor device a layer of polycrystalline silicon containing at least two types of impurity is formed on a silicon substrate and the impurities diffused from the layer into the substrate. As described the layer is deposited to a thickness of several hundred Š to several Á by feeding a mixture of silane, phosphine and boron hydride into a reaction chamber containing the substrate which is held at 500 to 700‹ C. The layer may be deposited over the entire substrate and reduced by photoetching to areas where diffusion is required. Oxide is deposited over the layer prior to diffusion, which may be effected in oxygen. After diffusion the polycrystalline silicon may be oxidized throughout its thickness. Surface concentrations from 10<SP>14</SP> to 10<SP>20</SP> atoms/cc. are obtainable by the method.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8970171A JPS4855663A (en) | 1971-11-10 | 1971-11-10 |
Publications (1)
Publication Number | Publication Date |
---|---|
GB1377699A true GB1377699A (en) | 1974-12-18 |
Family
ID=13978063
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB5013572A Expired GB1377699A (en) | 1971-11-10 | 1972-10-31 | Method of making a semiconductor device and a semiconductor device when made thereby |
Country Status (4)
Country | Link |
---|---|
JP (1) | JPS4855663A (en) |
CH (1) | CH565452A5 (en) |
DE (1) | DE2255107A1 (en) |
GB (1) | GB1377699A (en) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5728942B2 (en) * | 1973-12-22 | 1982-06-19 | ||
JPS50134365A (en) * | 1974-04-09 | 1975-10-24 | ||
JPS50159253A (en) * | 1974-06-12 | 1975-12-23 | ||
DE2439408A1 (en) * | 1974-08-16 | 1976-02-26 | Siemens Ag | SEMICONDUCTOR COMPONENT |
DE2449688C3 (en) * | 1974-10-18 | 1980-07-10 | Siemens Ag, 1000 Berlin Und 8000 Muenchen | Method for producing a doped zone of one conductivity type in a semiconductor body |
JPS5153462A (en) * | 1974-11-05 | 1976-05-11 | Fujitsu Ltd | Handotaisochino seizohoho |
JPS5154365A (en) * | 1974-11-06 | 1976-05-13 | Mitsubishi Electric Corp | Handotaisochino seizohoho |
JPS5188174A (en) * | 1975-01-31 | 1976-08-02 | Handotaisochino seizohoho | |
JPS5222887A (en) * | 1975-08-14 | 1977-02-21 | Matsushita Electronics Corp | Semiconductor unit manufacturing system |
JPS58108767A (en) * | 1981-12-22 | 1983-06-28 | Nec Corp | Manufacture of semiconductor device |
US4549914A (en) * | 1984-04-09 | 1985-10-29 | At&T Bell Laboratories | Integrated circuit contact technique |
-
1971
- 1971-11-10 JP JP8970171A patent/JPS4855663A/ja active Pending
-
1972
- 1972-10-31 GB GB5013572A patent/GB1377699A/en not_active Expired
- 1972-11-09 CH CH1630072A patent/CH565452A5/xx not_active IP Right Cessation
- 1972-11-10 DE DE19722255107 patent/DE2255107A1/en active Pending
Also Published As
Publication number | Publication date |
---|---|
DE2255107A1 (en) | 1973-05-17 |
JPS4855663A (en) | 1973-08-04 |
CH565452A5 (en) | 1975-08-15 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US2879190A (en) | Fabrication of silicon devices | |
GB1276012A (en) | Methods of producing antimony-containing layers on semiconductor bodies | |
GB1501114A (en) | Method of making a semiconductor device | |
GB1451096A (en) | Semiconductor devices | |
GB1377699A (en) | Method of making a semiconductor device and a semiconductor device when made thereby | |
GB1250377A (en) | ||
GB1100780A (en) | Improvements in or relating to the diffusion of doping substances into semiconductor crystals | |
GB1326522A (en) | Impurity diffusion into a semiconductor | |
GB1452637A (en) | Diffusion of impurities into a semiconductor | |
GB1199399A (en) | Improvements in or relating to the Manufacture of Semiconductors. | |
GB1520051A (en) | Methods of making semiconductor devices | |
GB1397684A (en) | Diffusion of impurity into semiconductor material | |
GB1388641A (en) | Monocrystals ofiii-v semiconductor compounds | |
JPS5423386A (en) | Manufacture of semiconductor device | |
GB1455949A (en) | Semiconductor devices cutting out a part from sheet metal by means of oxy | |
ES360497A1 (en) | Double depositions of bbr3 in silicon | |
GB1150934A (en) | Improvements in and relating to semiconductor devices. | |
GB1241397A (en) | Improvements in or relating to the production of p-doped zones in semiconductor monocrystals | |
GB1115140A (en) | Semiconductors | |
JPS5272162A (en) | Production of semiconductor device | |
JPS5271991A (en) | Production of semiconductor integrated circuit | |
JPS5394778A (en) | Manufacture of semiconductor device | |
JPS6482668A (en) | Manufacture of bipolar transistor | |
JPS52137987A (en) | Production of semiconductor device | |
GB1210981A (en) | Integrated semiconductor devices |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PS | Patent sealed | ||
PE20 | Patent expired after termination of 20 years |