GB1371104A - Methods of and apparatus for analysing mixtures - Google Patents
Methods of and apparatus for analysing mixturesInfo
- Publication number
- GB1371104A GB1371104A GB730471A GB730471A GB1371104A GB 1371104 A GB1371104 A GB 1371104A GB 730471 A GB730471 A GB 730471A GB 730471 A GB730471 A GB 730471A GB 1371104 A GB1371104 A GB 1371104A
- Authority
- GB
- United Kingdom
- Prior art keywords
- plasma
- sample
- tube
- discharge
- produced
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/105—Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
- G01N27/622—Ion mobility spectrometry
- G01N27/623—Ion mobility spectrometry combined with mass spectrometry
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Analytical Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Molecular Biology (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Abstract
1371104 Ion sources APPLIED RESEARCH LABORATORIES Ltd 20 March 1972 [19 March 1971 1 July 1971 10 Sept 1971] 7304/71 30794/71 and 42253/71 Heading H1D In the analysis of a material by a mass analyser, a gaseous medium containing ions of the material is produced by injecting the material in vapour, liquid, or aerosal form, into a high temperature plasma which is at atmospheric pressure, whereafter the gaseous medium containing the ions is fed to the mass analyser through a pressure reducing stage. The high temperature plasma is produced in an argon or helium carrier gas by an r.f. electrodeless discharge, or by a D.C. discharge in gas flowing through a capillary tube. For a massive solid example either an aerosol suitable for injection into the plasma is produced by employing the sample as the cathode for a D.C. arc struck in flowing argon or helium, first compressing a powder mixture of the material with graphite or metal into a solid cathode if the material is an insulator; or a pulsed laser beam is focused on to the sample surface in flowing gas, the sample being moved between successive pulses to vary the point of impact. The plasma containing the ionized material is sampled by extracting a portion through a fine orifice and passing the resulting beam through a succession of low pressure regions. If greater control of ionization is required, ions are removed from the beam by a transverse electric field, and the resulting neutral beam is passed into an electron impact ionizer. As shown in Fig. 1, a D.C. discharge is maintained between the anode 11 and the sample cathode 10, the carrier gas entering at tube 13 and carrying the sample particles into a high temperature plasma formed in the capillary tube 18 by a discharge between electrodes 16 and 17. Most of the plasma passes out through the pumping tube 20, the remainder being drawn off through a fine orifice 21 into the mass analyser entry tube 22, which is maintained at reduced pressure by the pumping tube 23. The apparatus of Fig. 4, in which the plasma is produced by electrodeless discharge in a capillary tube 32 mounted in a microwave cavity 33, is suitable for sample material which must be maintained within a given temperature range: the sample aerosol, e.g. from a chemical reaction and at 300 C. is expanded into the pipe 35 at a point of the plasma tail at which it has cooled to that temperature, whereafter a portion is drawn off to the mass analyser 41, thermal lagging 39 preventing further substantial reduction in temperature.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB730471A GB1371104A (en) | 1972-03-20 | 1972-03-20 | Methods of and apparatus for analysing mixtures |
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB3079471 | 1972-03-20 | ||
GB4225371 | 1972-03-20 | ||
GB730471A GB1371104A (en) | 1972-03-20 | 1972-03-20 | Methods of and apparatus for analysing mixtures |
Publications (1)
Publication Number | Publication Date |
---|---|
GB1371104A true GB1371104A (en) | 1974-10-23 |
Family
ID=27254994
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB730471A Expired GB1371104A (en) | 1972-03-20 | 1972-03-20 | Methods of and apparatus for analysing mixtures |
Country Status (1)
Country | Link |
---|---|
GB (1) | GB1371104A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2143673A (en) * | 1983-06-16 | 1985-02-13 | Hitachi Ltd | Ionizing samples for secondary ion mass spectrometry |
GB2225159A (en) * | 1988-11-18 | 1990-05-23 | Vg Instr Group | Mass spectrometers |
CN110186998A (en) * | 2019-06-20 | 2019-08-30 | 中国科学院大气物理研究所 | The device and method of atmosphere pollution real-time sampling analysis |
-
1972
- 1972-03-20 GB GB730471A patent/GB1371104A/en not_active Expired
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2143673A (en) * | 1983-06-16 | 1985-02-13 | Hitachi Ltd | Ionizing samples for secondary ion mass spectrometry |
GB2225159A (en) * | 1988-11-18 | 1990-05-23 | Vg Instr Group | Mass spectrometers |
US5036195A (en) * | 1988-11-18 | 1991-07-30 | Vg Instruments Group Limited | Gas analyzer |
GB2225159B (en) * | 1988-11-18 | 1993-05-05 | Vg Instr Group | Gas analyzer |
CN110186998A (en) * | 2019-06-20 | 2019-08-30 | 中国科学院大气物理研究所 | The device and method of atmosphere pollution real-time sampling analysis |
CN110186998B (en) * | 2019-06-20 | 2023-11-28 | 中国科学院大气物理研究所 | Device and method for real-time sampling and analyzing of atmospheric pollutants |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Christiansen et al. | Production of high current particle beams by low pressure spark discharges | |
Haberland et al. | A new type of cluster and cluster ion source | |
Mesyats | Ecton or electron avalanche from metal | |
US3944826A (en) | Methods and apparatus for analyzing mixtures | |
US4845367A (en) | Method and apparatus for producing ions by surface ionization of energy-rich molecules and atoms | |
CN103890901B (en) | Mass spectrum and its relevant technologies are improved | |
US5877593A (en) | Distorted field radio frequency ion source | |
Edels | Properties and theory of the electric arc. A review of progress | |
US4755344A (en) | Method and apparatus for the production of cluster ions | |
Douglas‐Hamilton et al. | An electron attachment plasma instability | |
JP2015511704A (en) | Improved interface for mass spectrometer equipment | |
Mieno et al. | Efficient production of O+ and O− ions in a helicon wave oxygen discharge | |
GB1371104A (en) | Methods of and apparatus for analysing mixtures | |
GB882367A (en) | Improvements in ion sources, and in particular in the ion extracting means thereof | |
US3798447A (en) | Apparatus for directing an energizing beam on a sample to cause secondary ion emission | |
Ganeev et al. | Pulsed discharge in a hollow cathode with the detection of ions in a time-of-flight mass spectrometer: analytical capabilities in the analysis of solid samples | |
Burtt et al. | Sorption and replacement of ionized noble gases at a tungsten surface | |
Jain et al. | Gas injected washer plasma gun | |
US3313934A (en) | Field ion source for mass spectrometry with elongated emitter | |
Austin et al. | Decomposition of N2O in a glow discharge | |
US2958775A (en) | Ion sources for mass spectrometers | |
EP0056899A1 (en) | Gas ion source | |
Hasted et al. | Attachment of electrons to nitrogen dioxide and sulphur hexafluoride | |
Lakshminarasimha et al. | Electron swarm parameters in CO2 laser gas mixtures | |
Fröhlich | A hollow-cathode ion source in glow discharge mass spectrometry |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PS | Patent sealed [section 19, patents act 1949] | ||
PCNP | Patent ceased through non-payment of renewal fee |