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GB1354177A - X-ray source - Google Patents

X-ray source

Info

Publication number
GB1354177A
GB1354177A GB3607671A GB3607671A GB1354177A GB 1354177 A GB1354177 A GB 1354177A GB 3607671 A GB3607671 A GB 3607671A GB 3607671 A GB3607671 A GB 3607671A GB 1354177 A GB1354177 A GB 1354177A
Authority
GB
United Kingdom
Prior art keywords
astigmator
lens
plates
july
rays
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB3607671A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Jeol Ltd
Original Assignee
Jeol Ltd
Nihon Denshi KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jeol Ltd, Nihon Denshi KK filed Critical Jeol Ltd
Publication of GB1354177A publication Critical patent/GB1354177A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J29/00—Details of cathode-ray tubes or of electron-beam tubes of the types covered by group H01J31/00
    • H01J29/46—Arrangements of electrodes and associated parts for generating or controlling the ray or beam, e.g. electron-optical arrangement
    • H01J29/56—Arrangements for controlling cross-section of ray or beam; Arrangements for correcting aberration of beam, e.g. due to lenses
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/14—Arrangements for concentrating, focusing, or directing the cathode ray
    • H01J35/147—Spot size control
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

1354177 X-ray tubes; electron beam irradiation apparatus NIHON DENSHI KK 30 July 1971 [30 July 1970] 36076/71 Heading HID An X-ray generator comprises an electron gun 3, Fig. 1, for directing a beam at a target 6, a condenser lens 7, and an astigmator 5 disposed between the gun and the lens. In Fig. 1 the astigmator is elastrotatic and comprises four plates arranged around the beam; if one pair of opposed plates is at a higher potential than the other the beam will be elongated to produce a line source of X-rays; if the plates are all at the same potential the beam will be concentrated at a point. The astigmator may alternatively be magnetic, comprising two pairs of opposed coils, Fig. 3 (not shown). The lens 7 comprises two coils 12 and 13 and three polepieces 14-16, the polarities of poles 14 and 16 being opposite to that of 15. In a modification, Fig. 4 (not shown), the chamber is continuously evacuated and terminates in a slit through which the electron beam passes to an external specimen to generate X-rays which are analysed to indicate the nature of the specimen.
GB3607671A 1970-07-30 1971-07-30 X-ray source Expired GB1354177A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6686770A JPS5435078B1 (en) 1970-07-30 1970-07-30

Publications (1)

Publication Number Publication Date
GB1354177A true GB1354177A (en) 1974-06-05

Family

ID=13328226

Family Applications (1)

Application Number Title Priority Date Filing Date
GB3607671A Expired GB1354177A (en) 1970-07-30 1971-07-30 X-ray source

Country Status (5)

Country Link
US (1) US3732426A (en)
JP (1) JPS5435078B1 (en)
DE (1) DE2136460A1 (en)
FR (1) FR2099373A5 (en)
GB (1) GB1354177A (en)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3962583A (en) * 1974-12-30 1976-06-08 The Machlett Laboratories, Incorporated X-ray tube focusing means
SE415804B (en) * 1978-06-21 1980-10-27 Nils Johannes Baecklund SET FOR MEDIUM X-RAY META CONTAIN THE CONTENT OR QUANTITY OF A PRESET-PREPARED SUBSTANCE IN A SAMPLE, AND DEVICE FOR EXECUTING THE SET
FR2534066B1 (en) * 1982-10-05 1989-09-08 Thomson Csf X-RAY TUBE PRODUCING A HIGH EFFICIENCY BEAM, ESPECIALLY BRUSH-SHAPED
DE3401749A1 (en) * 1984-01-19 1985-08-01 Siemens AG, 1000 Berlin und 8000 München X-RAY DIAGNOSTIC DEVICE WITH AN X-RAY TUBE
DE19639920C2 (en) * 1996-09-27 1999-08-26 Siemens Ag X-ray tube with variable focus
GB9620160D0 (en) 1996-09-27 1996-11-13 Bede Scient Instr Ltd X-ray generator
US6236713B1 (en) 1998-10-27 2001-05-22 Litton Systems, Inc. X-ray tube providing variable imaging spot size
US7826595B2 (en) * 2000-10-06 2010-11-02 The University Of North Carolina Micro-focus field emission x-ray sources and related methods
JP4954525B2 (en) * 2005-10-07 2012-06-20 浜松ホトニクス株式会社 X-ray tube
EP2556525B1 (en) * 2010-04-09 2018-08-22 GE Sensing & Inspection Technologies GmbH Microfocus x-ray tube with cathode element and process using the same
US9748070B1 (en) 2014-09-17 2017-08-29 Bruker Jv Israel Ltd. X-ray tube anode
JP7048396B2 (en) 2018-04-12 2022-04-05 浜松ホトニクス株式会社 X-ray tube
US11302508B2 (en) 2018-11-08 2022-04-12 Bruker Technologies Ltd. X-ray tube

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2866902A (en) * 1955-07-05 1958-12-30 High Voltage Engineering Corp Method of and apparatus for irradiating matter with high energy electrons
IT584331A (en) * 1955-10-29
US2849634A (en) * 1956-07-09 1958-08-26 Vickers Electrical Co Ltd Linear electron accelerators
US2919381A (en) * 1956-07-25 1959-12-29 Farrand Optical Co Inc Electron lens
DE1064168B (en) * 1958-06-20 1959-08-27 Zeiss Carl Fa Device for generating and shaping a charge carrier beam
US2944175A (en) * 1959-03-26 1960-07-05 Motorola Inc Television receiver
US3376449A (en) * 1967-01-20 1968-04-02 Ion Physics Corp Electrostatic quadrapole lens assembly with transverse intermediate termination elements of resistive material joining together the quadrapole electrodes for preventing beam aberration

Also Published As

Publication number Publication date
JPS5435078B1 (en) 1979-10-31
DE2136460A1 (en) 1972-03-09
FR2099373A5 (en) 1972-03-10
US3732426A (en) 1973-05-08

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Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
PLNP Patent lapsed through nonpayment of renewal fees