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GB1349786A - Apparatus for testing electrical circuits - Google Patents

Apparatus for testing electrical circuits

Info

Publication number
GB1349786A
GB1349786A GB1722671A GB1349786DA GB1349786A GB 1349786 A GB1349786 A GB 1349786A GB 1722671 A GB1722671 A GB 1722671A GB 1349786D A GB1349786D A GB 1349786DA GB 1349786 A GB1349786 A GB 1349786A
Authority
GB
United Kingdom
Prior art keywords
contacts
conductors
casing
frame
board
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB1722671A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Services Ltd
Original Assignee
Fujitsu Services Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Services Ltd filed Critical Fujitsu Services Ltd
Publication of GB1349786A publication Critical patent/GB1349786A/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/54Testing for continuity
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/52Testing for short-circuits, leakage current or ground faults
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/58Testing of lines, cables or conductors

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)

Abstract

1349786 Test probes INTERNATIONAL COMPUTERS Ltd 26 May 1971 17226/71 Heading H2E Apparatus for establishing electrical connection to conductors carried on a circuit board 14 for the purpose of testing the continuity of the conductors comprises a flexible resilient member 1, having a series of electrical contacts 11 extending therethrough, which is attached to the bottom of a frame 24 movable along a vertical axis by means of a pneumatic system 28. A pressure skirt 35 is attached between the frame 24 and a casing 29 for the purpose of sealing the volume enclosed by the casing above the flexible member 1. Leads 12 connect the contacts 11 to a connector member 20 and flat cables 23 are used to provide electrical connection with a continuity tester situated outside the casing 29. To establish contact with the electrical conductors on the board 14 the frame 24 is lowered using the pneumatic system 28 until the contacts 11 touch the board conductors. The pressure in the volume above the member 1 is then increased for the purpose of maintaining a firm contact between the contacts 11 and the conductors. The resilient member 1 may comprise a thin sheet of Mylar (Registered Trade Mark) with a coating of silicon rubber for the purpose of sealing the holes through which the contacts 11 extend. The contacts may be of gold plated brass. An alternative arrangement of the frame 24 and circuit board inside the casing 29 is described (Figs. 2, 3, not shown).
GB1722671A 1971-05-26 1971-05-26 Apparatus for testing electrical circuits Expired GB1349786A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB1722671 1971-05-26

Publications (1)

Publication Number Publication Date
GB1349786A true GB1349786A (en) 1974-04-10

Family

ID=10091452

Family Applications (1)

Application Number Title Priority Date Filing Date
GB1722671A Expired GB1349786A (en) 1971-05-26 1971-05-26 Apparatus for testing electrical circuits

Country Status (2)

Country Link
FR (1) FR2138605B3 (en)
GB (1) GB1349786A (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2617190A1 (en) * 1975-05-17 1976-12-02 Int Computers Ltd DEVICES FOR TESTING ELECTRICAL DEVICES
GB2156532A (en) * 1984-03-24 1985-10-09 Plessey Co Plc Apparatus for testing a printed circuit board
US5092774A (en) * 1991-01-09 1992-03-03 National Semiconductor Corporation Mechanically compliant high frequency electrical connector
US5567165A (en) * 1993-12-28 1996-10-22 Yamaichi Electronics Co., Ltd. Fluid actuated connector/carrier for electric part
US5573418A (en) * 1993-12-28 1996-11-12 Yamaichi Electronics Co., Ltd. Press-in connection type structure for electric part
US6468098B1 (en) * 1999-08-17 2002-10-22 Formfactor, Inc. Electrical contactor especially wafer level contactor using fluid pressure
US7396236B2 (en) 2001-03-16 2008-07-08 Formfactor, Inc. Wafer level interposer

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2617190A1 (en) * 1975-05-17 1976-12-02 Int Computers Ltd DEVICES FOR TESTING ELECTRICAL DEVICES
GB2156532A (en) * 1984-03-24 1985-10-09 Plessey Co Plc Apparatus for testing a printed circuit board
US5092774A (en) * 1991-01-09 1992-03-03 National Semiconductor Corporation Mechanically compliant high frequency electrical connector
US5567165A (en) * 1993-12-28 1996-10-22 Yamaichi Electronics Co., Ltd. Fluid actuated connector/carrier for electric part
US5573418A (en) * 1993-12-28 1996-11-12 Yamaichi Electronics Co., Ltd. Press-in connection type structure for electric part
US6468098B1 (en) * 1999-08-17 2002-10-22 Formfactor, Inc. Electrical contactor especially wafer level contactor using fluid pressure
US7195503B2 (en) 1999-08-17 2007-03-27 Formfactor, Inc. Electrical contactor, especially wafer level contactor, using fluid pressure
US7455540B2 (en) 1999-08-17 2008-11-25 Formfactor, Inc. Electrical contactor, especially wafer level contactor, using fluid pressure
US7722371B2 (en) 1999-08-17 2010-05-25 Formfactor, Inc. Electrical contactor, especially wafer level contactor, using fluid pressure
US7396236B2 (en) 2001-03-16 2008-07-08 Formfactor, Inc. Wafer level interposer
US7649368B2 (en) 2001-03-16 2010-01-19 Formfactor, Inc. Wafer level interposer

Also Published As

Publication number Publication date
FR2138605A1 (en) 1973-01-05
FR2138605B3 (en) 1975-02-14

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Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
PCNP Patent ceased through non-payment of renewal fee