[go: up one dir, main page]

GB1089975A - Improved diffraction gloniometer - Google Patents

Improved diffraction gloniometer

Info

Publication number
GB1089975A
GB1089975A GB2158465A GB2158465A GB1089975A GB 1089975 A GB1089975 A GB 1089975A GB 2158465 A GB2158465 A GB 2158465A GB 2158465 A GB2158465 A GB 2158465A GB 1089975 A GB1089975 A GB 1089975A
Authority
GB
United Kingdom
Prior art keywords
circle
detector
crystal
arm
tangential
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB2158465A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Chirana Praha np
Original Assignee
Chirana Praha np
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Chirana Praha np filed Critical Chirana Praha np
Publication of GB1089975A publication Critical patent/GB1089975A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

1,089,975. Diffraction apparatus. CHIRANA PRAHA NARODNI PODNIK. May 21, 1965 [May 23, 1964], No. 21584/65. Heading H5R. A diffraction goniometer is arranged to operate on both the central (Bragg-Brentano) and the tangential (Seemann-Bohlin) focusing principles. The apparatus includes a rotatable crystal or specimen at the central S 1 of focusing circle K 1 on the circumference of which is situated the focal point F of the X-ray source. The detector having a slit S, is mounted on a base-plate P movable along an arm R 1 , rotatable about the centre of circle K 1 . In operation on the central principle, the detector is located in one position on the arm R 1 , and travels along the circumference of circle K 1 as rotation of the crystal necessitates. The apparatus also includes an auxiliary arm R 2 rotatable about an axis at one end, this axis being on the circumference of circle K 1 and equidistant from the focal point F and the crystal axis S 1 . In operation under the tangential principle, the end of the arm R 2 , which travels round a further focusing circle K 2 , engages the detector baseplate and as it rotates, slides the detector along the arm R 1 so that the detector travels around circle K 2 rather than that K 1 . This causes the crystal to remain tangential to circle K 2 and the detector to move into the required positions on circle K 2 to receive rays from the crystal. The link between the drives for arms R 1 and R 2 is provided by means of helical gears (SK 1 and SK 2 ) which rotate about the centres of circles K 1 and K 2 , respectively and which in the tangential principle of operation can be connected by displacement of a worm drive (S n ) which then engages with the gear (SK 2 ) (Fig. 5, not shown). The invention has equal application with other radiations besides X-rays, e.g. γ- rays, neutrons.
GB2158465A 1964-05-23 1965-05-21 Improved diffraction gloniometer Expired GB1089975A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CS298264 1964-05-23

Publications (1)

Publication Number Publication Date
GB1089975A true GB1089975A (en) 1967-11-08

Family

ID=5368585

Family Applications (1)

Application Number Title Priority Date Filing Date
GB2158465A Expired GB1089975A (en) 1964-05-23 1965-05-21 Improved diffraction gloniometer

Country Status (4)

Country Link
DE (1) DE1245164B (en)
FR (1) FR1500772A (en)
GB (1) GB1089975A (en)
NL (1) NL6506536A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4691334A (en) * 1983-10-12 1987-09-01 U.S. Philips Corporation X-ray examination apparatus

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4102850A1 (en) * 1991-01-31 1992-08-06 Philips Patentverwaltung X-RAY VOLTAGE MEASURING DEVICE

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2805341A (en) * 1954-07-12 1957-09-03 Andrew R Lang Diffractometer
GB847265A (en) * 1957-09-11 1960-09-07 Ass Elect Ind Improvements relating to mechanical linkages
NL244115A (en) * 1958-10-07

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4691334A (en) * 1983-10-12 1987-09-01 U.S. Philips Corporation X-ray examination apparatus

Also Published As

Publication number Publication date
DE1245164B (en) 1967-07-20
NL6506536A (en) 1965-11-24
FR1500772A (en) 1967-11-10

Similar Documents

Publication Publication Date Title
US2552858A (en) Serialographic apparatus and x-ray
GB953535A (en) Improvements in x-ray diffractometers
GB1089975A (en) Improved diffraction gloniometer
US2783385A (en) X-ray fluorescent spectrometry
GB594108A (en) Improvements in x-ray diffraction apparatus
US3728541A (en) X-ray diffractometer
US3566111A (en) Apparatus for varying the detector slit width in fully focusing x-ray spectrometers
US3218458A (en) Diffractometer
US3628015A (en) Scanning mechanism for use in an x-ray spectrometer
US3091696A (en) Collimator
US3906225A (en) X-ray spectrometer
US3124681A (en) Zingaro
US3361909A (en) X-ray diffraction goniometer with specific drive mechanism for the specimen holder and detector
GB1203925A (en) Variable-orientation mechanism for positioning samples
US2133738A (en) Method of and apparatus for making radiographs of body layers
SU146074A1 (en) The method of relative movement of the crystal and the counter in the X-ray spectrograph
Birks et al. Compact Curved‐Crystal X‐Ray Spectrometer
GB1029859A (en) X-ray beam defining diaphragm system
SU360875A1 (en)
GB887704A (en) Improvements in devices for measuring wave-lengths of x-rays
SU559694A1 (en) Diaphragm
SU851211A1 (en) X-ray diffractometer of zeemann-bolin type
JPS5223981A (en) Measuring method of specific azimuthal crystal grains by x-rays
Einstein Elimination of spot doubling in precession photography without layer-line screens
SU894502A1 (en) X-ray spectrum for investigating monocrystal structural perfection