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GB1082421A - Apparatus for mounting a semiconductor component in a support - Google Patents

Apparatus for mounting a semiconductor component in a support

Info

Publication number
GB1082421A
GB1082421A GB1315566A GB1315566A GB1082421A GB 1082421 A GB1082421 A GB 1082421A GB 1315566 A GB1315566 A GB 1315566A GB 1315566 A GB1315566 A GB 1315566A GB 1082421 A GB1082421 A GB 1082421A
Authority
GB
United Kingdom
Prior art keywords
rectifier
test
polarity
voltage
component
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB1315566A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens Schuckertwerke AG
Original Assignee
Siemens Schuckertwerke AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens Schuckertwerke AG filed Critical Siemens Schuckertwerke AG
Publication of GB1082421A publication Critical patent/GB1082421A/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836Fault-finding or characterising
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/50Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the groups H01L21/18 - H01L21/326 or H10D48/04 - H10D48/07 e.g. sealing of a cap to a base of a container
    • H01L21/52Mounting semiconductor bodies in containers

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

1,082,421. Semi-conductor devices. SIEMENS SCHUCKERTWERKE A.G. March 24, 1966 [April 3, 1965], No. 13155/66. Heading H1K. [Also in Division G1] Apparatus for inserting a semi-conductor component 3, Fig. 1, into a recess 2a in a support member 2, is associated with testing circuitry for checking the electrical characteristics of the inserted component. The apparatus consists of an open-ended plunger 4 which is used to press the component into the recess, the open end containing a spring-loaded contact 9 for completing the connection to the testing circuit 10. The test circuit of Fig. 2 provides a polarity test in which the inserted component, a rectifier, is energized by an A.C. source 25 and its output applied to a relay-plus-rectifier combination 18, 19, 23, 24 which moves a contact 20 on to one or other of two fixed contacts 21, 22 in accordance with the polarity of the inserted rectifier. This polarity test also controls the operation of further relays R 1 , R 2 which control the polarity of the applied potential in a current-voltage characteristic test. The current-voltage characteristic test may take the form of checking the voltage which appears across the rectifier 33, Fig. 3, when connected in series with a resistor 34 and a D.C. supply 40, the polarity of the supply being such as to produce reverse bias of the rectifier. This test may be performed both before and after pressing the rectifier into its recess: the pre-pressing voltage may in this case be stored by a capacitor 36 and the post-test voltage, if lower, will cause a partial discharge of the capacitor, the discharging current being metered at 38 and, if it exceeds the permitted value, operating an alarm 39.
GB1315566A 1965-04-03 1966-03-24 Apparatus for mounting a semiconductor component in a support Expired GB1082421A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DES0096370 1965-04-03

Publications (1)

Publication Number Publication Date
GB1082421A true GB1082421A (en) 1967-09-06

Family

ID=7520001

Family Applications (1)

Application Number Title Priority Date Filing Date
GB1315566A Expired GB1082421A (en) 1965-04-03 1966-03-24 Apparatus for mounting a semiconductor component in a support

Country Status (1)

Country Link
GB (1) GB1082421A (en)

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